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Artykuły w czasopismach na temat „Electron probe microanalysis EPMA”

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Data publikacji: 19 października 2024

Data aktualizacji: 31 lipca 2025

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1

Willich, Peter, and Kirsten Schiffmann. "Electron probe microanalysis of borophosphosilicate coatings." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 226–27. http://dx.doi.org/10.1017/s0424820100134739.

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Planarization and passivation of integrated circuits by use of borophosphosilicate glass (BPSG) is of considerable technological interest. BPSG is prepared by chemical vapour deposition and electron probe microanalysis (EPMA) offers the possibility of non-destructive characterization in respect of composition and film thickness. Particular difficulties of EPMA are due to the insulating character of BPSG in combination with the demand for analysis of ultra-light elements (B and O). However, EPMA of BPSG also demonstrates the accuracy of recent bulk and thin film data processing when based on re

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2

Lakis, Rollin E., Charles E. Lyman, and Joseph I. Goldstein. "Electron-probe microanalysis of porous materials." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1660–61. http://dx.doi.org/10.1017/s0424820100132935.

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Conventional electron probe microanalysis (EPMA) requires solid, flat-polished specimens, and similarly prepared standards of known composition. Unfortunately, an increasing number of technologically important materials are particulate in nature and contain significant porosity. Supported heterogeneous catalysts are an important example. Many catalysts of industrial importance consist of a number of active metals and promoters dispersed in a porous (50% theoretical density, 200 m2/g surface area) ceramic support material. It is of great practical interest to determine the concentration and pre

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3

Merlet, C., X. Llovet, S. Segui, J. M. Fernández-Varea, and F. Salvat. "Ionization Cross Sections for Quantitative Electron Probe Microanalysis." Microscopy and Microanalysis 7, S2 (2001): 672–73. http://dx.doi.org/10.1017/s1431927600029433.

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Quantitative procedures in electron probe microanalysis (EPMA) require the knowledge of various atomic parameters, the most fundamental of which is the ionization cross section. A number of semi-empirical, approximate analytical formulas have been proposed to calculate the ionization cross section. The simplicity of these formulas makes them suitable for quantitative EPMA procedures. However, it is difficult to assess their reliability because of the lack of accurate experimental data. Indeed, inspection of currently available data reveals that they are still scarce for many elements and, when

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4

Goresh, S. "Industrial Applications of Electron Probe Microanalysis (EPMA)." Microscopy and Microanalysis 17, S2 (2011): 616–17. http://dx.doi.org/10.1017/s1431927611003953.

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Somlyo, A. P., and Avril V. Somlyo. "Electron Probe Analysis and Cell Physiology." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 2–5. http://dx.doi.org/10.1017/s0424820100117169.

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Electron probe x-ray microanalysis (EPMA) of rapidly frozen tissues is a uniquely powerful method for dealing with a large class of general problems in cell physiology, as it is suitable for measuring, under direct vision, the elemental composition of cells and cell organelles. EPMA can reach a spatial resolution of at least 10nm, and its practically attainable sensitivity (for Ca) is 0.3mmol Ca/kg dry wt. Therefore, the composition of mitochondria and of other organelles, as small as the endoplasmic reticulum (ER), can be quantitated with EPMA. The most extensive applications of EPMA to cell

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6

Matthews, Mike B., Ben Buse, and Stuart L. Kearns. "Electron Probe Microanalysis Through Coated Oxidized Surfaces." Microscopy and Microanalysis 25, no. 05 (2019): 1112–29. http://dx.doi.org/10.1017/s1431927619014715.

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AbstractLow voltage electron probe microanalysis (EPMA) of metals can be complicated by the presence of a surface oxide. If a conductive coating is applied, analysis becomes one of a three-layer structure. A method is presented which allows for the coating and oxide thicknesses and the substrate intensities to be determined. By restricting the range of coating and oxide thicknesses, tc and to respectively, x-ray intensities can be parameterized using a combination of linear functions of tc and to. tc can be determined from the coating element k-ratio independently of the oxide thickness. to ca

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7

Ro, Chul-Un. "Quantitative energy-dispersive electron probe X-ray microanalysis of individual particles." Powder Diffraction 21, no. 2 (2006): 140–44. http://dx.doi.org/10.1154/1.2204068.

