Letteratura scientifica selezionata sul tema "Optoelectronic measuring system"
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Articoli di riviste sul tema "Optoelectronic measuring system"
Liu, Ji, Donge Zhao, Yangjun Li e Hanchang Zhou. "Optoelectronic System for Measuring Warhead Fragments Velocity". Journal of Physics: Conference Series 276 (1 febbraio 2011): 012136. http://dx.doi.org/10.1088/1742-6596/276/1/012136.
Testo completoMarkina, O. M., e M. O. Tykhan. "Research of illuminating parameters halogen-filled and LED lamp for optoelectronic measuring system". Archives of Materials Science and Engineering 1, n. 94 (1 novembre 2018): 18–26. http://dx.doi.org/10.5604/01.3001.0012.7804.
Testo completoVasilevskii, A. M., G. A. Konoplev, D. A. Svetlov, V. A. Gerasimov, D. K. Kostrin e A. A. Ukhov. "Optoelectronic Data Measuring System for Monitoring Polyhexamethylene Guanidine-Based Decontaminants". Biomedical Engineering 48, n. 1 (maggio 2014): 13–16. http://dx.doi.org/10.1007/s10527-014-9405-6.
Testo completoMarkina, O. M. "Lighting setting features of opto-electronic measuring system for controlling adhesive joints optical components". Journal of Achievements in Materials and Manufacturing Engineering 2, n. 84 (1 ottobre 2017): 49–57. http://dx.doi.org/10.5604/01.3001.0010.7781.
Testo completoSavich, A. I., e V. V. Makarenko. "Optical tracking system containing an optoelectronic converter for measuring complicated shapes". Measurement Techniques 30, n. 11 (novembre 1987): 1095–98. http://dx.doi.org/10.1007/bf00865067.
Testo completoPulov, Dimcho, e Tsanko Karadzhov. "OPTOELECTRONIC DEVICE FOR MEASURING THE POWER OF LASER RADIATION". ENVIRONMENT. TECHNOLOGIES. RESOURCES. Proceedings of the International Scientific and Practical Conference 3 (16 giugno 2021): 286–90. http://dx.doi.org/10.17770/etr2021vol3.6590.
Testo completoArakantsev, Konstantin G., Igor A. Konyakhin e Alexander N. Timofeev. "Inner-Base Optoelectronic System for the Control of Linear Displacements". Key Engineering Materials 437 (maggio 2010): 237–41. http://dx.doi.org/10.4028/www.scientific.net/kem.437.237.
Testo completoParfiryev, A. V., O. V. Parfiryeva e A. V. Dushkin. "Optimization of the algorithm of information analysis and processing in the optoelectronic system". Proceedings of Universities. Electronics 27, n. 1 (febbraio 2022): 106–19. http://dx.doi.org/10.24151/1561-5405-2022-27-1-106-119.
Testo completoLiu, Qi Fang. "Measuring Coaxiality with Optoelectronic and Non-Contact Based on Helical Scanning". Advanced Materials Research 588-589 (novembre 2012): 1002–5. http://dx.doi.org/10.4028/www.scientific.net/amr.588-589.1002.
Testo completoKonyakhin, I. A., A. D. Merson e D. Y. Zubenko. "Optoelectronic System for Roll Angles Measuring of Maneuvering Objects Based on Anamorphosis Effect". Journal of Physics: Conference Series 48 (1 ottobre 2006): 988–91. http://dx.doi.org/10.1088/1742-6596/48/1/184.
Testo completoTesi sul tema "Optoelectronic measuring system"
Драч, Юрій Олександрович. "Підвищення точності вимірювання геометричних розмірів мікрометричного діапазону шляхом вдосконалення вузла освітлення оптико-електронної системи". Master's thesis, КПІ ім. Ігоря Сікорського, 2020. https://ela.kpi.ua/handle/123456789/38419.
