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Artykuły w czasopismach na temat „TIQ COMPARATOR”

Autor: Grafiati
Data publikacji: 11 września 2023
Data aktualizacji: 31 lipca 2025

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1

Palsodkar, Prachi, Pravin Dakhole, and Prasanna Palsodkar. "Reduced Complexity Linearity Improved Threshold Quantized Comparator Based Flash ADC." Journal of Circuits, Systems and Computers 26, no. 03 (2016): 1750046. http://dx.doi.org/10.1142/s0218126617500463.

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This paper describes a standard cell-based new approach of comparator design for flash ADC. Conventional flash ADC comparator consumes up to 60% of the power due to resistive ladder network and analog comparators. Threshold inverter quantized (TIQ) comparators reported earlier have improved speed and provide low-power, low-voltage operation. But they need feature size variation and have non-linearity issues. Here, a new standard cell comparator is proposed which retains all advantages of TIQ comparator and provides improved linearity with reduced hardware complexity. A 4-bit ADC designed using
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2

Thai, Hong-Hai, Cong-Kha Pham, and Duc-Hung Le. "Design of a Low-Power and Low-Area 8-Bit Flash ADC Using a Double-Tail Comparator on 180 nm CMOS Process." Sensors 23, no. 1 (2022): 76. http://dx.doi.org/10.3390/s23010076.

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This paper presents a low-area 8-bit flash ADC that consumes low power. The flash ADC includes four main blocks—an analog multiplexer (MUX), a comparator, an encoder, and an SPI (Serial Peripheral Interface) block. The MUX allows the selection between eight analog inputs. The comparator block contains a TIQ (Threshold Inverter Quantization) comparator, a control circuit, and a proposed architecture of a Double-Tail (DT) comparator. The advantage of using the DT comparator is to reduce the number of comparators by half, which helps reduce the design area. The SPI block can provide a simple way
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3

KIM, I., J. YOO, J. KIM, and K. CHOI. "Highly Efficient Comparator Design Automation for TIQ Flash A/D Converter." IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E91-A, no. 12 (2008): 3415–22. http://dx.doi.org/10.1093/ietfec/e91-a.12.3415.

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4

Sankar, P. A. Gowri, and G. Sathiyabama. "A Novel CNFET Technology Based 3 Bit Flash ADC for Low-Voltage High Speed SoC Application." International Journal of Engineering Research in Africa 19 (October 2015): 19–36. http://dx.doi.org/10.4028/www.scientific.net/jera.19.19.

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The continuous scaling down of metal-oxide-semiconductor field effect transistors (MOSFETs) led to the considerable impact in the analog-digital mixed signal integrated circuit design for system-on-chips (SoCs) application. SoCs trends force ADCs to be integrated on the chip with other digital circuits. These trends present new challenges in ADC circuit design based on existing CMOS technology. In this paper, we have designed and analyzed a 3-bit high speed, low-voltage and low-power flash ADC at 32nm CNFET technology for SoC applications. The proposed ADC utilizes the Threshold Inverter Quant
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5

Kumar Nagar, Rajesh, and UBS Chandrawat. "Design of a 3.0 MSPS, 2.5V, 0.25 µm, 4-Bit Flash ADC Based on TIQ Comparator." International Journal of Engineering Trends and Technology 12, no. 3 (2014): 123–26. http://dx.doi.org/10.14445/22315381/ijett-v12p222.

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6

Senthil Sivakumar, M., and S. P. Joy Vasantha Rani. "Efficient Design of ADC BIST with an Analog Ramp Signal Generation and Digital Error Estimation." Journal of Circuits, Systems and Computers 28, no. 03 (2019): 1950042. http://dx.doi.org/10.1142/s0218126619500427.

