Journal articles: 'AFM nanomanipulation'

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TIAN, Xiaojun. "Review of AFM Based Robotic Nanomanipulation." Journal of Mechanical Engineering 45, no. 06 (2009): 14. http://dx.doi.org/10.3901/jme.2009.06.014.

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Lal, R., and S. A. John. "Biological applications of atomic force microscopy." American Journal of Physiology-Cell Physiology 266, no. 1 (January 1, 1994): C1—C21. http://dx.doi.org/10.1152/ajpcell.1994.266.1.c1.

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The newly developed atomic force microscope (AFM) provides a unique window to the microworld of cells, subcellular structures, and biomolecules. The AFM can image the three-dimensional structure of biological specimens in a physiological environment. This enables real-time biochemical and physiological processes to be monitored at a resolution similar to that obtained for the electron microscope. The process of image acquisition is such that the AFM can also measure forces at the molecular level. In addition, the AFM can interact with the sample, thereby manipulating the molecules in a defined manner--nanomanipulation! The AFM has been used to image living cells and the underlying cytoskeleton, chromatin and plasmids, ion channels, and a variety of membranes. Dynamic processes such as crystal growth and the polymerization of fibrinogen and physicochemical properties such as elasticity and viscosity in living cells have been studied. Nanomanipulations, including dissection of DNA, plasma membranes, and cells, and transfer of synthetic structures have been achieved. This review describes the operating principles, accomplishments, and the future promise of the AFM.

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Shahmoradi Zavareh, Seyed Abbas, Hamid Akbari Moayyer, and Mohammad Amin Ahouei. "Experimental Manipulation of Gold Nano-Particles by Atomic Force Microscope and Investigating Effect of Various Working Parameters." Advanced Materials Research 829 (November 2013): 831–35. http://dx.doi.org/10.4028/www.scientific.net/amr.829.831.

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Due to involvement of various fields of engineering and bio researchers in nanoprojects and their need in achieving certain layout of nanoparticles (NPs) in many research studies, considerable attention is paid to nanomanipulation nowadays. The present experimental study employs Atomic Force Microscope (AFM) in order to push gold nanoparticles on a highly flat mica surface. A silicon probe in contact mode is used to both image and manipulate nanoparticles and Topo and L-R images have been obtained to show the successes of manipulation when proper conditions are fulfilled. The effect of AFM parameters such as applied force, scanning speed and number of pixels of image on nanomanipulation efficiency is investigated. Moreover, the tip is moved along a special path which can be set by software to study manipulation of nanoparticles aggregates. Finally, possible applications of nanomanipulation in nanomechanics, nanoelectronics, nanomaterials and bio-technology are reported and further experimental research works on nanomanipulation are proposed.

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Chang, Ming, C. H. Lin, and Juti Rani Deka. "Characterization and Manipulation of Boron Nanowire inside SEM." Key Engineering Materials 381-382 (June 2008): 31–34. http://dx.doi.org/10.4028/www.scientific.net/kem.381-382.31.

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Nanostructures materials have stimulated broad attention in the past decade because of their potential fundamental characteristics and its promising applications in nano electronic devices. In the present investigation, crystalline boron nanowires (BNWs) were synthesized by vapor liquid solid (VLS) technique and its mechanical properties were studied using a nanomanipulator inside a scanning electron microscope (SEM). Electron beam induced deposition (EBID) method was used to clamp boron nanowire to the AFM tips. The Young’s modulus of the NWs were determined from the buckling instability of NW and computed to be approximately 131.7 ± 14.6GPa. In addition, the nanomanipulation system was used to manipulate nanowire and built a nanoring.

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Yuan, Shuai, Zhidong Wang, Ning Xi, Yuechao Wang, and Lianqing Liu. "AFM Tip Position Control in situ for Effective Nanomanipulation." IEEE/ASME Transactions on Mechatronics 23, no. 6 (December 2018): 2825–36. http://dx.doi.org/10.1109/tmech.2018.2868983.

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Tian, Xiaojun, Yuechao Wang, Ning Xi, Lianqing Liu, Niandong Jiao, and Zaili Dong. "AFM Based MWCNT Nanomanipulation with Force and Visual Feedback." Journal of Nanoscience and Nanotechnology 9, no. 2 (February 1, 2009): 1647–50. http://dx.doi.org/10.1166/jnn.2009.c223.

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Mokaberi, B., and A. A. G. Requicha. "Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation." IEEE Transactions on Automation Science and Engineering 5, no. 2 (April 2008): 197–206. http://dx.doi.org/10.1109/tase.2007.895008.

