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Artículos de revistas sobre el tema "LEEM"

Autor: Grafiati

Publicado: 4 de junio de 2021

Última modificación: 26 de julio de 2025

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1

Bauer, Ernst. "LEEM Basics." Surface Review and Letters 05, no. 06 (1998): 1275–86. http://dx.doi.org/10.1142/s0218625x98001614.

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The fundamental physical phenomena on which LEEM is based are discussed, with the goal of showing why LEEM works, not how it works. The subjects covered include intensity, resolution, contrast, sampling depth and combination possibilities with other techniques (particularly LEED) which make LEEM a unique surface imaging method.

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2

Bauer, Ernst. "The Possibilities for Analytical Methods in Photoemission and Low-Energy Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 348–49. http://dx.doi.org/10.1017/s0424820100180495.

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One of the major shortcomings of conventional PEEM and of LEEM is the lack of chemical information about the surface. Although the imaging of the LEED pattern in the back focal plane of the objective lens of a LEEM instrument allows chemical characterization via the crystalline structure derived from the LEED pattern, this method fails in the absence of a characteristic LEED pattern. Direct information about the atomic composition of the surface is then needed which can be best obtained from inner shell electrons either directly by x-ray-induced photoemission (XPEEM) or by x-ray- or electron-i

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3

Goritzka, Jan C., Benjamin Herd, Philipp P. T. Krause, Jens Falta, J. Ingo Flege, and Herbert Over. "Insights into the gas phase oxidation of Ru(0001) on the mesoscopic scale using molecular oxygen." Physical Chemistry Chemical Physics 17, no. 21 (2015): 13895–903. http://dx.doi.org/10.1039/c4cp06010e.

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We present an extensive mesoscale study of the initial gas phase oxidation of Ru(0001), employing in situ low-energy electron microscopy (LEEM), micro low-energy electron diffraction (μ-LEED) and scanning tunneling microscopy (STM).

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4

Felter, Janina, Markus Franke, Jana Wolters, Caroline Henneke, and Christian Kumpf. "Two-dimensional growth of dendritic islands of NTCDA on Cu(001) studied in real time." Nanoscale 11, no. 4 (2019): 1798–812. http://dx.doi.org/10.1039/c8nr08943d.

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Based on bright- and dark-field LEEM, LEED and STM, we present evidence for dendritic, fractal growth for NTCDA submonolayers on Cu(001). This unexpected growth mode is explained by a model based on energetic considerations and NIXSW and ARPES results.

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5

Wichtendahl, R., R. Fink, H. Kuhlenbeck, et al. "SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter." Surface Review and Letters 05, no. 06 (1998): 1249–56. http://dx.doi.org/10.1142/s0218625x98001584.

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A new UHV spectroscopic X-ray photoelectron emission and low energy electron microscope is presently under construction for the installation at the PM-6 soft X-ray undulator beamline at BESSY II. Using a combination of a sophisticated magnetic beam splitter and an electrostatic tetrode mirror, the spherical and chromatic aberrations of the objective lens are corrected and thus the lateral resolution and sensitivity of the instrument improved. In addition a corrected imaging energy filter (a so-called omega filter) allows high spectral resolution (ΔE=0.1 eV ) in the photoemission modes and back

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6

Altman, M. S., W. F. Chung, and C. H. Liu. "LEEM Phase Contrast." Surface Review and Letters 05, no. 06 (1998): 1129–41. http://dx.doi.org/10.1142/s0218625x98001468.

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Contrast in low energy electron microscopy (LEEM) originating in the phase of the imaging electron wave is discussed. A wave-optical model is reviewed in which LEEM step contrast is calculated as the interference of the Fresnel diffracted waves from terrace edges which meet at a step. Model predictions which take into account instrumental resolution and beam coherence effects are compared to experimental observations of steps on the W(110) and Si(111) surfaces. Most importantly, this work allows for the routine identification of the step sense with LEEM by inspection. A quantum-mechanical Kron

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7

Schmidt, Th, S. Heun, J. Slezak, et al. "SPELEEM: Combining LEEM and Spectroscopic Imaging." Surface Review and Letters 05, no. 06 (1998): 1287–96. http://dx.doi.org/10.1142/s0218625x98001626.

