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Artykuły w czasopismach na temat „Electron microscope”

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Data publikacji: 4 czerwca 2021

Data aktualizacji: 25 lipca 2025

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1

Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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2

Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three l

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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.

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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic poten

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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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O'Keefe, Michael A., John H. Turner, John A. Musante, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implemen

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KONNO, Mitsuru, Toshie YAGUCHI, and Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope." Journal of the Japan Society of Colour Material 79, no. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.

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Watson, John H. L. "In the beginning there were electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.

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Electrons have undoubtedly been around since the beginning of time, but not until the first quarter of the twentieth century, following the work of deBroglie on the dual nature of the electron, Busch's hypothesis that an electron beam could be focussed by an axially symmetric magnetic field, and Davisson & Germer's and Thomson's independent demonstrations of electron diffraction, did microscopists take seriously the possibility of a microscope utilizing electrons and magnetic fields. The first attempts at building electron microscopes were made in Europe but the resolution in the often blu

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8

Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.

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Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both

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9

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcomin

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10

Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.

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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not

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11

Kersker, Michael M. "A History of ESEM in 2.5 Chapters." Microscopy and Microanalysis 7, S2 (2001): 774–75. http://dx.doi.org/10.1017/s1431927600029949.

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Microscopy has always been concerned with the observation of samples in their natural states. The earliest instruments, optical microscopes, did not interfere with the samples which were under observation due to the pervasive presence of visible light in the normal evolution of these entities. Man and science persisted in this direction until Ruska in 1933 invented the electron microscope and the real world changed forever (see MSA Rudenberg for an enlightening description of the early days of man's understanding of the electron and the subsequent invention of the electron microscope). The ear

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12

Dahmen, Ulrich, Rolf Erni, Velimir Radmilovic, Christian Ksielowski, Marta-Dacil Rossell, and Peter Denes. "Background, status and future of the Transmission Electron Aberration-corrected Microscope project." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 367, no. 1903 (2009): 3795–808. http://dx.doi.org/10.1098/rsta.2009.0094.

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The strong interaction of electrons with small volumes of matter make them an ideal probe for nanomaterials, but our ability to fully use this signal in electron microscopes remains limited by lens aberrations. To bring this unique advantage to bear on materials research requires a sample space for electron scattering experiments in a tunable electron-optical environment. This is the vision for the Transmission Electron Aberration-corrected Microscope (TEAM) project, which was initiated as a collaborative effort to re-design the electron microscope around aberration-correcting optics. The resu

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13

Ai, R. "A Microscope-Compatible Auger Electron Spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.

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With the recent development of ultra-high vacuum high resolution electron microscopes (UHV-HREM), electron microscopes have become valuable tools for surface studies. Techniques such as surface profile image, surface sensitive plane view, and reflection electron microscopy have been developed to take full advantage of the atomic resolution of HREM to study surface structures. However a complete surface study requires information on both the surface structure and surface chemistry. Therefore in order to turn an electron microscope into a real surface analytical tool, the challenge is to develop

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14

O’Keefe, M. A., J. Taylor, D. Owen, et al. "Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 384–85. http://dx.doi.org/10.1017/s0424820100164386.

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Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential tha

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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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Brama, Elisabeth, Christopher J. Peddie, Gary Wilkes, Yan Gu, Lucy M. Collinson, and Martin L. Jones. "ultraLM and miniLM: Locator tools for smart tracking of fluorescent cells in correlative light and electron microscopy." Wellcome Open Research 1 (December 13, 2016): 26. http://dx.doi.org/10.12688/wellcomeopenres.10299.1.

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In-resin fluorescence (IRF) protocols preserve fluorescent proteins in resin-embedded cells and tissues for correlative light and electron microscopy, aiding interpretation of macromolecular function within the complex cellular landscape. Dual-contrast IRF samples can be imaged in separate fluorescence and electron microscopes, or in dual-modality integrated microscopes for high resolution correlation of fluorophore to organelle. IRF samples also offer a unique opportunity to automate correlative imaging workflows. Here we present two new locator tools for finding and following fluorescent cel

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YAMAMOTO, Shinji, Kyohei UMEMOTO, and Ken-ichir YAMASHITA. "Electron Microscope." Journal of The Institute of Electrical Engineers of Japan 133, no. 5 (2013): 298–301. http://dx.doi.org/10.1541/ieejjournal.133.298.

