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1

Parsons, Colton A. "Variable Precision Tandem Analog-to-Digital Converter (ADC)." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1255.

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This paper describes an analog-to-digital signal converter which varies its precision as a function of input slew rate (maximum signal rate of change), in order to best follow the input in real time. It uses Flash and Successive Approximation (SAR) conversion techniques in sequence. As part of the design, the concept of "total real-time optimization" is explored, where any delay at all is treated as an error (Error = Delay * Signal Slew Rate). This error metric is proposed for use in digital control systems. The ADC uses a 4-bit Flash converter in tandem with SAR logic that has variable precision (0 to 11 bits). This allows the Tandem ADC to switch from a fast, imprecise converter to a slow, precise converter. The level of precision is determined by the input’s peak rate of change, optimized for minimum real-time error; a secondary goal is to react quickly to input transient spikes. The implementation of the Tandem ADC is described, along with various issues which arise when designing such a converter and how they may be dealt with. These include Flash ADC inaccuracies, rounding issues, and system timing and synchronization. Most of the design is described down to the level of logic gates and related building blocks (e.g. latches and flip-flops), and various logic optimizations are used in the design to reduce calculation delays. The design also avoids active analog circuitry whenever possible – it can be almost entirely implemented with CMOS logic and passive analog components.
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2

Orchanian, Shant. "Split Non-Linear Cyclic Analog-to-Digital Converter." Digital WPI, 2010. https://digitalcommons.wpi.edu/etd-theses/324.

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Analog-to-Digital Converters (ADC's) are inherently optimized for linearity in order to produce an accurate digital representation of an analog voltage. The Cyclic ADC's linearity is limited by one of its components, the residue amplifier. The residue amplifier is used to amplify the error between the analog voltage and the digital decision by a gain of two in each cycle of a conversion. In previous designs, this was accomplished by using a compound op-amp with a large open loop gain for linearity, and negative feedback to achieve the gain of two. This thesis explores the use of a resistively loaded differential pair to achieve this gain. The design reduces die size, power usage, and analog complexity. To correct for this inherent non- linearity, a Split ADC concept is employed to enable digital background calibration and a correction algorithm to account for this non- linearity. The Integrated circuit is designed, laid out, and simulated using the Cadence Integrated Circuit Front to Back design suite (ICFB) in the 0.18um Jazz CMOS process.
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3

Carter, Nathan R. "A 12-b 50Msample/s Pipeline Analog to Digital Converter." Digital WPI, 2000. https://digitalcommons.wpi.edu/etd-theses/749.

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This thesis focuses on the performace of pipeline converters and their integration on mixed signal processes. With this in mind, a 12-b 50MHz pipeline ADC has been realized in a 0.6um digital CMOS process. The architecture is based on a 1.5-b per stage structure utilizing digital correction for the first six stages. A differeintial switched capacitor circuit consisting of a cascode gm-c op-amp with 250MHz of bandwidth is used for sampling and amplification in each stage. Comparators with an internal offset voltage are used to implement the decision levels required for the 1.5-b per stage structure. Correction of the pipeline is accomplished by measuring the offset and gain of each of the first six stages using subsequent stages. The measured values are used to calculate digtal values the compensate for the inaccuracies of the analog pipeline. Corrected digital values for each stage are stored in the pipeline and used to create corrected output codes. Errors caused by measuring the first six stages using uncalibrated stages are minimized by using extra switching circuitry during calibration.
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4

Croughwell, Rosamaria. "A 16-b 10Msample/s Split-Interleaved Analog to Digital Converter." Digital WPI, 2007. https://digitalcommons.wpi.edu/etd-theses/974.

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"This work describes the integrated circuit design of a 16-bit, 10Msample/sec, combination ‘split’ interleaved analog to digital converter. Time interleaving of analog to digital converters has been used successfully for many years as a technique to achieve faster speeds using multiple identical converters. However, efforts to achieve higher resolutions with this technique have been difficult due to the precise matching required of the converter channels. The most troublesome errors in these types of converters are gain, offset and timing differences between channels. The ‘split ADC’ is a new concept that allows the use of a deterministic, digital, self calibrating algorithm. In this approach, an ADC is split into two paths, producing two output codes from the same input sample. The difference of these two codes is used as the calibration signal for an LMS error estimation algorithm that drives the difference error to zero. The ADC is calibrated when the codes are equal and the output is taken as the average of the two codes. The ‘split’ ADC concept and interleaved architecture are combined in this IC design to form the core of a high speed, high resolution, and self-calibrating ADC system. The dual outputs are used to drive a digital calibration engine to correct for the channel mismatch errors. This system has the speed benefits of interleaving while maintaining high resolution. The hardware for the algorithm as well as the ADC can be implemented in a standard 0.25um CMOS process, resulting in a relatively inexpensive solution. This work is supported by grants from Analog Devices Incorporated (ADI) and the National Science Foundation (NSF). "
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5

Levski, Dimitrov Deyan. "A Cyclic Analog to Digital Converter for CMOS image sensors." Thesis, Linköpings universitet, Elektroniksystem, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-103193.

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The constant strive for improvement of digital video capturing speeds together with power efficiency increase, has lead to tremendous research activities in the image sensor readout field during the past decade. The improvement of lithography and solid-state technologies provide the possibility of manufacturing higher resolution image sensors. A double resolution size-up, leads to a quadruple readout speed requirement, if the same capturing frame rate is to be maintained. The speed requirements of conventional serial readout techniques follow the same curve and are becoming more challenging to design, thus employing parallelism in the readout schemes appears to be inevitable for relaxing the analog readout circuits and keeping the same capturing speeds. This transfer however imposes additional demands to parallel ADC designs, mainly related to achievable accuracy, area and power. In this work a 12-bit Cyclic ADC (CADC) aimed for column-parallel readout implementation in CMOS image sensors is presented. The aim of the conducted study is to cover multiple CADC sub-component architectures and provide an analysis onto the latter to a mid-level of depth. A few various Multiplying DAC (MDAC) structures have been re-examined and a preliminary redundant signed-digit CADC design based on a 1.5-bit modified flip-over MDAC has been conducted. Three comparator architectures have been explored and a dynamic interpolative Sub-ADC is presented. Finally, some weak spots degrading the performance of the carried-out design have been analyzed. As an architectural improvement possibility two MDAC capacitor mismatch error reduction techniques have been presented.
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6

Spetla, Hattie. "Split Cyclic Analog to Digital Converter Using A Nonlinear Gain Stage." Digital WPI, 2009. https://digitalcommons.wpi.edu/etd-theses/1014.

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"Previous implementations of digital background calibration for cyclic ADCs have required linear amplifier behavior in the gain stage for accurate correction. Correction is digital decoding of ADC outputs to determine the original ADC input. Permitting nonlinearity in the gain stage of the ADC allows for less demanding amplifier design requirements, reducing power and size. However this requires a method of determining the value of this variable gain during digital correction. Look up tables (LUTs,) are an effective and efficient method of compensating for analog circuit imperfections. The LUT correction and calibration method discussed in this work has been simulated using Cadence integrated circuit simulation ADC specifications and MATLAB."
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7

Tchambake, Yapti Kelly. "Wideband Analog-to-Digital Converter (ADC) design for power amplifiers linearization." Electronic Thesis or Diss., Université Paris-Saclay (ComUE), 2019. http://www.theses.fr/2019SACLT047.

