Books on the topic 'Device integration'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the top 50 books for your research on the topic 'Device integration.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Browse books on a wide variety of disciplines and organise your bibliography correctly.
Gonschorek, Karl-Heinz, and Ralf Vick. Electromagnetic Compatibility for Device Design and System Integration. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03290-5.
Full textWorkshop on Large Scale Computational Device Modeling (1985 Naperville, Ill.). Large scale computational device modeling. Coordinated Science Laboratory, University of Illinois, 1986.
Find full textWolfgang, Karthe, Commission of the European Communities. Directorate-General for Science, Research, and Development., European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Nanofabrication technologies and device integration: 13-14 April 1994, Lindau, FRG. SPIE, 1994.
Find full textHuang, Weixin. Economic integration as a development device: The case of the EC and China. Verlag breitenbach Publishers, 1992.
Find full textMan, Cham Kit, ed. Computer-aided design and VLSI device development. Kluwer Academic Publishers, 1986.
Find full textKällbäck, Bengt. High-Speed Electronics: Basic Physical Phenomena and Device Principles. Springer Berlin Heidelberg, 1986.
Find full textDavid, Burnett, Kimura Shiníchiro, Singh Bhanwar, et al., eds. Challenges in process integration and device technology: 18-19 September 2000, Santa Clara, USA. SPIE, 2000.
Find full textJ, Motta Ricardo, Berberian Hapet A, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Device-independent color imaging and imaging systems integration: 1-3 February 1993, San Jose, California. SPIE, 1993.
Find full textJ, Motta Ricardo, Berberian Hapet A, IS & T--the Society for Imaging Science and Technology., and Society of Photo-optical Instrumentation Engineers., eds. Device-independent color imaging and imaging systems integration: 1-3 February 1993, San Jose, California. SPIE, 1993.
Find full textChatterjee, Pallab. Legacy Data: A Structured Methodology for Device Migration in DSM Technology. Springer US, 2003.
Find full textSymposium on Crystalline Defects and Contamination (2nd : 1997 Paris, France). Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. Edited by Kolbesen Bernd O, Electrochemical Society Electronics Division, Electrochemical Society Meeting, International Society of Electrochemistry. Meeting, and Symposium on Silicon Cleaning Technology (1997 : Paris, France). Electrochemical Society, 1997.
Find full textMadrid, Philip E. Device design and process window analysis of a deep submicron CMOS VLSI technology. Addison-Wesley, 1992.
Find full textMeeting, Materials Research Society, ed. Integrated miniaturized materials: From self-assembly to device integration : symposium held April 5-9, 2010, San Francisco, California, U.S.A. Materials Research Society, 2010.
Find full textSymposium on Crystalline Defects and Contamination (2001 Nuremberg, Germany). Proceedings of the satellite symposium to ESSDERC 2001 Nuremberg/Germany: Crystalline defects and contamination : their impact and control in device manufacturing III ; DECON 2001. Edited by Kolbesen Bernd O, Electrochemical Society Electronics Division, European Solid State Device Research Conference (31st : 2001 : Nuremberg/Germany), and DECON 2001. Electrochemical Society, 2001.
Find full text(Society), SPIE, ed. Nanoepitaxy: Homo- and heterogeneous synthesis, characterization, and device integration of nanomaterials : 3-4 August 2009, San Diego, California, United States. SPIE, 2009.
Find full textSymposium on Crystalline Defects and Contamination: their Impact and Control in Device Manufacturing (3rd : 2001 Paris, France). Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing III: DECON 2001 : Proceedings of the satellite symposium to ESSDERC 2001, Nuremberg, Germany. Edited by Kolbesen Bernd O, Electrochemical Society Electronics Division, and European Solid State Device Research Conference (31st : 2001 : Nuremberg, Germany). Electrochemical Society, 2001.
Find full textBishop, Lauri. The Integration of Principles of Motor Learning to Reduce Gait Asymmetry Using a Novel Robotic Device in Individuals Chronically Post-Stroke. [publisher not identified], 2018.
Find full textSatellite Symposium to ESSDERC 2005 (2005 Grenoble, France). Crystalline defects and contamination: Their impact and control in device manufacturing IV, DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France. Edited by Kolbesen Bernd O, Electrochemical Society. Electronics and Photonics Division., and European Solid State Device Research Conference (35th : 2005 : Grenoble, France). Electrochemical Society, 2005.
