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Artykuły w czasopismach na temat „Accumulation de charge photoinduite”

Autor: Grafiati

Data publikacji: 7 grudnia 2024

Data aktualizacji: 31 lipca 2025

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1

Gao, Mingze, Jiangkun Sun, Sheng Yu, et al. "Investigation of the Charge Accumulation Based on Stiffness Variation of the Micro-Shell Resonator Gyroscope." Micromachines 14, no. 9 (2023): 1755. http://dx.doi.org/10.3390/mi14091755.

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In capacitive microelectromechanical system (MEMS) devices, the application of dielectric materials causes long-term charging problems in the dielectric layers or substrates, which especially affect the repeatability and stability of high-performance devices. Due to the difficulties of observation and characterization of charge accumulation, an accurate characterization method is needed to study the effect of charge and propose suppression methods. In this paper, we analyze the influence of charge accumulation on the MSRG and propose a characterization method for charge accumulation based on s

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2

Russo, Christopher J., and Richard Henderson. "Charge accumulation in electron cryomicroscopy." Ultramicroscopy 187 (April 2018): 43–49. http://dx.doi.org/10.1016/j.ultramic.2018.01.009.

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3

Olsson, L. Ö., C. B. M. Andersson, M. C. Håkansson, J. Kanski, L. Ilver, and U. O. Karlsson. "Charge Accumulation at InAs Surfaces." Physical Review Letters 76, no. 19 (1996): 3626–29. http://dx.doi.org/10.1103/physrevlett.76.3626.

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4

Lai, Yundong, Hui Jiang, Yufei Han, and Jinyu Tang. "Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors." Electronics 13, no. 7 (2024): 1294. http://dx.doi.org/10.3390/electronics13071294.

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Charge accumulation usually happens on the surface of spacers under DC operation, which is susceptible to inducing surface flashover. In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface charges, a time-varying charge density model at the gas–solid interface of spacers was established. The results of the simulation show that the discontinuity of the current density between the spacer bulk side and the gas ion flow is the fundamental reason for the charge accumulation on the spacer su

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5

ZHANG, JIA-WEI, TIAN-HAO LI, and WEI ZHANG. "SIMULATION OF SURFACE CHARGE DISSIPATION OF INSULATING BACKSHEETS FOR FLEXIBLE PHOTOVOLTAIC MODULE UNDER VARIOUS TEMPERATURE CONDITIONS." Surface Review and Letters 27, no. 11 (2020): 1950230. http://dx.doi.org/10.1142/s0218625x19502305.

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Because of excellent mechanical properties, thermal insulation and ideal radiation resistance, polyimide (PI) is one of the best choices as a flexible solar backsheet in photovoltaic systems. In this study, accumulation characteristics of surface charge of PI backsheet under temperature-controlled corona polarization were investigated both theoretically and experimentally. In order to investigate the surface charge accumulation of PI backsheet under the effect of different temperatures, finite element method (FEM) was used. The mechanisms by which the temperature influenced accumulation and de

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6

Bonn, Annabell G., and Oliver S. Wenger. "Photoinduced Charge Accumulation in Molecular Systems." CHIMIA International Journal for Chemistry 69, no. 1 (2015): 17–21. http://dx.doi.org/10.2533/chimia.2015.17.

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7

Ireland, Peter M. "Contact charge accumulation and separation discharge." Journal of Electrostatics 67, no. 2-3 (2009): 462–67. http://dx.doi.org/10.1016/j.elstat.2009.01.014.

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8

Wang, Wenqu, Yu Gao, and Huicun Zhao. "The Effect of a Metal Particle on Surface Charge Accumulation Behavior of Epoxy Insulator with Zoning Coating." Energies 15, no. 13 (2022): 4730. http://dx.doi.org/10.3390/en15134730.

