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Thematische Bibliographien / Material modifications by ion beam / Zeitschriftenartikel

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Zeitschriftenartikel zum Thema „Material modifications by ion beam“

Autor: Grafiati

Veröffentlicht am 28. Juni 2021

Zuletzt aktualisiert am 29. Juli 2025

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1

Feng, Y. C., X. G. Li, and S. T. Yang. "Electron beam evaporation broad beam metal ion source for material modifications." Review of Scientific Instruments 67, no. 3 (1996): 924–26. http://dx.doi.org/10.1063/1.1146773.

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2

Ramola, R. C., and Subhash Chandra. "Ion Beam Induced Modifications in Conducting Polymers." Defect and Diffusion Forum 341 (July 2013): 69–105. http://dx.doi.org/10.4028/www.scientific.net/ddf.341.69.

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High energy ion beam induced modifications in polymeric materials is of great interest from the point of view of characterization and development of various structures and filters. Due to potential use of conducting polymers in light weight rechargeable batteries, magnetic storage media, optical computers, molecular electronics, biological and thermal sensors, the impact of swift heavy ions for the changes in electrical, structural and optical properties of polymers is desirable. The high energy ion beam irradiation of polymer is a sensitive technique to enhance its electrical conductivity, st

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3

Dudnikov, Vadim, and Andrei Dudnikov. "Highly Efficient Small Anode Ion Source." Plasma 4, no. 2 (2021): 214–21. http://dx.doi.org/10.3390/plasma4020013.

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We describe some modifications to a Bernas-type ion source that improve the ion beam production efficiency and source operating lifetime. The ionization efficiency of a Bernas type ion source has been improved by using a small anode that is a thin rod, oriented along the magnetic field. The transverse electric field of the small anode causes the plasma to drift in the crossed ExB field to the emission slit. The cathode material recycling was optimized to increase the operating lifetime, and the wall potential optimized to suppress deposition of material and subsequent flake formation. A three-

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4

Iwase, Akihiro. "Modifications of Metallic and Inorganic Materials by Using Ion/Electron Beams." Quantum Beam Science 6, no. 1 (2021): 1. http://dx.doi.org/10.3390/qubs6010001.

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5

Abdul-Kader, A. M., and Andrzej Turos. "Ion Beam Induced Modifications of Biocompatible Polymer." Solid State Phenomena 239 (August 2015): 149–60. http://dx.doi.org/10.4028/www.scientific.net/ssp.239.149.

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Ion beam bombardment has shown great potential for improving the surface properties of polymers. In this paper, the ion beam-polymer interaction mechanisms are briefly discussed. The main objective of this research was to study the effects of H-ion beam on physico-chemical properties of Ultra-high-molecular-weight polyethylene (UHMWPE) as it is frequently used in biomedical applications. UHMWPE was bombarded with 65 keV H-ions to fluences ranging from 1x1014–2x1016 ions/cm2. Changes of surface layer composition produced by ion bombardment of UHMWPE samples were studied. The hydrogen release an

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6

Singh, Kritika, Surya Snata Rout, Christina Krywka, and Anton Davydok. "Local Structural Modifications in Metallic Micropillars Induced by Plasma Focused Ion Beam Processing." Materials 16, no. 22 (2023): 7220. http://dx.doi.org/10.3390/ma16227220.

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A focused ion beam scanning electron microscope (FIB-SEM) is a powerful tool that is routinely used for scale imaging from the micro- to nanometer scales, micromachining, prototyping, and metrology. In spite of the significant capabilities of a FIB-SEM, there are inherent artefacts (e.g., structural defects, chemical interactions and phase changes, ion implantation, and material redeposition) that are produced due to the interaction of Ga+ or other types of ions (e.g., Xe+, Ar+, O+, etc.) with the sample. In this study, we analyzed lattice distortion and ion implantation and subsequent materia

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Feng, Y. C., and S. P. Wong. "Low energy solid intense ion beams extracted by electron beam evaporation ion source for material modifications." Review of Scientific Instruments 69, no. 7 (1998): 2644–46. http://dx.doi.org/10.1063/1.1148992.