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Li, G., N. Xi, M. Yu, and W. K. Fung. "Development of Augmented Reality System for AFM-Based Nanomanipulation." IEEE/ASME Transactions on Mechatronics 9, no. 2 (June 2004): 358–65. http://dx.doi.org/10.1109/tmech.2004.828651.

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Ishisaki, Itsuhachi, Yuya Ohashi, Tatsuo Ushiki, and Futoshi Iwata. "Nanomanipulator Based on a High-Speed Atomic Force Microscopy." Key Engineering Materials 516 (June 2012): 396–401. http://dx.doi.org/10.4028/www.scientific.net/kem.516.396.

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We developed a real-time nanomanipulation system based on high-speed atomic force microscopy (HS-AFM). During manipulation, the operation of the manipulation is momentarily interrupted for a very short time for high-speed imaging; thus, the topographical image of the fabricated surface is periodically updated during the manipulation. By using a high-speed imaging technique, the interrupting time could be much reduced during the manipulation; as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. As for the high-speed imaging technique, we employed a contact-mode HS-AFM to obtain topographic information through the instantaneous deflection of the cantilever during high-speed scanning. By using a share motion PZT scanner, the surface could be imaged with a frame rate of several fps. Furthermore, the high-speed AFM was coupled with a haptic device for human interfacing. By using the system, the operator can move the AFM probe into any position on the surface and feel the response from the surface during manipulation. As a demonstration of the system, nanofabrication under real-time monitoring was performed. This system would be very useful for real-time nanomanipulation and fabrication of sample surfaces.

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YUAN, Shuai. "Implementation of Virtual Clap Based AFM Nanomanipulation Through Tip Positioning." Journal of Mechanical Engineering 50, no. 13 (2014): 142. http://dx.doi.org/10.3901/jme.2014.13.142.

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Li, Guangyong, Yucai Wang, and Lianqing Liu. "Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan." IEEE Transactions on Automation Science and Engineering 9, no. 4 (October 2012): 755–62. http://dx.doi.org/10.1109/tase.2012.2211077.

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Gnecco, Enrico. "A collisional model for AFM manipulation of rigid nanoparticles." Beilstein Journal of Nanotechnology 1 (December 22, 2010): 158–62. http://dx.doi.org/10.3762/bjnano.1.19.

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The trajectories of differently shaped nanoparticles manipulated by atomic force microscopy are related to the scan path of the probing tip. The direction of motion of the nanoparticles is essentially fixed by the distance b between consecutive scan lines. Well-defined formulas are obtained in the case of rigid nanospheres and nanowires. Numeric results are provided for symmetric nanostars. As a result, orienting the fast scan direction perpendicular to the desired direction of motion and reducing b well below the linear size of the particles turns out to be an efficient way to control the nanomanipulation process.

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Landolsi, F., and F. H. Ghorbel. "Design of a duo-biomorph-based AFM cantilever suitable for nanomanipulation." Smart Materials and Structures 19, no. 6 (May 18, 2010): 065028. http://dx.doi.org/10.1088/0964-1726/19/6/065028.

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Bai, Huitian, and Sen Wu. "Deep-learning-based nanowire detection in AFM images for automated nanomanipulation." Nanotechnology and Precision Engineering 4, no. 1 (March 1, 2021): 013002. http://dx.doi.org/10.1063/10.0003218.

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Lytvyn, Peter M., Alexander A. Efremov, Oksana Lytvyn, Igor V. Prokopenko, Yurii I. Mazur, Morgan E. Ware, D. Fologia, and Gregory J. Salamo. "Precise Manipulations with Asymmetric Nano-Objects Viscoelastically Bound to a Surface." Journal of Nano Research 39 (February 2016): 256–76. http://dx.doi.org/10.4028/www.scientific.net/jnanor.39.256.

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This work provides a review of commonly used approaches for fine manipulations with nanoobjects by means of scanning probe microscopes and describes an original alternative cost-effective nanomanipulation method. High precision manipulations are important for up-to-date technologies of nanoelectronic, molecular, hybrid and nanomechanical devices and sensor systems especially for the state of the art fundamental and applied researches. A new method to form nanoassemblies by using asymmetric nanoparticles fixed on the surface with the viscoelastic linker has been proposed, theoretically substantiated and experimentally realized. An original theoretical model has been proposed to describe the ordering process of the linked nanorods by means of the multipass interaction with an atomic force microscope (AFM) tip.In addition, an adjustment of the tip-surface interaction has been proposed and implemented which is independent of the AFM. This original approach is based on additional ultrasonic excitation of the surface. This also enabled us to control the degree binding of the nanoparticles with the substrate.With these techniques we were able to form sets of chains (more than 5-μm length) consisting of nanometer-sized (10x50 nm) gold nanorods (NRs) linked to the surface of gallium arsenide by an organic linker. It has been shown that the viscoelastic binding of asymmetric nanoparticles to the surface allows us to create linear assemblies of nanoobjects in just a few passes of the AFM probe.The proposed technique significantly increases manufacturability of nanomanipulations. Direct formation of nanostructures can significantly reduce the cost of their formation in comparison with modern conventional technological approaches, which in many cases may even have some fundamental limitations (in resolution, in materials used, etc.).

