Academic literature on the topic 'Accelerating voltage'
Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles
Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Accelerating voltage.'
Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.
You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.
Journal articles on the topic "Accelerating voltage"
Postek, M. T., and R. C. Tiberio. "Low-Voltage Accelerating-Voltage SEM Magnification Standard Prototype." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 198–99. http://dx.doi.org/10.1017/s0424820100103073.
Full textMiyokawa, T., S. Norioka, and S. Goto. "Development of a conical anode Fe-gun for low voltage SEM." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 978–79. http://dx.doi.org/10.1017/s0424820100106958.
Full textErdman, Natasha, Charles Nielsen, and Vernon E. Robertson. "Shedding New Light on Cathodoluminescence—A Low Voltage Perspective." Microscopy and Microanalysis 18, no. 6 (December 2012): 1246–52. http://dx.doi.org/10.1017/s1431927612001262.
Full textDusevich, V. M., J. H. Purk, and J. D. Eick. "Choosing the Right Accelerating Voltage for SEM (An Introduction for Beginners)." Microscopy Today 18, no. 1 (January 2010): 48–52. http://dx.doi.org/10.1017/s1551929510991190.
Full textGoldenberg, A. L., M. Yu Glyavin, N. A. Zavolsky, and V. N. Manuilov. "Technological gyrotron with low accelerating voltage." Radiophysics and Quantum Electronics 48, no. 10-11 (October 2005): 741–47. http://dx.doi.org/10.1007/s11141-006-0003-7.
Full textGunell, H., L. Andersson, J. De Keyser, and I. Mann. "Vlasov simulations of trapping and loss of auroral electrons." Annales Geophysicae 33, no. 3 (March 4, 2015): 279–93. http://dx.doi.org/10.5194/angeo-33-279-2015.
Full textVaz, O. W., and S. J. Krause. "Low-voltage Scanning Electron Microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 676–77. http://dx.doi.org/10.1017/s0424820100144772.
Full textKaneko, Yasuko, Makoto Tokunaga, Kyoko Tanaka, Kimie Atsuzawa, and Masako Nishimura. "Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage." Microscopy 67, no. 2 (January 24, 2018): 125–28. http://dx.doi.org/10.1093/jmicro/dfx133.
Full textZaluzec, Nestor J. "Comparison of experimental and theoretical XEDS k-factors as a function of accelerating voltage." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 460–61. http://dx.doi.org/10.1017/s0424820100135903.
Full textChernoff, Don. "The Effect of Gas Type on Beam Scatter." Microscopy Today 6, no. 7 (September 1998): 12–13. http://dx.doi.org/10.1017/s1551929500068619.
Full textDissertations / Theses on the topic "Accelerating voltage"
Picard, Joël. "La pratique de la voltige aérienne : quelques conséquences physiologiques et pathologiques." Montpellier 1, 1988. http://www.theses.fr/1988MON11044.
Full textDavidová, Lenka. "Diagnostika polovodičových materiálů metodou EBIC." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2017. http://www.nusl.cz/ntk/nusl-319289.
Full textSaid, Sylvere. "Mécanisme de dégradation de films de polypropylène imprégné sous champ électrique en présence d'oxygène." Université Joseph Fourier (Grenoble), 1994. http://www.theses.fr/1994GRE10047.
Full textJhih-WunShih and 施智文. "Effect of Accelerating Voltage and Specimen Thickness on Physical Spatial Resolution of Transmission Electron Backscatter Diffraction in Copper." Thesis, 2016. http://ndltd.ncl.edu.tw/handle/21747125363357812379.
Full textWang, Chih-Chieh, and 王致傑. "Modeling of SET-State Retention Failure Time and Its Voltage Accelerating Qualification Method in a Post-Cycling Resistive Switching Memory." Thesis, 2019. http://ndltd.ncl.edu.tw/handle/xbjtpt.
