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Journal articles on the topic 'HRTEM (High Resolution Transmission Electron Microscopy)'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Gruehn, R. "High resolution transmission electron microscopy (HRTEM)." Fresenius' Zeitschrift für analytische Chemie 333, no. 7 (1989): 781–82. http://dx.doi.org/10.1007/bf00476638.

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2

Howe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during

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3

O'Keefe, Michael A., and John C. H. Spence. "“Resolution” in atomic-resolution Electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 498–99. http://dx.doi.org/10.1017/s0424820100086799.

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The Rayleigh resolution criterion was developed for incoherent imaging conditions and cannot, in general, be applied to coherent high-resolution transmission electron microscopy (HRTEM). In fact, the Rayleigh criterion may lead to paradoxical results since it considers only two scatterers and does not account for the signal-to-noise ratio. It may, however, be used for dark-field HAAD STEM imaging. For the case of strong multiple scattering in HRTEM lattice imaging, the only general relations that can be assumed between the image of a specimen and its projected crystal potential are those impos

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4

FERROW, E. A. "Computer-simulated high-resolution transmission electron microscopy (HRTEM) in tourmaline." Journal of Microscopy 177, no. 1 (1995): 68–76. http://dx.doi.org/10.1111/j.1365-2818.1995.tb03534.x.

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5

Lu, Jing Mei, and Xuan Cheng. "Analysis of Nanocrystal of Porous Silicon with High-Resolution Transmission Electron Microscopy." Advanced Materials Research 650 (January 2013): 34–38. http://dx.doi.org/10.4028/www.scientific.net/amr.650.34.

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The porous silicon samples were prepared with n(111) Si wafers by electrochemical polarization and their microstructures were characterized by high-resolution transmission electron microscopy (HRTEM). The DigitalMicrograph image processing was used to analyze the HRTEM images. The distorted Si (111) crystal plane was observed on porous silicon and could be distinguished with the Fourier transforming electron diffraction (ED) pattern. Grain boundaries were presented in the HRTEM images where the lattice fringes distortions took place. The anisotropy property could be preserved at a small locati

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6

Howe, J. M. "High-resolution tem of transformation interfaces in metals." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 284–87. http://dx.doi.org/10.1017/s0424820100126287.

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The advent of medium and high-voltage transmission electron microscopes with point-to-point resolutions below 0.2 nm has made it possible to study transformation interfaces in metals at the atomic level. Understanding the atomic structures of these interfaces is critical to understanding microstructural development and the resulting physical and mechanical properties of metals. One area of transformation interfaces in metals that has been investigated by high- resolution transmission electron microscopy (HRTEM), is the structures of interphase boundaries of metastable aging precipitates in Al

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Rečnik, A., D. L. Carroll, K. A. Shaw, D. M. Lind, and M. Rühle. "Structural Characterization of Fe3O4–NiO Superlattices Using High-reSolution Transmission Electron Microscopy." Journal of Materials Research 12, no. 8 (1997): 2143–51. http://dx.doi.org/10.1557/jmr.1997.0287.

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Superlattices of Fe3O4–NiO layers have been studied by high-resolution transmission electron microscopy (HRTEM). These superlattices are grown by oxygen-plasma-assisted molecular-beam epitaxy (MBE) on (001) oriented MgO substrates, and exhibit a high degree of ordering at the interfaces between the interlayers. The lack of misfit dislocations at the Fe3O4–NiO interfaces suggeststhat lattice strain is largely accommodated by changes in the lattice spacing. By quantitative HRTEM analysis of Fe3O4–NiO interfaces, possible atomic models are discussed, having implications in magnetic ordering and s

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8

Seyring, Martin, Xiaoyan Song, Andrey Chuvilin, Ute Kaiser, and Markus Rettenmayr. "Characterization of grain structure in nanocrystalline gadolinium by high-resolution transmission electron microscopy." Journal of Materials Research 24, no. 2 (2009): 342–46. http://dx.doi.org/10.1557/jmr.2009.0071.

