Bibliografie tematiche / FIB

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Letteratura scientifica selezionata sul tema "FIB"

Autore: Grafiati
Pubblicato: 4 giugno 2021
Ultima modifica: 25 luglio 2025

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Articoli di riviste sul tema "FIB"

1

Haub, Michael, Thomas Guenther, Martin Bogner, and André Zimmermann. "Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications." Micromachines 13, no. 7 (2022): 1019. http://dx.doi.org/10.3390/mi13071019.

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Abstract (sommario):
The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro- and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and repairing electronic circuits. This work investigates FIB/FEB technology as a tool for nanotip fabrication and quantum mechanical tunneling applications at a low tunneling voltage. Using a gas injection system (GIS), the Ga-FIB and FEB technology allows both additive and subtractive fabrication of arbitrary structures. Using energy dispersive X-ray
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2

Liu, Ta-Wei, Chung-Feng Huang, Ming-Lun Yeh, et al. "Less liver fibrosis marker increment in overweight chronic hepatitis B patients observed by age-adjusted Fibrosis-4 Index." BMJ Open Gastroenterology 7, no. 1 (2020): e000543. http://dx.doi.org/10.1136/bmjgast-2020-000543.

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Background and aimsChronic hepatitis B patients in Taiwan with no or limited liver injury are not reimbursed for antiviral treatment by the Taiwan National Health Insurance (NHI). Innovative fibrosis marker, age-adjusted Fibrosis-4 Index (FIB4-AA), was implemented to evaluate the tendency of liver fibrosis in these patients.MethodsThe FIB-4 indices of 256 antiviral treatment-naïve chronic hepatitis B patients at Kaohsiung Medical University Hospital from 2003 to 2019 were reviewed. The difference in initial FIB-4 and last FIB4-AA was treated as a categorical variable, representing the tendency
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Kamada, Yoshihiro, Kensuke Munekage, Takashi Nakahara, et al. "The FIB-4 Index Predicts the Development of Liver-Related Events, Extrahepatic Cancers, and Coronary Vascular Disease in Patients with NAFLD." Nutrients 15, no. 1 (2022): 66. http://dx.doi.org/10.3390/nu15010066.

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The prognosis of nonalcoholic fatty liver disease (NAFLD) patients depends on liver-related events (LREs), extrahepatic cancers, and major adverse cardiovascular events (MACEs). The fibrosis-4 (FIB-4) index is one of the most reliable and useful predictors of the degree of liver fibrosis. Recent studies have reported that the FIB-4 index is also useful for predicting LREs and MACEs in NAFLD patients. In the present study, we investigated the prognostic value of the FIB-4 index in NAFLD patients. A total of 506 biopsy-confirmed NAFLD patients from six hepatology centers in Japan from 2002 to 20
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Hu, Fupin, Jessica A. O'Hara, Jesabel I. Rivera та Yohei Doi. "Molecular Features of Community-Associated Extended-Spectrum-β-Lactamase-Producing Escherichia coli Strains in the United States". Antimicrobial Agents and Chemotherapy 58, № 11 (2014): 6953–57. http://dx.doi.org/10.1128/aac.03321-14.

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ABSTRACTWe characterized 30 community-associated extended-spectrum-β-lactamase-producingEscherichia coliisolates collected from five hospitals in the United States. Nineteen sequence types were identified. All sequence type 131 (ST131) isolates had thefimH30 allele. IncFII-FIA-FIB was the most common replicon type among theblaCTX-M-carrying plasmids, followed by IncFII-FIA and IncA/C. Restriction analysis of the IncFII-FIA-FIB and IncFII-FIA plasmids yielded related profiles for plasmids originating from different hospitals. The plasmids containingblaCTX-MorblaSHVwere stably maintained after s
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Deb, Rajat, Soumik Goswami, Nilanjan Sengupta, et al. "Redefining Liver Fibrosis Risk Assessment in Indians with Type 2 Diabetes: New FIB-4 Score Cutoff for Optimizing Sequential Assessment with Transient Elastography." Indian Journal of Endocrinology and Metabolism 29, no. 2 (2025): 237–41. https://doi.org/10.4103/ijem.ijem_457_24.

