Artículos de revistas sobre el tema "Jury, virginia"
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Qasim, Isa C. "Navigating the Trunks and Spars." New Criminal Law Review 24, no. 4 (2021): 518–67. http://dx.doi.org/10.1525/nclr.2021.24.4.518.
Texto completoJasem, Haibat Hatem. "Euphemism as Doublespeak in Jhonny Depp-Amber Heard Defamation Trial." JOURNAL OF LANGUAGE STUDIES 7, no. 1 (2023): 12–25. http://dx.doi.org/10.25130/jls.7.1.2.
Texto completoDeRogatis, Amy. "What Would Jesus Do? Sexuality and Salvation in Protestant Evangelical Sex Manuals, 1950s to the Present." Church History 74, no. 1 (2005): 97–137. http://dx.doi.org/10.1017/s0009640700109679.
Texto completoDonovan, James M. "J. R. Pole . Contract and Consent: Representation and the Jury in Anglo-American Legal History . Charlottesville: University of Virginia Press. 2010. Pp. xiii, 264. $49.50." American Historical Review 116, no. 4 (2011): 1078–79. http://dx.doi.org/10.1086/ahr.116.4.1078a.
Texto completoBrunn-Bevel, Rachelle J., and W. Carson Byrd. "The Foundation of Racial Disparities in the Standardized Testing Era." Humanity & Society 39, no. 4 (2015): 419–48. http://dx.doi.org/10.1177/0160597615603750.
Texto completoPreuett, Jason A., Daniel J. Collins, Douglas Luster, and Timothy L. Widmer. "Screening Selected Gulf Coast and Southeastern Forest Species for Susceptibility to Phytophthora ramorum." Plant Health Progress 14, no. 1 (2013): 17. http://dx.doi.org/10.1094/php-2013-0730-01-rs.
Texto completoDeutsch, Michael E., and Erica Thompson. "Secrets and Lies: The Persecution of Muhammad Salah (Part II)." Journal of Palestine Studies 38, no. 1 (2008): 25–53. http://dx.doi.org/10.1525/jps.2008.38.1.25.
Texto completoHeidt, Mason. "Virginia." Texas A&M Journal of Property Law 6, no. 3 (2020): 369–81. http://dx.doi.org/10.37419/jpl.v6.i3.18.
Texto completoStockton Maxwell, R., Amy E. Hessl, Edward R. Cook, and Brendan M. Buckley. "A Multicentury Reconstruction of May Precipitation for the Mid-Atlantic Region Using Juniperus virginiana Tree Rings*." Journal of Climate 25, no. 3 (2012): 1045–56. http://dx.doi.org/10.1175/jcli-d-11-00017.1.
Texto completoMidgley, PA, A. Eggeman, T. White, and E. Bithell. "Towards Routine Structure Solution using Precession Electron Diffraction." Microscopy and Microanalysis 15, S2 (2009): 738–39. http://dx.doi.org/10.1017/s1431927609093799.
Texto completoYasuhara, A., W. Inami, K. Yamazaki, et al. "Observation of Magnetic and Electric Field in STEM by using CCD camera." Microscopy and Microanalysis 15, S2 (2009): 1058–59. http://dx.doi.org/10.1017/s1431927609093805.
Texto completoHan, J., M. Kim, and HN Han. "TEM Observation of Twin Evolution in Austenitic TWIP steel." Microscopy and Microanalysis 15, S2 (2009): 792–93. http://dx.doi.org/10.1017/s1431927609093817.
Texto completoIshikawa, I., E. Okunishi, H. Sawada, et al. "Development of a 200kV Atomic Resolution Analytical Electron Microscope." Microscopy and Microanalysis 15, S2 (2009): 188–89. http://dx.doi.org/10.1017/s1431927609093829.
Texto completoSato, K., K. Aoyagi, TJ Konno, and Y. Hirotsu. "Characterization of L10-Type FePd Alloy Nanoparticles by Atomic-Resolution HAADF-STEM and Electron Tomography." Microscopy and Microanalysis 15, S2 (2009): 1262–63. http://dx.doi.org/10.1017/s1431927609093830.
Texto completoKamimura, O., T. Dobashi, K. Kawahara, Y. Maehara, and K. Gohara. "10-kV Electron-Diffractive Imaging of Multiwall Carbon Nanotube." Microscopy and Microanalysis 15, S2 (2009): 746–47. http://dx.doi.org/10.1017/s1431927609093842.
Texto completoTakahashi, J., K. Kawakami, and Y. Yamaguchi. "Quantitative Analysis of Cementite in Steel by Atom Probe Tomography." Microscopy and Microanalysis 15, S2 (2009): 306–7. http://dx.doi.org/10.1017/s1431927609093854.