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A method is presented for recognition of nanograins in high-resolution transmission electron microscope (HRTEM) images of nanocrystalline materials. We suggest a numerical procedure, which is similar to the experimental dynamic hollow cone dark-field method in transmission electron microscopy and the annular dark-field method in scanning transmission electron microscopy. The numerical routine is based on moving a small mask along a circular path in the Fourier spectrum of a HRTEM image and performing at each angular step an inverse Fourier transform. The procedure extracts the amplitude from t

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9

Sezen, Meltem, and Sina Sadighikia. "3D electron microscopy investigations of human dentin at the micro/nano-scale using focused ion beam based nanostructuring." RSC Advances 5, no. 10 (2015): 7196–99. http://dx.doi.org/10.1039/c4ra14364g.

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In this study, high resolution electron microscopy techniques, such as Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM) and High Resolution Transmission Electron Microscopy (HRTEM) allowed for revealing micro/nano features within human dentin with high definition and accuracy.

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10

Howe, James M., Hirotaro Mori, and Zhong Lin Wang. "In Situ High-Resolution Transmission Electron Microscopy in the Study of Nanomaterials and Properties." MRS Bulletin 33, no. 2 (2008): 115–21. http://dx.doi.org/10.1557/mrs2008.24.

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AbstractThis article introduces the use of in situ high-resolution transmission electron microscopy (HRTEM) techniques for the study and development of nanomaterials and their properties. Specifically, it shows how in situ HRTEM (and TEM) can be used to understand diverse phenomena at the nanoscale, such as the behavior of alloy phase formation in isolated nanometer-sized particles, the mechanical and transport properties of carbon nanotubes and nanowires, and the dynamic behavior of interphase boundaries at the atomic level. Current limitations and future potential advances in in situ HRTEM o

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11

Miyazawa, K., H. Satsuki, M. Kuwabara, and M. Akaishi. "Microstructural analysis of high-pressure compressed C60." Journal of Materials Research 16, no. 7 (2001): 1960–66. http://dx.doi.org/10.1557/jmr.2001.0268.

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The structure and hardness of C60 bulk specimens compressed under 5.5 GPa at room temperature to 600 °C are investigated by high-resolution transmission electron microscopy, x-ray diffraction, and micro-Vickers hardness tests. A strong accumulation of the [1 1 0]tr orientation of high-pressure-treated C60 specimens was developed along the compression axis, and stacking faults and nano-sized deformation twins were introduced into the C60 specimens compressed at 450–600 °C. Curved lattice planes indicating a polymerization of C60 were observed by high resolution transmission electron microscopy

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12

Sinkler, W., C. Michaelsen, and R. Bormann. "A transmission electron microscopy investigation of inverse melting in Nb45Cr55." Journal of Materials Research 12, no. 7 (1997): 1872–84. http://dx.doi.org/10.1557/jmr.1997.0257.

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In inverse melting, a supersaturated crystalline phase transforms polymorphously under heat treatment to the amorphous state. Inverse melting of body-centered cubic (bcc) Nb45Cr55 is studied using transmission electron microscopy (TEM) and high resolution TEM (HRTEM). The crystalline to amorphous transformation is heterogeneous, initiating at the bcc grain boundaries. HRTEM reveals 2–3 nm domains with medium range order (MRO) in the amorphous phase. Preferred orientation of MRO domains is found on a scale corresponding to the precursor bcc grain size. Using HRTEM and calorimetry, MRO developme

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13

CHEN, H., X. K. LU, S. Q. ZHOU, X. H. HAO, and Z. X. WANG. "FABRICATION AND CHARACTERISTICS OF ALN NANOWIRES." Modern Physics Letters B 15, no. 30 (2001): 1455–58. http://dx.doi.org/10.1142/s0217984901003068.

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Single phase AlN nanowires are fabricated by a sublimation method. They were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), typical selected area electron diffraction (SAED) and high-resolution transmission electron microscopy (HRTEM). The SEM and TEM images show that most of the nanowires have diameters of about 10–60 nm. The crystal structure of AlN nanowires revealed by XRD, SAED and HRTEM shows the AlN nanowires have a wurtzite structure.