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8

Iqbal, Muhammad, J. I. Akhter, A. Qayyum, Y. Javed, M. Rafiq, and A. A. Khuram. "Surface Modification and Characterization of Bulk Amorphous Materials." Key Engineering Materials 510-511 (May 2012): 43–50. http://dx.doi.org/10.4028/www.scientific.net/kem.510-511.43.

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Bulk metallic glasses (BMGs) are well known for their promising properties. Surface properties can be further improved by using certain techniques such as electron beam melting (EBM), laser beam melting (LBM), ion irradiation, ion implantation and neutron irradiation. BMGs especially Zr-based BMGs have numerous applications as structural materials. In this manuscript, the results are presented on microstructural investigations and phase formations in Zr-based BMGs modified by using above mentioned techniques. Microstructure was studied by scanning electron microscopy (SEM). Phase analysis was

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Bahng, Jungbae, Yuncheol Kim, Young-woo Lee, et al. "Multi-filament ion source for uniform ion beam generation." Journal of Physics: Conference Series 2743, no. 1 (2024): 012054. http://dx.doi.org/10.1088/1742-6596/2743/1/012054.

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Abstract Ion beams are employed in various fields such as semiconductor manufacturing, surface modification and material science. The uniformity of ion beams is crucial in many applications, but conventional ion sources that use a single filament often limit the uniformity and intensity of the ion beam. This paper presents a study that aims to optimize a multi-filament ion source to enhance the uniformity of ion beams. The study includes a detailed explanation of the ion source components and design, methods for measuring ion beam uniformity with its experimental design, followed by results, a

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Hirayama, Y. "GaAs/AlGaAs material modifications induced by focused Ga ion beam implantation." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 6, no. 3 (1988): 1018. http://dx.doi.org/10.1116/1.584339.

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11

Remnev, G. E., V. A. Tarbokov, and S. K. Pavlov. "Material modification by high-intense pulsed ion beams." Physics and Chemistry of Materials Treatment 2 (2021): 5–26. http://dx.doi.org/10.30791/0015-3214-2021-2-5-26.

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The review is devoted to the use of powerful submicrosecond ion beams for the synthesis and modification of material properties. Powerful ion beams, originally developed for the problems of inertial thermonuclear fusion, have been increasingly used over the past 30 years as a powerful pulsed heating source providing ample opportunities for modifying the surface layer of materials. By varying the key parameters of the beams, such as the composition (type of ions), the duration of the accelerating pulse (10 ns – 1 μs), the kinetic energy of the ions (0.1 – 1 MeV), the energy density transmitted

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Sezen, Meltem, and Feray Bakan. "Development of Functional Surfaces on High-Density Polyethylene (HDPE) via Gas-Assisted Etching (GAE) Using Focused Ion Beams." Microscopy and Microanalysis 21, no. 6 (2015): 1379–86. http://dx.doi.org/10.1017/s1431927615015391.

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AbstractIrradiation damage, caused by the use of beams in electron and ion microscopes, leads to undesired physical/chemical material property changes or uncontrollable modification of structures. Particularly, soft matter such as polymers or biological materials is highly susceptible and very much prone to react on electron/ion beam irradiation. Nevertheless, it is possible to turn degradation-dependent physical/chemical changes from negative to positive use when materials are intentionally exposed to beams. Especially, controllable surface modification allows tuning of surface properties for

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Yatsui, Kiyoshi. "Industrial applications of pulse power and particle beams." Laser and Particle Beams 7, no. 4 (1989): 733–41. http://dx.doi.org/10.1017/s0263034600006200.