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At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because it had very limited access to synchrotron radiation. Now the microscope is connected quasipermanently to the undulator beamline 6.2 at the storage ring ELETTRA, operating successfully since the end of 1

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8

Rausenberger, B., W. Świȩch, W. Engel, A. M. Bradshaw, and E. Zeitler. "LEEM and selected-area LEED studies of reaction front propagation." Surface Science Letters 287-288 (May 1993): A380. http://dx.doi.org/10.1016/0167-2584(93)90426-j.

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9

Rausenberger, B., W. Świȩch, W. Engel, A. M. Bradshaw, and E. Zeitler. "LEEM and selected-area LEED studies of reaction front propagation." Surface Science 287-288 (May 1993): 235–40. http://dx.doi.org/10.1016/0039-6028(93)90777-h.

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10

Dos Santos, Gabriela Corbari, Deivid Eive dos S. Silva, and Natasha M. C. Valentim. "Learner Experience Evaluation: a Feasibility Study and a Benchmark." Journal of the Brazilian Computer Society 31, no. 1 (2025): 132–53. https://doi.org/10.5753/jbcs.2025.4306.

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Learner eXperience (LX) is a concept derived from User eXperience (UX) and it can be defined as the perceptions, answers, and performances of learners interacting with Digital Communication and Information Technologies (DICTs). Evaluating the LX to obtain experiences that support and facilitate learning and knowledge mastery is important. Thus, we developed the LEEM to assess and improve the learner's experience using DICTs during learning. The LEEM is a generic evaluation model and can be used for any level of education; it can be used independently of the discipline and used with any educati

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11

KENNEDY, S. M., N. E. SCHOFIELD, D. M. PAGANIN, and D. E. JESSON. "WAVE OPTICAL TREATMENT OF SURFACE STEP CONTRAST IN LOW-ENERGY ELECTRON MICROSCOPY." Surface Review and Letters 16, no. 06 (2009): 855–67. http://dx.doi.org/10.1142/s0218625x09013402.

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A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface steps are evaluated in one and two dimensions. Under the special circumstances of a weak phase object, the simplified form of the contrast transfer function (CTF) is used to discuss LEEM image contrast and optimum defocus conditions.

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12

Tromp, Ruud M. "In Situ Electron Microscopy Studies of Surface Dynamical Processes." Microscopy and Microanalysis 4, S2 (1998): 608–9. http://dx.doi.org/10.1017/s1431927600023163.

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To obtain a full and detailed understanding of the spatiotemporal dynamics of surface processes such as epitaxial growth, strain relaxation, phase transformations and phase transitions, chemisorption and etching, in situ real-time observations have proven to be invaluable. The development of two experimental techniques, i.e. Low Energy Electron Microscopy (LEEM) typically operating at electron energies below 10 eV, and Ultra-High-Vacuum Transmission Electron Microscopy (UHV-TEM) at several 100 keV, has made such in situ studies routinely possible. In many cases, the videodata obtained from suc

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13

Johansson, Leif I., Somsakul Watcharinyanon, Alexei A. Zakharov, Rositza Yakimova, and Chariya Virojanadara. "The Registry of Graphene Layers Grown on SiC(000-1)." Materials Science Forum 717-720 (May 2012): 613–16. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.613.

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Graphene samples were grown on the C-face of SiC, at high temperature in a furnace and an Ar ambient, and were investigated using LEEM, XPEEM, LEED, XPS and ARPES. Formation of fairly large grains (crystallographic domains) of graphene exhibiting sharp 1x1 patterns in m-LEED was revealed and that different grains showed different azimuthal orientations. Selective area constant initial energy photoelectron angular distribution patterns recorded showed the same results, ordered grains and no rotational disorder between adjacent layers. A grain size of up to a few mm was obtained on some samples.

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14

Telieps, W. "Surface imaging with LEEM." Applied Physics A 44, no. 1 (1987): 55–61. http://dx.doi.org/10.1007/bf00617891.

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15

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM

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16

Schwarz, Daniel. "Direct visualization of subcritical nuclei in molecular film growth." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1606. http://dx.doi.org/10.1107/s2053273314083934.