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An electron probe X-ray microanalysis (EPMA) technique using an energy-dispersive X-ray detector with an ultrathin window, designated low-Z particle EPM, has been developed. The low-Z particle EPMA allows the quantitative determination of concentrations of low-Z elements, such as C, N, and O, as well as higher-Z elements that can be analyzed by conventional energy-dispersive EPMA. The quantitative determination of low-Z elements (using full Monte Carlo simulations, from the electron impact to the X-ray detection) in individual environmental particles has improved the applicability of single-pa

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8

Somlyo, Avril V., and Andrew P. Somlyo. "Electron probe x-ray microanalysis of subcellular ion transport in situ." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 16–17. http://dx.doi.org/10.1017/s0424820100120485.

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Electron probe x ray microanalysis [EPMA] provides quantitative information within a single spectrum about elements of biological interest with atomic number of 11 or greater. Therefore, the transport of ions and their accompanying co and counter ions across organelle membranes can be studied in situ by sampling within and adjacent to the intracellular organelle of interest under resting and stimulated conditions.EPMA is based on the fact that the ionization of atoms by fast electrons generates x rays having energies characteristic of the excited atoms. The interaction of incident fast electro

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9

Robertson, Vernon. "What Are the Advantages of a FE-EPMA or FE-SEM (Even When Not Analyzing Submicron Features at Low kV and High Beam Current)?" Microscopy Today 31, no. 6 (2023): 10–16. http://dx.doi.org/10.1093/mictod/qaad080.

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Abstract Field emission electron probe microanalyzers (EPMA) and scanning electron microscopes (SEM) have improved in both the hardware and software. They have become workhorse instruments for imaging secondary (SE) and backscattered (BSE) electrons. Recent advancements in technology provide qualitative quantitative analysis and X-ray maps at lower kVs and higher beam current without significantly enlarging the beam diameter. On EPMAs and SEMs with W and LaB6 electron guns, spatial resolution for microanalysis was ∼1 micron. Now, with field emission (FE) guns, resolution of 300 nm for quantita

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10

Takahashi, Hideyuki, Toshiaki Suzuki, and Charles Nielsen. "Application Ofthinfilm Method to Electronic Probe Microanalysis (EPMA)." Microscopy and Microanalysis 7, S2 (2001): 686–87. http://dx.doi.org/10.1017/s1431927600029500.

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Usually, in electron probe microanalysis, the X-ray diffusion range is around lμm on the sample surface. For this reason, the maximum useful magnification of X-ray image seems to be limited to a few thousand times. The X-ray diffusion on the \im order takes place in the bulk sample. However, when a sample is cut to a thin film, it is likely that the X-ray diffusion range will be made smaller, and it is also possible to observe very a narrow area X-ray image at higher magnification. The thin film method is a sampling technique used often in transmission electron microscopy. The microtome method

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11

Salvat, F., L. Sorbier, X. Llovet, and E. Acosta. "X-Ray Microanalysis with Penelope." Microscopy and Microanalysis 7, S2 (2001): 688–89. http://dx.doi.org/10.1017/s1431927600029512.

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Monte Carlo simulation is a suitable tool for the numerical generation of x-ray spectra by electron beams and, more specifically, for the quantification in electron probe microanalysis (EPMA). in this communication we describe the application of the general-purpose code PENELOPE to EPMA. This code simulates electron-photon showers in complex material structures consisting of homogeneous regions of arbitrary composition limited by quadric surfaces. It is devised to cover a wide energy range (from ∼500 eV to about 1 GeV). The interaction models implemented in PENELOPE are based on the most relia

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12

Tan, Shuhui, Rencheng Li, Richard S. Vachula, et al. "Electron probe microanalysis of the elemental composition of phytoliths from woody bamboo species." PLOS ONE 17, no. 7 (2022): e0270842. http://dx.doi.org/10.1371/journal.pone.0270842.