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Yang, Qinmin, and Jiangang Lu. "Robust Integral of NN and Error Sign Control for Nanomanipulation Using AFM." International Journal of Intelligent Mechatronics and Robotics 2, no. 2 (April 2012): 78–90. http://dx.doi.org/10.4018/ijimr.2012040106.

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This paper presents a novel control methodology for automatically manipulating nano particles on the substrate by using Atomic Force Microscope (AFM). The interactive forces and dynamics between the tip, particle and substrate are modeled and analyzed including the roughness effect of the substrate. Further, the control signal is designed to consist of the robust integral of a neural network (NN) output plus the sign of the error feedback signal multiplied with an adaptive gain. Using the NN-based adaptive force controller, the task of pushing nano particles is demonstrated in simulation environment. Finally, the asymptotical tracking performance of the closed-loop system, boundedness of the NN weight estimates and applied forces are shown by using the Lyapunov-based stability analysis.

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Ju, Dianming, Ying Zhang, Rui Li, Shuang Liu, Longhai Li, and Haitao Chen. "Mechanism-Independent Manipulation of Single-Wall Carbon Nanotubes with Atomic Force Microscopy Tip." Nanomaterials 10, no. 8 (July 30, 2020): 1494. http://dx.doi.org/10.3390/nano10081494.

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Atomic force microscopy (AFM) based nanomanipulation can align the orientation and position of individual carbon nanotubes accurately. However, the flexible deformation during the tip manipulation modifies the original shape of these nanotubes, which could affect its electrical properties and reduce the accuracy of AFM nanomanipulation. Thus, we developed a protocol for searching the synergistic parameter combinations to push single-wall carbon nanotubes (SWCNTs) to maintain their original shape after manipulation as far as possible, without requiring the sample physical properties and the tip-manipulation mechanisms. In the protocol, from a vast search space of manipulating parameters, the differential evolution (DE) algorithm was used to identify the optimal combinations of three parameters rapidly with the DE algorithm and the feedback of the length ratio of SWCNTs before and after manipulation. After optimizing the scale factor F and crossover probability Cr, the values F = 0.4 and Cr = 0.6 were used, and the ratio could reach 0.95 within 5–7 iterations. A parameter region with a higher length ratio was also studied to supply arbitrary pushing parameter combinations for individual manipulation demand. The optimal pushing parameter combination reduces the manipulation trajectory and the tip abrasion, thereby significantly improving the efficiency of tip manipulation for nanowire materials. The protocol for searching the best parameter combinations used in this study can also be extended to manipulate other one-dimensional nanomaterials.

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WANG, XINYAN, HAIJUN YANG, HUABIN WANG, PENG WANG, and HAI LI. "VISUALIZATION EX SITU OF SINGLE DNA MOLECULES INCUBATION: A FIRST STEP FOR QUANTITATIVE ANALYSIS ON MULTI-SITE DEGRADATION AND ENZYMATIC KINETICS." Surface Review and Letters 16, no. 01 (February 2009): 79–85. http://dx.doi.org/10.1142/s0218625x09012329.

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Herein, we showed a different approach to directly single-molecule level visualization of the degradation of DNA in vitro tests using DNase I incubation based on high-resolution AFM imaging ex situ with fine relocation nanotechnology. A method of nanomanipulation termed as "modified dynamic molecular combing" (MDMC) was used to pattern DNA samples for further degradation and enzymatic kinetics. This strategy is potentially able to quantitatively address the mechanical-induced kinetic profiles of multi-site degradation of individual DNA molecules with very stable tension and strong immobilization on a surface and discover the mechanochemistry.

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Nieradka, Konrad, Daniel Kopiec, Grzegorz Małozięć, Zuzanna Kowalska, Piotr Grabiec, Paweł Janus, Andrzej Sierakowski, Krzysztof Domański, and Teodor Gotszalk. "Fabrication and characterization of electromagnetically actuated microcantilevers for biochemical sensing, parallel AFM and nanomanipulation." Microelectronic Engineering 98 (October 2012): 676–79. http://dx.doi.org/10.1016/j.mee.2012.06.019.