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The growth and structure of 4,4'-biphenyldicarboxylic-acid (BDA) on Cu(001) at temperatures between 300 K and 400 K was studied by LEEM and μ-LEED. BDA is a linear molecule consisting of two phenyl rings with a carboxylic-acid group at opposite ends. During growth on Cu(001) the adsorbed BDA molecules form first a disordered 2D gas phase. Once this phase reaches a sufficiently large density, a crystalline phase nucleates, in which the molecules form a hydrogen-bonded 2D supramolecular network. By a careful analysis of the LEEM bright-field image intensity we can measure the density of the 2D g

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17

Tang, Wen-Xin, Qiang Fu, and Michael Altman. "Proceedings of LEEM/PEEM-11." Ultramicroscopy 210 (March 2020): 112929. http://dx.doi.org/10.1016/j.ultramic.2020.112929.

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18

Noël, Alain. "Le Leem interpelle les politiques." Actualités Pharmaceutiques 51, no. 514 (2012): 8. http://dx.doi.org/10.1016/s0515-3700(12)71250-8.

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19

Tromp, R. M., M. Mankos, M. C. Reuter, A. W. Ellis, and M. Copel. "A New Low Energy Electron Microscope." Surface Review and Letters 05, no. 06 (1998): 1189–97. http://dx.doi.org/10.1142/s0218625x98001523.

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Low energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epitaxial growth, phase transitions, chemisorption and strain relaxation phenomena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilities and greater ease of operation compared to present instruments.

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20

Kageshima, Hiroyuki, Hiroki Hibino, and Masao Nagase. "Epitaxial Graphene Growth Studied by Low-Energy Electron Microscopy and First-Principles." Materials Science Forum 645-648 (April 2010): 597–602. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.597.

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Epitaxial graphene growth on SiC is investigated using low-energy electron microscopy (LEEM) and first-principles calculations. LEEM is one of the most powerful tools to identify the thickness of graphene on SiC with a good spatial resolution. With the help of such LEEM, the thickness-dependent physical properties are identified by various experiments. It is shown that epitaxial graphene sheets continue even over steps of the substrate, and that a new graphene sheet often grows from step edges while the surface morphology changes drastically. Furthermore, the first-principles calculations also

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21

Aballe, Lucia, Michael Foerster, Eric Pellegrin, Josep Nicolas, and Salvador Ferrer. "The ALBA spectroscopic LEEM-PEEM experimental station: layout and performance." Journal of Synchrotron Radiation 22, no. 3 (2015): 745–52. http://dx.doi.org/10.1107/s1600577515003537.

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The spectroscopic LEEM-PEEM experimental station at the CIRCE helical undulator beamline, which started user operation at the ALBA Synchrotron Light Facility in 2012, is presented. This station, based on an Elmitec LEEM III microscope with electron imaging energy analyzer, permits surfaces to be imaged with chemical, structural and magnetic sensitivity down to a lateral spatial resolution better than 20 nm with X-ray excited photoelectrons and 10 nm in LEEM and UV-PEEM modes. Rotation around the surface normal and application of electric and (weak) magnetic fields are possible in the microscop

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22

Duden, Thomas, Andreas Thust, Christian Kumpf, and F. Stefan Tautz. "Focal-Series Reconstruction in Low-Energy Electron Microscopy." Microscopy and Microanalysis 20, no. 3 (2014): 968–73. http://dx.doi.org/10.1017/s1431927614000403.

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AbstractIn low-energy electron microscopy (LEEM) we commonly encounter images which, beside amplitude contrast, also show signatures of phase contrast. The images are usually interpreted by following the evolution of the contrast during the experiment, and assigning gray levels to morphological changes. Through reconstruction of the exit wave, two aspects of LEEM can be addressed: (1) the resolution can be improved by exploiting the full information limit of the microscope and (2) electron phase shifts which contribute to the image contrast can be extracted. In this article, linear exit wave r

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23

Altman, M. S., and E. Bauer. "LEEM/LEED investigation of reconstruction and initial oxidation of the W(001) surface." Surface Science 347, no. 3 (1996): 265–79. http://dx.doi.org/10.1016/0039-6028(95)00981-7.

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24

Poppa, Helmut, Ernst Bauer, and Heiko Pinkvos. "SPLEEM of Magnetic Surfaces and Layered Structures." MRS Bulletin 20, no. 10 (1995): 38–40. http://dx.doi.org/10.1557/s0883769400045334.

