Bibliografie tematiche / Scanning

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Letteratura scientifica selezionata sul tema "Scanning"

Autore: Grafiati
Pubblicato: 4 giugno 2021
Ultima modifica: 25 luglio 2025

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Articoli di riviste sul tema "Scanning"

1

Liu, Jie, Haiyan Ou, Hua Wang, Lin Peng, and Wei Shao. "Autofocus by Lissajous scanning in time reversal optical scanning holography." Chinese Optics Letters 22, no. 8 (2024): 080501. http://dx.doi.org/10.3788/col202422.080501.

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Bin Yu, Bin Yu, Wei Jia Wei Jia, Changhe Zhou Changhe Zhou, Hongchao Cao Hongchao Cao, and Wenting Sun Wenting Sun. "Grating imaging scanning lithography." Chinese Optics Letters 11, no. 8 (2013): 080501–80503. http://dx.doi.org/10.3788/col201311.080501.

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Arkhipov, V. V. "Scanning systems of rapid-scanning Fourier spectrometers." Journal of Optical Technology 77, no. 7 (2010): 435. http://dx.doi.org/10.1364/jot.77.000435.

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ALVARADO, S. F. "SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY." Surface Review and Letters 02, no. 05 (1995): 607–17. http://dx.doi.org/10.1142/s0218625x95000571.

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Bulgaru, Marius, Vlad Bocăneț, and Mircea Muntean. "Research regarding tactile scanning versus optical scanning." MATEC Web of Conferences 299 (2019): 04013. http://dx.doi.org/10.1051/matecconf/201929904013.

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Abstract (sommario):
In today’s fast-moving world, the manufacturing industry must keep up with evolving trends. One such trend that has greatly impacted the manufacturing industry is called Industry 4.0 and is regarded as the fourth industrial revolution. In this revolution one important aspect is that of quality. This paper makes a comparative study between tactile and optical measuring machines in the context of Industry 4.0. As the manufacturing industry must be more flexible and solve problems in a timelier manner, it is important to identify the right technologies appropriate for quality control.
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Hamilton, D. K., and T. Wilson. "Scanning optical microscopy by objective lens scanning." Journal of Physics E: Scientific Instruments 19, no. 1 (1986): 52–54. http://dx.doi.org/10.1088/0022-3735/19/1/009.

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Mody, Cyrus C. M. "STARS: Scanning Probe Microscopy [Scanning Our Past]." Proceedings of the IEEE 102, no. 7 (2014): 1107–12. http://dx.doi.org/10.1109/jproc.2014.2326811.

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Gareau, Daniel S., James G. Krueger, Jason E. Hawkes, et al. "Line scanning, stage scanning confocal microscope (LSSSCM)." Biomedical Optics Express 8, no. 8 (2017): 3807. http://dx.doi.org/10.1364/boe.8.003807.

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Hsiao, Gregor, and Jezz Leckenby. "Correcting Scanning Errors in Scanning Probe Microscopes." Microscopy Today 7, no. 7 (1999): 10–13. http://dx.doi.org/10.1017/s1551929500064737.

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Abstract (sommario):
Scanning probe microscopes (SPMs) are a family of instruments used for studying the surface properties of materials on a dimensional scale ranging from the atomic to the micrometer level. As depicted in Figure 1, all SPMs work by scanning a finely tipped probe in a raster pattern over the sample surface while measuring and mapping some interaction between the probe and the surface as a function of x-y position. The piezoelectric scanners used to provide the scanning motion offer very fine positional control but have certain inherent errors that, uncorrected, can distort images, introduce artif
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Fu, J., R. D. Young, and T. V. Vorburger. "Long‐range scanning for scanning tunneling microscopy." Review of Scientific Instruments 63, no. 4 (1992): 2200–2205. http://dx.doi.org/10.1063/1.1143139.

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Tesi sul tema "Scanning"

1

Svahn, Stefan. "3D-scanning : Volymberäkning vid scanning av bergvägg." Thesis, Karlstads universitet, Institutionen för geografi, medier och kommunikation, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-33349.

