Relevant bibliographies by topics / Secondary electron yield

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  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers
  5. Reports

Academic literature on the topic 'Secondary electron yield'

Author: Grafiati
Published: 4 June 2021
Last updated: 3 February 2022

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Journal articles on the topic "Secondary electron yield"

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XIE, AI-GEN, HAN-SUP UHM, YUN-YUN CHEN, and EUN-HA CHOI. "MAXIMUM SECONDARY ELECTRON YIELD AND PARAMETERS OF SECONDARY ELECTRON YIELD OF METALS." Surface Review and Letters 23, no. 05 (2016): 1650039. http://dx.doi.org/10.1142/s0218625x16500396.

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On the basis of the free-electron model, the energy range of internal secondary electrons, the energy band of a metal, the formula for inelastic mean escape depth, the processes and characteristics of secondary electron emission, the probability of internal secondary electrons reaching surface and passing over the surface barrier into vacuum B as a function of original work function [Formula: see text] and the distance from Fermi energy to the bottom of the conduction band [Formula: see text] was deduced. According to the characteristics of creation of an excited electron, the definition of average energy required to produce an internal secondary electron [Formula: see text], the energy range of excited electrons and internal secondary electrons and the energy band of a metal, the formula for expressing [Formula: see text] using the number of valence electron of the atom V, [Formula: see text] and atomic number Z was obtained. Based on the processes and characteristics of secondary electron emission, several relationships among the parameters of the secondary electron emission and the deduced formulae for B and [Formula: see text], the formula for expressing maximum secondary electron yield of metals [Formula: see text] using Z, V, back-scattering coefficient r, incident energy of primary electron at which secondary electron yield reaches [Formula: see text], [Formula: see text] and [Formula: see text] was deduced and demonstrated to be true. According to the deduced formula for [Formula: see text] and the relationships among [Formula: see text] and several parameters of secondary electron emitter, it can be concluded that high [Formula: see text] values are linked to high V, Z and [Formula: see text] values, and vice versa. Based on the processes and characteristics of secondary electron emission and the deduced formulae for the B, [Formula: see text] and [Formula: see text], the influences of surface properties on [Formula: see text] were discussed.
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XIE, AI-GEN, LING WANG, and LIU-HUA MU. "FORMULA FOR MAXIMUM SECONDARY ELECTRON YIELD FROM METALS." Surface Review and Letters 22, no. 02 (2015): 1550019. http://dx.doi.org/10.1142/s0218625x15500195.

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Based on free-electron model, the calculated inelastic mean escape depth of secondary electrons, experimental one, the energy band of metal, the characteristics and processes of secondary electron emission, maximum number of secondary electrons released per primary electron δ(Φ,EF)PEm as a function of parameter Km, work function Φ and Fermi energy EF was deduced, where Km is a constant for a given metal in the energy range 100–800 eV. According to the relationship between maximum secondary electron yield from metal δ(Φ,EF)m and δ(Φ,EF)PEm, the formula for δ(Φ,EF)m as a function of atomic number Z, parameter Km, Φ and EF was deduced. Using the deduced formula for δ(Φ,EF)m, Z, experimental δ(Φ,EF)m, Φ and EF, Km relative to alkali metals, Km relative to earth-alkali metals and the mean value of Km were computed, respectively. And the formulae for maximum secondary electron yield from alkali metals, earth-alkali metals and metals were obtained and proved to be true, respectively. On the basis of the deduced formula for δ(Φ,EF)m and the empirical relation that high Φ are connected with high EF, it can be concluded that high δ(Φ,EF)m are connected with high Φ and vice versa.
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XIE, A. G., Z. H. LIU, Y. Q. XIA, and M. M. ZHU. "MAXIMUM SECONDARY ELECTRON YIELDS FROM SEMICONDUCTORS AND INSULATORS." Surface Review and Letters 24, no. 04 (2016): 1750045. http://dx.doi.org/10.1142/s0218625x17500457.

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Based on the processes and characteristics of secondary electron emission and the formula for the yield due to primary electrons hitting on semiconductors and insulators, the universal formula for maximum yield [Formula: see text] due to primary electrons hitting on semiconductors and insulators was deduced, where [Formula: see text] is the maximum ratio of the number of secondary electrons produced by primary electrons to the number of primary electrons. On the basis of the formulae for primary range in different energy ranges of [Formula: see text], characteristics of secondary electron emission and the deduced universal formula for [Formula: see text], the formulae for [Formula: see text] in different energy ranges of [Formula: see text] were deduced, where [Formula: see text] is the primary incident energy at which secondary electron yields from semiconductors and insulators, [Formula: see text], are maximized to maximum secondary electron yields from semiconductors and insulators, [Formula: see text]; and [Formula: see text] is the maximum ratio of the number of total secondary electrons produced by primary electrons and backscattered electrons to the number of primary electrons. According to the deduced formulae for [Formula: see text], the relationship among [Formula: see text], [Formula: see text] and high-energy back-scattering coefficient [Formula: see text], the formulae for parameters of [Formula: see text] and the experimental data as well as the formulae for [Formula: see text] in different energy ranges of [Formula: see text] as a function of [Formula: see text], [Formula: see text], [Formula: see text] and [Formula: see text] were deduced, where [Formula: see text] and [Formula: see text] are the original electron affinity and the width of forbidden band, respectively. The scattering of [Formula: see text] was analyzed, and calculated [Formula: see text] values were compared with the values measured experimentally. It was concluded that the deduced formulae for [Formula: see text] were found to be universal for [Formula: see text].
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Russ, John C. "Monte Carlo Modelling of Secondary Electron Yield from Rough Surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 422–23. http://dx.doi.org/10.1017/s0424820100180860.

