Livros sobre o tema "Reliability of event recognition"
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P, Deines-Jones, and United States. National Aeronautics and Space Administration., eds. Automated track recognition and event reconstruction in nuclear emulsion. National Aeronautics and Space Administration, 1998.
Encontre o texto completo da fonteArmilio, Maria Luisa. Event-related potentials during learning and recognition of complex pictures. National Library of Canada, 1997.
Encontre o texto completo da fonteCarson-Berndsen, Julie. Time Map Phonology: Finite State Models and Event Logics in Speech Recognition. Springer Netherlands, 1998.
Encontre o texto completo da fonteWalshe, Kieran. The reliability and validity of adverse-event measures of the quality of healthcare. University of Birmingham, 1998.
Encontre o texto completo da fonteWierman, T. E. Common-cause failure database and analysis system: Event data collection, classification, and coding. U.S. Nuclear Regulatory Commission, Office of Nuclear Regulatory Research, 2007.
Encontre o texto completo da fonteGwan, Choi, and United States. National Aeronautics and Space Administration., eds. The single event effect characteristics of the 486-DX4 microprocessor: Test report. National Aeronautics and Space Administration, 1996.
Encontre o texto completo da fonteYuriy, Greg M. Discrete-event simulation of mine equipment systems combined with a reliability assessment model /by Greg M. Yuriy. Laurentian University, School of Graduate Studies, 2005.
Encontre o texto completo da fonteSchneider, Jörg, and Ton Vrouwenvelder. Introduction to safety and reliability of structures. 3rd ed. International Association for Bridge and Structural Engineering (IABSE), 1997. http://dx.doi.org/10.2749/sed005.
Texto completo da fonteInternational Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany). Defect recognition and image processing in semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub., 1998.
Encontre o texto completo da fonteservice), SpringerLink (Online, ed. Machine Vision Handbook. Springer London, 2012.
Encontre o texto completo da fonteMcNulty, G. J. Quality, Reliability and Maintenance (Imeche Event Publications). Professional Engineering Publishing, 2004.
Encontre o texto completo da fontePattern Recognition For Reliability Assessment Of Water Distribution Networks. CRC Press, 2012.
Encontre o texto completo da fonteHUZURBAZAR. FLOWGRAPH MODELS FOR MULTISTATE TIME TO EVENT DATA. JOHN WILEY AND SONS LTD, 2004.
Encontre o texto completo da fonteElizandro, David, and Hamdy Taha. Fundamentals of Performance Evaluation of Computer-Based Systems: Discrete Event Simulation Using Excel/VBA. Taylor & Francis Group, 2020.
Encontre o texto completo da fonteElizandro, David, and Hamdy Taha. Fundamentals of Performance Evaluation of Computer-Based Systems: Discrete Event Simulation Using Excel/VBA. Taylor & Francis Group, 2020.
Encontre o texto completo da fonteElizandro, David, and Hamdy Taha. Fundamentals of Performance Evaluation of Computer-Based Systems: Discrete Event Simulation Using Excel/VBA. Taylor & Francis Group, 2020.
Encontre o texto completo da fonteElizandro, David, and Hamdy Taha. Fundamentals of Performance Evaluation of Computer-Based Systems: Discrete Event Simulation Using Excel/VBA. Taylor & Francis Group, 2017.
Encontre o texto completo da fonteElizandro, David, and Hamdy Taha. Fundamentals of Performance Evaluation of Computer-Based Systems: Discrete Event Simulation Using Excel/VBA. Taylor & Francis Group, 2020.
Encontre o texto completo da fonteIntroducing Event-Based Revenue Recognition (EBRR) with SAP S/4HANA. Rheinwerk Publishing Inc., 2023.
Encontre o texto completo da fonteBlandón-Gitlin, Iris, and Amelia Mindthoff. Do Video Recordings Help Jurors Recognize Coercive Influences in Interrogations? Oxford University Press, 2018. http://dx.doi.org/10.1093/oso/9780190658113.003.0010.
Texto completo da fontePoucet, A. E. J. ES-RBE Event Sequence Reliability Benchmark Exercise: Summary Contributions of Participants. European Communities / Union (EUR-OP/OOPEC/OPOCE), 1992.