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Electron probe microanalysis (EPMA) is promising for accurately determining elemental components in micro-areas of individual phytolith particles, interpreting compositional features and formation mechanisms of phytoliths in plants, identifying archeological and sedimental phytolith. However, the EPMA method of analyzing mounted slide phytoliths has not well been defined. In this study, we attempted different EPMA methods to determine the elemental compositions of phytoliths in mounted slides. Direct analysis of carbon (DAC) with other elements in phytolith could obtain abnormally high total v

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13

Rinaldi, Romano, and Xavier Llovet. "Electron Probe Microanalysis: A Review of the Past, Present, and Future." Microscopy and Microanalysis 21, no. 5 (2015): 1053–69. http://dx.doi.org/10.1017/s1431927615000409.

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AbstractThe 50th anniversary of the application of electron probe microanalysis (EPMA) to the Earth Sciences provides an opportunity for an assessment of the state-of-the-art of the technique. Stemming from the introduction of the first automated instruments, the latest developments of EPMA and some typical applications are reviewed with an eye to the future. The most noticeable recent technical achievements such as the field-emission electron gun, the latest generation of energy and wavelength dispersive spectrometers, and the development of analytical methods based on new sets of first princ

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14

Rehbach, Werner P., and Peter Karduck. "Quantitative electron probe microanalysis of high-Tc superconducting materials." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1768–69. http://dx.doi.org/10.1017/s0424820100133473.

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Since the discovery of ceramics with superconducting properties at rather high temperatures by Bednorz and Müller great effort has been made to find new super conducting materials and to optimize them. To achieve good superconducting properties single-phase compounds with well defined stoichiometry especially with regard to the oxygen content are needed. For the determination of these material properties several macroscopical or microscopical techniques are applied; one of these is the electron probe microanalysis (EPMA). However, most of the work by EPMA reported so far is restricted to the d

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15

Claus, Tamme, Jonas Bünger, and Manuel Torrilhon. "A Novel Reconstruction Method to Increase Spatial Resolution in Electron Probe Microanalysis." Mathematical and Computational Applications 26, no. 3 (2021): 51. http://dx.doi.org/10.3390/mca26030051.

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The spatial resolution of electron probe microanalysis (EPMA), a non-destructive method to determine the chemical composition of materials, is currently restricted to a pixel size larger than the volume of interaction between beam electrons and the material, as a result of limitations on the underlying k-ratio model. Using more sophisticated models to predict k-ratios while solving the inverse problem of reconstruction offers a possibility to increase the spatial resolution. Here, a k-ratio model based on the deterministic M1-model in Boltzmann Continuous Slowing-Down approximation (BCSD) will

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16

Somlyo, Andrew P. "The Impact of Biological Microanalysis on Analytical Electron Microscopy." Microscopy and Microanalysis 4, S2 (1998): 170–71. http://dx.doi.org/10.1017/s1431927600020973.

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Advances in energy-dispersive detector technology were largely responsible for electron probe microanalysis (EPMA) becoming a valuable tool for biologists, while development of EPMA received much impetus from the special needs of biological research. Solid-state energy-dispersive detectors placed in close proximity to specimens in transmission electron microscopes (TEMs) provided the necessary geometric detection efficiency, hence sensitivity and higher spatial resolution, and the reasonably good energy resolution of these detectors permitted reliable separation of overlapping peaks, such as t

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17

McGee, James J. "Progress in Electron-Probe Microanalysis of Boron in Geologic Samples." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 696–97. http://dx.doi.org/10.1017/s042482010016594x.

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Despite the availability of modern instrumentation with improved detection and correction systems, the analysis of boron in geologic samples by electron probe microanalysis (EPMA) is often avoided. Many studies resort to using calculated or assumed concentrations of B based upon mineral stoichiometry rather than attempt to quantify the B contents by measurement. Assuming stoichiometric behavior for B is not always valid and disregards the possibility of variations in B content of minerals. Such assumptions can contribute to misleading crystal chemical substitution models for the other mineral

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18

Tsuji, K., Y. Murakami, K. Wagatsuma, and G. Love. "Surface studies by grazing-exit electron probe microanalysis (GE-EPMA)." X-Ray Spectrometry 30, no. 2 (2001): 123–26. http://dx.doi.org/10.1002/xrs.480.

