Увійти

Готові списки джерел за темами / Reflection spectroscopy / Статті в журналах

Щоб переглянути інші типи публікацій з цієї теми, перейдіть за посиланням: Reflection spectroscopy.

Статті в журналах з теми "Reflection spectroscopy"

Автор: Grafiati

Опубліковано: 28 травня 2022

Оновлено: 31 липня 2025

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся з топ-50 статей у журналах для дослідження на тему "Reflection spectroscopy".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.

1

Mirabella, F. M. "Internal Reflection Spectroscopy." Applied Spectroscopy Reviews 21, no. 1-2 (1985): 45–178. http://dx.doi.org/10.1080/05704928508060428.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

2

Weightman, P., D. S. Martin, R. J. Cole, and T. Farrell. "Reflection anisotropy spectroscopy." Reports on Progress in Physics 68, no. 6 (2005): 1251–341. http://dx.doi.org/10.1088/0034-4885/68/6/r01.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

3

ATWATER, HARRY A., C. C. AHN, S. S. WONG, G. HE, H. YOSHINO, and S. NIKZAD. "ENERGY-FILTERED RHEED AND REELS FOR IN SITU REAL TIME ANALYSIS DURING FILM GROWTH." Surface Review and Letters 04, no. 03 (1997): 525–34. http://dx.doi.org/10.1142/s0218625x9700050x.

Повний текст джерела

Анотація:

Energy-filtered reflection high energy electron diffraction and reflection electron energy loss spectroscopy expand the usefulness of reflection high energy electron diffraction for quantitative structure determination and surface spectroscopy during film growth. Several implementations of energy-filtered reflection high energy electron diffraction are discussed, along with the progress and prospects for structure determination. New developments in parallel detection reflection electron energy loss spectroscopy (PREELS) enable the use of this method to obtain surface-spectroscopic information

Стилі APA, Harvard, Vancouver, ISO та ін.

4

OSAWA, Masatoshi. "Total reflection Raman spectroscopy." Journal of the Spectroscopical Society of Japan 37, no. 3 (1988): 207–8. http://dx.doi.org/10.5111/bunkou.37.207.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

5

Brodsky, Anatol M., Lloyd W. Burgess, and Sean A. Smith. "Grating Light Reflection Spectroscopy." Applied Spectroscopy 52, no. 9 (1998): 332A—343A. http://dx.doi.org/10.1366/0003702981944995.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

6

ITO, Masatoki. "Infrared Reflection Absorption Spectroscopy." Hyomen Kagaku 13, no. 2 (1992): 88–95. http://dx.doi.org/10.1380/jsssj.13.88.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

7

Egawa, T., Y. Okimoto, R. Fukaya, et al. "Femtosecond Reflection Spectroscopy in La1.5Sr0.5CoO4." Acta Physica Polonica A 121, no. 2 (2012): 307–9. http://dx.doi.org/10.12693/aphyspola.121.307.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

8

Lilledahl, Magnus B., Olav A. Haugen, Marianne Barkost, and Lars O. Svaasand. "Reflection spectroscopy of atherosclerotic plaque." Journal of Biomedical Optics 11, no. 2 (2006): 021005. http://dx.doi.org/10.1117/1.2186332.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

9

Macdonald, B. F., J. S. Law, and R. J. Cole. "Azimuth-dependent reflection anisotropy spectroscopy." Journal of Applied Physics 93, no. 6 (2003): 3320–27. http://dx.doi.org/10.1063/1.1544645.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

10

Harrick, N. J. "Nanosampling via Internal Reflection Spectroscopy." Applied Spectroscopy 41, no. 1 (1987): 1–2. http://dx.doi.org/10.1366/0003702874868052.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

11

Szabó, P. "Andreev reflection spectroscopy in MgB2." Physica B: Condensed Matter 328, no. 1-2 (2003): 10–14. http://dx.doi.org/10.1016/s0921-4526(02)01798-2.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

12

Woods, David A., and Colin D. Bain. "Total internal reflection Raman spectroscopy." Analyst 137, no. 1 (2012): 35–48. http://dx.doi.org/10.1039/c1an15722a.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