Testo completoIn this master's dissertation an analytical study of the structure of the optoelectronic measuring system, its components and features of the setting. From the topic of the dissertation "Improving the accuracy of measuring the geometric dimensions of the micrometric range by improving the lighting unit of the optoelectronic system" it is clear that by improving the accuracy of measuring geometric dimensions in the micrometric range is improving the light source. We have identified the main known methods for determining the lighting characteristics of light sources in the second section of the dissertation. In this section we analyze the methods of "integrating sphere" and "goniophometric" to determine the luminous flux of lighting systems with different types of light distribution. Of course, we considered the methods of world experience in determining these characteristics and domestic experience, because we planned to conduct experimental studies of our own radiation source, which would correspond to the world level. In the third section, we gave examples of three light sources with lighting characteristics. We noted the spectral characteristics for each light source. In the fourth section, we presented materials on the construction of our optoelectronic measuring system. We designed our measuring system to determine the geometric dimensions of the micrometric range on the basis of an optical microscope, a television camera, which was attached to the body of the optical microscope using adapters (tubes). The radiation received from the geometric dimensions object by the CCD matrix of the television camera was sent to a personal computer with the necessary software, which allowed us to determine the dimensions of the object or the defect of the object by the radiation. We would like to note that we did not develop the software in the master's dissertation, but used the finished software product. After all, we did not face such a task. Most of our efforts have been focused on researching the light source. However, we would like to note that after the results obtained on the study of lighting characteristics of the new light source, we conducted a series of measurements of geometric dimensions in the micrometric range. To compare the accuracy of measuring micrometric geometric dimensions. To do this, we performed measurements on a reference sample of linear geometric dimensions GOST 15114-78 This set of measures uses the establishment of the resolution of telescopic systems, we did not measure the angular geometric dimensions. We would like to note that we chose an LED lamp as a new light source and compared the obtained results of lighting characteristics with a source that is standard (basic) for the optical microscope model. Therefore, we conducted a number of experimental studies of the lighting characteristics of the most popular light source - LED lamps. Analysis of the results of the study showed that before using a mass-produced lamp made by any technology in a measuring system (optoelectronic system) it is necessary after a specialized study in the centers of testing and diagnostics of superconducting light sources and lighting systems. After all, these lighting characteristics from the manufacturers do not correspond to those determined experimentally. Although the characteristics of the LED lamp were not significantly different from the halogen lamp. The impact on the measurement accuracy of the optoelectronic measuring system of these light sources, we determined using a bar measure of absolute contrast and concluded that the efficiency of LED lighting is four times higher than halogen lighting when building a measuring system as described in dissertation.
Edworthy, Robert Mark. "A vehicle-mounted television measuring system for railway structure gauging". Thesis, Brunel University, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.277415.
Testo completoPoizat, Jean-Philippe. "Réalisation et caractérisation de mesures quantiques non-destructives en optique". Phd thesis, Université Paris Sud - Paris XI, 1993. http://pastel.archives-ouvertes.fr/pastel-00714222.
Testo completoChen, Chun-Jen, e 陳俊仁. "The developments of multi-degree-of-freedom optoelectronic measuring systems by using the skew-ray tracing method". Thesis, 2007. http://ndltd.ncl.edu.tw/handle/57945347565817449526.
Testo completo國立成功大學
機械工程學系碩博士班
95
High-accuracy laser-based optoelectronic motion and position measuring systems typically utilize light rays that travel from one optical assembly to another to perform motion and/or position measurements. It is not a simple task to accurately determine the equations of these sensor readings in terms of positional/angular motions. This problem is addressed in this paper by application of the analytic skew-ray tracing methodology as computed by finite difference methodology. An illustrative example of a motion measurement system and comparison of the Position Sensing Detector (PSD) readings are given to validate the proposed methodology. It is shown that the proposed methodology can provide accurate expressions of PSD readings. Based on the proposed methodology, the following three optoelectronic multi-degree-of-freedom measurement systems are established: an optoelectronic inclinometer, a high angular accuracy measurement system and a six Degree-Of-Freedom (DOF) motion measurement system. The optoelectronic inclinometer which can measure inclination angles along two orthogonal directions simultaneously by using a simple pendulum, two mirrors, a 2-axis PSD, and a laser diode. To validate the proposed methodology, an actual prototype system is built, and its calibration and stability experiments are performed. The high accuracy angle measurement system performs angle measurement by use of laser-diodes, 2-axis PSDs and a series of reflections between two first-surface-mirrors. Calibration and stability experiments are performed. Experimental results show the accuracy and measurement range are, respectively, 0.05 arc sec and ±250 arc sec. The six-DOF measurement system comprises a pyramid-polygon- mirror, three laser diodes and three 2-axis PSDs. To validate the proposed methodology, a laboratory prototype system is built. System verification and stability tests are conducted to evaluate its performance. Stability test results show that measurement errors and maximum crosstalk are within ±1 μm in translation and ±1.5 arc sec in rotation.
Libri sul tema "Optoelectronic measuring system"
F, Fagan William, Europtica-Services I. C e Society of Photo-optical Instrumentation Engineers., a cura di. Industrial optoelectronic measurement systems using coherent light. Bellingham, Wash., USA: The Society, 1988.
