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Artykuły w czasopismach na temat „Dispersive X-ray”

Autor: Grafiati

Data publikacji: 3 czerwca 2025

Data aktualizacji: 31 lipca 2025

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1

Whallon, Joanne H., Stanley L. Flegler, and Karen L. Klomparens. "Energy-Dispersive X-Ray Microanalysis." BioScience 39, no. 4 (1989): 256–59. http://dx.doi.org/10.2307/1311163.

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2

Matsuo, Munetsugu, and Masayuki Okamoto. "Energy dispersive X-ray diffraction." Bulletin of the Japan Institute of Metals 28, no. 3 (1989): 208–12. http://dx.doi.org/10.2320/materia1962.28.208.

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3

Kämpfe, Bernd, Falk Luczak, and Bernd Michel. "Energy Dispersive X-Ray Diffraction." Particle & Particle Systems Characterization 22, no. 6 (2005): 391–96. http://dx.doi.org/10.1002/ppsc.200501007.

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4

Huang, X. R., A. T. Macrander, M. G. Honnicke, Y. Q. Cai, and Patricia Fernandez. "Dispersive spread of virtual sources by asymmetric X-ray monochromators." Journal of Applied Crystallography 45, no. 2 (2012): 255–62. http://dx.doi.org/10.1107/s0021889812003366.

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The principles of the virtual source spread (spatial broadening) phenomenon induced by angular dispersion in asymmetric X-ray Bragg reflections are illustrated, from which the virtual source properties are analyzed for typical high-resolution multiple-crystal monochromators, including inline four-bounce dispersive monochromators, back-reflection-dispersion monochromators and nondispersive nested channel-cut monochromators. It is found that dispersive monochromators can produce spread virtual sources of a few millimetres in size, which may prevent efficient microfocusing of the beam as required

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5

Chin, D. A., P. M. Nilson, D. Mastrosimone, et al. "High-resolution x-ray spectrometer for x-ray absorption fine structure spectroscopy." Review of Scientific Instruments 94, no. 1 (2023): 013101. http://dx.doi.org/10.1063/5.0125712.

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Two extended x-ray absorption fine structure flat crystal x-ray spectrometers (EFX’s) were designed and built for high-resolution x-ray spectroscopy over a large energy range with flexible, on-shot energy dispersion calibration capabilities. The EFX uses a flat silicon [111] crystal in the reflection geometry as the energy dispersive optic covering the energy range of 6.3–11.4 keV and achieving a spectral resolution of 4.5 eV with a source size of 50 μm at 7.2 keV. A shot-to-shot configurable calibration filter pack and Bayesian inference routine were used to constrain the energy dispersion re

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6

Donges, Jörn, André Rothkirch, Thomas Wroblewski, et al. "Energy Dispersive X-Ray Diffraction Imaging." Materials Science Forum 772 (November 2013): 21–25. http://dx.doi.org/10.4028/www.scientific.net/msf.772.21.

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Position resolved structural information from polycrystalline materials is usually obtained via micro beam techniques illuminating only a single spot of the specimen. Multiplexing in reciprocal space is achieved either by the use of an area detector or an energy dispersive device. Alternatively spatial information may be obtained simultaneously from a large part of the sample by using an array of parallel collimators between the sample and a position sensitive detector which suppresses crossfire of radiation scattered at different positions in the sample. With the introduction of an X-ray came

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7

Harding, G., M. Newton, and J. Kosanetzky. "Energy-dispersive X-ray diffraction tomography." Physics in Medicine and Biology 35, no. 1 (1990): 33–41. http://dx.doi.org/10.1088/0031-9155/35/1/004.

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8

Gog, T., A. Hille, D. Bahr, and G. Materlik. "Dispersive x‐ray standing wave measurements." Review of Scientific Instruments 66, no. 2 (1995): 1522–24. http://dx.doi.org/10.1063/1.1145897.

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9

Kirkland, J. P., V. E. Kovantsev, C. M. Dozier, et al. "Wavelength‐dispersive x‐ray fluorescence detector." Review of Scientific Instruments 66, no. 2 (1995): 1410–12. http://dx.doi.org/10.1063/1.1145924.

