Conecte-se

Bibliografias temáticas / Transmission electron

Literatura científica selecionada sobre o tema "Transmission electron"

Autor: Grafiati

Publicado: 15 de setembro de 2021

Última modificação: 18 de fevereiro de 2022

Crie uma referência precisa em APA, MLA, Chicago, Harvard, e outros estilos

Selecione um tipo de fonte:

Consulte a lista de atuais artigos, livros, teses, anais de congressos e outras fontes científicas relevantes para o tema "Transmission electron".

Ao lado de cada fonte na lista de referências, há um botão "Adicionar à bibliografia". Clique e geraremos automaticamente a citação bibliográfica do trabalho escolhido no estilo de citação de que você precisa: APA, MLA, Harvard, Chicago, Vancouver, etc.

Você também pode baixar o texto completo da publicação científica em formato .pdf e ler o resumo do trabalho online se estiver presente nos metadados.

Índice

Artigos de revistas
Teses / dissertações
Livros
Capítulos de livros
Trabalhos de conferências
Relatórios de organizações

Artigos de revistas sobre o assunto "Transmission electron":

1

KONNO, Mitsuru, Toshie YAGUCHI e Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope". Journal of the Japan Society of Colour Material 79, n.º 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

2

Moldovan, G., X. Li, P. Wilshaw e AI Kirkland. "Counting Electrons in Transmission Electron Microscopes". Microscopy and Microanalysis 14, S2 (agosto de 2008): 912–13. http://dx.doi.org/10.1017/s1431927608084912.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

3

Shindo, Daisuke. "Transmission Electron Microscope". Materia Japan 44, n.º 11 (2005): 932–35. http://dx.doi.org/10.2320/materia.44.932.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Yase, Kiyoshi. "Transmission Electron Microscopy." Kobunshi 43, n.º 2 (1994): 94–97. http://dx.doi.org/10.1295/kobunshi.43.94.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

5

Bendersky, L. A., e F. W. Gayle. "Electron diffraction using transmission electron microscopy". Journal of Research of the National Institute of Standards and Technology 106, n.º 6 (novembro de 2001): 997. http://dx.doi.org/10.6028/jres.106.051.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

6

Lichte, Hannes. "Electron Holography Improving Transmission Electron Microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 208–9. http://dx.doi.org/10.1017/s0424820100179798.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:

7

Brydson, R., A. Brown, L. G. Benning e K. Livi. "Analytical Transmission Electron Microscopy". Reviews in Mineralogy and Geochemistry 78, n.º 1 (1 de janeiro de 2014): 219–69. http://dx.doi.org/10.2138/rmg.2014.78.6.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

8

Doyama, Masao, Yoshiaki Kogure, Miyoshi Inoue, Yoshihiko Hayashi, Toshimasa Yoshiie, Toshikazu Kurihara, Ryuichiro Oshima e Katsushige Tsuno. "Transmission Positron-Electron Microscopes". Materials Science Forum 445-446 (janeiro de 2004): 471–73. http://dx.doi.org/10.4028/www.scientific.net/msf.445-446.471.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev e L. Schäfer. "ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY". Fine Chemical Technologies 12, n.º 1 (28 de fevereiro de 2017): 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Ultrafast laser spectral and electron diffraction methods complement each other and open up new possibilities in chemistry and physics to light up atomic and molecular motions involved in the primary processes governing structural transitions. Since the 1980s, scientific laboratories in the world have begun to develop a new field of research aimed at this goal. “Atomic-molecular movies” will allow visualizing coherent dynamics of nuclei in molecules and fast processes in chemical reactions in real time. Modern femtosecond and picosecond laser sources have made it possible to significantly change the traditional approaches using continuous electron beams, to create ultrabright pulsed photoelectron sources, to catch ultrafast processes in the matter initiated by ultrashort laser pulses and to achieve high spatio-temporal resolution in research. There are several research laboratories all over the world experimenting or planning to experiment with ultrafast electron diffraction and possessing electron microscopes adapted to operate with ultrashort electron beams. It should be emphasized that creating a new-generation electron microscope is of crucial importance, because successful realization of this project demonstrates the potential of leading national research centers and their ability to work at the forefront of modern science.

10

Urban, K. "Picometer Transmission Electron Microscopy". Microscopy and Microanalysis 17, S2 (julho de 2011): 1314–15. http://dx.doi.org/10.1017/s1431927611007446.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Mais fontes

Teses / dissertações sobre o assunto "Transmission electron":

1

Jin, Liang. "Direct electron detection in transmission electron microscopy". Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Thesis (Ph. D.)--University of California, San Diego, 2009.
Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).