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Lamontagne, Jérôme, Thierry Blay, and Ingrid Roure. "Microbeam Analysis of Irradiated Materials: Practical Aspects." Microscopy and Microanalysis 13, no. 3 (2007): 150–55. http://dx.doi.org/10.1017/s143192760707033x.

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Among the microanalytical techniques, electron probe microanalysis (EPMA) is one of the most powerful. Its performances can be used to provide an accurate characterization. In the present article the differences between the EPMA of highly irradiated materials and standard EPMA are highlighted. It focuses on the shielded EPMA specificities. Then, the article presents the difficulties encountered during the sample preparation and the analysis (mainly due to the radioactive background). In spite of these difficulties, some valuable results can be provided by a shielded EPMA on the in-pile behavio

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20

Karduck, Peter, та Norbert Ammann. "ϕ(ρz)-Determination for Advanced Applications of Electron Probe Microanalysis". Proceedings, annual meeting, Electron Microscopy Society of America 48, № 2 (1990): 14–15. http://dx.doi.org/10.1017/s0424820100133667.

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In the last 35 years electron probe microanalysis (EPMA) has developed to a versatile technique for the quantitative analysis of materials on a microscopic scale. This development has been initiated by the pioneering work of Castaing in 1951 (1). Already in 1955 Castaing and Descamps have introduced a basic formulation for the absorption correction to quantify characteristic x-ray data (2). This correction already presumed the knowledge of the distribution ϕ(ρz) of the generated x-ray intensity as a function of the depth ρz inside the target. The authors presented the first experimental proced

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21

Lakis, R. E., E. P. Vicenzi, and F. M. Allen. "Electron probe microanalysis of alumina-supported platinum catalysts." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 512–13. http://dx.doi.org/10.1017/s0424820100165021.

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Conventional Electron-Probe Microanalysis (EPMA) requires fully dense, flat polished specimens, and similarly prepared standards of known composition. Most supported catalyst systems do not fit the above criterion, because porosity and large internal surface areas are intrinsic qualities of useful catalyst materials. Many catalysts of commercial importance contain a number of active metals and promoters that are impregnated into porous ceramic support with well controlled concentration profiles relative to the other constituents. It would be of great practical importance to reliably measure th

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Conty, Claude. "Today’s and Tomorrow’s Instruments." Microscopy and Microanalysis 7, no. 2 (2001): 142–49. http://dx.doi.org/10.1007/s100050010077.

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Abstract This article will discuss the importance of Raimond Castaing’s thesis on the genesis of a nondestructive and truly quantitative microanalytical method that assisted the scientific community in moving forward in the development of microanalytical instruments. I will also share with you my recollection of the decades of improvement in the electron probe microanalyzer (EPMA), that has allowed us to reach our present level of instrument sophistication, and I will explore with you my thoughts on the future evolution of this technique. To conclude, I will present the current status of relat

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Merlet, C., X. Llovet, and F. Salvat. "Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis." Microscopy and Microanalysis 5, S2 (1999): 78–79. http://dx.doi.org/10.1017/s1431927600013714.

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Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficul

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Kubo, Yugo, and Koji Kuramochi. "Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe Microanalysis." Microscopy and Microanalysis 21, no. 6 (2015): 1398–405. http://dx.doi.org/10.1017/s1431927615015445.

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AbstractTo observe the fine distribution of minor aluminum and germanium dopants in the erbium-doped fiber (EDF) core of an optical amplifier, a sample thinning technique was applied for field emission electron probe microanalysis (FE-EPMA) together with wavelength-dispersive X-ray spectrometry. This technique significantly improved the spatial resolution without much degradation of the minimum detection limit for FE-EPMA. As such, this enabled us to observe the distribution of minor dopants in EDF. Moreover, we propose a very simple sample preparation to prevent electron-beam radiation damage

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Goldstein, J. I. "Scanning Electron Microscopy And Electron Probe Microanalysis Of Extraterrestrial Materials." Microscopy and Microanalysis 5, S2 (1999): 2–3. http://dx.doi.org/10.1017/s1431927600013337.