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De nos jours, la consommation d’énergie devient un des principaux défis à surmonter dans le développement des réseaux de communications mobiles. L’amplificateur de puissance est le composant le plus gourmand en énergie dans les stations de base. La cinquième génération de téléphonie mobile de part ses larges bandes de communication et ses modulations complexes augmente encore plus les contraintes sur l’amplificateur de puissance. Pour palier ce problème, il est courant de faire appel à des techniques de pré-distorsion. Une contrainte importante dans la mise en oeuvre de cette technique est la numérisation de la sortie de l’amplificateur qui, dû aux non-linéarités, s’étale sur un spectre significativement plus large que le signal utile, environ 5 fois en pratique voire plus. Habituellement, pour cette opération de numérisation, un Convertisseur Analogique Numérique (CAN) du type pipeline est utilisé car il permet d’obtenir des résolutions supérieures à 10 bits sur une bande de plusieurs dizaines voire centaines de MHz. Cependant, sa consommation d’énergie élevée pousse à explorer d’autres pistes. L’architecture "Multi Stage Noise Band Cancellation" (MSNBC) à base de modulateurs Delta Sigma a l’avantage de réaliser des dynamiques différentes par sous bande et est ainsi un candidat de choix pour le CAN de la boucle de retour des techniques de pré-distortion. L’objectif de ce travail est de démontrer la faisabilité de l’architecture MSNBC qui jusqu’à présent a été uniquement étudiée au niveau système. Ces études nous ont permis de proposer une architecture adaptée pour la numérisation d’un signal de bande RF 20 MHz avec des résolutions différentes par sous bande. Une architecture Zéro-IF tempscontinu avec un modulateur primaire du second ordre et un modulateur secondaire du quatrième ordre avec des quantificateurs 4 bits a été adoptée. Cette architecture a été implémentée en une technologie CMOS 65 nm. Les simulations électriques du MSNBC 2-4 avec un signal LTE ont permis d’obtenir 84.5 dB de SNDR dans la bande principale et 29.2 dB dans la bande adjacente contenant les produits d’intermodulation
Power consumption is nowadays one of the main challenges to overcome in the development of mobile communications networks. The power amplifier (PA) is the most power hungry component in base transceiver stations. The upcoming fifth generation of mobile telephony with wider communication bands and complex modulations further increases the constraints on the PA. To overcome this problem, it is common to use predistortion techniques that enable the power amplifier to operate with greater linearity and efficiency. An important constraint in the implementation of this technique is the digitization of the output of the amplifier which, due to non-linearities, spreads over a significantly wider spectrum than the initial signal, about 5 times in practice or even more. Pipeline Analog-to-Digital Converters (ADCs) are commonly used for this operation because it allows resolutions of greater than 10 bits to be obtained over a band of several tens or even hundreds of MHz. However, its high energy consumption pushes to find a better solution. The "Multi Stage Noise Band Cancellation" (MSNBC) architecture based on Delta Sigma modulators has the advantage of realizing different dynamics per subband and is thus a prime candidate for the feedback loop ADC of predistortion techniques. The purpose of this work is to demonstrate the feasibility of the MSNBC architecture that has so far only been studied at the system level. Our investigations allowed us to propose a suitable architecture to digitize a 20 MHz RF band signal with different resolutions per subband. A continuous time Zero-IF architecture with a second-order primary modulator and a fourth-order secondary modulator with 4-bit quantizers was adopted. This architecture has been implemented in a 65 nm CMOS technology. Transistor level simulations of the 2-4 MSNBC architecture simulations with an LTE test signal resulted in 84.5 dB SNDR in the main band and 29.2 dB in the adjacent band which contains the intermodulation products
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8

Aust, Carrie Ellen. "A Low-Power, Variable-Resolution Analog-to-Digital Converter." Thesis, Virginia Tech, 2000. http://hdl.handle.net/10919/33737.

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Analog-to-digital converters (ADCs) are used to convert analog signals to the digital domain in digital communications systems. An ADC used in wireless communications should meet the necessary requirements for the worst-case channel condition. However, the worst-case scenario rarely occurs. As a consequence, a high-resolution and subsequently high power ADC designed for the worst case is not required for most operating conditions. A solution to reduce the power dissipation of ADCs in wireless digital communications systems is to detect the current channel condition and to dynamically vary the resolution of the ADC according to the given channel condition. In this thesis, we investigated an ADC that can change its resolution dynamically and, consequently, its power dissipation. Our ADC is a switched-current, redundant signed-digit (RSD) cyclic implementation that easily incorporates variable resolution. Furthermore, the RSD cyclic algorithm is insensitive to offsets, allowing simple, low-power comparators. Our ADC is implemented in a 0.35 um CMOS technology with a single-ended 3.3 V power supply. Our ADC has a maximum power dissipation of 6.35 mW for a 12-bit resolution and dissipates an average of 10 percent less power when the resolution is decreased by two bits. Simulation results indicate our ADC achieves a bit rate of 1.7 MHz and has a SNR of 84 dB for the maximum input frequency of 8.3 kHz.
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9

Radhakrishnan, Venkataraman. "Design of a low power analog to digital converter in a 130nmCMOS technology." Thesis, Linköpings universitet, Elektroniksystem, 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-72700.

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Communication technology has become indispensable in a modernsociety. Its importance is growing day by day. One of the main reasonsbehind this growth is the advancement in the analog and mixed signalcircuit design.Analog to digital converter (ADC) is an essential part in a modernreceiver system. Its development is driven by the progress of CMOStechnologies with an aim to reduce area and power consumption. In thearea of RF integrated circuits for wireless application low operationalvoltage, and less current consumption are the central aspects of thedesign. The aim of this master thesis is the development and design ofa low-power analog to digital converter for RF applications.The basic specifications are:· High Speed, Low Current (1.5 V supply voltage)· Maximum input frequency 3.5 MHz· 8-bit resolution· Sampling rate < 100 MHzThus, this work comprises a theoretical concept phase in whichdifferent ADC topologies will be investigated. Based on which anappropriate ADC architecture will be fixed. Later, the chosen design willbe implemented in an industrial 130 nm CMOS process.
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10

Danesh, Seyed Amir Ali. "Time interleaved counter analog to digital converters." Thesis, University of Edinburgh, 2011. http://hdl.handle.net/1842/5790.

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The work explores extending time interleaving in A/D converters, by applying a high-level of parallelism to one of the slowest and simplest types of data-converters, the counter ADC. The motivation for the work is to realise high-performance re-configurable A/D converters for use in multi-standard and multi-PHY communication receivers with signal bandwidths in the 10s to 100s of MHz. The counter ADC requires only a comparator, a ramp signal, and a digital counter, where the comparator compares the sampled input against all possible quantisation levels sequentially. This work explores arranging counter ADCs in large time-interleaved arrays, building a Time Interleaved Counter (TIC) ADC. The key to realising a TIC ADC is distributed sampling and a global multi-phase ramp generator realised with a novel figure-of-8 rotating resistor ring. Furthermore Counter ADCs allow for re-configurability between effective sampling rate and resolution due to their sequential comparison of reference levels in conversion. A prototype TIC ADC of 128-channels was fabricated and measured in 0.13μm CMOS technology, where the same block can be configured to operate as a 7-bit 1GS/s, 8-bit 500MS/s, or 9-bit 250MS/s dataconverter. The ADC achieves a sub 400fJ/step FOM in all modes of configuration.
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11

Sheikhaei, Samad. "A 43mW single-channel 4GS/s 4-bit flash ADC IN 0.18um CMOS." Thesis, University of British Columbia, 2008. http://hdl.handle.net/2429/2746.

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The continued speed improvement of serial links and appearance of new communication technologies, such as ultra wideband (UWB), have introduced increasing demands on the speed and power specifications of high speed low to medium resolution analog to digital converters (ADCs). While multi channel ADCs can achieve high speeds, they often require extensive and costly post fabrication calibration. A single channel 4 bit flash ADC, suitable for abovementioned or similar applications, implemented entirely using current mode logic (CML) blocks, is presented. CML implementation allows for high sampling rates, while typically providing low power consumption at high speeds. To improve the conversion rate, both the analog (comparator array) and the digital (encoder) parts of the ADC are fully pipelined. Furthermore, the logic functions in the encoder are reformulated to reduce wire crossings and delay and to equalize the wires lengths in the layout. To keep the design simple, inductors are avoided. As a result, a compact design with small wire parasitics is achieved. Moreover, some geometric layout techniques, including a common centroid layout for the resistor ladder, are introduced to reduce the effect of mismatches to eliminate the use of digital calibration. The ADC is designed and fabricated in 0.18um CMOS and operates at 4GS/s. It achieves an effective number of bits (ENOB) of 3.71 (3.14, 2.75) for a 10MHz (0.501GHz, 1.491GHz) signal sampled at 4GS/s (3GS/s, 3GS/s). Differential/integral nonlinearity (DNL/INL) errors are between +/-0.35LSB and +/-0.26LSB, respectively. The ADC consumes 43mW from a 1.8V supply and occupies 0.06mm2 active area. Due to the use of CML circuits, the ADC achieves the highest speed reported for a single channel 4 bit ADC in a 0.18um CMOS technology. It also reports the best power performance among the 4-bit ADCs with similar or higher speeds. The active area is also among the smallest reported. In addition, in this thesis, the signal to noise ratio (SNR) of an ADC is formulated in terms of its INL performance. The related formulas in the literature are not accurate for low resolution ADCs, and yet they do not take the input waveform into account. Two standard waveforms, ramp and sinusoid, are considered here. The SNR formulas are derived and confirmed by simulation results.
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12

Hassan, Raza Naqvi Syed. "1 GS/s, Low Power Flash, Analog to Digital Converter in 90nm CMOS Technology." Thesis, Linköping University, Department of Electrical Engineering, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8382.