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14

van Benthem, Klaus, Christina Scheu, Wilfried Sigle, Christian Elsässer, and Manfred Rühle. "Electronic Structure Investigations of Metal / SrtiO3 Interfaces Using EELS." Microscopy and Microanalysis 7, S2 (2001): 304–5. http://dx.doi.org/10.1017/s1431927600027598.

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Ni, Pd and Cr thin films were grown on (100)SrTiO3 surfaces by molecular beam epitaxy at substrate temperatures of TNJ, pd=650°C and Tcr =150°C. Electron energy-loss spectroscopy (EELS) and high resolution transmission electron microscopy (HRTEM) were applied to investigate the local electronic structure and the atomic structure of the interfaces, respectively. Analytical microscopy was carried out with a parallel energy-loss spectrometer (PEELS766) attached to a dedicated scanning transmission electron microscope (STEM) operated at 100keV, which has a point resolution of 0.22 nm. HRTEM studie

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15

Kogure, T. "Stacking structures in pyrophyllite revealed by high-resolution transmission electron microscopy (HRTEM)." American Mineralogist 91, no. 8-9 (2006): 1293–99. http://dx.doi.org/10.2138/am.2006.1997.

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16

Mekhantseva, Tamara, Oleg Voitenko, Ilya Smirnov, et al. "TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System." Advanced Materials Research 590 (November 2012): 9–12. http://dx.doi.org/10.4028/www.scientific.net/amr.590.9.

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This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently gro

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17

Ferrow, Embaie A., and Sven Hovmoller. "Crystallographic image processing (CIP) and high-resolution transmission electron microscopy (HRTEM) studies of bannisterite: a 2:1 type modulated layer silicate." European Journal of Mineralogy 5, no. 1 (1993): 181–88. http://dx.doi.org/10.1127/ejm/5/1/0181.

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18

Kaiser, U., A. Chuvilin, P. D. Brown, and W. Richter. "Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC." Microscopy and Microanalysis 5, no. 6 (1999): 420–27. http://dx.doi.org/10.1017/s1431927699990487.

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Abstract: High-resolution transmission electron microscopy (HRTEM) images of the [1–10] zone of cubic SiC layers grown by molecular beam epitaxy (MBE) often reveal regions of material exhibiting an unusual threefold periodicity. The same contrast was found in earlier works of Jepps and Page, who attributed this contrast in HRTEM images of polycrystalline SiC to the 9R-SiC polytype. In this report we demonstrate by HRTEM image simulations that the model of the 9R polytype and an alternative twinning model can fit qualitatively the experimental HRTEM images. However, by comparing the fast Fourie

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19

Podor, R., V. Trillaud, G. I. Nkou Bouala, N. Dacheux, C. Ricolleau, and N. Clavier. "A multiscale in situ high temperature high resolution transmission electron microscopy study of ThO2 sintering." Nanoscale 13, no. 15 (2021): 7362–74. http://dx.doi.org/10.1039/d1nr00956g.

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Two-grain systems formed by ThO<sub>2</sub> nanospheres are used to study the initial stage of sintering up to 1050 °C using HT-HRTEM. The low temperature crystallite rearrangements as well as grain boundary formation and growth are observed.

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20

Málek, Jiří, Takefumi Mitsuhashi, Julio Ramírez-Castellanos, and Yoshio Matsui. "Calorimetric and high-resolution transmission electron microscopy study of nanocrystallization in zirconia gel." Journal of Materials Research 14, no. 5 (1999): 1834–43. http://dx.doi.org/10.1557/jmr.1999.0247.

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The formation of metastable tetragonal zirconia nanophase by thermal treatment of a zirconia gel derived from zirconyl chloride has been studied by high-resolution transmission electron microscopy (HRTEM) and differential scanning calorimetry (DSC). HRTEM observations revealed that a fully crystallized sample consists of nanocrystals, around 13 nm in size. This nanocrystalline t-ZrO2 has practically the same crystal structure as that of the high-temperature tetragonal zirconia phase. The nonisothermal crystallization rate is very fast in as-prepared zirconia gel. DSC data at various heating ra

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21

Ma, Jing Ling, Jiu Ba Wen, and Yan Fu Yan. "HRTEM Investigation of Precipitates in Al-Zn-In-Mg-Ti-Ce Anode Alloy." Advanced Materials Research 189-193 (February 2011): 1036–39. http://dx.doi.org/10.4028/www.scientific.net/amr.189-193.1036.