Full text國立交通大學
電子研究所
108
In this thesis, we observe that the SET-state [i.e., low-resistance state (LRS)] current degradation exhibits a two-stage evolution in a hafnium oxide resistive switching memory. The decline of current follows an inverse power law time-dependence (I∝t-n) in the second stage. Two related analytical models are proposed. One is a voltage accelerating qualification method for SET-state retention failure time based on our previously published read-disturb model, and the other is cycling induced retention failure time degradation. We discover that retention failure time degradation is attributed to stress-induced oxide traps in the switching dielectric in SET/RESET cycling. Because the stress-created traps are likely to replace a number of oxygen vacancies in forming conductive percolation path and thus fewer oxygen vacancies are needed to reach the same current level, leading to the degradation of LRS retention. The experiment data for several decades of time support the validity of our proposed model.
Martin, Joannie. "Optimisation des paramètres expérimentaux pour l’analyse des fibres d’amiante par microscopie électronique en transmission." Thèse, 2016. http://hdl.handle.net/1866/18437.
Full textAsbestos is a material known and used by man for nearly 5000 years, its commercial definition includes six different types of fibrous mineral. Because of their numerous thermal and mechanical properties, asbestos has been mined intensively for commercial use in the last century. It is now well recognized that asbestos exposure can cause severe damage to health and thus its use and exploitation is therefore banned in many countries and its exposure is strictly regulated. The application of those regulations requires rigorous analytical methods to support it. Transmission electron microscopy (TEM) is the most powerful and efficient tool for the analysis of asbestos fibers. However, identification errors caused by damage to asbestos fibers can occur and this problem has been investigated in depth. Asbestos amosite fibers were initially investigated to evaluate the damage caused by a transmission electron microscope electron beam. Since elemental x-ray intensity ratios obtained by energy dispersive x-ray spectroscopy (EDS) are commonly used for asbestos identification, the impact of beam damage on these ratios was measured. It was determined that the magnesium/silicon ratio was the most sensitive to damage caused by the electron beam. Various tests showed that most fibers have a current density threshold above which the chemical composition of the fiber is modified. The value of this threshold current density varied depending on the fiber. The existence of a threshold electron dose was also demonstrated. This value was dependent on the current density used and can be increased by providing a recovery period between exposures to the electron beam. This study also established that the electron beam current is directly related to the damage rate above a current density of 165 A/cm2. Guidelines were established in order to ensure that the amosite fibers are not damaged. It was determined that analysis should be conducted below a current density of 100 A/cm2. In the second part of this study, the main objective was to assess whether temperature is a factor influencing damage to asbestos fibers and, if so, how it can be used to minimize damage. It was found that lowering the temperature to 123 K can inhibit, for a given time, the manifestation of the damage. The significant decrease of atom diffusion at low temperature momentarily prevents mass loss, greatly reducing the possibility of misidentification of vi anthophyllite asbestos fibers. The results obtained in this study strongly suggest that the predominant mechanism damage is probably related to the induced-electric-field model. In a third part, the effect of the acceleration voltage on the damage of four different types of asbestos fibers; chrysotile, amosite, crocidolite and anthophyllite, was investigated. The results support the conclusion that contrary to what is usually recommended, it is best to use an acceleration voltage of 200 kV than 100 kV in order to avoid damage. The findings shed light on possible damage mechanisms; the most predominant seems to be caused by an induced electric field, radiolysis is not excluded but seems less important and knock-on is thought to be negligible for the conditions used.
SVIDENSKÁ, Silvie. "Nicotiana Occidentalis Chloroplast Ultrastructure imaged with Transmission Electron Microscopes Working at Different Accelerating Voltages." Master's thesis, 2010. http://www.nusl.cz/ntk/nusl-52639.
Full text"Reduction of longitudinal emittance of ion beams caused by the variation in acceleration gap voltages." 2012. http://library.cuhk.edu.hk/record=b5549179.