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The analog to digital converters is the key components in modern electronic systems. As the digital signal processing industry grows the ADC design becomes more and more challenging for researchers. In these days an ADC becomes a part of the system on chip instead of standalone circuit for data converters. This increases the requirements on ADC design concerning for example speed, power, area, resolution, noise etc. New techniques and methods are going to develop day by day to achieve high performance ADCs.

Of all types of ADCs the flash ADC is not only famous for its data conversion rate but also it becomes the part of other types of ADC for example pipeline and multi bit Sigma Delta ADCs. The main problem with a flash ADC is its power consumption, which increases in number of bits. This thesis presents the comparison of power consumption of different blocks in 1Gbps flash ADCs for 2, 4 and 6 bits in a 90nm CMOS technology. We also investigate the impact on power consumption by changing the design of decoder block.

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13

Majidi, Rabeeh. "DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS." Digital WPI, 2015. https://digitalcommons.wpi.edu/etd-dissertations/275.

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With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI.
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14

McGinnis, Ryan Edward. "Flexible Sigma Delta Time-Interleaved Bandpass Analog-to-Digital Converter." Wright State University / OhioLINK, 2006. http://rave.ohiolink.edu/etdc/view?acc_num=wright1152542196.

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15

Chan, Ka Yan. "Applying the "split-ADC" architecture to a 16 bit, 1 MS/s differential successive approximation analog-to-digital converter." Worcester, Mass. : Worcester Polytechnic Institute, 2008. http://www.wpi.edu/Pubs/ETD/Available/etd-043008-164352/.

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16

EL, RACHINI ALI. "Redundant analog to digital conversion architectures in CMOS technology." Doctoral thesis, Università degli Studi di Cagliari, 2015. http://hdl.handle.net/11584/266860.

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The operation of modern electronic devices in different fields as communications, signal processing, and sensor interface is critically affected with robust, high performance and scalable Analog-to-Digital Converter (ADCs), that can be considered as one of the main blocks in many systems, since they are mandatory to make the link between the analog outside world and the evermore-ubiquitous digital computer world. The design of these ADCs come distinct tradeoffs between speed, power, resolution, and die area embodied within many data conversion architectural variations. The flash ADC structure are often the base structure for high-speed operation and simple architecture analog-to-digital converters (ADCs). As the input signal is applied to (2
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Lundin, Henrik. "Characterization and Correction of Analog-to-Digital Converters." Doctoral thesis, KTH, School of Electrical Engineering (EES), 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-547.

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Denna avhandling behandlar analog-digitalomvandling. I synnerhet behandlas postkorrektion av analog-digitalomvandlare (A/D-omvandlare). A/D-omvandlare är i praktiken behäftade med vissa fel som i sin tur ger upphov till distorsion i omvandlarens utsignal. Om felen har ett systematiskt samband med utsignalen kan de avhjälpas genom att korrigera utsignalen i efterhand. Detta verk behandlar den form av postkorrektion som implementeras med hjälp av en tabell ur vilken korrektionsvärden hämtas.

Innan en A/D-omvandlare kan korrigeras måste felen i den mätas upp. Detta görs genom att estimera omvandlarens överföringsfunktion. I detta arbete behandlas speciellt problemet att skatta kvantiseringsintervallens mittpunkter. Det antas härvid att en referenssignal finns tillgänglig som grund för skattningen. En skattare som baseras på sorterade data visas vara bättre än den vanligtvis använda skattaren baserad på sampelmedelvärde.

Nästa huvudbidrag visar hur resultatet efter korrigering av en A/D-omvandlare kan predikteras. Omvandlaren antas här ha en viss differentiell olinjäritet och insignalen antas påverkad av ett slumpmässigt brus. Ett postkorrektionssystem, implementerat med begränsad precision, korrigerar utsignalen från A/D-omvandlaren. Ett utryck härleds som beskriver signal-brusförhållandet efter postkorrektion. Förhållandet visar sig bero på den differentiella olinjäritetens varians, det slumpmässiga brusets varians, omvandlarens upplösning samt precisionen med vilken korrektionstermerna beskrivs.

Till sist behandlas indexering av korrektionstabeller. Valet av metod för att indexera en korrektionstabell påverkar såväl tabellens storlek som förmågan att beskriva och korrigera dynamiska fel. I avhandlingen behandlas i synnerhet tillståndsmodellbaserade metoder, det vill säga metoder där tabellindex bildas som en funktion utav flera på varandra följande sampel. Allmänt gäller att ju fler sampel som används för att bilda ett tabellindex, desto större blir tabellen, samtidigt som förmågan att beskriva dynamiska fel ökar. En indexeringsmetod som endast använder en delmängd av bitarna i varje sampel föreslås här. Vidare så påvisas hur valet av indexeringsbitar kan göras optimalt, och experimentella utvärderingar åskådliggör att tabellstorleken kan reduceras avsevärt utan att fördenskull minska prestanda mer än marginellt.

De teorier och resultat som framförs här har utvärderats med experimentella A/D-omvandlardata eller genom datorsimuleringar.


Analog-to-digital conversion and quantization constitute the topic of this thesis. Post-correction of analog-to-digital converters (ADCs) is considered in particular. ADCs usually exhibit non-ideal behavior in practice. These non-idealities spawn distortions in the converters output. Whenever the errors are systematic, it is possible to mitigate them by mapping the output into a corrected value. The work herein is focused on problems associated with post-correction using look-up tables. All results presented are supported by experiments or simulations.

The first problem considered is characterization of the ADC. This is in fact an estimation problem, where the transfer function of the converter should be determined. This thesis deals with estimation of quantization region midpoints, aided by a reference signal. A novel estimator based on order statistics is proposed, and is shown to have superior performance compared with the sample mean traditionally used.

The second major area deals with predicting the performance of an ADC after post-correction. A converter with static differential nonlinearities and random input noise is considered. A post-correction is applied, but with limited (fixed-point) resolution in the corrected values. An expression for the signal-to-noise and distortion ratio after post-correction is provided. It is shown that the performance is dependent on the variance of the differential nonlinearity, the variance of the random noise, the resolution of the converter and the precision of the correction values.

Finally, the problem of addressing, or indexing, the correction look-up table is dealt with. The indexing method determines both the memory requirements of the table and the ability to describe and correct dynamically dependent error effects. The work here is devoted to state-space--type indexing schemes, which determine the index from a number of consecutive samples. There is a tradeoff between table size and dynamics: more samples used for indexing gives a higher dependence on dynamic, but also a larger table. An indexing scheme that uses only a subset of the bits in each sample is proposed. It is shown how the selection of bits can be optimized, and the exemplary results show that a substantial reduction in memory size is possible with only marginal reduction of performance.

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Ng, Sheung Yan. "A continuous-time asynchronous Sigma Delta analog to digital converter for broadband wireless receiver with adaptive digital calibration technique." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1253559906.

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19

El, Hamoui Mohamad A. "A Pipeline Analog-To-Digital Converter for a Plasma Impedance Probe." DigitalCommons@USU, 2009. https://digitalcommons.usu.edu/etd/287.