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Spin-polarized low-energy electron microscopy (SPLEEM) is a new approach to magnetic-surface imaging. Historically, it is an outgrowth of LEEM (low-energy electron microscopy), which has been successfully applied to the high-speed in situ imaging of microscopic surface structures under clean ultrahigh-vacuum (UHV) conditions. In terms of basic instrument design, in SPLEEM a spin-polarized electron source of the Pierce type replaces the LaB6 field-emission electron source used in all dedicated LEEM systems. A new, fully electrostatic version of LEEM has recently been developed, resulting in a m

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25

Dias, Maíra Tomayno de Melo, and Maria de Fátima Cardoso Gomes. "PRÁTICAS SOCIAIS DE LEITURA EM UMA SALA DE AULA DE JOVENS E ADULTOS: CONTRASTES EM FOCO." Educação em Revista 31, no. 2 (2015): 183–210. http://dx.doi.org/10.1590/0102-4698126598.

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Este artigo visa analisar contrastivamente práticas de leitura construídas por alunos e professoras em uma sala de aula de Educação de Jovens e Adultos (EJA) em Belo Horizonte. Para isso, analisamos as interações discursivas em que essas práticas foram construídas, destacando o que contou como leitura naquela sala de aula e os sentidos e os significados produzidos nos eventos de letramento. Essa investigação possibilitou conhecer o que e como leem, para quem leem, quando e onde leem e as semelhanças e diferenças encontradas nas práticas de leitura vivenciadas por estudantes e professoras daque

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26

Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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27

Bauer, Ernst. "LEEM and UHV-PEEM: A retrospective." Ultramicroscopy 119 (August 2012): 18–23. http://dx.doi.org/10.1016/j.ultramic.2011.09.006.

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28

Tromp, R. M. "Measuring chromatic aberration in LEEM/PEEM." Ultramicroscopy 199 (April 2019): 46–49. http://dx.doi.org/10.1016/j.ultramic.2019.01.009.

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29

Müllerová, Ilona, Kenji Matsuda, Petr Hrnčiřík, and Luděk Frank. "Enhancement of SEM to scanning LEEM." Surface Science 601, no. 20 (2007): 4768–73. http://dx.doi.org/10.1016/j.susc.2007.05.042.

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30

Santana, Fabiana Andrade de, and Ana Carolina Perrusi Brandão. "COMO CRIANÇAS LEEM LIVROS DE IMAGEM?" Revista Inter Ação 41, no. 1 (2016): 165. http://dx.doi.org/10.5216/ia.v41i1.36431.

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O estudo investigou a leitura de livros de imagem por crianças entre 4 e 5 anos. As narrativas produzidas pelos pequenos foram videogravadas e transcritas. Com base nesse material foram formuladas categorias de análise que orientaram a discussão dos dados coletados. Aos 5 anos, as crianças tendem a produzir leituras que apresentam maior fidelidade à sequência das imagens e incluem mais inferências pertinentes. Aos 4 anos, as leituras são menos articuladas, com predominância de descrição das cenas. O estudo apontou, entretanto, que o progresso das crianças em direção a uma leitura mais articula

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31

Agnoli, Stefano, T. Onur Menteş, Miguel A. Niño, Andrea Locatelli та Gaetano Granozzi. "A LEEM/μ-LEED investigation of phase transformations in TiOx/Pt(111) ultrathin films". Physical Chemistry Chemical Physics 11, № 19 (2009): 3727. http://dx.doi.org/10.1039/b821339a.

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32

TROMP, RUUD M. "IN SITU STUDIES WITH LOW-ENERGY ELECTRON MICROSCOPY." Surface Review and Letters 02, no. 01 (1995): 103–7. http://dx.doi.org/10.1142/s0218625x95000108.

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This paper gives a brief review of low-energy electron microscopy (LEEM) as used for in situ studies of surface dynamical processes. The capabilities of LEEM are illustrated with two examples. One is a kinetic instability observed during growth of the first layer of CaF 2 on Si (111). The second concerns the nucleation of misfit dislocations during the growth of thicker, epitaxial CaF 2 films on Si (111), as the critical thickness is exceeded. Both examples highlight the importance of real time, in situ observations of surface dynamical processes.

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33

Tsai, Nien-Pei, Yi-Chih Wu, Jenn-Wei Chen, Chih-Feng Wu, Chi-Meng Tzeng, and Wan-Jr Syu. "Multiple functions of l0036 in the regulation of the pathogenicity island of enterohaemorrhagic Escherichia coli O157:H7." Biochemical Journal 393, no. 2 (2005): 591–99. http://dx.doi.org/10.1042/bj20051201.

