Увійти

Готові списки джерел за темами / Correlative EBSD / Статті в журналах

Статті в журналах з теми "Correlative EBSD"

Щоб переглянути інші типи публікацій з цієї теми, перейдіть за посиланням: Correlative EBSD.

Автор: Grafiati

Опубліковано: 13 вересня 2021

Оновлено: 13 лютого 2022

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся з топ-50 статей у журналах для дослідження на тему "Correlative EBSD".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.

1

Chen, Y., K. P. Rice, T. J. Prosa, M. M. Nowell, and S. I. Wright. "Correlative t-EBSD Tomography and Atom Probe Tomography Analysis." Microscopy and Microanalysis 22, S3 (July 2016): 682–83. http://dx.doi.org/10.1017/s1431927616004268.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

2

Jiang, Jun, Tiantian Zhang, Fionn Dunne, and Ben Britton. "The Power of Correlative Microscopy–Understanding Deformation Compatibility with HR-EBSD and HR-DIC." Microscopy and Microanalysis 22, S3 (July 2016): 1930–31. http://dx.doi.org/10.1017/s1431927616010497.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

3

Stokes, Adam, Mowafak Al-Jassim, Dave Diercks, Brian Egaas, and Brian Gorman. "Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM and APT." Microscopy and Microanalysis 21, S3 (August 2015): 43–44. http://dx.doi.org/10.1017/s1431927615001014.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

4

Tsai, Shao-Pu, Peter Konijnenberg, Stefan Zaefferer, Nicolas Peter, Baptiste Gault, Kaori Kawano-Miyata, Dayong An, and Thomas Alister Griffiths. "Correlative Microscopy Observation (3D EBSD + APT + TEM) on Intergranular Corrosion Behaviors in 316L Stainless Steel." Microscopy and Microanalysis 25, S2 (August 2019): 748–49. http://dx.doi.org/10.1017/s1431927619004471.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

5

Stoffers, Andreas, Oana Cojocaru-Mirédin, Winfried Seifert, Stefan Zaefferer, Stephan Riepe, and Dierk Raabe. "Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography." Progress in Photovoltaics: Research and Applications 23, no. 12 (May 8, 2015): 1742–53. http://dx.doi.org/10.1002/pip.2614.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

6

Müller, M., D. Britz, and F. Mücklich. "Scale-bridging Microstructural Analysis – A Correlative Approach to Microstructure Quantification Combining Microscopic Images and EBSD Data." Practical Metallography 58, no. 7 (July 1, 2021): 408–26. http://dx.doi.org/10.1515/pm-2021-0032.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Abstract A comprehensive description of complex material structures may require characterization using different methods and observations across several scales. This work will present a correlative approach including light optical microscopy, scanning electron microscopy and electron backscatter diffraction, enabling microstructure quantification which combines microscopic images and electron backscatter diffraction data. The parameters obtained from electron backscatter diffraction such as misorientation parameters or grain and phase boundary data are an ideal source of information, complementing microscopic images. Two case studies performed on bainitic microstructures will be presented to demonstrate practical applications of this approach.

7

Zhang, Leifeng, Bertrand Radiguet, Patrick Todeschini, Christophe Domain, Yang Shen, and Philippe Pareige. "Investigation of solute segregation behavior using a correlative EBSD/TKD/APT methodology in a 16MND5 weld." Journal of Nuclear Materials 523 (September 2019): 434–43. http://dx.doi.org/10.1016/j.jnucmat.2019.06.002.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

8

Magazzeni, Christopher M., Hazel M. Gardner, Inigo Howe, Phillip Gopon, John C. Waite, David Rugg, David E. J. Armstrong, and Angus J. Wilkinson. "Nanoindentation in multi-modal map combinations: a correlative approach to local mechanical property assessment." Journal of Materials Research 36, no. 11 (January 4, 2021): 2235–50. http://dx.doi.org/10.1557/s43578-020-00035-y.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Abstract A method is presented for the registration and correlation of property maps of materials, including data from nanoindentation hardness, Electron Back-Scattered Diffraction (EBSD), and Electron Micro-Probe Analysis (EPMA). This highly spatially resolved method allows for the study of micron-scale microstructural features, and has the capability to rapidly extract correlations between multiple features of interest from datasets containing thousands of data points. Two case studies are presented in commercially pure (CP) titanium: in the first instance, the effect of crystal anisotropy on measured hardness and, in the second instance, the effect of an oxygen diffusion layer on hardness. The independently collected property maps are registered using affine geometric transformations and are interpolated to allow for direct correlation. The results show strong agreement with trends observed in the literature, as well as providing a large dataset to facilitate future statistical analysis of microstructure-dependent mechanisms. Graphical abstract

9

Sulzer, Sabin, Zhuangming Li, Stefan Zaefferer, Seyed Masood Hafez Haghighat, Angus Wilkinson, Dierk Raabe, and Roger Reed. "On the assessment of creep damage evolution in nickel-based superalloys through correlative HR-EBSD and cECCI studies." Acta Materialia 185 (February 2020): 13–27. http://dx.doi.org/10.1016/j.actamat.2019.07.018.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

