Gotowa bibliografia na temat „Film roughness”
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Artykuły w czasopismach na temat "Film roughness"
He, Li Jun, Chuan Li, and Xing Zhao Liu. "Surface Roughness in Alumina Thin Film Deposited on Silica Using Oblique Incidence." Materials Science Forum 787 (April 2014): 373–77. http://dx.doi.org/10.4028/www.scientific.net/msf.787.373.
Pełny tekst źródłaZHAO, PEI, RENG WANG, DINGQUAN LIU, FENGSHAN ZHANG, WEITAO SU, and XIAOFENG XU. "UNDERLAYER ROUGHNESS INFLUENCE ON THE PROPERTIES OF Ag THIN FILM." Surface Review and Letters 15, no. 06 (December 2008): 787–91. http://dx.doi.org/10.1142/s0218625x08012062.
Pełny tekst źródłaChengwei, Wu. "On Mixed Squeeze Films of Infinite Width Plates." Journal of Tribology 113, no. 2 (April 1, 1991): 378–83. http://dx.doi.org/10.1115/1.2920632.
Pełny tekst źródłaMitsuya, Y., T. Ohkubo, and H. Ota. "Averaged Reynolds Equation Extended to Gas Lubrication Possessing Surface Roughness in the Slip Flow Regime: Approximate Method and Confirmation Experiments." Journal of Tribology 111, no. 3 (July 1, 1989): 495–503. http://dx.doi.org/10.1115/1.3261957.
Pełny tekst źródłaWongkaew, Akkarat, Chanida Soontornkallapaki, Naritsara Amhae, and Wichet Lamai. "Effect of ZnO on a Superhydrophilic Self-Cleaning Properties of TiO2/SiO2 Thin Film on Glass Slide Substrate." Advanced Materials Research 1131 (December 2015): 237–41. http://dx.doi.org/10.4028/www.scientific.net/amr.1131.237.
Pełny tekst źródłaNiesen, T. P., M. R. De Guire, J. Bill, F. Aldinger, M. Rühle, A. Fischer, F. C. Jentoft, and R. Schlögl. "Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers." Journal of Materials Research 14, no. 6 (June 1999): 2464–75. http://dx.doi.org/10.1557/jmr.1999.0331.
Pełny tekst źródłaMitsuya, Y., and H. Ota. "Stiffness and Damping of Compressible Lubricating Films Between Computer Flying Heads and Textured Media: Perturbation Analysis Using the Finite Element Method." Journal of Tribology 113, no. 4 (October 1, 1991): 819–27. http://dx.doi.org/10.1115/1.2920698.
Pełny tekst źródłaCui, Rui Hai, Zhao Hua Jiang, and Zhong Ping Yao. "Influence of Cu2+ Doping on the Photocatalytic Activity of TiO2 Film." Key Engineering Materials 368-372 (February 2008): 1483–85. http://dx.doi.org/10.4028/www.scientific.net/kem.368-372.1483.
Pełny tekst źródłaPeng, Yonghong, Shuai Zhang, Fanghua Zhu, Wa Li, Yong Yi, Kai Du, and Qiang Yin. "Fabrication and Characterization of Fluorinated Polyimides (PI) Films with Improved Hydrophobic Property." Nano 13, no. 07 (July 2018): 1850080. http://dx.doi.org/10.1142/s1793292018500807.
Pełny tekst źródłaSURESH, K. A., YUSHAN SHI, A. BHATTACHARYYA, and SATYENDRA KUMAR. "WETTING–DEWETTING TRANSITION AND CONFORMAL TO NON-CONFORMAL INTERFACIAL ROUGHNESS TRANSITION IN ULTRA-THIN LIQUID CRYSTAL FILMS ON SOLID SUBSTRATES." Modern Physics Letters B 15, no. 08 (April 10, 2001): 225–33. http://dx.doi.org/10.1142/s0217984901001628.
Pełny tekst źródłaRozprawy doktorskie na temat "Film roughness"
Lee, Hyunjin. "Radiative properties of silicon wafers with microroughness and thin-film coatings." Diss., Available online, Georgia Institute of Technology, 2006, 2006. http://etd.gatech.edu/theses/available/etd-07092006-181152/.
Pełny tekst źródłaGuegan, Johan. "Experimental investigation into the influence of roughness on friction and film thickness in EHD contacts." Thesis, Imperial College London, 2015. http://hdl.handle.net/10044/1/53388.
Pełny tekst źródłaCardwell, Nicholas Don. "Effects of Realistic First-Stage Turbine Endwall Features." Thesis, Virginia Tech, 2005. http://hdl.handle.net/10919/36121.
