Einloggen

Thematische Bibliographien / Static SIMS / Zeitschriftenartikel

Um die anderen Arten von Veröffentlichungen zu diesem Thema anzuzeigen, folgen Sie diesem Link: Static SIMS.

Zeitschriftenartikel zum Thema „Static SIMS“

Autor: Grafiati

Veröffentlicht am 28. Juni 2021

Zuletzt aktualisiert am 29. Juli 2025

Geben Sie eine Quelle nach APA, MLA, Chicago, Harvard und anderen Zitierweisen an

Wählen Sie eine Art der Quelle aus:

Machen Sie sich mit Top-50 Zeitschriftenartikel für die Forschung zum Thema "Static SIMS" bekannt.

Neben jedem Werk im Literaturverzeichnis ist die Option "Zur Bibliographie hinzufügen" verfügbar. Nutzen Sie sie, wird Ihre bibliographische Angabe des gewählten Werkes nach der nötigen Zitierweise (APA, MLA, Harvard, Chicago, Vancouver usw.) automatisch gestaltet.

Sie können auch den vollen Text der wissenschaftlichen Publikation im PDF-Format herunterladen und eine Online-Annotation der Arbeit lesen, wenn die relevanten Parameter in den Metadaten verfügbar sind.

Sehen Sie die Zeitschriftenartikel für verschiedene Spezialgebieten durch und erstellen Sie Ihre Bibliographie auf korrekte Weise.

1

Gilmore, I. S., and M. P. Seah. "Static SIMS inter-laboratory study." Surface and Interface Analysis 29, no. 9 (2000): 624–37. http://dx.doi.org/10.1002/1096-9918(200009)29:9<624::aid-sia908>3.0.co;2-f.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

2

Gilmore, I. S., and M. P. Seah. "Static SIMS: towards unfragmented mass spectra — the G-SIMS procedure." Applied Surface Science 161, no. 3-4 (2000): 465–80. http://dx.doi.org/10.1016/s0169-4332(00)00317-2.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

3

Hoshi, T., and M. Kudo. "High resolution static SIMS imaging by time of flight SIMS." Applied Surface Science 203-204 (January 2003): 818–24. http://dx.doi.org/10.1016/s0169-4332(02)00834-6.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

4

YAMABE, Hidetoshi, and Kazue SHINGU. "Application of Static SIMS for Colour Materials." Journal of the Japan Society of Colour Material 68, no. 5 (1995): 294–300. http://dx.doi.org/10.4011/shikizai1937.68.294.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

5

Matolı́n, V., and V. Johánek. "Static SIMS study of TiZrV NEG activation." Vacuum 67, no. 2 (2002): 177–84. http://dx.doi.org/10.1016/s0042-207x(02)00111-2.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

6

Gilmore, I. S., and M. P. Seah. "Static SIMS: metastable decay and peak intensities." Applied Surface Science 144-145 (April 1999): 26–30. http://dx.doi.org/10.1016/s0169-4332(98)00757-0.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

7

Chew, A., and D. E. Sykes. "Static SIMS using a cameca ims 3f." Surface and Interface Analysis 17, no. 7 (1991): 532–35. http://dx.doi.org/10.1002/sia.740170723.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

8

Johansson, Leena-Sisko. "Static SIMS studies of coated TiO2 pigments." Surface and Interface Analysis 20, no. 4 (1993): 304–8. http://dx.doi.org/10.1002/sia.740200407.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

9

Licciardello, Antonino, Salvatore Pignataro, Angelika Leute, and Alfred Benninghoven. "Dimerization of polystyrene during static SIMS measurements." Surface and Interface Analysis 20, no. 6 (1993): 549–51. http://dx.doi.org/10.1002/sia.740200611.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

10

Zehnpfenning, J., E. Niehuis, H. Rulle, and A. Benninghoven. "Effect of Ga+ backscattering in static SIMS." Surface and Interface Analysis 21, no. 8 (1994): 566–70. http://dx.doi.org/10.1002/sia.740210809.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