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This paper presents the design of linear ramp generator and digital BIST for an on-chip ADC testing. It replaces the costly and time-consuming traditional mixed signal test methods like DSP-based testing, ATE, etc. The proposed on-chip analog ramp generator uses only a few transistors to generate linear ramp signal. A TIQ comparator based 8-bit flash ADC is taken under test. The output response of the ADC is analyzed in the digital BIST to measure the primary nonidealities affecting the linearity and accuracy of the data conversion. In testing, ADC generates the digital data sequence as a test
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7

Saman, B., R. H. Gudlavalleti, R. Mays, J. Chandy, Evan Heller, and F. Jain. "3-Bit Analog-to-Digital Converter Using Multi-State Spatial Wave-Function Switched FETs." International Journal of High Speed Electronics and Systems 29, no. 01n04 (2020): 2040014. http://dx.doi.org/10.1142/s0129156420400145.

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Multi-valued logic using multi-state spatial wavefunction switched (SWS)-FETs offers overall reduction in size and power as compared to conventional FET based circuits. This paper presents the design of compact 3-bit Analog-to-Digital Converters (ADC) implemented with SWS-FETs. A novel multi-valued Threshold Inverter Quantization (TIQ) based voltage comparator using SWS FET transistors has been proposed. Unlike conventional FETs, SWS-FETs are comprised of two or more vertically stacked coupled quantum well or quantum dot channels, and the spatial location of carriers within these channels is u
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8

Tangel, Ali, and Oktay Aytar. "MOS mismatch effects on TIQ comparators." International Journal of Electronics 96, no. 6 (2009): 561–70. http://dx.doi.org/10.1080/00207210902792783.

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9

Tan, Xin, Yu Qing Li, Xue Jie Liu, and Yan Hui Xie. "Structural and Mechanical Properties of Ti1-XAlxN Studied by Ab Initio." Advanced Materials Research 383-390 (November 2011): 3331–37. http://dx.doi.org/10.4028/www.scientific.net/amr.383-390.3331.

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Ti1-xAlxN films have been shown to exhibit superior mechanical and thermal properties and are thus widely used for industrial applications. We have studied the structural and mechanical properties of fcc-TiN and fcc-Ti1-xAlxN solid solution (x=0.25 and x=0.5), using first principles calculations based on the density functional theory. These calculations provide the lattice parameter, total energy, cohesive energy, elastic constants, etc, of the TiN lattice and when Al atoms replace Ti atoms in the TiN lattice. With regard to the cohesive energy of TiN and fcc-Ti1-xAlxN, we can obtain that the
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10

Vasjanov, Aleksandr, and Vaidotas Barzdėnas. "DESIGN OF A 65 NM CMOS COMPARATOR WITH HYSTERESIS / 65 NM KMOP TECHNOLOGIJOS HISTEREZINIO KOMPARATORIAUS PROJEKTAVIMAS." Mokslas – Lietuvos ateitis 6, no. 2 (2014): 202–5. http://dx.doi.org/10.3846/mla.2014.30.

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The comparator can be described as one of the basic building blocks in electronics. It is implemented both as a discrete device and as a constituent of a complex circuit. In both cases, the circuits usually operate in conditions, where useful and unwanted (noise) signals are present at the same time. In order to maintain the validity of output data, a hysteresis parameter is introduced to the comparator’s circuit. This article presents the results of a CMOS comparator with hysteresis design – the schematic, topology and simulation results are analyzed. The designed comparator is implemented in
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11

Shao, Haiming, Kaifeng Qu, Feipeng Lin, et al. "Magnetic Shielding Effectiveness of Current Comparator." IEEE Transactions on Instrumentation and Measurement 62, no. 6 (2013): 1486–90. http://dx.doi.org/10.1109/tim.2012.2228751.

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12

Coffield, Frederick E. "A high-performance digital phase comparator." IEEE Transactions on Instrumentation and Measurement IM-36, no. 3 (1987): 717–20. http://dx.doi.org/10.1109/tim.1987.6312777.

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13

So, E., and B. Djokic. "A Hybrid Electronically Coupled Current Comparator." IEEE Transactions on Instrumentation and Measurement 54, no. 2 (2005): 580–83. http://dx.doi.org/10.1109/tim.2004.843071.

