Libri sul tema "Electron microscopy transmission (TEM)"
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Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.
Testo completoReimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.
Testo completoReimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.
Testo completoCarter, C. Barry, e David B. Williams, a cura di. Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.
Testo completoWilliams, David B., e C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.
Testo completoWilliams, David B., e C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.
Testo completoThomas, Jürgen, e Thomas Gemming. Analytical Transmission Electron Microscopy. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-8601-0.
Testo completoZuo, Jian Min, e John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.
Testo completoDeepak, Francis Leonard, Alvaro Mayoral e Raul Arenal, a cura di. Advanced Transmission Electron Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.
Testo completoPennycook, Stephen J., e Peter D. Nellist, a cura di. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.
Testo completoHansen, Thomas Willum, e Jakob Birkedal Wagner, a cura di. Controlled Atmosphere Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-22988-1.
Testo completoReimer, Ludwig, a cura di. Energy-Filtering Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1995. http://dx.doi.org/10.1007/978-3-540-48995-5.
Testo completoHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Cerca il testo completoBrydson, Rik. Aberration-corrected analytical transmission electron microscopy. Hoboken, N.J: Wiley, 2011.
Cerca il testo completoBasic techniques for transmission electron microscopy. Orlando: Academic Press, 1986.
Cerca il testo completoBrydson, Rik, a cura di. Aberration-Corrected Analytical Transmission Electron Microscopy. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9781119978848.
Testo completoKumar, Challa S. S. R., a cura di. Transmission Electron Microscopy Characterization of Nanomaterials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-38934-4.
Testo completoClaverie, Alain, e Mireille Mouis, a cura di. Transmission Electron Microscopy in Micro-Nanoelectronics. Hoboken, NJ USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118579022.
Testo completoZhang, Xiao-Feng, e Ze Zhang, a cura di. Progress in Transmission Electron Microscopy 1. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-09518-8.
Testo completoWilliam, Heckman John, e Klomparens Karen L, a cura di. Scanning and transmission electron microscopy: An introduction. New York: Oxford University Press, 1995.
Cerca il testo completoWilliam, Heckman John, e Klomparens Karen L, a cura di. Scanning and transmission electron microscopy: An introduction. New York: W.H. Freeman, 1993.
Cerca il testo completoPhysical principles of electron microscopy: An introduction to TEM, SEM, and AEM. New York: Springer Science+Business Media, 2005.
Cerca il testo completoInc, ebrary, a cura di. High-resolution electron microscopy. New York: Oxford University Press, 2009.
Cerca il testo completoReimer, Ludwig. Transmission electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer-Verlag, 1989.
Cerca il testo completoTransmission electron microscopy: Physics of image formation and microanalysis. 4a ed. Berlin: Springer, 1997.
Cerca il testo completoR, Lewis P., a cura di. Biological specimen preparation for transmission electron microscopy. Princeton, N.J: Princeton University Press, 1998.
Cerca il testo completoPennycook, Stephen J. Scanning Transmission Electron Microscopy: Imaging and Analysis. New York, NY: Springer Science+Business Media, LLC, 2011.
Cerca il testo completoReimer, Ludwig. Transmission electron microscopy: Physics of image formation. 5a ed. New York, NY: Springer, 2008.
Cerca il testo completo1955-, Howe James M., a cura di. Transmission electron microscopy and diffractometry of materials. 2a ed. Berlin: Springer, 2002.
Cerca il testo completoFultz, Brent, e James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-04516-9.
Testo completoFultz, Brent, e James Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-29761-8.
Testo completoAyache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret e Danièle Laub. Sample Preparation Handbook for Transmission Electron Microscopy. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-1-4419-5975-1.
Testo completoFultz, Brent, e James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-662-04901-3.
Testo completoAyache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret e Danièle Laub. Sample Preparation Handbook for Transmission Electron Microscopy. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-0-387-98182-6.
Testo completoMcLaren, Alex C. Transmission electron microscopy of minerals and rocks. Cambridge: Cambridge University Press, 1991.
Cerca il testo completoHoriuchi, S. Fundamentals of high-resolution transmission electron microscopy. Amsterdam: North-Holland, 1994.
Cerca il testo completoJames, Howe, e SpringerLink (Online service), a cura di. Transmission Electron Microscopy and Diffractometry of Materials. 4a ed. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013.
Cerca il testo completoBarry, Carter C., a cura di. Transmission electron microscopy: A textbook for materials science. 2a ed. New York: Springer, 2009.
Cerca il testo completoExperimental high-resolution electron microscopy. 2a ed. New York: Oxford University Press, 1988.
Cerca il testo completoChescoe, Dawn. The operation of transmission and scanning electron microscopes. Oxford: Oxford University Press, 1990.
Cerca il testo completoHenning, K. H. Electron micrographs (TEM, SEM) of clays and clay minerals. Berlin: Akademie-Verlag, 1986.
Cerca il testo completoE, Reuss Laura, a cura di. Biological electron microscopy: Theory, techniques, and troubleshooting. 2a ed. New York: Kluwer Academic/Plenum Publishers, 2003.
Cerca il testo completoBiological electron microscopy: Theory, techniques, and troubleshooting. New York: Plenum Press, 1992.
Cerca il testo completoUnited States. National Aeronautics and Space Administration., a cura di. Soot precursor material: Visualization via simultaneous LIF-LII and characterization via TEM. [Washington, D.C: National Aeronautics and Space Administration, 1996.
Cerca il testo completoHugo, Richard Charles. In-situ TEM observations of gallium penetration into aluminum grain boundaries. 1993.
Cerca il testo completoTransmission Electron Microscopy. New York, NY: Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-40093-8.
Testo completoEnergy-Filtering Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1995.
Cerca il testo completoTransmission Electron Microscopy In Micronanoelectronics. Wiley-Iste, 2012.
Cerca il testo completoZhang, Xiao-Feng. Progress in Transmission Electron Microscopy. Wuhan Univ Pr, 2001.
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