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Space instrumentation technology is an essential tool for rocket and satellite research, and is expected to become popular in commercial and military operations in fields such as radar, imaging, and communications. These instruments are traditionally implemented on printed circuit boards using discrete general-purpose Analog-to-Digital Converter (ADC) devices and other components. A large circuit board is not convenient for use in micro-satellite deployments, where the total payload volume is limited to roughly one cubic foot. Because micro-satellites represent a fast growing trend in satellite research and development, there is motivation to explore miniaturized custom application-specific integrated circuit (ASIC) designs to reduce the volume and power consumption occupied by instrument electronics. In this thesis, a model of a new Plasma Impedance Probe (PIP) architecture, which utilizes a custom-built ADC along with other analog and digital components, is proposed. The model can be fully integrated to produce a low-power, miniaturized impedance probe.
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Shahzad, Khurram. "Low-power 8-bit Pipelined ADC with current mode Multiplying Digital-to-Analog Converter (MDAC)." Thesis, Linköping University, Department of Electrical Engineering, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-20314.

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In order to convert the analog information in the digital domain, pipelined analog-to-digital converter (ADC) offers an optimum balance of resolution, speed, power consumption, size and design effort.

In this thesis work we design and optimize a 8-bit pipelined ADC for low-power. The ADC has stage resolution of 1.5-bit and employ current mode multiplying analog-to-digital converter (MDAC). The main focus is to design and optimize the MDAC. Based on the analysis of "On current mode circuits" discussed in chapter 2, we design and optimize the MDAC circuit for the best possible effective number of bits (ENOB), speed and power consumption. Each of the first six stages consisting of Sample-and-Hold, 1.5-bit flash ADC and MDAC is realized at the circuit level. The last stage consisting of 2-bit flash ADC is also realized at circuit level. The delay logic for synchronization is implemented in Verilog-A and MATLAB. A first order digital error-correction algorithm is implemented in MATLAB.

The design is simulated in UMC 0.18um technology in Cadence environment. The choice of technology is made as the target application for the ADC, 'X-ray Detector System' is designed in the same technology. The simulation results obtained in-term of ENOB and power consumption are satisfactory for the target application.

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Zhang, Dai. "Design of Ultra-Low-Power Analog-to-Digital Converters." Licentiate thesis, Linköpings universitet, Elektroniska komponenter, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-79276.

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Power consumption is one of the main design constraints in today’s integrated circuits. For systems powered by small non-rechargeable batteries over their entire lifetime, such as medical implant devices, ultra-low power consumption is paramount. In these systems, analog-to-digital converters (ADCs) are key components as the interface between the analog world and the digital domain. This thesis addresses the design challenges, strategies, as well as circuit techniques of ultra-low-power ADCs for medical implant devices. Medical implant devices, such as pacemakers and cardiac defibrillators, typically requirelow-speed, medium-resolution ADCs. The successive approximation register (SAR) ADC exhibits significantly high energy efficiency compared to other prevalent ADC architectures due to its good tradeoffs among power consumption, conversion accuracy, and design complexity. To design an energy-efficient SAR ADC, an understanding of its error sources as well as its power consumption bounds is essential. This thesis analyzes the power consumption bounds of SAR ADC: 1) at low resolution, the power consumption is bounded by digital switching power; 2) at medium-to-high resolution, the power consumption is bounded by thermal noise if digital assisted techniques are used to alleviate mismatch issues; otherwise it is bounded by capacitor mismatch.  Conversion of the low frequency bioelectric signals does not require high speed, but ultra-low-power operation. This combined with the required conversion accuracy makes the design of such ADCs a major challenge. It is not straightforward to effectively reduce the unnecessary speed for lower power consumption using inherently fast components in advanced CMOS technologies. Moreover, the leakage current degrades the sampling accuracy during the long conversion time, and the leakage power consumption contributes to a significant portion of the total power consumption. Two SAR ADCs have been implemented in this thesis. The first ADC, implemented in a 0.13-µm CMOS process, achieves 9.1 ENOB with 53-nW power consumption at 1 kS/s. The second ADC, implemented in a 65-nm CMOS process, achieves the same resolution at 1 kS/s with a substantial (94%) improvement in power consumption, resulting in 3-nW total power consumption. Our work demonstrates that the ultra-low-power operation necessitates maximum simplicity in the ADC architecture.
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22

Wang, Mingzhen. "High-speed Low-voltage CMOS Flash Analog-to-Digital Converter for Wideband Communication System-on-a-Chip." Wright State University / OhioLINK, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=wright1189815482.

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23

Hellman, Johan. "Implementation of a Low-Cost Analog-to-Digital Converter for Audio Applications Using an FPGA." Thesis, Linköpings universitet, Elektroniksystem, 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-96009.

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The aim of this master’s thesis is to implement an ADC (Analog-to-Digital Converter) foraudio applications using external components together with an FPGA (Field-ProgrammableGate Array). The focus is on making the ADC low-cost and it is desirable to achieve 16-bitresolution at 48 KS/s. Since large FPGA’s have numerous I/O-pins, there are usually someunused pins and logic available in the FPGA that can be used for other purposes. This istaken advantage of, to make the ADC as low-cost as possible.This thesis presents two solutions: (1) a - (Sigma-Delta) converter with a first order passive loop-filter and (2) a - converter with a second order active loop-filter. The solutionshave been designed on a PCB (Printed Curcuit Board) with a Xilinx Spartan-6 FPGA. Bothsolutions take advantage of the LVDS (Low-Voltage-Differential-Signaling) input buffers inthe FPGA.(1) achieves a peak SNDR (Signal-to-noise-and-distortion-ratio) of 62.3 dB (ENOB (Effectivenumber of bits) 10.06 bits) and (2) achieves a peak SNDR of 80.3 dB (ENOB 13.04). (1) isvery low-cost ($0.06) but is not suitable for high-precision audio applications. (2) costs $0.53for mono audio and $0.71 for stereo audio and is comparable with the solution used today:an external ADC (PCM1807).
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Sivakumar, Balasubramanian. "A 6-Bit Sub-Ranging High Speed Flash Analog To Digital Converter With Digital Speed And Power Control." The Ohio State University, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=osu1229631191.

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25

Gong, Jianping. "Sub-Picosecond Jitter Clock Generation for Time Interleaved Analog to Digital Converter." Digital WPI, 2019. https://digitalcommons.wpi.edu/etd-dissertations/557.

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Nowadays, Multi-GHz analog-to-digital converters (ADCs) are becoming more and more popular in radar systems, software-defined radio (SDR) and wideband communications, because they can realize much higher operation speed through using many interleaved sub-ADCs to relax ADC sampling rates. Although the time interleaved ADC has some issues such as gain mismatch, offset mismatch and timing skew between each ADC channel, these deterministic errors can be solved by previous works such as digital calibration technique. However, time-interleaved ADCs require a precise sample clock to achieve an acceptable effective-numberof-bits (ENOB) which can be degraded by jitter in the sample clock. The clock generation circuits presented in this work achieves sub-picosecond jitter performance in 180nm CMOS which is suitable for time-interleaved ADC. Two different test chips were fabricated in 180nm CMOS to investigate the low jitter design technique. The low jitter delay line in two chips were designed in two different ways, but both of them utilized the low jitter design technique. In first test chip, the measured RMS jitter is 0.1061ps for each delay stage. The second chip uses the proposed low jitter Delay-Locked Loop can work from 80MHz to 120MHz, which means it can provide the time interleaved ADC with 2.4GHz to 3.6GHz low jitter sample clock, the measured delay stage jitter performance in second test chip is 0.1085ps.
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26

David, Christopher Leonidas. "All Digital, Background Calibration for Time-Interleaved and Successive Approximation Register Analog-to-Digital Converters." Digital WPI, 2010. https://digitalcommons.wpi.edu/etd-dissertations/194.