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The precipitates of Al-5Zn-0.02In-1Mg-0.05Ti-0.5Ce (wt %) anode alloy were studied by scanning electron microscopy, X-ray microanalysis, high resolution transmission electron microscopy and selected area electron diffraction analyses in the present work. The results show that the alloy mainly contains hexagonal structure MgZn2 and tetragonal structure Al2CeZn2 precipitates. From high resolution transmission electron microscopy and selected area electron diffraction, aluminium, Al2CeZn2 and MgZn2 phases have [0 1 -1]Al|| [1 -10]Al2CeZn2|| [-1 1 0 1]MgZn2orientation relation, and Al2CeZn2 and Mg

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22

Zhang, Zaoli, and Min Gao. "Uniformly distributed nickel nanoparticles created by heating the carbon nanotube." Journal of Materials Research 18, no. 3 (2003): 604–8. http://dx.doi.org/10.1557/jmr.2003.0078.

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Uniformly distributed nanoparticles created by heating carbon nanotubes synthesized by arc-discharge were studied by electron diffraction, high-resolution transmission electron microscopy (HRTEM), electron energy loss spectroscopy (EELS), and x-ray energy dispersive spectrometer (EDS). The nanoparticles have diameters in the range of 3–15 nm. Electron diffraction pattern and HRTEM images analysis both show that the nanoparticles can be nickel or diamond. EELS and EDS analysis in a dedicated scanning transmission electron microscope showed that the nanoparticles are face-centered-cubic nickel p

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23

Nelson, Florence, Alain C. Diebold, and Robert Hull. "Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking." Microscopy and Microanalysis 16, no. 2 (2010): 194–99. http://dx.doi.org/10.1017/s1431927609991309.

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AbstractGraphene is a single layer of carbon atoms arranged in a hexagonal lattice. The high carrier mobility and mechanical robustness of single layer graphene make it an attractive material for “beyond CMOS” devices. The current work investigates through high-resolution transmission electron microscopy (HRTEM) image simulation the sensitivity of aberration-corrected HRTEM to the different graphene stacking configurations AAA/ABA/ABC as well as bilayers with rotational misorientations between the individual layers. High-angle annular dark field–scanning transmission electron microscopy simula

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24

Xu, Huifang, and Pingqiu Fu. "Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)." Microscopy and Microanalysis 6, S2 (2000): 208–9. http://dx.doi.org/10.1017/s1431927600033535.

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Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTE

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25

Brydson, Rik, Peter C. Twigg, Fiona Loughran, and Frank L. Riley. "Influence of CaO–SiO2 ratio on the chemistry of intergranular films in liquid-phase sintered alumina and implications for rate of erosive wear." Journal of Materials Research 16, no. 3 (2001): 652–65. http://dx.doi.org/10.1557/jmr.2001.0120.

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Polycrystalline aluminas sintered with 10 wt% additions of calcium oxide (CaO) and silica (SiO2) in varying molar ratios were fabricated via precipitation, calcination, and hot pressing. Alumina microstructures were analyzed by scanning electron microscopy in terms of their mean grain size, grain size distribution, and grain aspect ratios. High-resolution transmission electron microscopy (HRTEM) showed the presence of an amorphous intergranular glassy phase at two- and three-grain boundaries. The intergranular film width at two-grain boundaries, determined by HRTEM, appeared to vary with the [

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26

Bursill, L. A., O. Leckel, and M. G. Blanchin. "High-resolution transmission electron microscopic (HRTEM) studies of Tl2Ba2CuO6±x." Journal of Alloys and Compounds 195 (May 1993): 125–28. http://dx.doi.org/10.1016/0925-8388(93)90702-o.