2

McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy". Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI, Ca XVIII, Ti XX, Cr XXII, Fe XXIV and Ni XXVI. Including relativistic effects in the calculations leads to the generation of 24 fine-structure energy levels when orbitals with 11,/ =:; 5 are considered. Oscillator strengths, were generated for all 276 transitions arising amongst these levels when maintaining a frozen core of Is2 Ã‚Â• Comparisons were made with both theoretical and experimental data available from the publications of Nahar & Pradhan (1999), Nahar (2002), Whiteford et al (2002) and Del Zanna (2006), along with NIST data. Collisional calculations were performed for Fe XXIV, an abundant ion in solar and fusion plasmas, which has the potential to be employed in photo-pumping schemes for X-ray lasers. The calculations were performed using the Dirac Atomic Relativistic Code (DARC; Ait-Tahar, Grant & Norrington 1996), which is a fully relativistic code based on R-matrix theory. In addition to carrying out these calculations, DARC was further developed to provide a solution to the problem of convergence which affects optically allowed transitions in the above threshold energy region. Comparison of these results was made with data already available in the literature, with discrepancies being highlighted and discussed. The work of Berrington & Tully (1997) did not include the n=5 orbital, and comparisons with the results presented here showed how important these are for low temperatures. Discrepancies between this work and that of Whiteford et al (2002) were also identified. Despite being given access to their unpublished data, the source of the identified discrepancies remains elusive. The problems identified require further investigation which lies beyond the scope and resources of the present work.

3

Worden, R. H. "Transmission electron microscopy of metamorphic reactions". Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Chan, Yu Fai. "Nanostructure characterization by transmission electron microscopy /". View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2002.
Includes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.

5

Löfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope". Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Electron vortex beams (EVBs) are electron beams with a doughnut-like intensity profile, carrying orbital angular momentum due to their helical phase shift distribution. When employed in an electron microscope, they are expected to be efficient for the detection of magnetic signals. In this report I have investigated high angle annular dark field (HAADF) images obtained using EVBs. This was done for 300 K and 5K. For 5 K, I also compared HAADF images from an ordinary electron beam with HAADF images from an electron vortex beam. What was found was that EVBs produced doughnuts around the atomic columns. However, when taking the size of the electron source into account, this phenomena could no longer be observed. When comparing images from EVBs with images from ordinary electron beams, I found that the intensity of scattered electrons around atomic columns was broader for EVBs. This was persistent even after taking the source size into account.
Elektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.

6

Agarwal, Akshay. "A nanofabricated amplitude-division electron interferometer in a transmission electron microscope". Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.
"September 2016." Cataloged from PDF version of thesis.
Includes bibliographical references (pages 56-62).
Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'.
by Akshay Agarwal.
S.M.

7

Johnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope". Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

The technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.

8

Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /". Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Koda, Nobuko. "Transmission electron microscopy studies of fega alloys". College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Resumo:

Thesis (M.S.) -- University of Maryland, College Park, 2003.
Thesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.

10

Hetherington, C. "Transmission electron microscopy of GaAs/AlGaAs multilayers". Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Mais fontes

Livros sobre o assunto "Transmission electron":

1

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

2

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

3

Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Carter, C. Barry, e David B. Williams, eds. Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

5

Williams, David B., e C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

6

Williams, David B., e C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

7

Thomas, Jürgen, e Thomas Gemming. Analytical Transmission Electron Microscopy. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-8601-0.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

8

Zuo, Jian Min, e John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Deepak, Francis Leonard, Alvaro Mayoral e Raul Arenal, eds. Advanced Transmission Electron Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

10

Pennycook, Stephen J., e Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Mais fontes

Capítulos de livros sobre o assunto "Transmission electron":

1

Williams, David B., e C. Barry Carter. "Electron Sources". In Transmission Electron Microscopy, 73–89. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

2

Kruit, Pieter. "Electron Sources". In Transmission Electron Microscopy, 1–15. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_1.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

3

Weyland, Matthew, e Paul Midgley. "Electron Tomography". In Transmission Electron Microscopy, 343–76. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_12.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Lehmann, Michael, e Hannes Lichte. "Electron Holography". In Transmission Electron Microscopy, 215–32. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_8.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

5

Williams, David B., e C. Barry Carter. "Electron Sources". In Transmission Electron Microscopy, 67–83. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

6

Reimer, Ludwig. "Electron-Specimen Interactions". In Transmission Electron Microscopy, 143–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

7

Reimer, Ludwig. "Electron-Specimen Interactions". In Transmission Electron Microscopy, 136–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