Full text在論文的第一部分，我們研發了一種TSC 技術，它可以減少因粒子加速器的電壓變化而引起的縱向發射度增長。通過數值模擬，結果表明離子束的縱向發射度得到了約89% 的降低。如果把TSC 技術應用於重離子核聚變，離子束的縱向發射度就可以有效地被降低，從而促進更高效的核聚變反應。在論文的第二部分，我們以離子束的電流信號分析為基礎，研發了一種非干擾性的離子束能量測量方法。對於傳統干擾性的離子束能量測量，這種強調非干擾性的測量方法對未來重離子核聚變實驗以及高能粒子加速器研發都有實質的應用價值。在論文的第三部分，我們從NDCX 實驗數據分析中，證實離子束的電流信號能夠有效地揭示離子束微弱的能量變化。這個實驗結果相應肯定了論文第二部分的電流信號分析處理方法。在論文的第四部分，我們模擬在真實的NDCX 環境下測試TSC 技術。模擬結果表明TSC 技術可有效地把離子束的縱向發射度減少近89% ，從而證明了TSC 技術在實際應用中的能力。在論文的最後部分，我們在強電流離子束的一維波動行為中引入橫縱向稱合分析，解釋了一維波動行為與數值模擬結果之間的細小偏差。
Heavy Ion Fusion (HIF) is a technology that has the potential to provide an unlimited source of clean energy for human future. HIF works by shooting at a capsule containing Deuterium and Tritium with energetic heavy ion beams such that the huge amount of kinetic energy carried by the ions is converted into strong compression shock waves. DT fuel is then compressed to form a high temperature and high density hotspot at the center of the capsule, thus igniting nuclear fusion between Deuterium and Tritium. Over the past few decades, the fundamental concepts of HIF had been tested in scaled ex¬periments from the source injection to the reaction chamber. To achieve the highest performance of ignition, ion beams with low longitudinal emittance is demanded.
In the first part of the thesis, we developed a novel Two-Step Correction (TSC) technique to reduce the growth of longitudinal emittance in an induc¬tion linac driver caused by variations in acceleration gap voltages. Through numerical studies, we achieved a reduction of longitudinal emittance by about 89% for high perveance ion beams. As a spinoff from the formalism developed in this study, we developed in the second part of the thesis a new non-invasive approach for the measurement of ion beam energy. The proposed diagnostics may have practical utility for future HIF experiments, particularly as higher energy accelerators are developed. It works by a generalized time-of-flight method, using two adjacent beam current signals to reconstruct the beam velocity profile. In the third part of the thesis, we verified that beam current signals are capable to reveal small beam energy variations by an NDCX-I experiment performed at Lawrence Berkeley National Laboratory. The result of this experiment confirms the formalism of the new non-invasive approach for the ion beam energy determination based on beam current signal analysis. In order to verify the effectiveness of TSC in real drivers, we proposed a new NDCX-I experiment in the fourth part of the thesis to test the limitations and performance of the correction technique in real environment. Through simulations with real driver features considered, a reduction of 89% of longitudinal emittance was observed, which confirms the ability of TSC in real applications. In the last part of the thesis, we revealed the limitation of the 1-D cold fluid model deployed in our analysis of space-charge waves for high perveance ion beams. We showed that inaccuracies are caused by transverse-longitudinal coupling which could be included in the wave equation for space-charge dominated beams.
Detailed summary in vernacular field only.
Detailed summary in vernacular field only.
Woo, Ka Ming = 抑制由粒子加速器的電壓變化所引起的縱向發射度 / 胡家明.
Thesis (M.Phil.)--Chinese University of Hong Kong, 2012.
Includes bibliographical references (leaves 153-156).
Abstracts also in Chinese.
Woo, Ka Ming = Yi zhi you li zi jia su qi de dian ya bian hua suo yin qi de zong xiang fa she du / Hu Jiaming.