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One of the first samples analyzed by Castaing in his electron probe microanalyzer (EPMA) some 50 years ago was an iron meteorite. The Widmanstatten pattern microstructure of iron meteorites can be observed at very low magnifications ( Fig. 1). These meteorites are ideal samples for microanalysis because of the Ni gradient which extends over 10 to 1000 microns in the parent taenite phase of these Fe-Ni samples (Fig. 3). The Ni gradient is the result of very slow cooling of the iron meteorite, in terms of millions of years, within a parent'asteroid.The scanning electron microscope (SEM) has been

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Williams, D. B. "The Impact of EDS In Materials Science Microanalysis." Microscopy and Microanalysis 4, S2 (1998): 168–69. http://dx.doi.org/10.1017/s1431927600020961.

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Since its invention in 1968, the EDS has played an essential role in X-ray analysis of materials, at the micrometer level, in the electron probe microanalyzer (EPMA). In the EPMA, the characteristic X-ray intensity from bulk specimens is sufficient that, despite its very small collection angle, the wavelength dispersive spectrometer (WDS) can also be used. Given the excellent energy resolution of the WDS it has often been the spectrometer of choice for bulk quantitative X-ray microanalysis. Therefore, the most important role of the EDS has been in X-ray microanalysis of thin specimens in the a

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Buse, Ben, та Stuart Kearns. "Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)". Microscopy and Microanalysis 24, № 1 (2018): 1–7. http://dx.doi.org/10.1017/s1431927618000041.

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AbstractQuantification of first series transition metal Lα X-rays is hampered by absorption and in some cases transition probabilities (fluorescence yields) varying with chemical bonding. Compound mass absorption coefficients for Fe Lα were measured in the olivine solid solution series [Forsterite (Mg2SiO4) to Fayalite (Fe2SiO4)] and the mass absorption coefficients for Fe Lα absorbed by Fe were calculated. The mass absorption coefficients vary systematically between Fo83 and Fo0. Using the measured mass absorption coefficients for both standard and unknown and by correcting for a systematic d

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Grover, V., P. Sengupta, K. Bhanumurthy, and A. K. Tyagi. "Electron probe microanalysis (EPMA) investigations in the CeO2–ThO2–ZrO2 system." Journal of Nuclear Materials 350, no. 2 (2006): 169–72. http://dx.doi.org/10.1016/j.jnucmat.2006.01.001.

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Harries, Dennis. "Homogeneity testing of microanalytical reference materials by electron probe microanalysis (EPMA)." Geochemistry 74, no. 3 (2014): 375–84. http://dx.doi.org/10.1016/j.chemer.2014.01.001.

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Walters, Jesse B. "MinPlot: A mineral formula recalculation and plotting program for electron probe microanalysis." Mineralogia 53, no. 1 (2022): 51–66. http://dx.doi.org/10.2478/mipo-2022-0005.

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Abstract MinPlot is a MATLAB®-based mineral formula recalculation and compositional plotting program for electron microprobe analyses (EPMA). The program offers recalculation and structural formula assignment for 15 different mineral groups: Garnet, pyroxene, olivine, amphibole, feldspar, mica, staurolite, cordierite, chlorite, chloritoid, talc, epidote, titanite, spinel, and sulfides. MinPlot is a fast and easy to use command line program and requires no prior computer programming knowledge. Percent mass fractions of oxides are loaded from datafiles and the user answers simple prompts to sele

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Cheng, Lining, Chao Zhang, Xiaoyan Li, Renat R. Almeev, Xiaosong Yang, and Francois Holtz. "Improvement of Electron Probe Microanalysis of Boron Concentration in Silicate Glasses." Microscopy and Microanalysis 25, no. 4 (2019): 874–82. http://dx.doi.org/10.1017/s1431927619014612.