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Monte-Carlo programs are well recognized for their ability to model electron beam interactions with samples, and to incorporate boundary conditions such as compositional or surface variations which are difficult to handle analytically. This success has been especially powerful for modelling X-ray emission and the backscattering of high energy electrons. Secondary electron emission has proven to be somewhat more difficult, since the diffusion of the generated secondaries to the surface is strongly geometry dependent, and requires analytical calculations as well as material parameters. Modelling of secondary electron yield within a Monte-Carlo framework has been done using multiple scattering programs, but is not readily adapted to the moderately complex geometries associated with samples such as microelectronic devices, etc.This paper reports results using a different approach in which simplifying assumptions are made to permit direct and easy estimation of the secondary electron signal from samples of arbitrary complexity. The single-scattering program which performs the basic Monte-Carlo simulation (and is also used for backscattered electron and EBIC simulation) allows multiple regions to be defined within the sample, each with boundaries formed by a polygon of any number of sides. Each region may be given any elemental composition in atomic percent. In addition to the regions comprising the primary structure of the sample, a series of thin regions are defined along the surface(s) in which the total energy loss of the primary electrons is summed. This energy loss is assumed to be proportional to the generated secondary electron signal which would be emitted from the sample. The only adjustable variable is the thickness of the region, which plays the same role as the mean free path of the secondary electrons in an analytical calculation. This is treated as an empirical factor, similar in many respects to the λ and ε parameters in the Joy model.
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Xie Aigen, 谢爱根, 张健 Zhang Jian, 刘斌 Liu Bin, and 王铁邦 Wang Tiebang. "Formula for secondary electron yield from metals." High Power Laser and Particle Beams 24, no. 2 (2012): 481–85. http://dx.doi.org/10.3788/hplpb20122402.0481.

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Costa Pinto, P., S. Calatroni, H. Neupert, et al. "Carbon coatings with low secondary electron yield." Vacuum 98 (December 2013): 29–36. http://dx.doi.org/10.1016/j.vacuum.2013.03.001.

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Thiel, B. L., D. J. Stokes, and D. Phifer. "Secondary Electron Yield Curve for Liquid Water." Microscopy and Microanalysis 5, S2 (1999): 282–83. http://dx.doi.org/10.1017/s1431927600014732.

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We have measured the secondary electron yield curve for liquid water using an Environmental SEM. The secondary electron emission coefficient, measured as a function of incident electron energy, is important for interpreting contrast in hydrated biological and inorganic specimens. This information is even more critical for water than other materials, as it is a factor of prime importance in understanding radiation damage in biological tissues.[1]These measurements were taken using a Philips XL-30 field emission ,ESEM, and repeated on an Electroscan E3 ESEM, equipped with a CeB6 filament. A specially designed Faraday cup was fashioned from brass and fitted with a removable graphite cup having an inset for a platinum aperture. This assembly was placed into an electrically floating Peltier cooling stage, and connected to a KE Instruments probe current meter.
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Alam, M. K., P. Yaghoobi, M. Chang, and A. Nojeh. "Secondary electron yield of multiwalled carbon nanotubes." Applied Physics Letters 97, no. 26 (2010): 261902. http://dx.doi.org/10.1063/1.3532851.

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Valizadeh, Reza, Oleg B. Malyshev, Sihui Wang, Svetlana A. Zolotovskaya, W. Allan Gillespie, and Amin Abdolvand. "Low secondary electron yield engineered surface for electron cloud mitigation." Applied Physics Letters 105, no. 23 (2014): 231605. http://dx.doi.org/10.1063/1.4902993.

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Susczynsky, D. M., and F. I. Klavetter. "Secondary-electron yield measurements of conducting polymers in the Scanning electron microscope." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1066–67. http://dx.doi.org/10.1017/s0424820100089640.

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In recent years, research on conducting polymers has been motivated to a large extent by the prospect of developing low-cost, light-weight conducting polymeric materials for commercial use. Conducting polymers have potential uses as electrodes and/or electrolytes for rechargeable batteries, as power conductors andpowercable sheathing and as material for space photovoltaics and spacecraft-charging applications.The utilization of conducting polymers for spacecraft construction and instrumentation requires an understanding of how such materials respond to the spacecraft environment. Of particular importance is how and to what degree such a material will charge when exposed to the wide range of energetic fluxes of electrons and protons that characterize a typical satellite environment. For typical space plasma environments, the total charging current to a satellite is given by the net sum of the electron and proton particle currents from the ambient plasma to the satellite, the secondary-electron and backscatter-electron emission currents arising from ambient-particle impact, and the photoelectron emission current resulting from solar UV.
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Dissertations / Theses on the topic "Secondary electron yield"

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Farhang, Mohammad Hossein. "Secondary electron emission yield from carbon samples." Thesis, University of Southampton, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.318220.