Find full textSatellite, Symposium to ESSDERC 2005 (2005 Grenoble France). Crystalline defects and contamination: Their impact and control in device manufacturing IV, DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France. Electrochemical Society, 2005.
Find full textInternational Workshop on VLSI Process and Device Modeling (1993 Nara-ken, Japan). 1993 International Workshop on VLSI Process and Device Modeling: (1993 VPAD), May 14 (Fri.) - May 15 (Sat.), 1993, Nara Ken-New Public Hall, Nara, Japan. Business Center for Academic Societies Japan, 1993.
Find full textIslam, M. Saiful. Nanoepitaxy: Homo- and heterogeneous synthesis, characterization, and device integration of nanomaterials II : 1-2 and 4 August 2010, San Diego, California, United States. Edited by SPIE (Society). SPIE, 2010.
Find full textH, Miller John J., and NASECODE Conference. (5th : 1987 : Dublin, Ireland), eds. The interfaces and integration of process device and circuit models, an introduction: An international short course held in association with the NASECODE V Conference, 15th - 16th June 1987, Trinity College, Dublin, Ireland. Boole Press, 1987.
Find full textAlfred, Driessen, Society of Photo-optical Instrumentation Engineers., and European Optical Society, eds. Laser diodes, optoelectronic devices, and heterogenous integration. SPIE, 2003.
Find full textIacopi, Francesca, and Francis Balestra, eds. More-than-Moore Devices and Integration for Semiconductors. Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-21610-7.
Full textMichael, Shur, and Maki Paul A. 1956-, eds. Advanced high speed devices. World Scientific Publishing Co., 2010.
Find full textBeerel, Peter A. A Designer's Guide to VLSI Devices. Cambridge University Press, 2010.
Find full textKunze, Ulrich. Quanteninterferenz-Feldeffekttransistoren, Bauelemente für die Nanometer-Integration? Akademie der Wissenschaften und der Literatur, 1987.
Find full textHai, Ming, Zhang Xuping, Chen Maggie Yihong, et al., eds. Optoelectronic devices and integration: 8-11 November, 2004, Beijing, China. SPIE, 2005.
Find full textGonschorek, Karl-Heinz, and Ralf Vick. Electromagnetic Compatibility for Device Design and System Integration. Springer, 2014.
Find full textGonschorek, Karl-Heinz, and Ralf Vick. Electromagnetic Compatibility for Device Design and System Integration. Springer London, Limited, 2009.
Find full textElectromagnetic Compatibility For Device Design And System Integration. Springer, 2009.
Find full textEl-Kareh, Badih. CMOS and BiCMOS Process Integration and Device Characterization. Springer, 2007.
Find full textGonschorek, Karl-Heinz, and Ralf Vick. Electromagnetic Compatibility for Device Design and System Integration. Springer, 2010.
Find full textLee, Kwyro, Trond Ytterdal, Tor A. Fjeldly, and Michael Shur. Semiconductor Device Modeling For VLSI. Prentice Hall, 1997.
Find full textLee, Kwyro, Trond Ytterdal, Tor A. Fjeldly, and Michael Shur. Semiconductor Device Modeling For VLSI. Prentice Hall, 1997.
Find full textKit Man Kit Man Cham, Soo-Young Soo-Young Oh, and John L. Moll. Computer-Aided Design and VLSI Device Development. Springer London, Limited, 2013.
Find full textEl-Kareh, Badih, and Lou N. Hutter. Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability. Springer, 2020.
Find full textHopf, Jens Michael. Framework for the Integration of Mobile Device Features in PLM. Saint Philip Street Press, 2020.
Find full textHopf, Jens Michael. Framework for the Integration of Mobile Device Features in PLM. Saint Philip Street Press, 2020.
Find full textEl-Kareh, Badih, and Lou N. Hutter. Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability. Springer, 2015.
Find full textEl-Kareh, Badih, and Lou N. Hutter. Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability. Springer, 2015.
Find full textEl-Kareh, Badih, and Lou N. Hutter. Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability. Springer New York, 2016.
Find full textMiller, J. J. H. The Interfaces and Integration of Process, Device and Circuit Models. Boole Press Ltd, 1987.
Find full textEl-Kareh, Badih, and Lou N. Hutter. Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability. Springer, 2019.
Find full textGoyal, Amit, Carlos J. Martinez, Rajesh R. Naik, Alberto Saiani, and David Gracias. Integrated Miniaturized Materials : Volume 1272: From Self-Assembly to Device Integration. University of Cambridge ESOL Examinations, 2014.
Find full text