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Abstract Introduction: Liver fibrosis in metabolic dysfunction-associated steatotic liver disease (MASLD) is strongly related to hepatic and extrahepatic outcomes. Clinically Significant Liver Fibrosis (CSLF) screening using FIB-4 score is mandated in all T2D patients. The existing FIB-4 cutoff of 1.3 is derived from Western studies and could differ for Indians. Hence, we aimed to determine the FIB-4 cutoff to rule out Transient Elastography (TE) proven CSLF among Indians with T2D. Methods: 551 individuals with T2D underwent laboratory tests for FIB-4 calculation and transient elastography (TE
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Haub, Michael, Thomas Günther, Martin Bogner, and André Zimmermann. "Investigation of Focused Ion and Electron Beam Platinum Carbon Nano-Tips with Transmission Electron Microscopy for Quantum Tunneling Vacuum Gap Applications." Applied Sciences 11, no. 24 (2021): 11793. http://dx.doi.org/10.3390/app112411793.

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Abstract (sommario):
To realize quantum tunneling applications with movable electrodes, sharp tips with radii down to several tens of nanometers are necessary. The use of a focused ion beam (FIB) and focused electron beam (FEB) with a gas injection system (GIS) allows the integration of geometries in the nanoscale directly into micro and nano systems. However, the implementation of the tunneling effect clearly depends on the material. In this work, a metal-organic precursor is used. The investigation of the prepared tunneling electrodes enables an insight into FIB/FEB parameters for the realization of quantum tunn
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Tashima, Janet, and Jay Lindquist. "Combining Focused Ion Beam and Scanning Electron Microscopy for IC Fab Support and Defect Review." Microscopy Today 4, no. 3 (1996): 18–19. http://dx.doi.org/10.1017/s1551929500067961.

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Abstract (sommario):
The cutting-edge tool for IC fab support and defect review brings together the Focused Ion Beam (FIB) technology with the Scanning Electron Microscope (SEM) into a single workstation. The twin beam FIB/SEM workstation, FEI Company's DualBeam™ 820 for example, combines the unique micromachining, microdeposition, and analysis capabilities of a FIB with the high resolution imaging power of a Schottky field emission scanning electron microscope (FE SEM). The full functionality of both instruments is available and neither is compromised by the other.
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Donoso N., Tania, and María Isabel Villegas T. "Percepción materna del ajuste socioemocional de sus hijos preescolares: Estudio descriptivo y comparativo de familias separadas e intactas con alto y bajo nivel de ajuste marital." Revista de Psicología 9, no. 1 (2000): 29. http://dx.doi.org/10.5354/0719-0581.2000.18544.

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Se estudió la percepción que tienen las madres del ajuste emocional y conductual de sus hijos preescolares en 77 familias con escala IPCS: a) 21 separadas viviendo en período crítico post-separación parental (FS), b) 45 intactas con alto nivel de ajuste marital (FIa), y c) 11 intactas con un bajo nivel de ajuste marital (FIb). Se encontraron diferencias significativas entre los niños de FS y FIa en ajuste socioemocional y conductual global, agresividad, retraimiento, inmadurez, comportamiento extraño, ansiedad e imagen disminuida. No se encontraron diferencias significativas en ninguna de las
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Ammar, Ahmed M., Norhan K. Abd El-Aziz, Mohamed G. Aggour, et al. "A Newly Incompatibility F Replicon Allele (FIB81) in Extensively Drug-Resistant Escherichia coli Isolated from Diseased Broilers." International Journal of Molecular Sciences 25, no. 15 (2024): 8347. http://dx.doi.org/10.3390/ijms25158347.

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Multiple drug resistance (MDR) has gained pronounced attention among Enterobacterales. The transfer of multiple antimicrobial resistance genes, frequently carried on conjugative incompatibility F (IncF) plasmids and facilitating interspecies resistance transmission, has been linked to Salmonella spp. and E. coli in broilers. In Egypt, the growing resistance is exacerbated by the limited clinical efficacy of many antimicrobials. In this study, IncF groups were screened and characterized in drug-resistant Salmonella spp. and E. coli isolated from broilers. The antimicrobial resistance profile, P
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m, Aslihan. "Interaction Of Newly Developed Markers Of Insulin Resistance And Liver Fibrosis." Annals of Medical Research 31, no. 8 (2024): 611. http://dx.doi.org/10.5455/annalsmedres.2024.06.114.