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27

Apicella, B., P. Pré, M. Alfè, et al. "Soot nanostructure evolution in premixed flames by High Resolution Electron Transmission Microscopy (HRTEM)." Proceedings of the Combustion Institute 35, no. 2 (2015): 1895–902. http://dx.doi.org/10.1016/j.proci.2014.06.121.

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28

Clark, D. J. M., and R. W. Truss. "High resolution transmission electron microscopy (HRTEM) and image analysis of uPVC thin films." Micron 25, no. 6 (1994): 547–50. http://dx.doi.org/10.1016/0968-4328(94)90017-5.

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29

Howe, James M. "In Situ hot-stage high-resolution Transmission Electron Microscope studies of the mechanisms and kinetics of precipitation reactions." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 228–29. http://dx.doi.org/10.1017/s0424820100137513.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the mechanisms and kinetics of precipitation reactions at the atomic level. Such information is required to understand phase transformations and the behavior of material interfaces. This paper provides a brief summary of the in situ hot-stage HRTEM technique and illustrates the use of this technique to obtain information about heterogeneous nucleation processes in precipitation and crystallization reactions. Examples of other types of in situ HRTEM studies can be found in pre

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30

Takaoka, H., M. Tomita, and T. Hayashi. "High-resolution transmission electron microscopic study of highly oxygen doped silicon layer." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 692–93. http://dx.doi.org/10.1017/s0424820100155438.

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High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped sam

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31

Stenkamp, D. "Quantitative determination of imaging parameters and composition from high-resolution transmission electron microscopy lattice images." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 96–97. http://dx.doi.org/10.1017/s0424820100162946.

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A quantitative method for the direct determination of defocus Δf, local sample thickness t and local composition x from high-resolution transmission electron microscopy (HRTEM) lattice images of wedge-shaped samples is described. The method is applicable to a wide class of crystalline materials comprising elemental semiconductors, elemental metals and substitutional random alloys composed of these elements. The proposed method relies on the functional dependence of linear and non-linear image Fourier coefficients on the parameters defocus Δf, sample thickness t and composition x. This relation

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32

O’Keefe, Michael A. "Limits to Spatial Resolution in the HRTEM." Microscopy and Microanalysis 3, S2 (1997): 1165–66. http://dx.doi.org/10.1017/s143192760001271x.

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The resolution of the high-resolution transmission electron microscope is limited by the specimen as well as by the HRTEM. For specimens that beam-damage, image resolution depends upon electron energy and electron dose. For small-cell crystalline specimens, Bragg’s law quantizes allowable reso-lutions, preventing image resolution from reaching instrumental resolutiqn. Specimen thickness be-comes increasingly important at higher resolutions. For a resolution of d(Å), we need the specimen to diffract at u=1/d. Consideration of the intersection of the Ewald sphere with the specimen shape trans-fo

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Javed, Qurat Ul Ain, Feng Ping Wang, M. Yasir Rafique, and M. Zubair Iqbal. "Phase Sensitive Behavior and Optical Properties of Cu_0.45Mn_0.55O₂ Nanoparticles." Advanced Materials Research 548 (July 2012): 110–14. http://dx.doi.org/10.4028/www.scientific.net/amr.548.110.

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In this work, we have reported a facile approach to fabricate the new Cu0.45Mn0.55O2 nanoparticles with novel properties. The detailed characteristic of the nanoparticles have been performed by X-Ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, transmission electron microscopy (TEM), high resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), and UV-visible spectroscopy. HRTEM and SAED measurements point out that the nanoparticles are phase sensitive during exposure to electron beam irradiation and under

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Mills, M. J. "High-resolution Electron Microscopy of defects in Ni3Al." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 302–3. http://dx.doi.org/10.1017/s0424820100153488.

