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Artykuły w czasopismach na temat „HRTEM”

Autor: Grafiati

Data publikacji: 4 czerwca 2021

Data aktualizacji: 25 lipca 2025

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1

Howe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during

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2

Lakshmi, R. Radha, D. Sruthi, K. Prithiv, S. Harippriya, and K. R. Aranganayagam. "Synthesis of ZnO and Ag/ZnO Nanorods: Characterization and Synergistic In Vitro Biocidal Studies." Advanced Science Letters 24, no. 8 (2018): 5490–95. http://dx.doi.org/10.1166/asl.2018.12135.

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The ZnO semiconductor has gained substantial interest in the research community in part because of its large exciton binding energy (60 meV) and direct wide band gap (3.72 eV). ZnO and Ag doped ZnO (Agx Zn1−xO (where x = 0.01, 0.02 and 0.03)) were synthesized by using soft chemical route. The synthesized materials were characterized by using XRD, HRSEM, EDS and HRTEM. The powder XRD pattern indicates that the ZnO and Agx Zn1−xO (where x = 0.01, 0.02 and 0.03) samples exhibits hexagonal wurtzite structure and also the Ag doping decreases the grain size of ZnO nano particles. The micro structura

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Arumugam, J., A. Dhayal Raj, and A. Albert Irudayaraj. "Morphology Manipulation and Related Properties of High Crystalline Bi2S3 Nanorods by Reflux Approach." Volume 4,Issue 5,2018 4, no. 5 (2018): 524–26. http://dx.doi.org/10.30799/jnst.159.18040516.

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One dimensional Bi2S3 nanorods have been successfully synthesized by a very simple reflux method with different precursor concentration for 2 hours at 180 �C. The as-synthesized Bi2S3 powders were characterized by X-ray diffraction (XRD), high resolution scanning electron microscope (HRSEM), high resolution transmission microscope (HRTEM), UV-Vis spectrometer, Fourier transform infrared (FTIR) spectrometer. X-ray diffraction (XRD) results show that the resulting nanocrystals have an orthorhombic structure. X-ray diffraction patterns indicate a polycrystalline nature and the crystallite sizes s

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4

Xing, Y. T., L. Y. Liu, D. F. Franceschini, W. C. Nunes, D. J. Smith, and I. G. Solorzano. "HRTEM and HRSTEM Study of Nanostructured Materials Prepared by Pulsed Laser Deposition." Microscopy and Microanalysis 22, S3 (2016): 2012–13. http://dx.doi.org/10.1017/s1431927616010904.

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Barman, Jayanta, Archana Das, Bapan Banik, and Farhana Sultana. "Optimizing ZnO/CdS Nano Composite Controlled by Fe Doping Towards Efficiency in Water Treatment and Antimicrobial Activity." Current World Environment 16, no. 3 (2021): 726–32. http://dx.doi.org/10.12944/cwe.16.3.6.

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Nanocrystalline composite zinc oxide (ZnO) and CdS with Fe doping thin films grown on glass substrate by chemical method. The parameters like temperature of the solution, UV exposure, pH of solution, immersion time, immersion cycles, have been controlled and standardized for nanocrystalline film. The synthesis NPs were analyzed by X-ray diffraction (XRD). Rietveld method shows that Fe-doped composite ZnO/CdS is a single pure phase and wurtzite structure. Samples were analyzed by sophisticated various instrument like XRD, UV- Visible spectrometer, HRTEM, HRSEM and composition was analyzed by ED

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6

Howe, J. M., T. M. Murray, K. T. Moore, et al. "Understanding Interphase Boundary Dynamics by In Situ High-Resolution and Energy-Filtering Transmission Electron Microscopy and Real-Time Image Simulation." Microscopy and Microanalysis 4, no. 3 (1998): 235–47. http://dx.doi.org/10.1017/s1431927698980230.