11

Licciardello, A., B. Wenclawiak, C. Boes, and A. Benninghoven. "Radiation effects in static SIMS of polymers." Surface and Interface Analysis 22, no. 1-12 (1994): 528–31. http://dx.doi.org/10.1002/sia.7402201112.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

12

Travaly, Y., and P. Bertrand. "Static SIMS investigation of metal/polymer interfaces." Surface and Interface Analysis 23, no. 5 (1995): 328–34. http://dx.doi.org/10.1002/sia.740230509.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

13

Seah, Martin P. "Sputtering, Cluster Primary Ions and Static SIMS." Journal of Surface Analysis 28, no. 3 (2022): S49—S55. http://dx.doi.org/10.1384/jsa.28.s49.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

14

Shen, Yanjie, Logan Howard, and Xiao-Ying Yu. "Secondary Ion Mass Spectral Imaging of Metals and Alloys." Materials 17, no. 2 (2024): 528. http://dx.doi.org/10.3390/ma17020528.

Der volle Inhalt der Quelle

Annotation:

Secondary Ion Mass Spectrometry (SIMS) is an outstanding technique for Mass Spectral Imaging (MSI) due to its notable advantages, including high sensitivity, selectivity, and high dynamic range. As a result, SIMS has been employed across many domains of science. In this review, we provide an in-depth overview of the fundamental principles underlying SIMS, followed by an account of the recent development of SIMS instruments. The review encompasses various applications of specific SIMS instruments, notably static SIMS with time-of-flight SIMS (ToF-SIMS) as a widely used platform and dynamic SIMS

APA, Harvard, Vancouver, ISO und andere Zitierweisen

15

Nieradko, M., N. W. Ghonaim, L. Xi, et al. "Primary ion fluence dependence in time-of-flight SIMS of a self-assembled monolayer of octadecylphosphonic acid molecules on mica discussion of static limit." Canadian Journal of Chemistry 85, no. 12 (2007): 1075–82. http://dx.doi.org/10.1139/v07-123.

Der volle Inhalt der Quelle

Annotation:

By using a self-assembled monolayer of octadecylphosphonic acid molecules, CH3(CH2)17PO(OH)2, on mica as a model of the “soft” materials, such as self-assembled monolayers (SAMs) and multilayers in many biological systems as well as artificially engineered molecular electronic systems, we have examined the effects of primary ion fluence on time-of-flight secondary ion mass spectrometry (TOF-SIMS) of the technologically important model. Our measurements clearly show that although the intensity per unit primary ion fluence of most atomic ions and many small fragment ions do not vary by more than

APA, Harvard, Vancouver, ISO und andere Zitierweisen

16

Seo, Satoru, Jon-Chi Chang, Masakazu Matsui, and Hirosi Takami. "Static SIMS Studies of Superconducting YBa2Cu3O7-yThin Films." Japanese Journal of Applied Physics 28, Part 2, No. 6 (1989): L994—L996. http://dx.doi.org/10.1143/jjap.28.l994.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

17

Briggs, David, Alan Brown, J. C. Vickerman, and F. Adams. "Handbook of static secondary ion mass spectrometry (SIMS)." Analytica Chimica Acta 236 (1990): 509–10. http://dx.doi.org/10.1016/s0003-2670(00)83361-9.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

18

Delcorte, A., C. Poleunis, and P. Bertrand. "Stretching the limits of static SIMS with C60+." Applied Surface Science 252, no. 19 (2006): 6494–97. http://dx.doi.org/10.1016/j.apsusc.2006.02.259.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

19

Bolbach, G., J. C. Blais, S. Clémendot, and A. Barraud. "Static SIMS studies of Langmuir-Blodgett gas sensors." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 88, no. 1-2 (1994): 180–83. http://dx.doi.org/10.1016/0168-583x(94)96101-8.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

20

Leggett, G. J., and J. C. Vickerman. "Sample charging during static SIMS studies of polymers." Applied Surface Science 84, no. 3 (1995): 253–66. http://dx.doi.org/10.1016/0169-4332(94)00543-5.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

