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1

Tang, Yi. "Digitally-assisted sigma-delta ADCs for scaled CMOS technology /." Thesis, Connect to this title online; UW restricted, 2007. http://hdl.handle.net/1773/5958.

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2

Andersson, Ola. "Modeling and Implementation of Current-Steering Digital-to-Analog Converters." Doctoral thesis, Linköpings universitet, Elektroniksystem, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-5062.

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Data converters, i.e., analog-to-digital converters (ADCs) and digital-to-analog converters (DACs), are interface circuits between the analog and digital domains. They are used in, e.g., digital audio applications, data communication applications, and other types of applications where conversion between analog and digital signal representation is required. This work covers different aspects related to modeling, error correction, and implementation of DACs for communication applications where the requirements on the circuits in terms of speed and linearity are hard. The DAC architecture considered in this work is the current-steering DAC, which is the most commonly used architecture for high-speed applications. Transistor-level simulation of complex circuits using accurate transistor models require long simulation times. A transistor-level model of a DAC used in a system simulation is likely to be a severe bottleneck limiting the overall system simulation speed. Moreover, investigations of stochastic parameter variations require multiple simulation runs with different parameter values making transistor-level models unsuitable. Therefore, there is a need for behavioral-level models with reasonably short simulation times. Behavioral-level models can also be used to find the requirements on different building blocks on high abstraction levels, enabling the use of efficient topdown design methodologies. Models of different nonideal properties in current-steering DACs are used and developed in this work. Static errors typically dominates the low-frequency behavior of the DAC. One of the limiting factors for the static linearity of a current-steering DAC is mismatch between current sources. A well-known model of this problem is used extensively in this work for evaluation of different ideas and techniques for linearity enhancement. The highfrequency behavior of the DAC is typically dominated by dynamic errors. Models oftwo types of dynamic errors are developed in this work. These are the dynamic errors caused by parasitic capacitance in wires and transistors and glitches caused by asymmetry in the settling behavior of a current source. The encoding used for the digital control word in a current steering DAC has a large influence on the circuit performance, e.g., in terms static linearity and glitches. In this work, two DAC architectures are developed. These are denoted the decomposed and partially decomposed architectures and utilize encoding strategies aiming at a high circuit performance by avoiding unnecessary switching of current sources. The developed architectures are compared with the well-known binary-weighted and segmented architectures using behavioral-level simulations. It can be hard to meet a DAC design specification using a straightforward implementation. Techniques for compensation of errors that can be applied to improve the DAC linearity are studied. The well-known dynamic element matching (DEM) techniques are used for transforming spurious tones caused by matching errors into white or shaped noise. An overview of these techniques are given in this work and a DEM technique for the decomposed DAC architecture is developed. In DS modulation, feedback of the quantization error is utilized to spectrally shape the quantization noise to reduce its power within the signal band. A technique based on this principle is developed for spectral shaping of DAC nonlinearity errors utilizing a DAC model in a feedback loop. Two examples of utilization of the technique are given. Four different current-steering DACs implemented in CMOS technology are developed to enable comparison between behavioral-level simulations and measurements on actual implementations and to provide platforms for evaluation of different techniques for linearity improvement. For example, a 14-bit DEM DAC is implemented and measurement results are compared with simulation results. A good agreement between measured and simulated results is obtained. Moreover, a configurable 12-bit DAC capable of operating with different degrees of segmentation and decomposition is implemented to evaluate the proposed decomposed architecture. Measurement results agree with results from behavioral-level simulations and indicate that the decomposed architecture is a viable alternative to the commonly used segmented architecture.
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3

Tourabaly, Jamil A. "A jittered-sampling correction technique for ADCs." Connect to thesis, 2008. http://portal.ecu.edu.au/adt-public/adt-ECU2008.0009.html.

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4

Zhong, Jian Yu. "Design of high-speed power-efficient SAR-type ADCs." Thesis, University of Macau, 2017. http://umaclib3.umac.mo/record=b3691882.

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5

Brady, Philomena C. "Offset correction in flash ADCs using floating-gate circuits." Thesis, Georgia Institute of Technology, 2003. http://hdl.handle.net/1853/14832.

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6

Nordick, Brent C. "Dynamic Element Matching Techniques For Delta-Sigma ADCs With Large Internal Quantizers." Diss., CLICK HERE for online access, 2004. http://contentdm.lib.byu.edu/ETD/image/etd466.pdf.