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This study discusses the use of in situ high-resolution transmission electron microscropy (HRTEM) techniques to determine the structure, composition, and interphase boundary dynamics during phase transformations at the atomic level. Three main in situ HRTEM techniques are described: (1) in situ HRTEM dynamic studies that are performed on the same precipitate plates from different viewing directions to determine the three-dimensional structure of the interfaces; (2) in situ compositional mapping of precipitate interfaces obtained by energy-filtering TEM experiments at temperature in a HRTEM, an

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7

Cohen, Dov, Geoffrey H. Campbell, Wayne E. King, and C. Barry Carter. "Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods." Microscopy and Microanalysis 4, S2 (1998): 784–85. http://dx.doi.org/10.1017/s1431927600024041.

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The analysis of the atomic structure of grain boundaries is often performed through the use of high-resolution transmission electron microscopy (HRTEM). A complication of the HRTEM technique is the inability to analyze directly the experimental images in order to determine projected atomic models of lattice defects. Since contrast features in HRTEM images, in general, do not correspond directly to atomic positions, experimental images are typically evaluated qualitatively through comparison with image simulation. Recently, the interest in quantitatively measuring the atomic structure of intern

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8

O'Keefe, Michael A. "Advances in image simulation for high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 38–39. http://dx.doi.org/10.1017/s0424820100136568.

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The original high-resolution transmission electron microscope (HRTEM) image simulation program was written as a tool to confirm interpretation of HRTEM images of niobium oxides. Thorough testing on known structures showed that image simulation could reliably duplicate the imaging process occurring in the HRTEM, and could thus be confidently used to interpret images of unknown structures. Mainstream application of image simulation to routine structure determination by HRTEM was ushered in by the establishment of the wide applicability of the SHRLI (simulated high-resolution lattice image) progr

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9

Mao, Fuqi, Xiaohan Guan, Ruoyu Wang, and Wen Yue. "Super-Resolution Based on Generative Adversarial Network for HRTEM Images." International Journal of Pattern Recognition and Artificial Intelligence 35, no. 10 (2021): 2154027. http://dx.doi.org/10.1142/s0218001421540276.

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As an important tool to study the microstructure and properties of materials, High Resolution Transmission Electron Microscope (HRTEM) images can obtain the lattice fringe image (reflecting the crystal plane spacing information), structure image and individual atom image (which reflects the configuration of atoms or atomic groups in crystal structure). Despite the rapid development of HTTEM devices, HRTEM images still have limited achievable resolution for human visual system. With the rapid development of deep learning technology in recent years, researchers are actively exploring the Super-r

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10

González, Gema, Werner Stracke, Zoraya Lopez, Ulrike Keller, Andrea Ricker, and Rudolf Reichelt. "Characterization of Defects and Surface Structures in Microporous Materials by HRTEM, HRSEM, and AFM." Microscopy and Microanalysis 10, no. 02 (2004): 224–35. http://dx.doi.org/10.1017/s1431927604040097.

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11

O’Keefe, Michael A. "Interpretation of HRTEM images by image simulation: An introduction to theory and practice." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 394–95. http://dx.doi.org/10.1017/s0424820100169705.

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High-resolution transmission electron microscope (HRTEM) image simulation was conceived in 1970 in response to a referee's questioning of the interpretation of images of a niobium oxide. Two years later a suite of HRTEM image simulation programs had been established and shown to accurately reproduce experimental HRTEM images when imaging parameters were accurately known. These first simulated images proved that the original interpretation of the niobium oxide images was indeed correct. Once these programs were available, it was possible to explore HRTEM imaging parameters including specimen io

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12

Marcks, CH, H. Wachsmuth, and H. Graf V. Reichenbach. "Preparation of vermiculites for HRTEM." Clay Minerals 24, no. 1 (1989): 23–32. http://dx.doi.org/10.1180/claymin.1989.024.1.02.

