Artículos de revistas sobre el tema "Metallized film capacitor"
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Belko, V., Liu Cheng, Sofiya Kalmykova, Aleksey Pechnikov, and Andrey Plotnikov. "Influence of Electrodes Configuration on Metallized Film Capacitor Performance Metrics." Problems of the Regional Energetics, no. 1(65) (January 2025): 121–34. https://doi.org/10.52254/1857-0070.2025.1-65.9.
Texto completoJia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying, and 韩春辉 Han Chunhui. "Reliability assessment of metallized film pulse capacitor." High Power Laser and Particle Beams 23, no. 1 (2011): 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.
Texto completoDr., Vinay Dua*. "DRASTIC CHANGE IN DIELECTRIC BREAKDOWN STRENGTH OF OIL SATURATED POLYMER FILM WITH TEMPERATURE." Global Journal of Engineering Science and Research Management 7, no. 4 (2020): 62–74. https://doi.org/10.5281/zenodo.3766188.
Texto completoVuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier, and J. L. Coulomb. "Optimization of Low-Voltage Metallized Film Capacitor Geometry." IEEE Transactions on Magnetics 43, no. 4 (2007): 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.
Texto completoHo, Janet, T. Jow, and Steven Boggs. "Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 6 (2008): 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.
Texto completoDu, Guoqiang, and Jie Zhang. "Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage." Electronics 13, no. 14 (2024): 2886. http://dx.doi.org/10.3390/electronics13142886.
Texto completoLi Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia, and Kong Zhonghua. "Study on Metallized Film Capacitor and Its Voltage Maintaining Performance." IEEE Transactions on Magnetics 45, no. 1 (2009): 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.
Texto completoChen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, et al. "Insulation resistance characteristics of metallized film capacitor under high electric field." High Power Laser and Particle Beams 24, no. 4 (2012): 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.
Texto completoBelko, V.O., O.A. Emelyanov, and I.O. Ivanov. "Processes of Self-Healing in Film Capacitors in Overload Modes." Problemele Energeticii Regionale 2(34) (August 15, 2017): 13–22. https://doi.org/10.5281/zenodo.1188819.
Texto completoKong, M. G., and Y. P. Lee. "Impact of surface discharge plasmas on performance of a metallized film capacitor." Journal of Applied Physics 90, no. 6 (2001): 3069–78. http://dx.doi.org/10.1063/1.1389072.
Texto completoLi, Hua, Yaohong Chen, Fuchang Lin, et al. "The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition." IEEE Transactions on Dielectrics and Electrical Insulation 18, no. 6 (2011): 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.
Texto completoDai, Xiying, Zhaoliang Xing, Wei Yang, et al. "The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films." International Journal of Polymer Science 2022 (November 8, 2022): 1–12. http://dx.doi.org/10.1155/2022/5970484.
Texto completoYoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee, and Heun-Young Lee. "The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications." Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, no. 5 (2011): 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.
Texto completoPeng, Bao Hua, J. L. Zhou, and Jing Feng. "Product Reliability Assessment Method Combining Degradation Data and Lifetime Data." Advanced Materials Research 44-46 (June 2008): 795–802. http://dx.doi.org/10.4028/www.scientific.net/amr.44-46.795.
Texto completoTai, Yunxiao, Pengqi Chen, Yang Jian, Qingqing Fang, Dang Xu, and Jigui Cheng. "Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity." Microelectronics Reliability 137 (October 2022): 114755. http://dx.doi.org/10.1016/j.microrel.2022.114755.
Texto completoZhang, Yong-Xin, Qi-Kun Feng, Shao-Long Zhong, et al. "Digital twin accelerating development of metallized film capacitor: Key issues, framework design and prospects." Energy Reports 7 (November 2021): 7704–15. http://dx.doi.org/10.1016/j.egyr.2021.10.116.
Texto completoLv, Chunlin, Jinjun Liu, Yan Zhang, Wanjun Lei, and Rui Cao. "An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process." Microelectronics Reliability 114 (November 2020): 113892. http://dx.doi.org/10.1016/j.microrel.2020.113892.
Texto completoZhang, Jie, Feipeng Wang, Yushuang He, Guoqiang Du, Lei Pan, and Xiao Zhang. "Risk classification of metallized film capacitor via energy recognition of the first self-healing." IET Conference Proceedings 2023, no. 46 (2023): 1302–4. https://doi.org/10.1049/icp.2024.2671.
Texto completoQi, Xiaoguang, and Steven Boggs. "Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots." Journal of Applied Physics 94, no. 7 (2003): 4449–56. http://dx.doi.org/10.1063/1.1602947.
