Zeitschriftenartikel zum Thema „Metallized film capacitor“
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Belko, V., Liu Cheng, Sofiya Kalmykova, Aleksey Pechnikov, and Andrey Plotnikov. "Influence of Electrodes Configuration on Metallized Film Capacitor Performance Metrics." Problems of the Regional Energetics, no. 1(65) (January 2025): 121–34. https://doi.org/10.52254/1857-0070.2025.1-65.9.
Der volle Inhalt der QuelleJia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying, and 韩春辉 Han Chunhui. "Reliability assessment of metallized film pulse capacitor." High Power Laser and Particle Beams 23, no. 1 (2011): 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.
Der volle Inhalt der QuelleDr., Vinay Dua*. "DRASTIC CHANGE IN DIELECTRIC BREAKDOWN STRENGTH OF OIL SATURATED POLYMER FILM WITH TEMPERATURE." Global Journal of Engineering Science and Research Management 7, no. 4 (2020): 62–74. https://doi.org/10.5281/zenodo.3766188.
Der volle Inhalt der QuelleVuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier, and J. L. Coulomb. "Optimization of Low-Voltage Metallized Film Capacitor Geometry." IEEE Transactions on Magnetics 43, no. 4 (2007): 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.
Der volle Inhalt der QuelleHo, Janet, T. Jow, and Steven Boggs. "Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 6 (2008): 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.
Der volle Inhalt der QuelleDu, Guoqiang, and Jie Zhang. "Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage." Electronics 13, no. 14 (2024): 2886. http://dx.doi.org/10.3390/electronics13142886.
Der volle Inhalt der QuelleLi Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia, and Kong Zhonghua. "Study on Metallized Film Capacitor and Its Voltage Maintaining Performance." IEEE Transactions on Magnetics 45, no. 1 (2009): 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.
Der volle Inhalt der QuelleChen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, et al. "Insulation resistance characteristics of metallized film capacitor under high electric field." High Power Laser and Particle Beams 24, no. 4 (2012): 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.
Der volle Inhalt der QuelleBelko, V.O., O.A. Emelyanov, and I.O. Ivanov. "Processes of Self-Healing in Film Capacitors in Overload Modes." Problemele Energeticii Regionale 2(34) (August 15, 2017): 13–22. https://doi.org/10.5281/zenodo.1188819.
Der volle Inhalt der QuelleKong, M. G., and Y. P. Lee. "Impact of surface discharge plasmas on performance of a metallized film capacitor." Journal of Applied Physics 90, no. 6 (2001): 3069–78. http://dx.doi.org/10.1063/1.1389072.
Der volle Inhalt der QuelleLi, Hua, Yaohong Chen, Fuchang Lin, et al. "The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition." IEEE Transactions on Dielectrics and Electrical Insulation 18, no. 6 (2011): 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.
Der volle Inhalt der QuelleDai, Xiying, Zhaoliang Xing, Wei Yang, et al. "The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films." International Journal of Polymer Science 2022 (November 8, 2022): 1–12. http://dx.doi.org/10.1155/2022/5970484.
Der volle Inhalt der QuelleYoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee, and Heun-Young Lee. "The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications." Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, no. 5 (2011): 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.
Der volle Inhalt der QuellePeng, Bao Hua, J. L. Zhou, and Jing Feng. "Product Reliability Assessment Method Combining Degradation Data and Lifetime Data." Advanced Materials Research 44-46 (June 2008): 795–802. http://dx.doi.org/10.4028/www.scientific.net/amr.44-46.795.
Der volle Inhalt der QuelleTai, Yunxiao, Pengqi Chen, Yang Jian, Qingqing Fang, Dang Xu, and Jigui Cheng. "Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity." Microelectronics Reliability 137 (October 2022): 114755. http://dx.doi.org/10.1016/j.microrel.2022.114755.
Der volle Inhalt der QuelleZhang, Yong-Xin, Qi-Kun Feng, Shao-Long Zhong, et al. "Digital twin accelerating development of metallized film capacitor: Key issues, framework design and prospects." Energy Reports 7 (November 2021): 7704–15. http://dx.doi.org/10.1016/j.egyr.2021.10.116.
Der volle Inhalt der QuelleLv, Chunlin, Jinjun Liu, Yan Zhang, Wanjun Lei, and Rui Cao. "An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process." Microelectronics Reliability 114 (November 2020): 113892. http://dx.doi.org/10.1016/j.microrel.2020.113892.
Der volle Inhalt der QuelleZhang, Jie, Feipeng Wang, Yushuang He, Guoqiang Du, Lei Pan, and Xiao Zhang. "Risk classification of metallized film capacitor via energy recognition of the first self-healing." IET Conference Proceedings 2023, no. 46 (2023): 1302–4. https://doi.org/10.1049/icp.2024.2671.
Der volle Inhalt der QuelleQi, Xiaoguang, and Steven Boggs. "Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots." Journal of Applied Physics 94, no. 7 (2003): 4449–56. http://dx.doi.org/10.1063/1.1602947.
