Littérature scientifique sur le sujet « Transmission electron »
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Articles de revues sur le sujet "Transmission electron":
KONNO, Mitsuru, Toshie YAGUCHI et Takahito HASHIMOTO. « Transmission Electron Microscop and Scanning Transmission Electron Microscope ». Journal of the Japan Society of Colour Material 79, no 4 (2006) : 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.
Moldovan, G., X. Li, P. Wilshaw et AI Kirkland. « Counting Electrons in Transmission Electron Microscopes ». Microscopy and Microanalysis 14, S2 (août 2008) : 912–13. http://dx.doi.org/10.1017/s1431927608084912.
Shindo, Daisuke. « Transmission Electron Microscope ». Materia Japan 44, no 11 (2005) : 932–35. http://dx.doi.org/10.2320/materia.44.932.
Yase, Kiyoshi. « Transmission Electron Microscopy. » Kobunshi 43, no 2 (1994) : 94–97. http://dx.doi.org/10.1295/kobunshi.43.94.
Bendersky, L. A., et F. W. Gayle. « Electron diffraction using transmission electron microscopy ». Journal of Research of the National Institute of Standards and Technology 106, no 6 (novembre 2001) : 997. http://dx.doi.org/10.6028/jres.106.051.
Lichte, Hannes. « Electron Holography Improving Transmission Electron Microscopy ». Proceedings, annual meeting, Electron Microscopy Society of America 48, no 1 (12 août 1990) : 208–9. http://dx.doi.org/10.1017/s0424820100179798.
Brydson, R., A. Brown, L. G. Benning et K. Livi. « Analytical Transmission Electron Microscopy ». Reviews in Mineralogy and Geochemistry 78, no 1 (1 janvier 2014) : 219–69. http://dx.doi.org/10.2138/rmg.2014.78.6.
Doyama, Masao, Yoshiaki Kogure, Miyoshi Inoue, Yoshihiko Hayashi, Toshimasa Yoshiie, Toshikazu Kurihara, Ryuichiro Oshima et Katsushige Tsuno. « Transmission Positron-Electron Microscopes ». Materials Science Forum 445-446 (janvier 2004) : 471–73. http://dx.doi.org/10.4028/www.scientific.net/msf.445-446.471.
Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev et L. Schäfer. « ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY ». Fine Chemical Technologies 12, no 1 (28 février 2017) : 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.
Urban, K. « Picometer Transmission Electron Microscopy ». Microscopy and Microanalysis 17, S2 (juillet 2011) : 1314–15. http://dx.doi.org/10.1017/s1431927611007446.
Thèses sur le sujet "Transmission electron":
Jin, Liang. « Direct electron detection in transmission electron microscopy ». Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.
Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
McKeown, Karen. « Using scanning electron microscopy (SEM) and transmission electron nncroscopy ». Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.
Worden, R. H. « Transmission electron microscopy of metamorphic reactions ». Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.
Chan, Yu Fai. « Nanostructure characterization by transmission electron microscopy / ». View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.
Includes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.
Löfgren, André. « Detection of electron vortex beams : Using a scanning transmission electron microscope ». Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Elektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Agarwal, Akshay. « A nanofabricated amplitude-division electron interferometer in a transmission electron microscope ». Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.
"September 2016." Cataloged from PDF version of thesis.
Includes bibliographical references (pages 56-62).
Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'.
by Akshay Agarwal.
S.M.
Johnson, Lars. « Nanoindentation in situ a Transmission Electron Microscope ». Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
The technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Findlay, Scott David. « Theoretical aspects of scanning transmission electron microscopy / ». Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.
Koda, Nobuko. « Transmission electron microscopy studies of fega alloys ». College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.
Thesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Hetherington, C. « Transmission electron microscopy of GaAs/AlGaAs multilayers ». Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.
Livres sur le sujet "Transmission electron":
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg : Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg : Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg : Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.
Carter, C. Barry, et David B. Williams, dir. Transmission Electron Microscopy. Cham : Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.
Williams, David B., et C. Barry Carter. Transmission Electron Microscopy. Boston, MA : Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.
Williams, David B., et C. Barry Carter. Transmission Electron Microscopy. Boston, MA : Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.
Thomas, Jürgen, et Thomas Gemming. Analytical Transmission Electron Microscopy. Dordrecht : Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-8601-0.
Zuo, Jian Min, et John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY : Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.
Deepak, Francis Leonard, Alvaro Mayoral et Raul Arenal, dir. Advanced Transmission Electron Microscopy. Cham : Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.
Pennycook, Stephen J., et Peter D. Nellist, dir. Scanning Transmission Electron Microscopy. New York, NY : Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.
Chapitres de livres sur le sujet "Transmission electron":
Williams, David B., et C. Barry Carter. « Electron Sources ». Dans Transmission Electron Microscopy, 73–89. Boston, MA : Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_5.
Kruit, Pieter. « Electron Sources ». Dans Transmission Electron Microscopy, 1–15. Cham : Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_1.
Weyland, Matthew, et Paul Midgley. « Electron Tomography ». Dans Transmission Electron Microscopy, 343–76. Cham : Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_12.
Lehmann, Michael, et Hannes Lichte. « Electron Holography ». Dans Transmission Electron Microscopy, 215–32. Cham : Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_8.