10

KAHL, W. A., N. DILISSEN, K. HIDAS, C. J. GARRIDO, V. LÓPEZ-SÁNCHEZ-VIZCAÍNO та M. J. ROMÁN-ALPISTE. "3-D microstructure of olivine in complex geological materials reconstructed by correlative X-ray μ-CT and EBSD analyses". Journal of Microscopy 268, № 2 (7 липня 2017): 193–207. http://dx.doi.org/10.1111/jmi.12598.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

11

Wang, Zhangwei, Ji Gu, Dayong An, Yong Liu, and Min Song. "Characterization of the microstructure and deformation substructure evolution in a hierarchal high-entropy alloy by correlative EBSD and ECCI." Intermetallics 121 (June 2020): 106788. http://dx.doi.org/10.1016/j.intermet.2020.106788.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

12

Schwarz, T., G. Stechmann, B. Gault, O. Cojocaru-Miredin, P. Choi, A. Redinger, S. Siebentritt, and D. Raabe. "Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-film Solar Cells." Microscopy and Microanalysis 23, S1 (July 2017): 672–73. http://dx.doi.org/10.1017/s1431927617004020.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

13

Örnek, C., and D. L. Engelberg. "Correlative EBSD and SKPFM characterisation of microstructure development to assist determination of corrosion propensity in grade 2205 duplex stainless steel." Journal of Materials Science 51, no. 4 (October 28, 2015): 1931–48. http://dx.doi.org/10.1007/s10853-015-9501-3.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

14

Zeibig, Daria, Timo Bernthaler, Gerhard Schneider, and Stefanie Freitag. "Visualization of Crystal Orientation and the Granulate Sub-Grain Size in Lithium Ion Batteries by Means of EBSD and Correlative Microscopy." Microscopy and Microanalysis 24, S1 (August 2018): 1512–13. http://dx.doi.org/10.1017/s1431927618008048.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

15

Gardner, H. M., P. Gopon, C. M. Magazzeni, A. Radecka, K. Fox, D. Rugg, J. Wade, D. E. J. Armstrong, M. P. Moody, and P. A. J. Bagot. "Quantifying the effect of oxygen on micro-mechanical properties of a near-alpha titanium alloy." Journal of Materials Research 36, no. 12 (January 11, 2021): 2529–44. http://dx.doi.org/10.1557/s43578-020-00006-3.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

AbstractTitanium alloys are widely used in the aerospace industry, yet oxygen ingress can severely degrade the mechanical properties of titanium alloy components. Atom probe tomography (APT), electron probe microanalysis (EPMA) and nanoindentation were used to characterise the oxygen-rich layer on an in-service jet engine compressor disc, manufactured from the titanium alloy TIMETAL 834. Oxygen ingress was quantified and related to changes in mechanical properties through nanoindentation studies. The relationship between oxygen concentration, microstructure, crystal orientation and hardness has been explored through correlative hardness mapping, EPMA and electron backscatter diffraction (EBSD). It has been found that the hardening effects of microstructure and crystallography are only significant at very low-oxygen concentrations, whereas interstitial solid solution hardening dominates by order of magnitude for higher oxygen concentrations. The role of microstructure on oxygen ingress has been studied and oxygen ingress along a potential α/β interface was directly observed on the nanoscale using APT.

16

Shade, P., M. Groeber, M. Uchic, and R. Wheeler. "Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD." Microscopy and Microanalysis 18, S2 (July 2012): 720–21. http://dx.doi.org/10.1017/s1431927612005454.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

17

Fuertes, Nuria, and Rachel Pettersson. "Effect of cold rolling on microstructure, corrosion and electrochemical response of the lean duplex stainless steel LDX 2101® by a correlative EBSD–SKPFM investigation." Materials and Corrosion 71, no. 7 (March 18, 2020): 1052–65. http://dx.doi.org/10.1002/maco.202011588.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

18

Mitchell, R. L., M. Coleman, P. Davies, L. North, E. C. Pope, C. Pleydell-Pearce, W. Harris, and R. Johnston. "Macro-to-nanoscale investigation of wall-plate joints in the acorn barnacle Semibalanus balanoides : correlative imaging, biological form and function, and bioinspiration." Journal of The Royal Society Interface 16, no. 157 (August 2019): 20190218. http://dx.doi.org/10.1098/rsif.2019.0218.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Correlative imaging combines information from multiple modalities (physical–chemical–mechanical properties) at various length scales (centimetre to nanometre) to understand the complex biological materials across dimensions (2D–3D). Here, we have used numerous coupled systems: X-ray microscopy (XRM), scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), optical light microscopy (LM) and focused ion beam (FIB-SEM) microscopy to ascertain the microstructural and crystallographic properties of the wall-plate joints in the barnacle Semibalanus balanoides . The exoskeleton is composed of six interlocking wall plates, and the interlocks between neighbouring plates (alae) allow barnacles to expand and grow while remaining sealed and structurally strong. Our results indicate that the ala contain functionally graded orientations and microstructures in their crystallography, which has implications for naturally functioning microstructures, potential natural strengthening and preferred oriented biomineralization. Elongated grains at the outer edge of the ala are oriented perpendicularly to the contact surface, and the c -axis rotates with the radius of the ala. Additionally, we identify for the first time three-dimensional nanoscale ala pore networks revealing that the pores are only visible at the tip of the ala and that pore thickening occurs on the inside (soft bodied) edge of the plates. The pore networks appear to have the same orientation as the oriented crystallography, and we deduce that the pore networks are probably organic channels and pockets, which are involved with the biomineralization process. Understanding these multiscale features contributes towards an understanding of the structural architecture in barnacles, but also their consideration for bioinspiration of human-made materials. The work demonstrates that correlative methods spanning different length scales, dimensions and modes enable the extension of the structure–property relationships in materials to form and function of organisms.