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An overview is given of recent progress in the industrial applications of intense pulse power and associated particle beams, except for activities in inertial confinement fusion. In particular, several topics are discussed which relate to the applications in the R&D of materials, the excitation of short wavelength lasers, the generation of charged particle beams, and the development of plasma X-ray sources.I. Applications in material processing. If intense pulsed charged particle beams are directed onto materials, only their surfaces where the beam energy is deposited are quickly heated up

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Noël, Céline, Sara Pescetelli, Antonio Agresti, et al. "Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams." Materials 12, no. 5 (2019): 726. http://dx.doi.org/10.3390/ma12050726.

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Ion beam depth profiling is increasingly used to investigate layers and interfaces in complex multilayered devices, including solar cells. This approach is particularly challenging on hybrid perovskite layers and perovskite solar cells because of the presence of organic/inorganic interfaces requiring the fine optimization of the sputtering beam conditions. The ion beam sputtering must ensure a viable sputtering rate on hard inorganic materials while limiting the chemical (fragmentation), compositional (preferential sputtering) or topographical (roughening and intermixing) modifications on soft

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Shen, Z. G., C. H. Lee, C. Wu, D. Y. Jiang, and S. Z. Yang. "Material surface modification by pulsed ion beam." Journal of Materials Science 25, no. 7 (1990): 3139–41. http://dx.doi.org/10.1007/bf00587663.

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16

Bacri, C. O., C. Bachelet, C. Baumier, et al. "SCALP, a platform dedicated to material modifications and characterization under ion beam." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 406 (September 2017): 48–52. http://dx.doi.org/10.1016/j.nimb.2017.03.036.

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17

Grant Norton, M., Elizabeth L. Fleischer, William Hertl, James W. Mayer, and C. Barry Carter. "Direct observation of microstructural changes in ion-beam modified ceramics." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 1048–49. http://dx.doi.org/10.1017/s0424820100178379.

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A technique for the direct observation of microstructural changes in ceramics following ion- implantation is presented. Ion-implantation produces modifications to the mechanical properties of ceramic surfaces. These modifications have been investigated as a means of improving the hardness and wear of such materials. Examples of these changes will be presented for single-crystal specimens of MgO which have been implanted with Xe+ ions. The resultant microstructural changes are a function of ion fluence and are related to structural modifications at or near the surface.Transmission electron micr

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Brow, R. K. "Glass surface modifications during ion beam sputtering." Journal of Non-Crystalline Solids 107, no. 1 (1988): 1–10. http://dx.doi.org/10.1016/0022-3093(88)90084-1.

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19

Kitta, Mitsunori, and Masanori Kohyama. "Nanoscale controlled Li-insertion reaction induced by scanning electron-beam irradiation in a Li4Ti5O12 electrode material for lithium-ion batteries." Physical Chemistry Chemical Physics 19, no. 18 (2017): 11581–87. http://dx.doi.org/10.1039/c7cp00185a.

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Electron beam of scanning transmission electron microscopy can induce nanoscale-controlled Li-insertion in Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub> electrode, which is significant as a new type of electron beam-assisted chemical reactions for local structural and property modifications.

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20

Sharp, C. J., R. Franqueira Ximenes, M. Calviani, et al. "CERN Linac4 Chopper Dump: operational experience and future upgrades." Journal of Physics: Conference Series 2420, no. 1 (2023): 012093. http://dx.doi.org/10.1088/1742-6596/2420/1/012093.

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Abstract The Chopper Dump in the Linac4 accelerator at CERN is a beam-intercepting device responsible for the absorption of the 3 MeV H− ion beam produced by the Linac4 source and deflected upstream by an electromagnetic chopper. It allows a portion of the beam, which would otherwise fall into the unstable region of the radiofrequency buckets in the Proton Synchrotron Booster, to be dumped at low energy with minimal induced radiation. It may also be used to absorb the entire beam. With peak currents of 25 to 45 mA and shallow penetration, this results in large deposited energy densities, therm

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Potemkin, G. V., A. E. Ligachev, and M. V. Zhidkov. "Properties of a high-power ion beam with particle energy up to 1 MeV, obtained from a plasma created by a high-voltage pulse on a graphite cathode." Physics and Chemistry of Materials Treatment 4 (2023): 18–31. http://dx.doi.org/10.30791/0015-3214-2023-4-18-31.