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Introduction: Insulin resistance is one of the most common causes of liver fibrosis. Instead of the Homeostatic Model Assessment- Insulin Resistance (HOMA-IR) index, which has been used to indicate insulin resistance for many years, Triglyceride-Glucose index (TyG) has recently been used, which is thought to be more predictive. (AST) to Platelet Ratio Index (APRI) and Fibrosis-4 Index (FIB-4) are newly developed markers to indicate liver fibrosis. In this study, we aimed to examine the relationship between TyG and HOMA-IR and APRI and FIB-4. Material and Methods: 8618 patients who applied to T
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Tesi sul tema "FIB"

1

Ostřížek, Petr. "Elektrotransportní vlastnosti nanostruktur připravených metodou FIB." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229474.

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The aim of this work is fabrication of nanostructures and measurement of their electrotransport properties. There are two different methods used for fabrication - electron beam lithography with sputtering of thin films and focused ion beam with deposition from gas phase. I-V characteristic was measured for characterisation of as prepared nanostructures - wires. Material of wires prepared by using of electron beam lithography was permalloy - an alloy of iron and nickel. Second types of wires prepared by using of chemical vapor deposition induced by focused ion beam was platinum based.
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Mucke, S. "Herstellung von Nanometer-Strukturen mittels feinfokussiertem Ionenstrahl (FIB)." Forschungszentrum Dresden, 2010. http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-28940.

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Feinfokussierte Ionenstrahlen dienen in den Gebieten der Halbleiterindustrie und Materialforschung der Mikro- und Nanostrukturierung. Die vorliegende Arbeit beschäftigt sich mit den beiden Hauptanwendungen von fokussierten Ionenstrahlen, dem Materialabtrag und der ionenstrahlinduzierten Materialabscheidung. Dabei wird die hochauflösende Ionensäule CANION 31Z der Firma Orsay Physics mit Stromdichten von bis zu 10 A/cm2 und mit integriertem Gassystem eingesetzt. Es wird ausführlich auf Anwendungsbeispiele von Fokussierten Ionenstrahlsystemen im Bereich der Industrie und Forschung eingegangen. Sc
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Mucke, S. "Herstellung von Nanometer-Strukturen mittels feinfokussiertem Ionenstrahl (FIB)." Forschungszentrum Rossendorf, 2004. https://hzdr.qucosa.de/id/qucosa%3A21721.

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Feinfokussierte Ionenstrahlen dienen in den Gebieten der Halbleiterindustrie und Materialforschung der Mikro- und Nanostrukturierung. Die vorliegende Arbeit beschäftigt sich mit den beiden Hauptanwendungen von fokussierten Ionenstrahlen, dem Materialabtrag und der ionenstrahlinduzierten Materialabscheidung. Dabei wird die hochauflösende Ionensäule CANION 31Z der Firma Orsay Physics mit Stromdichten von bis zu 10 A/cm2 und mit integriertem Gassystem eingesetzt. Es wird ausführlich auf Anwendungsbeispiele von Fokussierten Ionenstrahlsystemen im Bereich der Industrie und Forschung eingegangen. Sc
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Claude, Jean-Benoît. "Etude des mécanismes de nanogravure par FIB-LMAIS." Thesis, Aix-Marseille, 2017. http://www.theses.fr/2017AIXM0445/document.

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Les problématiques liées à la diminution de la taille des dispositifs actuels amènent l’industrie à réfléchir à des techniques de gravure ayant des résolutions à l’échelle de l’atome. Dans ce contexte, les techniques de nanostructuration directes sont très bien adaptées et représentent un potentiel important pour un futur proche dans les laboratoires de recherches. Le projet sur lequel j’ai travaillé avait pour but de coupler dans un environnement Ultra-Vide (UHV), un Dual-Beam, composé d’un FIB (Faisceau d’Ions Focalisé) et d’un MEB (Microscope électronique à balayage) et un bâti d’épitaxie p
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Guellil, Imene. "Nano-fonctionnalisation par FIB haute résolution de silicium." Electronic Thesis or Diss., Aix-Marseille, 2022. http://www.theses.fr/2022AIXM0361.