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14

Zhao, Xiumin. "New comparator-type calibrator for instrument transformers." IEEE Transactions on Instrumentation and Measurement IM-36, no. 3 (1987): 755–58. http://dx.doi.org/10.1109/tim.1987.6312784.

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15

Avramov, S., and I. Zapunski. "An AC comparator for audio frequency waveforms." IEEE Transactions on Instrumentation and Measurement 40, no. 2 (1991): 373–76. http://dx.doi.org/10.1109/tim.1990.1032963.

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16

Abumurad, Abdulrahman, and Kyusun Choi. "Design Procedure and Selection of TIQ Comparators for Flash ADCs." Circuits, Systems, and Signal Processing 37, no. 2 (2017): 500–531. http://dx.doi.org/10.1007/s00034-017-0574-x.

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17

Met, Andrzej, Krzysztof Musiol, and Tadeusz Skubis. "Vector Voltmeter for High-Precision Unbalanced Comparator Bridge." IEEE Transactions on Instrumentation and Measurement 60, no. 2 (2011): 577–83. http://dx.doi.org/10.1109/tim.2010.2058555.

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18

Nakazoe, Jun, Kazuyuki Seki, and Minoru Abe. "A cascade comparator ADC using a magnetic modulator." IEEE Transactions on Instrumentation and Measurement IM-36, no. 2 (1987): 440–42. http://dx.doi.org/10.1109/tim.1987.6312716.

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19

Williams, J. M., and A. Hartland. "An automated cryogenic current comparator resistance ratio bridge." IEEE Transactions on Instrumentation and Measurement 40, no. 2 (1991): 267–70. http://dx.doi.org/10.1109/tim.1990.1032934.

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20

Santra, Sanchayan, Ranjan Mondal, and Bhabatosh Chanda. "Learning a Patch Quality Comparator for Single Image Dehazing." IEEE Transactions on Image Processing 27, no. 9 (2018): 4598–607. http://dx.doi.org/10.1109/tip.2018.2841198.

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21

Bierzychudek, M. E., and R. E. Elmquist. "Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator." IEEE Transactions on Instrumentation and Measurement 58, no. 4 (2009): 1170–75. http://dx.doi.org/10.1109/tim.2008.2006967.

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22

Gotz, Martin, Dietmar Drung, Eckart Pesel, et al. "Improved Cryogenic Current Comparator Setup With Digital Current Sources." IEEE Transactions on Instrumentation and Measurement 58, no. 4 (2009): 1176–82. http://dx.doi.org/10.1109/tim.2008.2012379.

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23

Bierzychudek, M. E., R. S. Sanchez-Pena, and Alejandra Tonina. "Robust Control of a Two-Terminal Cryogenic Current Comparator." IEEE Transactions on Instrumentation and Measurement 62, no. 6 (2013): 1736–42. http://dx.doi.org/10.1109/tim.2013.2240954.

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24

So, Eddy. "A microprocessor-controlled current-comparator-based DC voltage calibrator." IEEE Transactions on Instrumentation and Measurement IM-36, no. 2 (1987): 291–95. http://dx.doi.org/10.1109/tim.1987.6312689.

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25

Hao, L., J. C. Macfarlane, S. Haining, and J. C. Gallop. "HTS Superconducting Current Comparator: Dynamic Range and Noise Limits." IEEE Transactions on Instrumentation and Measurement 54, no. 2 (2005): 584–87. http://dx.doi.org/10.1109/tim.2005.843575.

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26

Bierzychudek, Marcos Eduardo, Martin Gotz, Ricardo S. Sanchez-Pena, Ricardo Iuzzolino, and Dietmar Drung. "Application of Robust Control to a Cryogenic Current Comparator." IEEE Transactions on Instrumentation and Measurement 66, no. 6 (2017): 1095–102. http://dx.doi.org/10.1109/tim.2017.2648898.