19

Lee, Youn Kyu, and Dohoon Kim. "A Taxonomy for Security Flaws in Event-Based Systems." Applied Sciences 10, no. 20 (October 20, 2020): 7338. http://dx.doi.org/10.3390/app10207338.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Event-based system (EBS) is prevalent in various systems including mobile cyber physical systems (MCPSs), Internet of Things (IoT) applications, mobile applications, and web applications, because of its particular communication model that uses implicit invocation and concurrency between components. However, an EBS’s non-determinism in event processing can introduce inherent security vulnerabilities into the system. Multiple types of attacks can incapacitate and damage a target EBS by exploiting this event-based communication model. To minimize the risk of security threats in EBSs, security efforts are required by determining the types of security flaws in the system, the relationship between the flaws, and feasible techniques for dealing with each flaw. However, existing security flaw taxonomies do not appropriately reflect the security issues that originate from an EBS’s characteristics. In this paper, we introduce a new taxonomy that defines and classifies the particular types of inherent security flaws in an EBS, which can serve as a basis for resolving its specific security problems. We also correlate our taxonomy with security attacks that can exploit each flaw and identify existing solutions that can be applied to preventing such attacks. We demonstrate that our taxonomy handles particular aspects of EBSs not covered by existing taxonomies.

20

Vaudin, M. D., AJ Gayle, L. H. Friedman, and R. F. Cook. "Strain Mapping Using EBSD Cross Correlation and Raman Methods." Microscopy and Microanalysis 24, S1 (August 2018): 960–61. http://dx.doi.org/10.1017/s1431927618005299.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

21

Wagner, F., N. Allain-Bonasso, and S. Berbenni. "Automatic correlation of grains from two different EBSD maps." Materials Characterization 62, no. 7 (July 2011): 681–83. http://dx.doi.org/10.1016/j.matchar.2011.04.012.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

22

Stojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.

23

Hansen, Landon T., Brian E. Jackson, David T. Fullwood, Stuart I. Wright, Marc De Graef, Eric R. Homer, and Robert H. Wagoner. "Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)." Microscopy and Microanalysis 23, no. 3 (March 6, 2017): 460–71. http://dx.doi.org/10.1017/s1431927617000204.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

AbstractStudies of dislocation density evolution are fundamental to improved understanding in various areas of deformation mechanics. Recent advances in cross-correlation techniques, applied to electron backscatter diffraction (EBSD) data have particularly shed light on geometrically necessary dislocation (GND) behavior. However, the framework is relatively computationally expensive—patterns are typically saved from the EBSD scan and analyzed offline. A better understanding of the impact of EBSD pattern degradation, such as binning, compression, and various forms of noise, is vital to enable optimization of rapid and low-cost GND analysis. This paper tackles the problem by setting up a set of simulated patterns that mimic real patterns corresponding to a known GND field. The patterns are subsequently degraded in terms of resolution and noise, and the GND densities calculated from the degraded patterns using cross-correlation ESBD are compared with the known values. Some confirmation of validity of the computational degradation of patterns by considering real pattern degradation is also undertaken. The results demonstrate that the EBSD technique is not particularly sensitive to lower levels of binning and image compression, but the precision is sensitive to Poisson-type noise. Some insight is also gained concerning effects of mixed patterns at a grain boundary on measured GND content.

24

Kamaya, Masayuki, Joao Quinta da Fonseca, L. M. Li, and Michael Preuss. "Local Plastic Strain Measurement by EBSD." Applied Mechanics and Materials 7-8 (August 2007): 173–79. http://dx.doi.org/10.4028/www.scientific.net/amm.7-8.173.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Work has been carried out recently, which demonstrates misorientation measurements recorded by using electron backscatter diffraction (EBSD) enables one to undertake local post mortem plastic strain quantification once the degree of misorientation is calibrated against plastic strain. The present paper builds on this work and investigates the possibility of determining strain in individual grains. Due to the anisotropy of crystalline grains, polycrystalline material deform inhomogeneously on a microstructural level. In this study, the local strain induced in a pure copper specimen during tensile loading measured using EBSD was compared to in-situ strain measurements using optical microscopy imaging in conjunction with image correlation technique. By applying an averaging procedure for improving the accuracy of the measured EBSD data, the distribution of the misorientation within grains was quantified, and, as one would expect, it tended to be highest near the grain boundaries.

