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Готові списки джерел за темами / Length metrology / Статті в журналах

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Статті в журналах з теми "Length metrology"

Автор: Grafiati

Опубліковано: 14 березня 2023

Оновлено: 31 липня 2025

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1

Lee, Dong-Yeon, Dong-Min Kim, and Dae-Gab Gweon. "Atomic Force Microscope for Standard Length Metrology." Transactions of the Korean Society of Mechanical Engineers A 30, no. 12 (2006): 1611–17. http://dx.doi.org/10.3795/ksme-a.2006.30.12.1611.

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2

Stone, Jack A. "Uncalibrated Helium-Neon Lasers in Length Metrology." NCSLI Measure 4, no. 3 (2009): 52–58. http://dx.doi.org/10.1080/19315775.2009.11721483.

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3

Matsumoto, Hirokazu. "In-Situ Interferometric Metrology with Optical Comb." Journal of Electrical Electronics Engineering 4, no. 1 (2025): 01–10. https://doi.org/10.33140/jeee.04.01.02.

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Анотація:

Optical frequency comb has various characteristics such as short pulse, broad spectra, many spectral lines, and high temporal coherency. In this paper, historical progress of the optical frequency comb is introduced in the metrology field and its temporalcoherence inteferometric applications are discussed for optical metrology. Specially, in-situ length metrology is presented on new measurement applications using the characteristics of the repetition frequency, brad spectra and high accuracy of the optical frequency comb.

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4

García-Asenjo, Luis, Sergio Baselga, Chris Atkins, and Pascual Garrigues. "Development of a Submillimetric GNSS-Based Distance Meter for Length Metrology." Sensors 21, no. 4 (2021): 1145. http://dx.doi.org/10.3390/s21041145.

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Absolute distance determination in the open air with an uncertainty of a few tenths of a millimetre is increasingly required in many applications that involve high precision geodetic metrology. No matter the technique used to measure, the resulting distances must be proven consistent with the unit of length (SI-metre) as realized in the outdoor facilities traditionally used in length metrology, which are also known as calibration baselines of reference. The current calibration baselines of reference have distances in the range of 10 to 1000 m, but at present there is no solution on the market

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5

ZHANG Yujie, 张玉杰, 雷李华 LEI Lihua, 管钰晴 GUAN Yuqing та ін. "纳米长度溯源链融合计量研究". Infrared and Laser Engineering 54, № 5 (2025): 20250074. https://doi.org/10.3788/irla20250074.

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6

Buchta, Zdeněk, Martin Šarbort, Martin Čížek, et al. "System for automatic gauge block length measurement optimized for secondary length metrology." Precision Engineering 49 (July 2017): 322–31. http://dx.doi.org/10.1016/j.precisioneng.2017.03.002.

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7

Wieczorowski, Michał, Paweł Pawlus, and Bartosz Gapiński. "Perspectives of modern metrology." Mechanik 92, no. 12 (2019): 767–73. http://dx.doi.org/10.17814/mechanik.2019.12.106.

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Анотація:

The most up-to-date trends in development of length and angle metrology were presented. This development falls within a concept of Industry 4.0 and is understood as Metrology 4.0. Basic elements of these concepts and their connections were shown during years in relation to consecutive industrial revolutions. Specific issues regarding additive technologies were described with a view to functional filtration. Achievements of coordinate measuring technique in macro scale were also presented including optical scanning and computed tomography. In conclusions standardization works regarding the ment

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8

TANAKA, Shinichi. "Non-Contact 3D Metrology by Multi Wave-Length Interferometer." Journal of the Japan Society for Precision Engineering 85, no. 8 (2019): 695–98. http://dx.doi.org/10.2493/jjspe.85.695.

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9

Blumröder, Ulrike, Ronald Füßl, Thomas Fröhlich, Eberhard Manske, and Rostyslav Mastylo. "FREQUENCY COMB-COUPLED METROLOGY LASERS FOR NANOPOSITIONING AND NANO MEASURING MACHINES." Measuring Equipment and Metrology 82, no. 4 (2021): 36–42. http://dx.doi.org/10.23939/istcmtm2021.04.036.

