Academic literature on the topic 'White Light Scanning Interferometry'

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Journal articles on the topic "White Light Scanning Interferometry"

1

Behrends, Gert, Dirk Stöbener, and Andreas Fischer. "Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry." Sensors 21, no. 7 (2021): 2486. http://dx.doi.org/10.3390/s21072486.

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Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.
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2

Tereschenko, Stanislav, Peter Lehmann, Lisa Zellmer, and Angelika Brueckner-Foit. "Passive vibration compensation in scanning white-light interferometry." Applied Optics 55, no. 23 (2016): 6172. http://dx.doi.org/10.1364/ao.55.006172.

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3

Kassamakov, Ivan, Kalle Hanhijärvi, Imad Abbadi, Juha Aaltonen, Hanne Ludvigsen, and Edward Hæggström. "Scanning white-light interferometry with a supercontinuum source." Optics Letters 34, no. 10 (2009): 1582. http://dx.doi.org/10.1364/ol.34.001582.

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4

Vallance, R. Ryan, Chris J. Morgan, Shelby M. Shreve, and Eric R. Marsh. "Micro-tool characterization using scanning white light interferometry." Journal of Micromechanics and Microengineering 14, no. 8 (2004): 1234–43. http://dx.doi.org/10.1088/0960-1317/14/8/017.

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5

Behrends, Gert, Dirk Stöbener, and Andreas Fischer. "Lateral scanning white-light interferometry on rotating objects." Surface Topography: Metrology and Properties 8, no. 3 (2020): 035006. http://dx.doi.org/10.1088/2051-672x/aba484.

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6

Wang, Zhen, and Yi Jiang. "Wavenumber scanning-based Fourier transform white-light interferometry." Applied Optics 51, no. 22 (2012): 5512. http://dx.doi.org/10.1364/ao.51.005512.

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7

Jiang, Yi. "Wavelength-scanning white-light interferometry with a 3×3 coupler-based interferometer." Optics Letters 33, no. 16 (2008): 1869. http://dx.doi.org/10.1364/ol.33.001869.

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8

Zhu, Linlin, Yuchu Dong, Zexiao Li, and Xiaodong Zhang. "A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI)." Sensors 20, no. 18 (2020): 5225. http://dx.doi.org/10.3390/s20185225.

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The two peaks characteristic of yellow and blue light in the spectrum of dual-wavelength white light emitting diodes (LEDs) introduce distinctive features to the interference signal of white light scanning interferometry (WLSI). The distinctive features are defined as discontinuities, so that the fringe contrast function cannot be modeled as a single Gaussian function, and causes the interferogram to have uneven distribution of fringes of different orders in the scanning interferometer. This phenomenon leads to the low accuracy of the zero-order fringe position in the envelope calculation, which affects the repeatability and accuracy of the interferometry. This paper proposes a new surface recovery algorithm based on the Hilbert phase envelope and adjacent reference points calculation, which can effectively overcome the influence of the discontinuous signal of dual-wavelength LED white light interference on the three-dimensional reconstruction of WLSI measurements. The reliability of the algorithm is verified by experiments, and the measurement accuracy of LED WLSI system is evaluated.
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9

Maniscalco, B., P. M. Kaminski, and J. M. Walls. "Thin film thickness measurements using Scanning White Light Interferometry." Thin Solid Films 550 (January 2014): 10–16. http://dx.doi.org/10.1016/j.tsf.2013.10.005.

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10

Dai, Rong, Tie-bang Xie, and Su-ping Chang. "A micro-displacement stage for scanning white-light interferometry." Journal of Physics: Conference Series 13 (January 1, 2005): 94–97. http://dx.doi.org/10.1088/1742-6596/13/1/022.

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