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Diarrhoeagenic enterohaemorrhagic Escherichia coli and enteropathogenic E. coli attach to human intestinal epithelium and efface brush-border microvilli, forming an A/E (attaching and effacing) lesion. These human pathogens are phenotypically similar to the mouse pathogen Citrobacter rodentium. Genetically, they all have a homologous set of virulent genes involved in the A/E lesion, and these genes are organized on a LEE (locus of enterocyte effacement), a pathogenicity island. This island comprises 41 specific open reading frames, of which most are organized at five operons, LEE1, LEE2, LEE3,

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34

Bauer, Ernst, Michael Mundschau, Waclaw Swiech, and Wolfgang Telieps. "Surface Morphology Studies by Low-Energy Electron Microscopy (LEEM)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 294–95. http://dx.doi.org/10.1017/s0424820100180227.

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The morphology of a surface determines to a large extent its physical and chemical properties. In order to understand these properties it is frequently sufficient to image the surface with a resolution in the 10 nm range, provided that the relevant surface features show sufficient contrast, as is the case in LEEM. The talk discusses the morphology information which can be obtained with LEEM and illustrates it with various examples.Point defects, e.g. emergence points of screw dislocations, or point-like defects such as small impurity clusters cannot be resolved in LEEM but nevertheless imaged

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35

Jaroch, Tomasz, and Ryszard Zdyb. "Temperature-Dependent Growth and Evolution of Silicene on Au Ultrathin Films—LEEM and LEED Studies." Materials 15, no. 4 (2022): 1610. http://dx.doi.org/10.3390/ma15041610.

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The formation and evolution of silicene on ultrathin Au films have been investigated with low energy electron microscopy and diffraction. Careful control of the annealing rate and temperature of Au films epitaxially grown on the Si(111) surface allows for the preparation of a large scale, of the order of cm2, silicene sheets. Depending on the final temperature, three stages of silicene evolution can be distinguished: (i) the growth of the low buckled phase, (ii) the formation of a layered heterostructure of the low buckled and planar phases of silicene and (iii) the gradual destruction of the

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36

Turgeon, Laurier. "Laboratoire d’enquête ethnologique et de multimédia (Leem)." Rabaska: Revue d'ethnologie de l'Amérique française 19 (2021): 352. http://dx.doi.org/10.7202/1082789ar.

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37

Pang, A. B., A. Pavlovska, L. Däweritz, A. Locatelli, E. Bauer, and M. S. Altman. "LEEM image phase contrast of MnAs stripes." Ultramicroscopy 130 (July 2013): 7–12. http://dx.doi.org/10.1016/j.ultramic.2013.03.008.

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38

Pang, A. B., Th Müller, M. S. Altman, and Ernst Bauer. "Fourier optics of image formation in LEEM." Journal of Physics: Condensed Matter 21, no. 31 (2009): 314006. http://dx.doi.org/10.1088/0953-8984/21/31/314006.

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39

KATO, Makoto, and Yuji SAKAI. "Development of an Energy Filter for LEEM." Hyomen Kagaku 20, no. 1 (1999): 38–44. http://dx.doi.org/10.1380/jsssj.20.38.

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40

BAUER, Ernst. "LEEM and PEEM: Laterally Resolved Surface Analysis." Hyomen Kagaku 23, no. 5 (2002): 261. http://dx.doi.org/10.1380/jsssj.23.261.

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41

Bauer, Ernst. "Surface microscopy with low energy electrons: LEEM." Journal of Electron Spectroscopy and Related Phenomena 241 (May 2020): 146806. http://dx.doi.org/10.1016/j.elspec.2018.11.005.

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42

KOSHIKAWA, Takanori. "Recent Development and Application of LEEM/PEEM. Image Formation Processes of LEEM and PEEM and Its Future Trend." Hyomen Kagaku 23, no. 5 (2002): 262–70. http://dx.doi.org/10.1380/jsssj.23.262.

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43

PELHOS, K., T. E. MADEY, J. B. HANNON, and G. L. KELLOGG. "NUCLEATION AND GROWTH DURING FACETING OF THE PLATINUM-COVERED W(111) SURFACE." Surface Review and Letters 06, no. 05 (1999): 767–74. http://dx.doi.org/10.1142/s0218625x99000779.