25

Picard, Yoosuf N., Ranga Kamaladasa, Marc De Graef, Noel T. Nuhfer, William J. Mershon, Tony Owens, Libor Sedlacek, and Filip Lopour. "Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling." Microscopy Today 20, no. 2 (February 28, 2012): 12–16. http://dx.doi.org/10.1017/s1551929512000077.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Electron diffraction in both SEM and TEM provides a contrast mechanism for imaging defects as well as a means for quantifying elastic strain. Electron backscatter diffraction (EBSD) is the commercially established method for SEM-based diffraction analysis. In EBSD, Kikuchi patterns are acquired by a charge-coupled device (CCD) camera and indexed using commercial software. Phase and crystallographic orientation information can be extracted from these Kikuchi patterns, and researchers have developed cross-correlation methods to measure strain as well.

26

Kumar, Mukul, Adam J. Schwartz, and Wayne E. King. "Correlating observations of deformation microstructures by TEM and automated EBSD techniques." Materials Science and Engineering: A 309-310 (July 2001): 78–81. http://dx.doi.org/10.1016/s0921-5093(00)01771-8.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

27

Higginson, R. L., and G. D. West. "The Study of Texture Development of High Temperature Oxide Scales on Steel Substrates Using Electron Backscatter Diffraction." Materials Science Forum 495-497 (September 2005): 399–404. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.399.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Low silicon carbon steel has been oxidised at varying temperatures in free flowing air using a thermomechanical simulator to control heating and cooling rates. The resultant oxide scales have been studies using Electron Backscatter Diffraction (EBSD) and the phases identified by the differences in the diffraction patterns. The crystallographic textures were calculated from the EBSD data. There is a correlation between the textures of the different phase layers within the scale, which depends on the formation mechanism of the individual phases.

28

Zhao, Xiang, Xin Li Wang, Dong Xue Li та Wen Bin Dai. "Orientation Correlation during α→β Up-Transformation Induced by Electric Current Pulses in a Cu-Zn Alloy". Materials Science Forum 783-786 (травень 2014): 2406–9. http://dx.doi.org/10.4028/www.scientific.net/msf.783-786.2406.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

In this work, the orientation of the β variants within a single parent α grain on the α→β up-transformation induced by electric current pulses in a Cu-Zn alloy was investigated. Electron backscatter diffraction (EBSD) was used to determine the relationship between the α phase and the β variants. By EBSD analysis, it was found that crystallographic variant selection was observed not only across those prior α/α grain boundaries, but also within the α grain interior. Results revealed that the orientation relationship between the α phase and the β associated with nucleation from α phase was close to the Kurdjumov-Sachs (K-S) orientation relationship, which better described the orientation relationship for α nucleation within β grains.

29

Tsukimoto, Susumu, Tatsuhiko Ise, Genta Maruyama, Satoshi Hashimoto, Tsuguo Sakurada, Junji Senzaki, Tomohisa Kato, Kazutoshi Kojima, and Hajime Okumura. "Correlation between Local Strain Distribution and Microstructure of Grinding-Induced Damage Layers in 4H-SiC(0001)." Materials Science Forum 897 (May 2017): 177–80. http://dx.doi.org/10.4028/www.scientific.net/msf.897.177.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Evaluation of surface damage layers formed by mechanical grinding processes is indispensable in epi-ready SiC wafer preparation. As well as microstructure, the analysis of local strain distribution in the damage layers gives a clue on control of the wafer quality. Advanced electron backscatter diffraction (EBSD) technique is applied to evaluate the strain distribution of the damage layers. It is revealed that the elastic strain distribution can be classified into a hierarchy of three regions with respect to depth from the surface. Combining EBSD analysis with TEM observation, large compressive elastic strain and misorientation are introduced in the highly-defective region underneath the ground wafer surface. In addition, the gradient distribution of the strain is observed clearly below the highly-defective region. The knowledge of correlating between strain distribution and microstructure is promising to control the damage layer for the wafer preparation.

30

Vaudin, M. D., G. Stan, Y. B. Gerbig, and R. F. Cook. "High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM." Ultramicroscopy 111, no. 8 (July 2011): 1206–13. http://dx.doi.org/10.1016/j.ultramic.2011.01.039.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

31

Vaudin, MD, G. Stan, YB Gerbig, and RF Cook. "High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,." Microscopy and Microanalysis 15, S2 (July 2009): 416–17. http://dx.doi.org/10.1017/s1431927609093076.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

32

Biswas, Partha, P. S. Kannaki, Satish Kumar Shekhawat, Indradev Samajdar, V. Deshmukh, S. S. Sahay, Eric M. Johnson, and Mohamad El-Zein. "Fatigue Failure, Residual Stress and Misorientation - A Possible Correlation." Materials Science Forum 702-703 (December 2011): 307–10. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.307.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Two grades of Steel, with tempered martensitic structure, were used for fatigue tests. From such tests, samples were obtained with significant differences in the probability of fatigue failure. The latter was related to surface/sub-surface misorientation developments and developments in compressive residual stresses. A combination of glancing incidence X-ray diffraction (GIXRD) and high resolution cross-sectional EBSD (electron back scattered diffraction) were used. The study brings out a clear correlation between misorientation, residual stress and fatigue life.