13

Guo, J., J. Cooper, A. Gallagher, and M. Lewenstein. "Theory of selective reflection spectroscopy." Optics Communications 110, no. 1-2 (1994): 197–208. http://dx.doi.org/10.1016/0030-4018(94)90196-1.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

14

Milosevic, Milan. "Internal Reflection and ATR Spectroscopy." Applied Spectroscopy Reviews 39, no. 3 (2004): 365–84. http://dx.doi.org/10.1081/asr-200030195.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

15

Guo, J., J. Cooper, A. Gallagher, and M. Lewenstein. "Theory of selective reflection spectroscopy." Optics Communications 110, no. 5-6 (1994): 732–43. http://dx.doi.org/10.1016/0030-4018(94)90279-8.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

16

Häggblad, Erik, Marcus Larsson, Mikael Arildsson, Tomas Strömberg, and E. Göran Salerud. "Reflection Spectroscopy of Analgesized Skin." Microvascular Research 62, no. 3 (2001): 392–400. http://dx.doi.org/10.1006/mvre.2001.2358.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

17

Kolomiets, O., U. Hoffmann, P. Geladi, and H. W. Siesler. "Quantitative Determination of Pharmaceutical Drug Formulations by Near-Infrared Spectroscopic Imaging." Applied Spectroscopy 62, no. 11 (2008): 1200–1208. http://dx.doi.org/10.1366/000370208786401590.

Повний текст джерела

Анотація:

Over the last decade Fourier transform infrared (FT-IR) and near-infrared (NIR) spectroscopic imaging with focal plane array (FPA) detectors have proved powerful techniques for the rapid visualization of samples by a combination of spectroscopic and spatial information. Using these methods, selected sample areas can be analyzed with reference to the identification and localization of chemical species by FT-IR spectroscopy in the transmission or attenuated total reflection (ATR) mode and by NIR spectroscopy in diffuse reflection with a lateral resolution in the micrometer range. The present com

Стилі APA, Harvard, Vancouver, ISO та ін.

18

NAKASHIMA, Shinichi, and Tadashi ITOH. "Fundamentals of Laser Spectroscopy III. Absorption and Reflection Spectroscopy." Review of Laser Engineering 28, no. 2 (2000): 121–26. http://dx.doi.org/10.2184/lsj.28.121.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

19

Cantrell, Will, and George E. Ewing. "Attenuated (but Not Total) Internal Reflection FT-IR Spectroscopy of Thin Films." Applied Spectroscopy 56, no. 5 (2002): 665–69. http://dx.doi.org/10.1366/0003702021955240.

Повний текст джерела

Анотація:

We present a spectroscopic technique that is a hybrid between reflection-absorption and attenuated total reflection (ATR) spectroscopy. The method, which we call attenuated internal reflection (AIR), is suitable for the investigation of thin film liquids on non-or weakly absorbing substrates. In AIR the interrogating infrared beam is not exposed to vapor that may be associated with the film, but unlike ATR there are few geometric constraints on the substrate. We show the theoretical basis for the method and results from experiments demonstrating its use.

Стилі APA, Harvard, Vancouver, ISO та ін.

20

Yang, Tibo, Xinyang Fan, and Jinge Zhou. "Total Reflection X-Ray Fluorescence Spectroscopy." OALib 07, no. 08 (2020): 1–12. http://dx.doi.org/10.4236/oalib.1106671.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

21

Daghero, D., R. S. Gonnelli, G. A. Ummarino, et al. "Andreev-reflection spectroscopy in ZrB12single crystals." Superconductor Science and Technology 17, no. 5 (2004): S250—S254. http://dx.doi.org/10.1088/0953-2048/17/5/030.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

22

Iacobucci, S., L. Marassi, R. Camilloni, S. Nannarone, and G. Stefani. "Reflection (e,2e) spectroscopy on surfaces." Physical Review B 51, no. 15 (1995): 10252–55. http://dx.doi.org/10.1103/physrevb.51.10252.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

23

Seifert, G., and H. Graener. "Picosecond IR spectroscopy using internal reflection." Optics Communications 145, no. 1-6 (1998): 300–308. http://dx.doi.org/10.1016/s0030-4018(97)00456-2.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