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The improved resolution of the latest generation of intermediate voltage electron microscopes makes possible the direct study of the atomic structure of defects in close-packed metals and alloys. Of particular technological interest are several classes of intermetallic compounds which exhibit desirable mechanical properties at higher temperatures. This paper demonstrates the current application of high resolution transmission electron microscopy (HRTEM) to the study of dislocation cores and interfaces in nickel-based alloys, and the implications of the observations in terms of models of deform

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Saleh, Hoda H., Rehab Sokary, and Zakaria I. Ali. "Radiation – induced preparation of polyaniline/poly vinyl alcohol nanocomposites and their properties." Radiochimica Acta 107, no. 8 (2019): 725–35. http://dx.doi.org/10.1515/ract-2018-3003.

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Abstract Polyaniline (PANI) nanoparticles and PANI/poly vinyl alcohol (PVA) nanocomposite films were synthesized by the oxidative polymerization of aniline and ammonium peroxodisulfate (APS), as an oxidizing agent in aqueous medium. The PANI/PVA nanocomposite films were exposed to γ-irradiation after oxidative polymerization. Synthesized polyaniline (PANI) nanoparticles and PANI/PVA nanocomposite films were characterized by attenuated total reflectance infrared spectroscopy (FTIR-ATR), X-ray diffraction, high resolution scanning electron microscopy, (HRSEM) high resolution transmission electro

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36

Xin, Ren Long, Yang Leng, and Ning Wang. "TEM Examinations of OCP/HA Transformation." Key Engineering Materials 309-311 (May 2006): 191–94. http://dx.doi.org/10.4028/www.scientific.net/kem.309-311.191.

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We have directly observed the transformation from octacalcium phosphate (OCP) to hydroxyapatite (HA) in transmission electron microscope (TEM). The phase transformation was induced by electron beam irradiation in TEM. Several TEM techniques were employed to examine the crystal structure change, including bright field images, electron diffraction, high resolution microscopy (HRTEM) and fast Fourier transformation pattern of HRTEM images. The examinations indicate possible hydrolysis reaction in solid state transformation and crystallographic orientation of OCP (010)//HA (010) and OCP (001)//HA

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Hatakeyama, Tetsuo, Hirofumi Matsuhata, T. Suzuki, Takashi Shinohe, and Hajime Okumura. "Microscopic Examination of SiO₂/4H-SiC Interfaces." Materials Science Forum 679-680 (March 2011): 330–33. http://dx.doi.org/10.4028/www.scientific.net/msf.679-680.330.

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SiO2/4H-SiC interfaces are examined by high-resolution transmission electron microscopy (HRTEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and spatially resolved electron energy-loss spectroscopy (EELS). HRTEM and HAADF-STEM images of SiO2/4H-SiC interfaces reveal that abrupt interfaces are formed irrespective of the fabrication conditions. Transition regions around the interfaces reported by Zheleva et al. were not observed. Using EELS, profiles of the C/Si and O/Si ratios across an interface were measured. Our measurements did not reveal a C-rich r

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38

Miao, Qing Qing, Ying Mao Tang, Wen Wen Chen, et al. "Electrospun La³⁺-Doped ZnO Nanofibers with High Photocatalytic Activity for Rhodamine B Degradation." Advanced Materials Research 779-780 (September 2013): 337–42. http://dx.doi.org/10.4028/www.scientific.net/amr.779-780.337.

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Grape-like structure La3+-doped ZnO nanofibers with different doping concentrations were prepared by electrospinning-calcination technology. The resultant nanofibers were characterized by field-emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), high resolution transmission electron microscopy (HRTEM), photoluminescence spectrum (PL) and X-ray photoelectron spectrum (XPS) respectively. The photocatalytic activities of the nanofibers for the degradation of Rhodamine B (RhB) in aqueous solution were studied. Results show that the doping concentration of La3+ ha

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Wang, Zhi Yuan, Feng Ping Wang, Ming Yan Li, et al. "Synthesis and Hydrogen Absorption Capacity of Multilayered SnO₂ Hollow Microspheres." Advanced Materials Research 924 (April 2014): 57–60. http://dx.doi.org/10.4028/www.scientific.net/amr.924.57.