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The features of the method for generating gas-vapor plasma and the characteristics of a high-power ion beam (HPIB) obtained in a vacuum diode with a graphite cathode using a plasma-forming high-voltage nanosecond pulse are described. The cathode material and the two-pulse mode of operation of the TEMP-4 type diode make it possible to form a multicomponent nanosecond HPIB with a maximum ion energy of up to 1 MeV, a particle flux density on the surface of ~ 1013 ion/cm2, and a power density on the sample surface of up to 107 W/cm2 to modify the surface properties of structural materials. Materia

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22

Torrisi, L., and G. Foti. "Ion beam etching of polytetrafluoroethylene." Journal of Materials Research 5, no. 11 (1990): 2723–28. http://dx.doi.org/10.1557/jmr.1990.2723.

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Cross-links among long chains have been observed in ion bombarded hydrocarbon polymers like polystyrene or polyethylene. Irradiation of fluoropolymers, instead, produces a strong sample erosion with emission of fragments produced along the ion track. Polytetrafluoroethylene foils of thickness ranging from 50 μm up to 2 mm were exposed to MeV helium and proton beams. The ion erosion rate was investigated by changing the target temperature and observing surface topography modifications, using the scanning electron microscopy technique. Etching was measured as removed thickness per irradiation ti

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23

ROUT, BIBHUDUTTA, MANGAL S. DHOUBHADEL, PRAKASH R. POUDEL, et al. "ION BEAM MATERIALS ANALYSIS AND MODIFICATIONS AT keV TO MeV ENERGIES AT THE UNIVERSITY OF NORTH TEXAS." International Journal of Modern Physics: Conference Series 27 (January 2014): 1460147. http://dx.doi.org/10.1142/s2010194514601471.

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The University of North Texas (UNT) Ion Beam Modification and Analysis Laboratory (IBMAL) has four particle accelerators including a National Electrostatics Corporation (NEC) 9SDH-2 3 MV tandem Pelletron, a NEC 9SH 3 MV single-ended Pelletron, and a 200 kV Cockcroft-Walton. A fourth HVEC AK 2.5 MV Van de Graaff accelerator is presently being refurbished as an educational training facility. These accelerators can produce and accelerate almost any ion in the periodic table at energies from a few keV to tens of MeV. They are used to modify materials by ion implantation and to analyze materials by

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Phaneuf, M. W., J. Li, and T. Malis. "High Resolution FIB as a General Materials Science Tool." Microscopy and Microanalysis 4, S2 (1998): 492–93. http://dx.doi.org/10.1017/s1431927600022583.

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Focused Ion Beam or FIB systems have been used in integrated circuit production for some time. The ability to combine rapid, precision focused ion beam sputtering or gas-assisted ion etching with focused ion beam deposition allows for rapid-prototyping of circuit modifications and failure analysis of defects even if they are buried deep within the chip's architecture. Inevitably, creative TEM researchers reasoned that a FIB could be used to produce site specific parallel-sided, electron transparent regions, thus bringing about the rather unique situation wherein the specimen preparation device

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Orloff, J., L. W. Swanson, Jia-Zheng Li, and Dave Tuggle. "Beam Size in A High-Resolution Ion Microprobe Operated at High Current." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 312–13. http://dx.doi.org/10.1017/s0424820100135162.

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In recent years the development of liquid metal ion (LMI) sources has made it possible to produce high intensity focused ion beams - beams with current densities of the order of a few amperes per square centimeter and diameters of from less than 50 nanometers to a few micrometers [1,2]. These beams have been applied in areas such as scanning ion microscopy, surface analysis, lithography, implantation and micromachining (removing minute amounts of material in a precise and programmed way). In terms of technological utility micromachining has been the most important of these applications and doz

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Abdul-Kader, A. M. "Surface modifications of PADC polymeric material by ion beam bombardment for high technology applications." Radiation Measurements 69 (October 2014): 1–6. http://dx.doi.org/10.1016/j.radmeas.2014.07.013.