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Le but de ce travail est de développer un processus d’élaboration de boîtes quantiques (QD) de silicium-germanium (SiGe) avec des compositions allant du Si au Ge pur, et permettant d’obtenir des QD semi-conductrices et de tailles suffisamment petites pour l’obtention de confinement quantique. Pour cela, nous avons utilisé une combinaison de différentes techniques : l’épitaxie par jets moléculaires, la lithographie ionique par faisceau d’ions focalisés (FIBL) et le démouillage solide hétérogène. Dans ce contexte, la finalité de cette recherche est d’une part de développer un FIB qui puisse être
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Claude, Jean-Benoît. "Etude des mécanismes de nanogravure par FIB-LMAIS." Electronic Thesis or Diss., Aix-Marseille, 2017. http://www.theses.fr/2017AIXM0445.

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Abstract (sommario):
Les problématiques liées à la diminution de la taille des dispositifs actuels amènent l’industrie à réfléchir à des techniques de gravure ayant des résolutions à l’échelle de l’atome. Dans ce contexte, les techniques de nanostructuration directes sont très bien adaptées et représentent un potentiel important pour un futur proche dans les laboratoires de recherches. Le projet sur lequel j’ai travaillé avait pour but de coupler dans un environnement Ultra-Vide (UHV), un Dual-Beam, composé d’un FIB (Faisceau d’Ions Focalisé) et d’un MEB (Microscope électronique à balayage) et un bâti d’épitaxie p
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Rose, Philip David. "High-resolution in situ FIB lithography of MBE GaAs." Thesis, University of Cambridge, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624802.

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Konečný, Martin. "Aplikace KPM na povrchu grafén/Si modifikovaném metodou FIB." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2013. http://www.nusl.cz/ntk/nusl-230836.

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This diploma thesis is focused on the application of Kelvin probe microscopy on graphene fabricated by the chemical vapour deposition. The theoretical part of the thesis deals with basic principles of Kelvin force microscopy and focus ion beam. Further, basic properties of graphene and its possible fabrication methods are discussed. The experimental part is focused on the surface potential measurements on graphene membranes fabricated on the substrate modified by focus ion beam. Finally, atomic force microscope lithography was used for nanopatterning of graphene sheets.
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ElFallagh, Fathi Ali. "3D Analysis of Indentation Damage by FIB tomography and TEM." Thesis, University of Sheffield, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500111.

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Houel, Arnaud. "Ecriture directe de motifs nanométriques assistée par STM et FIB." Aix-Marseille 2, 2002. http://www.theses.fr/2002AIX22063.

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Libri sul tema "FIB"

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Wang, Zhiming M., ed. FIB Nanostructures. Springer International Publishing, 2013. http://dx.doi.org/10.1007/978-3-319-02874-3.

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ill, Swanson Maggie, and Wetzel Rick ill, eds. The fib. Letter People Co., 2002.

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Anderson, Melissa. The big fib. Shadow Mountain, 2010.

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illustrator, Hedderwick Mairi, ed. The big fib. Barrington Stoke, 2015.

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Layton, George. The fib: And other stories. HarperCollins, 1994.

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Farrell, Darren. Doug-Dennis and the flyaway fib. Dial Books for Young Readers, 2010.

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Ayatrohaedi. FS-FIB UI di mata Ayatrohaedi. Fakultas Ilmu Pengetahuan Budaya, Universitas Indonesia, 2007.

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fib. fib Model Code for Concrete Structures 2010. Wiley-VCH Verlag GmbH & Co. KGaA, 2013. http://dx.doi.org/10.1002/9783433604090.

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Ian, Hislop, ed. Lord Gnome's complete fib and lie diet. Private Eye, 1991.

