Books on the topic 'Spectrometrie sims'

Benninghoven, Alfred, Richard J. Colton, David S. Simons, and Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.

International Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama). Secondary ion mass spectrometry: SIMS IX : proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)...,7-12 November 1993. Edited by Benninghoven A. 1932-. Chichester: Wiley, 1994.

International Conferenceon Secondary Ion Mass Spectrometry (7th 1989 California, USA). Secondary ion mass spectrometry SIMS VII: Proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989. Edited by Benninghoven A. 1932-. Chichester: Wiley, 1990.

International Conference on Secondary Ion Mass Spectrometry (10th 1995 Muenster, Germany). Secondary ion mass spectrometry, SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995. Edited by Benninghoven A, Hagenhoff B, and Werner H. W. Chichester: Wiley, 1997.

International Conference on Secondary Ion Mass Spectrometry. (7th 1989 Monterey, Calif.). Secondary ion mass spectrometry: SIMS VII: proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-4th, 1989. Edited by Benninghoven A, Huber Alfred 1918-, and Werner H. W. Chichester: Wiley, 1990.

Surface analysis of polymers by XPS and static SIMS. Cambridge, U.K: Cambridge University Press, 1998.

International Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, D.C.). Secondary ion mass spectrometry: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985. Edited by Benninghoven A. Berlin: Springer-Verlag, 1986.

Vargas-Aburto, Carlos. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.

Grasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.

International Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Edited by Gillen G. Chichester: Wiley, 1998.

International Conference on Secondary Ion Mass Spectrometry (8th 1991 Amsterdam,Netherlands). Secondary ion mass spectrometry: SIMS VIII : proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, Amsterdam, the Netherlands, September 15-20 1991. Edited by Benninghoven A. 1932-. Chichester: Wiley, 1992.

International, Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles France). Secondary ion mass spectrometry: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Chichester: Wiley, 1988.

International Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, DC). Secondary ion mass spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 - October 4, 1985. Berlin: Springer, 1986.

(Editor), A. Benninghoven, B. Hagenhoff (Editor), and H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry: SIMS X. John Wiley & Sons Ltd (Import), 1997.

Benninghoven, A., R. Shimizu, and Y. Nihei. Secondary Ion Mass Spectrometry: SIMS IX. John Wiley & Sons, 1994.

Gillen, Edited by: G. Secondary Ion Mass Spectrometry SIMS XI. Wiley, 1998.

Secondary Ion Mass Spectrometry Sims V. Springer, 1986.

C, Vickerman J., Briggs D. 1948-, and SurfaceSpectra Limited, eds. ToF-SIMS: Surface analysis by mass spectrometry. Chichester: IM Pub., 2001.

Benninghoven, A., K. T. F. Janssen, and J. Tumpner. Secondary Ion Mass Spectrometry: Sims VIII : Proceedings. John Wiley & Sons Inc, 1992.

1945-, Lyon Philip A., and American Chemical Society, eds. Desorption mass spectrometry: Are SIMS and FAB the same? Washington, D.C: American Chemical Society, 1985.

Grams, Jacek. New Trends and Potentialities of ToF-SIMS in Surface Studies. Nova Science Pub Inc, 2007.

G, Newman John, and Hohlt Teresa A, eds. Static SIMS handbook of polymer analysis: A reference book of standard data for identification and interpretation of static SIMS data. Eden Prairie, Minn: Perkin-Elmer Corp., Physical Electronics Division, 1991.

Spool, Alan M. The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry. Momentum Press, 2016.

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ... Springer, 2011.

Briggs, D. Surface Analysis of Polymers by XPS and Static SIMS. Cambridge University Press, 2005.

Palma, Carolina Font. Analysis of particulate matter using time-of-flight secondary ion mass spectrometry (TOF-SIMS). 2004.

R, Aron Paul, Liff Dale Russell, and United States. National Aeronautics and Space Administration., eds. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.

Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983. Springer, 2012.