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Weidenmüller, U., J. Meijer, A. Stephan, et al. "Heavy ion projection beam system for material modification at high ion energy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20, no. 1 (2002): 246. http://dx.doi.org/10.1116/1.1434975.

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Veligura, Vasilisa, Gregor Hlawacek, Robin P. Berkelaar, Raoul van Gastel, Harold J. W. Zandvliet, and Bene Poelsema. "Digging gold: keV He+ ion interaction with Au." Beilstein Journal of Nanotechnology 4 (July 24, 2013): 453–60. http://dx.doi.org/10.3762/bjnano.4.53.

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Helium ion microscopy (HIM) was used to investigate the interaction of a focused He+ ion beam with energies of several tens of kiloelectronvolts with metals. HIM is usually applied for the visualization of materials with extreme surface sensitivity and resolution. However, the use of high ion fluences can lead to significant sample modifications. We have characterized the changes caused by a focused He+ ion beam at normal incidence to the Au{111} surface as a function of ion fluence and energy. Under the influence of the beam a periodic surface nanopattern develops. The periodicity of the patt

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Dev, B. N. "Materials modifications in heavy ion interactions with single crystals and their ion beam characterization." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 156, no. 1-4 (1999): 258–64. http://dx.doi.org/10.1016/s0168-583x(99)00288-8.

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Appleton, Bill R., S. Tongay, M. Lemaitre, et al. "Materials modifications using a multi-ion beam processing and lithography system." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 272 (February 2012): 153–57. http://dx.doi.org/10.1016/j.nimb.2011.01.054.

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31

Fox, Daniel, Yanhui Chen, Colm C. Faulkner, and Hongzhou Zhang. "Nano-structuring, surface and bulk modification with a focused helium ion beam." Beilstein Journal of Nanotechnology 3 (August 8, 2012): 579–85. http://dx.doi.org/10.3762/bjnano.3.67.

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We investigate the ability of a focused helium ion beam to selectively modify and mill materials. The sub nanometer probe size of the helium ion microscope used provides lateral control not previously available for helium ion irradiation experiments. At high incidence angles the helium ions were found to remove surface material from a silicon lamella leaving the subsurface structure intact for further analysis. Surface roughness and contaminants were both reduced by the irradiation process. Fabrication is also realized with a high level of patterning acuity. Implantation of helium beneath the

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Chakravadhanula, Venkata Sai Kiran, Yogendra Kumar Mishra, Venkata Girish Kotnur, et al. "Microstructural and plasmonic modifications in Ag–TiO2 and Au–TiO2 nanocomposites through ion beam irradiation." Beilstein Journal of Nanotechnology 5 (September 1, 2014): 1419–31. http://dx.doi.org/10.3762/bjnano.5.154.

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The development of new fabrication techniques of plasmonic nanocomposites with specific properties is an ongoing issue in the plasmonic and nanophotonics community. In this paper we report detailed investigations on the modifications of the microstructural and plasmonic properties of metal–titania nanocomposite films induced by swift heavy ions. Au–TiO2 and Ag–TiO2 nanocomposite thin films with varying metal volume fractions were deposited by co-sputtering and were subsequently irradiated by 100 MeV Ag8+ ions at various ion fluences. The morphology of these nanocomposite thin films before and

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Song, Yin, Chong-Hong Zhang, Yi-Tao Yang, Jie Gou, and Zhao-Nan Ding. "Microstructure of SiC fibers by swift heavy ion beam irradiation." Modern Physics Letters B 33, no. 20 (2019): 1950236. http://dx.doi.org/10.1142/s0217984919502361.