33

Bechtold, Marion, Marco Witte, and Sascha Kluge. "On the Correlation between Microstructure Homogeneity and Formability in Two Multi Phase Steels Treated with Different Cooling Strategies." Materials Science Forum 854 (May 2016): 22–28. http://dx.doi.org/10.4028/www.scientific.net/msf.854.22.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

In the scope of the optimization of multi phase steels, e.g. for the automotive industry, control of the microstructure is essential to tailor the mechanical properties. In this study, two cold rolled steels varying in carbon content were annealed and cooled under different laboratory conditions. The microstructure is investigated using optical and electron microscopy and EBSD. The results are correlated to the mechanical properties obtained from tensile, hole expansion and bending test. It is found that tensile strength and elongation are mainly dependent on martensite volume fraction, while yield strength is less affected by chemical composition or annealing treatment. In contrast, hole expansion capacity and maximum bending angle are significantly improved by the homogenization of the microstructure which is independent of strength and elongation. The microstructure homogeneity is expressed by analyzing the Lorenz curves derived from the kernel average misorientation from EBSD measurements.

34

Jiang, Jun, Tiantian Zhang, Fionn P. E. Dunne, and T. Ben Britton. "Deformation compatibility in a single crystalline Ni superalloy." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 472, no. 2185 (January 2016): 20150690. http://dx.doi.org/10.1098/rspa.2015.0690.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Deformation in materials is often complex and requires rigorous understanding to predict engineering component lifetime. Experimental understanding of deformation requires utilization of advanced characterization techniques, such as high spatial resolution digital image correlation (HR-DIC) and high angular resolution electron backscatter diffraction (HR-EBSD), combined with clear interpretation of their results to understand how a material has deformed. In this study, we use HR-DIC and HR-EBSD to explore the mechanical behaviour of a single-crystal nickel alloy and to highlight opportunities to understand the complete deformations state in materials. Coupling of HR-DIC and HR-EBSD enables us to precisely focus on the extent which we can access the deformation gradient, F , in its entirety and uncouple contributions from elastic deformation gradients, slip and rigid body rotations. Our results show a clear demonstration of the capabilities of these techniques, found within our experimental toolbox, to underpin fundamental mechanistic studies of deformation in polycrystalline materials and the role of microstructure.

35

Rauch, Edgar F., Muriel Véron, Stavros Nicolopoulos, and Daniel Bultreys. "Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science." Solid State Phenomena 186 (March 2012): 13–15. http://dx.doi.org/10.4028/www.scientific.net/ssp.186.13.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

EBSD is a well known technique that allows orientation and phase mapping using an SEM. Although the technique is very powerful, has serious limitations related with a) special resolution limited to 50 nm (SEM-FEG) and b) specimen preparation issues as is not possible to obtain EBSD signal from rough surfaces or strained materials , nanoparticles etc.. To address those difficulties , a novel technique has been developed recently (EBSD-TEM like) allowing automatic orientation and phase mapping using template matching analysis of acquired diffraction patterns in TEM. Electron beam is scanned through the sample area of interest ; the acquired electron diffraction patterns from several sample locations are compared via cross-correlation matching techniques with pre-calculted simulated templates to reveal local crystal orientation and phases. The dedicated device (ASTAR) allows orientation and phase identification of crystallographic orientation in a region of interest up to 10µm2, with a step size ranging from 1nm to 20nm depending on the transmission electron microscope setting (FEG or LaB6).

36

Jackson, Brian E., Jordan J. Christensen, Saransh Singh, Marc De Graef, David T. Fullwood, Eric R. Homer, and Robert H. Wagoner. "Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction." Microscopy and Microanalysis 22, no. 4 (August 2016): 789–802. http://dx.doi.org/10.1017/s143192761601148x.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

AbstractHigh-resolution (or “cross-correlation”) electron backscatter diffraction analysis (HR-EBSD) utilizes cross-correlation techniques to determine relative orientation and distortion of an experimental electron backscatter diffraction pattern with respect to a reference pattern. The integrity of absolute strain and tetragonality measurements of a standard Si/SiGe material have previously been analyzed using reference patterns produced by kinematical simulation. Although the results were promising, the noise levels were significantly higher for kinematically produced patterns, compared with real patterns taken from the Si region of the sample. This paper applies HR-EBSD techniques to analyze lattice distortion in an Si/SiGe sample, using recently developed dynamically simulated patterns. The results are compared with those from experimental and kinematically simulated patterns. Dynamical patterns provide significantly more precision than kinematical patterns. Dynamical patterns also provide better estimates of tetragonality at low levels of distortion relative to the reference pattern; kinematical patterns can perform better at large values of relative tetragonality due to the ability to rapidly generate patterns relating to a distorted lattice. A library of dynamically generated patterns with different lattice parameters might be used to achieve a similar advantage. The convergence of the cross-correlation approach is also assessed for the different reference pattern types.