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Barros, Joaquim A. O., Vítor M. C. F. Cunha, Hélder S. Sousa, José C. Matos, and José M. Sena-Cruz, eds. 4th fib International Conference on Concrete Sustainability (ICCS2024). Springer Nature Switzerland, 2024. https://doi.org/10.1007/978-3-031-80724-4.

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Capitoli di libri sul tema "FIB"

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Labille, Jérôme, Natalia Pelinovskaya, Céline Botta, et al. "FIB-SEM." In Encyclopedia of Nanotechnology. Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100246.

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Bauch, Jürgen, and Rüdiger Rosenkranz. "FIB - Ionenfeinstrahltechnik." In Physikalische Werkstoffdiagnostik. Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53952-1_7.

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"Fibs Don't Fib." In Technical Analysis of the Currency Market. John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119201496.ch7.

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"FIB-SEM." In Encyclopedia of Biophysics. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-16712-6_100318.

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"FIB-SEM." In Encyclopedia of Nanotechnology. Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_100332.

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Fine, Michael, James W. Peters, and Robert S. Lawrence. "A. FIB." In The Nature of Health. CRC Press, 2018. http://dx.doi.org/10.1201/9781315365398-19.

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"La FIB:." In Campo Elías Romero Fuenmayor. Editorial Universidad del Norte, 2021. http://dx.doi.org/10.2307/j.ctv287sbqv.9.

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Park, Chris, Amir Avishai, David Pan, Brett Lewis, and Alex Buxbaum. "FIB Overview." In Microelectronics Failure Analysis. ASM International, 2019. http://dx.doi.org/10.31399/asm.tb.mfadr7.t91110335.

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"fib, n.³." In Oxford English Dictionary, 3rd ed. Oxford University Press, 2023. http://dx.doi.org/10.1093/oed/2283840541.

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"fib, v.¹." In Oxford English Dictionary, 3rd ed. Oxford University Press, 2023. http://dx.doi.org/10.1093/oed/4244200257.

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Atti di convegni sul tema "FIB"

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Bonifacio, C. S., R. Li, M. L. Ray, P. E. Fischione, and William Hubbard. "Enhanced TEM Specimen Preparation for STEM-EBIC Analysis Using a Ga FIB system Followed by Post-FIB Ar Ion Beam Milling." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024p0191.

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Abstract Electrical characterization is a critical step in the failure analysis workflow, a sequence that often ends in high-resolution imaging in the transmission electron microscope (TEM). Scanning TEM electron beam-induced current (STEM EBIC) is a technique that effectively combines these methods by performing electrical characterization at each imaging pixel, with the electron beam acting as a local current source. This work highlights the specimen preparation technique using the Ga FIB system followed by post-FIB Ar ion milling for STEM EBIC analysis. We present STEM EBIC as a technique t
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Michael, Joseph. "Introduction to FIB and applications: Plasma FIB and laser." In Proposed for presentation at the CCEM Lecture Series on Electron and Ion Microscopy held June 7-11, 2021 in Hamilton , Ontario, Canado. US DOE, 2021. http://dx.doi.org/10.2172/1870975.

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Stegmann, Heiko, Hubert Schulz, and James Whitby. "FIB-SIMS in FIB-SEMs—Practical Aspects for Physical Failure Analysis." In ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022p0257.

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Abstract Secondary ion mass spectrometry (SIMS) is a well-established method in semiconductor manufacturing process control and development for trace metal and organic contaminant detection, as well as for depth profiling of ultra-thin film stacks and total dopant concentrations. Using a focused ion beam (FIB) as the primary ion beam provides a versatile and highly sensitive analytical technique with lateral resolution down to a few tens of nanometers, an appropriate technique for targeted failure analysis on functional device structures. This paper presents an example to show the potential of
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Gadkari, Kaustubh, M. Lawrence Weikum, Dan Massey, and Christos Papadopoulos. "Pragmatic router FIB caching." In 2015 IFIP Networking Conference (IFIP Networking). IEEE, 2015. http://dx.doi.org/10.1109/ifipnetworking.2015.7145296.

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Suzuki, Eiji, Josh Adams, Calvin Ball, Tim McCready, and Sonya Robinson. "FIB on Test Board." In ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0402.