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SATO, Mitsugu. "Electron Microscope." Journal of the Society of Mechanical Engineers 117, no. 1144 (2014): 142–43. http://dx.doi.org/10.1299/jsmemag.117.1144_142.

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Oikawa, Tetsuo. "Electron Microscope." Zairyo-to-Kankyo 41, no. 10 (1992): 690–97. http://dx.doi.org/10.3323/jcorr1991.41.690.

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing i

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21

Williams, Nicola. "Do Microscopes Have Politics? Gendering the Electron Microscope in Laboratory Biological Research." Technology and Culture 64, no. 4 (2023): 1159–83. http://dx.doi.org/10.1353/tech.2023.a910999.

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abstract: Objects like microscopes are gendered depending on their context. The introduction of the electron microscope at Leeds University in early 1940s Britain was under the control of high-status physicists, most of whom were men, who regulated its access over and against biologists. Moreover, the microscope required physical strength more associated with men than women, combined with a sound knowledge of physics. This article explores the challenges women encountered including access to scientific instruments when entering post–World War II electron microscopy through Irene Manton's caree

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Gauvin, Raynald, and Pierre Hovington. "On the Microanalysis of Small Precipitates at Low Voltage with a FE-SEM." Microscopy and Microanalysis 5, S2 (1999): 308–9. http://dx.doi.org/10.1017/s1431927600014860.

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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate th

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BAUM, RUDY. "Light microscope rivals electron microscope." Chemical & Engineering News 71, no. 35 (1993): 22–23. http://dx.doi.org/10.1021/cen-v071n035.p022.

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Ruska, Ernst. "The development of the electron microscope and of electron microscopy." Reviews of Modern Physics 59, no. 3 (1987): 627–38. http://dx.doi.org/10.1103/revmodphys.59.627.

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Ruska, Ernst. "The development of the electron microscope and of electron microscopy." Bioscience Reports 7, no. 8 (1987): 607–29. http://dx.doi.org/10.1007/bf01127674.

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-contro

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Kremer, James R., Paul S. Furcinitti, Eileen O’Toole, and J. Richard McIntosh. "Analysis of photographic emulsions for High-Voltage Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 452–53. http://dx.doi.org/10.1017/s0424820100148095.

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Characteristics of electron microscope film emulsions, such as the speed, the modulation transfer function, and the exposure dependence of the noise power spectrum, have been studied for electron energies (80-100keV) used in conventional transmission microscopy. However, limited information is available for electron energies in the intermediate to high voltage range, 300-1000keV. Furthermore, emulsion characteristics, such as optical density versus exposure, for new or improved emulsions are usually only quoted by film manufacturers for 80keV electrons. The need for further film emulsion studi

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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Kenik, Edward A., and Karren L. More. "SHaRE: Collaborative materials science research." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 804–5. http://dx.doi.org/10.1017/s0424820100106089.

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The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, tech

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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.

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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simu

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Prutton, M., M. M. El Gomati, J. C. Greenwood, P. G. Kennyr, I. R. Barkshire, and J. C. Dee. "Multispectral Surface Analytical Microscopy: A Third-Generation Scanning Auger Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 384–85. http://dx.doi.org/10.1017/s0424820100135526.

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The quantitative interpretation of scanning Auger electron microscope (SAM) images has been shown to require the use of multi-spectral imaging of the surface under study. In a multi-spectral analytical microscope (MULSAM) a set of maps (bands) is acquired from the same area of a sample using scattered electrons with different kinetic energies as well as other signals from the sample such as current flowing to ground, the conventional SEM signal and characteristic x-rays. The resulting set of bands is a multi-spectral image which can be processed using models of the electron scattering in the s

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Pan, M., K. Ishizuka, C. E. Meyer, O. L. Krivanek, J. Sasakit, and Y. Kimurat. "Progress in Computer Assisted Electron Microscopy." Microscopy and Microanalysis 3, S2 (1997): 1093–94. http://dx.doi.org/10.1017/s1431927600012356.