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Abstract (sommario):
Scanning är ett verktyg som har utvecklats mycket och används mer och mer inom geodetisk mätning. Instrumenten har blivit mer pålitliga med högre kvalité på resultaten, därför är det viktigt att eliminera de problem som kan skada scanningens pålitlighet. Det problemet som ska undersökas och testas i det här examensarbetet uppstår när man till exempel scannar en bergvägg. Man vill få en så lik avbildning av bergväggen som möjligt för att sedan kunna göra volymberäkningar emot bergväggen. Avbildningen av bergväggen består av ett moln av punkter som tillsammans skapar en 3D-modell av bergväggen.
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Raspin, P. "Scanning business environments : an investigation into managerial scanning behaviour." Thesis, Cranfield University, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.401662.

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Niblock, Trevor. "Micro scanning probes." Thesis, University of Southampton, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.395357.

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Leane, Robert B. "Scanning tunnelling microscopy." Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291716.

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Hyde, Neville. "Environmental scanning : the need for and overview of environmental scanning system." Thesis, Stellenbosch : University of Stellenbosch, 2000. http://hdl.handle.net/10019.1/4595.

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Thesis (MBA (Business Management))--University of Stellenbosch, 2000.<br>ENGLISH ABSTRACT: Historically organisations have had the "luxury" of being able to anticipate future developments and respond to them in good time due to, firstly, the comparatively slow pace of change and, secondly, the past being a relatively good predictor of the future. The second half of the 20th Century bears witness to some of the most dramatic changes and developments experienced by mankind. Most notable of these were globalisation, de-regulation, the emergence of the information/knowledge economy and, perhaps mo
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Hyde, Neville, and Johan Burger. "Environmental scanning : the need for and overview of environmental scanning systems." Thesis, Stellenbosch : University of Stellenbosch, 2000. http://hdl.handle.net/10019.1/4656.

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ENGLISH ABSTRACT: Historically organisations have had the "luxury" of being able to anticipate future developments and respond to them in good time due to, firstly, the comparatively slow pace of change and, secondly, the past being a relatively good predictor of the future. The second half of the 20th Century bears witness to some of the most dramatic changes and developments experienced by mankind. Most notable of these were globalisation,de-regulation, the emergence of the information/knowledge economy and, perhaps most significant of all, the changes brought about by the Internet. The unde
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Weise, Thibaut. "Real-time 3D scanning." Konstanz Hartung-Gorre, 2009. http://d-nb.info/1000182894/04.

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Almqvist, Nils. "Scanning probe microscopy : Applications." Licentiate thesis, Luleå tekniska universitet, Materialvetenskap, 1994. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-17980.

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Donnermeyer, Achim. "Scanning ion-conductance microscopy." [S.l.] : [s.n.], 2007. http://nbn-resolving.de/urn/resolver.pl?urn=urn:nbn:de:hbz:361-11593.

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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Libri sul tema "Scanning"

1

Ponzio, Nicola. Scanning. Corraini edizioni, 2014.

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Kassing, Rainer, ed. Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0.

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F, Marshall Gerald, ed. Optical scanning. Marcel Dekker, Inc., 1991.

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4

International, Scanning Microscopy. Scanning microscopy. Scanning Microscopy International, 1987.

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Beiser, Leo. Holographic scanning. Wiley, 1988.

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Tally, Taz. Avoiding the scanning blues: A desktop scanning primer. Prentice Hall PTR, 2001.

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Marshall, Gerald, ed. Laser Beam Scanning. CRC Press, 2017. http://dx.doi.org/10.4324/9780203749142.

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Meyer, Ernst, Roland Bennewitz, and Hans J. Hug. Scanning Probe Microscopy. Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-37089-3.

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Reimer, Ludwig. Scanning Electron Microscopy. Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4.

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Neddermeyer, H., ed. Scanning Tunneling Microscopy. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.

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Capitoli di libri sul tema "Scanning"

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Rey, Enno, Michael Thumann, and Dominick Baier. "Scanning." In Mehr IT-Sicherheit durch Pen-Tests. Vieweg+Teubner Verlag, 2005. http://dx.doi.org/10.1007/978-3-322-80257-6_5.

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Bishop, Peter C., and Andy Hines. "Scanning." In Teaching about the Future. Palgrave Macmillan UK, 2012. http://dx.doi.org/10.1057/9781137020703_7.