Texto completoChen, Yaohong, Hua Li, Fuchang Lin, et al. "Study on Self-Healing and Lifetime Characteristics of Metallized-Film Capacitor Under High Electric Field." IEEE Transactions on Plasma Science 40, no. 8 (2012): 2014–19. http://dx.doi.org/10.1109/tps.2012.2200699.
Texto completoH. Lean, Meng, and Wei-Ping L. Chu. "Simulation of charge packet formation in layered polymer film." COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 33, no. 4 (2014): 1396–415. http://dx.doi.org/10.1108/compel-09-2013-0291.
Texto completoQi, Xiaoguang, and Steven Boggs. "Transient finite element computation of the temperature rise in metallized film capacitor end connections caused by underdamped discharge." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 1 (2008): 277–83. http://dx.doi.org/10.1109/t-dei.2008.4446761.
Texto completoDonhowe, Mark, Jeff Lawler, Sean Souffie, and E. Lee Stein. "250°C Operating Temperature Dielectric Film Capacitors." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2011, HITEN (2011): 000201–6. http://dx.doi.org/10.4071/hiten-paper2-mdonhowe.
Texto completoRevenok, T. V., V. V. Sleptsov, and A. O. Diteleva. "Research of electrode materials for the creation of multifunctional current sources with increased capacity as a components of the energy sector of an efficient urban environment." Construction Materials, no. 9 (October 9, 2024): 63–69. http://dx.doi.org/10.31659/0585-430x-2024-828-9-63-69.
Texto completoRytöluoto, Ilkka, Minna Niittymäki, Paolo Seri, et al. "Biaxially oriented silica–polypropylene nanocomposites for HVDC film capacitors: morphology-dielectric property relationships, and critical evaluation of the current progress and limitations." Journal of Materials Chemistry A 10, no. 6 (2022): 3025–43. http://dx.doi.org/10.1039/d1ta10336a.
Texto completoLi Hua, 李化, 陈耀红 Chen Yaohong, 林福昌 Lin Fuchang, and 彭波 Peng Bo. "Lifetime characteristics of metallized film pulsed capacitors." High Power Laser and Particle Beams 22, no. 4 (2010): 773–76. http://dx.doi.org/10.3788/hplpb20102204.0773.
Texto completoJoubert, Ch, A. Béroual, and G. Rojat. "Asymmetrical current distribution in metallized film capacitors." Journal of Applied Physics 95, no. 11 (2004): 6420–25. http://dx.doi.org/10.1063/1.1712009.
Texto completoOstrowski, Jörg, Ralf Hiptmair, and Henning Fuhrmann. "Electric 3D‐simulation of metallized film capacitors." COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 26, no. 2 (2007): 524–43. http://dx.doi.org/10.1108/03321640710727836.
Texto completoBelko, Victor, Ivan Ivanov, Andrey Plotnikov, and Valery Belanov. "Energy characteristics of self-healing process in metallized film capacitors." E3S Web of Conferences 140 (2019): 02006. http://dx.doi.org/10.1051/e3sconf/201914002006.
Texto completoSilvus, Stan, and Kenneth Cook. "Useful Technique for Analysis of Fluid-Filled Capacitors." EDFA Technical Articles 9, no. 2 (2007): 6–12. http://dx.doi.org/10.31399/asm.edfa.2007-2.p006.
Texto completoKong, M. G., and Y. P. Lee. "Electrically induced heat dissipation in metallized film capacitors." IEEE Transactions on Dielectrics and Electrical Insulation 11, no. 6 (2004): 1007–13. http://dx.doi.org/10.1109/tdei.2004.1387824.
Texto completoTortai, J. H., A. Denat, and N. Bonifaci. "Self-healing of capacitors with metallized film technology:." Journal of Electrostatics 53, no. 2 (2001): 159–69. http://dx.doi.org/10.1016/s0304-3886(01)00138-3.
Texto completoGodec, M., Dj Mandrino, and M. Gaberšček. "Investigation of performance degradation in metallized film capacitors." Applied Surface Science 273 (May 2013): 465–71. http://dx.doi.org/10.1016/j.apsusc.2013.02.063.
Texto completoKim, Namhun, Changju Park, Sangshin Kwak, and Jeihoon Baek. "Experimental Comparisons and Evaluations of Different Types of DC-link Capacitors for VSI-Based Electric Compressors in Battery Electric Vehicle Systems." Electronics 9, no. 8 (2020): 1276. http://dx.doi.org/10.3390/electronics9081276.