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All the lenses, deflectors and stigmators of contemporary electron microscopes are controlled digitally by an internal computer. Control through RS232 serial interface by an external computer has also become a standard feature. This external control has made so-called computer assisted electron microscopy (CAEM) possible and practical. We are developing a CAEM system with two objectives: (1) to free inexperienced microscopists from technical details of operating an electron microscope, especially transmission electron microscopes (TEM); (2) to assist experienced microscopists to operate their

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Gauvin, Raynald, and Paula Horny. "The Characterization of Nano Materials in the FE-SEM." Microscopy and Microanalysis 6, S2 (2000): 744–45. http://dx.doi.org/10.1017/s1431927600036217.

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The observation of nano materials or nano phases is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the last decade, a new generation of microscopes is available on the market. These are the Field Emission Scanning Electron Microscope (FE-SEM) with a virtual secondary electron detector. The FE-SEM have a higher brightness allowing probe diameter smaller than 2.5 nm with incident electron energy, E0, below 5 keV. Furthermore, what gives FE-SEM outstanding resolu

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Suga, Hiroshi, Takafumi Fujiwara, Nobuhiro Kanai, and Masatoshi Kotera. "Secondary Electron Image Contrast in the Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 410–11. http://dx.doi.org/10.1017/s042482010018080x.

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An image contrast given in the scanning electron microscope(SEM) is due to differences in a detected number of secondary electrons (SE) coming from the specimen surface. The difference arises from the topographic, compositional and voltage features at the specimen surface. Two kinds of approaches have been taken for the quantification of SE images. One is to simulate electron trajectories in vacuum toward the detector, assuming the typical angular and energy distributions of electrons emitted from the specimen surface. However, the typical angular and energy distributions are not always applic

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Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as su

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Geiger, Dorin, Hannes Lichte, Martin Linck, and Michael Lehmann. "Electron Holography with aCs-Corrected Transmission Electron Microscope." Microscopy and Microanalysis 14, no. 1 (2007): 68–81. http://dx.doi.org/10.1017/s143192760808001x.

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Cscorrectors have revolutionized transmission electron microscopy (TEM) in that they substantially improve point resolution and information limit. The object information is found sharply localized within 0.1 nm, and the intensity image can therefore be interpreted reliably on an atomic scale. However, for a conventional intensity image, the object exit wave can still not be detected completely in that the phase, and hence indispensable object information is missing. Therefore, for example, atomic electric-field distributions or magnetic domain structures cannot be accessed. Off-axis electron h

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Stevens Kalceff, M. A., M. R. Phillips, and A. R. Moon. "Cathodoluminescence Investigation of Electron Irradiation Damage in Insulators." Microscopy and Microanalysis 3, S2 (1997): 749–50. http://dx.doi.org/10.1017/s1431927600010631.

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Cathodoluminescence (CL) is the luminescent emission from a material which has been irradiated with electrons. Cathodoluminescence microanalysis (spectroscopy and microscopy) in an electron microscope complements the average defect structure information available from complementary techniques (e.g. Photoluminescence, Electron Spin Resonance spectroscopy). CL microanalysis enables both pre-existing and irradiation induced local variations in the bulk and surface defect structure to be characterized with high spatial (lateral and depth) resolution and sensitivity. This is possible as electron be

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Vidyavati and G. Sathaiah. "Cell division in desmids under scanning electron microscope." Archiv für Hydrobiologie 105, no. 2 (1989): 239–49. http://dx.doi.org/10.1127/archiv-hydrobiol/105/1989/239.

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Tomita, T., Y. Kokubo, Y. Harada, H. Daimon, and S. Ino. "Development of an Ultrahigh-Vacuum Ultrahigh-Resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 440–41. http://dx.doi.org/10.1017/s0424820100180951.

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An ultrahigh-vacuum (UHV) ultrahigh-resolution (UHR) 100kV scanning electron microscope with a UHV specimen preparation chamber has been developed for in situ observation of clean specimen surfaces. The measured vacuum in the specmen area was about 2.2 × 10-8 Pa, and a 0.14nm lattice image of Au (220) was observed.Field emission scanning electron microscopes have been developed for the past ten years for sub-nanometer analysis. However, in recent analytical electron microscopy of so-called “new materials” such as ceramics and semiconductors, half nanometer analysis in UHV has become extremely

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TONOMURA, Akira. "Holography Electron Microscope." Journal of the Japan Society for Precision Engineering 57, no. 7 (1991): 1165–68. http://dx.doi.org/10.2493/jjspe.57.1165.

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