Cerca il testo completoCapitoli di libri sul tema "Optoelectronic measuring system"
Yanbing, Liu, e Zhang Jinru. "An Optical Fibre Magnetic Field Sensor System for Measuring Low Frequency Fields". In Laser/Optoelektronik in der Technik / Laser/Optoelectronics in Engineering, 770–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-48372-1_163.
Testo completoZhang, J. R., Y. J. Zhang e B. Chen. "Improving the measuring accuracy and reliability of a binocular structured light measurement system". In Frontier Research and Innovation in Optoelectronics Technology and Industry, 57–62. London, UK : CRC Press/Balkema, an imprint of the Taylor & Francis Group, [2019]: CRC Press, 2018. http://dx.doi.org/10.1201/9780429447082-8.
Testo completoDvoynishnikov, Sergey Vladimirovich, e Vladimir Genrievich Meledin. "Optoelectronic Differential Cloudy Triangulation Method for Measuring Geometry of Hot Moving Objects". In Optoelectronics in Machine Vision-Based Theories and Applications, 49–78. IGI Global, 2019. http://dx.doi.org/10.4018/978-1-5225-5751-7.ch003.
Testo completoLindner, Lars. "Laser Scanners". In Developing and Applying Optoelectronics in Machine Vision, 108–45. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch004.
Testo completoCastillo, Javier Rivera, Moises Rivas-Lopez, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio Cesar Rodríguez-Quiñonez e Daniel Hernandez-Balbuena. "Machine Vision Optical Scanners for Landslide Monitoring". In Developing and Applying Optoelectronics in Machine Vision, 206–35. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch007.
Testo completoMiranda-Vega, Jesús Elias, Javier Rivera-Castillo, Moisés Rivas-López, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio C. Rodríguez-Quiñonez e Daniel Hernández-Balbuena. "Reducing the Optical Noise of Machine Vision Optical Scanners for Landslide Monitoring". In Examining Optoelectronics in Machine Vision and Applications in Industry 4.0, 103–33. IGI Global, 2021. http://dx.doi.org/10.4018/978-1-7998-6522-3.ch004.
Testo completoAtti di convegni sul tema "Optoelectronic measuring system"
Galiulin, Ravil M. "Optoelectronic computer-aided measuring OPTEL system". In Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, a cura di Yuri V. Chugui, Sergei N. Bagayev, Albert Weckenmann e P. Herbert Osanna. SPIE, 2002. http://dx.doi.org/10.1117/12.484600.
Testo completoSzebeszczyk, Janina, e Joanna Straszecka. "Achilles tendon reflex measuring system". In Optoelectronic and Electronic Sensors, a cura di Ryszard Jachowicz e Zdzislaw Jankiewicz. SPIE, 1995. http://dx.doi.org/10.1117/12.213153.
Testo completoLigeza, P. "Modeling of complex hot-wire measuring system". In Optoelectronic and Electronic Sensors IV, a cura di Jerzy Fraczek. SPIE, 2001. http://dx.doi.org/10.1117/12.435913.
Testo completoHypszer, Ryszard, Jerzy Plucinski e Pawel Wierzba. "System for measuring thickness of opaque dielectric layers". In Optoelectronic and Electronic Sensors II, a cura di Zdzislaw Jankiewicz e Henryk Madura. SPIE, 1997. http://dx.doi.org/10.1117/12.266718.
Testo completoLi, Hegao. "Measuring system of digital-optical power spectrum". In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294710.
Testo completoZhang, Yuheng, Siyang Liu, Linsheng Zhong, Shenzhan Zhang, Xiaofang Wu e Zhujun Wan. "An Optical System for Measuring the Pitch of a Fiber Array". In Optoelectronic Devices and Integration. Washington, D.C.: OSA, 2018. http://dx.doi.org/10.1364/oedi.2018.ot4a.75.
Testo completoZhang, Yunxiang. "Optical fibre-CCD area endoscope image measuring system". In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294877.
Testo completoGao, Wei, Yi Zeng, Yan Dong, Ye Gu e Guangheng Tong. "Design of automatic image measuring system based on RTX simulation system". In International Symposium on Optoelectronic Technology and Application 2014, a cura di Gaurav Sharma, Fugen Zhou e Jennifer Liu. SPIE, 2014. http://dx.doi.org/10.1117/12.2073163.
Testo completoHao, Qun, Yongtian Wang e Dingguo Sha. "Online measuring system for amorphous strip thickness". In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, a cura di Shulian Zhang e Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403835.
Testo completoZheng, Yingjun, e Yongmei Huang. "New soft-measuring system of polarized light". In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, a cura di Shulian Zhang e Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403894.
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