Auswahl der wissenschaftlichen Literatur zum Thema „Transmission electron“
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Zeitschriftenartikel zum Thema "Transmission electron":
KONNO, Mitsuru, Toshie YAGUCHI und Takahito HASHIMOTO. „Transmission Electron Microscop and Scanning Transmission Electron Microscope“. Journal of the Japan Society of Colour Material 79, Nr. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.
Moldovan, G., X. Li, P. Wilshaw und AI Kirkland. „Counting Electrons in Transmission Electron Microscopes“. Microscopy and Microanalysis 14, S2 (August 2008): 912–13. http://dx.doi.org/10.1017/s1431927608084912.
Shindo, Daisuke. „Transmission Electron Microscope“. Materia Japan 44, Nr. 11 (2005): 932–35. http://dx.doi.org/10.2320/materia.44.932.
Yase, Kiyoshi. „Transmission Electron Microscopy.“ Kobunshi 43, Nr. 2 (1994): 94–97. http://dx.doi.org/10.1295/kobunshi.43.94.
Bendersky, L. A., und F. W. Gayle. „Electron diffraction using transmission electron microscopy“. Journal of Research of the National Institute of Standards and Technology 106, Nr. 6 (November 2001): 997. http://dx.doi.org/10.6028/jres.106.051.
Lichte, Hannes. „Electron Holography Improving Transmission Electron Microscopy“. Proceedings, annual meeting, Electron Microscopy Society of America 48, Nr. 1 (12.08.1990): 208–9. http://dx.doi.org/10.1017/s0424820100179798.
Brydson, R., A. Brown, L. G. Benning und K. Livi. „Analytical Transmission Electron Microscopy“. Reviews in Mineralogy and Geochemistry 78, Nr. 1 (01.01.2014): 219–69. http://dx.doi.org/10.2138/rmg.2014.78.6.
Doyama, Masao, Yoshiaki Kogure, Miyoshi Inoue, Yoshihiko Hayashi, Toshimasa Yoshiie, Toshikazu Kurihara, Ryuichiro Oshima und Katsushige Tsuno. „Transmission Positron-Electron Microscopes“. Materials Science Forum 445-446 (Januar 2004): 471–73. http://dx.doi.org/10.4028/www.scientific.net/msf.445-446.471.
Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev und L. Schäfer. „ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY“. Fine Chemical Technologies 12, Nr. 1 (28.02.2017): 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.
Urban, K. „Picometer Transmission Electron Microscopy“. Microscopy and Microanalysis 17, S2 (Juli 2011): 1314–15. http://dx.doi.org/10.1017/s1431927611007446.
Dissertationen zum Thema "Transmission electron":
Jin, Liang. „Direct electron detection in transmission electron microscopy“. Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.
Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
McKeown, Karen. „Using scanning electron microscopy (SEM) and transmission electron nncroscopy“. Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.
Worden, R. H. „Transmission electron microscopy of metamorphic reactions“. Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.
Chan, Yu Fai. „Nanostructure characterization by transmission electron microscopy /“. View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.
Includes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.
Löfgren, André. „Detection of electron vortex beams : Using a scanning transmission electron microscope“. Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Elektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Agarwal, Akshay. „A nanofabricated amplitude-division electron interferometer in a transmission electron microscope“. Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.
"September 2016." Cataloged from PDF version of thesis.
Includes bibliographical references (pages 56-62).
Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'.
by Akshay Agarwal.
S.M.
Johnson, Lars. „Nanoindentation in situ a Transmission Electron Microscope“. Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
The technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Findlay, Scott David. „Theoretical aspects of scanning transmission electron microscopy /“. Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.
Koda, Nobuko. „Transmission electron microscopy studies of fega alloys“. College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.
Thesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Hetherington, C. „Transmission electron microscopy of GaAs/AlGaAs multilayers“. Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.
Bücher zum Thema "Transmission electron":
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.
Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.
Carter, C. Barry, und David B. Williams, Hrsg. Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.
Williams, David B., und C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.
Williams, David B., und C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.
Thomas, Jürgen, und Thomas Gemming. Analytical Transmission Electron Microscopy. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-8601-0.
Zuo, Jian Min, und John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.
Deepak, Francis Leonard, Alvaro Mayoral und Raul Arenal, Hrsg. Advanced Transmission Electron Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.
Pennycook, Stephen J., und Peter D. Nellist, Hrsg. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.
Buchteile zum Thema "Transmission electron":
Williams, David B., und C. Barry Carter. „Electron Sources“. In Transmission Electron Microscopy, 73–89. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_5.
Kruit, Pieter. „Electron Sources“. In Transmission Electron Microscopy, 1–15. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_1.
Weyland, Matthew, und Paul Midgley. „Electron Tomography“. In Transmission Electron Microscopy, 343–76. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_12.
