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Gotowe bibliografie tematyczne / Electron microscope

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Gotowa bibliografia na temat „Electron microscope”

Autor: Grafiati

Data publikacji: 4 czerwca 2021

Data aktualizacji: 25 lipca 2025

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Artykuły w czasopismach na temat "Electron microscope"

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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen

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KONNO, Mitsuru, Toshie YAGUCHI, and Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope." Journal of the Japan Society of Colour Material 79, no. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.

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Watson, John H. L. "In the beginning there were electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.

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Electrons have undoubtedly been around since the beginning of time, but not until the first quarter of the twentieth century, following the work of deBroglie on the dual nature of the electron, Busch's hypothesis that an electron beam could be focussed by an axially symmetric magnetic field, and Davisson & Germer's and Thomson's independent demonstrations of electron diffraction, did microscopists take seriously the possibility of a microscope utilizing electrons and magnetic fields. The first attempts at building electron microscopes were made in Europe but the resolution in the often blu

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Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.

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Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both

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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not

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Rozprawy doktorskie na temat "Electron microscope"

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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.

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Martin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.

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Duckett, Gordon Richard. "Electron microscope studies of organic pigments." Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.

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Skoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.

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Tato práce se zabývá možnostmi kvantitativního zobrazování ve skenovacím (transmisním) elektronovém mikroskopu (S|T|EM) společně s jejich korelativní aplikací. Práce začíná popisem metody kvantitativního STEM (qSTEM), kde lze stanovenou lokální tloušťku vzorku dát do spojitosti s ozářenou dávkou, a vytvořit tak studii úbytku hmoty. Tato metoda byla použita při studiu ultratenkých řezů zalévací epoxidové pryskyřice za různých podmínek (stáří, teplota, kontrastování, čištění pomocí plazmy, pokrytí uhlíkem, proud ve svazku). V rámci této části jsou diskutovány a demonstrovány možnosti kalibračníh

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Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

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Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K, I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic

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Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope." Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.

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Johnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.

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<p>The technique of Nanoindentation <em>in situ</em> Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (<em>α-Al</em><em>2</em><em>O</em><em>3</em>) cut from wafers; Cr/Sc multilayers and <em>Ti</em><em>3</em><em>SiC</em><em>2</em> thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and

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Lyster, Martin. "Electron microscope studies of cadmium mercury telluride." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.

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Dellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.

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Christensen, K. N. "Electron microscope studies of oxygen implanted silicon." Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.

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Książki na temat "Electron microscope"

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Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. Academic, 1990.

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Champness, P. E. Electron diffraction in the transmission electron microscope. BIOS Scientific Publishers, 2001.

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Hayat, M. A. Basic techniques for transmission electron microscopy. Academic Press, 1985.

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Reimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Springer, 1998.

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J, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Elsevier, 1985.

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Tomb, Howard. Microaliens: Dazzling journeys with an electron microscope. Farrar, Straus and Giroux, 1993.

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Egerton, Ray F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-6887-2.

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Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-5099-7.

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Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-9583-4.

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Egerton, R. F. Electron energy-loss spectroscopy in the electron microscope. 2nd ed. Plenum Press, 1996.

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Części książek na temat "Electron microscope"

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Gooch, Jan W. "Electron Microscope." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.

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Weik, Martin H. "electron microscope." In Computer Science and Communications Dictionary. Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.

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Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-642-35950-7_6595-4.

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Staufer, U., L. P. Muray, D. P. Kern, and T. H. P. Chang. "Miniaturized Electron Microscope." In Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1729-6_9.

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Dijkstra, Jeanne, and Cees P. de Jager. "Electron Microscope Serology." In Practical Plant Virology. Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72030-7_59.

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Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6595.

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Gooch, Jan W. "Scanning Electron Microscope." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_10317.

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Mitome, Masanori. "Transmission Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_124.

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Kinoshita, Toyohiko. "Photoemission Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_76.

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Schmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6595.