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The growth of digital systems underscores the need to convert analog information to the digital domain at high speeds and with great accuracy. Analog-to-Digital Converter (ADC) calibration is often a limiting factor, requiring longer calibration times to achieve higher accuracy. The goal of this dissertation is to perform a fully digital background calibration using an arbitrary input signal for A/D converters. The work presented here adapts the cyclic "Split-ADC" calibration method to the time interleaved (TI) and successive approximation register (SAR) architectures. The TI architecture has three types of linear mismatch errors: offset, gain and aperture time delay. By correcting all three mismatch errors in the digital domain, each converter is capable of operating at the fastest speed allowed by the process technology. The total number of correction parameters required for calibration is dependent on the interleaving ratio, M. To adapt the "Split-ADC" method to a TI system, 2M+1 half-sized converters are required to estimate 3(2M+1) correction parameters. This thesis presents a 4:1 "Split-TI" converter that achieves full convergence in less than 400,000 samples. The SAR architecture employs a binary weight capacitor array to convert analog inputs into digital output codes. Mismatch in the capacitor weights results in non-linear distortion error. By adding redundant bits and dividing the array into individual unit capacitors, the "Split-SAR" method can estimate the mismatch and correct the digital output code. The results from this work show a reduction in the non-linear distortion with the ability to converge in less than 750,000 samples.
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27

Brenneman, Cody R. "Circuit Design for Realization of a 16 bit 1MS/s Successive Approximation Register Analog-to-Digital Converter." Digital WPI, 2010. https://digitalcommons.wpi.edu/etd-theses/423.

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As the use of digital systems continues to grow, there is an increasing need to convert analog information into the digital domain. Successive Approximation Register (SAR) analog-to-digital converters are used extensively in this regard due to their high resolution, small die area, and moderate conversion speeds. However, capacitor mismatch within the SAR converter is a limiting factor in its accuracy and resolution. Without some form of calibration, a SAR converter can only reasonably achieve an accuracy of 10 bits. The Split-ADC technique is a digital, deterministic, background self-calibration algorithm that can be applied to the SAR converter. This thesis describes the circuit design and physical implementation of a novel 16-bit 1MS/s SAR analog-to-digital converter for use with the Split-ADC calibration algorithm. The system was designed using the Jazz 0.18um CMOS process, successfully operates at 1MS/s, and consumes a die area of 1.2mm2. The calibration algorithm was applied, showing an improvement in the overall accuracy of the converter.
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28

Li, Xiangtao. "High-speed analog-to-digital conversion in SiGe HBT technology." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/24652.

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Thesis (Ph.D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2008.
Committee Chair: Cressler, John D.; Committee Member: Laskar, Joy; Committee Member: Lee, Chin-Hui; Committee Member: Morley, Thomas; Committee Member: Papapolymerou, John
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29

Dinc, Huseyin. "A high-speed two-step analog-to-digital converter with an open-loop residue amplifier." Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/39572.

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It is well known that feedback is a very valuable tool for analog designers to improve linearity, and desensitize various parameters affected by process, temperature and supply variations. However, using strong global feedback limits the operation speed of analog circuits due to stability requirements. The circuits and techniques explored in this research avoid the usage of strong-global-feedback circuits to achieve high conversion rates in a two-stage analog-to-digital converter (ADC). A two-step, 9-bit, complementary-metal-oxide-semiconductor (CMOS) ADC utilizing an open-loop residue-amplifier is demonstrated. A background-calibration technique was proposed to generate the reference voltage to be used in the second stage of the ADC. This technique alleviates the gain variation in the residue amplifier, and allows an open-loop residue amplifier topology. Even though the proposed calibration idea can be extended to multistage topologies, this design was limited to two stages. Further, the ADC exploits a high-performance double-switching frontend sample-and-hold amplifier (SHA). The proposed double-switching SHA architecture results in exceptional hold-mode isolation. Therefore, the SHA maintains the desired linearity performance over the entire Nyquist bandwidth.
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30

Säll, Erik. "Implementation of Flash Analog-to-Digital Converters in Silicon-on-Insulator Technology." Licentiate thesis, Linköping University, Linköping University, Electronics System, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-5260.

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High speed analog-to-digital converters (ADCs) used in, e.g., read channel and ultra wideband (UWB) applications are often based on a flash topology. The read channel applications is the intended application of this work, where a part of the work covers the design of two different types of 6-bit flash ADCs. Another field of application is UWB receivers.

To optimize the performance of the whole system and derive the specifications for the sub-blocks of the system it is often desired to use a topdown design methodology. To facilitate the top-down design methodology the ADCs are modeled on behavioral level. The models are simulated in MATLAB®. The results are used to verify the functionality of the proposed circuit topologies and serve as a base to the circuit design phase.

The first flash ADC has a conventional topology. It has a resistor net connected to a number of latched comparators, but its thermometer-tobinary encoder is based on 2-to-1 multiplexers buffered with inverters. This gives a compact encoder with a regular structure and short critical path. The main disadvantage is the code dependent timing difference between the encoder outputs introduced by this topology. The ADC was simulated on schematic level in Cadence® using the foundry provided transistor models. The design obtained a maximum sampling frequency of 1 GHz, an effective resolution bandwidth of 390 MHz, and a power consumption of 170 mW.

The purpose of the second ADC is to demonstrate the concept of introducing dynamic element matching (DEM) into the reference net of a flash ADC. This design yields information about the performance improvements the DEM gives, and what the trade-offs are when introducing DEM. Behavioral level simulations indicate that the SFDR is improved by 11 dB when introducing DEM, but the settling time of the reference net with DEM will now limit the conversion speed of the converter. Further, the maximum input frequency is limited by the total resistance in the reference net, which gets increased in this topology. The total resistance is the total switch on-resistance plus the total resistance of the resistors. To increase the conversion speed and the maximum input frequency a new DEM topology is proposed in this work, which reduces the number of switches introduced into the reference net compared with earlier proposed DEM topologies. The transistor level simulations in Cadence® of the flash ADC with DEM indicates that the SFDR improves by 6 dB compared with when not using DEM, and is expected to improve more if more samples are used in the simulation. This was not possible in the current simulations due to the long simulation time. The improved SFDR is however traded for an increased chip area and a reduction of the maximum sampling frequency to 550 MHzfor this converter. The average power consumption is 92 mW.

A goal of this work is to evaluate a 130 nm partially depleted silicon-oninsulator (SOI) complementary metal oxide semiconductor (CMOS) technology with respect to analog circuit implementation. The converters are therefore implemented in this technology. When writing this the ADCs are still being manufactured. Since the technology evaluation will be based on the measurement results the final results of the evaluation are not included in this thesis. The conclusions regarding the SOI CMOS technology are therefore based on a literature study of published scientific papers in the SOI area, information extracted during the design phase of the ADCs, and from the transistor level circuit simulations. These inputs indicate that to fully utilize the potential performance advantages of the SOI CMOS technology the partially depleted SOI CMOS technology should be exchanged for a fully depleted SOI CMOS technology. The manufacturing difficulties regarding the control of the thin-film thickness must however first be solved before the exchange can be done.


Report code: LiU-Tek-Lic-2005:68.
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31

Ravikumar, Dinesh. "Modeling of Ideal and Error Characteristics of a Multi – Stage,Time Interleaved Sub – Ranging Analog to Digital Converter usingMATLAB." The Ohio State University, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=osu1460971228.

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32

Lee, Sang Min. "A CMOS analog pulse compressor with a low-power analog-to-digital converter for MIMO radar applications." Diss., Georgia Institute of Technology, 2010. http://hdl.handle.net/1853/42875.

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Multiple-input multiple-output (MIMO) radars, which utilize multiple transmitters and receivers to send and receive independent waveforms, have been actively investigated as a next generation radar technology inspired by MIMO techniques in communication theory. Complementary metal-oxide-semiconductor (CMOS) technology offers an opportunity for dramatic cost and size reduction for a MIMO array. However, the resulting formidable signal processing burden has not been addressed properly and remains a challenge. On the other hand, from a block-level point of view, an analog-to-digital converter (ADC) is required for mixed-signal processing to convert analog signals to digital signals, but an ADC occupies a significant portion of a system's budget. Therefore, improvement of an ADC will greatly enhance various trade-offs. This research presents an alternative and viable approach for a MIMO array from a system architecture point of view, and also develops circuit level improvement techniques for an ADC. This dissertation presents a fully-integrated analog pulse compressor (APC) based on an analog matched filter in a mixed signal domain as a key block for the waveform diversity MIMO radar. The performance gain of the proposed system is mathematically presented, and the proposed system is successfully implemented and demonstrated from the block level to the system level using various waveforms. Various figures of merit are proposed to aid system evaluations. This dissertation also presents a low-power ADC based on an asynchronous sample-and-hold multiplying SAR (ASHMSAR) with an enhanced input range dynamic comparator as a key element of a future system. Overall, with the new ADC, a high level of system performance without severe penalty on power consumption is expected. The research in this dissertation provides low-cost and low-power MIMO solutions for a future system by addressing both system issues and circuit issues comprehensively.
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33

Kim, Tae Hong. "Electromagnetic Band Gap (EBG) synthesis and its application in analog-to-digital converter load boards." Diss., Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/22712.