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Xie, Hui, Julien Vitard, Dogan Sinan Haliyo, and StÉphane Regnier. "Enhanced Accuracy of Force Application for AFM Nanomanipulation Using Nonlinear Calibration of Optical Levers." IEEE Sensors Journal 8, no. 8 (August 2008): 1478–85. http://dx.doi.org/10.1109/jsen.2008.920722.

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Shen, Yajing. "Effect of the Tip Size on AFM Cantilever Based Force Sensor." Journal of Sensors 2015 (2015): 1–8. http://dx.doi.org/10.1155/2015/926594.

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Atomic force microscopy (AFM) cantilever is a widely used end effector for precise force sensing and micro-nanomanipulation at small scale. However, in current researches, the effect of the cantilever tip on the force sensing and manipulation accuracy is rarely considered. In this paper, we investigate how the tip size of the end effector affects the measurement accuracy of the cell adhesion force. First, several end effectors with different tip sizes are fabricated from the same AFM cantilever via focused ion beam (FIB) etching. Then, the single cell detachment force is measured at the same experiment condition by these end effectors, respectively. The results indicate that the sensed adhesion force is susceptible to the tip size of the end effector obviously. In addition, the precision of cell manipulation is also regulated by the contact area between the cell and end effector greatly. These findings will benefit our in-depth understanding on the force interaction at small scale and will provide valid reference for the development of high-precision force sensor and manipulation.

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Maharaj, Dave, and Bharat Bhushan. "Nanomanipulation, nanotribology and nanomechanics of Au nanorods in dry and liquid environments using an AFM and depth sensing nanoindenter." Nanoscale 6, no. 11 (2014): 5838–52. http://dx.doi.org/10.1039/c3nr06646k.

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Ghattan Kashani, H., S. Shokrolahi, H. Akbari Moayyer, M. Shariat Panahi, and A. Shahmoradi Zavareh. "Experimental and numerical investigation of nanoparticle releasing in AFM nanomanipulation using high voltage electrostatic forces." Journal of Applied Physics 122, no. 3 (July 21, 2017): 034305. http://dx.doi.org/10.1063/1.4995287.

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Korayem, M. H., and M. Zakeri. "Sensitivity analysis of nanoparticles pushing critical conditions in 2-D controlled nanomanipulation based on AFM." International Journal of Advanced Manufacturing Technology 41, no. 7-8 (May 7, 2008): 714–26. http://dx.doi.org/10.1007/s00170-008-1519-0.

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Falvo, M. R., G. Clary, A. Helser, S. Paulson, R. M. Taylor, V. Chi, F. P. Brooks, S. Washburn, and R. Superfine. "Nanomanipulation Experiments Exploring Frictional and Mechanical Properties of Carbon Nanotubes." Microscopy and Microanalysis 4, no. 5 (October 1998): 504–12. http://dx.doi.org/10.1017/s1431927698980485.

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In many cases in experimental science, the instrument interface becomes a limiting factor in the efficacy of carrying out unusual experiments or prevents the complete understanding of the acquired data. We have developed an advanced interface for scanning probe microscopy (SPM) that allows intuitive rendering of data sets and natural instrument control, all in real time. The interface, called the nanoManipulator, combines a high-performance graphics engine for real-time data rendering with a haptic interface that places the human operator directly into the feedback loop that controls surface manipulations. Using a hand-held stylus, the operator moves the stylus laterally, directing the movement of the SPM tip across the sample. The haptic interface enables the user to “feel” the surface by forcing the stylus to move up and down in response to the surface topography. In this way the user understands the immediate location of the tip on the sample and can quickly and precisely maneuver nanometer-scale objects. We have applied this interface to studies of the mechanical properties of nanotubes and to substrate-nanotube interactions. The mechanical properties of carbon nanotubes have been demonstrated to be extraordinary. They have an elastic modulus rivaling that of the stiffest material known, diamond, while maintaining a remarkable resistance to fracture. We have used atomic-force microscopy (AFM) to manipulate the nanotubes through a series of configuration that reveal buckling behavior and high-strain resilience. Nanotubes also serve as test objects for nanometer-scale contact mechanics. We have found that nanotubes will roll under certain conditions. This has been determined through changes in the images and through the acquisition of lateral force during manipulation. The lateral force data show periodic stick-slip behavior with a periodicity matching the perimeter of the nanotube.

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Leite, F. L., E. C. Ziemath, O. N. Oliveira Jr., and P. S. P. Herrmann. "Adhesion Forces for Mica and Silicon Oxide Surfaces Studied by Atomic Force Spectroscopy (AFS)." Microscopy and Microanalysis 11, S03 (December 2005): 130–33. http://dx.doi.org/10.1017/s1431927605051068.