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10

Tsuji, Kouichi, Takashi Ohmori, and Makoto Yamaguchi. "Wavelength Dispersive X-ray Fluorescence Imaging." Analytical Chemistry 83, no. 16 (2011): 6389–94. http://dx.doi.org/10.1021/ac201395u.

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11

Webster, J., R. Ninan, and B. Ganly. "Energy-position dispersive X-ray fluorescence." Acta Crystallographica Section A Foundations and Advances 79, a2 (2023): C1139. http://dx.doi.org/10.1107/s2053273323084826.

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12

Fischer, K. F., and H. G. Krane. "Energy-dispersive x-ray laue measurements with anomalous dispersion effects." Zeitschrift f�r Physik B Condensed Matter 61, no. 1 (1985): 57–61. http://dx.doi.org/10.1007/bf01308942.

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13

Gogolev, Aleksey, Yury Cherepennikov, Roman Rezaev, and Andrey Ogrebo. "Monochromatic X-Ray Source for Dual-Wave X-Ray Absorptiometry." Advanced Materials Research 1084 (January 2015): 252–55. http://dx.doi.org/10.4028/www.scientific.net/amr.1084.252.

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This work considers the existing approaches and devices for the composition analysis of multiphase medium are considered. A new technique for analyzing three-phase mediums based on the wave dispersive analysis of radiation is proposed. The fluxes of a multiphase fluid, composite materials, etc. can act as the mediums. Preliminary estimates show that the sensitivity is about 0.25% of the oil content in water and 1% of the content of gas.

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14

Plotnick, Roy E. "X-ray analysis using energy dispersive and wavelength dispersive spectroscopy." Paleontological Society Special Publications 4 (1989): 179–85. http://dx.doi.org/10.1017/s2475262200005116.

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Scanning electron microscopy has long been used by paleontologists for the detailed morphological study of fossil organisms. Often, however, as in studies of growth or diagenesis, the researcher is also interested in the chemical composition of the specimen. Traditional methods of chemical analysis, such as “wet” chemistry or atomic absorption, require destructive preparation (crushing, grinding, solution) and provide only bulk chemical analyses; there is no measure of the spatial distribution of elements.

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15

Chambers, William F., and Joe H. Doyle. "Computer-Assisted Wavelength-Dispersive X-Ray Mapping." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 240–41. http://dx.doi.org/10.1017/s0424820100134806.

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Elemental x-ray maps frequently provide one of the best ways to display compositional gradients and inhomogeneities in a sample. Two problems consistently plague the effective use of elemental x-ray mapping: Proper exposure and the maintenance of x-ray focus. Solutions applicable to Cameca MBX microprobes have been previously reported. These solutions involved aligning the X-axis of the electron beam raster parallel to the insensitive axis of the analyzing crystal and synchronously scanning the spectrometer with the Y-axis of the electron beam raster to maintain x-ray focus. The ability of the

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16

Lane, David W., Antony Nyombi, and James Shackel. "Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system." Journal of Applied Crystallography 47, no. 2 (2014): 488–94. http://dx.doi.org/10.1107/s1600576714000314.

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A method for energy-dispersive X-ray diffraction mapping is presented, using a conventional low-power benchtop X-ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X-ray maps with a 10 µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X-rays. The maps showed that the crystallites in the Bi pellet were larger th

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17

McCarthy, Jon J., and David J. McMillan. "Application of X-ray Optics to Energy-Dispersive Spectroscopy." Microscopy and Microanalysis 4, no. 6 (1998): 632–41. http://dx.doi.org/10.1017/s1431927698980618.

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X-ray optics have been used in X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy. X-ray optics have been used to increase the X-ray flux incident on the sample or to direct and focus emitted X-rays from a sample. We report here the use of a grazing incidence optic (GIO) as a flux-enhancing collimator for use with an energy-dispersive (ED) detector used to perform electron beam microanalysis. We found that the GIO in combination with an ED spectrometer (EDS) provides su

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18

McCarthy, J. J., and D. J. McMillan. "Application of X-Ray Optics to Energy Dispersive Spectroscopy." Microscopy and Microanalysis 4, S2 (1998): 178–79. http://dx.doi.org/10.1017/s1431927600021012.