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Multilayered SnO2hollow microspheres (MHS-SnO2) have been successfully synthesized via a solvothermal method by using glycol-water as solvent. The morphology, composition and structure of the product have been characterized by field-emission scanning electron microscopy (FESEM) with an energy dispersive X-ray (EDX) spectroscopy, transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM) with selected area electron diffraction (SAED) and X-ray diffraction (XRD). The FESEM, TEM and HRTEM images indicate that the as-prepared microspheres show multilayered str

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Howe, James M. "In situ high-resolution Transmission electron microscopy of interphase boundary motion in metallic alloys." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 450–51. http://dx.doi.org/10.1017/s0424820100086556.

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Information provided by in situ studies is often essential for understanding microstructural evolution in solids. The recent development of intermediate-voltage high-resolution transmission electron microscopes (HRTEM) with in situ heating capabilities now provides the opportunity to perform in situ high-resolution studies of interphase boundary (IPB) motion. This paper presents initial results on in situ HRTEM studies of IPB motion in metallic alloys, in particular, during growth of Q precipitates in an Al-Cu-Mg-Ag alloy and Pd3Si crystals in an amorphous Pd-Si alloy.Samples of an Al-4Cu-0.5M

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O'Keefe, Michael A. "Where are the limits to spatial resolution in the HRTEM?" Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 280–81. http://dx.doi.org/10.1017/s042482010013777x.

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In discussing resolution limits, it is important to distinguish between the resolution of a microscope and the resolutions of the images produced by the microscope. The spatial resolution of a high-resolution transmission electron microscope (HRTEM) is an upper bound on the resolution of images that can be produced by that microscope, but there is no guarantee that any particular image from the microscope will attain this bound. In addition to instrumental limits, properties of the specimen will act to degrade image resolutions. For specimens that beam-damage rapidly, image resolution depends

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Sutrisno, H., E. D. Siswani, and K. S. Budiasih. "The effect of sintering temperatures of TiO2(B)-nanotubes on its microstructure." Science of Sintering 50, no. 3 (2018): 291–98. http://dx.doi.org/10.2298/sos1803291s.

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Titanium dioxide (TiO2)-nanotubes were prepared by a simple technique reflux. The morphologies and microstructures of nanotubes were characterized by high resolution scanning electron microscopy (HRSEM), high resolution transmission electron microscopy (TEM), powder X-ray diffraction (XRD,) energy dispersive X-ray spectroscopy (EDS) and surface area analyzer. The microstructures of TiO2 phases obtained from the sintering process of TiO2-nanotubes for 1 hour at various temperatures from 100 to 1000?C at intervals of 50?C were investigated from the XRD diffractograms. The analyses of morphologie

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Sajjad, Muhammad, and Peter Feng. "Electron microscopic characterization of multi-layer boron nitride nanosheets." MRS Proceedings 1549 (2013): 85–90. http://dx.doi.org/10.1557/opl.2013.859.

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AbstractWe report on the direct synthesis of multi-layer boron nitride nanosheets (BNNSs) and their electron microscopic characterization. The synthesis process is carried out by irradiating hexagonal boron nitride (h-BN) target using short laser pulses. Scanning electron microscopy showed large area (≈50×50 μm2) flat layers of BNNSs transparent to the electron beam. Low magnification transmission electron microscope (TEM) is used to characterize different areas of nanosheets. TEM revealed that each individual nanosheet is composed of several layers. High resolution TEM (HRTEM) measurements co

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Howe, J. M., T. M. Murray, K. T. Moore, et al. "Understanding Interphase Boundary Dynamics by In Situ High-Resolution and Energy-Filtering Transmission Electron Microscopy and Real-Time Image Simulation." Microscopy and Microanalysis 4, no. 3 (1998): 235–47. http://dx.doi.org/10.1017/s1431927698980230.