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Streszczenia konferencji na temat "Electron microscope"

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Arend, Germaine, Armin Feist, Guanhao Huang, et al. "Coupling Free Electrons and Cavity Photons in a Transmission Electron Microscope." In CLEO: Applications and Technology. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_at.2024.jth4n.4.

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We couple free electrons to the optical modes of a photonic microring resonator. Inelastic electron scattering leads to the generation of cavity photons, correlated to the electrons in time and energy loss.

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Milner, R., and M. W. Phaneuf. "Comparative Carburization of Heat Resistant Alloys." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98431.

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Abstract Two high strength, centrifugally cast heat resistant materials were examined under near identical pack carburizing conditions. The first material represented an alloy class which is becoming the most popular for replacement coils in ethylene pyrolysis furnaces due to its large improvement in carburization resistance over HP based alloys. The second material represented the next generation of alloys to be used for this purpose. Additionally, several investigative techniques were employed to illustrate some of the strengths and weaknesses of each technique. A recent advance in microscop

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Kuzyk, Casimir, Alexander Dimitrakopoulos, R. Fabian Pease, and Alireza Nojeh. "Compact and Low-Cost Scanning Electron Microscope." In 2024 37th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2024. http://dx.doi.org/10.1109/ivnc63480.2024.10652416.

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Little, Brenda J., Robert K. Pope, Tyrone L. Daulton, and Richard I. Ray. "Application of Environmental Cell Transmission Electron Microscopy to Microbiologically Influenced Corrosion." In CORROSION 2001. NACE International, 2001. https://doi.org/10.5006/c2001-01266.

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Abstract The spatial/chemical relationship between bacteria, their biofilms, and metal substrata was examined in an environmental cell transmission electron microscope equipped with an energy loss spectrometer. The advantage of environmental cell transmission electron microscopy is that unfixed, hydrated specimens can be examined, in more or less their natural state, with high spatial resolution.

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Yatagai, Toyohiko, Katsuyuki Ohmura, and Shigeo Iwasaki. "Phase sensitive analysis of electron holograms." In Holography. Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.

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Holography has been used in electron microscopy since the field emission electron microscope was developed.[1] Tonomura et al described the interference microscope based on the electron holography to evaluate microscopic distribution of the magnetic field. [2] To gain high sensitivity the use of the optical phase multiplication technique was discussed so as to obtain 10 time magnification of the reconstructed phase. [3] Recently Takeda et al applied the FFT method of the subfringe analysis for electron holographic fringes.[4] They mentioned phase variations much smaller than 2 π could be detec

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Larionov, Yu V., and Yu A. Novikov. "Virtual scanning electron microscope." In International Conference on Micro-and Nano-Electronics 2012, edited by Alexander A. Orlikovsky. SPIE, 2013. http://dx.doi.org/10.1117/12.2016977.

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Postek, Michael T. "Scanning electron microscope metrology." In Critical Review Collection. SPIE, 1994. http://dx.doi.org/10.1117/12.187461.

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Mačák, Martin. "Electrohydrodynamic Model Of Electron Microscope." In STUDENT EEICT 2021. Fakulta elektrotechniky a komunikacnich technologii VUT v Brne, 2021. http://dx.doi.org/10.13164/eeict.2021.209.

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Krysztof, Michał, Marcin Białas, and Tomasz Grzebyk. "Imaging Using Mems Electron Microscope." In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188948.

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Krysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza, and Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope." In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.

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Raporty organizacyjne na temat "Electron microscope"

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/6000131.

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Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), 1992. http://dx.doi.org/10.2172/7015892.

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Kenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5356814.

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Ren, Z. F. Purchase of Transmission Electron Microscope. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada392051.

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Hadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada388472.

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Stirling, J. A. R., and G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.

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Marder, A., K. Barmak, and D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/676882.

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Collins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler, and Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1331925.

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Fraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Defense Technical Information Center, 1987. http://dx.doi.org/10.21236/ada189111.

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Ruggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), 1993. http://dx.doi.org/10.2172/6854553.

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