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Vempati, Pratyusha. "Analytical fits to Secondary Emission Yield Data." University of Cincinnati / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801.

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Wang, Sihui. "Secondary electron yield measurements of anti-multipacting surfaces for accelerators." Thesis, Loughborough University, 2016. https://dspace.lboro.ac.uk/2134/23255.

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Electron cloud is an unwanted effect limiting the performance of particle accelerators with positively charged particle beams of high-intensity and short bunch spacing. However, electron cloud caused by beam induced multipacting can be sufficiently suppressed if the secondary electron yield (SEY) of accelerator chamber surface is lower than unity. Usually, the SEY is reduced by two ways: modification of surface chemistry and engineering the surface roughness. The objective of this PhD project is a systematic study of SEY as a function of various surface related parameters such as surface chemistry and surface morphology, as well as an effect of such common treatments for particle accelerators as beam pipe bakeout and surface conditioning with a beam, ultimately aiming to engineer the surfaces with low SEY for the electron cloud mitigation. In this work, transition metals and their coatings and laser treated surface were studied as a function of annealing treatment and electron bombardment. The transition metal thin films have been prepared by DC magnetron sputtering for further test. In the first two Chapter of this thesis, the literature review on electron emission effect is introduced, which includes the process of the electron emission, the influence factor and examples of low SEY materials. In the third Chapter, the experimental methods for SEY measurements and surface investigation used in this work are described. In Chapter 4, the SEY measurement setup which is built by myself are introduced in detail. In Chapter 5 transition metals and their coatings and non-evaporable getter (NEG) coatings have been studied. All the samples have been characterized by SEY measurements, their surface morphology was analysed with Scanning Electron Microscopy (SEM) and their chemistry was studied with X-ray Photoelectron Spectroscopy (XPS). Different surface treatments such as conditioning by electron beam, thermal treatment under vacuum on the sample surfaces have been investigated. For example, the maximum SEY (δmax) of as-received Ti, Zr, V and Hf were 2.30, 2.31, 1.72 and 2.45, respectively. After a dose of 7.9x10-3 C mm-2, δmax of Ti drops to 1.19. δmax for Zr, V and Hf drop to 1.27, 1.48 and 1.40 after doses of 6.4x10-3 C mm-2, 1.3x10-3 and 5.2x10-3 C mm-2, respectively. After heating to 350 °C for 2.5 hours, the SEY of bulk Ti has dropped to 1.21 and 1.40, respectively. As the all bulk samples have a flat surface, there are no difference of morphology. So this reduction of SEY is believed to be a consequence of the growth of a thin graphitic film on the surface after electron bombardment and the removal of the contaminations on the surface after annealing. Chapter 6 of this thesis is about the laser treated surface. Laser irradiation can transform highly reflective metals to black or dark coloured metal. From SEM results, metal surfaces modified by a nanosecond pulsed laser irradiation form a highly organised pyramid surface microstructures, which increase the surface roughness. Due to this reason, δmax of as-received laser treated surface could be lower than 1, which can avoid the electron cloud phenomenon. In this Chapter, the influence of different laser treatment parameters, such as power, hatch distance, different atmospheres on SEY has been investigated. Meanwhile, different surface treatments such as electron conditioning and thermal treatments are studied on the laser treated surface with the investigation of XPS. For example, the δmax of as-received type I with hatch distance 50, 60 and 80 μm in Air are 0.75, 0.75 and 0.80, respectively. After heating to 250 °C for 2 hours, in all case the δmax drop to 0.59, 0.60, 0.62, respectively. The SEYs of all as-received samples are lower than 1 due to the increasing the roughness on the surface by the special pyramid structure. After thermal treatment, the SEY reduces even further. This is caused by removing the contaminations on the surfaces. In conclusion, the present study has largely improved the knowledge of the electron cloud mitigation techniques by surface engineering of vacuum chambers. On the one hand, the surface treatments can modify the surface chemistry, such as the produce the graphic carbon layer on the surface by electron condition and the removal the contamination layer on the top of the surface by thermal treatment. On the other hand, the SEY could be critically low by engineering the surface roughness. Both methods allow reaching δmax less than unity. The efficiency of laser treated surface for e-cloud was demonstrated for a first time leading to a great interest to this new technology application for existing and future particle accelerators.
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Ludwick, Jonathan. "Physics of High-Power Vacuum Electronic Systems Based on Carbon Nanotube Fiber Field Emitters." University of Cincinnati / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1613745398331048.

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Illemann, Jens. "Präzisionsmassebestimmung einzelner Partikel im Femtogrammbereich und Anwendungen in der Oberflächenphysik." Doctoral thesis, Universitätsbibliothek Chemnitz, 2000. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-200000677.