Der volle Inhalt der QuelleChen, Yaohong, Hua Li, Fuchang Lin, et al. "Study on Self-Healing and Lifetime Characteristics of Metallized-Film Capacitor Under High Electric Field." IEEE Transactions on Plasma Science 40, no. 8 (2012): 2014–19. http://dx.doi.org/10.1109/tps.2012.2200699.
Der volle Inhalt der QuelleH. Lean, Meng, and Wei-Ping L. Chu. "Simulation of charge packet formation in layered polymer film." COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 33, no. 4 (2014): 1396–415. http://dx.doi.org/10.1108/compel-09-2013-0291.
Der volle Inhalt der QuelleQi, Xiaoguang, and Steven Boggs. "Transient finite element computation of the temperature rise in metallized film capacitor end connections caused by underdamped discharge." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 1 (2008): 277–83. http://dx.doi.org/10.1109/t-dei.2008.4446761.
Der volle Inhalt der QuelleDonhowe, Mark, Jeff Lawler, Sean Souffie, and E. Lee Stein. "250°C Operating Temperature Dielectric Film Capacitors." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2011, HITEN (2011): 000201–6. http://dx.doi.org/10.4071/hiten-paper2-mdonhowe.
Der volle Inhalt der QuelleRevenok, T. V., V. V. Sleptsov, and A. O. Diteleva. "Research of electrode materials for the creation of multifunctional current sources with increased capacity as a components of the energy sector of an efficient urban environment." Construction Materials, no. 9 (October 9, 2024): 63–69. http://dx.doi.org/10.31659/0585-430x-2024-828-9-63-69.
Der volle Inhalt der QuelleRytöluoto, Ilkka, Minna Niittymäki, Paolo Seri, et al. "Biaxially oriented silica–polypropylene nanocomposites for HVDC film capacitors: morphology-dielectric property relationships, and critical evaluation of the current progress and limitations." Journal of Materials Chemistry A 10, no. 6 (2022): 3025–43. http://dx.doi.org/10.1039/d1ta10336a.
Der volle Inhalt der QuelleLi Hua, 李化, 陈耀红 Chen Yaohong, 林福昌 Lin Fuchang, and 彭波 Peng Bo. "Lifetime characteristics of metallized film pulsed capacitors." High Power Laser and Particle Beams 22, no. 4 (2010): 773–76. http://dx.doi.org/10.3788/hplpb20102204.0773.
Der volle Inhalt der QuelleJoubert, Ch, A. Béroual, and G. Rojat. "Asymmetrical current distribution in metallized film capacitors." Journal of Applied Physics 95, no. 11 (2004): 6420–25. http://dx.doi.org/10.1063/1.1712009.
Der volle Inhalt der QuelleOstrowski, Jörg, Ralf Hiptmair, and Henning Fuhrmann. "Electric 3D‐simulation of metallized film capacitors." COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 26, no. 2 (2007): 524–43. http://dx.doi.org/10.1108/03321640710727836.
Der volle Inhalt der QuelleBelko, Victor, Ivan Ivanov, Andrey Plotnikov, and Valery Belanov. "Energy characteristics of self-healing process in metallized film capacitors." E3S Web of Conferences 140 (2019): 02006. http://dx.doi.org/10.1051/e3sconf/201914002006.
Der volle Inhalt der QuelleSilvus, Stan, and Kenneth Cook. "Useful Technique for Analysis of Fluid-Filled Capacitors." EDFA Technical Articles 9, no. 2 (2007): 6–12. http://dx.doi.org/10.31399/asm.edfa.2007-2.p006.
Der volle Inhalt der QuelleKong, M. G., and Y. P. Lee. "Electrically induced heat dissipation in metallized film capacitors." IEEE Transactions on Dielectrics and Electrical Insulation 11, no. 6 (2004): 1007–13. http://dx.doi.org/10.1109/tdei.2004.1387824.
Der volle Inhalt der QuelleTortai, J. H., A. Denat, and N. Bonifaci. "Self-healing of capacitors with metallized film technology:." Journal of Electrostatics 53, no. 2 (2001): 159–69. http://dx.doi.org/10.1016/s0304-3886(01)00138-3.
Der volle Inhalt der QuelleGodec, M., Dj Mandrino, and M. Gaberšček. "Investigation of performance degradation in metallized film capacitors." Applied Surface Science 273 (May 2013): 465–71. http://dx.doi.org/10.1016/j.apsusc.2013.02.063.
Der volle Inhalt der QuelleKim, Namhun, Changju Park, Sangshin Kwak, and Jeihoon Baek. "Experimental Comparisons and Evaluations of Different Types of DC-link Capacitors for VSI-Based Electric Compressors in Battery Electric Vehicle Systems." Electronics 9, no. 8 (2020): 1276. http://dx.doi.org/10.3390/electronics9081276.