Lehmann, Michael, und Hannes Lichte. „Electron Holography“. In Transmission Electron Microscopy, 215–32. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_8.
Williams, David B., und C. Barry Carter. „Electron Sources“. In Transmission Electron Microscopy, 67–83. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_5.
Reimer, Ludwig. „Electron-Specimen Interactions“. In Transmission Electron Microscopy, 143–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_5.
Reimer, Ludwig. „Electron-Specimen Interactions“. In Transmission Electron Microscopy, 136–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_5.
Reimer, Ludwig. „Analytical Electron Microscopy“. In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_9.
Reimer, Ludwig. „Electron-Specimen Interactions“. In Transmission Electron Microscopy, 136–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_5.
Reimer, Ludwig. „Analytical Electron Microscopy“. In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_9.
Konferenzberichte zum Thema "Transmission electron":
Krysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza und Jan Dziuban. „Electron Transparent Anode for MEMS Transmission Electron Microscope“. In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.
Krajnak, Matus. „Transforming transmission electron microscopy with MerlinEM electron counting detector“. In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.594.
Bach, Nora, Armin Feist, Till Domrose, Marcel Moller, Nara Rubiano da Silva, Thomas Danz, Sascha Schafer und Claus Ropers. „Highly coherent femtosecond electron pulses for ultrafast transmission electron microscopy“. In 2017 30th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2017. http://dx.doi.org/10.1109/ivnc.2017.8051554.
Pennycook, S. J. „Transmission Electron Microscopy: Overview and Challenges“. In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology. AIP, 2003. http://dx.doi.org/10.1063/1.1622537.
Leth Larsen, Matthew Helmi. „Deep learning assisted transmission electron microscopy“. In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.924.
Nicholls, Daniel. „Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy“. In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.159.
Feist, Armin, Katharina E. Echternkamp, Reiner Bormann, Nara Rubiano da Silva, Marcel Möller, Wenxi Liang, Sascha Schäfer und Claus Ropers. „Few-nanometer femtosecond electron probe pulses in ultrafast transmission electron microscopy“. In International Conference on Ultrafast Phenomena. Washington, D.C.: OSA, 2016. http://dx.doi.org/10.1364/up.2016.uth2b.5.
De Graef, Marc. „Recent Progress in Lorentz Transmission Electron Microscopy“. In ESOMAT 2009 - 8th European Symposium on Martensitic Transformations. Les Ulis, France: EDP Sciences, 2009. http://dx.doi.org/10.1051/esomat/200901002.
Xie, Wenkai, Xi Chen, Lin Meng, Xinyan Gao und Shenggang Liu. „Electron-beam transmission properties in plasma channel“. In AeroSense 2002, herausgegeben von Howard E. Brandt. SPIE, 2002. http://dx.doi.org/10.1117/12.469835.
Merrill, F. E., A. J. Clarke, J. Goett, J. W. Gibbs, C. Hast, S. D. Imhoff, K. Jobe et al. „Demonstration of transmission high energy electron microscopy“. In SHOCK COMPRESSION OF CONDENSED MATTER - 2019: Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter. AIP Publishing, 2020. http://dx.doi.org/10.1063/12.0000952.
Berichte der Organisationen zum Thema "Transmission electron":
Ren, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, Januar 2001. http://dx.doi.org/10.21236/ada392051.
Libera, Matthew R. Transmission Electron Holography of Polymer Microstructure. Fort Belvoir, VA: Defense Technical Information Center, April 1998. http://dx.doi.org/10.21236/ada344467.
Fraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, Oktober 1987. http://dx.doi.org/10.21236/ada189111.
Pennycook, S. J., und A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), Juni 2008. http://dx.doi.org/10.2172/939888.
Minor, Andrew M. In situ nanoindentation in a transmission electron microscope. Office of Scientific and Technical Information (OSTI), Januar 2002. http://dx.doi.org/10.2172/807441.
Reed, B., M. Armstrong, K. Blobaum, N. Browning, A. Burnham, G. Campbell, R. Gee et al. Time Resolved Phase Transitions via Dynamic Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), Februar 2007. http://dx.doi.org/10.2172/902321.
Dietz, N. L. Transmission electron microscopy analysis of corroded metal waste forms. Office of Scientific and Technical Information (OSTI), April 2005. http://dx.doi.org/10.2172/861616.
Clark, Waylon T., Michael D. Pelock, Jeremy Paul Martin, Daniel Peter Jr Jackson, Mark Edward Savage, Brian Scott Stoltzfus, Clifford Will, Jr Mendel und Timothy David Pointon. Precision electron flow measurements in a disk transmission line. Office of Scientific and Technical Information (OSTI), Januar 2008. http://dx.doi.org/10.2172/932880.
Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/10170120.
Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/6282616.