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The possibility of analyzing surfaces at the nanoscale provided by atomic force microscopy [1] (AFM) has been explored for various materials, including polymers [2], biological materials [3] and clays [4]. Further uses of AFMs involved nanomanipulation [5] and measurements of interaction forces, where the latter has been referred to as atomic force spectroscopy (AFS) [6]. Measurements of surface-surface interactions at the nanoscale are important because many materials have their properties changed at this range [7]. For samples in air, the interactions with the tip are a superimposition of van der Waals, electrostatic and capillary forces. A number of surface features can now be monitored with AFS, such as adsorption processes and contamination from the environment. Many implications exist for soil sciences and other areas, because quantitative knowledge of particle adhesion is vital for understanding technological processes, including particle aggregation in mineral processing, quality of ceramics and adhesives. In this paper, we employ AFS to measure adhesion (pull-off force) between the AFM tip and two types of substrate. Adhesion maps are used to illustrate sample regions that had been contaminated with organic compounds.

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Duan, Na, Fei Long, Xinyan Wang, Bin Li, Jun Hu, and Yi Zhang. "Facilitating the pickup of individual DNA molecules by AFM nanomanipulation with tips mechanically worn on bare mica." Microscopy Research and Technique 75, no. 5 (November 7, 2011): 638–42. http://dx.doi.org/10.1002/jemt.21104.

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Fehler, Konstantin G., Anna P. Ovvyan, Lukas Antoniuk, Niklas Lettner, Nico Gruhler, Valery A. Davydov, Viatcheslav N. Agafonov, Wolfram H. P. Pernice, and Alexander Kubanek. "Purcell-enhanced emission from individual SiV− center in nanodiamonds coupled to a Si3N4-based, photonic crystal cavity." Nanophotonics 9, no. 11 (July 10, 2020): 3655–62. http://dx.doi.org/10.1515/nanoph-2020-0257.

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AbstractHybrid quantum photonics combines classical photonics with quantum emitters in a postprocessing step. It facilitates to link ideal quantum light sources to optimized photonic platforms. Optical cavities enable to harness the Purcell-effect boosting the device efficiency. Here, we postprocess a free-standing, crossed-waveguide photonic crystal cavity based on Si3N4 with SiV− center in nanodiamonds. We develop a routine that optimizes the overlap with the cavity electric field utilizing atomic force microscope (AFM) nanomanipulation to attain control of spatial and dipole alignment. Temperature tuning further gives access to the spectral emitter-cavity overlap. After a few optimization cycles, we resolve the fine-structure of individual SiV− centers and achieve a Purcell enhancement of more than 4 on individual optical transitions, meaning that four out of five spontaneously emitted photons are channeled into the photonic device. Our work opens up new avenues to construct efficient quantum photonic devices.

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Nishida, Shuhei, Yutaka Funabashi, and Atsushi Ikai. "Combination of AFM with an objective-type total internal reflection fluorescence microscope (TIRFM) for nanomanipulation of single cells." Ultramicroscopy 91, no. 1-4 (May 2002): 269–74. http://dx.doi.org/10.1016/s0304-3991(02)00108-0.

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Tian, Xiao Jun, Yue Chao Wang, and Zai Li Dong. "A Study on the Assembly and Improvement of Electrical Contact between Carbon Nanotube and Microelectrode." Advanced Materials Research 60-61 (January 2009): 399–405. http://dx.doi.org/10.4028/www.scientific.net/amr.60-61.399.

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Nowadays research on nano-electronic device based on carbon nanotube (CNT) raises much interest among researchers, but in the fabrication process, crucial problems exist in making and improving the electrical contact between CNT and microelectrode. Here pulse gas alignment method, combined with nanomanipulation technology based on atomic force microscope (AFM) if necessary, is proposed for the first time to assemble and make electrical contact between CNT and microelectrode. After the assembly, a processing technique of applying sweeping voltages is performed for producing electrical current induced local Joule heat, which will decompose and remove the sodium dodecyl sulfate (SDS) molecules adsorbed on the CNT and at the interface region, or even have some annealing effect, to reduce the contact resistance between CNT and microelectrode and thus to improve the electrical contact. Experiments of assembly and improvement of electrical contact between multi-wall carbon nanotube and microelectrode are performed to verify the effectiveness of the proposed methods

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Dong, Lixin, Fumihito Arai, and Toshio Fukuda. "3-D Nanorobotic Manipulation of Nanometer-scale Objects." Journal of Robotics and Mechatronics 13, no. 2 (April 20, 2001): 146–53. http://dx.doi.org/10.20965/jrm.2001.p0146.

