Books on the topic 'AEM'
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Luca, Mazzei, and Risi Nelo 1920-, eds. Cinema elettrico: I film dell'archivio AEM (1928-1962). Milano: Rizzoli, 2011.
Find full textRong, Yonghua. Characterization of Microstructures by Analytical Electron Microscopy (AEM). Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20119-6.
Full textPhysical principles of electron microscopy: An introduction to TEM, SEM, and AEM. New York: Springer Science+Business Media, 2005.
Find full text(Milan, Italy) Azienda elettrica municipale. AEM: Una storia per immagini : gli ex libris narrano 100 anni di storia = AEM : a story in pictures : 100 years of history narrated by the Ex Libris. [Milano]: Fondazione AEM, 2010.
Find full textDiálogo de sonidos: I premio del V concurso de narrativa "Antonio Márquez Salas" AEM 2009. Mérida: Asociación de Escritores de Mérida, 2010.
Find full textBultman, Mark W. An interpretation of the 1997 Airborne ElectroMagnetic (AEM) survey, Fort Huachuca vicinity, Cochise County, Arizona, with digital data. [Reston, Va.]: U.S. Dept. of the Interior, U.S. Geological Survey, 1999.
Find full textBhutan. Electronic voting machine (EVM) rules and regulations of the Kingdom of Bhutan =: ʼBrug gi tshogs rgyan phrul chas (Ai wi aem) bcaʼ yig daṅ sgrig bźi. Thimphu: Election Commission of Bhutan, 2007.
Find full textArturo, Ponce, Bueno Darío, and Workshop on Nanomaterials (1st : 2009 : Saltillo (Coahuila) México), eds. Advanced electron microscopy and nanomaterials: Selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) México, September 29th-October 2nd, 2009. Stafa-Zurich, Switzerland: Trans Tech Publications, 2010.
Find full textGosudarstvennyĭ russkiĭ muzeĭ (Saint Petersburg, Russia) and Muzeĭ Li︠u︡dviga, eds. AES, AES + F. St. Petersburg: Palace Editions, 2006.
Find full textDavis, Lee, Callum Greene, and Anthony G. Katagas. 3 a.m. United States]: Showtime Entertainment, 2002.
Find full textPublishing, LAD Custom. Business Statistics: Aem 3100. LAD Custom Publishing, Incorporated, 2021.
Find full textPublishing, LAD Custom. Introductory Statistics: Aem 2100. LAD Custom Publishing, Incorporated, 2021.
Find full textPublishing, LAD Custom. Special Topics in AEM: Global Business Strategy. LAD Custom Publishing, Incorporated, 2021.
Find full textPublishing, Lad Custom. Special Topics in AEM: Global Business Strategy. LAD Custom Publishing, Incorporated, 2022.
Find full textCustom Cornell AEM 1200 Intro to Business Management. Cengage South-Western, 2013.
Find full textPublishing, Lad Custom. Special Topics in AEM: Risk Management in Emerging Markets. LAD Custom Publishing, Incorporated, 2022.
Find full textInternational Conference on Advancement in Engineering and Management (AEM-2020). IRDCP, 2020. http://dx.doi.org/10.22161/conf.aem.2020.
Full textElectromagnetic Methods in Geophysics: Applications in GeoRadar, FDEM, TDEM, and AEM. Wiley & Sons, Limited, John, 2022.
Find full textLeucci, Giovanni, and Fabio Giannino. Electromagnetic Methods in Geophysics: Applications in GeoRadar, FDEM, TDEM, and AEM. Wiley & Sons, Incorporated, John, 2021.
Find full textLeucci, Giovanni, and Fabio Giannino. Electromagnetic Methods in Geophysics: Applications in GeoRadar, FDEM, TDEM, and AEM. Wiley & Sons, Incorporated, John, 2021.
Find full text4th International Conference on Advancement in Engineering and Management (AEM-2021). IRDCP, 2021. http://dx.doi.org/10.22161/conf.aem.jun.2021.
Full textLeucci, Giovanni, and Fabio Giannino. Electromagnetic Methods in Geophysics: Applications in GeoRadar, FDEM, TDEM, and AEM. Wiley & Sons, Incorporated, John, 2021.
Find full textPhysical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer London, Limited, 2016.
Find full textEgerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer, 2007.
Find full textEgerton, R. F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer, 2010.
Find full textEgerton, R. F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer London, Limited, 2006.
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