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Dissertationen zum Thema „Electron microscope“

Autor: Grafiati

Veröffentlicht am 4. Juni 2021

Zuletzt aktualisiert am 25. Juli 2025

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1

Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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2

Martin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.

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3

Duckett, Gordon Richard. "Electron microscope studies of organic pigments." Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.

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4

Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

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Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh

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5

Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

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Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K, I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic

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6

Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope." Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.

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7

Johnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.

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<p>The technique of Nanoindentation <em>in situ</em> Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (<em>α-Al</em><em>2</em><em>O</em><em>3</em>) cut from wafers; Cr/Sc multilayers and <em>Ti</em><em>3</em><em>SiC</em><em>2</em> thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and

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8

Lyster, Martin. "Electron microscope studies of cadmium mercury telluride." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.

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9

Dellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.

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10

Christensen, K. N. "Electron microscope studies of oxygen implanted silicon." Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.

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11

Elliott, Sarah Louise. "Dopant profiling with the scanning electron microscope." Thesis, University of Cambridge, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.270885.

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12

Babich, I. M. "Short history of the scanning electron microscope." Thesis, Видавництво СумДУ, 2012. http://essuir.sumdu.edu.ua/handle/123456789/27513.

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13

Agarwal, Akshay. "A nanofabricated amplitude-division electron interferometer in a transmission electron microscope." Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.

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Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.<br>"September 2016." Cataloged from PDF version of thesis.<br>Includes bibliographical references (pages 56-62).<br>Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by

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14

Caldwell, N. H. M. "Knowledge-based engineering for the scanning electron microscope." Thesis, University of Cambridge, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.597224.

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The dissertation is an account of the author's research into the analysis, design, and implementations of knowledge-based (expert) systems for applications in the field of scanning electron microscopy. The specific tasks of interest have been fault diagnosis and instrument control. This research represents the first utilisation of knowledge-based techniques within electron microscopy. The dissertation begins by providing background material on the scanning electron microscope and surveying the expert systems literature with regard to critical areas of system design. The target applications and

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15

Ali, Saleh Mahdi. "Quantitative analysis of information in electron-microscope images." Thesis, King's College London (University of London), 1986. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.401716.

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16

McLaren, Mathew Jonathon. "Transmission electron microscope characterisation of iron-rhodium epilayers." Thesis, University of Leeds, 2014. http://etheses.whiterose.ac.uk/8281/.

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Iron-rhodium (FeRh) alloys exhibit an unusual magnetostructural transition, making them a fascinating topic of research. When the alloy is approximately equiatomic (Fe48Rh52 to Fe56Rh44) it is in a caesium chloride (CsCl) structure. At room temperature it is antiferromagnetic (AFM), making a first-order phase transition to a ferromagnetic (FM) state when heated above ~350K. There is also a 1% increase in unit lattice volume upon heating to the FM phase, as well as an increase in entropy and decrease in resistivity. The transition can be modified by doping, applied strain and applied magnetic f

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17

Rosolen, Grahame Craig. "The development of a combined scanning electron microscope and scanning tunnelling microscope for nanotechnology." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241061.

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18

Yu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /." [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.

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19

Marturi, Naresh. "Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope." Thesis, Besançon, 2013. http://www.theses.fr/2013BESA2014/document.

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Avec les dernières avancées en matière de nanotechnologies, il est devenu possible de concevoir, avec une grande efficacité, de nouveaux dispositifs et systèmes nanométriques. Il en résulte la nécessité de développer des méthodes de pointe fiables pour la nano manipulation et la nano caractérisation. La d´étection directe par l’homme n’ étant pas une option envisageable à cette échelle, les tâches sont habituellement effectuées par un opérateur humain expert `a l’aide de microscope électronique à balayage équipé de dispositifs micro nano robotiques. Toutefois, en raison de l’absence de méthode

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20

Tanaka, H., T. Kojima, H. Tsuruta, J. Chen, T. Tanji, and M. Ichihashi. "Development of a Real-Time Stereo Transmission Electron Microscope." Cambridge University Press, 2005. http://hdl.handle.net/2237/10297.

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21

Meaden, Graham M. "Cathodoluminescence studies of diamond in the scanning electron microscope." Thesis, University of Bristol, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.357826.

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22

Farley, A. N. "An environmental control stage for the scanning electron microscope." Thesis, University of Bristol, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379674.

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23

Vaughn, Joel M. "Manipulation Of Nanoscale Objects in the Transmission Electron Microscope." Ohio University / OhioLINK, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1191525305.

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24

Gaudenzi, de faria Marcelo. "Robust control for manipulation inside a scanning electron microscope." Thesis, Besançon, 2016. http://www.theses.fr/2016BESA2068/document.