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AbstractA technique for preparing vermiculites for examination by high-resolution transmission electron microscopy (HRTEM) has been developed. A TEM-stable expanded phase can be obtained by intercalating n-alkylammonium ions between the silicate layers of a parent biotite. The vermiculite particles were embedded in Spurr resin and centrifuged to improve orientation. Ultra-thin specimens were prepared using an ultramicrotome, the quality and thickness of the sections being monitored by TEM. Lattice images of biotite, Ba-vermiculite and octylammonium-vermiculite, the latter showing a perpendicul

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13

Hassan, Ishmael, Yasuhiro Kudoh, Peter R. Buseck, and Eui Ito. "MgSiO3 perovskite: a HRTEM study." Mineralogical Magazine 60, no. 402 (1996): 799–804. http://dx.doi.org/10.1180/minmag.1996.060.402.10.

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AbstractSelected-area electron diffraction patterns for the [110] zone of MgSiO3 perovskite are consistent with the orthorhombic unit cell obtained by X-ray diffraction (a = 4.775, b = 4.929, c = 6.897 Å). Various areas of a crystal fragment show diffuse streaking along c*, and well-developed satellite reflections that give a 3-fold repeat along [10]*. Another fragment shows doubled cell dimensions when viewed down [30]. The variable occurrence of the satellite reflectioncs and diffuse streaking indicate subtle variations in ordering, chemistry, or both. Images obtained by high-resolution tran

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14

Ohnishi, N., T. Ohsuna, Y. Sakamoto, O. Terasaki, and K. Hiraga. "Quantitative HRTEM study of zeolite." Microporous and Mesoporous Materials 21, no. 4-6 (1998): 581–88. http://dx.doi.org/10.1016/s1387-1811(98)00026-2.

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15

O’Keefe, Michael A., and Margaret L. Sattler. "HRTEM simulation of amorphous materials." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 112–13. http://dx.doi.org/10.1017/s0424820100173698.

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Image simulation has become one of the preferred techniques for analysis of high-resolution transmission electron micrographs, in both bright-field and dark-field modes. This is especially true of microscope images used in stuctural studies, both for perfect crystal structures, and for defects within periodic structures. In using image simulation for structural analysis, comparison is made point-by-point (pixel by pixel) between the experimental image and one simulated under identical imaging conditions for a model structure. Comparison with a matching simulated image enables features in the e

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16

Michel, Daniel, Léo Mazerolles, and Richard Portier. "HRTEM studies on oxide ceramics." Microscopy Microanalysis Microstructures 1, no. 5-6 (1990): 433–42. http://dx.doi.org/10.1051/mmm:0199000105-6043300.

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17

Pailloux, Frédéric, Marie-Laure David, and Laurent Pizzagalli. "Quantitative HRTEM investigation of nanoplatelets." Micron 41, no. 2 (2010): 135–42. http://dx.doi.org/10.1016/j.micron.2009.09.005.

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18

Op de Beeck, Marc, and Dirk Van Dyck. "Direct structure reconstruction in HRTEM." Ultramicroscopy 64, no. 1-4 (1996): 153–65. http://dx.doi.org/10.1016/0304-3991(96)00006-x.

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19

Nakagawa, D., T. Kawabata, S. Ikeno, and K. Matsuda. "Hrtem Observation of Age-Precipitation in Mg-Gd-Y Alloys." Archives of Metallurgy and Materials 58, no. 2 (2013): 361–62. http://dx.doi.org/10.2478/v10172-012-0199-9.

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Precipitation in Mg-Gd-Y alloys which have the different total amount of RE were investigated by HRTEM and SAED technique, and calculation of HRTEM images and electron density by first principles to understand the relationship between precipitation in these alloys and HRTEM images. The diffuse scattering by SAED was obtained in as-quenched samples in each alloy, and mono-layer zones have been confirmed by HRTEM observation. The atomic position just consisted of the RE and Mg columns show the black contrast, and the bright dots correspond to the space surrounding by the six Mg columns of hexago

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20

Howe, J. M., and S. J. Rozeveld. "Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (1990): 358–59. http://dx.doi.org/10.1017/s0424820100174928.