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In this work, a new method for mass determination of single low-charged particles in the sub-picogram regime is developed. It opens applications to chemical physics and surface science via determination of growth rates. The method combines the well-known electrodynamic quadrupole ion trap in a UHV-chamber and fourier transformation of scattered light. The achieved mass resolution of down to $10^{-4}$ at 100 fg mass on a time scale of ten seconds allows a resolution of a few percent of the mass of an adsorbed monolayer and to determine growth rates down to one molecule per second on a time scale of one day. The observation of temperature dependent sticking coefficients results in the measures of the energy of an adsorption barrier. Observation of discrete steps in the rate gives information about the density of molecules in an ordered layer. Temperature dependent desorption data gives the binding energy. The dependence of these observables on the controllable curvature and charge of the substrate's surface is measurable. The first part of this dissertation consists of a description of the common theory of the quadrupole ion trap with the completion of not widely known, newly introduced, contributions to the trapping potential. These contributions lead to systematic shifts in the mass determination. In particular the influence of the inhomogenity of the electrical field, that is used for compensating the gravitational force, is investigated analytically and corroborated experimentally. It is assumed, that the particle's finite size effects in a further shift. In the experimental part initial demonstrative measurements are presented: the time-resolved adsorption of fullerene, anthracene and NO on silica spheres with 500nm diameter has been measured at room temperature. In addition the secondary electron yield of in-situ prepared particles during irradiation with monoenergetic electrons has been determined by analyzing the distribution of change of the number of elementary charges by single events of charging.
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Baudin, Lucie. "Structuration de surface par laser dans l’environnement des accélérateurs de particules : relation entre topographie superficielle, adhésion des particules et compatibilité aux applications ultravide." Thesis, Université Paris sciences et lettres, 2020. http://www.theses.fr/2020UPSLM052.

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La structuration laser des surfaces a été développée au CERN pour le traitement des parois internes de l’enceinte à vide où circulent les protons. Le balayage de la surface par le faisceau laser creuse des sillons en ablatant le cuivre dont une partie est redéposée sur la surface sous la forme d’agrégats de particules. Cette rugosité à deux échelles absorbe efficacement les électrons, mais l’impact sur les autres fonctionnalités de la machine doit être vérifié. Pendant son opération, la surface est soumise à des forces électromagnétiques et des variations de température qui pourraient l’endommager. Deux méthodes d’extraction de particules, chocs laser et centrifugation, ont été déployées pour tester l’adhésion des particules en laboratoire. Bien qu’il ait été constaté que la surface préserverait ses propriétés, le détachement de particules, suite aux sollicitations mécaniques ou au traitement in-situ, est une question ouverte qui devrait motiver le choix de paramètres de traitement alternatifs ou d’une stratégie de nettoyage<br>Laser-assisted surface structuration was developed at CERN for the treatment of the inside wall of the vacuum system. Grooves were created by material ablation while the laser scanned the surface. A part of this material was redeposed as particle aggregates. This two-scale rugosity efficiently trap electrons. The effects on other surface functionalities had to be assessed. During its operation, the surface is submitted to electro-mechanical forces and cooling cycles which might deteriorate its performances. Two extraction techniques have been developed - laser-shocks and centrifugation - to assess particle adhesion. Although the surface properties are not detrimentally degraded, massive particle detachment during operation or during the treatment itself is an issue that should motivate the choice of alternative treatment parameters or of a cleaning strategy
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Rigoudy, Charles. "Couches minces diélectriques avec des inclusions de nanoparticules d'argent réalisées par voie plasma conçues pour le contrôle du gradient de charges électriques sous irradiation électronique pour des applications spatiales." Thesis, Toulouse 3, 2019. http://www.theses.fr/2019TOU30268.