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Epoxy insulators are widely used in Gas-Insulated Transmission Lines (GILs), playing a significant role in electrical insulation and mechanical support. The metal particles generated during the production and operation of the equipment aggravate surface charge accumulation on the insulator, causing surface flashover. Therefore, it is necessary to study the suppression strategy of charge accumulation. In this paper, a downsized disc insulator was taken as the research object to investigate the effect of zoning coating on charge suppression with the presence of a linear aluminum metal particle u

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9

Liang, Fangwei, Hanhua Luo, Xianhao Fan, Xuetong Li, and Xu Wang. "Review of Surface Charge Accumulation on Insulators in DC Gas-Insulated Power Transmission Lines: Measurement and Suppression Measures." Energies 16, no. 16 (2023): 6027. http://dx.doi.org/10.3390/en16166027.

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Gas-insulated power transmission lines (GILs) can replace cables and overhead transmission lines, playing an important role in DC transmission systems. However, the influence of surface charge accumulation on insulation reliability cannot be ignored as the operational voltage of the DC GIL increases. In this paper, the measurement methods for the insulator surface potential are summarized, including, dust maps, the Pockels effect method, and the electrostatic probe method. Then, a typical surface charge inversion algorithm is introduced. The main influencing factors of surface charge accumulat

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10

Shimakawa, Hajime, Akiko Kumada, Kunihiko Hidaka, Takanori Yasuoka, Yoshikazu Hoshina, and Motoharu Shiiki. "Surface Charge Accumulation of DC-GIS Spacer." IEEJ Transactions on Power and Energy 140, no. 6 (2020): 548–49. http://dx.doi.org/10.1541/ieejpes.140.548.

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11

Gierus, A. V., and T. G. Gierus. "Charge accumulation effects in quantum-well structures." Semiconductors 40, no. 6 (2006): 681–86. http://dx.doi.org/10.1134/s1063782606060133.

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12

Feng Wang, Yuchang Qiu, W. Pfeiffer, and E. Kuffel. "Insulator surface charge accumulation under impulse voltage." IEEE Transactions on Dielectrics and Electrical Insulation 11, no. 5 (2004): 847–54. http://dx.doi.org/10.1109/tdei.2004.1349790.

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13

(George)Yu, Zhao-Zhi, and Keith Watson. "Two-step model for contact charge accumulation." Journal of Electrostatics 51-52 (May 2001): 313–18. http://dx.doi.org/10.1016/s0304-3886(01)00071-7.

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14

Garab, Gy, Zs Rozsa, and Govindjee. "Carbon dioxide affects charge accumulation in leaves." Naturwissenschaften 75, no. 10 (1988): 517–19. http://dx.doi.org/10.1007/bf00361289.

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15

Jing, T., P. H. F. Morshuis, and F. H. Kreuger. "Mechanisms of surface charge accumulation in SF6." Archiv für Elektrotechnik 77, no. 2 (1994): 151–55. http://dx.doi.org/10.1007/bf01578538.

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16

Gu, Wenhao, Fei Teng, Yaozhu Chu, An Zhang, and Zain Ul Abideen. "An interesting charge accumulation process of Bi12O15Cl6." Journal of Electroanalytical Chemistry 846 (August 2019): 113169. http://dx.doi.org/10.1016/j.jelechem.2019.05.051.

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17

Boev, S. G., and V. A. Paderin. "Charge accumulation in dielectrics irradiated by protons." Soviet Physics Journal 30, no. 5 (1987): 425–29. http://dx.doi.org/10.1007/bf00900096.

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18

Gritsenko, N. I., I. N. Gulenko, and N. V. Moshel'. "Charge transport and accumulation in liquid crystals." Soviet Physics Journal 32, no. 7 (1989): 507–10. http://dx.doi.org/10.1007/bf00896120.

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19

Boyev, S. G., and A. P. Tyutnev. "Space charge accumulation in electron irradiated PMMA." Journal of Electrostatics 26, no. 2 (1991): 175–85. http://dx.doi.org/10.1016/0304-3886(91)90014-7.

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20

Huan, Bai, Guangmao Li, Gang Du, Jun Xiong, and Wenxiong Mo. "Effect of Semiconductive Layer on Space Charge Accumulation in XLPE." E3S Web of Conferences 204 (2020): 02004. http://dx.doi.org/10.1051/e3sconf/202020402004.