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This article shows how a direct readout of the interferometric length measurement in nanopositioning machines can be transferred by connecting the metrology laser to a frequency comb line. The approach is based on a GPS-referenced frequency comb with which the stability of the timer (atomic clock via GPS) is transferred to the metrology laser of the nanopositioning and nano measuring machine NPMM-200. The necessary prerequisites for ensuring traceability are discussed. It is demonstrated that with this approach an improvement in the long-term stability of the metrology laser by three orders of

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10

Jing, Ren, and Xin Chang. "A determinate method of metrology attribute benchmark of commercial banks’ management efficiency." PLOS ONE 17, no. 8 (2022): e0272286. http://dx.doi.org/10.1371/journal.pone.0272286.

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The evaluation or metrology of commercial bank management efficiency is the core of its effective management. The existing management efficiency of commercial banks adopts evaluation scheme rather than metrology. There are four shortcomings with the evaluation scheme, the evaluation is a ranking of advantages and/or disadvantages, all objects should participate in the evaluation, the evaluation results are valid only for the evaluated objects, and the evaluation results lack the metrology benchmark of the object domain. To address this issue, the paper presents a method to determine the benchm

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11

Wieczorowski, Michał. "Digitalization of surfaces in micro, meso and macro applications." Mechanik 91, no. 11 (2018): 944–49. http://dx.doi.org/10.17814/mechanik.2018.11.166.

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Анотація:

In the paper a concept of length and angle metrology in fourth industrial revolution known as Industry 4.0 was presented. Problems and conditions as well as limitations connected with measurement possibilities from devices and man point of view were shown. Scale as metrology term with its division to different ranges, i.e. macro, micro and meso were described. For each of these areas digitization and its tasks were presented.

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12

Mateo, Ana Baselga, and Zeb W. Barber. "Precision and accuracy testing of FMCW ladar-based length metrology." Applied Optics 54, no. 19 (2015): 6019. http://dx.doi.org/10.1364/ao.54.006019.

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13

Röske, Dirk. "Some problems concerning the lever arm length in torque metrology." Measurement 20, no. 1 (1997): 23–32. http://dx.doi.org/10.1016/s0263-2241(97)00006-7.

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14

Centeno González, Luz María, Eduardo Castillo Castañeda, Luis Omar Becerra Santiago, and Alberto Rochín García. "A magnetic suspension system for measuring liquid density." Ingeniería e Investigación 33, no. 1 (2013): 46–51. http://dx.doi.org/10.15446/ing.investig.v33n1.37666.

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Density is a derived quantity of mass and length; it is defined as mass per volume unit and its SI unit is kg/m3. National metrology institutes have been designing and building their own magnetic suspension systems during the last 5 decades for making fluid density measurements; this has allowed them to carry out research into liquids and gases' physical characteristics. This paper was aimed at designing and developing a magnetic suspension system for a magnetic balance used in determining liquid density to be used in CENAM's metrology density laboratories.

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15

Niwa, Y., K. Arai, A. Ueda, et al. "Laser interferometric high-precision geometry (angle and length) monitor for JASMINE." Proceedings of the International Astronomical Union 3, S248 (2007): 280–81. http://dx.doi.org/10.1017/s1743921308019315.

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AbstractThe telescope geometry of JASMINE should be stabilized and monitored with the accuracy of about 10 to 100 pm or 10 to 100 prad of rms over about 10 hours. For this purpose, a high-precision interferometric laser metrology system is employed. Useful techniques for measuring displacements on extremely small scales are the wave-front sensing method and the heterodyne interferometrical method. Experiments for verification of measurement principles are well advanced.

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16

Postek, Michael T., Marylyn Bennett, Nestor J. Zaluzec, Thomas Wheatley, and Samuel Jones. "National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed." Microscopy and Microanalysis 4, S2 (1998): 22–23. http://dx.doi.org/10.1017/s1431927600020237.