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Le phénomène d'émission électronique est étudié dans de nombreux domaines fondamentaux de la physique et pose le principe de fonctionnement d'un grand nombre de dispositifs tels que les écrans à émission de champ, les propulseurs Hall, etc. Il est mieux compris pour les métaux. Cependant pour les matériaux isolants, il constitue un phénomène critique limitant la fiabilité des composants dans les applications spatiales où les phénomènes de décharge et de claquage sont entièrement contrôlés par l'émission électronique. Selon l'énergie des électrons incidents et les propriétés des diélectriques, les électrons peuvent être piégés au sein du matériau, et/ou être à l'origine de phénomènes d'émission électronique. Ce travail de thèse se situe à l'interface de trois domaines de recherche : le dépôt par plasma de couches minces nanocomposites, le piégeage et le transport de charges électriques dans les diélectriques, et la caractérisation des matériaux sous irradiation en milieu spatial. Il explore l'effet des nanoparticules d'argent (AgNPs) enterrées dans des couches minces de silice, sur les mécanismes physiques (injection, piégeage, transport de charges et émission électronique secondaire) responsables du chargement diélectrique et des émissions d'électrons, afin de moduler ces phénomènes. Les couches minces nanostructurées de silice contenant un plan d'AgNPs ont été élaborées par procédé plasma combinant dans un même réacteur la pulvérisation d'une cible métallique et le dépôt chimique en phase vapeur activé par plasma (PECVD). La caractérisation structurale des échantillons a permis de déterminer la composition chimique de la matrice de silice plasma, la taille, la forme, la densité et la distribution des AgNPs ainsi que l'épaisseur totale de la structure. Ces analyses ont permis de corréler les paramètres structurels avec la réponse des couches diélectriques nanostructurées réalisées sous contrainte électrique et irradiation électronique. Il a été constaté que pour des électrons primaires de faible énergie (&lt; 2keV), le rendement total d'émission d'électrons (TEEY) des couches minces de silice sans AgNPs présente une forme atypique avec un minimum local situé à environ 1 keV. Afin de mieux comprendre ce comportement, un modèle de TEEY a été développé. Il est basé sur le modèle de Dionne, et adapté aux diélectriques. Il considère le champ électrique interne résultant de l'accumulation de charges électriques dans la couche diélectrique. [...]<br>Electron emission phenomenon is intensively studied in many fundamental areas in physics and lays down the principle of operation of a large number of devices such as field emission display devices, Hall thrusters, etc. It is better described for metals. However, when originating from insulating materials it becomes a critical phenomenon involved in reliability issues of components in space applications where surface flashover phenomena and vacuum breakdown are entirely controlled by the electron emission from solids. Depending on the energy of impinging electrons and the dielectric properties, the electrons can be trapped within the dielectric bulk, and/or be responsible of electron emission phenomena. This PhD work, carried out at the interface of three research domains: plasma deposition of thin nanocomposite layers, dielectric charging and charge transport in thin dielectrics, and characterization of materials under irradiation in space environment, aims to explore the effect of metal inclusions (silver nanoparticles, AgNPs), embedded in thin dielectric silica layers, on the physical mechanisms (charge injection, trapping, transport and secondary electron emission from the surface) responsible of the dielectric charging and electron emission from dielectrics, in order to modulate them. Nanostructured thin dielectric silica layers containing a single plan of AgNPs have been elaborated by plasma process successfully combining in the same reactor sputtering of a metallic target and plasma enhanced chemical vapor deposition (PECVD). Structural characterization of the resulting samples has been performed to determine the chemical composition of the plasma silica matrix as well as to obtain the AgNPs size, shape, density and distribution and the total thickness of the structure. These analyses allowed correlation of the structural parameters with the response of the obtained nanostructured dielectric layers under electrical stress and electronic irradiation. It was found that for low energy of the incident electrons (&lt; 2keV) the total electron emission yield (TEEY) from thin silica layers without AgNPs presents an atypical shape with local minimum situated at around 1keV. To get closer to the description of this behavior a model for the TEEY was developed. It is based on Dionne's model, but adapted to dielectrics. It considers the internal electric field resulting from dielectric charging phenomenon.[...]
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Mildner, Stephanie. "Pr$_{1-x}$Ca$_x$MnO$_x$ for Catalytic Water Splitting - Optical Properties and In Situ ETEM Investigations." Doctoral thesis, 2015. http://hdl.handle.net/11858/00-1735-0000-0023-961F-0.

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Gegenstand der vorliegenden Dissertation ist die Untersuchung von Ca-dotierten PrMnO3 (PCMO) als Katalysator für die (photo)elektrochemische Wasseroxidation. Im Fokus der Untersuchungen stehen die folgenden elementaren Schritte des Gesamtprozesses: i) Die optische Absorption in PCMO wird zunächst als Funktion der Ca-Dotierung und der Temperatur untersucht mit dem Ziel, den Einfluß von Korrelationseffekten auf die optischen Eigenschaften zu verstehen. Die präsentierten Ergebnisse zeigen, dass die Bildung kleiner Polaronen im PCMO als Folge starker Korrelationswechselwirkungen in breites Absorptionsmaximum im Nah-Infrarot bis sichtbarem Energiebereich verursacht, welches im Rahmen eines Photonen-assistierten Polaronenhüpfprozesses und einer Anregung zwischen Jahn-Teller-aufgespaltenen Zuständen diskutiert wird. Weiterhin legt die Dotierungsabhängigkeit der Spektren nahe, dass O 2p und Mn 3d Hybridzustände die Fermienergie-nahe elektronische Struktur bestimmen, wobei der relative Anteil von O 2p mit der Ca-Dotierung variiert. ii) Der aktive Zustand von PCMO in Kontakt mit Wasser bzw. Wasserdampf wird mit Hilfe von Zyklovoltammetrie und in situ ‚environmental‘ Transmissionselektronenmikroskopie (ETEM) für verschiedene Dotierlevels untersucht. Die Ergebnisse beider Methoden ergeben, dass die katalysierte Wasseroxidation gemäß $2\text{H}_2\text{O} \rightarrow \text{O}_2 + 4 \text{H}^+$ mit einem Korrosionsprozess in Form einer Pr/Ca Verarmung und Amorphisierung der PCMO-Elektrode konkurriert. Die höchste katalytische Aktivität sowie Korrosionsstabilität werden im mittleren Dotierungsbereich gefunden. Auf Basis der in situ ETEM Ergebnisse wird außerdem gezeigt, dass durch Zufügen von Monosilan zu Wasserdampf-basierten Elektrolyten im ETEM eine Elektronenstrahl-induzierte Wasseroxidation an aktiven PCMO Oberflächen über die Sekundärreaktion $\text{SiH}_4+2\text{O}_2\rightarrow\text{SiO}_2+2\text{H}_2\text{O}$ nachgewiesen werden kann. Elektronenenergieverlustspektroskopie von PCMO vor und nach der Reaktion in Wasserdampf ergeben, dass der aktive Zustand von PCMO die Bildung und Ausheilung von Sauerstoffleerstellen im Rahmen einer Interkalation des bei der Wasseroxidation freiwerdenden Sauerstoffs beinhaltet. Die Rolle des Elektronenstrahls als Triebkraft für die Wasseroxidation im ETEM wird mithilfe von Elektronenholographie und elektrischen Experimenten sowie theoretischer Modellierung basierend auf Sekundärelektronenemissionen als ein positives Elektronenstrahl-induziertes elektrisches Potential identifiziert.
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Book chapters on the topic "Secondary electron yield"