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Long time DC pressure on high voltage cables will lead to the accumulation of space charge in XLPE cables, thus endangering cable insulation. In order to study the effect of the thickness of semiconducting layer on the space charge in XLPE, the space charge in 10kV and 220kV XLPE sample with different thickness of semiconducting layer was measured and compared based on PEA method. Firstly, the samples were pressurized to the specified voltage, then kept this voltage for 30 minutes, then depressurized to 0, and lastly maintained for 90 minutes. The variation of space charge distribution during

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21

Li, Zhonglei, Jingang Su, Boxue Du, Zhaohao Hou, and Chenlei Han. "Inhibition Effect of Graphene on Space Charge Injection and Accumulation in Low-Density Polyethylene." Nanomaterials 8, no. 11 (2018): 956. http://dx.doi.org/10.3390/nano8110956.

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Space charge injection and accumulation is attracting much attention in the field of dielectric insulation especially for electronic devices, power equipment and so on. This paper proposes using the inhibition effect of graphene for the injection and accumulation of space charge in low-density polyethylene (LDPE). Scanning electron microscope (SEM) and transmission electron microscopy (TEM) images were employed to observe the dispersion of graphene with a two-dimensional structure in LDPE. The time-dependent space charge dynamic behaviors of graphene/LDPE nanocomposites with the filler content

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22

Yan, Zhiyu, Hong Zhao, Baozhong Han, Jiaming Yang, and Junqi Chen. "The suppression of space charge accumulation in CB/LDPE nanocomposites and its association with molecule relaxation." e-Polymers 18, no. 1 (2018): 49–56. http://dx.doi.org/10.1515/epoly-2017-0111.

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AbstractSpace charge accumulation within insulating material poses a threat to the reliability in the operation of DC power cables. To investigate the influence of carbon black (CB) on the space charge accumulation of low density polyethylene (LDPE), both conductive carbon black (C-CB) and insulating carbon black (I-CB) were employed as filler particles. The space charge distributions of LDPE and CB/LDPE nanocomposites were obtained by the pulsed electro-acoustic (PEA) method. Additionally, dynamic mechanical analysis (DMA) and thermally stimulated current (TSC) spectroscopy were applied to ex

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23

Jin, Rui, Xiaoyan Liu, Gang Du, Jinfeng Kang, and Ruqi Han. "Effect of trapped charge accumulation on the retention of charge trapping memory." Journal of Semiconductors 31, no. 12 (2010): 124016. http://dx.doi.org/10.1088/1674-4926/31/12/124016.

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24

Xing, Zhaoliang, Chong Zhang, Haozhe Cui, Yali Hai, Qingzhou Wu, and Daomin Min. "Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps." Applied Sciences 9, no. 20 (2019): 4253. http://dx.doi.org/10.3390/app9204253.

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Charge trapping and de-trapping properties can affect space charge accumulation and electric field distortion behavior in polymers. Dielectric materials may contain different types of traps with different energy distributions, and it is of interest to investigate the charge trapping/de-trapping dynamic processes in dielectric materials containing multiple discrete trap centers. In the present work, we analyze the charge trapping/de-trapping dynamics in materials with two discrete traps in two cases where charges are injected continuously or only for a very short period. The time dependent trap

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25

Yablon, L. S., O. V. Morushko, B. K. Ostafiychuk, І. М. Budzulyak, and О. M. Khemiy. "Effect of laser irradiation on Electrochemical Properties of composite MoS2/C." Фізика і хімія твердого тіла 17, no. 4 (2016): 575–81. http://dx.doi.org/10.15330/pcss.17.4.575-581.

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The paper presents the results of studies of electrochemical properties of composite MoS2/C. It is shown that the contribution to the conductivity of composites makes a charge accumulation capacitive nature inherent in high-conductive carbon, which is situated between the layers of MoS2, improved charge transfer processes during charge / discharge, and quick turnaround faradeyivski processes inherent molybdenum disulphide. Found that the highest discharge specific capacity has laser irradiated composite MoS2/C with a carbon content of 70% (209 F/g), due to the best combination of two mechanism

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26

Alexandrov O. V., Tyapkin N. S., Mokrushina S. A., and Fomin V. N. "Effect of ionizing irradiation on charge distribution and breakdown of MOSFETs." Semiconductors 56, no. 2 (2022): 188. http://dx.doi.org/10.21883/sc.2022.02.53051.9735.