Pełny tekst źródłaShioya, Nobutaka. "Development of Analytical Technique of Molecular Orientation in a Thin Film and Its Application to Low-Crystallinity Organic Thin Films Having a Surface Roughness." Kyoto University, 2018. http://hdl.handle.net/2433/232268.
Pełny tekst źródłaAghasi, Paul P. "Dependence of Film Cooling Effectiveness on 3D Printed Cooling Holes." University of Cincinnati / OhioLINK, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1458893416.
Pełny tekst źródłaWebb, Joshua J. "The Effect of Particle Size and Film Cooling on Nozzle Guide Vane Deposition." The Ohio State University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=osu1313528110.
Pełny tekst źródłaPavlík, František. "Studium vlivu parametru elipticity na rozložení tloušťky mazacího filmu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229941.
Pełny tekst źródłaFratini, Christopher M. "Study of the Morphology and Optical Properties of Propylene/Ethylene Copolymer Films." Diss., Virginia Tech, 2006. http://hdl.handle.net/10919/27211.
Pełny tekst źródłaSugar, Joshua D. "Mechanisms of microstructure development at metallic-interlayer/ceramic interfaces during liquid-film-assisted bonding." Berkeley, Calif. : Oak Ridge, Tenn. : Lawrence Berkeley National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2003. http://www.osti.gov/servlets/purl/825347-j6A0Su/native/.
Pełny tekst źródłaSimon, Darren, and s3027589@student rmit edu au. "Chemistry and Morphology of Polymer Thin Films for Electro-Optical Application." RMIT University. Applied Sciences, 2006. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20070123.122707.
Pełny tekst źródłaKsiążki na temat "Film roughness"
1935-, Aboudi Jacob, Arnold S. M, and NASA Glenn Research Center, eds. The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling. Cleveland, Ohio: National Aeronautics and Space Administration, Glenn Research Center, 1999.
Znajdź pełny tekst źródłaThe effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling. Cleveland, Ohio: National Aeronautics and Space Administration, Glenn Research Center, 1999.
Znajdź pełny tekst źródłaCzęści książek na temat "Film roughness"
Fukushima, Manabu, Seiji Nakano, and Hideki Kita. "Ceramic Surface Roughness Modification Using A Polymethylsilsesquioxane and Silicon Oxycarbide Film Coating." In Ceramic Transactions Series, 289–94. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2011. http://dx.doi.org/10.1002/9781118144145.ch45.
Pełny tekst źródłaItoh, M., K. Aota, R. Sugano, and H. Takano. "Reduction of Thin Film Surface Roughness by Self-Assembling of Organic Molecules." In Ceramic Transactions Series, 467–74. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118406038.ch57.
Pełny tekst źródłaWoods, D. C., R. L. Fletcher, and E. B. G. Jones. "Microfouling Film Composition, Thickness and Surface Roughness on Ship Trial Antifouling Paints." In Biodeterioration 7, 49–56. Dordrecht: Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-009-1363-9_7.
Pełny tekst źródłaPark, Bo Hyeon, Hyun Sik Oh, Seok Pyo Hong, and Sang Jeen Hong. "Analysis of Surface Roughness of Immersion Sn Plating Film via Micro Etch Process." In Advanced Materials Research, 425–28. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-463-4.425.
Pełny tekst źródłaAdeshara, Jatinkumar V., M. B. Prajapati, G. M. Deheri, and R. M. Patel. "Study of Longitudinal Roughness on Hydromagnetic Squeeze Film Between Conducting Rotating Circular Plates." In Advances in Intelligent Systems and Computing, 219–33. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-15-0184-5_20.
Pełny tekst źródłaPeng, Zhilong. "Effects of Surface Roughness and Film Thickness on the Adhesion of a Bio-inspired Nanofilm." In Springer Theses, 55–70. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-46955-2_5.
Pełny tekst źródłaOlmeda, R., P. Breda, C. Stemmer, and M. Pfitzner. "Large-Eddy Simulations for the Wall Heat Flux Prediction of a Film-Cooled Single-Element Combustion Chamber." In Notes on Numerical Fluid Mechanics and Multidisciplinary Design, 223–34. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-53847-7_14.
Pełny tekst źródłaTarakci, M., and S. Guruswamy. "Influence of Surface Roughness on the Coercivity and Magnetic Interactions in CoCrX (X=Pt,Pd,Ta,B) Thin Film Media." In Surface Engineering, 283–92. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118788325.ch28.