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One of the missions of the NIST Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. Industry. This responsibility is found within the Precision Engineering Division (PED). The successful development of a “Collaboratory” for TelePresence Microscopy provides an important new tool to promote technology transfer in the area of length metrology and measurement technology. NIST and Texas Instruments, under the auspices of the National Advanced Manufacturing Testbed (NAMT) and in collaboration with the University of Illinois are developing a microscopy

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17

Chiffre, L. De, D. González-Madruga, G. Dalla Costa, et al. "Accurate measurements in a production environment using dynamic length metrology (DLM)." Procedia CIRP 75 (2018): 343–48. http://dx.doi.org/10.1016/j.procir.2018.04.074.

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18

Schamp, C. T. "High-Resolution Metrology in the TEM." Microscopy Today 20, no. 3 (2012): 46–49. http://dx.doi.org/10.1017/s1551929512000363.

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Анотація:

The transmission electron microscope (TEM) is well known as the technique of choice for visualization and measurement of features at near-atomic length scales, particularly for semiconductor devices. For example, a critical measurement of interest may be the thickness of the gate oxide in a transistor. The accuracy of these measurements is based on calibrated distances at each magnification. The term accuracy conveys the extent to which the measurement minimizes the difference between the measured value and the true value. The associated term precision is the closeness of agreement in a series

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19

Duarte, Julio Enrique, Flavio Humberto Fernández Morales, Mauricio Moreno Sereno, José Mora Almerich, and Miguel Vicente Andrés. "Optical fiber metrology to small displacements detection." Revista Facultad de Ingeniería Universidad de Antioquia, no. 56 (February 28, 2013): 151–59. http://dx.doi.org/10.17533/udea.redin.14663.

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This work presents a methodology to measure deflections in the range of microns in thermo-pneumatic silicon micomembranes. This method is based on the fiber optic interferometry, which was used to study the static behavior of a silicon membrane of 10 mm in thickness, 5 mm in side length and 300 mm in bulk, which was glued to a glass slide. Static behavior is defines as the membrane deflection measurement taking into account only its response to the infrared radiation energy that drives them.

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20

Kupcevičová, Jelena. "Русская и украинская историческая метрология и её отражение в паремиях". Studia Slavica XXVI, № 1 (2022): 55–66. http://dx.doi.org/10.15452/studiaslavica.2022.26.0004.

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The present article is devoted to the historically metrology of Russian and Ukrainian people, the emergence and use of different units for measuring length, width, area, weight and volume of bulk solids and liquids, etc. and their reflection in the proverbs of these nations.

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21

Zhao, Yan, Xing Hua Qu, Yong Tian, Rui Jun Lu, and Hong Guang Liu. "Investigation on the Metrology of Conical Thread Gauge." Key Engineering Materials 693 (May 2016): 150–54. http://dx.doi.org/10.4028/www.scientific.net/kem.693.150.

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This paper presents a new method for the calibration of conical thread gauges. The procedure involves scanning of conical thread profiles, extracting all the thread main parameters, reconstructing the conical thread model. The metrologies model compared to the Standard one that is established on the basis of theoretical data. Thereby, the actual state of the threads can be fully identified by means of Screwing into the threaded length, which is good for control of the thread quality

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22

Luque-Morales, Ramon Alberto, Oscar Hernandez-Uribe, Zaida Antonieta Mora-Alvarez, and Leonor Adriana Cardenas-Robledo. "Ontology Development for Knowledge Representation of a Metrology Lab." Engineering, Technology & Applied Science Research 13, no. 6 (2023): 12348–53. http://dx.doi.org/10.48084/etasr.6485.

