Artykuły w czasopismach na temat „Metallized film capacitor”
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Belko, V., Liu Cheng, Sofiya Kalmykova, Aleksey Pechnikov, and Andrey Plotnikov. "Influence of Electrodes Configuration on Metallized Film Capacitor Performance Metrics." Problems of the Regional Energetics, no. 1(65) (January 2025): 121–34. https://doi.org/10.52254/1857-0070.2025.1-65.9.
Pełny tekst źródłaJia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying, and 韩春辉 Han Chunhui. "Reliability assessment of metallized film pulse capacitor." High Power Laser and Particle Beams 23, no. 1 (2011): 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.
Pełny tekst źródłaDr., Vinay Dua*. "DRASTIC CHANGE IN DIELECTRIC BREAKDOWN STRENGTH OF OIL SATURATED POLYMER FILM WITH TEMPERATURE." Global Journal of Engineering Science and Research Management 7, no. 4 (2020): 62–74. https://doi.org/10.5281/zenodo.3766188.
Pełny tekst źródłaVuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier, and J. L. Coulomb. "Optimization of Low-Voltage Metallized Film Capacitor Geometry." IEEE Transactions on Magnetics 43, no. 4 (2007): 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.
Pełny tekst źródłaHo, Janet, T. Jow, and Steven Boggs. "Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 6 (2008): 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.
Pełny tekst źródłaDu, Guoqiang, and Jie Zhang. "Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage." Electronics 13, no. 14 (2024): 2886. http://dx.doi.org/10.3390/electronics13142886.
Pełny tekst źródłaLi Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia, and Kong Zhonghua. "Study on Metallized Film Capacitor and Its Voltage Maintaining Performance." IEEE Transactions on Magnetics 45, no. 1 (2009): 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.
Pełny tekst źródłaChen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, et al. "Insulation resistance characteristics of metallized film capacitor under high electric field." High Power Laser and Particle Beams 24, no. 4 (2012): 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.
Pełny tekst źródłaBelko, V.O., O.A. Emelyanov, and I.O. Ivanov. "Processes of Self-Healing in Film Capacitors in Overload Modes." Problemele Energeticii Regionale 2(34) (August 15, 2017): 13–22. https://doi.org/10.5281/zenodo.1188819.
Pełny tekst źródłaKong, M. G., and Y. P. Lee. "Impact of surface discharge plasmas on performance of a metallized film capacitor." Journal of Applied Physics 90, no. 6 (2001): 3069–78. http://dx.doi.org/10.1063/1.1389072.
Pełny tekst źródłaLi, Hua, Yaohong Chen, Fuchang Lin, et al. "The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition." IEEE Transactions on Dielectrics and Electrical Insulation 18, no. 6 (2011): 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.
Pełny tekst źródłaDai, Xiying, Zhaoliang Xing, Wei Yang, et al. "The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films." International Journal of Polymer Science 2022 (November 8, 2022): 1–12. http://dx.doi.org/10.1155/2022/5970484.
Pełny tekst źródłaYoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee, and Heun-Young Lee. "The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications." Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, no. 5 (2011): 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.
Pełny tekst źródłaPeng, Bao Hua, J. L. Zhou, and Jing Feng. "Product Reliability Assessment Method Combining Degradation Data and Lifetime Data." Advanced Materials Research 44-46 (June 2008): 795–802. http://dx.doi.org/10.4028/www.scientific.net/amr.44-46.795.
Pełny tekst źródłaTai, Yunxiao, Pengqi Chen, Yang Jian, Qingqing Fang, Dang Xu, and Jigui Cheng. "Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity." Microelectronics Reliability 137 (October 2022): 114755. http://dx.doi.org/10.1016/j.microrel.2022.114755.
Pełny tekst źródłaZhang, Yong-Xin, Qi-Kun Feng, Shao-Long Zhong, et al. "Digital twin accelerating development of metallized film capacitor: Key issues, framework design and prospects." Energy Reports 7 (November 2021): 7704–15. http://dx.doi.org/10.1016/j.egyr.2021.10.116.
Pełny tekst źródłaLv, Chunlin, Jinjun Liu, Yan Zhang, Wanjun Lei, and Rui Cao. "An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process." Microelectronics Reliability 114 (November 2020): 113892. http://dx.doi.org/10.1016/j.microrel.2020.113892.
Pełny tekst źródłaZhang, Jie, Feipeng Wang, Yushuang He, Guoqiang Du, Lei Pan, and Xiao Zhang. "Risk classification of metallized film capacitor via energy recognition of the first self-healing." IET Conference Proceedings 2023, no. 46 (2023): 1302–4. https://doi.org/10.1049/icp.2024.2671.
Pełny tekst źródłaQi, Xiaoguang, and Steven Boggs. "Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots." Journal of Applied Physics 94, no. 7 (2003): 4449–56. http://dx.doi.org/10.1063/1.1602947.
