Добірка наукової літератури з теми "Grain boundary electron scattering"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся зі списками актуальних статей, книг, дисертацій, тез та інших наукових джерел на тему "Grain boundary electron scattering".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Статті в журналах з теми "Grain boundary electron scattering"
VANCEA, J. "UNCONVENTIONAL FEATURES OF FREE ELECTRONS IN POLYCRYSTALLINE METAL FILMS." International Journal of Modern Physics B 03, no. 10 (1989): 1455–501. http://dx.doi.org/10.1142/s0217979289000956.
Повний текст джерелаSilcox, J. "Electron Scattering with an Atomic Sized Probe." Microscopy and Microanalysis 6, S2 (2000): 102–3. http://dx.doi.org/10.1017/s1431927600033006.
Повний текст джерелаKumar, Sunil, and George C. Vradis. "Thermal Conductivity of Thin Metallic Films." Journal of Heat Transfer 116, no. 1 (1994): 28–34. http://dx.doi.org/10.1115/1.2910879.
Повний текст джерелаZhou, Tianji, Atharv Jog, and Daniel Gall. "First-principles prediction of electron grain boundary scattering in fcc metals." Applied Physics Letters 120, no. 24 (2022): 241603. http://dx.doi.org/10.1063/5.0098822.
Повний текст джерелаTakata, Naoki, Kenichi Ikeda, Hideharu Nakashima, and Nobuhiro Tsuji. "In Situ EBSP Analysis of Grain Boundary Migration during Recrystallization in Pure Aluminum Foils." Materials Science Forum 558-559 (October 2007): 351–56. http://dx.doi.org/10.4028/www.scientific.net/msf.558-559.351.
Повний текст джерелаAlzobaie, Ammar Rahman, and May AbdulSattar Mohammed. "The Effect Scattering of Phonons, Surface and Grain Boundary on Electrical Properties for Magnesium and Palladium Nano Metallic." Journal of Physics: Conference Series 3028, no. 1 (2025): 012017. https://doi.org/10.1088/1742-6596/3028/1/012017.
Повний текст джерелаZhang, Zhi Guo. "Bridge Action of Double-Deck Films Interface Electrons." Applied Mechanics and Materials 217-219 (November 2012): 1038–42. http://dx.doi.org/10.4028/www.scientific.net/amm.217-219.1038.
Повний текст джерелаGuo, Xitao, Yonghao Tan, Yupei Hu, et al. "Effect of microplate size on the semiconductor–metal transition in VO2 thin films." New Journal of Chemistry 46, no. 16 (2022): 7497–502. http://dx.doi.org/10.1039/d2nj01324j.
Повний текст джерелаfendle, Valerie, and Brian Ralph. "Clustering of coincident site lattice boundaries in polycrystals." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 630–31. http://dx.doi.org/10.1017/s0424820100105217.
Повний текст джерелаQiu, T. Q., and C. L. Tien. "Size Effects on Nonequilibrium Laser Heating of Metal Films." Journal of Heat Transfer 115, no. 4 (1993): 842–47. http://dx.doi.org/10.1115/1.2911378.
Повний текст джерелаДисертації з теми "Grain boundary electron scattering"
Синашенко, Оксана Володимирівна, Оксана Владимировна Синашенко, Oksana Volodymyrivna Synashenko, et al. "The Influence of Electrons Scattering at Grain Boundary and at Surface on Resistivity and Thermal Coefficient of Resistance of Nanocrystalline Silver Films." Thesis, Sumy State University, 2012. http://essuir.sumdu.edu.ua/handle/123456789/34900.
Повний текст джерелаHansen, Landon Thomas. "Characterization of Dislocation - Grain Boundary Interactions Through Electron Backscatter Diffraction." BYU ScholarsArchive, 2019. https://scholarsarchive.byu.edu/etd/7536.
Повний текст джерелаAmalaraj, Akash Savio. "5D Grain Boundary Characterization from EBSD Microscopy." BYU ScholarsArchive, 2018. https://scholarsarchive.byu.edu/etd/8816.
Повний текст джерелаDudeck, K. J. "High resolution electron microscopy investigation of the strontium titanate 3(112) [110] grain boundary." Thesis, University of Oxford, 2009. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.510948.