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AbstractThe determination of low boron concentrations in silicate glasses by electron probe microanalysis (EPMA) remains a significant challenge. The internal interferences from the diffraction crystal, i.e. the Mo-B4C large d-spacing layered synthetic microstructure crystal, can be thoroughly diminished by using an optimized differential mode of pulse height analysis (PHA). Although potential high-order spectral interferences from Ca, Fe, and Mn on the BKα peak can be significantly reduced by using an optimized differential mode of PHA, a quantitative calibration of the interferences is requi

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A, V. S. Satyanarayana, Jagannadha Rao M, Seetharami Reddy B, Chandra Mouli K, and V. S. P. V. Satya Guru T. "EPMA and PIXE Analyses of High Grade Metamorphic Rocks." Indian Journal of Science and Technology 15, no. 1 (2022): 1–8. https://doi.org/10.17485/IJST/v15i1.1651.

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ABSTRACT <strong>Background/Objectives:</strong> The demand for exact quantification analyses in complex ore assemblages is increasing rapidly as mineral processing studies become more sophisticated. In response to this need, an Electron Micro Probe Analysis and Proton Induced X-ray Emission complementary based analytical tool procedure for the chemical characterization of minerals was employed to study the metamorphic rocks. <strong>Methods :</strong> In this work, we compare the quantitative analysis of high-grade metamorphic rocks by proton induced X-ray emission (PIXE) with

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Bünger, Jonas, Silvia Richter, and Manuel Torrilhon. "A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic () Method for Electron Transport." Microscopy and Microanalysis 28, no. 2 (2022): 454–68. http://dx.doi.org/10.1017/s1431927622000083.

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Classical $k$-ratio models, for example, ZAF and $\phi ( \rho z)$, used in electron probe microanalysis (EPMA) assume a homogeneous or multilayered material structure, which essentially limits the spatial resolution of EPMA to the size of the interaction volume where characteristic X-rays are produced. We present a new model for characteristic X-ray emission that avoids assumptions on the material structure to not restrict the resolution of EPMA a priori. Our model bases on the spherical harmonic ($P_{\rm N}$) approximation of the Boltzmann equation for electron transport in continuous slowing

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Nihtianova, D. D., I. T. Ivanov, J. J. Macicek, and I. K. Georgieva. "Crystallographic data for BaMnSiO4: A new phase in the system BaO-MnO-SiO2." Powder Diffraction 12, no. 3 (1997): 167–70. http://dx.doi.org/10.1017/s0885715600009659.

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A new phase in the system BaO-MnO-SiO2 obtained by a pyrosynthetic method has been investigated using selected area electron diffraction (SAED), electron probe microanalysis (EPMA), and X-ray powder diffraction. The lattice parameters and a possible space group of the phase with a general composition BaMnSiO4 were determined as follows: a=5.370(2), b=18.447(7), c=8.498(5) Å, Z=8, Space Group Pmc21.

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Claus, T., G. Achuda, S. Richter, and M. Torrilhon. "Subscale inversion of X-ray emission in electron probe microanalysis based on deterministic transport equations." IOP Conference Series: Materials Science and Engineering 1324, no. 1 (2025): 012005. https://doi.org/10.1088/1757-899x/1324/1/012005.

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Abstract The reconstruction methods (ZAF, ϕ(ρz) matrix correction) commonly applied in electron probe microanalysis (EPMA) make restrictive assumptions about the material structure. The model assumption that the material is homogeneous (or layered in depth) limits the spatial resolution of the reconstruction method to the interaction volume of electrons. Models based on Monte Carlo (MC) methods allow for arbitrary material structure, but suffer from statistical noise that prevents the use of MC in gradient-based reconstruction. We present a reconstruction framework for EPMA based on determinis

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Ngo, H., J. Ruben, J. Arends, et al. "Electron Probe Microanalysis and Transverse Microradiography Studies of Artificial Lesions in Enamel and Dentin: A Comparative Study." Advances in Dental Research 11, no. 4 (1997): 426–32. http://dx.doi.org/10.1177/08959374970110040801.

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In cariology and research involving the interactions between restorative materials and dental hard tissues, it is important for small changes in tooth mineral content to be measurable. Currently, transverse microradiography (TMR) is the most accepted tool for the above purpose. Electron Probe Microanalysis (EPMA) can yield both qualitative identification of elements and quantitative compositional information. The purpose of this study was to compare the mineral distribution in well-defined artificial lesions, in dentin and enamel, by the use of both TMR and EPMA on the same sample. The good co

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Chong, Saehwa, Jared O. Kroll, Jarrod V. Crum, and Brian J. Riley. "Synthesis and crystal structure of a neodymium borosilicate, Nd3BSi2O10." Acta Crystallographica Section E Crystallographic Communications 75, no. 5 (2019): 700–702. http://dx.doi.org/10.1107/s2056989019005024.