Pełny tekst źródłaMwema, Fredrick Madaraka, Esther Titilayo Akinlabi, and Oluseyi Philip Oladijo. "Mono-Fractal Analyses of Roughness of Sputtered Films." In Sputtered Thin Films, 101–36. First edition. | Boca Raton, FL : CRC Press/Taylor & Francis Group, LLC, 2021. | Series: Engineering materials book series: CRC Press, 2021. http://dx.doi.org/10.1201/9781003053507-7.
Pełny tekst źródłaTrost, M., and S. Schröder. "Roughness and Scatter in Optical Coatings." In Optical Characterization of Thin Solid Films, 377–405. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-75325-6_14.
Pełny tekst źródłaStreszczenia konferencji na temat "Film roughness"
Morris, Nicholas J., Joaquin M. Gutierrez, Ever J. Barbero, and Darran R. Cairns. "Polymer Skins With Switchable Roughness." In ASME 2011 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. ASMEDC, 2011. http://dx.doi.org/10.1115/smasis2011-5129.
Pełny tekst źródłaSchmidt, Donald L., Basav Sen, and David G. Bogard. "Effects of Surface Roughness on Film Cooling." In ASME 1996 International Gas Turbine and Aeroengine Congress and Exhibition. American Society of Mechanical Engineers, 1996. http://dx.doi.org/10.1115/96-gt-299.
Pełny tekst źródłaTielking, John, and V. Thomas. "The effect of film thickness on the fracture roughness of balloon film." In 32nd Aerospace Sciences Meeting and Exhibit. Reston, Virigina: American Institute of Aeronautics and Astronautics, 1994. http://dx.doi.org/10.2514/6.1994-634.
Pełny tekst źródłaSouthwell, W. H. "Coherence Loss Due To Thin Film Interface Roughness." In 1986 International Symposium/Innsbruck, edited by J. Roland Jacobsson. SPIE, 1986. http://dx.doi.org/10.1117/12.938393.
Pełny tekst źródłaShen, Zhengxiang, Bin Ma, Tao Ding, Xiaoqiang Wang, ZhanShan Wang, Lishuan Wang, Huasong Liu, and Yiqin Ji. "Fabrication and quantitative characterization of super smooth surface with sub-nanometer roughness." In Seventh International Conference on Thin Film Physics and Applications, edited by Junhao Chu and Zhanshan Wang. SPIE, 2010. http://dx.doi.org/10.1117/12.888916.
Pełny tekst źródłaKarabekov, Albert Y., and Igor V. Kozhevnikov. "Peculiarities of x-ray scattering by thin-film roughness." In X-ray Optics and Surface Science, edited by Alexander V. Vinogradov. SPIE, 1995. http://dx.doi.org/10.1117/12.200273.
Pełny tekst źródłaInoue, Y., and K. Ikuta. "Cell based microactuator with controlled roughness of thin film." In TRANSDUCERS 2015 - 2015 18th International Solid-State Sensors, Actuators and Microsystems Conference. IEEE, 2015. http://dx.doi.org/10.1109/transducers.2015.7181271.
Pełny tekst źródłaOsipov, M. I. "EFFICIENCY OF FILM COOLING WITH INFLUENCE OF SURFACE ROUGHNESS." In International Heat Transfer Conference 10. Connecticut: Begellhouse, 1994. http://dx.doi.org/10.1615/ihtc10.1130.
Pełny tekst źródłaHan, Guoqiang, Zhuangde Jiang, Weixuan Jing, and Mingzhi Zhu. "Effects of Substrate Properties, Film Thickness and Evaporation Rate on the Surface Roughness of Ultra Thin Titanium Films." In 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21096.
Pełny tekst źródłaBoutaous, M’hamed, and Patrick Bourgin. "Macroscopic Effects of Surface Roughness in Confined Air-Flow." In ASME 2002 International Mechanical Engineering Congress and Exposition. ASMEDC, 2002. http://dx.doi.org/10.1115/imece2002-33831.
Pełny tekst źródłaRaporty organizacyjne na temat "Film roughness"
Raben, Sam, Pavlos Vlachos, and Wing Ng. Effects of Leading Edge Film-Cooling and Surface Roughness on the Downstream Film-Cooling Along a Transonic Turbine Blade for Low and High Free-Stream Turbulence. Fort Belvoir, VA: Defense Technical Information Center, February 2008. http://dx.doi.org/10.21236/ada479415.
Pełny tekst źródłaBerney, Ernest, Naveen Ganesh, Andrew Ward, J. Newman, and John Rushing. Methodology for remote assessment of pavement distresses from point cloud analysis. Engineer Research and Development Center (U.S.), April 2021. http://dx.doi.org/10.21079/11681/40401.
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