24

Klockenkàmper, Rinhold, Joachim Knoth, Andreas Prange, and Heinrich Schwenke. "Total-Reflection X-Ray Fluorescence Spectroscopy." Analytical Chemistry 64, no. 23 (1992): 1115A—1123A. http://dx.doi.org/10.1021/ac00047a717.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

25

Zhang, Zhenfeng, and George E. Ewing. "Attenuated Partial Internal Reflection Infrared Spectroscopy." Analytical Chemistry 74, no. 11 (2002): 2578–83. http://dx.doi.org/10.1021/ac011288t.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

26

Kawai, Jun, Shinjiro Hayakawa, Yoshinori Kitajima, Kuniko Maeda, and Yohichi Gohshi. "Total reflection X-ray photoelectron spectroscopy." Journal of Electron Spectroscopy and Related Phenomena 76 (December 1995): 313–18. http://dx.doi.org/10.1016/0368-2048(95)02518-9.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

27

Newnham, David A., and Philip F. Taday. "Pulsed Terahertz Attenuated Total Reflection Spectroscopy." Applied Spectroscopy 62, no. 4 (2008): 394–98. http://dx.doi.org/10.1366/000370208784046731.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

28

Thrane, L., R. H. Jacobsen, P. Uhd Jepsen, and S. R. Keiding. "THz reflection spectroscopy of liquid water." Chemical Physics Letters 240, no. 4 (1995): 330–33. http://dx.doi.org/10.1016/0009-2614(95)00543-d.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

29

Ekgasit, Sanong, and Pimthong Thongnopkun. "Novel Attenuated Total Reflection Fourier Transform Infrared Microscopy Using a Gem Quality Diamond as an Internal Reflection Element." Applied Spectroscopy 59, no. 10 (2005): 1236–41. http://dx.doi.org/10.1366/000370205774430972.

Повний текст джерела

Анотація:

A novel technique for attenuated total reflection Fourier transform infrared (ATR FT-IR) spectral acquisition by an infrared microscope with a gem-quality faceted diamond as an internal reflection element (IRE) is introduced. Unlike conventional IREs, the novel diamond IRE has a sharp tip configuration instead of a flat tip configuration. Light at normal incidence was coupled into the diamond while the transflected radiation from the diamond was collected through the table facet by the built-in 15× Cassegrainian objective. The number of reflections in the novel diamond IRE equals two. The evan

Стилі APA, Harvard, Vancouver, ISO та ін.

30

Korte, E. H., B. Jordanov, D. Kolev, and D. Tsankov. "Total Reflection Prisms as Achromatic IR Retarders." Applied Spectroscopy 42, no. 8 (1988): 1394–400. http://dx.doi.org/10.1366/0003702884429742.

Повний текст джерела

Анотація:

Retarders based on total internal reflections are discussed. Quarterwave retardation can be obtained by a single reflection when one is using material of high refractive index (≥2.4), as it is available for the IR range. Alternatively, the influence of the beam divergence can be efficiently compensated for. Several optical designs and first results are presented.

Стилі APA, Harvard, Vancouver, ISO та ін.

31

Yue, Chenyang, Hong Jiang, Tianzhi Li, et al. "Compact in situ microscope for photoelectron spectroscopy via two-mirror reflection." Chinese Optics Letters 21, no. 6 (2023): 061101. http://dx.doi.org/10.3788/col202321.061101.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

32

Palka, N. "THz Reflection Spectroscopy of Explosives Measured by Time Domain Spectroscopy." Acta Physica Polonica A 120, no. 4 (2011): 713–15. http://dx.doi.org/10.12693/aphyspola.120.713.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

33

Lu, Y. Q., M. R. Yalamanchili, and J. D. Miller. "FT-IR Internal Reflection Spectroscopy Using Regular Polygonal Internal Reflection Elements." Applied Spectroscopy 52, no. 6 (1998): 851–54. http://dx.doi.org/10.1366/0003702981944382.