Encontre o texto completo da fonteTime map phonology: Finite state models and event logics in speech recognition. Kluwer, 1998.
Encontre o texto completo da fonteGat, Yves Le. Recurrent Event Modeling Based on the Yule Process: Application to Water Network Asset Management. Wiley & Sons, Incorporated, John, 2015.
Encontre o texto completo da fonteGat, Yves Le. Recurrent Event Modeling Based on the Yule Process: Application to Water Network Asset Management. Wiley & Sons, Incorporated, John, 2015.
Encontre o texto completo da fonteGat, Yves Le. Recurrent Event Modeling Based on the Yule Process: Application to Water Network Asset Management. Wiley & Sons, Incorporated, John, 2015.
Encontre o texto completo da fonteGat, Yves Le. Recurrent Event Modeling Based on the Yule Process: Application to Water Network Asset Management. Wiley & Sons, Incorporated, John, 2016.
Encontre o texto completo da fonteTrifunovic, N. Pattern Recognition for Reliability Assessment of Water Distribution Networks: UNESCO-IHE PhD Thesis. Taylor & Francis Group, 2012.
Encontre o texto completo da fonteTrifunovic, N. Pattern Recognition for Reliability Assessment of Water Distribution Networks: UNESCO-Ihe PhD Thesis. Taylor & Francis Group, 2012.
Encontre o texto completo da fonteTrifunovic, N. Pattern Recognition for Reliability Assessment of Water Distribution Networks: UNESCO-IHE PhD Thesis. Taylor & Francis Group, 2012.
Encontre o texto completo da fontePattern Recognition for Reliability Assessment of Water Distribution Networks: UNESCO-IHE PhD Thesis. Taylor & Francis Group, 2017.
Encontre o texto completo da fonteCrosby, Donald A. Multiplicity of Interpreted Worlds. Rowman & Littlefield, 2022. https://doi.org/10.5040/9781978734913.
Texto completo da fonteBrandzel, Amy, and Jigna Desai. Racism without Recognition. University of Illinois Press, 2017. http://dx.doi.org/10.5406/illinois/9780252037832.003.0004.
Texto completo da fonteDetection and Recognition of Events in Video (Event 2001): 2001 IEEE Workshop (IEEE Conference Proceedings). Computer Science Press, 2001.
Encontre o texto completo da fonteStability, reliability, and cross-mode correlations of tests in a recommended 8-minute performance assessment battery. National Aeronautics and Space Administration, 1986.
Encontre o texto completo da fonteDenecke, Kerstin. Event-Driven Surveillance: Possibilities and Challenges. Springer, 2012.
Encontre o texto completo da fonteCarson-Berndsen, J. Time Map Phonology: Finite State Models and Event Logics in Speech Recognition (Text, Speech and Language Technology). Springer, 1997.
Encontre o texto completo da fonteGuffey, Patrick J., and Martin Culwick. Adverse Event Prevention and Management. Oxford University Press, 2016. http://dx.doi.org/10.1093/med/9780199366149.003.0009.
Texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part II. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part VI. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part III. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part V. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteKrähenbühl, Adrien, Bertrand Kerautret, Miguel Colom, Daniel Lopresti, and Pascal Monasse. Reproducible Research in Pattern Recognition: Third International Workshop, RRPR 2021, Virtual Event, January 11, 2021, Revised Selected Papers. Springer International Publishing AG, 2021.
Encontre o texto completo da fontePriselac, Sandra. Exploring the parameters of retrieval mode in a recognition memory task using behavioural and event-related potential methodologies. 2006.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part I. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part III. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part VII. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteBimbo, Alberto Del, Tao Mei, Giovanni Maria Farinella, Rita Cucchiara, and Stan Sclaroff. Pattern Recognition and Information Forensics: ICPR 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings, Part VII. Springer International Publishing AG, 2021.
Encontre o texto completo da fonteTemplin, Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th :. 1997 :., J. Donecker, and I. Rechenberg. Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, ... (Institute of Physics Conference Series). Taylor & Francis, 1998.
Encontre o texto completo da fonteO'Neal, Greg. When the lights go out: "analyzing San Diego's fuel plan in the event of a prolonged power outage". 2012.
Encontre o texto completo da fonte