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The application of x-ray optics for focusing x-rays into high intensity spots or for collimation of x-ray beams has been reported by several authors. Example applications for x-ray optics include microfluorescence, microdiffraction, tomography and lithography, and WDS. Kirkland et al. pointed out that the use of an optic, in a collimating configuration could provide enhanced detection sensitivity in wavelength dispersive spectroscopy. In these proceedings last year, Agnello et al. presented data from a new WDS device specifically designed to use a grazing incidence collimating x-ray optic that

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19

Blank, H., B. Neff, St Steil, and J. Hormes. "A new energy dispersive x‐ray monochromator for soft x‐ray applications." Review of Scientific Instruments 63, no. 1 (1992): 1334–37. http://dx.doi.org/10.1063/1.1143062.

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20

Newbury, Dale E., and David S. Bright. "X-Ray Mapping with Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry in the Scanning Electron Microscope: a Tutorial." Microscopy and Microanalysis 5, S2 (1999): 518–19. http://dx.doi.org/10.1017/s1431927600015919.

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X-ray mapping is one of the most popular modes for displaying information obtained with x-ray spectrometry performed in the scanning electron microscope. This popularity arises from the ready accessibility and apparent simplicity of information presented in a pictorial fashion, especially when used in conjunction with other SEM imaging modes, such as backscattered, secondary, and specimen current electron images. Further, the rise of powerful, inexpensive computer systems capable of image processing and display has given the analyst a dedicated, on-line tool with the capacity and flexibility n

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21

Gurker, N. "Imaging Techniques for X-Ray Fluorescence and X-Ray Diffraction." Advances in X-ray Analysis 30 (1986): 53–65. http://dx.doi.org/10.1154/s0376030800021145.

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Electron induced X-ray mapping together with modern SEM/EDX analysis systems has reached a high level of perfection due to established methods of beam deflection and focusing and today's standard in energy dispersive X-ray detection and data processing. X-ray analysis of specimens based on X-ray excitation (XRF/XRD) is routinely performed on comparatively large specimen areas without conserved spatial information. XRF-/XRD-imaging capabilities are not yet commonly available on standard spectrometers, since both suitable X-ray optical elements are missing and there is a large intensity loss due

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22

Remond, G., R. Myklebust, M. Fialin, C. Nockolds, M. Phillips, and C. Roques-Carmes. "Decomposition of wavelength dispersive x-ray spectra." Journal of Research of the National Institute of Standards and Technology 107, no. 6 (2002): 509. http://dx.doi.org/10.6028/jres.107.044.

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23

Firsov, A., A. Erko, F. Senf, et al. "Novel wavelength-dispersive X-ray fluorescence spectrometer." Journal of Physics: Conference Series 425, no. 15 (2013): 152013. http://dx.doi.org/10.1088/1742-6596/425/15/152013.

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24

Cox, G. A. "Fundamentals of Energy Dispersive X-ray Analysis." Physics Bulletin 36, no. 8 (1985): 349. http://dx.doi.org/10.1088/0031-9112/36/8/028.

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25

Hall, C., P. Barnes, J. K. Cockcroft, et al. "Synchrotron energy-dispersive X-ray diffraction tomography." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 140, no. 1-2 (1998): 253–57. http://dx.doi.org/10.1016/s0168-583x(97)00994-4.

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26

Kramar, Utz. "Advances in energy-dispersive X-ray fluorescence." Journal of Geochemical Exploration 58, no. 1 (1997): 73–80. http://dx.doi.org/10.1016/s0375-6742(96)00053-2.

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27

Hollerith, C., D. Wernicke, M. Bühler, et al. "Energy dispersive X-ray spectroscopy with microcalorimeters." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 520, no. 1-3 (2004): 606–9. http://dx.doi.org/10.1016/j.nima.2003.11.327.

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28

Reid, J. S., and S. G. Clackson. "Energy-dispersive diffuse X-ray scattering apparatus." Journal of Applied Crystallography 25, no. 2 (1992): 244–50. http://dx.doi.org/10.1107/s0021889891012116.

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A design is presented of apparatus suitable for energy-dispersive diffuse X-ray scattering in which the sample is oriented on a three-circle cradle within a vacuum chamber. The apparatus alignment procedures are discussed and a method given for finding the relevant orientation matrix under the conditions of Laue scattering to a fixed detector. The method also finds the zero positions of the orienter and is not confined to diffuse-scattering applications.

