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Libros sobre el tema "Atomic force microscopes"

Autor: Grafiati
Publicado: 4 de junio de 2021
Última modificación: 10 de febrero de 2022

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1

García, Ricardo Castro. Amplitude modulation atomic force microscopy. Weinheim: Wiley-VCH, 2010.

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2

Microcantilevers for atomic force microscope data storage. Boston, Mass: Kluwer Academic Publishers, 1998.

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3

Paul, West, ed. Atomic force microscopy. Oxford: Oxford University Press, 2010.

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4

Santos, Nuno C. y Filomena A. Carvalho, eds. Atomic Force Microscopy. New York, NY: Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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5

Haugstad, Greg. Atomic Force Microscopy. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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6

Voigtländer, Bert. Atomic Force Microscopy. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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7

Braga, Pier Carlo y Davide Ricci. Atomic Force Microscopy. New Jersey: Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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8

Morita, S. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002.

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9

Lanza, Mario, ed. Conductive Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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10

Morita, S., R. Wiesendanger y E. Meyer, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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11

Morita, Seizo, Franz J. Giessibl, Ernst Meyer y Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3.

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12

Morita, Seizo, Franz J. Giessibl y Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6.

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13

Cohen, Samuel H., Mona T. Bray y Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2.

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14

R, Kirby A. y Gunning A. P, eds. Atomic force microscopy for biologists. 2a ed. London: Imperial College Press, 2010.

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15

Xie, Hui, Cagdas Onal, Stéphane Régnier y Metin Sitti. Atomic Force Microscopy Based Nanorobotics. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20329-9.

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16

Baró, Arturo M. y Ronald G. Reifenberger, eds. Atomic Force Microscopy in Liquid. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.

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17

García, Ricardo. Amplitude Modulation Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2010. http://dx.doi.org/10.1002/9783527632183.

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18

Cohen, Samuel H. y Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy 2. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4757-9325-3.

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19

Cohen, Samuel H. y Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy 3. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/b118422.

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20

Braga, Pier Carlo y Davide Ricci, eds. Atomic Force Microscopy in Biomedical Research. Totowa, NJ: Humana Press, 2011. http://dx.doi.org/10.1007/978-1-61779-105-5.

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21

Celano, Umberto, ed. Electrical Atomic Force Microscopy for Nanoelectronics. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-15612-1.

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22

Molecular manipulation with atomic force microscopy. Boca Raton: CRC Press, 2011.

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23

Sarid, Dror. Scanning force microscopy: With applications to electric, magnetic, and atomic forces. New York: Oxford University Press, 1994.

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24

Scanning force microscopy: With applications to electric, magnetic, and atomic forces. New York: Oxford University Press, 1991.

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25

Chui, Benjamin W. Microcantilevers for Atomic Force Microscope Data Storage. Boston, MA: Springer US, 1999.

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26

Chui, Benjamin W. Microcantilevers for Atomic Force Microscope Data Storage. Boston, MA: Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4983-3.

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27

Khulbe, Kailash C. Synthetic polymeric membranes: Characterization by atomic force microscopy. Berlin: Springer, 2007.

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28

Gale, Marla Ann. Collagen assembly as examined by atomic force microscopy. Ottawa: National Library of Canada, 1995.

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29

Cai, Jiye, ed. Atomic Force Microscopy in Molecular and Cell Biology. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-1510-7.

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30

Haugstad, Greg. Atomic force microscopy: Exploring basic modes and advanced applications. Hoboken, N.J: John Wiley & Sons, 2012.

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31

Haugstad, Greg. Atomic force microscopy: Exploring basic modes and advanced applications. Hoboken, N.J: John Wiley & Sons, 2012.

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32

Atomic force microscopy in biomedical research: Methods and protocols. New York: Humana Press, 2011.

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33

Chhabra, Neetu. Study of the paper fibre surface using atomic force microscopy. Ottawa: National Library of Canada, 2003.

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34

Tang, Zhonghua, 1977 February- author y Zu Yuangang author, eds. Yuan zi li xian wei jing zai da fen zi yan jiu zhong de ying yong. Beijing: Ke xue chu ban she, 2013.