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In this paper, third generation SiC fiber material irradiated with the 410 MeV energy of [Formula: see text] ion at 173 K was analyzed by Raman spectroscopy, X-ray diffraction (XRD) and transmission electron microscope (TEM). Raman spectroscopy, TEM and XRD data show modifications in the local structure of irradiated SiC fibers. Although highly disordered SiC grains were observed in appearance, no evidence of amorphization was found. After the Sn ions irradiation and XRD, two diffraction peaks disappeared, which showed that the rich Si and C could be further combined in [Formula: see text] ion

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WATT, F., A. A. BETTIOL, J. A. VAN KAN, E. J. TEO, and M. B. H. BREESE. "ION BEAM LITHOGRAPHY AND NANOFABRICATION: A REVIEW." International Journal of Nanoscience 04, no. 03 (2005): 269–86. http://dx.doi.org/10.1142/s0219581x05003139.

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To overcome the diffraction constraints of traditional optical lithography, the next generation lithographies (NGLs) will utilize any one or more of EUV (extreme ultraviolet), X-ray, electron or ion beam technologies to produce sub-100 nm features. Perhaps the most under-developed and under-rated is the utilization of ions for lithographic purposes. All three ion beam techniques, FIB (Focused Ion Beam), Proton Beam Writing (p-beam writing) and Ion Projection Lithography (IPL) have now breached the technologically difficult 100 nm barrier, and are now capable of fabricating structures at the na

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Le Boité, M. G., A. Traverse, L. Névot, B. Pardo, and J. Corno. "Characterization of ion-beam mixed multilayers via grazing x-ray reflectometry." Journal of Materials Research 3, no. 6 (1988): 1089–96. http://dx.doi.org/10.1557/jmr.1988.1089.

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The grazing x-ray reflectrometry technique was used as a way to study modifications in metallic multilayers induced by ion-beam irradiation. Due to the high sensitivity of the technique, short-range atomic displacements of an atom A in a layer B can be detected so that the first stages of ion-beam mixing can be investigated. The rate of mixing is measured and the compound A1−xBx formed at the layers' interfaces is characterized.

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Rao, E. Venkateshwar, and M. Ramakrishna Murthy. "Studies on the ion-beam modifications in ethylene diamine sulphate." Bulletin of Materials Science 22, no. 4 (1999): 797–800. http://dx.doi.org/10.1007/bf02745608.

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Venkateshwar Rao, E., and M. Ramakrishna Murthy. "Ion beam modifications of defect sub-structure of calcite cleavages." Bulletin of Materials Science 31, no. 2 (2008): 139–42. http://dx.doi.org/10.1007/s12034-008-0024-2.

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Korusenko, Petr, Ksenia Kharisova, Egor Knyazev, Oleg Levin, Alexander Vinogradov, and Elena Alekseeva. "Surface Engineering of Multi-Walled Carbon Nanotubes via Ion-Beam Doping: Pyridinic and Pyrrolic Nitrogen Defect Formation." Applied Sciences 13, no. 19 (2023): 11057. http://dx.doi.org/10.3390/app131911057.

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In this study, we present an innovative ion-beam doping technique for the controlled modification of the near-surface region of multi-walled carbon nanotubes (MWCNTs) aimed at creating pyridinic and pyrrolic nitrogen defects in their walls. This method involves the irradiation of MWCNTs with nitrogen ions using a high-dose ion implanter, resulting in the incorporation of nitrogen atoms into the nanotube structure. The structural and chemical changes induced by the ion-beam treatment were thoroughly characterized. Scanning electron microscopy (SEM) analysis revealed subtle changes in nanotube m

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Nellen, Philipp M., Patric Strasser, Victor Callegari, Robert Wüest, Daniel Erni, and Franck Robin. "Focused ion beam modifications of indium phosphide photonic crystals." Microelectronic Engineering 84, no. 5-8 (2007): 1244–47. http://dx.doi.org/10.1016/j.mee.2007.01.037.

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Avasthi, D. K. "Ion Beam Analysis and Applications in On-Line Monitoring of Ion Induced Modifications of Materials." Materials Science Forum 248-249 (May 1997): 405–8. http://dx.doi.org/10.4028/www.scientific.net/msf.248-249.405.

