Bibliografías temáticas / Electron microscopy

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Literatura académica sobre el tema "Electron microscopy"

Autor: Grafiati
Publicado: 4 de junio de 2021
Última modificación: 25 de julio de 2025

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Artículos de revistas sobre el tema "Electron microscopy"

1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin
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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l
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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el
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Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as su
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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca
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6

Tromp, Ruud M. "Low-Energy Electron Microscopy." MRS Bulletin 19, no. 6 (1994): 44–46. http://dx.doi.org/10.1557/s0883769400036757.

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For surface science, the 1980s were the decade in which the microscopes arrived. The scanning tunneling microscope (STM) was invented in 1982. Ultrahigh vacuum transmission electron microscopy (UHVTEM) played a key role in resolving the structure of the elusive Si(111)-7 × 7 surface. Scanning electron microscopy (SEM) as well as reflection electron microscopy (REM) were applied to the study of growth and islanding. And low-energy electron microscopy (LEEM), invented some 20 years earlier, made its appearance with the work of Telieps and Bauer.LEEM and TEM have many things in common. Unlike STM
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O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen
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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten
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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca
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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th
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Tesis sobre el tema "Electron microscopy"

1

Jin, Liang. "Direct electron detection in transmission electron microscopy." Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.

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Thesis (Ph. D.)--University of California, San Diego, 2009.<br>Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
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Davies, D. G. "Scanning electron acoustic microscopy." Thesis, University of Cambridge, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304042.

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Duncan, James Lyon. "Electron microscopy of photosystems." Thesis, Imperial College London, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.412477.

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Harland, C. J. "Detector and electronic developments for scanning electron microscopy." Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Bruley, John. "Analytical electron microscopy of diamond." Thesis, University of Cambridge, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.237560.

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Briggs, John A. G. "Cryo-electron microscopy of retroviruses." Thesis, University of Oxford, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.408819.

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Sader, Kasim Stefan. "Aspects of biological electron microscopy." Thesis, University of Leeds, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.434150.

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Song, Se Ahn. "Electron microscopy of lanthanide diphthalocyanines." Thesis, University of Essex, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.328597.

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Cullen, Sarah Louise. "Electron microscopy of carbon nanotubes." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.387605.

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Libros sobre el tema "Electron microscopy"

1

Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. Academic, 1990.

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Goodhew, Peter J. Electron microscopy and analysis. 2nd ed. Taylor & Francis, 1988.

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Slayter, Elizabeth M. Light and electron microscopy. Cambridge University Press, 1992.

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R, Beanland, and Humphreys F. J, eds. Electron microscopy and analysis. 3rd ed. Taylor & Francis, 2001.

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Kʻo-hsin, Kuo, and Zhai Z. H, eds. Electron microscopy. World Scientific, 1992.

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Thomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. Academic Press, 1994.

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Kuo, John, ed. Electron Microscopy. Humana Press, 2014. http://dx.doi.org/10.1007/978-1-62703-776-1.

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Kuo, John, ed. Electron Microscopy. Humana Press, 2007. http://dx.doi.org/10.1007/978-1-59745-294-6.

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Thomas, Mulvey, and Sheppard C. J. R, eds. Advances in optical and electron microscopy. Academic Press, 1994.

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Inc, ebrary, ed. High-resolution electron microscopy. Oxford University Press, 2009.

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Capítulos de libros sobre el tema "Electron microscopy"

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Nölting, Bengt. "Electron microscopy." In Methods in Modern Biophysics. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-05367-6_6.

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Saka, S. "Electron Microscopy." In Methods in Lignin Chemistry. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-74065-7_10.

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Janssens, Koen. "Electron Microscopy." In Modern Methods for Analysing Archaeological and Historical Glass. John Wiley & Sons Ltd, 2013. http://dx.doi.org/10.1002/9781118314234.ch6.

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Michler, G. H. "Electron microscopy." In Polymer Science and Technology Series. Springer Netherlands, 1999. http://dx.doi.org/10.1007/978-94-011-4421-6_26.

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Kuo, John. "Electron Microscopy." In Springer Protocols Handbooks. Humana Press, 2008. http://dx.doi.org/10.1007/978-1-60327-375-6_54.

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Bertazzo, Sergio. "Electron Microscopy." In Microscopy of the Heart. Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-95304-5_6.

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Volkmann, Niels, and Dorit Hanein. "Electron Microscopy." In Structural Bioinformatics. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471721204.ch6.

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Doane, Frances W. "Electron Microscopy." In Laboratory Diagnosis of Infectious Diseases Principles and Practice. Springer New York, 1988. http://dx.doi.org/10.1007/978-1-4612-3900-0_7.