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Weik, Martin H. "scanning." In Computer Science and Communications Dictionary. Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_16636.

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Martin, Yves. "Performance and selection criteria of critical components of STM and AFM." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_1.

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Briggs, G. A. D., R. Gundle, C. W. Lawrence, A. Rodriguez-Rey, and C. B. Scruby. "Acoustic Microscopy: Pictures to Ponder." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_10.

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Sure, T. "Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_11.

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Pohl, D. W. "On the Search for Last Frontiers Scanning Tunneling Microscopy and Related Techniques (Abstract)." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_12.

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Wickramasinghe, H. K. "STM and AFM extensions (Abstract)." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_13.

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Kassing, Rainer. "Investigations on the SFM." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_2.

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Möller, R. "New Scanning Microscopy Techniques: Scanning Noise Microscopy Scanning Tunneling Microscopy Assisted by Surface Plasmons." In Scanning Microscopy. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-84810-0_3.

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Atti di convegni sul tema "Scanning"

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Chiu, Ming-Hung, Chin-Fa Lai, Chen-Tai Tan, and Yi-Zhi Lin. "Transmission-type angle deviation microscope with NA=0.65 for 3D measurement." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.850984.

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SPIE, Proceedings of. "Front Matter: Volume 7378." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.835753.

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Schwoeble, A. J., Brian R. Strohmeier, and John D. Piasecki. "The influence of surface chemistry on GSR particles: using XPS to complement SEM/EDS analytical techniques." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.863906.

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Leroy, E., S. Mamedov, E. Teboul, A. Whitley, D. Meyer, and L. Casson. "Complementing and adding to SEM performance with the addition of XRF, Raman, CL and PL spectroscopy and imaging." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.864236.

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Campo, E. M., A. Meléndez, K. Morales, J. Poplawsky, J. J. Santiago-Avilés, and I. Ramos. "Electron microscopy and cathodoluminescence in electrospun nanodimensional structures: challenges and opportunities." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.866761.

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Campo, E. M., H. Campanella, Y. Y. Huang, et al. "Electron microscopy of polymer-carbon nanotubes composites." In Scanning Microscopy 2010, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.867718.

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Pfeiffer, Hans C. "New prospects for electron beams as tools for semiconductor lithography." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822771.

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De, Arijit K., and Debabrata Goswami. "Three-dimensional image formation under single-photon ultra-short pulsed illumination." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.822773.

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Cizmar, Petr, András E. Vladár, and Michael T. Postek. "Optimization of accurate SEM imaging by use of artificial images." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.823415.

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Haegel, Nancy M., Chun-Hong Low, Lee Baird, and Goon-Hwee Ang. "Transport imaging with near-field scanning optical microscopy." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.824114.

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Rapporti di organizzazioni sul tema "Scanning"

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Dow, John D. Scanning Tunneling Microscopy. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada249262.

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Marangoni, Alejandro G., and M. Fernanda Peyronel. Differential Scanning Calorimetry. AOCS, 2014. http://dx.doi.org/10.21748/lipidlibrary.40884.

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Melloch, Michael R. Scanning Probe Microscope. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388569.

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Swartzentruber, B. S., A. M. Bouchard, and G. C. Osbourn. Adaptive scanning probe microscopies. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/446386.

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Taylor, A. J., G. P. Donati, G. Rodriguez, T. R. Gosnell, S. A. Trugman, and D. I. Some. Femtosecond scanning tunneling microscope. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/672306.

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Webber, Nels W. LANL Robotic Vessel Scanning. Office of Scientific and Technical Information (OSTI), 2015. http://dx.doi.org/10.2172/1227254.

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Leckey, J. H., and M. D. Boeckmann. Rapid scanning mass spectrometer. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/459358.

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Gharavi, Hamid, K. Venkatesh Prasad, and Petros Ioannou. Scanning advanced automobile technology. National Institute of Standards and Technology, 2007. http://dx.doi.org/10.6028/nist.ir.7421.

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Crooks, R. M., T. S. Corbitt, C. B. Ross, M. J. Hampden-Smith, and J. K. Schoer. Scanning Probe Surface Modification. Defense Technical Information Center, 1993. http://dx.doi.org/10.21236/ada273178.

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Botkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/270266.

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