Повний текст джерелаSun, Tik. "Classical Size Effect in Copper Thin Films: Impact of Surface and Grain Boundary Scattering on Resistivity." Doctoral diss., Orlando, Fla. : University of Central Florida, 2009. http://purl.fcla.edu/fcla/etd/CFE0002959.
Повний текст джерелаWade, C. Austin. "Investigation of Grain Boundary Segregation and Embrittlement Mechanisms of the Cu-Bi System by Analytical Electron Microscopy." Thesis, Lehigh University, 2015. http://pqdtopen.proquest.com/#viewpdf?dispub=3723911.
Повний текст джерелаBasinger, John A. "Detail Extraction from Electron Backscatter Diffraction Patterns." BYU ScholarsArchive, 2011. https://scholarsarchive.byu.edu/etd/2689.
Повний текст джерелаPourmatin, Hossein. "Computational Multiscale Methods for Defects: 1. Line Defects in Liquid Crystals; 2. Electron Scattering in Defected Crystals." Research Showcase @ CMU, 2014. http://repository.cmu.edu/dissertations/458.
Повний текст джерелаDohr, Judith. "Micromechanical testing of oxidized grain boundaries." Thesis, University of Oxford, 2016. https://ora.ox.ac.uk/objects/uuid:fb8a08ef-87d8-47ab-9ac8-89bf300203ea.
Повний текст джерелаCrane, Samantha. "High resolution transmission electron microscopy analysis of the influence of grain boundary and triple grain junction crystallinity and chemistry on silicon carbide-based armor with small additions of aluminum, boron, and carbon." [Gainesville, Fla.] : University of Florida, 2005. http://purl.fcla.edu/fcla/etd/UFE0010845.
Повний текст джерелаКниги з теми "Grain boundary electron scattering"
Randle, V. Measurement of Grain Boundary Geometry. Taylor & Francis Group, 2019.
Знайти повний текст джерелаRandle, Valerie. Measurement of Grain Boundary Geometry. Taylor & Francis Group, 2017.
Знайти повний текст джерелаRandle, Valerie. Measurement of Grain Boundary Geometry. Taylor & Francis Group, 2017.
Знайти повний текст джерелаRandle, Valerie. Measurement of Grain Boundary Geometry. Taylor & Francis Group, 2017.
Знайти повний текст джерелаЧастини книг з теми "Grain boundary electron scattering"
Reed, Bryan W., and Christopher A. Schuh. "Grain Boundary Networks." In Electron Backscatter Diffraction in Materials Science. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_15.
Повний текст джерелаRoukes, M. L., T. J. Thornton, A. Scherer, and B. P. Van der Gaag. "Electron-Boundary Scattering in Quantum Wires." In Electronic Properties of Multilayers and Low-Dimensional Semiconductor Structures. Springer US, 1990. http://dx.doi.org/10.1007/978-1-4684-7412-1_6.
Повний текст джерелаWoonbumroong, A., P. D. Brown, and C. B. Boothroyd. "Grain-boundary segregation of Ho in BaTiO3." In Electron Microscopy and Analysis 1997. CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-131.
Повний текст джерелаBrown, R. A. "Phonon Scattering by a Grain Boundary in Silicon." In Phonon Scattering in Condensed Matter V. Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82912-3_77.
Повний текст джерелаKeast, V. J., and D. B. Williams. "Investigations of grain boundary embrittlement in the STEM." In Electron Microscopy and Analysis 1997. CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-77.
Повний текст джерелаWang, S., and M. Aindow. "High Angle Grain Boundary Structure in Widmanstätten Alpha Ti Microstructures." In Electron Microscopy and Analysis 1997. CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-171.
Повний текст джерелаGoyal, Amit. "Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires." In Electron Backscatter Diffraction in Materials Science. Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_25.
Повний текст джерелаRohrer, Gregory S., and Valerie Randle. "Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections." In Electron Backscatter Diffraction in Materials Science. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_16.
Повний текст джерелаDixit, Hemant, Aniruddha Konar, Rajan Pandey, Jin Cho, and Francis Benistant. "Analyzing the Impact of Grain Boundary Scattering on the Metal Resistivity: First-Principles Study of Symmetric Tilt Grain Boundaries in Copper." In Springer Proceedings in Physics. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-319-97604-4_107.