37

Llanos, Laura, Beatriz Pereda, Denis Jorge Badiola, J. M. Rodriguez-Ibabe, and Beatriz López. "Study of Recrystallization in High Manganese Steels by Means of the EBSD Technique." Materials Science Forum 753 (March 2013): 443–48. http://dx.doi.org/10.4028/www.scientific.net/msf.753.443.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

The softening processes that take place after hot deformation in two high Mn steels, one of them microalloyed with 0.1%Nb, have been investigated. Double hit torsion tests were carried out in order to determine the mechanical softening at temperatures ranging from 900 to 1100°C. In addition, the applicability of different parameters obtained by means of the Electron Back Scattering Diffraction (EBSD) technique to estimate the recrystallized fraction was investigated. It has been found that the Grain Orientation Spread (GOS) is the parameter that best allows quantifying the recrystallized fraction under the conditions investigated. The correlation between the mechanical softening and the recrystallized fraction measured by EBSD depends on the material and deformation conditions. A good correlation between both values is observed for the base steel at all the temperatures. However, for the Nb microalloyed steel, although at high temperatures a good correlation is also observed, at low temperatures the mechanical softening fraction tends to be larger than the recrystallized fraction denoting that recovery has an important contribution.

38

Schwartz, A. J., M. Kumar, P. J. Bedrossian, and W. E. King. "Coupling Automated Electron Backscatter Diffraction with Transmission Electron and Atomic Force Microscopies." Microscopy and Microanalysis 6, S2 (August 2000): 940–41. http://dx.doi.org/10.1017/s1431927600037193.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Grain boundary network engineering is an emerging field that encompasses the concept that modifications to conventional thermomechanical processing can result in improved properties through the disruption of the random grain boundary network. Various researchers have reported a correlation between the grain boundary character distribution (defined as the fractions of “special” and “random” grain boundaries) and dramatic improvements in properties such as corrosion and stress corrosion cracking, creep, etc. While much early work in the field emphasized property improvements, the opportunity now exists to elucidate the underlying materials science of grain boundary network engineering. Recent investigations at LLNL have coupled automated electron backscatter diffraction (EBSD) with transmission electron microscopy (TEM)5 and atomic force microscopy (AFM) to elucidate these fundamental mechanisms.An example of the coupling of TEM and EBSD is given in Figures 1-3. The EBSD image in Figure 1 reveals “segmentation” of boundaries from special to random and random to special and low angle grain boundaries in some grains, but not others, resulting from the 15% compression of an Inconel 600 polycrystal.

39

Grossin, D., C. Henrist, J.-Ph Mathieu, S. Meslin, C. Harnois, J.-G. Noudem, R. Cloots, and D. Chateigner. "EBSD study on YBCO textured bulk samples: correlation between crystal growth and ‘microtexture’." Superconductor Science and Technology 19, no. 2 (January 10, 2006): 190–99. http://dx.doi.org/10.1088/0953-2048/19/2/007.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

40

Albou, Adeline, S. Raveendra, P. Karajagikar, Indradev Samajdar, Julian H. Driver, and Claire Maurice. "Direct Observations of Cube Nucleation from Intergranular Cube Segments in Cold Rolled Al-Mn." Materials Science Forum 715-716 (April 2012): 354–59. http://dx.doi.org/10.4028/www.scientific.net/msf.715-716.354.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Two major types of Cube bands/segments have been observed in heavily (90%) cold rolled Al-0.1wt %Mn using the EBSD technique with a FEG SEM: i) intergranular transition bands as thin cube segments aligned along RD between S and Cu oriented grains and ii) as transgranular strain localized bands situated in some particular grains. Their evolution is studied by light annealing at 275°C and 300°C and EBSD observations of exactly the same areas to directly correlate local deformation substructure with recrystallization. Only the intergranular cube transition bands give rapid recrystallization nucleation to cube grains of dimension >10µm. In particular the fastest growing cube grains have a near 40°<111> relation with part of their surroundings.

