Thematische Bibliographien / Nanofocused X-Ray diffraction

Inhaltsverzeichnis

  1. Zeitschriftenartikel
  2. Dissertationen
  3. Konferenzberichte

Auswahl der wissenschaftlichen Literatur zum Thema „Nanofocused X-Ray diffraction“

Autor: Grafiati
Veröffentlicht am 25. Mai 2024
Zuletzt aktualisiert am 31. Juli 2025

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Zeitschriftenartikel zum Thema "Nanofocused X-Ray diffraction"

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Ren, Zhe, Francesca Mastropietro, Anton Davydok, et al. "Scanning force microscope forin situnanofocused X-ray diffraction studies." Journal of Synchrotron Radiation 21, no. 5 (2014): 1128–33. http://dx.doi.org/10.1107/s1600577514014532.

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A compact scanning force microscope has been developed forin situcombination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The newin situdevice allows forin situimaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by na
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2

Hruszkewycz, S. O., M. V. Holt, J. Maser, et al. "Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 372, no. 2010 (2014): 20130118. http://dx.doi.org/10.1098/rsta.2013.0118.

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Bragg coherent diffraction with nanofocused hard X-ray beams provides unique opportunities for quantitative in situ studies of crystalline structure in nanoscale regions of complex materials and devices by a variety of diffraction-based techniques. In the case of coherent diffraction imaging, a major experimental challenge in using nanoscale coherent beams is maintaining a constant scattering volume such that coherent fringe visibility is maximized and maintained over the course of an exposure lasting several seconds. Here, we present coherent Bragg diffraction patterns measured from different
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3

Nicolas, Jan-David, Tobias Reusch, Markus Osterhoff, et al. "Time-resolved coherent X-ray diffraction imaging of surface acoustic waves." Journal of Applied Crystallography 47, no. 5 (2014): 1596–605. http://dx.doi.org/10.1107/s1600576714016896.

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Time-resolved coherent X-ray diffraction experiments of standing surface acoustic waves, illuminated under grazing incidence by a nanofocused synchrotron beam, are reported. The data have been recorded in stroboscopic mode at controlled and varied phase between the acoustic frequency generator and the synchrotron bunch train. At each time delay (phase angle), the coherent far-field diffraction pattern in the small-angle regime is inverted by an iterative algorithm to yield the local instantaneous surface height profile along the optical axis. The results show that periodic nanoscale dynamics c
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Chayanun, Lert, Susanna Hammarberg, Hanna Dierks, et al. "Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline." Crystals 9, no. 8 (2019): 432. http://dx.doi.org/10.3390/cryst9080432.

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The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV
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Zaluzhnyy, Ivan, Ruslan Kurta, Marcus Scheele, Frank Schreiber, Boris Ostrovskii, and Ivan Vartanyants. "Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials." Materials 12, no. 21 (2019): 3464. http://dx.doi.org/10.3390/ma12213464.

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Angular X-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of X-ray diffraction patterns and provides insights into the orientational order in the system under investigation. This method is based on the evaluation of the angular cross-correlation function of the scattered intensity distribution on a two-dimensional (2D) detector and further averaging over many diffraction patterns for enhancement of the anisotropic signal. Over the last decade, AXCCA was successfully used to study the anisotropy in various soft matter systems
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Abbey, Brian, Ruben A. Dilanian, Connie Darmanin, et al. "X-ray laser–induced electron dynamics observed by femtosecond diffraction from nanocrystals of Buckminsterfullerene." Science Advances 2, no. 9 (2016): e1601186. http://dx.doi.org/10.1126/sciadv.1601186.

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X-ray free-electron lasers (XFELs) deliver x-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third-generation synchrotron source. The power density of an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond time scale. Exploration of the interaction of intense coherent x-ray pulses and matter is both of intrinsic scientific interest and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pu
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Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, et al. "Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams." Journal of Applied Crystallography 46, no. 4 (2013): 887–92. http://dx.doi.org/10.1107/s0021889813004226.

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Grazing-incidence X-ray diffraction measurements on single GaAs nanowires (NWs) grown on a (111)-oriented GaAs substrate by molecular beam epitaxy are reported. The positions of the NWs are intentionally determined by a direct implantation of Au with focused ion beams. This controlled arrangement in combination with a nanofocused X-ray beam allows the in-plane lattice parameter of single NWs to be probed, which is not possible for randomly grown NWs. Reciprocal space maps were collected at different heights along the NW to investigate the crystal structure. Simultaneously, substrate areas with
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Li, Qian, Samuel D. Marks, Sunil Bean, et al. "Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure–property characterization." Journal of Synchrotron Radiation 26, no. 5 (2019): 1790–96. http://dx.doi.org/10.1107/s1600577519008609.