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A set of nanorobotic manipulators with 4-DOF is constructed for 3-D nanomanipulation of nanometer-scale objects, which can work both under optical microscopes (OM) in air and inside the vacuum chamber of scanning electronic microscopes (SEM). Manipulators are actuated with PicomotorsTM (New Focus Inc.) with better than 30nm linear resolution (X, Y, Z stages actuated by Picomotors) and 2mrad rotary one. 2 atomic force microscope (AFM) cantilevers serve as the end-effectors, with 1 vertically installed (the axis of the cantilever tip is vertical to the light axis of OM or electronic beam of SEM) to facilitate the observation of operation. Manipulation is made by controlling dielectrophoretic force between the cantilever and objects, and by modifying the van der Waals force between the sample substrate and objects. Pick-and-placement of a ø1µm polystyrene bead shows the effectiveness of direlectrophoresis. To show manipulation accuracy, several letters are ""written"" with polystyrene ø3µm and ø1µm beads. Multiwall carbon nanotubes (MWNTs) are manipulated in 3-D space including picking up and placing single ones. Force measurements are made to get information to facilitate manipulation.

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Damircheli, Mehrnoosh, and Babak Eslami. "Design of V-shaped cantilevers for enhanced multifrequency AFM measurements." Beilstein Journal of Nanotechnology 11 (October 6, 2020): 1525–41. http://dx.doi.org/10.3762/bjnano.11.135.

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As the application of atomic force microscopy (AFM) in soft matter characterization has expanded, the use of different types of cantilevers for these studies have also increased. One of the most common types of cantilevers used in soft matter imaging is V-shaped cantilevers due to their low normal spring constant. These types of cantilevers are also suitable for nanomanipulation due to their high lateral spring constants. The combination of low normal spring constant and high lateral spring constants makes V-shaped cantilevers promising candidates for imaging soft matter. Although these cantilevers are widely used in the field, there are no studies on the static and dynamic behavior of V-shaped cantilevers in multifrequency AFM due to their complex geometry. In this work, the static and dynamic properties of V-shaped cantilevers are studied while investigating their performance in multifrequency AFM (specifically bimodal AFM). By modeling the cantilevers based on Timoshenko beam theory, the geometrical dimensions such as length, base width, leg width and thickness are studied. By finding the static properties (mass, spring constants) and dynamic properties (resonance frequencies and quality factors) for different geometrical dimensions, the optimum V-shaped cantilever that can provide the maximum phase contrast in bimodal AFM between gold (Au) and polystyrene (PS) is found. Based on this study, it is found that as the length of the cantilever increases the 2nd eigenmode phase contrast decreases. However, the base width exhibits the opposite relationship. It is also found that the leg width does not have a monotone relationship similar to length and base width. The phase contrast increases for the range of 14 to 32 µm but decreases afterwards. The thickness of a V-shaped cantilever does not play a major role in defining the dynamics of the cantilever compared to other parameters. This work shows that in order to maximize the phase contrast, the ratio of second to first eigenmode frequencies should be minimized and be close to a whole number. Additionally, since V-shaped cantilevers are mostly used for soft matter imaging, lower frequency ratios dictate lower spring constant ratios, which can be advantageous due to lower forces applied to the surface by the tip given a sufficiently high first eigenmode frequency. Finally, two commercially available V-shaped cantilevers are theoretically and experimentally benchmarked with an optimum rectangular cantilever. Two sets of bimodal AFM experiments are carried out on Au-PS and PS-LDPE (polystyrene and low-density polyethylene) samples to verify the simulation results.

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Liu, Mei, Weilin Su, Xiangzheng Qin, Kai Cheng, Wei Ding, Li Ma, Ze Cui, et al. "Mechanical/Electrical Characterization of ZnO Nanomaterial Based on AFM/Nanomanipulator Embedded in SEM." Micromachines 12, no. 3 (February 28, 2021): 248. http://dx.doi.org/10.3390/mi12030248.

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ZnO nanomaterials have been widely used in micro/nano devices and structure due to special mechanical/electrical properties, and its characterization is still deficient and challenging. In this paper, ZnO nanomaterials, including nanorod and nanowire are characterized by atomic force microscope (AFM) and nanomanipulator embedded in scanning electron microscope (SEM) respectively, which can manipulate and observe simultaneously, and is efficient and cost effective. Surface morphology and mechanical properties were observed by AFM. Results showed that the average Young’s modulus of ZnO nanorods is 1.40 MPa and the average spring rate is 0.08 N/m. Electrical properties were characterized with nanomanipulator, which showed that the ZnO nanomaterial have cut-off characteristics and good schottky contact with the tungsten probes. A two-probe strategy was proposed for piezoelectric property measurement, which is easy to operate and adaptable to multiple nanomaterials. Experiments showed maximum voltage of a single ZnO nanowire is around 0.74 mV. Experiment criteria for ZnO manipulation and characterization were also studied, such as acceleration voltage, operation duration, sample preparation. Our work provides useful references for nanomaterial characterization and also theoretical basis for nanomaterials application.