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35

Nisman, Rozalia. Morphological characterization of lamellar structures of single crystals and spherulites using atomic force microscopy and lateral force microscopy. Ottawa: National Library of Canada, 1994.

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36

Lanza, Mario. Conductive Atomic Force Microscopy: Applications in Nanomaterials. Wiley-VCH Verlag GmbH, 2017.

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37

Lanza, Mario. Conductive Atomic Force Microscopy: Applications in Nanomaterials. Wiley & Sons, Incorporated, John, 2017.

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38

Daojun, Wang, ed. Yuan zi li xian wei jing chuan li di tu ji fen xi: Patent analysis of of atomic force microscope. Taibei Shi: Xing zheng yuan Guo jia ke xue wei yuan hui ke xue ji shu zi liao zhong xin, 2004.

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39

Yang, Hongshun Ph D. Atomic Force Microscopy Afm: Principles, Modes of Operation and Limitations. Nova Science Pub Inc, 2014.

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40

Simulation of tip-sample interaction in the atomic force microscope. [Washington, D.C: National Aeronautics and Space Administration, 1994.

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41

Amitava, Banerjea y United States. National Aeronautics and Space Administration., eds. Simulation of tip-sample interaction in the atomic force microscope. [Washington, D.C: National Aeronautics and Space Administration, 1994.

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42

Amitava, Banerjea y United States. National Aeronautics and Space Administration., eds. Simulation of tip-sample interaction in the atomic force microscope. [Washington, D.C: National Aeronautics and Space Administration, 1994.

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43

Amitava, Banerjea y United States. National Aeronautics and Space Administration., eds. Simulation of tip-sample interaction in the atomic force microscope. [Washington, D.C: National Aeronautics and Space Administration, 1994.

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44

1959-, Martin Yves, ed. Selected papers on scanning probe microscopes: Design and applications. Bellingham, Wash: SPIE Optical Engineering Press, 1995.

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45

Vaughan, David. 2. Studying minerals. Oxford University Press, 2014. http://dx.doi.org/10.1093/actrade/9780199682843.003.0002.

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The study of minerals begins with their characterization, identification, and classification determined from their chemical compositions and crystallographic properties. ‘Studying minerals’ shows that historically this was based on properties observable in hand specimens, but the development of wide-ranging techniques has allowed the study of all aspects of minerals: their structures, chemistries, surface chemistries, and reactivities. Techniques described include transmitted light and reflected light microscopy using thin and polished sections; X-ray crystallography based on Bragg’s Law; techniques using various forms of electromagnetic radiation; and electron microscopes including the transmission electron microscope, scanning electron microscope, scanning tunnelling microscope, and atomic force microscope.
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46

Chen, C. Julian. Introduction to Scanning Tunneling Microscopy. 3a ed. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198856559.001.0001.

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The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us. Since the publication of the first edition in 1993, this book has been recognized as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field. After an Overview chapter accessible for newcomers at an entry level presenting the basic design, scientific background, and illustrative applications, the book has three Parts. Part I, Principles, provides the most systematic and detailed theory of its scientific bases from basic quantum mechancis and condensed-metter physics in all available literature. Quantitative analysis of its imaging mechanism for atoms, molecules, and wavefunctions is detailed. Part II, Instrumentation, provides down to earth descriptions of its building components, including piezoelectric scanners, vibration isolation, electronics, software, probe tip preparation, etc. Part III, Related methods, presenting two of its most important siblings, scanning tunnelling specgroscopy and atomic force miscsoscopy. The book has five appendices for background topics, and 405 references for further readings.
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47

Voigtländer, Bert. Atomic Force Microscopy. Springer, 2019.

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48

Atomic Force Microscopy. Taylor & Francis Group, 2019.

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49

Paul, West. Atomic Force Microscopy. Oxford University Press, 2018.

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50

Sanders, Wesley C. Atomic Force Microscopy. CRC Press, 2019. http://dx.doi.org/10.1201/9780429266553.

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