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A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together with their crystallographic structure, facilitating the investigation of local structure–property relationships. The design, implementation and operating procedures of this instrument are reported. The scientific capabilities are demonstrated in a proof-of-principle study of the insulator–metal phase
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Wallentin, Jesper, Daniel Jacobsson, Markus Osterhoff, Magnus T. Borgström, and Tim Salditt. "Bending and Twisting Lattice Tilt in Strained Core–Shell Nanowires Revealed by Nanofocused X-ray Diffraction." Nano Letters 17, no. 7 (2017): 4143–50. http://dx.doi.org/10.1021/acs.nanolett.7b00918.

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Marçal, Lucas A. B., Eitan Oksenberg, Dmitry Dzhigaev, et al. "In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3 Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction." ACS Nano 14, no. 11 (2020): 15973–82. http://dx.doi.org/10.1021/acsnano.0c07426.

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Dissertationen zum Thema "Nanofocused X-Ray diffraction"

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Anjum, Taseer. "Nanomechanics : mechanical response analysis of semiconductor GaAs nanowires by using finite element method and x-ray diffraction techniques." Electronic Thesis or Diss., Aix-Marseille, 2021. http://www.theses.fr/2021AIXM0173.

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Au cours des deux dernières décennies, d’énormes progrès ont été réalisés dans la miniaturisation des dispositifs optoélectroniques et des systèmes nanoélectromécaniques à base de capteurs grâce à l'intégration de nanofils quasi unidimensionnels. Le présent travail porte sur l'analyse de la réponse mécanique de nanofils GaAs semi-conducteurs préparés sur un substrat de silicium par épitaxie par jet moléculaire. Le comportement mécanique du nanofil est caractérisé par des essais de flexion in situ dans un MEB et en combinaison avec la diffraction des rayons X. L'objectif de ce travail est d'ide
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Henkel, Thilo Johannes. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method." Doctoral thesis, Humboldt-Universität zu Berlin, 2018. http://dx.doi.org/10.18452/18707.

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In dieser Arbeit wird das lokal aufgelöste Deformationsfeld einzelner (In,Ga)N/GaN Drähte mit Hilfe nanofokussierter Röntgenbeugung und der Methode der Finiten Elemente untersucht. Hiermit soll ein Beitrag zum grundlegenden Verständis der optischen Eigenschaften geleistet werden, die durch das Deformationsfeld maßgeblich beeinflusst werden. Zunächst wird die Abhängigkeit der vertikalen Normalkomponente, epsilon_zz, des elastischen Dehnungstensors von der Geometrie eines axialen (In,Ga)N/GaN Nanodrahtes diskutiert. Dabei wird ein signifikant negativer epsilon_zz-Wert beobachtet, sobald
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Henkel, Thilo Johannes [Verfasser], Henning [Gutachter] Riechert, Thomas [Gutachter] Schröder, and Martin [Gutachter] Schmidbauer. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method / Thilo Johannes Henkel ; Gutachter: Henning Riechert, Thomas Schröder, Martin Schmidbauer." Berlin : Humboldt-Universität zu Berlin, 2018. http://d-nb.info/1185579362/34.

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4

Henkel, Thilo [Verfasser], Henning [Gutachter] Riechert, Thomas [Gutachter] Schröder, and Martin [Gutachter] Schmidbauer. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method / Thilo Johannes Henkel ; Gutachter: Henning Riechert, Thomas Schröder, Martin Schmidbauer." Berlin : Humboldt-Universität zu Berlin, 2018. http://d-nb.info/1185579362/34.

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Konferenzberichte zum Thema "Nanofocused X-Ray diffraction"

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Lidzey, David G. "Mapping structural properties of lead halide perovskites by scanning nanofocus x-ray diffraction (Conference Presentation)." In Organic, Hybrid, and Perovskite Photovoltaics XVIII, edited by Kwanghee Lee, Zakya H. Kafafi, and Paul A. Lane. SPIE, 2017. http://dx.doi.org/10.1117/12.2275741.

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