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Koitschev, A., S. Fink, U. Rexhausen, K. Löffler, J. K. H. Hörber, H. P. Zenner, J. P. Ruppersberg, and M. G. Langer. "Das Rasterkraftmikroskop (AFM) Ein Nanomanipulator für biophysikalische Untersuchungen an Stereozilien der Sinneszellen der Kochlea." HNO 50, no. 5 (May 2002): 464–69. http://dx.doi.org/10.1007/s00106-001-0573-9.

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Polyakov, Boris, Mikk Antsov, Sergei Vlassov, Leonid M. Dorogin, Mikk Vahtrus, Roberts Zabels, Sven Lange, and Rünno Lõhmus. "Mechanical properties of sol–gel derived SiO2 nanotubes." Beilstein Journal of Nanotechnology 5 (October 20, 2014): 1808–14. http://dx.doi.org/10.3762/bjnano.5.191.

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The mechanical properties of thick-walled SiO2 nanotubes (NTs) prepared by a sol–gel method while using Ag nanowires (NWs) as templates were measured by using different methods. In situ scanning electron microscopy (SEM) cantilever beam bending tests were carried out by using a nanomanipulator equipped with a force sensor in order to investigate plasticity and flexural response of NTs. Nanoindentation and three point bending tests of NTs were performed by atomic force microscopy (AFM) under ambient conditions. Half-suspended and three-point bending tests were processed in the framework of linear elasticity theory. Finite element method simulations were used to extract Young’s modulus values from the nanoindentation data. Finally, the Young’s moduli of SiO2 NTs measured by different methods were compared and discussed.

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Kim, Tae Gon, Antoine Pacco, Kurt Wostyn, Steven Brems, Xiu Mei Xu, Herbert Struyf, Kai Arstila, et al. "Effects of Interfacial Strength and Dimension of Structures on Physical Cleaning Window." Solid State Phenomena 187 (April 2012): 123–26. http://dx.doi.org/10.4028/www.scientific.net/ssp.187.123.

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Four different types of FINs; amorphous Si (a-Si), annealed a-Si, polycrystalline Si (poly-Si) and crystalline Si (c-Si) were used to investigate the effect of interfacial strength and the length of structures on the physical cleaning window by measuring their collapse forces by atomic force microscope (AFM). A transmission electron microscope (TEM) and a nanoneedle with a nanomanipulator in a scanning electron microscope (SEM) were employed in order to explain the different collapse behavior and their forces. Different fracture shapes and collapse forces of FINs could explain the influence of the interfacial strength on the pattern strength. Furthermore, the different lengths of a-Si FINs were prepared and their collapse forces were measured and the shorter length reduced their pattern strength. Strong adhesion at the interface resulted in a wider process window while smaller dimensions made the process window narrower.

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Korayem, M. H., M. Taheri, and S. D. Ghahnaviyeh. "Sobol method application in dimensional sensitivity analyses of different AFM cantilevers for biological particles." Modern Physics Letters B 29, no. 22 (August 20, 2015): 1550123. http://dx.doi.org/10.1142/s0217984915501237.

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Due to the more delicate nature of biological micro/nanoparticles, it is necessary to compute the critical force of manipulation. The modeling and simulation of reactions and nanomanipulator dynamics in a precise manipulation process require an exact modeling of cantilevers stiffness, especially the stiffness of dagger cantilevers because the previous model is not useful for this investigation. The stiffness values for V-shaped cantilevers can be obtained through several methods. One of them is the PBA method. In another approach, the cantilever is divided into two sections: a triangular head section and two slanted rectangular beams. Then, deformations along different directions are computed and used to obtain the stiffness values in different directions. The stiffness formulations of dagger cantilever are needed for this sensitivity analyses so the formulations have been driven first and then sensitivity analyses has been started. In examining the stiffness of the dagger-shaped cantilever, the micro-beam has been divided into two triangular and rectangular sections and by computing the displacements along different directions and using the existing relations, the stiffness values for dagger cantilever have been obtained. In this paper, after investigating the stiffness of common types of cantilevers, Sobol sensitivity analyses of the effects of various geometric parameters on the stiffness of these types of cantilevers have been carried out. Also, the effects of different cantilevers on the dynamic behavior of nanoparticles have been studied and the dagger-shaped cantilever has been deemed more suitable for the manipulation of biological particles.

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Li, Mi, Lianqing Liu, Ning Xi, and Yuechao Wang. "Biological Applications of a Nanomanipulator Based on AFM: In situ visualization and quantification of cellular behaviors at the single-molecule level." IEEE Nanotechnology Magazine 9, no. 3 (September 2015): 25–35. http://dx.doi.org/10.1109/mnano.2015.2441110.