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29

Higginbotham, Andrew, Shamim Patel, James A. Hawreliak, et al. "Single photon energy dispersive x-ray diffraction." Review of Scientific Instruments 85, no. 3 (2014): 033906. http://dx.doi.org/10.1063/1.4867456.

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30

Rindby, A. "Software for energy-dispersive X-ray fluorescence." X-Ray Spectrometry 18, no. 3 (1989): 113–18. http://dx.doi.org/10.1002/xrs.1300180308.

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31

Sun, Tianxi, Meirong Zhang, Xunliang Ding, Zhiguo Liu, Xiaoyan Lin, and Hui Liu. "Characterization of polycapillary X-ray lens for application in confocal three-dimensional energy-dispersive micro X-ray diffraction experiments." Journal of Applied Crystallography 40, no. 6 (2007): 1169–73. http://dx.doi.org/10.1107/s0021889807048285.

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A confocal technology based on polycapillary X-ray optics is proposed to perform three-dimensional energy-dispersive micro X-ray diffraction. A three-dimensional energy-dispersive micro X-ray diffractometer based on a polycapillary focusing X-ray lens (PFXRL) in the excitation channel and a polycapillary parallel X-ray lens (PPXRL) in the detection channel has been designed. At 2\theta = 90^ \circ, the lateral resolution l_X \times l_Y of this diffractometer is 49.7 \times 49.9 \rm \micro m at 7.5 keV, and its depth resolution d_Z is 48.1 \rm \micro m at 8.0 keV. The total resolution of this d

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32

Hayakawa, Shinjiro, Shunji Goto, Takashi Shoji, Eiji Yamada, and Yohichi Gohshi. "X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU." Journal of Synchrotron Radiation 5, no. 3 (1998): 1114–16. http://dx.doi.org/10.1107/s090904959701892x.

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An X-ray microprobe system for X-ray fluorescence (XRF) analysis and spectroscopy has been developed at SPring-8 BL39XU; it comprises an X-ray focusing or collimation system, energy-dispersive (ED) and wavelength-dispersive (WD) XRF spectrometers, and a sample-scanning system. The conventional ED spectrometer will be utilized for qualitative and quantitative trace-element analysis, and the WD spectrometer will be used both for trace-element analysis and XRF spectroscopy. A combination of monochromated undulator radiation and the WD spectrometer will enable resonant XRF spectroscopy using brill

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33

Gorenstein, Paul. "Focusing X-Ray Optics for Astronomy." X-Ray Optics and Instrumentation 2010 (December 27, 2010): 1–19. http://dx.doi.org/10.1155/2010/109740.

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Focusing X-ray telescopes have been the most important factor in X-ray astronomy’s ascent to equality with optical and radio astronomy. They are the prime tool for studying thermal emission from very high temperature regions, non-thermal synchrotron radiation from very high energy particles in magnetic fields and inverse Compton scattering of lower energy photons into the X-ray band. Four missions with focusing grazing incidence X-ray telescopes based upon the Wolter 1 geometry are currently operating in space within the 0.2 to 10 keV band. Two observatory class missions have been operating si

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34

Pańczyk, Ewa, Bożena Sartowska, Lech Waliś, Jakub Dudek, Władysław Weker, and Maciej Widawski. "The origin and chronology of medieval silver coins based on the analysis of chemical composition." Nukleonika 60, no. 3 (2015): 657–63. http://dx.doi.org/10.1515/nuka-2015-0108.

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Abstract Medieval Central Europe coins - the Saxon coins, also called as the Otto and Adelheid denarii, as well as the Polish ones, the Władysław Herman and Bolesław Śmiały coins - were examined to determine their provenance and dating. Their attribution and chronology often constitute a serious problem for historians and numismatists. For hundreds of years, coins were in uncontrolled conditions and in variable environment. Destructed and inhomogeneous surface were the effect of corrosion processes. Electron microscopy with energy dispersive X-ray analysis (scanning electron microscopy with en

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35

Duan Zeming, 段泽明, 姜其立 Jiang Qili, 刘俊 Liu Jun, 潘秋丽 Pan Qiuli, and 程琳 Cheng Lin. "Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing." Acta Optica Sinica 38, no. 12 (2018): 1230002. http://dx.doi.org/10.3788/aos201838.1230002.