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The effect of ionizing radiation on the formation of charges at internal SiO2-Si (substrate) and external SiO2-Sips (gate) interfacial boundaries (IFB) and on the gate breakdown of MOSFETs is studied. It is shown that with an increase in the dose of ionizing radiation near the internal interfacial boundaries, a monotonous increase of positive charge in p-MOSFETs, and the accumulation of positive charges at first, and at doses above 105 rad the accumulation of negative charges in n-MOSFETs is observed. Near the external interfacial boundaries, at low radiation doses, positive charge accumulatio

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27

Parfenov P. S., Korzhenevskii I. G., Babaev A. A., Litvin. A. P., Sokolova A. V., and Fedorov A. V. "Measuring the mobility of charge carriers in samples with low conductivity by the field effect transistor method using output characteristics." Technical Physics 68, no. 4 (2023): 546. http://dx.doi.org/10.21883/tp.2023.04.55948.283-22.

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FET-based charge carrier mobility measurements in low-conductivity materials, as well as semiconductor materials with a high density of trapping states, such as nanocrystals and polycrystalline films, are highly distorted due to charge accumulation in the transistor structure. In this work, a comparative study of the measurement of the mobility of charge carrier in conductive polymers, nanocrystals and polycrystalline films, using the analysis of output and transfer characteristics, was carried out. It is shown that using output characteristics instead of transfer characteristics for calculati

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28

Cheng, Lin, Zongrang Chen, Jianyong Luo, Dechao Yang, and Nan Liu. "Analysis of the dynamic characteristics of XLPE pellet space charge." Journal of Physics: Conference Series 2835, no. 1 (2024): 012019. http://dx.doi.org/10.1088/1742-6596/2835/1/012019.

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Abstract The accumulation of space charge within XLPE materials can lead to the electric field’s uneven distribution, thereby increasing the risk of insulation problems in cables. However, the damage mechanism of space charge on cable insulation is not understood completely. Therefore, this study is dedicated to analysing the behaviour of space charge accumulation and dissipation in pressed XLPE granular material. The charge movement mechanism within XLPE materials was meticulously analysed with the pulsed electro-acoustic method. Experimental results reveal that the pressed granular XLPE accu

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29

Moufakkir, Younes, Ayyoub Zouaghi, and Christian Vollaire. "Study of Discharge Inception and Propagation in Liquid–Solid Insulation System under DC–LI Superimposed Constraints." Energies 16, no. 1 (2022): 172. http://dx.doi.org/10.3390/en16010172.

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High-voltage direct current (HVDC) links are starting to become widely implemented thanks to their interesting advantages such as reduced operation losses, the absence of reactive power, which allows energy transport via underground cables over long distances, and improved power control. The latter advantage is very essential for renewable energy resource integration into power grids. However, a thorough understanding of the behavior of insulation systems for HVDC components is critical so as to ensure a more reliable service. Indeed, the existence of the direct current (DC) voltage in HVDC co

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30

Andreev, D. V. "Accumulation and Erase of Radiation-Induced Charge in MOS Structures." Poverhnostʹ. Rentgenovskie, sinhrotronnye i nejtronnye issledovaniâ, no. 6 (October 15, 2024): 93–98. http://dx.doi.org/10.31857/s1028096024060137.

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It is shown that when a MOS (metal–oxide–semiconductor) structure is simultaneously exposed to radiation and high-field injection of electrons, part of the radiation-induced positive charge can be erased when interacting with injected electrons, and the density of surface states can increase. These phenomena must be taken into account when operating MOS radiation sensors in high-field charge injection modes. High-field injection modes used for post-radiation erase of positive charge in MOS sensors are analyzed. It has been established that to annihilate one hole (radiation-induced positive cha

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31

Zhao, Wei, Huaqiang Li, Wenpeng Li, Xin Chen, Lisheng Zhong, and Jinghui Gao. "Charge Accumulation in the Homo-Crosslinked-Polyethylene Bilayer." Materials 15, no. 9 (2022): 3024. http://dx.doi.org/10.3390/ma15093024.