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Cette thèse étudie le problème de nano-positionnement à l'intérieur d'un microscope électronique à balayage (MEB). Pour obtenir des informations de position avec rapidité et précision, une installation dédiée composée d’un vibromètre placé à l'intérieur du MEB a été mise en œuvre. Cette approche diffère de méthodes basées sur le traitement d'images, car elle permet de saisir des données en temps réel sur le comportement dynamique des structures étudiées. Dans une première étude, les perturbations mécaniques agissant à l'intérieur de la chambre à vide du microscope ont été caractérisées et leur

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25

Mattiazzo, Serena. "Performances of the Ion Electron Emission Microscope at SIRAD." Doctoral thesis, Università degli studi di Padova, 2008. http://hdl.handle.net/11577/3425031.

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When an energetic ion strikes a microelectronic device it induces current transients that may lead to a variety of undesirable Single Event Effects (SEE). An important part of the activity of the SIRAD heavy ion facility at the 15 MV Tandem accelerator of the INFN Laboratories of Legnaro (Italy) concerns SEE studies of microelectronic devices destined for radiation hostile environments. An Ion Electron Emission Microscope (IEEM) is working at the SIRAD facility. In the IEEM technique, a broad ion beam irradiates a device under test (DUT) and the secondary electrons emitted by the target surf

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26

Bélisle, Jonathan. "Design and assembly of a multimodal nonlinear laser scanning microscope." Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100765.

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The objective of this thesis is to present the fabrication of a multiphoton microscope and the underlying theory responsible for its proper functioning. A basic introduction to nonlinear optics will give the necessary knowledge to the reader to understand the optical effects involved. Femtosecond laser pulses will be presented and characterized. Each part of the microscope, their integration and the design of the microscope will be discussed. The basic concepts of laser scanning microscopy are also required to explain the design of the scanning optics. Fast scanning problems and their solution

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27

Gass, Mhairi Hope. "Low-loss electron energy loss spectroscopy in a scanning transmission electron microscope of GaInNAs." Thesis, University of Liverpool, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.415656.

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28

Chang, Michael Ming Yuen. "A computer-controlled system in transmission electron microscopy." Thesis, University of Cambridge, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292941.

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29

Somodi, Philippa Katherine. "Interpretation of electron holograms of doped semiconductors and phase retrieval in the transmission electron microscope." Thesis, University of Cambridge, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613846.

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30

Hurm, Christian. "Towards an unambiguous electron magnetic chiral dichroism (EMCD) measurement in a transmission electron microscope (TEM)." Berlin Logos-Verl, 2008. http://d-nb.info/992155444/04.

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31

Staniewicz, Lech Thomas Leif. "Transmission-mode imaging in the environmental scanning electron microscope (ESEM." Thesis, University of Cambridge, 2012. https://www.repository.cam.ac.uk/handle/1810/242281.

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Electron microscopy was first conducted in the 1930s with the advent of theTEM and later the STEM. In 1969, the first commercial SEM was released,with the possibility of retrofitting it to behave like a STEM following soonafterwards. In 1979, Danilatos and Robinson advanced electron microscopyby creating a new type of SEM which allowed a controlled quantity of gasinto the sample chamber, termed ESEM. The most recent evolution in thisline was the combination of ESEM and STEM in 2005, a procedure termedWet STEM.The focus of this work is on investigating applications of this new technique,along w

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32

Murphy, Michael James. "Low-dimensional electron systems fabricated with an atomic force microscope." Thesis, University of Cambridge, 2007. https://www.repository.cam.ac.uk/handle/1810/265511.

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Over the past quarter-century, there has been intensive research into electron transport in low dimensional systems, especially those fabricated in semiconductor material. This research has added to our understanding of electrical transport properties outside of the macroscopic regime, and allowed exploration of potential device designs and fabrication methods. To define devices on micron and nanometer length scales, powerful lithographic techniques such as photolithography and electron-beam lithography have been widely employed to pattern semiconductor material. A newer technique is exploited

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33

Gold, Daniel Patrick. "Transmission electron microscope studies of emitters of silicon bipolar transistors." Thesis, University of Oxford, 1989. http://ora.ox.ac.uk/objects/uuid:ec5f58c3-ced6-44fe-8f1f-d042cdb7b7b7.