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36

Inagaki, Manabu, Yasushi Hayakawa, Kyoko Nogami, et al. "Wavelength Dispersive X-ray Absorption Fine Structure Imaging by Parametric X-ray Radiation." Japanese Journal of Applied Physics 47, no. 10 (2008): 8081–86. http://dx.doi.org/10.1143/jjap.47.8081.

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Hailey, C. J., J. H. Lupton, O. H. W. Siegmund, R. E. Stewart, and K. P. Ziock. "An x‐ray image intensifier system for precision wavelength dispersive x‐ray spectroscopy." Review of Scientific Instruments 61, no. 8 (1990): 2121–26. http://dx.doi.org/10.1063/1.1141378.

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38

Wollman, D. A., Dale E. Newbury, G. C. Hilton, et al. "Microcalorimeter EDS Measurements of Chemical Shifts in Fe Compounds." Microscopy and Microanalysis 4, S2 (1998): 196–97. http://dx.doi.org/10.1017/s1431927600021103.

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We report measurements of chemical shifts in the Fe-L x-ray lines of different Fe compounds from xray emission spectra acquired using a microcalorimeter energy dispersive spectrometer (EDS). The observed changes in peak position and relative intensity of the Fe-L x-ray lines are in agreement with measurements obtained using a wavelength dispersive spectrometer (WDS), demonstrating the usefulness of microcalorimeter EDS for high-energy-resolution x-ray microanalysis.Chemical shifts result from changes in electron binding energies with the chemical environment of atoms. In x-ray spectra, chemica

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39

Aquila, I., S. Boca, P. Ricci, et al. "The use of scanning electron microscopy and energy dispersive X-ray spectroscopy in a case of occupational death." Medico-Legal Journal 88, no. 3 (2020): 163–68. http://dx.doi.org/10.1177/0025817219891085.

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Scanning electron microscopy is a technique that provides high-resolution images at the micro- and nano-scale. The combination of scanning electron microscopy and energy dispersive X-ray spectroscopy analysis is developing fast for application in forensic science. In this work, we report a case of work-related traumatic death of a 50-year-old man. The autopsy showed cranial fractures with cerebral haemorrhage. It was more difficult to understand the accident dynamics because the body had been shifted from the accident site to mask what had really taken place. Scanning electron microscopy/energ

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40

Rémond, Guy. "Spectral Deconvolution of Wavelength Dispersive X-RAY Spectra." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 112–13. http://dx.doi.org/10.1017/s0424820100134156.

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X-ray peaks frequently exhibit asymmetrical shape which may result either from the mechanisms of generation of X-ray photons or from instrumental spectral distortions. As a result a non-proportionality may occur between the observed and the true intensities of the analyzed emissions. An analytical description of the shape of an X-ray line must be used in a least-squares fitting procedure in order to derive the relative intensities from experimental spectra. The available models will be discussed taking into account the analyzed energy domain and the energy resolution of the spectrometer respec

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41

MATASSA, ROBERTO, PAOLO BALLIRANO, MARIA PIA DONZELLO, CLAUDIO ERCOLANI, CLAUDIA SADUN та RUGGERO CAMINITI. "A NANOSTRUCTURED POLYMORPH OF μ-OXOBIS(PHTHALOCYANINATOIRON(III)) STUDIED BY ANGULAR AND ENERGY DISPERSIVE X-RAY DIFFRACTION". Nano 02, № 02 (2007): 121–28. http://dx.doi.org/10.1142/s1793292007000398.

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A new approach of X-ray diffraction was used to investigate the nanostructured μ-Oxo(2) polymorph of μ-oxo-bis(phthalocyaninatoiron(III)), [ PcFe – O – FePc ]. The packing of the dinuclear units was determined by the Rietveld method on Angular Dispersive X-ray Diffraction (ADXD) data, whereas the intramolecular geometry was optimized by Energy Dispersive X-ray Diffraction (EDXD) exploiting the peculiar strength of those techniques. The dimension of the nanoparticles was estimated from the Fourier transform of the EDXD experimental structural function.

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42

Newbury, Dale E. "Electron probe x-ray microanalysis with energy-dispersive x-ray spectrometry: The basics of x-ray spectrum interpretation." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 376–77. http://dx.doi.org/10.1017/s0424820100169614.