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Hermansson, Anne-Marie, and Maud Langton. "Electron Microscopy." In Physical Techniques for the Study of Food Biopolymers. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4615-2101-3_6.

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Nölting, Bengt. "Electron microscopy." In Methods in Modern Biophysics. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03022-2_6.

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Actas de conferencias sobre el tema "Electron microscopy"

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Zhu, Yu. "Transmission Electron Microscopy." In ISTFA 2024. ASM International, 2024. http://dx.doi.org/10.31399/asm.cp.istfa2024tpm1.

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Gaida, John H., Hugo Lourenço-Martins, Murat Sivis, et al. "Attosecond electron microscopy using free-electron homodyne detection." In CLEO: Fundamental Science. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_fs.2024.fm2b.2.

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We implement attosecond electron microscopy in a TEM to measure the optical near-field of a plasmonic nanoprism with 54 as (FWHM) temporal and few-nm spatial resolution, demonstrating free-electron homodyne detection.
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Kuo, Kehsin, and Junen Yao. "Electron Microscopy." In International Symposium on Electron Microscopy. WORLD SCIENTIFIC, 1991. http://dx.doi.org/10.1142/9789814539340.

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Villarraga-Gómez, Herminso, Kyle Crosby, Masako Terada, and Mansoureh Norouzi Rad. "Assessing Electronics with Advanced 3D X-ray Microscopy Techniques and Electron Microscopy." In ISTFA 2023. ASM International, 2023. http://dx.doi.org/10.31399/asm.cp.istfa2023p0554.

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Abstract This paper presents advanced workflows that combine 3D Xray microscopy (XRM), nanoscale tomography, and electron microscopy to generate a detailed visualization of the interior of electronic devices and assemblies to enable the study of internal components for failure analysis (FA). Newly developed techniques such as the integration of deep-learning (DL) based algorithms for 3D image reconstruction are also discussed in this article. In addition, a DL-based tool (called DeepScout) is introduced that uses high-resolution 3D XRM datasets as training data for lower-resolution, larger fie
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Musumeci, Pietro. "Single-shot time-resolved electron microscopy using MeV electrons." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.678.

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Banhart, Florian. "Nanosecond analytical electron microscopy with single electron pulses." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.225.

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Nicholls, Daniel. "Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.159.

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Kuo, K. H., and Z. H. Zhai. "Electron Microscopy I." In 5th Asia-Pacific Electron Microscopy Conference. WORLD SCIENTIFIC, 1992. http://dx.doi.org/10.1142/9789814537544.

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Kuo, K. H., and Z. H. Zhai. "Electron Microscopy II." In 5th Asia-Pacific Electron Microscopy Conference. WORLD SCIENTIFIC, 1992. http://dx.doi.org/10.1142/9789814537537.

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Nabben, David, Joel Kuttruff, Levin Stolz, Andrey Ryabov, and Peter Baum. "Attosecond Electron Microscopy." In CLEO: Fundamental Science. Optica Publishing Group, 2023. http://dx.doi.org/10.1364/cleo_fs.2023.fth1c.1.

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Informes sobre el tema "Electron microscopy"

1

Bentley, J. (Future of electron microscopy). Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5651701.

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Weber, Peter M. Time-Resolved Scanning Electron Microscopy. Defense Technical Information Center, 2006. http://dx.doi.org/10.21236/ada455461.

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Binev, Peter, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, and Robert Sharpley. Compressed Sensing and Electron Microscopy. Defense Technical Information Center, 2010. http://dx.doi.org/10.21236/ada560915.

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Allard, L., and T. Nolan. (Concepts for future developments in electron microscopy). [Concept for Future Development in Electron Microscopy]. Office of Scientific and Technical Information (OSTI), 1990. http://dx.doi.org/10.2172/6959950.

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Durr, Hermann. Ultrafast Science Opportunities with Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1249382.

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Lyman, C. Analytical electron microscopy of catalyst preparations. Office of Scientific and Technical Information (OSTI), 1990. http://dx.doi.org/10.2172/6990056.

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Harris, Christopher. Open Reproducible Electron Microscopy Data Analysis. Office of Scientific and Technical Information (OSTI), 2022. http://dx.doi.org/10.2172/1847929.

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Sickafus, Kurt. History of Scanning Electron Microscopy (SEM). Office of Scientific and Technical Information (OSTI), 2024. http://dx.doi.org/10.2172/2372668.

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Mitchell, T. E., H. H. Kung, K. E. Sickafus, G. T. III Gray, R. D. Field, and J. F. Smith. High-resolution electron microscopy of advanced materials. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/548622.

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Taylor, J. R. Improved methods for high resolution electron microscopy. Office of Scientific and Technical Information (OSTI), 1987. http://dx.doi.org/10.2172/5644034.

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