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A lanthanide borosilicate, trineodymium borosilicate or Nd3BSi2O10, was synthesized using a flux method with LiCl, and its structure was determined from X-ray powder diffraction (XRD) and electron probe microanalysis (EPMA). The structure is composed of layers with [SiO4]4− and [BSiO6]5− anions alternating along the c axis linked by Nd3+ cations between them.

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Cochrane, Nathan J., Youichi Iijima, Peiyan Shen, et al. "Comparative Study of the Measurement of Enamel Demineralization and Remineralization Using Transverse Microradiography and Electron Probe Microanalysis." Microscopy and Microanalysis 20, no. 3 (2014): 937–45. http://dx.doi.org/10.1017/s1431927614000622.

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AbstractTransverse microradiography (TMR) and electron probe microanalysis (EPMA) are commonly used for characterizing dental tissues. TMR utilizes an approximately monochromatic X-ray beam to determine the mass attenuation of the sample, which is converted to volume percent mineral (vol%min). An EPMA stimulates the emission of characteristic X-rays from a variable volume of sample (dependent on density) to provide compositional information. The aim of this study was to compare the assessment of sound, demineralized, and remineralized enamel using both techniques. Human enamel samples were dem

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Schomisch Moravec, Christine, and Meredith Bond. "Subcellular Calcium (Ca2+) Redistribution During Cardiac Muscle Contraction by Electron Probe Microanalysis (EPMA)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 136–37. http://dx.doi.org/10.1017/s0424820100134272.

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Substantial evidence suggests that the increase in cytosolic Ca2+ which occurs upon stimulation of cardiac muscle originates from the sarcoplasmic reticulum (SR) and that its release is triggered by a transient rise in cytosolic Ca2+. The junctional SR has been proposed as a Ca2+ release site, based on a number of observations, e.g. measurements by EPMA have demonstrated significant Ca2+ stores in the junctional SR in resting cardiac muscle; the ryanodine-sensitive Ca2+ release channels are associated with junctional SR membrane and the low affinity Ca2+ binding protein, calsequestrin, is loca

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Schulz, Bernhard, Joachim Krause, and Wolfgang Dörr. "A Protocol for Electron Probe Microanalysis (EPMA) of Monazite for Chemical Th-U-Pb Age Dating." Minerals 14, no. 8 (2024): 817. http://dx.doi.org/10.3390/min14080817.

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A protocol for the monazite (LREE,Y,Th,U,Si,Ca)PO4 in situ Th-U-Pb dating by electron probe microanalyser (EPMA) involves a suitable reference monazite. Ages of several potential reference monazites were determined by TIMS-U-Pb isotope analysis. The EPMA protocol is based on calibration with REE-orthophosphates and a homogeneous Th-rich reference monazite at beam conditions of 20 kV, 50 nA, and 5 µm for best possible matrix matches and avoidance of dead time bias. EPMA measurement of samples and repeated analysis of the reference monazite are performed at beam conditions of 20 kV, 100 nA, and

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Nachlas, William, Suzanne Baldwin, Jay Thomas, and Michael Ackerson. "Investigation of N in Ammonium-bearing Silicates with Electron Probe Microanalysis (EPMA)." Microscopy and Microanalysis 26, S2 (2020): 42–43. http://dx.doi.org/10.1017/s1431927620013203.

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Tsuji, Kouichi. "Grazing-exit electron probe X-ray microanalysis (GE-EPMA): Fundamental and applications." Spectrochimica Acta Part B: Atomic Spectroscopy 60, no. 11 (2005): 1381–91. http://dx.doi.org/10.1016/j.sab.2005.08.013.