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This study discusses the use of in situ high-resolution transmission electron microscropy (HRTEM) techniques to determine the structure, composition, and interphase boundary dynamics during phase transformations at the atomic level. Three main in situ HRTEM techniques are described: (1) in situ HRTEM dynamic studies that are performed on the same precipitate plates from different viewing directions to determine the three-dimensional structure of the interfaces; (2) in situ compositional mapping of precipitate interfaces obtained by energy-filtering TEM experiments at temperature in a HRTEM, an

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Kogure, Toshihiro, and Atsuyuki Inoue. "Determination of defect structures in kaolin minerals by high-resolution transmission electron microscopy (HRTEM)." American Mineralogist 90, no. 1 (2005): 85–89. http://dx.doi.org/10.2138/am.2005.1603.

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Capitani, G. C., and M. Mellini. "High-resolution transmission electron microscopy (HRTEM) investigation of antigorite polysomes (m = 15 to 18)." American Mineralogist 92, no. 1 (2007): 64–71. http://dx.doi.org/10.2138/am.2007.2188.

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Tokumoto, Yuki, Naoya Shibata, Teruyasu Mizoguchi, et al. "High-resolution transmission electron microscopy (HRTEM) observation of dislocation structures in AlN thin films." Journal of Materials Research 23, no. 8 (2008): 2188–94. http://dx.doi.org/10.1557/jmr.2008.0265.

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The structure and configuration of threading dislocations (TDs) in AlN films grown on (0001) sapphire by metal–organic vapor phase epitaxy (MOVPE) were characterized by high-resolution transmission electron microscopy (HRTEM). It was found that the TDs formed in the films were mainly the perfect edge dislocations with the Burgers vector of b = ⅓〈11¯20〉. The majority of the edge TDs were not randomly formed but densely arranged in lines. The arrays of the edge TDs were mainly observed on the {11¯20} and {10¯10} planes. These two planes showed different configurations of TDs. TD arrays on both o

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Qiao, G. W., J. Zhou, and K. H. Kuo. "High Resolution Transmission Electron Microscopy of Some Catalysts." Zeitschrift für Naturforschung A 41, no. 3 (1986): 478–82. http://dx.doi.org/10.1515/zna-1986-0304.

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Application of high resolution electron microscopy (HREM) to the study of Pt-Sn/γ-Al2O3 supported catalyst, zeolites, iron catalyst for ammonia synthesis, rare-earth oxide catalysts, etc., is described. Micro-twins, dislocations and other crystallographic imperfections are observed. Moreover, the structure images of channels representing columns of cages in several kinds of zeolites as well as radiation damage processes in them have been recorded in situ. The observed images of zeolites were found to be in good agreement with the structure model projections and computer simulated images.

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Taniyama, A., D. Shindo, T. Oikawa та M. Kersker. "Detective Quantum Efficiency of 25μm Pixel Imaging Plate". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 серпня 1996): 456–57. http://dx.doi.org/10.1017/s042482010016474x.

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The 25μm pixel Imaging Plate (IP) is expected to apply to high-resolution transmission electron microscopy (HRTEM) because of its higher spatial resolution than the 50μm pixel IP. It seems that the 25μm pixel IP, which has wide dynamic range and good linearity, is effective for HRTEM with low exposure to reduce electron radiation damage. In order to apply the IP to the HRTEM appropriately, it is necessary to understand the detective efficiency of the IP. In this paper, signal to noise (S/N) ratio and detective quantum efficiency (DQE) of the 25μm pixel IP at accelerating voltages of 100, 200 a

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Ospina, C. A., J. Terra, Antonio Jose Ramirez, D. E. Ellis, and Antonella M. Rossi. "Simulations of Hydroxyapatite Nanocrystals for HRTEM Images Calculations." Key Engineering Materials 493-494 (October 2011): 763–67. http://dx.doi.org/10.4028/www.scientific.net/kem.493-494.763.

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Hydroxyapatite (HA, Ca10(PO4)6(OH)2) is one of the most important biomaterials used in bone regeneration therapies due to their chemical properties are very similar to the inorganic phase found in bone tissues. The direct observation of the ultrastructure of HA is very important in the comprehension of their nucleation and interactions with the molecules involved in bone formation. High-resolution Transmission Electron Microscopy (HRTEM) is a currently technique used for this task. However, the interpretation of the images is not straightforward and needs the use of softwares dedicated to high

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