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Dapor, Maurizio. "Secondary Electron Yield." In Transport of Energetic Electrons in Solids. Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-43264-5_9.

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Dapor, Maurizio. "Secondary Electron Yield." In Transport of Energetic Electrons in Solids. Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-03883-4_7.

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Dapor, Maurizio. "Secondary Electron Yield." In Transport of Energetic Electrons in Solids. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-47492-2_7.

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Nitta, Kumi, Eiji Miyazaki, Shinichiro Michizono, and Yoshio Saito. "Effects of Secondary Electron Emission Yield of Polyimide Films on Atomic Oxygen Irradiation." In Protection of Materials and Structures From the Space Environment. Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30229-9_12.

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Yan, Baojun, Shulin Liu, Kaile Wen, et al. "Secondary Electron Yield of Nano-Thick Aluminum Oxide and its Application on MCP Detector." In Springer Proceedings in Physics. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-1316-5_63.

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Damamme, Gilles, and Asdin Aoufi. "Two-Fluxes and Reaction-Diffusion Computation of Initial and Transient Secondary Electron Emission Yield by a Finite Volume Method." In Numerical Simulations - Applications, Examples and Theory. InTech, 2011. http://dx.doi.org/10.5772/12858.

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Taber, Douglass. "Enantioselective Assembly of Alkylated Stereogenic Centers." In Organic Synthesis. Oxford University Press, 2011. http://dx.doi.org/10.1093/oso/9780199764549.003.0037.

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Oxygenated secondary stereogenic centers are readily available. There is a limited range of carbon nucleophiles that will displace a secondary leaving group in high yield with clean inversion. Teruaki Mukaiyama of the Kitasato Institute has described (Chem. Lett. 2007, 36, 2) an elegant addition to this list. Phosphinites such as 1 are easily prepared from the corresponding alcohols. Quinone oxidation in the presence of a nucleophile led via efficient displacement to the coupled product 2. The sulfone could be reduced with SmI2 to give 3. Enantioselective reduction of trisubstituted alkenes is also a powerful method for establishing alkylated stereogenic centers. Juan C. Carretero of the Universidad Autonoma de Madrid has found (Angew. Chem. Int. Ed. 2007, 46, 3329) that the enantioselective reduction of unsaturated pyridyl sulfones such as 4 was directed by the sulfone, so the other geometric isomer of 4 gave the opposite enantiomer of 5. The protected hydroxy sulfone 5 is a versatile chiral building block. Samuel H. Gellman of the University of Wisconsin has reported (J. Am. Chem. Soc. 2007, 129, 6050) an improved procedure for the aminomethylation of aldehydes. L-Proline-catalyzed condensation with the matched α-methyl benzylamine derivavative 7 gave the aldehyde, which was immediately reduced to the alcohol 8 to avoid racemization. The amino alcohol 8 was easily separated in diastereomerically-pure form. In the past, aldehydes have been efficiently α-alkylated using two-electron chemistry. David W. C. Macmillan of Princeton University has developed (Science 2007, 316, 582; J. Am. Chem. Soc. 2007, 129, 7004) a one-electron alternative. The organocatalyst 9 formed an imine with the aldehyde. One-electron oxidation led to an α-radical, which was trapped by the allyl silane (or, not pictured, a silyl enol ether) leading to the α-alkylated aldehyde 10. This is mechnistically related to the work reported independently by Mukund P. Sibi (J. Am. Chem. Soc. 2007, 129, 4124; OHL Feb. 11, 2008) on one-electron α-oxygenation of aldehydes. Secondary alkylated centers can also be prepared by SN2’ alkylation of prochiral substrates such as 11. Ben L. Feringa of the University of Groningen has shown (J. Org. Chem. 2007, 72, 2558) that the displacement proceeded with high ee even with conventional Grignard reagents.
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Massawe, Expery Mathias, Peter Josephat Kirigiti, and Sauda Hatibu Mbwambo. "Rating of Cash Crop Insurance Contracts in Tanzania Using Nonparametric Methods." In Advances in Electronic Government, Digital Divide, and Regional Development. IGI Global, 2021. http://dx.doi.org/10.4018/978-1-7998-6471-4.ch018.