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Krohs, Florian, Cagdas Onal, Metin Sitti, and Sergej Fatikow. "Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure." Journal of Dynamic Systems, Measurement, and Control 131, no. 6 (November 1, 2009). http://dx.doi.org/10.1115/1.4000139.

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While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter, the assembly of nano-objects, is a very promising technique for prototyping nanoelectronical devices that are composed of DNA-based nanowires, CNTs, etc. But, pushing nano-objects in the order of a few nanometers nowadays remains a very challenging, labor-intensive task that requires frequent human intervention. To increase throughput of AFM-based nanomanipulation, automation can be considered as a long-term goal. However, automation is impeded by spatial uncertainties existing in every AFM system. This article focuses on thermal drift, which is a crucial error source for automating AFM-based nanoassembly, since it implies a varying, spatial displacement between AFM probe and sample. A novel, versatile drift estimation method based on Monte Carlo localization is presented and experimental results obtained on different AFM systems illustrate that the developed algorithm is able to estimate thermal drift inside an AFM reliably even with highly unstructured samples and inside inhomogeneous environments.

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Zhao, Wei, Kangmin Xu, Xiaoping Qian, and Rong Wang. "Tip Based Nanomanipulation Through Successive Directional Push." Journal of Manufacturing Science and Engineering 132, no. 3 (May 26, 2010). http://dx.doi.org/10.1115/1.4001676.

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Nanomanipulation refers to the process of transporting nanoscale components. It has found applications in nanodevice prototyping and biomolecular and cellular investigation. In this paper, we present an atomic force microscope (AFM) based approach for automated manipulation of nanoparticles to form designed patterns. The automated manipulation is based on a novel method, successive directional push. This method keeps pushing along a fixed forward direction until the particle reaches the baseline of the target position, and it then repeats the pushing process along the baseline direction. This process is iterated until the particle reaches its target position. By examining the topography of several local parallel scan lines, this method can determine the lateral coordinate of the particle. The novelty of this method lies in the fact that further pushing along the same pushing direction can be conducted without precise information about the forward position. The successive directional push method has been successfully implemented into an AFM system. We demonstrate that complex designed patterns including over 100 latex particles of 50 nm diameter can be fabricated with this method.

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Landolsi, Fakhreddine, Fathi H. Ghorbel, and James B. Dabney. "Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing." Journal of Dynamic Systems, Measurement, and Control 135, no. 1 (October 30, 2012). http://dx.doi.org/10.1115/1.4006370.

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The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.

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Korayem, M. H., R. N. Hefzabad, A. Homayooni, and H. Aslani. "Molecular dynamics simulation of nanomanipulation based on AFM in liquid ambient." Applied Physics A 122, no. 11 (October 22, 2016). http://dx.doi.org/10.1007/s00339-016-0504-y.

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Park, Kyung Jin, Ji-Hyeok Huh, Dae-Woong Jung, Jin-Sung Park, Gwan H. Choi, Gaehang Lee, Pil J. Yoo, Hong-Gyu Park, Gi-Ra Yi, and Seungwoo Lee. "Assembly of “3D” plasmonic clusters by “2D” AFM nanomanipulation of highly uniform and smooth gold nanospheres." Scientific Reports 7, no. 1 (July 20, 2017). http://dx.doi.org/10.1038/s41598-017-06456-w.

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Hantschel, Thomas, Peter Ryan, Saku Palanne, Oliver Richard, Kai Arstila, Anne S. Verhulst, Hugo Bender, Xiaoxing Ke, and Wilfried Vandervorst. "Nanoprober-Based Pick-and-Place Process for Site-Specific Characterization of Individual Carbon Nanotubes." MRS Proceedings 1081 (2008). http://dx.doi.org/10.1557/proc-1081-p17-04.

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AbstractThe potential use of carbon nanotubes (CNT) as interconnects requires also new characterization approaches as the existing ones are optimized for three-dimensional materials and do not work for inherently one-dimensional structures like CNTs. Therefore, we have developed a so-called pick-and-place process which allows to remove an individual CNT from a specific site and to place it at another location for further analysis. The approach is based on nanomanipulation combined with scanning electron microscopy (SEM). This paper presents the pick-and-place concept and explains the different steps required for its successful application. We further demonstrate its power by characterizing individual CNTs using transmission electron microscopy (TEM) and atomic force microscopy (AFM). The developed pick-and-place approach overcomes the challenge of site-specific analysis of CNT interconnects and strongly facilitates the routine analysis of CNTs.

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Journal articles on the topic 'AFM nanomanipulation'

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