Williams, David B., et C. Barry Carter. « Electron Sources ». Dans Transmission Electron Microscopy, 67–83. Boston, MA : Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_5.
Reimer, Ludwig. « Electron-Specimen Interactions ». Dans Transmission Electron Microscopy, 143–96. Berlin, Heidelberg : Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_5.
Reimer, Ludwig. « Electron-Specimen Interactions ». Dans Transmission Electron Microscopy, 136–91. Berlin, Heidelberg : Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_5.
Reimer, Ludwig. « Analytical Electron Microscopy ». Dans Transmission Electron Microscopy, 375–430. Berlin, Heidelberg : Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_9.
Reimer, Ludwig. « Electron-Specimen Interactions ». Dans Transmission Electron Microscopy, 136–91. Berlin, Heidelberg : Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_5.
Reimer, Ludwig. « Analytical Electron Microscopy ». Dans Transmission Electron Microscopy, 375–430. Berlin, Heidelberg : Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_9.
Actes de conférences sur le sujet "Transmission electron":
Krysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza et Jan Dziuban. « Electron Transparent Anode for MEMS Transmission Electron Microscope ». Dans 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.
Krajnak, Matus. « Transforming transmission electron microscopy with MerlinEM electron counting detector ». Dans European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.594.
Bach, Nora, Armin Feist, Till Domrose, Marcel Moller, Nara Rubiano da Silva, Thomas Danz, Sascha Schafer et Claus Ropers. « Highly coherent femtosecond electron pulses for ultrafast transmission electron microscopy ». Dans 2017 30th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2017. http://dx.doi.org/10.1109/ivnc.2017.8051554.
Pennycook, S. J. « Transmission Electron Microscopy : Overview and Challenges ». Dans CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY : 2003 International Conference on Characterization and Metrology for ULSI Technology. AIP, 2003. http://dx.doi.org/10.1063/1.1622537.
Leth Larsen, Matthew Helmi. « Deep learning assisted transmission electron microscopy ». Dans European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.924.
Nicholls, Daniel. « Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy ». Dans European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.159.
Feist, Armin, Katharina E. Echternkamp, Reiner Bormann, Nara Rubiano da Silva, Marcel Möller, Wenxi Liang, Sascha Schäfer et Claus Ropers. « Few-nanometer femtosecond electron probe pulses in ultrafast transmission electron microscopy ». Dans International Conference on Ultrafast Phenomena. Washington, D.C. : OSA, 2016. http://dx.doi.org/10.1364/up.2016.uth2b.5.
De Graef, Marc. « Recent Progress in Lorentz Transmission Electron Microscopy ». Dans ESOMAT 2009 - 8th European Symposium on Martensitic Transformations. Les Ulis, France : EDP Sciences, 2009. http://dx.doi.org/10.1051/esomat/200901002.
Xie, Wenkai, Xi Chen, Lin Meng, Xinyan Gao et Shenggang Liu. « Electron-beam transmission properties in plasma channel ». Dans AeroSense 2002, sous la direction de Howard E. Brandt. SPIE, 2002. http://dx.doi.org/10.1117/12.469835.
Merrill, F. E., A. J. Clarke, J. Goett, J. W. Gibbs, C. Hast, S. D. Imhoff, K. Jobe et al. « Demonstration of transmission high energy electron microscopy ». Dans SHOCK COMPRESSION OF CONDENSED MATTER - 2019 : Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter. AIP Publishing, 2020. http://dx.doi.org/10.1063/12.0000952.
Rapports d'organisations sur le sujet "Transmission electron":
Ren, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA : Defense Technical Information Center, janvier 2001. http://dx.doi.org/10.21236/ada392051.
Libera, Matthew R. Transmission Electron Holography of Polymer Microstructure. Fort Belvoir, VA : Defense Technical Information Center, avril 1998. http://dx.doi.org/10.21236/ada344467.
Fraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA : Defense Technical Information Center, octobre 1987. http://dx.doi.org/10.21236/ada189111.
Pennycook, S. J., et A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), juin 2008. http://dx.doi.org/10.2172/939888.
Minor, Andrew M. In situ nanoindentation in a transmission electron microscope. Office of Scientific and Technical Information (OSTI), janvier 2002. http://dx.doi.org/10.2172/807441.
Reed, B., M. Armstrong, K. Blobaum, N. Browning, A. Burnham, G. Campbell, R. Gee et al. Time Resolved Phase Transitions via Dynamic Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), février 2007. http://dx.doi.org/10.2172/902321.
Dietz, N. L. Transmission electron microscopy analysis of corroded metal waste forms. Office of Scientific and Technical Information (OSTI), avril 2005. http://dx.doi.org/10.2172/861616.
Clark, Waylon T., Michael D. Pelock, Jeremy Paul Martin, Daniel Peter Jr Jackson, Mark Edward Savage, Brian Scott Stoltzfus, Clifford Will, Jr Mendel et Timothy David Pointon. Precision electron flow measurements in a disk transmission line. Office of Scientific and Technical Information (OSTI), janvier 2008. http://dx.doi.org/10.2172/932880.
Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), septembre 1992. http://dx.doi.org/10.2172/10170120.
Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), septembre 1992. http://dx.doi.org/10.2172/6282616.