Повний текст джерела

Анотація:

Regular polygonal reactive internal reflection elements (IREs) have been designed and fabricated for Fourier transform infrared (FT-IR) internal reflection spectroscopy (IRS) to study adsorption phenomena at the IRE surface. The geometric and optical features of these polygonal IREs are described with respect to the use of the FT-IR/IRS adsorption density equation. An octagonal internal reflection element of fluorite (CaF2) was prepared with 3 mm sides, and adsorption at the polygon faces was examined by FT-IR/IRS. Adsorption densities thus determined at the surface of the polygonal IRE were f

Стилі APA, Harvard, Vancouver, ISO та ін.

34

Rowell, N. L., L. Tay, D. J. Lockwood, J. M. Baribeau, J. A. Bardwell, and R. Boukherroub. "Organic monolayers detected by single reflection attenuated total reflection infrared spectroscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 24, no. 3 (2006): 668–72. http://dx.doi.org/10.1116/1.2180270.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

35

Wang, Chengshan, Miodrag Micic, Mark Ensor, Sylvia Daunert, and Roger M. Leblanc. "Infrared Reflection−Absorption Spectroscopy and Polarization-Modulated Infrared Reflection−Absorption Spectroscopy Studies of the Aequorin Langmuir Monolayer." Journal of Physical Chemistry B 112, no. 13 (2008): 4146–51. http://dx.doi.org/10.1021/jp710953j.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

36

Yamamoto, Kiyoshi, and Hatsuo Ishida. "Interpretation of Reflection and Transmission Spectra for Thin Films: Reflection." Applied Spectroscopy 48, no. 7 (1994): 775–87. http://dx.doi.org/10.1366/0003702944029839.

Повний текст джерела

Анотація:

The optical behavior of a thin film (i.e., peak positions and intensities of infrared spectra) has been discussed for reflection under a thin-film approximation. The reflection spectra of anisotropic and isotropic thin films on various substrates (transparent, dielectric and absorbing, and semi-metal) have been simulated at various angles of incidence in the infrared region for external and internal reflection. For spectral simulation, the matrix method has been used in conjunction with noise-free complex refractive indices based on dispersion theory. The peak positions in the simulated spectr

Стилі APA, Harvard, Vancouver, ISO та ін.

37

Milosevic, M., S. L. Berets, and A. Y. Fadeev. "Single-Reflection Attenuated Total Reflection of Organic Monolayers on Silicon." Applied Spectroscopy 57, no. 6 (2003): 724–27. http://dx.doi.org/10.1366/000370203322005454.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

38

Arangio, Andrea, Christophe Delval, Giulia Ruggeri, Nikunj Dudani, Amir Yazdani, and Satoshi Takahama. "Electrospray Film Deposition for Solvent-Elimination Infrared Spectroscopy." Applied Spectroscopy 73, no. 6 (2019): 638–52. http://dx.doi.org/10.1177/0003702818821330.

Повний текст джерела

Анотація:

The application of electrospray (ES) for quantitative transfer of analytes from solution to an internal reflection element for analysis by attenuated total reflection Fourier transform infrared (ATR FT-IR) spectroscopy has been developed in this work. The ES ATR FT-IR method is evaluated with non-volatile and semi-volatile organic and inorganic compounds dissolved in pure organic solvents or organics in a mixture with water. The technique demonstrates the capability for rapid solvent evaporation from dilute solutions, facilitating the creation of thin films that allow ATR FT-IR to generate tra

Стилі APA, Harvard, Vancouver, ISO та ін.

39

Gunawan, Vincensius. "calculated attenuated total reflection (ATR) for analyzing surface plasmon polaritons." International Journal of Scientific Research and Management 10, no. 11 (2022): 20–24. http://dx.doi.org/10.18535/ijsrm/v10i11.p01.

Повний текст джерела

Анотація:

The electromagnetic waves propagate in the interface between metal and dielectric can be simply called surface plasmon polariton. The surface plasmon polaritons were produced by the coupling of incoming electromagnetic waves and collective vibrations of free charges on metal surface. The generation of surface polaritons may be done using attenuated total reflection (ATR) method which was based on total internal reflection. The method can be performed numerically by analyzing reflections on each involved interfaces. The generated surface plasmon polaritons were represented by the appearance of

Стилі APA, Harvard, Vancouver, ISO та ін.