Abstract --- p.ii
概論 --- p.iv
Acknowledgement --- p.v
Chapter 1 --- Introduction --- p.1
Chapter 2 --- Background --- p.4
Chapter 2.1 --- Highlight --- p.4
Chapter 2.2 --- Introduction to fusion energy --- p.4
Chapter 2.3 --- Fusion technology --- p.5
Chapter 2.3.1 --- Magnetic confinement fusions --- p.5
Chapter 2.3.2 --- Inertial confinement fusions --- p.7
Chapter 2.4 --- Inertia confinement fusion --- p.9
Chapter 2.4.1 --- Principle of ICF --- p.9
Chapter 2.4.2 --- Implosion dynamics --- p.11
Chapter 2.4.3 --- Rayleigh-Taylor instability --- p.13
Chapter 2.4.4 --- Fast ignition --- p.14
Chapter 2.5 --- Heavy Ion Fusion --- p.16
Chapter 2.5.1 --- Comparison between laser and heavy ion driven fusions --- p.16
Chapter 2.5.2 --- Linear Induction Accelerator --- p.18
Chapter 2.6 --- Operation of a HIF driver --- p.20
Chapter 2.6.1 --- Source injection --- p.20
Chapter 2.6.2 --- Transport of ion beams --- p.21
Chapter 2.6.3 --- Acceleration of ion beams --- p.22
Chapter 2.6.4 --- Neutralized drift longitudinal compression --- p.24
Chapter 2.6.5 --- Target chamber --- p.25
Chapter 2.7 --- Transverse beam dynamics --- p.26
Chapter 2.7.1 --- Beam envelope equation --- p.26
Chapter 2.7.2 --- Matched beams solutions --- p.29
Chapter 2.8 --- Longitudinal beam dynamics --- p.30
Chapter 2.8.1 --- Cold plasma model --- p.30
Chapter 2.8.2 --- Self longitudinal electric field --- p.32
Chapter 2.8.3 --- Longitudinal emittance --- p.34
Chapter 2.9 --- Intense ion beam simulation --- p.35
Chapter 2.9.1 --- Particle-In-Cell method --- p.35
Chapter 2.9.2 --- WARP code --- p.36
Chapter 2.10 --- Conclusion --- p.37
Chapter 3 --- Techniques for correcting velocity and density fluctuations of ion beams --- p.39
Chapter 3.1 --- Highlight --- p.39
Chapter 3.2 --- The quest for short-pulse length ion beams --- p.40
Chapter 3.2.1 --- Applications of short-pulse ion beams --- p.40
Chapter 3.2.2 --- Consequence of the growth of longitudinal emittance --- p.41
Chapter 3.3 --- Effect of gap voltage variation on εzn --- p.42
Chapter 3.3.1 --- Description of simulation scenario --- p.42
Chapter 3.3.2 --- The coasting of an unperturbed ion beam and a velocitytilt beam --- p.43
Chapter 3.3.3 --- Effect of many constant voltage gaps --- p.44
Chapter 3.3.4 --- Effect of non-uniform voltage gap --- p.46
Chapter 3.4 --- One-step correction --- p.48
Chapter 3.4.1 --- Criteria for the one-step correction --- p.52
Chapter 3.4.2 --- Space-charge dominated beams --- p.55
Chapter 3.5 --- Two-step correction --- p.56
Chapter 3.5.1 --- Principle of two-step correction --- p.56
Chapter 3.5.2 --- Result of two-step correction --- p.59
Chapter 3.6 --- Conclusion --- p.62
Chapter 4 --- A new non-invasive approach for the measurement of ion beam energy --- p.63
Chapter 4.1 --- Highlight --- p.63
Chapter 4.2 --- Introduction --- p.64
Chapter 4.3 --- Derivation of the ion beam energy based on two current signals --- p.65
Chapter 4.3.1 --- Obtaining the time evolution of the beam current --- p.65
Chapter 4.3.2 --- Deriving the beam energy profile --- p.67
Chapter 4.3.3 --- Obtaining the average velocity --- p.70
Chapter 4.4 --- Checking the beam energy profile with 3-D PIC simulations --- p.72
Chapter 4.4.1 --- Determination of the average velocity --- p.73
Chapter 4.4.2 --- Computation of the beam energy profile --- p.74
Chapter 4.5 --- Signal magnification --- p.74
Chapter 4.6 --- Error propagations --- p.77
Chapter 4.7 --- Conclusion --- p.81
Chapter 5 --- Experimental verification of the beam current signal amplification --- p.83
Chapter 5.1 --- Highlight --- p.83
Chapter 5.2 --- Introduction to NDCX-I --- p.84
Chapter 5.3 --- Design of the NDCX-I experiment --- p.88
Chapter 5.4 --- Voltage profiles applied at the source plate --- p.90
Chapter 5.4.1 --- Marx voltage profile --- p.90
Chapter 5.4.2 --- Voltage modulation --- p.91
Chapter 5.5 --- Signal amplification of beam currents measured at the Faraday cup --- p.92
Chapter 5.6 --- Modeling of the space-charge wave propagation --- p.94
Chapter 5.6.1 --- Solving for the line-charge density profile at the source plate --- p.94
Chapter 5.6.2 --- Procedure of space-charge wave modeling --- p.99
Chapter 5.7 --- Conclusion --- p.101