Pełny tekst źródłaChen, Yaohong, Hua Li, Fuchang Lin, et al. "Study on Self-Healing and Lifetime Characteristics of Metallized-Film Capacitor Under High Electric Field." IEEE Transactions on Plasma Science 40, no. 8 (2012): 2014–19. http://dx.doi.org/10.1109/tps.2012.2200699.
Pełny tekst źródłaH. Lean, Meng, and Wei-Ping L. Chu. "Simulation of charge packet formation in layered polymer film." COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 33, no. 4 (2014): 1396–415. http://dx.doi.org/10.1108/compel-09-2013-0291.
Pełny tekst źródłaQi, Xiaoguang, and Steven Boggs. "Transient finite element computation of the temperature rise in metallized film capacitor end connections caused by underdamped discharge." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 1 (2008): 277–83. http://dx.doi.org/10.1109/t-dei.2008.4446761.
Pełny tekst źródłaDonhowe, Mark, Jeff Lawler, Sean Souffie, and E. Lee Stein. "250°C Operating Temperature Dielectric Film Capacitors." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2011, HITEN (2011): 000201–6. http://dx.doi.org/10.4071/hiten-paper2-mdonhowe.
Pełny tekst źródłaRevenok, T. V., V. V. Sleptsov, and A. O. Diteleva. "Research of electrode materials for the creation of multifunctional current sources with increased capacity as a components of the energy sector of an efficient urban environment." Construction Materials, no. 9 (October 9, 2024): 63–69. http://dx.doi.org/10.31659/0585-430x-2024-828-9-63-69.
Pełny tekst źródłaRytöluoto, Ilkka, Minna Niittymäki, Paolo Seri, et al. "Biaxially oriented silica–polypropylene nanocomposites for HVDC film capacitors: morphology-dielectric property relationships, and critical evaluation of the current progress and limitations." Journal of Materials Chemistry A 10, no. 6 (2022): 3025–43. http://dx.doi.org/10.1039/d1ta10336a.
Pełny tekst źródłaLi Hua, 李化, 陈耀红 Chen Yaohong, 林福昌 Lin Fuchang, and 彭波 Peng Bo. "Lifetime characteristics of metallized film pulsed capacitors." High Power Laser and Particle Beams 22, no. 4 (2010): 773–76. http://dx.doi.org/10.3788/hplpb20102204.0773.
Pełny tekst źródłaJoubert, Ch, A. Béroual, and G. Rojat. "Asymmetrical current distribution in metallized film capacitors." Journal of Applied Physics 95, no. 11 (2004): 6420–25. http://dx.doi.org/10.1063/1.1712009.
Pełny tekst źródłaOstrowski, Jörg, Ralf Hiptmair, and Henning Fuhrmann. "Electric 3D‐simulation of metallized film capacitors." COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 26, no. 2 (2007): 524–43. http://dx.doi.org/10.1108/03321640710727836.
Pełny tekst źródłaBelko, Victor, Ivan Ivanov, Andrey Plotnikov, and Valery Belanov. "Energy characteristics of self-healing process in metallized film capacitors." E3S Web of Conferences 140 (2019): 02006. http://dx.doi.org/10.1051/e3sconf/201914002006.
Pełny tekst źródłaSilvus, Stan, and Kenneth Cook. "Useful Technique for Analysis of Fluid-Filled Capacitors." EDFA Technical Articles 9, no. 2 (2007): 6–12. http://dx.doi.org/10.31399/asm.edfa.2007-2.p006.
Pełny tekst źródłaKong, M. G., and Y. P. Lee. "Electrically induced heat dissipation in metallized film capacitors." IEEE Transactions on Dielectrics and Electrical Insulation 11, no. 6 (2004): 1007–13. http://dx.doi.org/10.1109/tdei.2004.1387824.
Pełny tekst źródłaTortai, J. H., A. Denat, and N. Bonifaci. "Self-healing of capacitors with metallized film technology:." Journal of Electrostatics 53, no. 2 (2001): 159–69. http://dx.doi.org/10.1016/s0304-3886(01)00138-3.
Pełny tekst źródłaGodec, M., Dj Mandrino, and M. Gaberšček. "Investigation of performance degradation in metallized film capacitors." Applied Surface Science 273 (May 2013): 465–71. http://dx.doi.org/10.1016/j.apsusc.2013.02.063.
Pełny tekst źródłaKim, Namhun, Changju Park, Sangshin Kwak, and Jeihoon Baek. "Experimental Comparisons and Evaluations of Different Types of DC-link Capacitors for VSI-Based Electric Compressors in Battery Electric Vehicle Systems." Electronics 9, no. 8 (2020): 1276. http://dx.doi.org/10.3390/electronics9081276.
Pełny tekst źródłaKong, Zhong Hua, Li Gang Wu, Chun Ya Tong, and Zai Fei Luo. "Calculation of Self-Healing Contract Resistance of Metallized Film." Applied Mechanics and Materials 615 (August 2014): 236–39. http://dx.doi.org/10.4028/www.scientific.net/amm.615.236.