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It is well known that only a few milliradians of crystal or beam tilt can produce image artifacts in HRTEM images of perfect crystals. One important application of HRTEM is for determining the atomic structures of interfaces. While it is intuitive that alignment of an interface parallel to the electron beam should be critical for obtaining reliable HRTEM images of interfaces, a systematic study of the effects of crystal and beam tilt on HRTEM images of interfaces has not been performed.In this investigation, the effects of crystal and beam tilt on HRTEM images of planar, coherent interfaces we

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21

Howe, James M. "In Situ hot-stage high-resolution Transmission Electron Microscope studies of the mechanisms and kinetics of precipitation reactions." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 228–29. http://dx.doi.org/10.1017/s0424820100137513.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the mechanisms and kinetics of precipitation reactions at the atomic level. Such information is required to understand phase transformations and the behavior of material interfaces. This paper provides a brief summary of the in situ hot-stage HRTEM technique and illustrates the use of this technique to obtain information about heterogeneous nucleation processes in precipitation and crystallization reactions. Examples of other types of in situ HRTEM studies can be found in pre

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22

Deng, Yu-Hao. "Common Phase and Structure Misidentifications in High-Resolution TEM Characterization of Perovskite Materials." Condensed Matter 6, no. 1 (2020): 1. http://dx.doi.org/10.3390/condmat6010001.

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High-resolution TEM (HRTEM) is a powerful tool for structure characterization. However, methylammonium lead iodide (MAPbI3) perovskite is highly sensitive to electron beams and easily decomposes into lead iodide (PbI2). Misidentifications, such as PbI2 being incorrectly labeled as perovskite, are widely present in HRTEM characterization and would negatively affect the development of perovskite research field. Here misidentifications in MAPbI3 perovskite are summarized, classified, and corrected based on low-dose imaging and electron diffraction (ED) simulations. Corresponding crystallographic

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23

Kaiser, U., A. Chuvilin, P. D. Brown, and W. Richter. "Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC." Microscopy and Microanalysis 5, no. 6 (1999): 420–27. http://dx.doi.org/10.1017/s1431927699990487.

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Abstract: High-resolution transmission electron microscopy (HRTEM) images of the [1–10] zone of cubic SiC layers grown by molecular beam epitaxy (MBE) often reveal regions of material exhibiting an unusual threefold periodicity. The same contrast was found in earlier works of Jepps and Page, who attributed this contrast in HRTEM images of polycrystalline SiC to the 9R-SiC polytype. In this report we demonstrate by HRTEM image simulations that the model of the 9R polytype and an alternative twinning model can fit qualitatively the experimental HRTEM images. However, by comparing the fast Fourie

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24

Panigrahi, Muktikanta. "Chemically Synthesized ZnO Nanostructure: Effect of Polyethylene Glycol (PEG) Surfactants." NanoNEXT 3, no. 3 (2022): 6–13. http://dx.doi.org/10.54392/nnxt2232.

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ZnO nano-particles is synthesized using hydrated zinc chloride (ZnCl2.2H2O) as main raw components. It is calcined at different temperatures (i.e., 200 ⁰C, 400 ºC, 600 ⁰C and 800 ⁰C). Synthesized ZnO is characterized by XRD, SEM/EDS, HRTEM, UV Visible, and Band Gap. XRD result showed pure wurtzite-structure and is crystalline nature. Both XRD results and SAED obtained from pattern HRTEM studies are indicated similar information of the ZnO nanomaterials. Both FESEM and HRTEM techniques are used to observe surface morphology of ZnO nanomaterials. Such analyses are directed to the thermo-chemical

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Baik, H. S., T. Epicier та E. Van Cappellen. "Quantitative analysis of HRTEM images from amorphous materials. I: About the estimation ofCsandδffrom HRTEM diffractograms". European Physical Journal Applied Physics 4, № 1 (1998): 11–26. http://dx.doi.org/10.1051/epjap:1998240.