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Duque, Laura, Fernanda Guimarães, Helena Ribeiro, Raquel Sousa, and Ilda Abreu. "Elemental characterization of the airborne pollen surface using Electron Probe Microanalysis (EPMA)." Atmospheric Environment 75 (August 2013): 296–302. http://dx.doi.org/10.1016/j.atmosenv.2013.04.040.

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Cazaux, Jacques. "About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution." Microscopy and Microanalysis 10, no. 6 (2004): 670–84. http://dx.doi.org/10.1017/s1431927604040619.

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The physical mechanisms involved in electron irradiation of insulating specimens are investigated by combining some simple considerations of solid-state physics (trapping mechanisms of electrons and secondary electron emission) with basic equations of electrostatics. To facilitate the understanding of the involved mechanisms only widely irradiated samples having a uniform distribution of trapping sites are considered. This starting hypothesis allows development of simple models for the trapped charge distributions in ground-coated specimens as investigated in electron probe microanalysis (EPMA

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Tormey, J. McD, and E. S. Wheeler-Clark. "Electron Probe X-Ray Microanalysis of Cardiac Muscle: Progress Report." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 18–21. http://dx.doi.org/10.1017/s0424820100117200.

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Myocardial contractility is primarily controlled by the moment to moment concentration of ionized Ca around the myofibrils. This concentration in turn is determined by a large number of factors, including gradients of various electrolytes across cell membranes and the concentrations of Ca in various subcellular compartments. The latter include sarcoplasmic reticulum (SR), mitochondria, binding sites associated with sarcolemmae and T-tubules, and binding sites within the sarcoplasm itself. A central problem in cardiac physiology has been to determine the functional interrelationships among thes

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Song, Jian Li, Qi Lin Deng, C. Y. Chen, and De Jin Hu. "Experimental Study on the Laser Direct Fabrication of Stainless Steel Components." Key Engineering Materials 315-316 (July 2006): 239–43. http://dx.doi.org/10.4028/www.scientific.net/kem.315-316.239.

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Experimental study on the laser direct fabrication (LDF) of stainless steel powder is carried out. Microstructure and properties of the deposited components are analyzed and tested with optical microscopy (OM), scanning electron microscopy (SEM) and electron probe microanalysis (EPMA) etc. Cracking generation mechanisms of this material are investigated, corresponding cracking control strategies have been proposed. Finally, fully dense stainless steel components free of defects and with perfect comprehensive mechanical properties have been produced.

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Chia, V. K. F., R. J. Bleiler, C. L. Anderson, and R. W. Odom. "Quantitative Trace Element Analysis of Micro-Samples by SIMS." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 360–61. http://dx.doi.org/10.1017/s042482010013540x.

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A number of researchers have applied secondary ion mass spectrometry (SIMS) in various areas of medical research. The potential of SIMS as an analytical tool in elemental microanalysis of biological specimens lies in its sub-part per million (ppm) elemental detection sensitivities and its ability to generate two and three dimensional distributions of the intensities of mass selected secondary ions. Established techniques such as inductively coupled plasma (ICP) and electron probe microanalysis (EPMA) are also capable of sub-ppm elemental detection limits. ICP detection limits are adversely aff

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Somlyo, A. P. "Where Art Thou, Calcium?" Microscopy and Microanalysis 3, S2 (1997): 913–14. http://dx.doi.org/10.1017/s1431927600011454.

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Ever since the recognition of calcium as a major intracellular messenger of signal transduction, its subcellular localization and intracellular movements have been intensively sought through electron and light optical methods. Electron probe microanalysis (EPMA), X-ray mapping, electron energy-loss spectroscopy (EELS) and energy-filtered imaging still provide the highest spatial resolution for measuring total calcium, whereas with light optical methods (fluorescent, luminescent and absorbance dyes) free [Ca2+]i can be measured with high sensitivity and time resolution. This presentation will s

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Keil, K., R. Fitzgerald, and KFJ Heinrich. "Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)." Microscopy and Microanalysis 14, S2 (2008): 1152–53. http://dx.doi.org/10.1017/s1431927608081221.

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Carpenter, PK. "Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts." Microscopy and Microanalysis 14, S2 (2008): 1150–51. http://dx.doi.org/10.1017/s1431927608088806.

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