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Digital transformation in metrology is impacting the industry, where accurate and fair data are essential to take enterprises to the next level in the digital era. The amount and complexity of information are growing exponentially, and expert knowledge becomes imperative for users to perform measurement tasks and decision-making. This study presents the development of a modular metrological inspection ontology for a metrology laboratory based on the reuse of ontologies related to sensors and units of measurement. Such an ontology considers information about operators and customers (name, telep

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23

Garzón, Daniela, Jorge Luis Galvis Arroyave, David Plazas, Victor Hugo Gil, and Ovidio Almanza. "Development and Validation of an Affordable Calibration Method for Surface Plates." Ingeniería e Investigación 44, no. 2 (2024): e106659. https://doi.org/10.15446/ing.investig.106659.

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The measurement and calibration of flat surfaces is highly relevant for precision engineering, length metrology, and optical systems. Hence, many National Metrology Institutes (NMIs) tend to offer calibration services in this regard. Typically, mechanical, electromechanical, and optical measuring techniques are applied, with uncertainties in the order of micrometers. However, these techniques necessitate expensive equipment that requires periodical calibration and maintenance, which not many laboratories can afford. This work presents the validation of an affordable and simple calibration tech

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24

Fujiwara, Akira, Gento Yamahata, Nathan Johnson, Shuji Nakamura, and Nobuhisa Kaneko. "(Invited) Silicon Quantum Dot Single-Electron Pumps for the Closure of the Quantum Metrology Triangle." ECS Transactions 112, no. 1 (2023): 119–30. http://dx.doi.org/10.1149/11201.0119ecst.

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We have developed silicon quantum dot single-electron pumps for the application to quantum electrical standards. High-speed silicon pumps operated at GHz frequencies, generating a large current at a sub-nanoampere level, are promising for the realization of a precise closure of the quantum metrology triangle; it is a consistency check experiment with the quantum Hall resistance standard and Josephson voltage standard. We have found that, to improve the pump accuracy which is governed by the dynamical charge quantization process in a quantum dot, the optimal design and operation of pumps regard

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25

Zakharenko, Y. G., N. A. Kononova, V. L. Fedorin, Z. V. Fomkina, and K. V. Chekirda. "Prospects of development of the reference base of the Russian Federation in the field of length measurements." Izmeritel`naya Tekhnika, no. 2 (2020): 3–5. http://dx.doi.org/10.32446/0368-1025it.2020-2-3-5.

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Анотація:

The results of the work to create a complex of high-precision hardware for the unit of length reproduction and transferring carried out at “D. I. Mendeleyev Institute for Metrology (VNIIM)” are represented. This complex will serve as the basis for the further development of the reference base of the Russian Federation in the field of length measurements and will allow reproduction of the unit of length at two wavelengths of 633 nm and 532 nm, as well as measurements of the wavelength of laser sources in vacuum in the range from 500 to 1050 nm.

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26

Singh, Lokendra, and Arpan Gupta. "Computational Metrology for Measuring Industrial Component Dimensions." International Journal of Mathematical, Engineering and Management Sciences 8, no. 5 (2023): 841–49. http://dx.doi.org/10.33889/ijmems.2023.8.5.048.

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Анотація:

To target the problem of dimension measurement of objects in industry, a new computer vision method is proposed based upon Harris-corner detection. The proposed research delivers an alternative to the requirement of various precise measurement devices and skilled labour. In order to measure the various dimensions of an object, the proposed algorithm separates the corner points from the background based on variations in pixel intensity. An algorithm has been proposed to analyze captured object images and perform measurements and inspection processes. The aim of this paper is to utilize computer

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27

Milman, Pérola, Eloi Descamps, and Othmane Meskine. "Light and color: photonic resources for quantum metrology." Photoniques, no. 131 (2025): 48–53. https://doi.org/10.1051/photon/202513148.

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Анотація:

A finite precision is always associated with the estimation of a parameter, whether it is time, length, or a rotation angle. What does fundamentally limit this precision, given a fixed amount of resources—such as total energy—that are used in parameter estimation? The answer depends on whether classical or quantum strategies are employed. In this paper, we explore the fundamental precision limits of metrological protocols, with a focus on how quantum optics and photonic devices can achieve a quadratic improvement in precision compared to classical setups while using the same amount of resource

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28

Elena G., Muratova. "Some questions of historical metrology of the Balkars and Karachays." Kavkazologiya 2023, no. 2 (2023): 124–42. http://dx.doi.org/10.31143/2542-212x-2023-2-124-142.