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Howe, James M., Hirotaro Mori, and Zhong Lin Wang. "In Situ High-Resolution Transmission Electron Microscopy in the Study of Nanomaterials and Properties." MRS Bulletin 33, no. 2 (2008): 115–21. http://dx.doi.org/10.1557/mrs2008.24.

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AbstractThis article introduces the use of in situ high-resolution transmission electron microscopy (HRTEM) techniques for the study and development of nanomaterials and their properties. Specifically, it shows how in situ HRTEM (and TEM) can be used to understand diverse phenomena at the nanoscale, such as the behavior of alloy phase formation in isolated nanometer-sized particles, the mechanical and transport properties of carbon nanotubes and nanowires, and the dynamic behavior of interphase boundaries at the atomic level. Current limitations and future potential advances in in situ HRTEM o

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Tanaka, Nobuo, Jun Yamasaki, Shingo Fuchi, and Yoshikazu Takeda. "First Observation of InxGa1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM." Microscopy and Microanalysis 10, no. 1 (2004): 139–45. http://dx.doi.org/10.1017/s1431927604040231.

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InxGa1−xAs quantum dots in GaP(100) crystals prepared by the OMVPE technique are observed along the [011] direction with a newly developed 200-kV spherical aberration(Cs)-corrected HRTEM, a 200-kV annular dark-field (ADF)-STEM, and a 200-kV conventional HRTEM equipped with a thermal field-emission gun. The dots are 6–10 nm in size and strongly strained due to the misfit of about 9% with the GaP substrate and GaP cap layer. All of the cross-sectional high-resolution electron micrographs show dumbbell images of Ga and P atomic columns separated by 0.136 nm in well-oriented and perfect GaP areas,

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Keller, Bob. "What's in a 'NYM?" Microscopy Today 21, no. 4 (2013): 72. http://dx.doi.org/10.1017/s1551929513000758.

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The field of electron microscopy, by its diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to name a few of the instruments. Add in the different forms of data that these instruments might collect, and it can be overwhelming: ADF, BF, BSE, CBED, CL, DF, EBIC, EBSD/BEKP/BKD/EBSP, ECCI, EDS/EDX, EELS, HAADF, NBD, SAD, and SE. For the brave reader, check out the acronym listing at the beginning of DB Williams and CB Carter's series on TEM.

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Matsuoka, Yuki, Katsumi Watanabe, Seiji Saikawa, Susumu Ikeno, and Kenji Matsuda. "HRTEM Observation of Age-Precipitation in Mg-2.9at.% Alloys." Advanced Materials Research 922 (May 2014): 503–6. http://dx.doi.org/10.4028/www.scientific.net/amr.922.503.

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The magnesium alloy containing rare earth element is known to show good heat resistance. In this study, Mg-Y, Mg-Gd and Mg-Gd-Y alloys including the same total amount of solute elements have been investigated to clarified the effect of the Y atom on age-hardening and precipitation using HRTEM, SAED technique and HRTEM simulation. The diffuse scattering by SAED was obtained in as-quenched condition in all alloys. In the specimen at as-quenched condition, the row contrasts consisted of bright and dark dots lying on the {100}Mgplanes, which were considered to mono-layer were observed by HRTEM.

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30

Sutrisno, H., E. D. Siswani, and K. S. Budiasih. "The effect of sintering temperatures of TiO2(B)-nanotubes on its microstructure." Science of Sintering 50, no. 3 (2018): 291–98. http://dx.doi.org/10.2298/sos1803291s.