21

Vickerman, John C., Angela Oakes, and Heather Gamble (aka Donsig). "Static SIMS studies of catalyst structure and activity." Surface and Interface Analysis 29, no. 6 (2000): 349–61. http://dx.doi.org/10.1002/1096-9918(200006)29:6<349::aid-sia822>3.0.co;2-1.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

22

Briggs, D. "A proposed standard (PTFE tape) for static SIMS." Surface and Interface Analysis 14, no. 4 (1989): 209–12. http://dx.doi.org/10.1002/sia.740140407.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

23

Gilmore, I. S., and M. P. Seah. "Static SIMS: A Study of Damage Using Polymers." Surface and Interface Analysis 24, no. 11 (1996): 746–62. http://dx.doi.org/10.1002/(sici)1096-9918(199610)24:11<746::aid-sia177>3.0.co;2-a.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

24

Ogaki, R., F. M. Green, S. Li, et al. "A comparison of the static SIMS and G-SIMS spectra of biodegradable homo-polyesters." Surface and Interface Analysis 40, no. 8 (2008): 1202–8. http://dx.doi.org/10.1002/sia.2866.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

25

Baig, Nameera F., Sage J. B. Dunham, Nydia Morales-Soto, Joshua D. Shrout, Jonathan V. Sweedler, and Paul W. Bohn. "Multimodal chemical imaging of molecular messengers in emerging Pseudomonas aeruginosa bacterial communities." Analyst 140, no. 19 (2015): 6544–52. http://dx.doi.org/10.1039/c5an01149c.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

26

Linton, Richard W. "Secondary ion mass spectroscopy in the biological and materials sciences." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 498–99. http://dx.doi.org/10.1017/s0424820100148320.

Der volle Inhalt der Quelle

Annotation:

Secondary ion mass spectrometry (SIMS) is based upon energetic ion bombardment of surfaces resulting in in the emission of sputtered particles, including both atomic and molecular ions. The use of mass spectrometric detection provides a highly versatile and sensitive tool for surface and thin film chemical analysis. In recent years, the scope of the technique has broadened to include a variety of analysis modes including:1.Elemental Depth Profiling (dynamic SIMS),2.Laterally Resolved Imaging (ion microprobe or ion microscope analysis),3.Image Depth Profiling (combination of modes 1 and 2 provi

APA, Harvard, Vancouver, ISO und andere Zitierweisen

27

Linton, Richard W. "Direct Imaging of Trace Elements, Isotopes, and Molecules Using Mass Spectrometry." Microscopy and Microanalysis 4, S2 (1998): 124–25. http://dx.doi.org/10.1017/s1431927600020742.

Der volle Inhalt der Quelle

Annotation:

Secondary ion mass spectrometry (SIMS) is based upon the energetic ion bombardment of surfaces resulting in in the emission of sputtered particles, including both atomic and molecular ions. The use of mass spectrometric detection provides a highly versatile and sensitive tool for surface and thin film microanalysis. The scope of the technique includes a diversity of analysis modes including:1.Elemental Depth Profiling (dynamic SIMS),2.Laterally Resolved Imaging (ion microprobe or ion microscope analysis),3.Image Depth Profiling (combination of modes 1 and 2 providing 3-D images),4.Molecular Mo

APA, Harvard, Vancouver, ISO und andere Zitierweisen

28

Odom, Robert W. "Molecular surface analysis by TOF-SIMS." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1556–57. http://dx.doi.org/10.1017/s0424820100132418.