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The article is devoted to the study of some issues of historical metrology of the Karachay-Balkars, inextricably linked with their economic activity, which occurred in the mountainous conditions of the Central Caucasus. This article contains examples of used length, volume and square measure-ment units in the Karachay-Balkars’ traditional metrology, found in historical records. It is shown that it is necessary to start research on the socio-economic history of Balkaria in the 19th century from the study of historical metrology. The system of weights and measures was necessary for a clear regul

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29

Taylor, S., J. Mardinly, M. A. O'Keefe, and R. Gronsky. "HRTEM Image Simulations for Gate Oxide Metrology." Microscopy and Microanalysis 6, S2 (2000): 1080–81. http://dx.doi.org/10.1017/s1431927600037892.

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High resolution transmission electron microscopy (HRTEM) has found extensive use in the semiconductor industry for performing device metrology and characterization. However, shrinking device dimensions (gate oxides are rapidly approaching 10Å) present challenges to the use of HRTEM for many applications, including gate oxide metrology. In this study, we performed HRTEM image simulations of a MOSFET device to examine the accuracy of HRTEM in measuring gate oxide thickness. Length measurements extracted from simulated images were compared to actual dimensions in the model structure to assess TEM

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30

Medvedev, P. A., and M. V. Novgorodskaya. "Mathematical models’ analysis of rectangular coordinates’calculation in the expanded zones of Gauss Kruger conformal projection." Geodesy and Cartography 921, no. 3 (2017): 14–19. http://dx.doi.org/10.22389/0016-7126-2017-921-3-14-19.

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This article contains analysis of mathematical models built depending on longitude difference degree, that are used for calculating planimetric rectangular coordinates in accordance with geodesic coordinates in the longitudinally expanded zones of Gauss Kruger conformal projection. Coefficients of these expansions are measured by successive differentiation or by recurrence formula. Disadvantages of performed coordinate mathematical transformations using schemes recommended by Federal Agency on Technical Regulating and Metrology and Euro-Asian Council for Standardization, Metrology and Certific

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31

Wolańczyk, Franciszek. "Gallium as a Metrology Substance for Measuring Thermal Conductivity of Metals." Applied Mechanics and Materials 831 (April 2016): 144–50. http://dx.doi.org/10.4028/www.scientific.net/amm.831.144.

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In the presented work the effective thermal conductivity of steel was received from the simple experiment in which the change of phase metrology-matter was applied [1]. As the metrology-matter gallium was used.The change of phase process plays role of the heat source. During the change of phase period the temperature is constant. A quasi-stationary temperature fields allows to use the stationary model of heat transfer calculations. The model is a cylindrical rod of finite length losing heat out one face to melting-substance and by radiation from surface, respectively. All process measurement w

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32

Rickgauer, John Peter, Derek N. Fuller, and Douglas E. Smith. "DNA as a Metrology Standard for Length and Force Measurements with Optical Tweezers." Biophysical Journal 91, no. 11 (2006): 4253–57. http://dx.doi.org/10.1529/biophysj.106.089524.

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33

MINOSHIMA, Kaoru, Thomas R. SCHIBLI, Hajime INABA, et al. "Precision Length Metrology Based on the Time and Frequency Standards Using Optical Combs." Review of Laser Engineering 35, no. 10 (2007): 642–48. http://dx.doi.org/10.2184/lsj.35.642.

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34

Barwood, G. P., P. Gill, and W. R. C. Rowley. "High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes." Measurement Science and Technology 9, no. 7 (1998): 1036–41. http://dx.doi.org/10.1088/0957-0233/9/7/005.

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35

Wilson, Marshall, Alexandre Savtchouk, Igor Tasarov, et al. "Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers." ECS Transactions 16, no. 6 (2019): 285–301. http://dx.doi.org/10.1149/1.2980312.