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Titanium dioxide (TiO2)-nanotubes were prepared by a simple technique reflux. The morphologies and microstructures of nanotubes were characterized by high resolution scanning electron microscopy (HRSEM), high resolution transmission electron microscopy (TEM), powder X-ray diffraction (XRD,) energy dispersive X-ray spectroscopy (EDS) and surface area analyzer. The microstructures of TiO2 phases obtained from the sintering process of TiO2-nanotubes for 1 hour at various temperatures from 100 to 1000?C at intervals of 50?C were investigated from the XRD diffractograms. The analyses of morphologie

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Matsuda, Kenji, Junya Nakamura, Tokimasa Kawabata, et al. "Effect of Additional Elements (Cu, Ag) on Precipitation in 6xxx (Al-Mg-Si) Alloys." Materials Science Forum 706-709 (January 2012): 357–60. http://dx.doi.org/10.4028/www.scientific.net/msf.706-709.357.

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It has been known that Cu- or Ag-addition Al-1.0mass%Mg2Si (balanced) alloys shows higher hardness and elongation than Cu-free or Ag-free balance alloy. In this study, the alloys with Cu or Ag addition and the alloys with Si / Mg in excess have been investigated by hardness and tensile tests and HRTEM observation. Cu addition is effective for higher hardness, and Ag-addition is useful for improvement of elongation for peak-aged samples. Precipitates in peak aged these alloys have been confirmed by HRTEM. Cu-addition alloy almost includes Q’-phase, and Ag-addition alloy includes b’-phase. The p

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Taniyama, A., D. Shindo, T. Oikawa та M. Kersker. "Detective Quantum Efficiency of 25μm Pixel Imaging Plate". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 серпня 1996): 456–57. http://dx.doi.org/10.1017/s042482010016474x.

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The 25μm pixel Imaging Plate (IP) is expected to apply to high-resolution transmission electron microscopy (HRTEM) because of its higher spatial resolution than the 50μm pixel IP. It seems that the 25μm pixel IP, which has wide dynamic range and good linearity, is effective for HRTEM with low exposure to reduce electron radiation damage. In order to apply the IP to the HRTEM appropriately, it is necessary to understand the detective efficiency of the IP. In this paper, signal to noise (S/N) ratio and detective quantum efficiency (DQE) of the 25μm pixel IP at accelerating voltages of 100, 200 a

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Taylor, S., J. Mardinly, M. A. O'Keefe, and R. Gronsky. "HRTEM Image Simulations of Structural Defects in Gate Oxides." Microscopy and Microanalysis 6, S2 (2000): 1078–79. http://dx.doi.org/10.1017/s1431927600037880.

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High-resolution transmission electron microscopy (HRTEM) is used extensively in the semiconductor industry for device characterization, and has become one of the highly favored techniques for characterizing the latest generation of ultra-thin gate oxides in MOSFET devices. However, relatively little is understood (either quantitatively or experimentally) about the limitations of HRTEM in detecting structural defects in gate oxides that could affect device performance. To investigate model defects experimentally, it would be necessary to construct “perfect” gate oxides, introduce defects with s

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Kiss, Ákos K., Edgar F. Rauch, Béla Pécz, János Szívós, and János L. Lábár. "A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques." Microscopy and Microanalysis 21, no. 2 (2015): 422–35. http://dx.doi.org/10.1017/s1431927615000112.

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AbstractA new approach for measurement of local thickness and characterization of grain boundaries is presented. The method is embodied in a software tool that helps to find and set sample orientations useful for high-resolution transmission electron microscopic (HRTEM) examination of grain boundaries in polycrystalline thin films. The novelty is thesimultaneoustreatment of the two neighboring grains and orienting both grains and the boundary planesimultaneously. The same metric matrix-based formalism is used for all crystal systems. Input into the software tool includes orientation data for t

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Howe, J. M. "High-resolution tem of transformation interfaces in metals." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 284–87. http://dx.doi.org/10.1017/s0424820100126287.