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With increase in frequency and convergence toward mixed signal systems, supplying stable voltages to integrated circuits and blocking noise coupling in the systems are major problems. Electromagnetic band gap (EBG) structures have been in the limelight for power/ground noise isolation in mixed signal applications due to their capability to suppress unwanted electromagnetic mode transmission in certain frequency bands. The EBG structures have proven effective in isolating the power/ground noise in systems that use a common power supply. However, while the EBG structures have the potential to present many advantages in noise suppression applications, there is no method in the prior art that enables reliable and efficient synthesis of these EBG structures. Therefore, in this research, a novel EBG synthesis method for mixed signal applications is presented. For one-dimensional periodic structures, three new approaches such as current path approximation method, border to border radius, power loss method have been introduced and combined for synthesis. For two-dimensional EBG structures, a novel EBG synthesis method using genetic algorithm (GA) has been presented. In this method, genetic algorithm (GA) is utilized as a solution-searching technique. Synthesis procedure has been automated by combining GA with multilayer finite-difference method and dispersion diagram analysis method. As a real application for EBG structures, EBG structures have been applied to a GHz ADC load board design for power/ground noise suppression.
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34

Lindeberg, Johan. "Design and Implementation of a Low-Power SAR-ADC with Flexible Sample-Rate and Internal Calibration." Thesis, Linköpings universitet, Elektroniksystem, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-103229.

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The objective of this Master's thesis was to design and implement a low power Analog to Digital Converter (ADC) used for sensor measurements. In the complete measurement unit, in which the ADC is part of, different sensors will be measured. One set of these sensors are three strain gauges with weak output signals which are to be pre-amplified before being converted. The focus of the application for the ADC has been these sensors as they were considered a limiting factor. The report describes theory for the algorithmic and incremental converter as well as a hybrid converter utilizing both of the two converter structures. All converters are based on one operational amplifier and they operate in repetitive fashions to obtain power efficient designs on a small chip area although at low conversion rates. Two converters have been designed and implemented to different degrees of completeness. One is a 13 bit algorithmic (or cyclic) converter which uses a switching scheme to reduce the problem of capacitor mismatch. This converter was implemented at transistor level and evaluated separately and to some extent also with sub-components. The second converter is a hybrid converter using both the operation of the algorithmic and incremental converter to obtain 16 bits of resolution while still having a fairly high sample rate.
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35

Dornelas, Helga Uchoa. "Low power SAR analog-to-digital converter for internet-of-things RF receivers." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2018. http://hdl.handle.net/10183/186015.

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The "Internet of Things" (IoT) has been a topic of intensive research in industry, technological centers and academic community, being data communication one aspect of high relevance in this area. The exponential increase of devices with wireless capabilities as well as the number of users, alongside with the decreasing costs for implementation of broadband communications, created a suitable environment for IoT applications. An IoT device is typically composed by a wireless transceiver, a battery and/or energy harvesting unit, a power management unit, sensors and conditioning unit, a microprocessor and data storage unit. Energy supply is a limiting factor in many applications and the transceiver usually demands a significant amount of power. In this scenario the emerging wireless communication standard IEEE 802.11ah, in which this work focuses, was proposed as an option for low power sub-GHz radio communication. A typical architecture of modern radio receivers contains the analog radio-frequency (RF) front-end, which amplifies, demodulates and filters the input signal, and also analog-to-digital converters (ADC), that translate the analog signals to the digital domain. Additionally, the Successive-Approximation (SAR) ADC architecture has become popular recently due to its power efficiency, simplicity, and compatibility with scaled-down integrated CMOS technology. In this work, the RF receiver architecture and its specifications aiming low power consumption and IEEE 802.11ah standard complying are outlined, being the basis to the proposition of an 8-bit resolution and 10 MHz sampling rate ADC. A power efficient switching scheme for the charge redistribution SAR ADC architecture is explored in detail, along with the circuit-level design of the digital-to-analog converter (DAC). The transistor-level design of the two remaining ADC main blocks, sampling switch and comparator, are also explored. Electrical simulation of the physical layout, including parasitics, at a 130nm CMOS process resulted in a SINAD of 47:3 dB and 45:5 dB and at the receiver IF 3 MHz and at the Nyquist rate, respectively, consuming 21 W with a power supply of 1 V . The SAR ADC resulting Figure-of-Merit (FoM) corresponded to 11:1 fJ/conv-step at IF, and 13:7 fJ/conv-step at the Nyquist rate.
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36

Öresjö, Per. "A High Speed Sigma Delta A/D-Converter for a General Purpose RF Front End in 90nm-Technology." Thesis, Linköping University, Department of Electrical Engineering, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8706.

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In this report a transistor-level design of a GHz Sigma-Delta analog-to-digital converter for an RF front end is proposed. The design is current driven, where the integration is done directly over two capacitances and it contains no operational amplifiers.

The clock frequency used for verification was 2.5 GHz and the output band-width was 10 MHz. The system is flexible in that the number of internal bits can be scaled easily and in this report a three-bit system yielding an SNR of 76.5 dB as well as a four-bit system yielding an SNR of 82.5 dB are analyzed.

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37

Silva, Alexandre Herculano Mendes. "Pipelined analog-to-digital conversion using current-mode reference shifting." Master's thesis, Faculdade de Ciências e Tecnologia, 2012. http://hdl.handle.net/10362/8265.

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Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de Computadores
Pipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step.
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38

Hiremath, Vinayashree. "DESIGN OF ULTRA HIGH SPEED FLASH ADC, LOW POWER FOLDING AND INTERPOLATING ADC IN CMOS 90nm TECHNOLOGY." Wright State University / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=wright1291391500.

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39

Lala, Padmini. "AN 8-BIT 13.88 kS/s EXTENDED COUNTING ADC." University of Akron / OhioLINK, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=akron1564686278693053.

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40

Kotti, Vivek. "Design of an 8-bit Successive Approximation Pipelined Analog to Digital Converter (SAP-ADC) in 90 nm CMOS." Wright State University / OhioLINK, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=wright1503596547020087.

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41

Liu, Shaolong. "SAR ADCs Design and Calibration in Nano-scaled Technologies." Research Showcase @ CMU, 2017. http://repository.cmu.edu/dissertations/1073.

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The rapid progress of scaling and integration of modern complimentary metal oxide semiconductor (CMOS) technology motivates the replacement of traditional analog signal processing by digital alternatives. Thus, analog-to-digital converters (ADCs), as the interfaces between the analog world and the digital one, are driven to enhance their performance in terms of speed, resolution and power efficiency. However, in the presence of imperfections of device mismatch, thermal noise and reduced voltage headroom, efficient ADC design demands new strategies for design, calibration and optimization. Among various ADC architectures, successive-approximation-register (SAR) ADCs have received renewed interest from the design community due to their low hardware complexity and scaling-friendly property. However, the conventional SAR architecture has many limitations for high-speed, high-resolution applications. Many modified SAR architectures and hybrid SAR architectures have been reported to break the inherent constraints in the conventional SAR architecture. Loop-unrolled (LU) SAR ADCs have been recognized as a promising architecture for high-speed applications. However, mismatched comparator offsets introduce input-level dependent errors to the conversion result, which deteriorates the linearity and limits the resolution and the resolution of most reported SAR ADCs of this kind are limited to 6 bits. Also, for high-resolution SAR ADCs, the comparator noise specification is very stringent, which imposes a limitation on ADC speed and power-efficiency. Lastly, capacitor mismatch is an important limiting factor for SAR ADC linearity, and generally requires dedicated calibration to achieve efficient designs in terms of power and area. In this work, we investigate the impacts of offset mismatch, comparator noise and capacitor mismatch on high-speed SAR ADCs. An analytical model is proposed to estimate the resolution and predict the yield of LU-SAR ADCs with presence of comparator offset mismatch. A background calibration technique is proposed for resolving the comparator mismatch issue. A 150-MS/s 8-bit LU-SAR ADC is fabricated in a 130-nm CMOS technology to validate the concept. The measured result shows that the calibration improves the SNDR from 33.7-dB to 42.9-dB. The ADC consumes 640 μW from a 1.2 V supply with a Figure-of-Merit (FoM) of 37.5-fJ/conv-step. Moreover, the bit-wise impact of comparator noise is studied for LU-SAR ADCs. Lastly, an extended statistical element selection (SES) calibration technique is proposed to calibrate the capacitor mismatch in SAR ADCs. Based on these techniques, a high-resolution, asynchronous SAR architecture employing multiple comparators with different speed and noise specifications to optimize speed and power efficiency. A 12-bit prototype ADC is fabricated in a 1P9M 65nm CMOS technology, and fits into an active area of 500 μm × 200 μm. At 125 MS/s, the ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 64.4 dB and a spurious-free-dynamic-range (SFDR) of 75.1 dB at the Nyquist input frequency while consuming 1.7 mW from a 1.2 V supply. The resultant figure-of-merit (FoM) is 10.3 fJ/conv-step.
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42