Texto completoHashimoto, A., M. Shimojo, K. Mitsuishi, and M. Takeguchi. "Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 636–37. http://dx.doi.org/10.1017/s1431927609093866.
Texto completoBencan, A., J. Bernard, J. Tellier, B. Malic, and M. Kosec. "The Influence of Alkaline Germanate Based Liquid Phase Sintering Aid on Microstructure and Phase Composition of K0.5Na0.5NbO3 Ceramics." Microscopy and Microanalysis 15, S2 (2009): 786–87. http://dx.doi.org/10.1017/s1431927609093878.
Texto completoSato, T., H. Matsumoto, M. Konno, M. Fukui, I. Nagaoki, and Y. Taniguchi. "Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM." Microscopy and Microanalysis 15, S2 (2009): 114–15. http://dx.doi.org/10.1017/s143192760909388x.
Texto completoOkunishi, E., I. Ishikawa, H. Sawada, F. Hosokawa, M. Hori, and Y. Kondo. "Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy." Microscopy and Microanalysis 15, S2 (2009): 164–65. http://dx.doi.org/10.1017/s1431927609093891.
Texto completoTomita, T., Y. Tanishiro, T. Miyata, et al. "Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 1084–85. http://dx.doi.org/10.1017/s1431927609093908.
Texto completoMoll, S., and L. Thomé. "Radiation Effects in Oxides Foreseen for the Immobilization and Transmutation of Radioactive Wastes: Case Study of Zirconia." Microscopy and Microanalysis 15, S2 (2009): 1344–45. http://dx.doi.org/10.1017/s143192760909391x.
Texto completoCollins, CL, J. Holland, SR Burgess, P. Statham, and N. Rowlands. "Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector." Microscopy and Microanalysis 15, S2 (2009): 230–31. http://dx.doi.org/10.1017/s1431927609093921.
Texto completoKannan, KR, and AR Raju. "Synthesis and Characterization of Nanomaterials Obtained by Sol-Gel Synthesis." Microscopy and Microanalysis 15, S2 (2009): 1264–65. http://dx.doi.org/10.1017/s1431927609093933.
Texto completoKlein, C., S. Mutas, A. Würfel, and E. Zschech. "Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)." Microscopy and Microanalysis 15, S2 (2009): 282–83. http://dx.doi.org/10.1017/s1431927609093945.
Texto completoAert, S. Van, J. Verbeeck, S. Bals, R. Erni, D. Van Dyck, and S. Van Tendeloo. "Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 464–65. http://dx.doi.org/10.1017/s1431927609093957.
Texto completoCollins, CL, J. Holland, SR Burgess, and N. Rowlands. "X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science." Microscopy and Microanalysis 15, S2 (2009): 172–73. http://dx.doi.org/10.1017/s1431927609093969.
Texto completoLametschwandtner, A., U. Lametschwandtner, H. Bartel, C. Radner, and B. Minnich. "Microvascular Anatomy of Extrahepatic Bile Ducts in Adult South African Clawed Toad, Xenopus laevis Daudin: Scanning Electron Microscopy of Vascular Corrosion Casts and Correlative Light Microscopy." Microscopy and Microanalysis 15, S2 (2009): 986–87. http://dx.doi.org/10.1017/s1431927609093970.
Texto completoGiannuzzi, LA, and M. Utlaut. "Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images." Microscopy and Microanalysis 15, S2 (2009): 650–51. http://dx.doi.org/10.1017/s1431927609093982.
Texto completoHovington, P., P. T-Pinard, M. Lagacé, D. Thibeault, R. Gauvin, and D. Drouin. "Evaluation of Strategies to Increase the Spatial Resolution of X-Ray Mapping in the FE-SEM of Low Concentration in Sub-Micron microstructures." Microscopy and Microanalysis 15, S2 (2009): 480–81. http://dx.doi.org/10.1017/s1431927609093994.
Texto completoSawada, H., T. Sasaki, F. Hosokawa, et al. "Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,." Microscopy and Microanalysis 15, S2 (2009): 1458–59. http://dx.doi.org/10.1017/s1431927609094008.
Texto completoWang, J., X. Wang, Y. Jiao, Q. Li, M.-W. Chu, and M. Malac. "Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures." Microscopy and Microanalysis 15, S2 (2009): 1244–45. http://dx.doi.org/10.1017/s143192760909401x.
Texto completoStegmann, H., Y. Ritz, D. Utess, H.-J. Engelmann, and E. Zschech. "In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System." Microscopy and Microanalysis 15, S2 (2009): 170–71. http://dx.doi.org/10.1017/s1431927609094021.