41

Guilmeau, E., Catherine Henrist, Tohru Suzuki, Yoshio Sakka, Daniel Chateigner, D. Grossin, and B. Ouladdiaf. "Texture of Alumina by Neutron Diffraction and SEM-EBSD." Materials Science Forum 495-497 (September 2005): 1395–400. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.1395.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

The orientation distributions of α-Al2O3 textured ceramics are determined from neutron diffraction and SEM-EBSD. A curved position-sensitive detector coupled to a tilt angle (χ) scan allowed the whole neutron diffraction pattern treatment in the combined Rietveld-WIMV-Popa algorithm. Analyses from neutron and electron diffraction data gave similar results if EBSD data are smoothed to account for grain statistics. Four textured alumina ceramics were prepared by slipcasting under a high magnetic field and sintered at 800°C, 1300°C, 1400°C and 1600°C. The inverse pole figures and EBSD-mapping highlights the influence of the magnetic field and sintering temperature on the texture development. The inverse pole figures calculated for the fiber direction show a major (001) component for all the samples. With the increasing sintering temperature, the texture strength is enhanced and the c-axis distribution is sharper. The effectiveness of the combined approach for determining the crystallite size is also evident. As a global trend, the calculated crystallite size and observed grain size are similar and increase with the increasing sintering temperature. The mechanism of the texture development in the sintered specimens is certainly initiated from the preferred orientation of the green body after slip-casting under a high magnetic field. The basal texture is enhanced during sintering by selective anisotropic grain growth. We evidenced here the powerfulness of the Rietveld texture analysis correlated to SEM-EBSD calculation to provide a basis for the correlation of texture, microstructural parameters and anisotropic properties.

42

Nowell, Matthew M., Shawn W. Wallace, Jens Rafaelsen, Tara L. Nylese, René de Kloe, and Stuart I. Wright. "Correlating Complementary Data for Improving Electron Backscatter Diffraction (EBSD) Microstructural Characterization of Geological Materials." Microscopy and Microanalysis 23, S1 (July 2017): 2166–67. http://dx.doi.org/10.1017/s1431927617011497.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

43

Shi, Qiwei, Dominique Loisnard, Chengyi Dan, Fengguo Zhang, Hongru Zhong, Han Li, Yuda Li, Zhe Chen, Haowei Wang, and Stéphane Roux. "Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation." Materials Characterization 178 (August 2021): 111206. http://dx.doi.org/10.1016/j.matchar.2021.111206.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

44

Ko, Lawrence C. L., and Joao Quinta da Fonseca. "Measurement of Strain and Lattice Rotation in the Particle Deformation Zone." Materials Science Forum 753 (March 2013): 21–24. http://dx.doi.org/10.4028/www.scientific.net/msf.753.21.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

It is known that there is lattice rotation around the particles after deformation, in a so-called Particle Deformation Zone (PDZ), which is thought to be important in randomizing the texture after recrystallization though Particle Stimulated Nucleation (PSN). However, the role of the local distribution of stored energy and its link to local lattice rotation is not well understood, making it impossible to successfully predict PSN efficiency. Here, we present a new method for studying the deformation around particles with the use of Digital Image Correlation (DIC) of High-Resolution Scanning Electron Microscopy (HRSEM) image and Electron BackScatter Diffraction (EBSD) map. Combining these two techniques makes it possible, for the first time, to relate the local deformation fields to remnant changes in local lattice orientation. Initial measurements are made on a model Al-Si alloy deformed in plane-strain condition by channel die compression up to 30%. Our analysis shows that the material deforms heterogeneously with high levels of deformation localized along slip bands. EBSD analysis shows that the lattice distortion in these bands is minimal. The HRDIC analysis clearly shows particles interrupt the slip banding. Local lattice rotation measured by EBSD is considerably less than expected from the measured deformation.

45

Choi, Z.-S., R. Mönig, and C. V. Thompson. "Effects of microstructure on the formation, shape, and motion of voids during electromigration in passivated copper interconnects." Journal of Materials Research 23, no. 2 (February 2008): 383–91. http://dx.doi.org/10.1557/jmr.2008.0054.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

In situ scanning electron microscope observations have been performed on passivated damascene Cu interconnect segments of different widths during accelerated electromigration tests. In some cases, voids form and grow at the cathode. However, an alternative failure mode is also observed, during which voids form distant from the cathode end of the interconnect segment and drift toward the cathode, where they eventually lead to failure. The number of observations of this failure mode increased with increasing linewidth. During void motion, the shape and the velocity of the drifting voids varied significantly. Postmortem electron backscattered diffraction (EBSD) analysis was performed after in situ testing, and a correlation of EBSD data with the in situ observations reveals that locations at which voids form, their shape evolution, and their motion all strongly depend on the locations of grain boundaries and the crystallographic orientations of neighboring grains.

46

Jackson, Brian, David Fullwood, Jordan Christensen та Stuart Wright. "Resolving pseudosymmetry in γ-TiAl using cross-correlation electron backscatter diffraction with dynamically simulated reference patterns". Journal of Applied Crystallography 51, № 3 (13 квітня 2018): 655–69. http://dx.doi.org/10.1107/s1600576718003849.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Pseudosymmetry is a phenomenon that occurs when grains with different lattice parameters produce nearly identical diffraction patterns such that conventional electron backscatter diffraction (EBSD) techniques are unable to unambiguously differentiate the lattice orientations. This commonly occurs in materials with near-unity tetragonality, such as γ-TiAl. The current study uses cross-correlation EBSD to resolve pseudosymmetry in γ-TiAl. Three dynamically simulated reference patterns are generated for each point in the scan, one for each of the three potential pseudosymmetric orientations, which are subsequently correlated with the original pattern using six different methods in order to identify the correct orientation. The methods are first applied to a scan of dynamically simulated patterns, which is used to evaluate the sensitivity of the method to pattern resolution, pattern noise and pattern center error. It was determined that all six methods were 100% successful up to about 13 µm of pattern center error and pattern resolutions of about 80 × 80 pixels, and hence the methods were applied to an experimental sample of lamellar γ-TiAl. A hybrid combination of two of the methods was shown to successfully select the correct pseudosymmetry for about 96% of the points in the scan, improving upon the 70% accuracy of the Hough-based methods for the current study and 90% accuracy for previous studies resolving pseudosymmetry in lamellar γ-TiAl.