Chapter 6 --- Implementation of Two-Step Correction in NDCX-I --- p.103
Chapter 6.1 --- Highlight --- p.103
Chapter 6.2 --- Application of the current signal analysis to the Two-Step Correction --- p.104
Chapter 6.3 --- Proposal of the new NDCX-I experiment --- p.107
Chapter 6.3.1 --- Design of the beamline --- p.107
Chapter 6.3.2 --- Description of the simulation scenario --- p.110
Chapter 6.3.3 --- Result of the Two-Step Correction simulation --- p.114
Chapter 6.4 --- Conclusion --- p.126
Chapter 7 --- Transverse-Longitudinal coupling in the wave equation --- p.128
Chapter 7.1 --- Highlight --- p.128
Chapter 7.2 --- Phenomenological study of residue --- p.129
Chapter 7.2.1 --- Description of the simulation scenario --- p.129
Chapter 7.2.2 --- Modeling of the velocity wave --- p.131
Chapter 7.2.3 --- Phenomenon of residue --- p.133
Chapter 7.3 --- Review of the space-charge wave equation --- p.141
Chapter 7.3.1 --- Fluid description of ion beams --- p.141
Chapter 7.3.2 --- Beam envelope perturbation --- p.145
Chapter 7.4 --- Conclusion --- p.149
Chapter 8 --- Conclusion --- p.150
Bibliography --- p.153
Lai, Cheng-Hung, and 賴政宏. "Acceleration of Aging by High Voltage Electrostatic Field and Detection of Molasses Alcohol Adulteration by SNIF-NMR for Taiwanese Rice Spirits." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/80897481266007058597.
Full text大葉大學
生物產業科技學系
102
Taiwanese rice-spirits were treated by a designed adjustable parallel high-voltage electrostatic field (AP-HVEF) to investigate the acceleration effect on aging. On the other hand, the ratios of edible alcohol blended in rice spirits were detected by 2H nuclear magnetic resonance (SNIF-NMR) and isotope ratio mass spectrometer (IRMS). Experiments were divided into three parts and the results obtained were as follows. 1. Part I: Three model spirits were prepared by individually adding acetic acid, caproic acid, and lactic acid with a concentration of 20,000 ppm in 50% edible alcohol. The concentrations ethyl acetate, ethyl caproate, and ethyl lactate in the model spirits set at room temperature for 20 hr increased from initial 66, 12, and 19 ppm to 601, 243, and 328 ppm, respectively. While contrast to the control, the three esters increased 23.8%, 26.3%, 25.9% (600 kV/m) and 31.1%, 33.7%, 32.6% (900 kV/m) for that of treated by AP-HVEF. Unfortunately, extending treatment time to 20 days, the increase rate lowered to 17.1%, 7.8%, and 5.3%, respectively, for that of 900 kV/m. No obvious effect was shown for treatments of 300 kV/m and 600 kV/m. This indicated that time is probably primary factor on aging of spirit. 2. Part II: The aging effect of AP-HVEF on rice spirits blended with 1,000 ppm acetic acid and lactic acid was investigated. Ethyl acetate and ethyl lactate naturally increased to 57 and 23 ppm from initial 41 and 8 ppm for 40% rice spirits. Both esters increased due to AP-HVEF treatment with increasing field strength or extending time. Rice spirits treated at 900 kV/m for 7 days, showed 101 ppm ethyl acetate and 50 ppm ethyl lactate, while from initial 58 and 10 ppm to 163 and 132 ppm, respectively, for that of blended with acids. According to sensory test, the panel thought that AP-HVEF treatment at 900 kV/m obviously affected quality of rice spirits. 3. Part III: Five pure rice spirits labeled as TK-8, TK-9, TCS-10, TN-11 and TN 71 were made from rice varieties. Imitate rice spirits were made by adulterating molasses-spirit (MS) with various ratios to pure rice spirits. SNIF-NMR and IRMS were used to detect the added ratios. Significant difference in (D/H)I for SNIF-NMR index was observed. The (D/H)I linearly (R2 > 0.96) increased with addition of MS in TK-8, TK-9, TCS-10, TN-11 and TN-71. Test results demonstrated that TN-71 shows sensitive detectable limit which mixed molasses-spirit in rice-spirits is 3.62 %, and TK-8, TK-9, TCS-10 and TN-11 were shown the ranging from 8.20 to 11.73 %. Of the IRMS indices, TK-8, TK-9, TCS-10, TN-11 and TN-71.shown the 13C/12C ratio, δ13C = -27.4 to -28.9‰, and MS δ13C = -11.2‰. Though 13C/12C ratios increased with adding MS, it was not available as the index to distinguish how much MS is adulterated as SNIF-NMR analysis due to the low correlation of them.