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36

Franz, Christoph, Peter Abels, Raphael Rolser, and Michael Becker. "Energy Input per Unit Length – High Accuracy Kinematic Metrology in Laser Material Processing." Physics Procedia 12 (2011): 411–20. http://dx.doi.org/10.1016/j.phpro.2011.03.151.

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37

Naeim, Ihab H. "In-Depth Practical Study of Length Metrology With Laser Interferometers Applying Different Techniques." International Journal of Applied Physics 7, no. 2 (2020): 36–42. http://dx.doi.org/10.14445/23500301/ijap-v7i2p106.

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38

Belfi, J., N. Beverini, D. Cuccato, et al. "Interferometric length metrology for the dimensional control of ultra-stable ring laser gyroscopes." Classical and Quantum Gravity 31, no. 22 (2014): 225003. http://dx.doi.org/10.1088/0264-9381/31/22/225003.

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39

Chen, Jin Long, He Min Wang, Yu Wen Qin, and Xin Hua Ji. "An Experimental Study of the Displacement and Strain Fields across Interphases in Thermoplastic Composites." Key Engineering Materials 306-308 (March 2006): 959–64. http://dx.doi.org/10.4028/www.scientific.net/kem.306-308.959.

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Анотація:

The main purpose of this paper is to develop a set of improved micro-metrology system, which consists of a digital image-measuring device and a microscope with a long focal length, for the study of displacement fields, strain fields in the area across the interphases, and also the effect of temperature on the micro-mechanics properties of interphases in thermoplastic composites. Meanwhile, the precision of the micro-metrology system is assessed by using an extra solution within of the framework of infinitesimal strain in particular, the choice of the size of subset in the correlation technique

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40

Blumröder, Ulrike, Paul Köchert, Thomas Fröhlich та ін. "A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm". Sensors 23, № 3 (2023): 1734. http://dx.doi.org/10.3390/s23031734.

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Since the turn of the millennium, the development and commercial availability of optical frequency combs has led to a steadily increase of worldwide installed frequency combs and a growing interest in using them for industrial-related metrology applications. Especially, GPS-referenced frequency combs often serve as a “self-calibrating” length standard for laser wavelength calibration in many national metrology institutes with uncertainties better than u = 1 × 10−11. In this contribution, the application of a He-Ne laser source permanently disciplined to a GPS-referenced frequency comb for the

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41

Katić, Marko, Nenad Ferdelji, and Danijel Šestan. "Investigation of Temperature-Induced Errors in XCT Metrology." International Journal of Automation Technology 14, no. 3 (2020): 484–90. http://dx.doi.org/10.20965/ijat.2020.p0484.

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The presented research shows the time dependent temperature distribution and thermal time constant within a typical industrial X-ray computed tomography (XCT) system used for dimensional metrology. Temperature effects can significantly affect measurement results of XCT scans either by directly changing the dimensions of the measurement object, or by indirectly changing the geometry of XCT scanner. In either case, the effect is not known well enough to be used for correction of measurement results or estimation of measurement uncertainty. In order to determine these effects, traceable temperatu

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Dobosz, Marek. "Laser diode distance measuring interferometer - metrological properties." Metrology and Measurement Systems 19, no. 3 (2012): 553–64. http://dx.doi.org/10.2478/v10178-012-0048-1.

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Abstract A novel laser diode based length measuring interferometer for scientific and industrial metrology is presented. Wavelength the stabilization system applied in the interferometer is based on the optical wedge interferometer. Main components of the interferometer such as: laser diode stabilization assembly, photodetection system, measuring software, air parameters compensator and base optical assemblies are described. Metrological properties of the device such as resolution, measuring range, repeatability and accuracy are characterized.

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43

Sanchidrián-Vaca, Carlos, and Carlos Sabín. "Parameter Estimation of Wormholes beyond the Heisenberg Limit." Universe 4, no. 11 (2018): 115. http://dx.doi.org/10.3390/universe4110115.