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Transmission Electron Microscope (TEM) studies have been carried out of emitter regions in polysilicon contacted emitter bipolar transistors. The preparation of suitable TEM thin foils is described. In addition a technique is developed for the observation and quant jtative interpretation of the break-up of the interfacial oxide layers observed in these samples. The effect of annealing the samples prior to emitter dopant implantation (pre-annealing) is investigated for phosphorus and arsenic doped samples, implanted into a polysilicon layer 0.4μm thick, with a dose of 1x10<sup>16</sup>cm<sup>2<

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34

Ravichandran, M. V. "Electron microscope investigation of SiC-whisker reinforced-oxide ceramic composites." Thesis, University of Cambridge, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.239253.

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35

Kazemian, Payam. "Progress towards quantitative dopant profiling with the scanning electron microscope." Thesis, University of Cambridge, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613999.

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36

Pratt, Neil Victor. "Luminescence and scanning electron microscope studies of III-V semiconductors." Thesis, Imperial College London, 1988. http://hdl.handle.net/10044/1/47222.

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37

于恩華 and Enhua Yu. "Crossed and uncrossed retinal fibres in normal and monocular hamsters: light and electron microscopic studies." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1990. http://hub.hku.hk/bib/B31232449.

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38

Sasaki, Katsuhiro, and Hiroyasu Saka. "A simple method of the electric/magnetic field observation by a conventional transmission electron microscope." Trans Tech Publications Inc, 2005. http://hdl.handle.net/2237/5299.

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39

Arai, Shigeo, Shunsuke Muto, Takayoshi Tanji, et al. "Development of an environmental high-voltage electron microscope for reaction science." Oxford University Press, 2013. http://hdl.handle.net/2237/20833.

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40

Buggy, T. W. "Theoretical and experimental studies using a prototype scanning transmission electron microscope." Thesis, University of Glasgow, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.375453.

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41

Reid, Stephen Alastair. "A study of human skeletal maturation using the scanning electron microscope." Thesis, University College London (University of London), 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.288391.

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42

Jackson, Michael David. "Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems." Thesis, University of Liverpool, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.338676.

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43

Kenny, Peter Gerard. "The acquisition and analysis of multi-spectral analytical electron microscope images." Thesis, University of York, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.276346.

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44

Rogers, Peter John. "Backscatter Electron Microscope, palynofacies and geochemical analysis of Mesozoic black shales." Thesis, University of Southampton, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.296422.

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45

Chuah, Joon Huang. "A multi-pixel CMOS photon detector for the scanning electron microscope." Thesis, University of Cambridge, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.608077.

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46

Antypas, Ioanna. "Theoretical approaches to magnetic induction mapping in the transmission electron microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611855.

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47

Zaggout, Fatima Nouh. "Quantification of SE dopant contrast in low voltage scanning electron microscope." Thesis, University of York, 2007. http://etheses.whiterose.ac.uk/11013/.

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48

Nye, Philip. "Computer instrumentation for voltage contrast measurement in the scanning electron microscope." Thesis, University of Edinburgh, 1990. http://hdl.handle.net/1842/15545.

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The scanning electron microscope is widely used in industry as a tool in both development and production stages of integrated circuit manufacture, firstly for very high magnification topographical inspection of circuits and secondly for various diagnostic techniques in which the electron beam interacts in some way with the circuit. The most used of these techniques is voltage contrast, in which the scanning electron microscope is used to measure voltages and waveforms within the operating circuit. There are an increasing number of systems available for making voltage contrast measurements. Thi

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49

Worlock, Stephen. "A model of VLSI specimen charging in the scanning electron microscope." Thesis, University of Edinburgh, 1992. http://hdl.handle.net/1842/14704.

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When VLSI devices are viewed using a Scanning Electron Microscope (SEM) with a low energy (1keV) primary beam, exposed dielectric surfaces can undergo charging. Such charging can have an adverse effect on voltage contrast testing of the device. The aim of this thesis is to improve understanding of charging behaviour. By adopting common VLSI materials and typical voltage contast SEM configurations, it makes a qualitative study of the factors that influence VLSI specimen charging. A model of specimen charging, based on the study, is then formulated and assessed.

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50

Cornille, Olivier. "Accurate 3D shape and displacement measurement using a scanning electron microscope." Toulouse, INSA, 2005. http://www.theses.fr/2005ISAT0021.

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Avec le développement actuel des nano-technologies, la demande en matière d'étude du comportement des matériaux à des échelles micro ou nanoscopique ne cesse d'augmenter. Pour la mesure de forme ou de déformations tridimensionnelles à ces échelles de grandeur, l'acquisition d'images à partir d'un Microscope électronique à Balayage (MEB) couplée à l'analyse par corrélation d'images numériques s'est avérée une technique intéressante. Cependant, un MEB est un outil conçu essentiellement pour de la visualisation et son utilisation pour des mesures tridimensionnelles précises pose un certain nombre

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