Der volle Inhalt der Quelle

Annotation:

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are prod

APA, Harvard, Vancouver, ISO und andere Zitierweisen

29

Watts, John F. "Surface analysis of polymers by XPS and static SIMS." Surface Engineering 14, no. 4 (1998): 290. http://dx.doi.org/10.1179/sur.1998.14.4.290.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

30

Wee, A. T. S., C. H. A. Huan, R. Gopalakrishnan, et al. "Static SIMS of polyacetylene: the effect of chain unsaturation." Synthetic Metals 45, no. 2 (1991): 227–34. http://dx.doi.org/10.1016/0379-6779(91)91807-m.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

31

Van Velzen, P. N. T., P. E. Wierenga, R. C. F. Schaake, D. Van Leyen, and A. Benninghoven. "Surface Characterization of Particulate Video Tapes by Static SIMS." Tribology Transactions 31, no. 4 (1988): 489–96. http://dx.doi.org/10.1080/10402008808981853.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

32

Bertrand, Patrick. "Static SIMS for analysis of molecular conformation and orientation." Applied Surface Science 252, no. 19 (2006): 6986–91. http://dx.doi.org/10.1016/j.apsusc.2006.02.147.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

33

Aubriet, Fr�d�ric, Claude Poleunis, and Patrick Bertrand. "Characterization of lead-titanium-oxygen compounds by static SIMS." Surface and Interface Analysis 34, no. 1 (2002): 754–58. http://dx.doi.org/10.1002/sia.1404.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

34

Leute, Angelika, Derk Rading, Alfred Benninghoven, Kathrin Schroeder, and Doris Klee. "Static SIMS investigation of immobilized molecules on polymer surfaces." Advanced Materials 6, no. 10 (1994): 775–80. http://dx.doi.org/10.1002/adma.19940061014.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

35

Schueler, Bruno, and Robert W. Odom. "Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 308–9. http://dx.doi.org/10.1017/s0424820100135149.

Der volle Inhalt der Quelle

Annotation:

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) condit

APA, Harvard, Vancouver, ISO und andere Zitierweisen

36

Basgall, E. J., and N. Winograd. "Uncoated Lvsem and Imaging Tof-Sims of Unfixed, Plunge Frozen, Freeze Dried, Fungal and Plant Material." Microscopy and Microanalysis 4, S2 (1998): 850–51. http://dx.doi.org/10.1017/s1431927600024375.

Der volle Inhalt der Quelle

Annotation:

A Cryosorption Freeze Drying (CFD) system was evaluated for its effectiveness in preparing delicate biological materials for both low voltage-field emission scanning electron microscopy (LVFESEM) and imaging liquid metal (Ga) ion beam, static time-of-flight, secondary ion mass spectrometry (TOF-SIMS). The primary goals of these studies were to investigate the retention of both structural and chemical integrity using fresh cryoprepared biological material which had not been exposed to any chemical fixation and which would not be coated by any conductive material in order to obtain information f

APA, Harvard, Vancouver, ISO und andere Zitierweisen

37

Gilmore, I. S., and M. P. Seah. "Static SIMS: ion detection efficiencies in a channel electron multiplier." Applied Surface Science 144-145 (April 1999): 113–17. http://dx.doi.org/10.1016/s0169-4332(98)00779-x.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

38

Huan, C. H. A., A. T. S. Wee, R. Gopalakrishnan, et al. "Static SIMS of conjugated polymers: films of the substituted polyacetylenes." Synthetic Metals 53, no. 2 (1993): 193–203. http://dx.doi.org/10.1016/0379-6779(93)90890-9.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

39

Zhu, X. Y., S. Akhter, M. E. Castro, and J. M. White. "Kinetic studies using static SIMS: H2 adsorption on Ni(100)." Surface Science 195, no. 1-2 (1988): L145—L149. http://dx.doi.org/10.1016/0039-6028(88)90773-x.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

40

Steffens, P., E. Niehuis, T. Friese, D. Greifendorf, and A. Benninghoven. "A time‐of‐flight mass spectrometer for static SIMS applications." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 3, no. 3 (1985): 1322–25. http://dx.doi.org/10.1116/1.573058.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

41

Shard, A. G., S. Clarke, and M. C. Davies. "Static SIMS analysis of random poly (lactic-co-glycolic acid)." Surface and Interface Analysis 33, no. 6 (2002): 528–32. http://dx.doi.org/10.1002/sia.1414.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