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27

Xiaobing, He, Wang Wei, Zhang Xin, and Dai Dongxue. "Research on High Accuracy Current Comparator and Self-Calibration Methods." IEEE Transactions on Instrumentation and Measurement 62, no. 6 (2013): 1669–74. http://dx.doi.org/10.1109/tim.2013.2253978.

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28

So, Eddy. "A Current-Comparator-Based 20-Bit Digital-to-Analog Converter." IEEE Transactions on Instrumentation and Measurement IM-34, no. 2 (1985): 278–82. http://dx.doi.org/10.1109/tim.1985.4315324.

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29

Williams, Earl S., and Joseph R. Kinard. "A Dual-Channel Automated Comparator for AC-DC Difference Measurements." IEEE Transactions on Instrumentation and Measurement IM-34, no. 2 (1985): 290–94. http://dx.doi.org/10.1109/tim.1985.4315327.

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30

Rietveld, G., E. Bartolome, J. Sese, et al. "1:30 000 cryogenic current comparator with optimum squid readout." IEEE Transactions on Instrumentation and Measurement 52, no. 2 (2003): 621–25. http://dx.doi.org/10.1109/tim.2003.809916.

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31

Sese, J., E. Bartolome, A. Camon, J. Flokstra, G. Rietveld, and C. Rillo. "Simplified calculus for the design of a cryogenic current comparator." IEEE Transactions on Instrumentation and Measurement 52, no. 2 (2003): 612–16. http://dx.doi.org/10.1109/tim.2003.811579.

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32

Bergman, D. I., and B. C. Waltrip. "A low-noise latching comparator probe for waveform sampling applications." IEEE Transactions on Instrumentation and Measurement 52, no. 4 (2003): 1107–13. http://dx.doi.org/10.1109/tim.2003.815982.

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33

Trinchera, Bruno, Danilo Serazio, and Umberto Pogliano. "Asynchronous Phase Comparator for Characterization of Devices for PMUs Calibrator." IEEE Transactions on Instrumentation and Measurement 66, no. 6 (2017): 1139–45. http://dx.doi.org/10.1109/tim.2017.2648598.

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34

Trinchera, Bruno, Vincenzo D'Elia, and Luca Callegaro. "A Digitally Assisted Current Comparator Bridge for Impedance Scaling at Audio Frequencies." IEEE Transactions on Instrumentation and Measurement 62, no. 6 (2013): 1771–75. http://dx.doi.org/10.1109/tim.2013.2238011.

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35

Delahaye, Francois, and Dominique Reymann. "Progress in Resistance Ratio Measurements Using a Cryogenic Current Comparator at LCIE." IEEE Transactions on Instrumentation and Measurement IM-34, no. 2 (1985): 316–19. http://dx.doi.org/10.1109/tim.1985.4315334.

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36

Ling Hao, J. C. Gallop, J. C. Macfarlane, and C. Carr. "HTS cryogenic current comparator for non-invasive sensing of charged particle beams." IEEE Transactions on Instrumentation and Measurement 52, no. 2 (2003): 617–20. http://dx.doi.org/10.1109/tim.2003.810456.

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37

Ren, S., H. Yang, and X. Wang. "The Theoretical Analysis of Open-Loop Characteristic for Double Magnetic Detector Comparator." IEEE Transactions on Instrumentation and Measurement 54, no. 2 (2005): 592–94. http://dx.doi.org/10.1109/tim.2004.843350.

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38

Yu, Haoyu, Xiaolong Chen, Jinsong Zhan, and Zhaoxiang Chen. "A Long-Range High Applicability Length Comparator for Linear Displacement Sensor Calibration." IEEE Transactions on Instrumentation and Measurement 70 (2021): 1–10. http://dx.doi.org/10.1109/tim.2020.3011795.

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39

Bierzychudek, Marcos Eduardo, Ricardo S. Sanchez-Pena, and Alejandra Tonina. "Identification and Control of a Cryogenic Current Comparator Using Robust Control Theory." IEEE Transactions on Instrumentation and Measurement 64, no. 12 (2015): 3451–57. http://dx.doi.org/10.1109/tim.2015.2459472.