Texto completoKong, Zhong Hua, Li Gang Wu, Chun Ya Tong, and Zai Fei Luo. "Calculation of Self-Healing Contract Resistance of Metallized Film." Applied Mechanics and Materials 615 (August 2014): 236–39. http://dx.doi.org/10.4028/www.scientific.net/amm.615.236.
Texto completoPicci, G., and M. Rabuffi. "Pulse handling capability of energy storage metallized film capacitors." IEEE Transactions on Plasma Science 28, no. 5 (2000): 1603–6. http://dx.doi.org/10.1109/27.901241.
Texto completoBelko, Victor, Dmitry Glivenko, Oleg Emelyanov, Ivan Ivanov, and Andrey Plotnikov. "Current Pulse Polarity Effect on Metallized Film Capacitors Failure." IEEE Transactions on Plasma Science 45, no. 6 (2017): 1020–25. http://dx.doi.org/10.1109/tps.2017.2703947.
Texto completoLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime investigation and prediction of metallized polypropylene film capacitors." Microelectronics Reliability 53, no. 12 (2013): 1962–67. http://dx.doi.org/10.1016/j.microrel.2013.06.005.
Texto completoNa, J. G. "New method to predict corrosion characteristics of Zn‐metallized thin films for film capacitors." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13, no. 6 (1995): 2739–41. http://dx.doi.org/10.1116/1.579697.
Texto completoXiao, Meng, Mengdie Zhang, Haoliang Liu, Boxue Du, and Yawei Qin. "Dielectric Property and Breakdown Strength Performance of Long-Chain Branched Polypropylene for Metallized Film Capacitors." Materials 15, no. 9 (2022): 3071. http://dx.doi.org/10.3390/ma15093071.
Texto completoWang Wenjuan, 王文娟, 李化 Li Hua, 李智威 Li Zhiwei, 童勇 Tong Yong, and 林福昌 Lin Fuchang. "Lifetime improvement of metallized film capacitors by inner pressure strengthening." High Power Laser and Particle Beams 26, no. 4 (2014): 45015. http://dx.doi.org/10.3788/hplpb20142604.45015.
Texto completoBelko, Victor O., Oleg A. Emelyanov, Ivan O. Ivanov, Andrey P. Plotnikov, and Efrem G. Feklistov. "Application of Numerical Simulation for Metallized Film Capacitors Electrodes Design." IEEE Access 9 (2021): 80945–52. http://dx.doi.org/10.1109/access.2021.3085695.
Texto completoBelko, V. O., D. Y. Glivenko, O. A. Emelyanov, and I. O. Ivanov. "INVESTIGATION OF DEGRADATION IN ELECTRODE CONTACTS OF METALLIZED FILM CAPACITORS." St. Petersburg State Polytechnical University Journal 254, no. 4 (2017): 69–76. http://dx.doi.org/10.5862/jest.254.8.
Texto completoLi, Hua, Wenjuan Wang, Zhiwei Li, et al. "Polarization characteristics of metallized polypropylene film capacitors at different temperatures." IEEE Transactions on Dielectrics and Electrical Insulation 22, no. 2 (2015): 682–88. http://dx.doi.org/10.1109/tdei.2015.7076763.
Texto completoZhao, Jianyin, and Fang Liu. "Reliability assessment of the metallized film capacitors from degradation data." Microelectronics Reliability 47, no. 2-3 (2007): 434–36. http://dx.doi.org/10.1016/j.microrel.2006.05.013.
Texto completoMcCluskey, F. P., N. M. Li, and E. Mengotti. "Eliminating infant mortality in metallized film capacitors by defect detection." Microelectronics Reliability 54, no. 9-10 (2014): 1818–22. http://dx.doi.org/10.1016/j.microrel.2014.07.090.
Texto completoMakdessi, M., A. Sari, and P. Venet. "Metallized polymer film capacitors ageing law based on capacitance degradation." Microelectronics Reliability 54, no. 9-10 (2014): 1823–27. http://dx.doi.org/10.1016/j.microrel.2014.07.103.
Texto completoValentine, Nathan, Michael H. Azarian, and Michael Pecht. "Metallized film capacitors used for EMI filtering: A reliability review." Microelectronics Reliability 92 (January 2019): 123–35. http://dx.doi.org/10.1016/j.microrel.2018.11.003.
Texto completoEl-Husseini, M. H., P. Venet, G. Rojat, and C. Joubert. "Thermal simulation for geometric optimization of metallized polypropylene film capacitors." IEEE Transactions on Industry Applications 38, no. 3 (2002): 713–18. http://dx.doi.org/10.1109/tia.2002.1003421.
Texto completoLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss." IEEE Transactions on Plasma Science 41, no. 5 (2013): 1313–18. http://dx.doi.org/10.1109/tps.2013.2243476.
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