Grant, David William. "Reduced Burst Release of Bioactive rhBMP-2 from a Three-phase Composite Scaffold." Thesis, 2010. http://hdl.handle.net/1807/25605.
Full textBooks on the topic "Accelerating voltage"
Wright, A. G. Voltage dividers. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780199565092.003.0013.
Full textBook chapters on the topic "Accelerating voltage"
Minty, Michiko G., and Frank Zimmermann. "Longitudinal Optics Measurement and Correction." In Particle Acceleration and Detection, 149–74. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-662-08581-3_7.
Full textMoons, Bert, and Marian Verhelst. "DVAFS—Dynamic-Voltage-Accuracy-Frequency-Scaling Applied to Scalable Convolutional Neural Network Acceleration." In System-Scenario-based Design Principles and Applications, 99–111. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-20343-6_5.
Full textJin, Jeong-Tae, Seung-Ho Jeong, Kwang-Won Lee, Dae-Sik Chang, Doo-Hee Chang, and Byung-Hoon Oh. "Design of a High Voltage Acceleration Power Supply for a Neutral Beam Injection System." In Communications in Computer and Information Science, 387–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-26010-0_47.
Full textShimizu, Kenichi, and Tomoaki Mitani. "Application Example 1: Lateral Resolution of in-Lens SE and High-Angle BSE Imaging at Low Accelerating Voltages, Below 2.0 kV." In New Horizons of Applied Scanning Electron Microscopy, 3–6. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03160-1_2.
Full textFreitag, B., G. Knippels, S. Kujawa, P. C. Tiemeijer, M. Van der Stam, D. Hubert, C. Kisielowski, P. Denes, A. Minor, and U. Dahmen. "First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage." In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 55–56. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-85156-1_28.
Full textPadamsee, H. "RF Superconducting Accelerating Cavities." In High Voltage Vacuum Insulation, 431–57. Elsevier, 1995. http://dx.doi.org/10.1016/b978-012437175-0/50016-6.
Full textBahgaat, Naglaa K., and Mohamed Ahmed Moustafa Hassan. "Automatic Voltage Regulator System Tuning Using Swarm Intelligence Techniques." In Advances in System Dynamics and Control, 232–52. IGI Global, 2018. http://dx.doi.org/10.4018/978-1-5225-4077-9.ch008.
Full textVenkobarao, Vivek. "Hybridized Genetic Algorithm Based Machine Parameters Estimation for Direct Torque Control of 3 Phase Motor for Wind Energy Systems." In Advances in Computer and Electrical Engineering, 96–108. IGI Global, 2016. http://dx.doi.org/10.4018/978-1-4666-9911-3.ch006.
Full textKrishnan, Kannan M. "Scanning Electron Microscopy." In Principles of Materials Characterization and Metrology, 693–744. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0010.
Full textConference papers on the topic "Accelerating voltage"
Georges, A., H. Dzitko, M. Mouillet, D. Reynaud, and R. Nicolas. "Lifetime testing of Airix accelerating units." In 2012 IEEE International Power Modulator and High Voltage Conference (IPMHVC). IEEE, 2012. http://dx.doi.org/10.1109/ipmhvc.2012.6518868.
Full textMori, Irchiro, Toshiaki Shinozaki, Kazuyoshi Sugihara, Chikara Itoh, and Mitsuo Tabata. "Electron Beam Image Projection System with High Accelerating Voltage." In 1985 Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 1985. http://dx.doi.org/10.7567/ssdm.1985.a-5-1.
Full textHsu, Wen Cheng, Yu Hsiang Shu, and Chenglong Pan. "Using Higher Accelerating Voltage of SEM to Dig Out Implant Defects." In 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2019. http://dx.doi.org/10.1109/ipfa47161.2019.8984876.