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We propose to exploit the quantum properties of nonlinear media to estimate the parameters of massless wormholes. The spacetime curvature produces a change in length with respect to Minkowski spacetime that can be estimated in principle with an interferometer. We use quantum metrology techniques to show that the sensitivity is improved with nonlinear media and propose a nonlinear Mach–Zehnder interferometer to estimate the parameters of massless wormholes that scales beyond the Heisenberg limit.

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Miller, Tatiana, Krzysztof Gajda, and Aneta Łętocha. "Reliability of measurements performed in the IZTW accredited laboratory in the field of surface topography and product geometry." Mechanik 91, no. 4 (2018): 307–10. http://dx.doi.org/10.17814/mechanik.2018.4.47.

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The scope and the reliability of measurements performed in the accredited laboratory in the Section of Length and Angle Measurements in Department of Geometrical Quantities Metrology of the IAMT were presented. The scope of services include the performance of tests and measurements in a very wide range related to surface texture analysis, research tests of dimensional and shape accuracy and product quality control. The capabilities of equipment and software available in the laboratory were characterized.

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45

Holá, Miroslava, Jan Hrabina, Martin Sarbort, Jindrich Oulehla, Ondrej Cíp, and Josef Lazar. "Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry." Measurement Science Review 15, no. 5 (2015): 263–67. http://dx.doi.org/10.1515/msr-2015-0036.

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AbstractWe report on investigations of how fast changes of the refractive index influence the uncertainty of interferometric displacement measurements. Measurement of position within a limited range is typical for precise positioning of coordinate measuring systems, such as nanometrology standards combined with scanning probe microscopy (SPM). The varying refractive index of air contributes significantly to the overall uncertainty; it plays a role especially in case of longer-range systems. In our experiments we have observed that its fast variations, seen as length noise, are not linearly pro

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46

Huang, Guangyao, Can Cui, Xiaoyang Lei, et al. "A Review of Optical Interferometry for High-Precision Length Measurement." Micromachines 16, no. 1 (2024): 6. https://doi.org/10.3390/mi16010006.

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Optical interferometry has emerged as a cornerstone technology for high-precision length measurement, offering unparalleled accuracy in various scientific and industrial applications. This review provides a comprehensive overview of the latest advancements in optical interferometry, with a focus on grating and laser interferometries. For grating interferometry, systems configurations ranging from single-degree- to multi-degree-of-freedom are introduced. For laser interferometry, different measurement methods are presented and compared according to their respective characteristics, including ho

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47

Thywissen, J. H. "Using neutral atoms and standing light waves to form a calibration artifact for length metrology." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 16, no. 6 (1998): 3841. http://dx.doi.org/10.1116/1.590420.

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48

Zhang, Haijun, Dongxian Zhang, and Xiaofeng Lin. "Dual imaging-unit atomic force microscope for nanometer order length metrology based on reference scales." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20, no. 5 (2002): 1935. http://dx.doi.org/10.1116/1.1502700.

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49

Zhang, Dongxian, Haijun Zhang, and Xiaofeng Lin. "Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina." Microscopy Research and Technique 64, no. 3 (2004): 223–27. http://dx.doi.org/10.1002/jemt.20060.

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Neyezhmakov, Pavel, Alexander Prokopov, Tatiana Panasenko, and Andrii Shloma. "Analysis of the temperature component of the combined standard uncertainty of the refractive index according to the test data of the control system for meteorological parameters developed for the Lyptsi geodetic polygon." Ukrainian Metrological Journal, no. 4 (December 30, 2021): 34–38. http://dx.doi.org/10.24027/2306-7039.4.2021.250411.

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The National Scientific Centre “Institute of Metrology” is actively involved in the implementation of a number of international projects under the EMPIR programme. One of such joint projects is the EMPIR 18SIB01 GeoMetre research project “Large-scale dimensional measurements for geodesy”. The overall goal of the project is to ensure traceability of length measurements – from the measurement standard of the unit of length to long distances typical for geodetic measurements. As a result of the project, it is necessary to provide length measurements of at least 5 km with an expanded uncertainty o

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