8

Reimer, Ludwig. "Analytical Electron Microscopy". In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_9.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Reimer, Ludwig. "Electron-Specimen Interactions". In Transmission Electron Microscopy, 136–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

10

Reimer, Ludwig. "Analytical Electron Microscopy". In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_9.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Trabalhos de conferências sobre o assunto "Transmission electron":

1

Krysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza e Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope". In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

2

Krajnak, Matus. "Transforming transmission electron microscopy with MerlinEM electron counting detector". In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.594.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

3

Bach, Nora, Armin Feist, Till Domrose, Marcel Moller, Nara Rubiano da Silva, Thomas Danz, Sascha Schafer e Claus Ropers. "Highly coherent femtosecond electron pulses for ultrafast transmission electron microscopy". In 2017 30th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2017. http://dx.doi.org/10.1109/ivnc.2017.8051554.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Pennycook, S. J. "Transmission Electron Microscopy: Overview and Challenges". In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology. AIP, 2003. http://dx.doi.org/10.1063/1.1622537.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

5

Leth Larsen, Matthew Helmi. "Deep learning assisted transmission electron microscopy". In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.924.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

6

Nicholls, Daniel. "Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy". In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.159.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

7

Feist, Armin, Katharina E. Echternkamp, Reiner Bormann, Nara Rubiano da Silva, Marcel Möller, Wenxi Liang, Sascha Schäfer e Claus Ropers. "Few-nanometer femtosecond electron probe pulses in ultrafast transmission electron microscopy". In International Conference on Ultrafast Phenomena. Washington, D.C.: OSA, 2016. http://dx.doi.org/10.1364/up.2016.uth2b.5.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

8

De Graef, Marc. "Recent Progress in Lorentz Transmission Electron Microscopy". In ESOMAT 2009 - 8th European Symposium on Martensitic Transformations. Les Ulis, France: EDP Sciences, 2009. http://dx.doi.org/10.1051/esomat/200901002.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Xie, Wenkai, Xi Chen, Lin Meng, Xinyan Gao e Shenggang Liu. "Electron-beam transmission properties in plasma channel". In AeroSense 2002, editado por Howard E. Brandt. SPIE, 2002. http://dx.doi.org/10.1117/12.469835.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

10

Merrill, F. E., A. J. Clarke, J. Goett, J. W. Gibbs, C. Hast, S. D. Imhoff, K. Jobe et al. "Demonstration of transmission high energy electron microscopy". In SHOCK COMPRESSION OF CONDENSED MATTER - 2019: Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter. AIP Publishing, 2020. http://dx.doi.org/10.1063/12.0000952.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

Relatórios de organizações sobre o assunto "Transmission electron":

1

Ren, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, janeiro de 2001. http://dx.doi.org/10.21236/ada392051.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

2

Libera, Matthew R. Transmission Electron Holography of Polymer Microstructure. Fort Belvoir, VA: Defense Technical Information Center, abril de 1998. http://dx.doi.org/10.21236/ada344467.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

3

Fraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, outubro de 1987. http://dx.doi.org/10.21236/ada189111.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

4

Pennycook, S. J., e A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), junho de 2008. http://dx.doi.org/10.2172/939888.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

5

Minor, Andrew M. In situ nanoindentation in a transmission electron microscope. Office of Scientific and Technical Information (OSTI), janeiro de 2002. http://dx.doi.org/10.2172/807441.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

6

Reed, B., M. Armstrong, K. Blobaum, N. Browning, A. Burnham, G. Campbell, R. Gee et al. Time Resolved Phase Transitions via Dynamic Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), fevereiro de 2007. http://dx.doi.org/10.2172/902321.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

7

Dietz, N. L. Transmission electron microscopy analysis of corroded metal waste forms. Office of Scientific and Technical Information (OSTI), abril de 2005. http://dx.doi.org/10.2172/861616.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

8

Clark, Waylon T., Michael D. Pelock, Jeremy Paul Martin, Daniel Peter Jr Jackson, Mark Edward Savage, Brian Scott Stoltzfus, Clifford Will, Jr Mendel e Timothy David Pointon. Precision electron flow measurements in a disk transmission line. Office of Scientific and Technical Information (OSTI), janeiro de 2008. http://dx.doi.org/10.2172/932880.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

9

Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), setembro de 1992. http://dx.doi.org/10.2172/10170120.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.

10

Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), setembro de 1992. http://dx.doi.org/10.2172/6282616.

Texto completo da fonte

Estilos ABNT, Harvard, Vancouver, APA, etc.