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The advent of medium and high-voltage transmission electron microscopes with point-to-point resolutions below 0.2 nm has made it possible to study transformation interfaces in metals at the atomic level. Understanding the atomic structures of these interfaces is critical to understanding microstructural development and the resulting physical and mechanical properties of metals. One area of transformation interfaces in metals that has been investigated by high- resolution transmission electron microscopy (HRTEM), is the structures of interphase boundaries of metastable aging precipitates in Al

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Medlin, D. L., J. E. Smugeresky та D. Cohen. "Image Periodicities Introduced by Three-Fold Astigmatism in HRTEM Images of α-Al2O3 and Related Materials". Microscopy and Microanalysis 4, S2 (1998): 596–97. http://dx.doi.org/10.1017/s1431927600023102.

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HRTEM images of α-Al2O3 oriented along [1100] often exhibit a modulation of the basal fringe intensity with a period that corresponds to twice the basal plane spacing. In the example shown in figure 1, note the strong basal fringe contrast in the A12O3 with a period of 4.33 Å. HRTEM image simulations for ideal imaging conditions fail to reproduce this doubling of the lattice fringe period. Instead, simulated images predict that the (0006) fringes (d0006=2.17 Å) should be of equal intensity (e.g., see Figure 3a). Incorrect beam and/or crystal tilt can strongly affect HRTEM image contrast. In pa

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Sinkler, W., C. Michaelsen, and R. Bormann. "A transmission electron microscopy investigation of inverse melting in Nb45Cr55." Journal of Materials Research 12, no. 7 (1997): 1872–84. http://dx.doi.org/10.1557/jmr.1997.0257.

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In inverse melting, a supersaturated crystalline phase transforms polymorphously under heat treatment to the amorphous state. Inverse melting of body-centered cubic (bcc) Nb45Cr55 is studied using transmission electron microscopy (TEM) and high resolution TEM (HRTEM). The crystalline to amorphous transformation is heterogeneous, initiating at the bcc grain boundaries. HRTEM reveals 2–3 nm domains with medium range order (MRO) in the amorphous phase. Preferred orientation of MRO domains is found on a scale corresponding to the precursor bcc grain size. Using HRTEM and calorimetry, MRO developme

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Boulc'h, Florence, Marie-Claude Schouler, Patricia Donnadieu, Jean-Marc Chaix, and Elisabeth Djurado. "DOMAIN SIZE DISTRIBUTION OF Y-TZP NANO-PARTICLES USING XRD AND HRTEM." Image Analysis & Stereology 20, no. 3 (2011): 157. http://dx.doi.org/10.5566/ias.v20.p157-161.

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Yttria doped nanocrystalline zirconia powder was prepared by spray-pyrolysis technique. Powder crystallized into tetragonal form, as dense and compositionally homogeneous polycrystalline spheres. X-Ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM) have been used in order to characterize the mean size and the size distribution of crystalline domains. An average size of 6 nm was calculated by Scherrer formula from X-Ray diffraction pattern. The domain size, determined by analysis method developed by Hytch from HRTEM observations, ranges from 5 to 22 nm with a mai

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Lu, Jing Mei, and Xuan Cheng. "Analysis of Nanocrystal of Porous Silicon with High-Resolution Transmission Electron Microscopy." Advanced Materials Research 650 (January 2013): 34–38. http://dx.doi.org/10.4028/www.scientific.net/amr.650.34.

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The porous silicon samples were prepared with n(111) Si wafers by electrochemical polarization and their microstructures were characterized by high-resolution transmission electron microscopy (HRTEM). The DigitalMicrograph image processing was used to analyze the HRTEM images. The distorted Si (111) crystal plane was observed on porous silicon and could be distinguished with the Fourier transforming electron diffraction (ED) pattern. Grain boundaries were presented in the HRTEM images where the lattice fringes distortions took place. The anisotropy property could be preserved at a small locati

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Matsuda, Kenji, Junya Nakamura, Yoshio Nakamura, Tatsuo Sato та Susumu Ikeno. "Crystal Structure of the β'-Phase in Al-Mg-Si-Ag Alloy". Materials Science Forum 539-543 (березень 2007): 837–41. http://dx.doi.org/10.4028/www.scientific.net/msf.539-543.837.