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Abstract This paper offers an alternative solution in dealing with Focused Ion Beam (FIB) circuit edit debug of RF products that often required soldering the device onto a test board to enable sensitive RF characterization. Performing FIB circuit edit while the device is soldered on a test board not only eliminates signal degradation and inconsistency caused by a socket; but also, it allows for adding additional FIB edits on the same device. The conventional way of RF product debug of devices in a wire bond package was to characterize the device in a socket, perform the FIB circuit edit, encap
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Bonifacio, C. S., P. Nowakowski, M. J. Campin, M. L. Ray, and P. E. Fischione. "Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies." In ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0241.

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Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of
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Moore, Thomas M. "Nanomechanical Characterization in the FIB." In ISTFA 2005. ASM International, 2005. http://dx.doi.org/10.31399/asm.cp.istfa2005p0209.

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Abstract The availability of the focused ion beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability has made it an appealing platform for materials characterization at the sub-micron, or "nano" level. This article focuses on nanomechanical characterization in the FIB, which is an extension of the FIB capabilities into the realm of nano-technology. It presents examples that demonstrate the power and flexibility of nanomechanical testing in the FIB or scanning electron microscope with a probe shaft that includes a built-in strain gauge. Loads that
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Sarrar, Nadi, Robert Wuttke, Stefan Schmid, Marcin Bienkowski, and Steve Uhlig. "Leveraging locality for FIB aggregation." In GLOBECOM 2014 - 2014 IEEE Global Communications Conference. IEEE, 2014. http://dx.doi.org/10.1109/glocom.2014.7037090.

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9

Yun-Ru Wu, Shu-Yi Kao, and Shih-Arn Hwang. "Minimizing ECO routing for FIB." In 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). IEEE, 2010. http://dx.doi.org/10.1109/vdat.2010.5496675.

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10

Giannuzzi, Lucille A. "Multi-signal FIB/SEM tomography." In SPIE Defense, Security, and Sensing. SPIE, 2012. http://dx.doi.org/10.1117/12.919821.

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Rapporti di organizzazioni sul tema "FIB"

1

Shul, Randy J., Michael J. Rye, Greg Salazar, and Steve Ball. FEI FIB/SEM Failure Analysis. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1492079.

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2

Campbell, A. N., D. M. Tanner, J. M. Soden, et al. Electrical and chemical characterization of FIB-deposited insulators. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/532558.

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3

Ogura, K. S., S. B. Donald, and B. W. Chung. Improving Microstructural Quantification in 3D FIB-SEM Tomography. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1566797.

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4

Trotter, G. Terminology for Forwarding Information Base (FIB) based Router Performance. RFC Editor, 2001. http://dx.doi.org/10.17487/rfc3222.

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5

Harmer, M. P. A Focused-Ion Beam (FIB) Nano-Fabrication and Characterization Facility. Defense Technical Information Center, 2002. http://dx.doi.org/10.21236/ada408750.

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6

Tegtmeier, Eric, and Caitlin Taylor. Single Crystal UO2 cube creation using a Xe Plasma FIB. Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1688725.

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7

Bradley, J., Z. Dai, G. Graham, and N. Teslich. Final Report - SRNL Agreement #AC51296V SEM, FIB, TEM Studies of CZT Samples. Office of Scientific and Technical Information (OSTI), 2007. http://dx.doi.org/10.2172/924965.

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8

Long, Daniel, Manish Singh, Small Kathryn, and John Watt. Cryo-FIB for TEM Investigation of Soft Matter and Beam Sensitive Energy Materials. Office of Scientific and Technical Information (OSTI), 2022. http://dx.doi.org/10.2172/2386898.

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9

Wall, M., M. Fluss, and C. Schaldach. Dual Beam FIB for Imaging, Nano-Sectioning and Sample Preparation of Spores: Initial Results. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/892791.

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10

Hirsch, Samuel. Efficacy of a FIB and Planar Preparation Technique for Producing TEM Lamella of CLS. DEVCOM Army Research Laboratory, 2023. http://dx.doi.org/10.21236/ad1201906.

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