Повний текст джерелаSchoop, Urs, Stephan Kleefisch, Stefanie Meyer, et al. "Transport properties of grain boundary junctions fabricated from hole and electron doped high-Tc superconductors." In Advances in Superconductivity XI. Springer Japan, 1999. http://dx.doi.org/10.1007/978-4-431-66874-9_23.
Повний текст джерелаТези доповідей конференцій з теми "Grain boundary electron scattering"
Hefferan, Christopher M., Michael J. Deible, Matthew J. Perricone, and Keith E. Wagner. "Grain Boundary Corrosion of UNS N10276 Using Orientation Imaging via Electron Backscatter Diffraction Microscopy (EBSD)." In CORROSION 2019. NACE International, 2019. https://doi.org/10.5006/c2019-13418.
Повний текст джерелаBruemmer, S. M. "Grain Boundary Composition Effects on Environmentally Induced Cracking of Engineering Materials." In CORROSION 1987. NACE International, 1987. https://doi.org/10.5006/c1987-87185.
Повний текст джерелаWang, J. Q., A. Atrens, and D. R. G. Mitchell. "Grain Boundary Characterization of X42 Pipeline Steel in Relation to IGSCC." In CORROSION 2001. NACE International, 2001. https://doi.org/10.5006/c2001-01210.
Повний текст джерелаJacobs, A. J. "Grain Boundary Segregation and IGSCC in Cold Worked Type 304SS." In CORROSION 1989. NACE International, 1989. https://doi.org/10.5006/c1989-89495.
Повний текст джерелаBruemmer, S. M., L. A. Chariot, and E. P. Simonen. "Grain Boundary Chemistry Effects on Irradiation-Assisted Stress Corrosion Cracking." In CORROSION 1990. NACE International, 1990. https://doi.org/10.5006/c1990-90506.
Повний текст джерелаCheng, Zhuolin, Jiale Wang, Rou Li, Ao Gao, Jianying Li, and Kangning Wu. "Evolution of Electron Trapping at the Grain Boundary During Long-Term Stability Transition of Stable ZnO Varistor Ceramics." In 2024 IEEE 14th International Conference on the Properties and Applications of Dielectric Materials (ICPADM). IEEE, 2024. http://dx.doi.org/10.1109/icpadm61663.2024.10750713.
Повний текст джерелаAngeliu, T. M. "Microstructural Characterization of L-Grade Stainless Steels Relative to the IGSCC Behavior in BWR Environments." In CORROSION 2001. NACE International, 2001. https://doi.org/10.5006/c2001-01121.
Повний текст джерелаJacobs, A. J., G. P. Wozadlo, K. Nakata, T. Okada, and S. Suzuki. "The Correlation of Grain Boundary Composition in Irradiated Type 348 Stainless Steel with IASCC Resistance." In CORROSION 1994. NACE International, 1994. https://doi.org/10.5006/c1994-94124.
Повний текст джерелаJacobs, A. J., G. P. Wozadlo, K. Nakata, T. Okada, and S. Suzuki. "The Correlation of Grain Boundary Composition in Irradiated Type 348 Stainless Steel with IASCC Resistance." In CORROSION 1994. NACE International, 1994. https://doi.org/10.5006/c1994-94502.
Повний текст джерелаTsuchiyama, Tomohiro, Osamu Matsumoto, and Takenori Nakayama. "Stress Corrosion Cracking Behavior of 3.5Nicrmov Steel in Carbonated Pure Water." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98247.
Повний текст джерелаЗвіти організацій з теми "Grain boundary electron scattering"
Plitzko, Jurgen M., Geoffrey H. Campbell, Wayne E. King, Stephen M. Foiles, Christian Kisielowski, and Gerd Duscher. Study by atomistic theory and high-resolution electron microscopies of Cu atoms at an Al grain boundary. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/841694.
Повний текст джерелаCampbell, G. H., W. E. King, W. L. Wien, and S. M. Foiles. A high resolution electron microscopy study of the {Sigma}11 (113)/[110] symmetric tilt grain boundary in pure Al and Al-1.5 wt% Cu. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/231591.
Повний текст джерела