42

Shaw, A. D., M. M. Cortez, A. K. Gianotto, et al. "Static SIMS analysis of carbonate on basic alkali-bearing surfaces." Surface and Interface Analysis 35, no. 3 (2003): 310–17. http://dx.doi.org/10.1002/sia.1534.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

43

Verdier, S., J. B. Metson, and H. M. Dunlop. "Static SIMS studies of the oxides and hydroxides of aluminium." Journal of Mass Spectrometry 42, no. 1 (2007): 11–19. http://dx.doi.org/10.1002/jms.1121.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

44

Wood, B. J., R. N. Lamb, and C. L. Raston. "Static SIMS study of hydroxylation of low-surface-area silica." Surface and Interface Analysis 23, no. 10 (1995): 680–88. http://dx.doi.org/10.1002/sia.740231006.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

45

Cejudo, Antonio, Josep María Centenera-Centenera, and Fernando Santonja-Medina. "Sagittal Integral Morphotype of Competitive Amateur Athletes and Its Potential Relation with Recurrent Low Back Pain." International Journal of Environmental Research and Public Health 18, no. 16 (2021): 8262. http://dx.doi.org/10.3390/ijerph18168262.

Der volle Inhalt der Quelle

Annotation:

Athletes have higher thoracic and lumbar curvature in standing than the reference values of the non-athletic population. The sagittal integral morphotype method (SIM) assessment has not previously been applied to competitive amateur athletes (CAA). The propose of the present study was to determine the SIM of CAA treated at a sports-medicine center and to identify spinal misalignments associated with recurrent low back pain (LBP). An observational analysis was developed to describe the SIM in 94 CAA. The thoracic and lumbar curvatures of the CAA were measured in standing, sitting, and trunk for

APA, Harvard, Vancouver, ISO und andere Zitierweisen

46

Li, Quan-Wen, Jun-Liang Liu, Jian-Hua Jia, et al. "“Half-sandwich” YbIII single-ion magnets with metallacrowns." Chemical Communications 51, no. 51 (2015): 10291–94. http://dx.doi.org/10.1039/c5cc03389f.

Der volle Inhalt der Quelle

Annotation:

Two “half-sandwich” Yb<sup>III</sup>-SIMs are presented bearing metallacrowns. The central ytterbium ion is coordinated by YbO<sub>8</sub> geometry in D<sub>4d</sub> symmetry. The analysis of static, dynamic magnetism and emission spectrum offers an insight into the magneto-optical correlation.

APA, Harvard, Vancouver, ISO und andere Zitierweisen

47

Gilmore, I. S., F. M. Green, and M. P. Seah. "Static TOF-SIMS. A VAMAS interlaboratory study. Part II - accuracy of the mass scale and G-SIMS compatibility." Surface and Interface Analysis 39, no. 10 (2007): 817–25. http://dx.doi.org/10.1002/sia.2596.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

48

HAYASHI, Yasuo, and Kiyoshi MATSUMOTO. "Determination of Surface Silanol Group on Silicate Glasses Using Static SIMS." Journal of the Ceramic Society of Japan 100, no. 1164 (1992): 1038–41. http://dx.doi.org/10.2109/jcersj.100.1038.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

49

Van Ham, R., A. Adriaens, L. Van Vaeck, R. Gijbels, and F. Adams. "Molecular information in static SIMS for the speciation of inorganic compounds." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163 (March 2000): 245–49. http://dx.doi.org/10.1016/s0168-583x(99)00750-8.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

50

Cocco, R. A., C. Papageorgopoulos, and B. J. Tatarchuk. "Static sims measurements during explosive desorption: Desorption-induced recombination and cationization." Surface Science 218, no. 1 (1989): 167–77. http://dx.doi.org/10.1016/0039-6028(89)90625-0.

Der volle Inhalt der Quelle

APA, Harvard, Vancouver, ISO und andere Zitierweisen

Wir bieten Rabatte auf alle Premium-Pläne für Autoren, deren Werke in thematische Literatursammlungen aufgenommen wurden. Kontaktieren Sie uns, um einen einzigartigen Promo-Code zu erhalten!