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Electron probe x-ray microanalysis (EPMA) with energy dispersive x-ray spectrometry (EDS) provides the capability for detecting elements with atomic number ≥ 4 (beryllium) from an excited specimen volume with linear dimensions of micrometers and a mass in the picogram range. To maximize the utility of EPMA/EDS, the analyst needs to understand the rich source of information that is potentially available in the x-ray spectrum. At its most basic level, interpretation of the spectrum consists of recognizing and identifying the various components of the spectrum as recorded by the EDS system: chara

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43

Hagenmayer, R. M., P. Lamparter, and S. Steeb. "X-Ray Diffraction with Molten AuxMn100-x-Alloys." Zeitschrift für Naturforschung A 50, no. 9 (1995): 831–36. http://dx.doi.org/10.1515/zna-1995-0907.

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Abstract The molten alloys Au28.5Mn71.5 and Au68Mn32 are investigated with the energy dispersive X-ray diffraction method which works rather fast so that the evaporation loss of Mn from the molten alloys is kept low. From the observed prepeak follows that both melts are compound-forming but the gold rich melt Au68Mn32 shows only 50% of the short range order existent within the Au28.5Mn71.5 melt. Total structure factors and total pair correlation functions are discussed.

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Steel, E. B., R. B. Marinenko, and R. L. Myklebust. "Quality Assurance of Energy Dispersive Spectrometry Systems." Microscopy and Microanalysis 3, S2 (1997): 903–4. http://dx.doi.org/10.1017/s1431927600011405.

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Monitoring the performance capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for determining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. In addition, there is a growing popularity of quality systems through laboratory accreditation and ISO 9000 related programs that require set quality control procedures for analytical instrumentation. Having similar standard procedures amongst labs would allow direct intercomparison of results. This intercomparison would help labs and manufact

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Huang, Juanjuan, Adam P. Tornheim, Xianbo Shi, et al. "Dispersive X-ray absorption spectroscopy using independent grazing-incidence focusing and convexly bent Bragg-crystal dispersing optics." Journal of Synchrotron Radiation 32, no. 4 (2025): 1068–84. https://doi.org/10.1107/s1600577525004953.

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We present a modular instrument for dispersive X-ray absorption spectroscopy (DXAS) developed for the Advanced Spectroscopy Beamline at Sector 25 of the Advanced Photon Source. The setup employs a double-multilayer monochromator to provide X-rays with a broad energy bandwidth, Kirkpatrick–Baez mirrors for focusing, a convexly bent Bragg-crystal polychromator for energy dispersion, and a pixel-array detector to resolve all X-ray energies and collect their intensity simultaneously, thereby enabling acquisition of a full X-ray absorption spectrum in a single shot. The use of separate optics for X

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Dent, A. J., M. P. Wells, R. C. Farrow, et al. "Combined energy dispersive EXAFS and x‐ray diffraction." Review of Scientific Instruments 63, no. 1 (1992): 903–6. http://dx.doi.org/10.1063/1.1143774.

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Alonso-Mori, Roberto, Jan Kern, Dimosthenis Sokaras, et al. "A multi-crystal wavelength dispersive x-ray spectrometer." Review of Scientific Instruments 83, no. 7 (2012): 073114. http://dx.doi.org/10.1063/1.4737630.

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Sanyal, M. K., V. C. Sahni, and G. P. Das. "A Microprocessor Based Energy Dispersive X-Ray Diffractometer." Instrumentation Science & Technology 16, no. 2 (1987): 281–94. http://dx.doi.org/10.1080/10739148708543643.

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Aiginger, H., M. Benedikt, and R. Görgl. "Energy Dispersive Measurement of X-Ray Tube Spectra." Advances in X-ray Analysis 39 (1995): 137–47. http://dx.doi.org/10.1154/s0376030800022540.

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A method for measuring spectral distributions of x-ray tubes directly with a solid-state detector is presented. Different anode materials (chromium, molybdenum, rhodium and tungsten) have been measured. Results for various applied voltages and take-off angles have been obtained.

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Yuan, Lixiang. "Soft x-ray phase modulation multilayer dispersive element." Optical Engineering 34, no. 5 (1995): 1508. http://dx.doi.org/10.1117/12.201632.

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