Jung, Seungwoo. "Optimization of SiGe HBT BiCMOS analog building blocks for operation in extreme environments." Diss., Georgia Institute of Technology, 2015. http://hdl.handle.net/1853/54419.

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The objective of this research is to optimize silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BiCMOS analog circuit building blocks for operation in extreme environments utilizing design techniques. First, negative feedback effects on single-event transient (SET) in SiGe HBT analog circuits were investigated. In order to study the role of internal and external negative feedback effects on SET in circuits, two different types of current mirrors (a basic common-emitter current mirror and a Wilson current mirror) were fabricated using a SiGe HBT BiCMOS technology and exposed to laser-induced single events. The SET measurements were performed at the U.S. Naval Research Laboratory using a two-photon absorption (TPA) pulsed laser. The measured data showed that negative feedback improved SET response in the analog circuits; the highest peak output transient current was reduced by more than 50%, and the settling time of the output current upon a TPA laser strike was shortened with negative feedback. This proven negative feedback radiation hardening technique was applied later in the high-speed 5-bit flash analog-to-digital converter (ADC) for receiver chains of radar systems to improve SET response of the system.
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43

Kollarits, Matthew David. "Design and Simulation of a Temperature-Insensitive Rail-to-Rail Comparator for Analog-to-Digital Converter Application." University of Akron / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=akron1279036924.

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44

Chhetri, Dhurv, and Venkata Narasimha Manyam. "A Continuous-Time ADC and DSP for Smart Dust." Thesis, Linköpings universitet, Elektroniksystem, 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-80586.

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Recently, smart dust or wireless sensor networks are gaining more attention.These autonomous, ultra-low power sensor-based electronic devices sense and process burst-type environmental variations and pass the data from one node (mote) to another in an ad-hoc network. Subsystems for smart dust are typically the analog interface (AI), analog-to-digital converter (ADC), digital signal processor (DSP), digital-to-analog converter (DAC), power management, and transceiver for communication. This thesis project describes an event-driven (ED) digital signal processing system (ADC, DSP and DAC) operating in continuous-time (CT) with smart dust as the target application. The benefits of the CT system compared to its conventional counterpart are lower in-band quantization noise and no requirement of a clock generator and anti-aliasing filter, which makes it suitable for processing burst-type data signals. A clockless EDADC system based on a CT delta modulation (DM) technique is presented. The ADC output is digital data, continuous in time, known as “data token”. The ADC employs an unbuffered, area efficient, segmented resistor-string (R-string) feedback DAC. A study of different segmented R-string DAC architectures is presented. A comparison in component reduction with prior art shows nearly 87.5% reduction of resistors and switches in the DAC and the D flip-flops in the bidirectional shift registers for an 8-bit ADC, utilizing the proposed segmented DAC architecture. The obtained SNDR for the 3-bit, 4-bit and 8-bit ADC system is 22.696 dB, 30.435 dB and 55.73 dB, respectively, with the band of interest as 220.5 kHz. The CTDSP operates asynchronously and process the data token obtained from the EDADC. A clockless transversal direct-form finite impulse response (FIR) low-pass filter (LPF) is designed. Systematic top-down test-driven methodology is employed through out the project. Initially, MATLAB models are used to compare the CT systems with the sampled systems. The complete CTDSP system is implemented in Cadence design environment. The thesis has resulted in two conference contributions. One for the 20th European Conference on Circuit Theory and Design, ECCTD’11 and the other for the 19th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC’11. We obtained the second-best student paper award at the ECCTD.
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45

Rossoni, Mattos Diego. "Design and characterization of an 8gsps flash analog-to-digital converter for radio astronomy and cosmology applications." Thesis, Bordeaux 1, 2012. http://www.theses.fr/2012BOR14653/document.

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Un Convertisseur Analogique-Numérique (CAN) pour les applications spatiales en astrophysique et cosmologie a été développé au cours de cette thèse. Cette catégorie de circuits demande des bandes passantes très larges, de très hautes fréquences d'échantillonnage et une faible résolution. L’architecture flash a été retenue pour sa rapidité et sa bande passante. La fréquence d’échantillonnage est de 8GHz. La technologie utilisée est la CMOS 65 nm de chez STMicroeletronics. La conception a été faite en deux phases. Une première qui a amené à un prototype d'un échantillonneur-bloqueur et une deuxième qui a amené au CAN. Les deux prototypes ont été caractérisés et à partir de ces résultats des perspectives d'amélioration pour les nouvelles implémentations ont été retrouvées.Pour atteindre l'objectif final du CAN multi-bits (6-bit sont visés) il a été décidé de dessiner une première version du CAN avec la moitié de la résolution initialement prévue (on passe de 6-bit à 3-bit). L'objectif est de nous permettre d’analyser le comportement des blocs fonctionnels intégrés et ensuite passer à une deuxième voire troisième version pour remplir le cahier des charges initial
An Analog-to-Digital Converter (ADC) has been developed for astrophysical and cosmological applications. This class of circuits demands, especially in the millimeter wavelength domain, ultra wide bandwidths, ultra high sampling frequencies and a low resolution. The “flash” architecture has been chosen for its speed and bandwidth. This ADC samples at 8Gsps and it has been fabricated in 65nm CMOS technology from STMicroelectornics.The design has been done in two steps. The first was the prototype of a track-and-hold circuit. The second was the ADC. Both circuits have been characterized and from these results some perspectives for further improvements have been proposed.In order to achieve the final goal of the multi-bit ADC (6-bit resolution) we have decided to design a first prototype with half the final resolution, namely a 3-bit resolution ADC. Our idea was, with this first prototype, to conduct a first analysis of the behavior of the integrated functional blocks and, consequently, find the correct improvements required for the ADC final version
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Zhang, Dai. "Design and Evaluation of an Ultra-Low Power Successive Approximation ADC." Thesis, Linköping University, Department of Electrical Engineering, 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-18219.

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Analog-to-digital converters (ADC) targeted for use in medical implant devices serve an important role as the interface between analog signal and digital processing system. Usually, low power consumption is required for a long battery lifetime. In such application which requires low power consumption and moderate speed and resolution, one of the most prevalently used ADC architectures is the successive approximation register (SAR) ADC.This thesis presents a design of an ultra-low power 9-bit SAR ADC in 0.13μm CMOS technology. Based on a literature review of SAR ADC design, the proposed SAR ADC combines a capacitive DAC with S/H circuit, uses a binary-weighted capacitor array for the DAC and utilizes a dynamic latch comparator. Evaluation results show that at a supply voltage of 1.2V and an output rate of 1kS/s, the SAR ADC performs a total power consumption of 103nW and a signal-to-noise-and-distortion ratio of 54.4dB. Proper performance is achieved down to a supply voltage of 0.45V, with a power consumption of 16nW.

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Stefanou, Nikolaos. "A 1Gsample/s 6-bit flash A/D converter with a combined chopping and averaging technique for reduced distortion in 0.18(mu)m CMOS." Texas A&M University, 2005. http://hdl.handle.net/1969.1/2469.