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41

Zhao, Lirong, Yimin Cui, Wenping Li, Wajid Ali Khan, and Yutian Ma. "3-D SRIM Simulation of Focused Ion Beam Sputtering with an Application-Oriented Incident Beam Model." Applied Sciences 9, no. 23 (2019): 5133. http://dx.doi.org/10.3390/app9235133.

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Ion beam sputter etching has been widely used in material surface modification and transmission electron microscope (TEM) sample preparation. Due to the complexity of the ion beam etching process, the quantitative simulation of ion beam sputtering is necessary to guarantee precision in surface treatment and sculpting under different energies and beam currents. In this paper, an application-oriented incident ion beam model was first built with aberrations and Coulomb repulsion forces being considered from the Ga ion source to the sample. The sputtering process of this model on the sample was th

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Petrov Yu.V., Gogina O.A., Vyvenko O.F., et al. "Ion-beam Modification of the Local Luminescent Properties of Hexagonal Boron Nitride." Technical Physics 92, no. 8 (2022): 984. http://dx.doi.org/10.21883/tp.2022.08.54560.66-22.

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Hexagonal boron nitride is a promising material of modern optoelectronics. Point defects in this material can serve as single-photon sources. In this paper we investigate the modification of the luminescent properties of hexagonal boron nitride by means of local irradiation with focused gallium and helium ion beams. It is demonstrated that the intensity of band-to-band cathodoluminescence monotonically decreases with increasing ion fluence for both gallium and helium. The luminescence band of about 2 eV may become more intense after exposure to He ions with certain ion fluence. The effect of c

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Teresov, A. D., Yu A. Denisova, A. B. Skosyrsky, V. V. Denisov, A. A. Leonov, and E. A. Petrikova. "Modification of the surface of a tungsten carbide composite material by electron-ion-plasma methods." Izvestiya vysshikh uchebnykh zavedenii. Fizika, no. 11 (2022): 163–67. http://dx.doi.org/10.17223/00213411/65/11/163.

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The surface of a porous tungsten carbide pseudoalloy of the WC-WCoNiFe system has been modified by a pulsed electron beam and the method of combined electron-ion-plasma, which includes vacuum arc deposition of a film from VT1-0 titanium alloy (1 μm) and subsequent pulsed electron-beam processing of the"coating/substrate" system. Optimal modes of pulsed electron-beam processing were found depending on the energy density in the pulse (40-65 J/cm2) and the pulse duration (150-200 µs). It is shown that electron-beam surface treatment of a material of this class under optimal conditions of electron

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Althubiti, Numa A., Nuha Al-Harbi, Rabab K. Sendi, Ali Atta, and Ahmed M. A. Henaish. "Surface Characterization and Electrical Properties of Low Energy Irradiated PANI/PbS Polymeric Nanocomposite Materials." Inorganics 11, no. 2 (2023): 74. http://dx.doi.org/10.3390/inorganics11020074.

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In this work, nanocomposite samples of polyaniline (PANI) and lead sulfide nanoparticles (PbSNPs) were prepared, utilizing the solution preparation method, for implantation in energy storage elements. The PANI/PbS films were irradiated by different fluences of oxygen beam: 5 × 1016, 10 × 1016, and 15 × 1016 ions.cm−2. The composite was investigated by XRD, SEM, DSC, and FTIR. After ion irradiation, the Tg and Tm values decreased by 4.8 °C and 10.1 °C, respectively. The conductivities, electrical impedances, and electrical moduli of untreated and irradiated samples were examined in frequencies

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Prenitzer, B. I., B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie. "Practical Aspects of FIB Milling: Understanding Ion Beam/Material Interactions." Microscopy and Microanalysis 6, S2 (2000): 502–3. http://dx.doi.org/10.1017/s1431927600035005.