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The homo-crosslinked-polyethylene (H-XLPE) bilayer simplifies the returned insulation structure of the factory joint in submarine cables, and its dielectric property is key to the reliability of the power transmission system. In this paper, we investigated the charge accumulation phenomenon in a secondary thermocompression H-XLPE bilayer using the pulse electro-acoustic method. The charge accumulation reduces its overall breakdown strength when compared with XLPE. According to X-ray diffraction measurement and thermal analysis results, the specimen forms a homo-junction region between the bila

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32

Chen, Chi, Xia Wang, Kai Wu, et al. "Space charge and trap energy level characteristics of SiC wide bandgap semiconductor." AIP Advances 12, no. 3 (2022): 035017. http://dx.doi.org/10.1063/5.0085118.

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Charge carrier transport and accumulation in silicon carbide (SiC) wide bandgap semiconductors caused by the defect and impurity are likely to lead to serious performance degradation and failure of the semiconductor materials, and the high temperature effect makes the charge behaviors more complex. In this paper, charge carrier transport and accumulation in semi-insulating vanadium doped 4H–SiC crystal materials and the correlated temperature effect were investigated. Attempts were made to address the effect of deep trap levels on carrier transport. A combination of pulsed electro-acoustic dir

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33

Xu, Lu, Yixuan Li, Yan Zhu, and Jianning Yin. "Impact of Pressure and Temperature on Charge Accumulation Characteristics of Insulators in Direct-Current Gas-Insulated Switchgear." Energies 17, no. 11 (2024): 2739. http://dx.doi.org/10.3390/en17112739.

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Direct-current gas-insulated switchgear (DC GIS) is an important device for promoting the lightweight and compact design of offshore wind power platforms. Gas pressure and temperature gradients are crucial factors that must be considered during the design process of the DC GIS. In this study, the multi-physics coupling model of basin insulators considering surface charge accumulation was established, and the corresponding real-sized insulator surface charge measurement platform was constructed. The effects of gas pressure and temperature gradient on the surface charge accumulation characterist

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34

Duan, Xiaohui, Chuanyun Zhu, Qifeng Shang, Zhen Zhang, Kaiyuan Wang, and Yu Gao. "Surface Charge Accumulation on Basin-Shape Insulator in Various Eco-Friendly Gases with Metal Particle Under AC Voltage." Energies 18, no. 11 (2025): 2935. https://doi.org/10.3390/en18112935.

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Surface charge accumulation is considered one of the key factors that lead to unexpected insulator flashover failures in gas-insulated switchgear (GIS). With the existence of metal particles, charge accumulation characteristics on insulator surfaces become intricate in eco-friendly gases under AC voltage. In this study, the surface charge behavior on a down-scaled 252 kV AC GIS basin insulator model with a linear metal particle adhered to the HV electrode on the convex surface in compressed air (80%N2/20%O2) and C4F7N/CO2 mixtures was investigated. After applying an AC voltage of 40 kV for 5 m

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35

Dolgopolov, M. V., M. V. Elisov, S. A. Radzhapov, I. R. Rakhmankulov, and A. S. Chipura. "Modeling of semiconductor heterostructures for energy converters and sensors." Vestnik of Samara University. Natural Science Series 30, no. 1 (2024): 64–81. http://dx.doi.org/10.18287/2541-7525-2024-30-1-64-81.

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A set of modeling programs for constructing a sequence of energy zones of heterojunctions is presented for analyzing the distribution of charge carriers in the heterostructure and internal characteristics, for describing the processes of charge transfer and accumulation. Wolfram Mathematica analytical system and Delphi programming language were used. The main elements of materials are semiconductors, metals of contact structures and injection regions of nonequilibrium carriers. The programs allow determining the structural characteristics of materials, active zones and spatial charge regions,

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36

Srivastava, Priya, Ramesh Kumar, and Monojit Bag. "The curious case of ion migration in solid-state and liquid electrolyte-based perovskite devices: unveiling the role of charge accumulation and extraction at the interfaces." Physical Chemistry Chemical Physics 23, no. 18 (2021): 10936–45. http://dx.doi.org/10.1039/d1cp01214b.