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This chapter used nonparametric methods to establish the parameters of cash crop insurance contracts based on zone yields. The secondary historical yields data obtained from the Food and Agriculture Organization of the United Nations, for the period of 1961 through 2018, for cotton and cashew nuts, were used both in estimating the kernel density function and forecasting the mean yield. The estimated kernel density and mean forecasts were used to tabulate, at a different level of coverage, the probability of loss, the expected yield shortfall (kilogram per hectare, denote kg/ha), and the actuarial-fair premium rates for each crop. The results showed that, at different levels of coverage (i.e., from 50% to 90%), the actuarial-fair premium rates range between 0% and 32% of the sum assured. However, the range for cashew nuts is narrow (0% to 8%) while that of cotton is 4% to 32%, a very wider range compared to cashew nuts. Further, the expected losses for cotton, in the same coverage intervals, ranges from 11.58kg/ha to 256.06kg/ha while that of cashew was 0.44kg/ha to 19.69kg/ha.
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Jordan, Robert B. "Inorganic Photochemistry." In Reaction Mechanisms of Inorganic and Organometallic Systems. Oxford University Press, 2007. http://dx.doi.org/10.1093/oso/9780195301007.003.0009.

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Electromagnetic radiation in the form of UV and visible light has long been used as a reactant in inorganic reactions. The energy of light in the 200- to 800-nm region varies between 143 and 36 kcal mol-1, so it is not surprising that chemical bonds can be affected when a system absorbs light in this readily accessible region. Systematic mechanistic studies in this area have benefited greatly from the development of lasers that provided intense monochromatic light sources and from improvements in actinometers to measure the light intensity. Prior to the laser era, it was necessary to use filters to limit the energy of the light used to a moderately narrow region or to just cut off light below a certain wavelength. Pulsed-laser systems also allow much faster monitoring of the early stages of the reaction and the detection of primary photolysis intermediates. The systems discussed in this chapter have been chosen because of their relationship to substitution reaction systems discussed previously. For a broader assessment of this area, various books and review articles should be consulted. Mechanistic photochemistry incorporates features of both electron-transfer and substitution reactions, but the field has some of its own terminology, which is summarized as follows: The quantum yield,F , is the number of defined events, in terms of reactant or product, that occur per photon absorbed by the system. An einstein, E, is defined as a mole of photons, and if n is the moles of reactant consumed or product formed, then F = n/E. For simple reactions F£ 1 but can be &gt;1 for chain reactions. An actinometer is a device used to measure the number of einsteins emitted at a particular wavelength by a particular light source. Photon-counting devices are now available and secondary chemical actinometers have been developed, such as that based on the Reineckate ion, Cr(NH3)2(NCS)4-, as well as the traditional iron(III)-oxalate and uranyl-oxalate actinometers. An early problem in this field was the lack of an actinometer covering the 450- to 600-nm range and the Reineckate actinometer solved this problem.
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Taber, Douglass. "New Methods for Functional Group Conversion." In Organic Synthesis. Oxford University Press, 2011. http://dx.doi.org/10.1093/oso/9780199764549.003.0008.

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Yujiro Hayashi of Tokyo University of Science and Teruaki Mukaiyama of the Kitasato Institute developed (Chem. Lett. 2008, 37, 592) a reduction-oxidation method for converting primary, secondary (such as 1, with clean inversion) and tertiary alcohols to sulfides. Peter A. Crooks of the University of Kentucky found (Chem. Lett. 2008, 37, 528) that tetrabenzylpyrophosphate 5 was an effective agent for condensing an acid 4 with an amine 6 to give the amide 7. This protocol, that runs in near quantitative yield in an hour at room temperature, with all impurities readily removable by washing with aqueous base and aqueous acid, appears to be well-suited both for scale-up, and for solid-phase synthesis. Balchandra M. Bhanage of the University of Mumbai reported (Tetrahedron Lett. 2008, 49, 965) the reductive amination of aldehydes, including 8, and ketones to the corresponding amines, using H2 and an inexpensive Fe catalyst. André Charette of the Université de Montréal showed (J. Am. Chem. Soc. 2008, 130, 18) that the Hantzsch ester 12 , in the presence of Tf2O, reduced amides selectively to amines. Esters, epoxides, ketones, nitriles and alkynes were stable to these conditions. Matthew Tudge of Merck Rahway demonstrated (Tetrahedron Lett . 2008, 49, 1041) that Br2 in DME activated NaBH4 , allowing facile reduction of esters, including the congested diester 14, at ambient temperature. David J. Procter of the University of Manchester made (J. Am. Chem. Soc. 2008, 130, 1136) the remarkable observation that six-membered ring lactones such as 16 were reduced to the corresponding diol with SmI2 . Five-membered ring and seven-membered ring lactones were not reduced under these conditions. Bruce H. Lipshutz of the University of California, Santa Barbara devised (Organic Lett . 2008, 10, 289) a convenient and economical procedure for CuH, using Cu and an inexpensive ligand in catalytic amounts, with PMHS as the bulk reductant. The reduction of 18 presumably proceeds by electron transfer, as with dissolving metal reduction, delivering 19 with the more stable trans ring fusion. In the presence of t-BuOH as a proton source, the reduction goes on to the alcohol 20.
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Conference papers on the topic "Secondary electron yield"

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Beránek, M., I. Richterová, Z. Němeček, et al. "Influence of the Electric Field on Secondary Electron Emission Yield." In MULTIFACETS OF DUSTRY PLASMAS: Fifth International Conference on the Physics of Dusty Plasmas. AIP, 2008. http://dx.doi.org/10.1063/1.2996796.