Full textKobayashi, Hideo, Takao Higuchi, Keishi Asakawa, and Yasunori Yokoya. "PBS performance evaluation under a high-accelerating-voltage e-beam exposure." In 17th Annual BACUS Photomask Technology and Management, edited by James A. Reynolds and Brian J. Grenon. SPIE, 1997. http://dx.doi.org/10.1117/12.301222.
Full textTang, Chao, Rui-jin Liao, Li-jun Yang, and Fei-long Huang. "Research on the dielectric properties and breakdown voltage of transformer oil-paper insulation after accelerating thermal ageing." In 2010 International Conference on High Voltage Engineering and Application (ICHVE). IEEE, 2010. http://dx.doi.org/10.1109/ichve.2010.5640744.
Full textPostek, Jr., Michael T., Andras E. Vladar, Samuel N. Jones, and William J. Keery. "Report on the NIST low-accelerating-voltage SEM magnification standard interlaboratory study." In SPIE'S 1993 Symposium on Microlithography, edited by Michael T. Postek. SPIE, 1993. http://dx.doi.org/10.1117/12.148941.
Full textGinzburg, N. S. "Increasing of Peak Power of Superradiation Pulses by Variation of Accelerating Voltage." In BEAMS 2002: 14th International Conference on High-Power Particle Beams. AIP, 2002. http://dx.doi.org/10.1063/1.1530856.
Full textSkorobogatov, Dmitry N., Maxim I. Bryzgunov, Anatoly D. Goncharov, Igor Gusev, Mikhail N. Kondaurov, Victor R. Kozak, Anatoly S. Medvedko, et al. "The precision high voltage power supply system for the accelerating column of the 2MeV electron cooler for COSY." In 2014 IEEE International Power Modulator and High Voltage Conference (IPMHVC). IEEE, 2014. http://dx.doi.org/10.1109/ipmhvc.2014.7287350.
Full textOhye, Toshimi, Chiaki Morita, and Hiroshi Shimoyama. "Computer simulation of electron optical characteristics of accelerating tube for high-voltage electron microscope." In SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, edited by William B. Thompson, Mitsugu Sato, and Albert V. Crewe. SPIE, 1993. http://dx.doi.org/10.1117/12.155700.
Full textNagornov, Aleksey, and Roman Mikheev. "Circuitry Methods for Increasing the Pulse-Voltage Converter’s Radiation Resistance by Accelerating Relaxation Effects." In 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus). IEEE, 2020. http://dx.doi.org/10.1109/eiconrus49466.2020.9039221.
Full textReports on the topic "Accelerating voltage"
Postek, Michael T. Low accelerating voltage pitch standard based on the modification of NBS SRM 484. Gaithersburg, MD: National Bureau of Standards, 1987. http://dx.doi.org/10.6028/nbs.ir.87-3665.
Full textSereno, N. S. APS linac klystron and accelerating structure gain measurements and klystron PFN voltage regulation requirements. Office of Scientific and Technical Information (OSTI), July 1997. http://dx.doi.org/10.2172/501502.
Full textConnolly, R., and J. Rose. Remnant voltages in the RHIC storage system during acceleration: PART II. Office of Scientific and Technical Information (OSTI), February 1994. http://dx.doi.org/10.2172/1118893.
Full textHimmel, Jeffrey, John Gualtieri, and John Kosinski. Acceleration Sensitivity and Mode Shape Relationship Tests of Voltage Controlled Surface Acoustic Wave Oscillator. Fort Belvoir, VA: Defense Technical Information Center, August 1995. http://dx.doi.org/10.21236/ada299044.
Full textBogart, Joanne R. A Fast and Accurate Phasing Algorithm for the RF Accelerating Voltages of the SLAC Linac. Office of Scientific and Technical Information (OSTI), April 2003. http://dx.doi.org/10.2172/813031.
Full textLuc, Brunet. Systematic Equations Handbook : Book 1-Energy. R&D Médiation, May 2015. http://dx.doi.org/10.17601/rd_mediation2015:1.
Full textXi Yang and Charles M Ankenbrandt and Jim Norem. Experimental estimate of beam loading and minimum rf voltage for acceleration of high intensity beam in the Fermilab Booster. Office of Scientific and Technical Information (OSTI), April 2004. http://dx.doi.org/10.2172/822586.
Full text