Der volle Inhalt der QuelleKong, Zhong Hua, Li Gang Wu, Chun Ya Tong, and Zai Fei Luo. "Calculation of Self-Healing Contract Resistance of Metallized Film." Applied Mechanics and Materials 615 (August 2014): 236–39. http://dx.doi.org/10.4028/www.scientific.net/amm.615.236.
Der volle Inhalt der QuellePicci, G., and M. Rabuffi. "Pulse handling capability of energy storage metallized film capacitors." IEEE Transactions on Plasma Science 28, no. 5 (2000): 1603–6. http://dx.doi.org/10.1109/27.901241.
Der volle Inhalt der QuelleBelko, Victor, Dmitry Glivenko, Oleg Emelyanov, Ivan Ivanov, and Andrey Plotnikov. "Current Pulse Polarity Effect on Metallized Film Capacitors Failure." IEEE Transactions on Plasma Science 45, no. 6 (2017): 1020–25. http://dx.doi.org/10.1109/tps.2017.2703947.
Der volle Inhalt der QuelleLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime investigation and prediction of metallized polypropylene film capacitors." Microelectronics Reliability 53, no. 12 (2013): 1962–67. http://dx.doi.org/10.1016/j.microrel.2013.06.005.
Der volle Inhalt der QuelleNa, J. G. "New method to predict corrosion characteristics of Zn‐metallized thin films for film capacitors." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13, no. 6 (1995): 2739–41. http://dx.doi.org/10.1116/1.579697.
Der volle Inhalt der QuelleXiao, Meng, Mengdie Zhang, Haoliang Liu, Boxue Du, and Yawei Qin. "Dielectric Property and Breakdown Strength Performance of Long-Chain Branched Polypropylene for Metallized Film Capacitors." Materials 15, no. 9 (2022): 3071. http://dx.doi.org/10.3390/ma15093071.
Der volle Inhalt der QuelleWang Wenjuan, 王文娟, 李化 Li Hua, 李智威 Li Zhiwei, 童勇 Tong Yong, and 林福昌 Lin Fuchang. "Lifetime improvement of metallized film capacitors by inner pressure strengthening." High Power Laser and Particle Beams 26, no. 4 (2014): 45015. http://dx.doi.org/10.3788/hplpb20142604.45015.
Der volle Inhalt der QuelleBelko, Victor O., Oleg A. Emelyanov, Ivan O. Ivanov, Andrey P. Plotnikov, and Efrem G. Feklistov. "Application of Numerical Simulation for Metallized Film Capacitors Electrodes Design." IEEE Access 9 (2021): 80945–52. http://dx.doi.org/10.1109/access.2021.3085695.
Der volle Inhalt der QuelleBelko, V. O., D. Y. Glivenko, O. A. Emelyanov, and I. O. Ivanov. "INVESTIGATION OF DEGRADATION IN ELECTRODE CONTACTS OF METALLIZED FILM CAPACITORS." St. Petersburg State Polytechnical University Journal 254, no. 4 (2017): 69–76. http://dx.doi.org/10.5862/jest.254.8.
Der volle Inhalt der QuelleLi, Hua, Wenjuan Wang, Zhiwei Li, et al. "Polarization characteristics of metallized polypropylene film capacitors at different temperatures." IEEE Transactions on Dielectrics and Electrical Insulation 22, no. 2 (2015): 682–88. http://dx.doi.org/10.1109/tdei.2015.7076763.
Der volle Inhalt der QuelleZhao, Jianyin, and Fang Liu. "Reliability assessment of the metallized film capacitors from degradation data." Microelectronics Reliability 47, no. 2-3 (2007): 434–36. http://dx.doi.org/10.1016/j.microrel.2006.05.013.
Der volle Inhalt der QuelleMcCluskey, F. P., N. M. Li, and E. Mengotti. "Eliminating infant mortality in metallized film capacitors by defect detection." Microelectronics Reliability 54, no. 9-10 (2014): 1818–22. http://dx.doi.org/10.1016/j.microrel.2014.07.090.
Der volle Inhalt der QuelleMakdessi, M., A. Sari, and P. Venet. "Metallized polymer film capacitors ageing law based on capacitance degradation." Microelectronics Reliability 54, no. 9-10 (2014): 1823–27. http://dx.doi.org/10.1016/j.microrel.2014.07.103.
Der volle Inhalt der QuelleValentine, Nathan, Michael H. Azarian, and Michael Pecht. "Metallized film capacitors used for EMI filtering: A reliability review." Microelectronics Reliability 92 (January 2019): 123–35. http://dx.doi.org/10.1016/j.microrel.2018.11.003.
Der volle Inhalt der QuelleEl-Husseini, M. H., P. Venet, G. Rojat, and C. Joubert. "Thermal simulation for geometric optimization of metallized polypropylene film capacitors." IEEE Transactions on Industry Applications 38, no. 3 (2002): 713–18. http://dx.doi.org/10.1109/tia.2002.1003421.
Der volle Inhalt der QuelleLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss." IEEE Transactions on Plasma Science 41, no. 5 (2013): 1313–18. http://dx.doi.org/10.1109/tps.2013.2243476.
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