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Nanometer scale, high resolution Ga+ ion probes, attainable in commercially available focused ion beam (FIB) instruments, allow imaging, sputtering and deposition operations to be performed with a high degree of spatial precision. Of particular interest is how this precision milling/deposition capability has enabled a wide range of site specific micromachining and microfabrication operations (e.g., TEM, SEM, SIMS, and AUGER specimen preparation and circuit modification). The applications of FIB instruments frequently involve the creation of high aspect ratio features (i.e., deep narrow trenche

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Marx, Michael, Wolfgang Schäf, and Horst Vehoff. "Influence of Grain Boundaries on Short Fatigue Crack Growth in “Polycrystalline CMSX-4”." Advanced Materials Research 278 (July 2011): 333–38. http://dx.doi.org/10.4028/www.scientific.net/amr.278.333.

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Increasing the resistance of a material to fatigue crack growth by optimizing the microstructure is a major task of materials science. In this regard, grain boundaries and precipitates are well known to decelerate short cracks. Thereby the strength of the interaction is influenced by the crack parameters crack length and distance to the obstacles, the grain boundary parameters like orientation of the adjacent grains and the precipitate parameters like size and distance. A comprehensive understanding of the underlying physical principles is missing. The focused ion beam (FIB) microscope offers

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Cureton, William F., Cameron L. Tracy, and Maik Lang. "Review of Swift Heavy Ion Irradiation Effects in CeO2." Quantum Beam Science 5, no. 2 (2021): 19. http://dx.doi.org/10.3390/qubs5020019.

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Cerium dioxide (CeO2) exhibits complex behavior when irradiated with swift heavy ions. Modifications to this material originate from the production of atomic-scale defects, which accumulate and induce changes to the microstructure, chemistry, and material properties. As such, characterizing its radiation response requires a wide range of complementary characterization techniques to elucidate the defect formation and stability over multiple length scales, such as X-ray and neutron scattering, optical spectroscopy, and electron microscopy. In this article, recent experimental efforts are reviewe

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Wu, Di. "Research on Thermo Effects of Silver Modified by High-Intensity Pulsed Ion Beam." Applied Mechanics and Materials 423-426 (September 2013): 294–97. http://dx.doi.org/10.4028/www.scientific.net/amm.423-426.294.

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We report a modification method for Silver target by high-intensity pulsed ion beam (HIPIB) irradiation. Based on the temporal and spatial distribution models of the ion beam density detected by Faraday cup in the chamber and the ions accelerating voltage, the energy deposition of the beam ions in Ag is calculated by Monte Carlo method. Taking this time-dependent nonlinear deposited energy as the source term of two-dimensional thermal conduction equation, we obtain the temporal and spatial ablation process of metal Ag during a pulse time. The top-layer silver material in thickness of about 0.3

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Wu, Di, and Yong Jian Du. "The Irradiation Effects of Metal Gold Surface by Intense Pulsed Ion Beam." Advanced Materials Research 690-693 (May 2013): 2085–88. http://dx.doi.org/10.4028/www.scientific.net/amr.690-693.2085.

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We report a modification method for Gold target by intense pulsed ion beam (IPIB) irradiation. Based on the temporal and spatial distribution models of the ion beam density detected by Faraday cup in the chamber and the ions accelerating voltage, the energy deposition of the beam ions in Au is calculated by Monte Carlo method. Taking this time-dependent nonlinear deposited energy as the source term of two-dimensional thermal conduction equation, we obtain the temporal and spatial ablation process of metal Au during a pulse time. The top-layer Gold material in thickness of about 0.25μm is ablat

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Michael, Joseph R. "Focused Ion Beam Induced Microstructural Alterations: Texture Development, Grain Growth, and Intermetallic Formation." Microscopy and Microanalysis 17, no. 3 (2011): 386–97. http://dx.doi.org/10.1017/s1431927611000171.

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AbstractCopper, gold, and tungsten thin films have been exposed to 30 kV Ga+ion irradiation, and the resulting microstructural modifications are studied as a function of ion dose. The observed microstructural changes include texture development with respect to the easy channeling direction in the target, and in the case of Cu, an additional intermetallic phase is produced. Texture development in these target materials is a function of the starting materials grain size, and these changes are not observed in large grained materials. The accepted models of differential damage driven grain growth

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