Pełny tekst źródłaPicci, G., and M. Rabuffi. "Pulse handling capability of energy storage metallized film capacitors." IEEE Transactions on Plasma Science 28, no. 5 (2000): 1603–6. http://dx.doi.org/10.1109/27.901241.
Pełny tekst źródłaBelko, Victor, Dmitry Glivenko, Oleg Emelyanov, Ivan Ivanov, and Andrey Plotnikov. "Current Pulse Polarity Effect on Metallized Film Capacitors Failure." IEEE Transactions on Plasma Science 45, no. 6 (2017): 1020–25. http://dx.doi.org/10.1109/tps.2017.2703947.
Pełny tekst źródłaLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime investigation and prediction of metallized polypropylene film capacitors." Microelectronics Reliability 53, no. 12 (2013): 1962–67. http://dx.doi.org/10.1016/j.microrel.2013.06.005.
Pełny tekst źródłaNa, J. G. "New method to predict corrosion characteristics of Zn‐metallized thin films for film capacitors." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13, no. 6 (1995): 2739–41. http://dx.doi.org/10.1116/1.579697.
Pełny tekst źródłaXiao, Meng, Mengdie Zhang, Haoliang Liu, Boxue Du, and Yawei Qin. "Dielectric Property and Breakdown Strength Performance of Long-Chain Branched Polypropylene for Metallized Film Capacitors." Materials 15, no. 9 (2022): 3071. http://dx.doi.org/10.3390/ma15093071.
Pełny tekst źródłaWang Wenjuan, 王文娟, 李化 Li Hua, 李智威 Li Zhiwei, 童勇 Tong Yong, and 林福昌 Lin Fuchang. "Lifetime improvement of metallized film capacitors by inner pressure strengthening." High Power Laser and Particle Beams 26, no. 4 (2014): 45015. http://dx.doi.org/10.3788/hplpb20142604.45015.
Pełny tekst źródłaBelko, Victor O., Oleg A. Emelyanov, Ivan O. Ivanov, Andrey P. Plotnikov, and Efrem G. Feklistov. "Application of Numerical Simulation for Metallized Film Capacitors Electrodes Design." IEEE Access 9 (2021): 80945–52. http://dx.doi.org/10.1109/access.2021.3085695.
Pełny tekst źródłaBelko, V. O., D. Y. Glivenko, O. A. Emelyanov, and I. O. Ivanov. "INVESTIGATION OF DEGRADATION IN ELECTRODE CONTACTS OF METALLIZED FILM CAPACITORS." St. Petersburg State Polytechnical University Journal 254, no. 4 (2017): 69–76. http://dx.doi.org/10.5862/jest.254.8.
Pełny tekst źródłaLi, Hua, Wenjuan Wang, Zhiwei Li, et al. "Polarization characteristics of metallized polypropylene film capacitors at different temperatures." IEEE Transactions on Dielectrics and Electrical Insulation 22, no. 2 (2015): 682–88. http://dx.doi.org/10.1109/tdei.2015.7076763.
Pełny tekst źródłaZhao, Jianyin, and Fang Liu. "Reliability assessment of the metallized film capacitors from degradation data." Microelectronics Reliability 47, no. 2-3 (2007): 434–36. http://dx.doi.org/10.1016/j.microrel.2006.05.013.
Pełny tekst źródłaMcCluskey, F. P., N. M. Li, and E. Mengotti. "Eliminating infant mortality in metallized film capacitors by defect detection." Microelectronics Reliability 54, no. 9-10 (2014): 1818–22. http://dx.doi.org/10.1016/j.microrel.2014.07.090.
Pełny tekst źródłaMakdessi, M., A. Sari, and P. Venet. "Metallized polymer film capacitors ageing law based on capacitance degradation." Microelectronics Reliability 54, no. 9-10 (2014): 1823–27. http://dx.doi.org/10.1016/j.microrel.2014.07.103.
Pełny tekst źródłaValentine, Nathan, Michael H. Azarian, and Michael Pecht. "Metallized film capacitors used for EMI filtering: A reliability review." Microelectronics Reliability 92 (January 2019): 123–35. http://dx.doi.org/10.1016/j.microrel.2018.11.003.
Pełny tekst źródłaEl-Husseini, M. H., P. Venet, G. Rojat, and C. Joubert. "Thermal simulation for geometric optimization of metallized polypropylene film capacitors." IEEE Transactions on Industry Applications 38, no. 3 (2002): 713–18. http://dx.doi.org/10.1109/tia.2002.1003421.
Pełny tekst źródłaLi, Zhiwei, Hua Li, Fuchang Lin, et al. "Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss." IEEE Transactions on Plasma Science 41, no. 5 (2013): 1313–18. http://dx.doi.org/10.1109/tps.2013.2243476.
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