Texto completoSoltau, H., O. Jaratschin, A. Liebel, et al. "New Detector Architecture, for Electron Microscopes with SDDs." Microscopy and Microanalysis 15, S2 (2009): 204–5. http://dx.doi.org/10.1017/s1431927609094033.
Texto completoMarquis, EA, DW Saxey, A. Cerezo, and GDW Smith. "A UK Facility for Atom Probe Tomography Analysis." Microscopy and Microanalysis 15, S2 (2009): 288–89. http://dx.doi.org/10.1017/s1431927609094045.
Texto completoSasaki, T., H. Sawada, T. Nakamichi, et al. "Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun." Microscopy and Microanalysis 15, S2 (2009): 1080–81. http://dx.doi.org/10.1017/s1431927609094057.
Texto completoWang, P., G. Behan, AI Kirkland, and P. Nellist. "Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope." Microscopy and Microanalysis 15, S2 (2009): 42–43. http://dx.doi.org/10.1017/s1431927609094069.
Texto completoWu, X., I. Baker, MK Miller, and KL More. "Microstructure and Mechanical Behavior in Spinodal Fe35Ni15Mn25Al25 Alloy." Microscopy and Microanalysis 15, S2 (2009): 116–17. http://dx.doi.org/10.1017/s1431927609094070.
Texto completoRowenhorst, D., A. Lewis та G. Spanos. "Grain Boundary Curvature Analysis of β -Grains in Ti-21S". Microscopy and Microanalysis 15, S2 (2009): 640–41. http://dx.doi.org/10.1017/s1431927609094082.
Texto completoBean, SJ, VM Kugler, and D. Connor. "The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM." Microscopy and Microanalysis 15, S2 (2009): 1112–13. http://dx.doi.org/10.1017/s1431927609094094.
Texto completoTang, D., A. Rucki, H. Cerva, and P. Schlossmacher. "LM-STEM Study of Dislocations in Thick Silicon." Microscopy and Microanalysis 15, S2 (2009): 190–91. http://dx.doi.org/10.1017/s1431927609094100.
Texto completoHodoroaba, V.-D., and M. Procop. "Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM." Microscopy and Microanalysis 15, S2 (2009): 1118–19. http://dx.doi.org/10.1017/s1431927609094112.
Texto completoWong, K., N. Anantharamaiah, R. Garcia, D. Batchelor, B. Pourdeyhimi, and D. Griffis. "Focused Ion Beam Characterization of Bicomponent Polymer Fibers." Microscopy and Microanalysis 15, S2 (2009): 370–71. http://dx.doi.org/10.1017/s1431927609094124.
Texto completoHartshorne, M., E. Toby, P. Uranga, M. Schmidt, P. Novotny, and M. Taheri. "Direct Observation of the Effects of Alloying Additions on Transformation Mechanisms in Emerging Steel Alloys with In-Situ TEM." Microscopy and Microanalysis 15, S2 (2009): 704–5. http://dx.doi.org/10.1017/s1431927609094136.
Texto completoDillon, S., and G. Rohrer. "Measuring the Grain Boundary Character and Energy Distributions of Ceramics From Serial Sections of Orientation Maps." Microscopy and Microanalysis 15, S2 (2009): 608–9. http://dx.doi.org/10.1017/s1431927609094148.
Texto completoWight, S., and J. Small. "Modeling and Measurements of Electron Beam Scattering into Adjacent Particles." Microscopy and Microanalysis 15, S2 (2009): 1266–67. http://dx.doi.org/10.1017/s143192760909415x.
Texto completoKourkoutis, LF, JH Song, HY Hwang, and DA Muller. "Atomic-Scale Chemical Imaging of Interdiffusion and Defects in (La0.7Sr0.3MnO3)5/(SrTiO3)5 Multilayers by Aberration Corrected Microscopy." Microscopy and Microanalysis 15, S2 (2009): 428–29. http://dx.doi.org/10.1017/s1431927609094161.
Texto completoStodolka, JP, MG Schweitzer, and TA Albrecht. "Towards an FE-SEM as a complete analytical laboratory." Microscopy and Microanalysis 15, S2 (2009): 182–83. http://dx.doi.org/10.1017/s1431927609094173.
Texto completoMichael, JR, DC Joy, and BJ Griffin. "Challenges in Achieving High Resolution at Low Voltages in the SEM." Microscopy and Microanalysis 15, S2 (2009): 660–61. http://dx.doi.org/10.1017/s1431927609094185.
Texto completoPoppell, E., C. Marks, A. Hill, and M. Hill. "Microbial Symbionts and Sponge Heterotrophy; Morphological Aspects of Sponge: Symbiont Integration via SEM Analysis." Microscopy and Microanalysis 15, S2 (2009): 844–45. http://dx.doi.org/10.1017/s1431927609094197.
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