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The crystal structure of metastable phase in Ag added Al-Mg-Si alloy was investigated by comparing the β’-phases in Al-Mg-Si alloy without Ag, using images of high resolution transmission electron microscope (HRTEM), selected area electron diffraction patterns (SADPs) and an energy dispersive X-ray spectroscopy (EDS). SADPs and HRTEM images obtained from metastable phase in the Ag added Al-Mg-Si alloy showed similar to those of β’-phase in Al-Mg-Si alloy without Ag and had different lattice spacings because of the effect of Ag. According to our careful analysis on obtained HRTEM images and SAD

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ICHINOSE, Hideki, Hidetaka SAWADA, and Eriko TAKUMA. "Grain Boundary Structure Analysis by HRTEM." Nihon Kessho Gakkaishi 47, no. 1 (2005): 3–8. http://dx.doi.org/10.5940/jcrsj.47.3.

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XU HUI-FANG, LUO GU-FENG, HU MEI-SHENG, and CHEN JUN. "HRTEM STUDY OF THE SUPERLATTICE ORTHOCLASE." Acta Physica Sinica 38, no. 9 (1989): 1527. http://dx.doi.org/10.7498/aps.38.1527.

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Glaisher, R. W., D. J. Smith, and A. E. C. Spargo. "Systematic HRTEM imaging of tetrahedral semiconductors." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (1987): C257. http://dx.doi.org/10.1107/s0108767387078589.

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Tao, CHEN, WANG Hejing, ZHANG Xiaoping, and ZHENG Nan. "SAED and HRTEM Investigation of Palygorskite." Acta Geologica Sinica - English Edition 82, no. 2 (2010): 385–91. http://dx.doi.org/10.1111/j.1755-6724.2008.tb00588.x.

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Miyazawa, K. "Hrtem Investigation of Pzt–c60Thin Films." Surface Engineering 17, no. 1 (2001): 38–40. http://dx.doi.org/10.1179/026708401101517584.

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Ernst, F., P. Pirouz, and A. H. Heuer. "HRTEM study of a Cu/Al2O3interface." Philosophical Magazine A 63, no. 2 (1991): 259–77. http://dx.doi.org/10.1080/01418619108204849.

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Kilaas, Roar. "Defect modeling in HRTEM image simulation." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 528–29. http://dx.doi.org/10.1017/s0424820100086957.

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One practical problem in High Resolution Transmission Electron Microscopy (HRTEM) image simulation is the creation of atomistic models of defect structures. The ideal crystal structures are readily represented by a relatively small number of “basis” atoms and the crystallographic space group. On the other hand, the specification of a grain boundary between two crystals requires the atomic location of possibly thousands of atoms, and a HRTEM simulation program will need all this information before a calculation can be carried out. Users comfortable with writing computer code will write a comput

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Medina-Flores, A., L. Béjar-Gómez, L. Zamora, A. Medina-Almazán, and J. Bernal. "HRTEM Analysis of Au-Cu Nanoparticles." Microscopy and Microanalysis 17, S2 (2011): 1052–53. http://dx.doi.org/10.1017/s1431927611006131.

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Zhou, W. "HRTEM investigation of mesoporous molecular sieves." Micron 31, no. 5 (2000): 605–11. http://dx.doi.org/10.1016/s0968-4328(99)00143-2.

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Sörgel, Timo, Lorenz Kienle, and Martin Jansen. "HRTEM and SAED investigations of CuxMTe2 ()." Solid State Sciences 8, no. 10 (2006): 1187–92. http://dx.doi.org/10.1016/j.solidstatesciences.2006.04.015.

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