40

Gloos, K., and E. Tuuli. "Mechanisms of normal reflection at metal interfaces studied by Andreev-reflection spectroscopy." Low Temperature Physics 40, no. 10 (2014): 902–6. http://dx.doi.org/10.1063/1.4897411.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

41

Vyshniak, V., S. Litvynchuk, V. Nosenko, and K. Boatri. "Infrared spectroscopy reflection of multicomponent food powders." Scientific Works of National University of Food Technologies 27, no. 6 (2021): 129–39. http://dx.doi.org/10.24263/2225-2924-2021-27-6-15.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

42

Nagai, Masaya, and Koichiro Tanaka. "Terahertz time-domain spectroscopy with reflection geometry." Review of Laser Engineering 33, Supplement (2005): 14–15. http://dx.doi.org/10.2184/lsj.33.14.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

43

Bunimovich, D., E. Belotserkovsky, and A. Katzir. "Noncontact infrared reflection spectroscopy using optical fibers." Review of Scientific Instruments 65, no. 8 (1994): 2731–32. http://dx.doi.org/10.1063/1.1144607.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

44

Schiwon, Robert, Gerhard Schwaab, Erik Bründermann, and Martina Havenith. "Terahertz cavity-enhanced attenuated total reflection spectroscopy." Applied Physics Letters 86, no. 20 (2005): 201116. http://dx.doi.org/10.1063/1.1929072.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

45

Raudsepp, Allan, Christian Fretigny, François Lequeux, and Laurence Talini. "Two beam surface fluctuation specular reflection spectroscopy." Review of Scientific Instruments 83, no. 1 (2012): 013111. http://dx.doi.org/10.1063/1.3678317.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

46

Yates, K. A., L. F. Cohen, Zhi-An Ren, et al. "Point contact Andreev reflection spectroscopy of NdFeAsO0.85." Superconductor Science and Technology 21, no. 9 (2008): 092003. http://dx.doi.org/10.1088/0953-2048/21/9/092003.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

47

Yates, Karen A., and Lesley F. Cohen. "Andreev reflection spectroscopy in transition metal oxides." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 376, no. 2125 (2018): 20150001. http://dx.doi.org/10.1098/rsta.2015.0001.

Повний текст джерела

Анотація:

Here we review the literature concerning measurement of the Andreev reflection between a superconductor (S) and ferromagnet (F), with particular attention to the case where the ferromagnet is a transition metal oxide. We discuss the practicality of utilization of the current models for determination of the transport current spin polarization and examine the evidence for Andreev bound states. This article is part of the theme issue ‘Andreev bound states’.

Стилі APA, Harvard, Vancouver, ISO та ін.

48

Gifford, J. A., G. J. Zhao, B. C. Li, J. Zhang, D. R. Kim, and T. Y. Chen. "Zero bias anomaly in Andreev reflection spectroscopy." Journal of Applied Physics 120, no. 16 (2016): 163901. http://dx.doi.org/10.1063/1.4965983.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

49

Camplin, John P., Jeanette C. Cook, and Elaine M. McCash. "Reflection–absorption IR spectroscopy at cryogenic temperatures." J. Chem. Soc., Faraday Trans. 91, no. 20 (1995): 3563–67. http://dx.doi.org/10.1039/ft9959103563.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

50

Lowry, Stephen R., Timothy E. May, and Aharon Bornstein. "Signal Enhancement Technique for Internal Reflection Spectroscopy." Applied Spectroscopy 47, no. 1 (1993): 30–34. http://dx.doi.org/10.1366/0003702934048596.

Повний текст джерела

Анотація:

The use of chalcogenide glass for internal reflection spectroscopy (IRS) is described. Chalcogenide glass is a material normally used in infrared fiber-optic systems. A key feature of this concept is the ability to create a tapered section in the IRS crystal in order to increase the interaction with the sample. A liquid cell with integral fiber is described, and its performance as an IRS element is discussed. Several features of the fiber and cell holder are shown to increase sensitivity and allow for an inexpensive sampling accessory.

Стилі APA, Harvard, Vancouver, ISO та ін.

Ми пропонуємо знижки на всі преміум-плани для авторів, чиї праці увійшли до тематичних добірок літератури. Зв'яжіться з нами, щоб отримати унікальний промокод!