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37

Chianese, Federico, Sandra Fusco, Mario Barra, Fabio Chiarella, Antonio Carella, and Antonio Cassinese. "Space-charge accumulation and band bending at conductive P3HT/PDIF-CN₂ interfaces investigated by scanning-Kelvin probe microscopy." Journal of Materials Chemistry C 9, no. 47 (2021): 17143–51. http://dx.doi.org/10.1039/d1tc04840f.

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Kumykov, Tembulat. "Charge accumulation in thunderstorm clouds: fractal dynamic model." E3S Web of Conferences 127 (2019): 01001. http://dx.doi.org/10.1051/e3sconf/201912701001.

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The paper considers a fractal dynamic charge accumulation model in thunderstorm clouds in view of the fractal dimension. Analytic solution to the model equation has been found. Using numerical calculations we have shown the relationship between the charge accumulation and the medium with the fractal structure. A comparative study of thunderstorm electrification mechanisms have been performed.

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39

Shimotani, Hidekazu, Haruhiko Asanuma, Jun Takeya, and Yoshihiro Iwasa. "Electrolyte-gated charge accumulation in organic single crystals." Applied Physics Letters 89, no. 20 (2006): 203501. http://dx.doi.org/10.1063/1.2387884.

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Zhu, Feng, Haibo Wang, De Song, Kun Lou, and Donghang Yan. "Charge transport in accumulation layers of organic heterojunctions." Applied Physics Letters 93, no. 10 (2008): 103308. http://dx.doi.org/10.1063/1.2980023.

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Olson, Carol L., and Ian Ballard. "Charge Accumulation and Polarization in Titanium Dioxide Electrodes." Journal of Physical Chemistry B 110, no. 37 (2006): 18286–90. http://dx.doi.org/10.1021/jp0616664.

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42

Guan, Li, and Xiaobo Chen. "Photoexcited Charge Transport and Accumulation in Anatase TiO2." ACS Applied Energy Materials 1, no. 8 (2018): 4313–20. http://dx.doi.org/10.1021/acsaem.8b00944.

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Chen, X. Y., H. Zhu, and S. D. Wang. "Charge accumulation dynamics in organic thin film transistors." Applied Physics Letters 97, no. 24 (2010): 243301. http://dx.doi.org/10.1063/1.3526374.

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Szamota-Leandersson, K., R. Bugoi, M. Göthelid, G. Le Lay, and U. O. Karlsson. "Pb induced charge accumulation on InAs(111)B." Surface Science 601, no. 15 (2007): 3246–52. http://dx.doi.org/10.1016/j.susc.2007.05.058.

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Decker, U., L. Richter, and J. Bo¨s. "Aspects of radiation-induced charge accumulation in dielectrics." Radiation Physics and Chemistry (1977) 26, no. 5 (1985): 579–81. http://dx.doi.org/10.1016/0146-5724(85)90214-6.

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Lim, F. N., R. J. Fleming, and R. D. Naybour. "Space charge accumulation in power cable XLPE insulation." IEEE Transactions on Dielectrics and Electrical Insulation 6, no. 3 (1999): 273–81. http://dx.doi.org/10.1109/94.775611.

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Gauthier, N. "Radius of curvature and charge accumulation near points." Physics Education 25, no. 1 (1990): 7. http://dx.doi.org/10.1088/0031-9120/25/1/103.

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Aubrey, J. E. "Charge transport and accumulation in off-axis silicon." Semiconductor Science and Technology 3, no. 9 (1988): 902–7. http://dx.doi.org/10.1088/0268-1242/3/9/012.

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Chen, L. Y. "Charge accumulation and frequency characteristics of sequential tunneling." Physical Review B 48, no. 7 (1993): 4914–16. http://dx.doi.org/10.1103/physrevb.48.4914.

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