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Hard disk drive applications require a high Spurious Free Dynamic Range (SFDR), 6-bit Analog-to-Digital Converter (ADC) at conversion rates of 1GHz and beyond. This work proposes a robust, fault-tolerant scheme to achieve high SFDR in an av- eraging flash A/D converter using comparator chopping. Chopping of comparators in a flash A/D converter was never previously implemented due to lack of feasibility in implementing multiple, uncorrelated, high speed random number generators. This work proposes a novel array of uncorrelated truly binary random number generators working at 1GHz to chop all comparators. Chopping randomizes the residual offset left after averaging, further pushing the dynamic range of the converter. This enables higher accuracy and lower bit-error rate for high speed disk-drive read channels. Power consumption and area are reduced because of the relaxed design requirements for the same linearity. The technique has been verified in Matlab simulations for a 6-bit 1Gsamples/s flash ADC under case of process gradients with non-zero mean offsets as high as 60mV and potentially serious spot offset errors as high as 1V for a 2V peak to peak input signal. The proposed technique exhibits an improvement of over 15dB compared to pure averaging flash converters for all cases. The circuit-level simulation results, for a 1V peak to peak input signal, demon- strate superior performance. The reported ADC was fabricated in TSMC 0.18 ??mCMOS process. It occupies 8.79mm2 and consumes about 400mW from 1.8V power supply at 1GHz. The targeted SFDR performance for the fabricated chip is at least 45dB for a 256MHz input sine wave, sampled at 1GHz, about 10dB improvement on the 6-bit flash ADCs in the literature.
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Pham, Long. "Lookup-Table-Based Background Linearization for VCO-Based ADCs." Digital WPI, 2015. https://digitalcommons.wpi.edu/etd-theses/586.

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Scaling of CMOS to nanometer dimensions has enabled dramatic improvement in digital power efficiency, with lower VDD supply voltage and decreased power consumption for logic functions. However, most traditionally prevalent ADC architectures are not well suited to the lower VDD environment. The improvement in time resolution enabled by increased digital speeds naturally drives design toward time-domain architectures such as voltage-controlled-oscillator (VCO) based ADCs. The major obstacle in the VCO-based technique is linearizing the VCO voltage-to-frequency characteristic. Achieving signal-to-noise (SNR) performance better than -40dB requires some form of calibration, which can be realized by analog or digital techniques, or some combination. A further challenge is implementing calibration without degrading energy efficiency performance. This thesis project discusses a complete design of a 10 bit three stage ring VCO-based ADC. A lookup-table (LUT) digital correction technique enabled by the "Split ADC" calibration approach is presented suitable for linearization of the ADC. An improvement in the calibration algorithm is introduced to ensure LUT continuity. Measured results for a 10 bit 48.8-kSps ADC show INL improvement of 10X after calibration convergence.
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Nordick, Brent C. "Dynamic Element Matching Techniques For Delta-Sigma ADCs With Large Internal Quantizers." Diss., CLICK HERE for online access, 2004. http://contentdm.lib.byu.edu/ETD/image/etd466.pdf.

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Aguirre, Paulo Cesar Comassetto de. "Projeto e análise de moduladores sigma-delta em tempo contínuo aplicados à conversão AD." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2014. http://hdl.handle.net/10183/105065.

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Conversores analógico-digitais (ADCs) têm papel fundamental na implementação dos sistemas-em-chip, do inglês System-on-Chip (SoC), atuais. Em razão dos requisitos destes sistemas e dos compromissos entre as características fundamentais dos ADCs, como largura de banda, consumo de energia e exatidão, diversas topologias e estratégias para sua implementação em circuitos integrados (CIs) têm sido desenvolvidas através dos tempos. Dentre estas topologias, os conversores sigma-delta (SDC) têm se destacado pela versatilidade, aliada ao baixo consumo e excelente exatidão. Inicialmente desenvolvidos e empregados para a conversão de sinais de baixa frequência e com operação em tempo discreto (DT), esta classe de conversores têm evoluído e nos últimos anos está sendo desenvolvida para operar em tempo contínuo e ser empregada na conversão de sinais com frequências de centenas de kHz a dezenas de MHz. Neste trabalho, os moduladores sigma-delta em tempo contínuo (SDMs-CT) são estudados, visando sua aplicação à conversão analógico-digital (AD). Os SDMs-CT oferecem vantagens significativas sobre seus homólogos em tempo discreto, como menor consumo de energia, maior largura de banda do sinal de entrada e filtro anti-alias, do inglês anti-alias filter (AAF), implícito. Entretanto, os SDMs-CT apresentam limitações adicionais, responsáveis pela degradação de seu desempenho, como os efeitos do jitter do sinal de relógio, o atraso excessivo do laço de realimentação, do inglês Excess Loop Delay (ELD), e as limitações impostas aos integradores analógicos. Após o estudo e análise de SDMs-CT e de suas limitações, foi desenvolvido um modelo comportamental no ambiente Matlab/Simulink R , que permite a simulação do impacto destas limitações no modulador, possibilitando a obtenção de uma estimativa mais aproximada do seu desempenho. Com base nestas simulações foi possível a determinação das especificações mínimas de cada bloco analógico que compõe o modulador (como o slew rate, a frequência de ganho unitário (fu) e o ganho DC dos amplificadores operacionais utilizados nos integradores) e os valores toleráveis de ELD e jitter do sinal de relógio. Adicionalmente, neste trabalho foi desenvolvida uma metodologia para simulação de SDMs-CT compostos por DACs a capacitor chaveado e resistor, do inglês Switched-Capacitor-Resistor (SCR). Com base neste modelo e no estudo das diferentes topologias de SDMs, um circuito foi desenvolvido para aplicação em receptores de RF, sendo do tipo passa-baixas de laço único, do inglês single-loop, single-bit, de terceira ordem, voltado ao baixo consumo de energia. Este circuito foi desenvolvido em tecnologia CMOS IBM de 130 nanômetros, tendo sido enviado para fabricação. Através das simulações pós-leiaute realizadas espera-se que seu desempenho fique próximo ao que tem sido publicado recentemente sobre SDMs-CT passa-baixas de laço único e single-bit.
Analog-to-Digital Converters (ADCs) play a fundamental role in the implementation of current systems-on-chip (SoC). Due to the requirements of these systems and the tradeoffs between the main ADCs characteristics, such as signal bandwidth, power consumption and accuracy, many topologies and strategies for their implementation in integrated circuits (ICs) have been developed through the ages. Among these topologies, the sigmadelta converters (SDC) have highlighted the versatility combined with low power consumption and excellent accuracy. Initially developed and used for the conversion of low frequency signals and operation in the discrete time (DT) domain, this class of converters have been evolved and developed over the past to operate in continuous time domain for the conversion of signals with frequencies of hundreds of kHz up to tens of MHz. In this work, continuous time sigma-delta modulators (CT-SDMs) are studied focusing its application to the analog-to-digital (AD) conversion. CT-SDMs offer significant advantages over their discrete-time counterparts, such as lower power consumption, higher input signal bandwidth and implicit anti-alias filter (AAF). However, CT-SDMs present additional limitations that are responsible for their performance degradation, such as the clock jitter, Excess Loop Delay (ELD) and the limitations imposed on the analog integrators. After the study and analysis of CT-SDMs and their performance limitations, a behavioral model approach was developed in the Matlab/Simulink R environment, which allows the simulation of the limitations impact on the modulator, allowing the obteinment of a more accurate estimate of its performance. Based on these simulations it was possible to determine the minimum specifications for each block that composes the analog modulator (such as slew rate, the unity gain frequency (fu) and the DC gain of the operational amplifiers used in integrators) and tolerable values of ELD and clock jitter. Additionally, it was developed in this work a methodology for simulate CT-SDMs with Switched-Capacitor- Resistor (SCR) DACs that provide exponential waveforms. Based on this model and the study of different SDMs topologies, it was developed a low-pass, single-loop, single-bit, third order circuit focused on low-power intended for application in RF receivers. This circuit was developed in an IBM 130 nanometers CMOS technology, and was send to manufacturing. Based on the post-layout simulations it is expected to have performance close to what has been recently published of low-pass, single-loop, single-bit CT-SDMs.
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