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Low energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) have been used to investigate the faceting of W(111) as induced by Pt. The atomically rough W(111) surface, when fully covered with a monolayer film of Pt and annealed to temperatures higher than ~750 K, experiences a significant morphological restructuring: the initially planar surface undergoes a faceting transition and forms three-sided pyramids with {211} faces. When Pt is dosed onto the heated surface, the transition from planar to faceted structure proceeds through the nucleation and growth of spatially separat

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44

Kan, Hung-Chih, and R. J. Phaneuf. "A quick estimation of the LEED pattern size formed by an electrostatic objective lens in LEEM." Optik 112, no. 11 (2001): 511–14. http://dx.doi.org/10.1078/0030-4026-00096.

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45

Virojanadara, Chariya, S. Watcharinyanon, A. A. Zakharov, R. Yakimova, and Leif I. Johansson. "Studies of Li Intercalation into Epitaxial Graphene on SiC(0001)." Materials Science Forum 717-720 (May 2012): 653–56. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.653.

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Detailed studies of Li deposition on monolayer graphene grown on the Si-face SiC surface were performed using LEEM, µ- LEED, PES and ARPES. Li found to intercalate directly after the deposition at room temperature. However, excess Li was also observed on the surface and found to form a compound with carbon atoms. This compound is suggested to give rise to a new (√3x√3) R30° surface reconstruction. After annealing the (√3x√3) R30° reconstruction was vanished and only a (1x1) graphene diffraction pattern was visible. At the same time a sever change was observed on the graphene morphology, especi

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46

Oh, Ami, Hyosun Leem, and Byoung-Un Oh. "Asarum koreanum (Aristolochiaceae), a new species from Korea." Phytotaxa 429, no. 2 (2020): 173–78. https://doi.org/10.11646/phytotaxa.429.2.8.

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Oh, Ami, Leem, Hyosun, Oh, Byoung-Un (2020): Asarum koreanum (Aristolochiaceae), a new species from Korea. Phytotaxa 429 (2): 173-178, DOI: 10.11646/phytotaxa.429.2.8, URL: http://dx.doi.org/10.11646/phytotaxa.429.2.8

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47

Venables, J. A., C. J. Harland, P. A. Bennett, and T. E. A. Zerrouk. "Electron diffraction in UHV SEM, REM, and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 594–95. http://dx.doi.org/10.1017/s0424820100170700.

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Electron diffraction techniques are widely used in Surface Science, with the main aim of determining atomic positions in surface reconstructions and the location of adsorbed atoms. These techniques require an Ultra-high vacuum (UHV) environment. The use of a focussed beam in UHV electron microscopes in principle allows such techniques to be applied on a microscopic scale. Most obviously this has been achieved in the Low Energy Electron Microscope (LEEM), where the corresponding diffraction technique, LEED, can now be used to investigate local areas with different surface structures, and to fol

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48

Rose, K. C., W. Engel, F. Meißen, A. J. Patchett, A. M. Bradshaw, and R. Imbihl. "LEEM and MEM Studies of Spatiotemporal Pattern Formation." Surface Review and Letters 05, no. 06 (1998): 1233–39. http://dx.doi.org/10.1142/s0218625x98001560.

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Spatiotemporal pattern formation has been investigated with low energy electron microscopy (LEEM) and mirror electron microscopy (MEM) during the catalytic oxidation of CO on Pt{110} under both oscillatory and stationary conditions. Due to higher resolution and richer contrast than in previous PEEM studies, it has been possible to investigate the details of the nucleation and propagation of reaction–diffusion fronts which make up the patterns, Further, new and more complex patterns have been discovered which demonstrate the importance of both global coupling and reaction-induced roughening.

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49

Watanabe, Fumiya, S. Kodambaka, Waclaw Swiech, J. E. Greene, and David G. Cahill. "LEEM study of island decay on Si(110)." Surface Science 572, no. 2-3 (2004): 425–32. http://dx.doi.org/10.1016/j.susc.2004.09.014.

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50

Ondrejcek, M., M. Rajappan, W. Swiech, and C. P. Flynn. "Step fluctuation spectroscopy of Au(111) by LEEM." Surface Science 574, no. 2-3 (2005): 111–22. http://dx.doi.org/10.1016/j.susc.2004.10.024.

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