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Academic literature on the topic 'White Light Scanning Interferometry'
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Journal articles on the topic "White Light Scanning Interferometry"
Behrends, Gert, Dirk Stöbener, and Andreas Fischer. "Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry." Sensors 21, no. 7 (2021): 2486. http://dx.doi.org/10.3390/s21072486.
Full textTereschenko, Stanislav, Peter Lehmann, Lisa Zellmer, and Angelika Brueckner-Foit. "Passive vibration compensation in scanning white-light interferometry." Applied Optics 55, no. 23 (2016): 6172. http://dx.doi.org/10.1364/ao.55.006172.
Full textKassamakov, Ivan, Kalle Hanhijärvi, Imad Abbadi, Juha Aaltonen, Hanne Ludvigsen, and Edward Hæggström. "Scanning white-light interferometry with a supercontinuum source." Optics Letters 34, no. 10 (2009): 1582. http://dx.doi.org/10.1364/ol.34.001582.
Full textVallance, R. Ryan, Chris J. Morgan, Shelby M. Shreve, and Eric R. Marsh. "Micro-tool characterization using scanning white light interferometry." Journal of Micromechanics and Microengineering 14, no. 8 (2004): 1234–43. http://dx.doi.org/10.1088/0960-1317/14/8/017.
Full textBehrends, Gert, Dirk Stöbener, and Andreas Fischer. "Lateral scanning white-light interferometry on rotating objects." Surface Topography: Metrology and Properties 8, no. 3 (2020): 035006. http://dx.doi.org/10.1088/2051-672x/aba484.
Full textWang, Zhen, and Yi Jiang. "Wavenumber scanning-based Fourier transform white-light interferometry." Applied Optics 51, no. 22 (2012): 5512. http://dx.doi.org/10.1364/ao.51.005512.
Full textJiang, Yi. "Wavelength-scanning white-light interferometry with a 3×3 coupler-based interferometer." Optics Letters 33, no. 16 (2008): 1869. http://dx.doi.org/10.1364/ol.33.001869.
Full textZhu, Linlin, Yuchu Dong, Zexiao Li, and Xiaodong Zhang. "A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI)." Sensors 20, no. 18 (2020): 5225. http://dx.doi.org/10.3390/s20185225.
Full textManiscalco, B., P. M. Kaminski, and J. M. Walls. "Thin film thickness measurements using Scanning White Light Interferometry." Thin Solid Films 550 (January 2014): 10–16. http://dx.doi.org/10.1016/j.tsf.2013.10.005.
Full textDai, Rong, Tie-bang Xie, and Su-ping Chang. "A micro-displacement stage for scanning white-light interferometry." Journal of Physics: Conference Series 13 (January 1, 2005): 94–97. http://dx.doi.org/10.1088/1742-6596/13/1/022.
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