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40

Djokic, Branislav, and Harold Parks. "A Synchronized Current-Comparator Bridge for the Calibration of Analog Merging Units." IEEE Transactions on Instrumentation and Measurement 68, no. 6 (2019): 1955–60. http://dx.doi.org/10.1109/tim.2018.2882117.

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41

Kinard, J. R., T. E. Lipe, and S. Avramov-Zamurovic. "A new binary inductive divider comparator system for measuring high-voltage thermal converters." IEEE Transactions on Instrumentation and Measurement 51, no. 5 (2002): 1045–49. http://dx.doi.org/10.1109/tim.2002.807794.

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42

Morath, C. P., K. Vaccaro, W. Buchwald, and W. R. Clark. "Comparator-Based Measurement Scheme for Dark-Count Rates in Single Photon Avalanche Diodes." IEEE Transactions on Instrumentation and Measurement 54, no. 5 (2005): 2020–26. http://dx.doi.org/10.1109/tim.2005.853347.

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43

Callegaro, Luca, Vincenzo D'Elia, Massimo Ortolano, and Faranak Pourdanesh. "A Three-Arm Current Comparator Bridge for Impedance Comparisons Over the Complex Plane." IEEE Transactions on Instrumentation and Measurement 64, no. 6 (2015): 1466–71. http://dx.doi.org/10.1109/tim.2015.2398953.

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44

Callegaro, Luca, Vincenzo D'Elia, Jan Kucera, Massimo Ortolano, Faranak Pourdanesh, and Bruno Trinchera. "Self-Compensating Networks for Four-Terminal-Pair Impedance Definition in Current Comparator Bridges." IEEE Transactions on Instrumentation and Measurement 65, no. 5 (2016): 1149–55. http://dx.doi.org/10.1109/tim.2015.2490898.

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45

Gotz, Martin, and Dietmar Drung. "Stability and Performance of the Binary Compensation Unit for Cryogenic Current Comparator Bridges." IEEE Transactions on Instrumentation and Measurement 66, no. 6 (2017): 1467–74. http://dx.doi.org/10.1109/tim.2017.2659998.

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46

Hwu, K. I., and Y. T. Yau. "Applying One-Comparator Counter-Based Sampling to Current Sharing Control of Multichannel LED Strings." IEEE Transactions on Industry Applications 47, no. 6 (2011): 2413–21. http://dx.doi.org/10.1109/tia.2011.2168596.

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47

Faisal, Agah, Jae Kap Jung, and Eddy So. "A Modified Technique for Calibration of Current-Comparator-Based Capacitance Bridge and Its Verification." IEEE Transactions on Instrumentation and Measurement 60, no. 7 (2011): 2642–47. http://dx.doi.org/10.1109/tim.2010.2096952.

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48

Shiyan Ren and Hengchun Ding. "A 300 000- a high precision DC comparator for on-line calibration and measurement." IEEE Transactions on Instrumentation and Measurement 40, no. 2 (1991): 281–83. http://dx.doi.org/10.1109/tim.1990.1032938.

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49

Elmquist, R. E., E. Hourdakis, D. G. Jarrett та N. M. Zimmerman. "Direct Resistance Comparisons From the QHR to 100 MΩ Using a Cryogenic Current Comparator". IEEE Transactions on Instrumentation and Measurement 54, № 2 (2005): 525–28. http://dx.doi.org/10.1109/tim.2004.843330.

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50

Poirier, Wilfrid, Dominique Leprat, and Felicien Schopfer. "A Resistance Bridge Based on a Cryogenic Current Comparator Achieving Sub-10⁻⁹ Measurement Uncertainties." IEEE Transactions on Instrumentation and Measurement 70 (2021): 1–14. http://dx.doi.org/10.1109/tim.2020.3010111.

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