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Vincie, Matthew, Tod Laurvick, Hengky Chandrahalim, Richard Cobb, and James Sattler. "Avoiding Transients in Low-level Sensing of Secondary Electron Yield." In 2020 IEEE SENSORS. IEEE, 2020. http://dx.doi.org/10.1109/sensors47125.2020.9278865.

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Pivi, M., G. Collet, F. King, et al. "Secondary electron yield and groove chamber tests in PEP-II." In 2007 IEEE Particle Accelerator Conference (PAC). IEEE, 2007. http://dx.doi.org/10.1109/pac.2007.4441123.

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Malik, Talal, Mark Gilmore, Salvador Portillo, and Edl Schamiloglu. "Secondary Electron Yield Measurements on Materials of Interest to Vacuum Electron Communication Devices." In 2020 IEEE 21st International Conference on Vacuum Electronics (IVEC). IEEE, 2020. http://dx.doi.org/10.1109/ivec45766.2020.9520541.

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Qiang Wei, Malong Fu, Shengli Wu, Wenbo Hu, and Jintao Zhang. "Influence of surface charging on secondary-electron yield of MgO film." In 2015 IEEE International Vacuum Electronics Conference (IVEC). IEEE, 2015. http://dx.doi.org/10.1109/ivec.2015.7224039.

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Bajek, David, Stefan Wackerow, Monika Sitko, Sergio Calatroni, Beniamino Di Girolama, and Amin Abdolvand. "Laser Engineered Surface Structures for Custom Design of Secondary Electron Yield." In 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). IEEE, 2019. http://dx.doi.org/10.1109/cleoe-eqec.2019.8873330.

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Hu, Tiancun, Isabel Montero, Pablo Perez-Villacastin, Wanzhao Cui, Meng Cao, and Qi Wang. "Secondary electron emission yield measurement of dielectric materials for satellite antenna." In 2017 Sixth Asia-Pacific Conference on Antennas and Propagation (APCAP). IEEE, 2017. http://dx.doi.org/10.1109/apcap.2017.8420660.

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Xie, Guibai, Wanzhao Cui, and Jing Yang. "A general route towards secondary electron yield suppression based on graphene." In 2016 17th International Symposium on Antenna Technology and Applied Electromagnetics (ANTEM). IEEE, 2016. http://dx.doi.org/10.1109/antem.2016.7550131.

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Matanovic, Ivana, Maciej P. Polak, Ryan S. Johnson, Raul E. Gutierrez, Dane Morgan, and Edl Schamiloglu. "Density Functional Theory Calculations for the Simulation of Secondary Electron Yield." In 2020 IEEE 21st International Conference on Vacuum Electronics (IVEC). IEEE, 2020. http://dx.doi.org/10.1109/ivec45766.2020.9520507.

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Aoufi, A., and G. Damamme. "Reaction-diffusion and two-fluxes method computation of secondary electron emission yield." In 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2009. http://dx.doi.org/10.1109/ceidp.2009.5377739.

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Reports on the topic "Secondary electron yield"

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Kirby, R. Artifacts in Secondary Electron Emission Yield Measurements. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/827328.

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Le Pimpec, F. Electron Conditioning of Technical Aluminium Surfaces: Effect on the Secondary Electron Yield. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/839813.

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Kirby, R. Instrumental Effects in Secondary Electron Yield and Energy Distribution Measurements. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/826951.

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Le Pimpec, F. Secondary electron yield measurements from thin surface coatings for NLC electron cloud reduction. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/826924.

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Schamiloglu, Edi, and Mark Gilmore. Measurements of Secondary Electron Yield From Materials With Application to Depressed Collectors. Defense Technical Information Center, 2005. http://dx.doi.org/10.21236/ada433606.

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Le Pimpec, F. Secondary Electron Yield Measurements of TiN coating and TiZrV getter film(LCC-128). Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/826502.

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Seth A Veitzer. Final Report for "Accurate Numerical Models of the Secondary Electron Yield from Grazing-incidence Collisions". Office of Scientific and Technical Information (OSTI), 2008. http://dx.doi.org/10.2172/939670.

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Le Pimpec, F. A Continuing Story on the Secondary Electron Yield Measurements of TiN Coating and TiZrV Getter Film. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/827021.

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Le Pimpec, F., R. E. Kirby, F. K. King, and M. Pivi. The Effect of Gas Ion Bombardment on the Secondary Electron Yield of TiN, TiCN and TiZrV Coatings For Suppressing Collective Electron Effects in Storage Rings. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/875817.

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Kirby, Robert E. Secondary Electron Emission Yields from PEP-II Accelerator Materials. Office of Scientific and Technical Information (OSTI), 2000. http://dx.doi.org/10.2172/784708.

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