47

Brandaleze, Elena, Valeria Peirani, and Martina Ávalos. "Mould Fluxes Viscosity and Surface Tension Influence on the Wear Mechanisms of Al₂O₃-C Nozzle." Advances in Science and Technology 92 (October 2014): 226–31. http://dx.doi.org/10.4028/www.scientific.net/ast.92.226.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

A deep understanding of the mould flux effect on the wear mechanisms of Al2O3-C nozzles (AG) is relevant to avoid premature damage and to decrease the cost of black refractories in the industry. In this paper, a post mortem study on a nozzle was carried out to identify the causes of the wear mechanisms during the continuous casting of billets. Physical properties such as viscosity and surface tension of the mould fluxes were determined at operation temperature (1550oC), in order to correlate with microstructural results obtained by light and scanning electron microscopy (SEM). Also dihedral angle φ measurements were carried out at high magnification by SEM. Applying EDS analysis the infiltrated mould flux chemical composition was determined. The study was completed by EBSD. The EBSD technique contributed to increase the knowledge on wear mechanisms because of the possibility of identifying and localizing phases together with crystalline condition. The phases, the grain orientations and the properties of grain boundaries, have a large influence on the corrosion behaviour. Therefore, it is essential to have a characterization technique that can provide information such as: grain size, orientation, misorientation angle and the present phases. In this context, EBSD can provide relevant information on crystallographic and structural analysis of AG nozzle including the insert of ZrO2-C.

48

Samet-Meziou, Amel, Ph Gerber, Jacek Tarasiuk, Thierry Baudin, and Richard Penelle. "Monte Carlo Modelling of Recrystallization Process in Cold Rolled IF-Ti Steel." Materials Science Forum 467-470 (October 2004): 665–70. http://dx.doi.org/10.4028/www.scientific.net/msf.467-470.665.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

Recently, some authors have used the Monte Carlo modelling using complete set of experimental data to get a better correlation between experimental observations and calculations concerning recrystallization process [1, 2]. Simulations using Monte Carlo technique have been performed these last years for IF-Ti steels in order to predict the microstructure and the texture evolution after high reduction amounts by cold rolling [3, 4]. On the contrary, in the present work, this evolution is simulated in an IF-Ti steel cold rolled after low deformation amount (reduction amount R = 40 %). Microstructure is characterized by Electron Back-Scattered Diffraction and introduced in the model. The quality index of the Kikuchi patterns (EBSD data) is used to qualitatively evaluate the stored energy for each grain. Different hypothesis of nucleation mechanisms have been introduced into the model. It has been shown that the better recrystallization texture correlation between experiment and simulation is obtained by taking into account the nucleation in the low stored energy sites and highly misorientation regions. Finally a simulation issue was compared with EBSD and TEM experimental results: microstructure, recrystallization kinetics and Avrami coefficients values.

49

Claves, Steven R., and William J. Mills. "Influence of Crystallographic Texture on Young's Modulus of Various Alloy 82H Welds." Microscopy and Microanalysis 17, no. 3 (April 8, 2011): 341–49. http://dx.doi.org/10.1017/s1431927611000079.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

Анотація:

AbstractElectron backscatter diffraction (EBSD) was employed to analyze the microstructure and texture of four different Alloy 82H gas tungsten arc welds that previously underwent static and dynamic modulus testing. The Young's moduli were shown to differ among the various welds, but also within each weld, dependent upon the direction measured. These differences were attributed to anisotropy of the crystallographic textures, which were described using inverse pole figures with respect to each of the weld's three orthogonal axes. The Young's modulus demonstrated a strong correlation with the texture, consistent with single crystal experiments. Sample directions containing a large population of {100} orientations had the lowest Young's modulus, while those with {111} grains possessed the highest. Microstructures with {110} textures were closer to the average modulus value of 207 GPa (30.0 Msi). X-ray diffraction texture measurements on four samples were used to verify the EBSD results.

50

Kakimoto, Ryohei, Motomichi Koyama, and Kaneaki Tsuzaki. "EBSD- and ECCI-based Assessments of Inhomogeneous Plastic Strain Evolution Coupled with Digital Image Correlation." ISIJ International 59, no. 12 (December 15, 2019): 2334–42. http://dx.doi.org/10.2355/isijinternational.isijint-2019-232.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.