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7

Jalali, Farahani Bahar. "Adaptive digital calibration techniques for high speed, high resolution SIGMA DELTA ADCs for broadband wireless applications." Columbus, Ohio : Ohio State University, 2005. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1133192371.

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8

Kerzerho, Vincent. ""Analogue Network of Converters": a DfT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SoC." Phd thesis, Université Montpellier II - Sciences et Techniques du Languedoc, 2008. http://tel.archives-ouvertes.fr/tel-00364546.

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Une nouvelle méthode de test pour les convertisseurs ADC et DAC embarqués dans un système complexe a été développée en prenant en compte les nouvelles contraintes affectant le test. Ces contraintes, dues aux tendances de design de systèmes, sont un nombre réduit de point d'accès aux entrées/sorties des blocs analogiques du système et une augmentation galopante du nombre et des performances des convertisseurs intégrés. La méthode proposée consiste à connecter les convertisseurs DAC et ADC dans le domaine analogique pour n'avoir besoin que d'instruments de test numériques pour générer et capturer les signaux de test. Un algorithme de traitement du signal a été développé pour discriminer les erreurs des DACs et ADCs. Cet algorithme a été validé par simulation et par expérimentation sur des produits commercialisés par NXP. La dernière partie de la thèse a consisté à développer de nouvelles applications pour l'algorithme.
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9

Ohlsson, Henrik. "Studies on Design and Implementation of Low-Complexity Digital Filters." Doctoral thesis, Linköping : Dept. of Electrical Engineering, Univ, 2005. http://www.ep.liu.se/diss/science_technology/09/49/index.html.

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10

Wei, He Gong. "High speed power/area optimized multi-bit/cycle SAR ADCs." Thesis, University of Macau, 2011. http://umaclib3.umac.mo/record=b2489844.

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11

Carter, Nathan R. "A 12-b 50Msample/s Pipeline Analog to Digital Converter." Digital WPI, 2000. https://digitalcommons.wpi.edu/etd-theses/749.

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This thesis focuses on the performace of pipeline converters and their integration on mixed signal processes. With this in mind, a 12-b 50MHz pipeline ADC has been realized in a 0.6um digital CMOS process. The architecture is based on a 1.5-b per stage structure utilizing digital correction for the first six stages. A differeintial switched capacitor circuit consisting of a cascode gm-c op-amp with 250MHz of bandwidth is used for sampling and amplification in each stage. Comparators with an internal offset voltage are used to implement the decision levels required for the 1.5-b per stage structure. Correction of the pipeline is accomplished by measuring the offset and gain of each of the first six stages using subsequent stages. The measured values are used to calculate digtal values the compensate for the inaccuracies of the analog pipeline. Corrected digital values for each stage are stored in the pipeline and used to create corrected output codes. Errors caused by measuring the first six stages using uncalibrated stages are minimized by using extra switching circuitry during calibration.
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12

EL, RACHINI ALI. "Redundant analog to digital conversion architectures in CMOS technology." Doctoral thesis, Università degli Studi di Cagliari, 2015. http://hdl.handle.net/11584/266860.

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The operation of modern electronic devices in different fields as communications, signal processing, and sensor interface is critically affected with robust, high performance and scalable Analog-to-Digital Converter (ADCs), that can be considered as one of the main blocks in many systems, since they are mandatory to make the link between the analog outside world and the evermore-ubiquitous digital computer world. The design of these ADCs come distinct tradeoffs between speed, power, resolution, and die area embodied within many data conversion architectural variations. The flash ADC structure are often the base structure for high-speed operation and simple architecture analog-to-digital converters (ADCs). As the input signal is applied to (2
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13

Parsons, Colton A. "Variable Precision Tandem Analog-to-Digital Converter (ADC)." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1255.

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This paper describes an analog-to-digital signal converter which varies its precision as a function of input slew rate (maximum signal rate of change), in order to best follow the input in real time. It uses Flash and Successive Approximation (SAR) conversion techniques in sequence. As part of the design, the concept of "total real-time optimization" is explored, where any delay at all is treated as an error (Error = Delay * Signal Slew Rate). This error metric is proposed for use in digital control systems. The ADC uses a 4-bit Flash converter in tandem with SAR logic that has variable precision (0 to 11 bits). This allows the Tandem ADC to switch from a fast, imprecise converter to a slow, precise converter. The level of precision is determined by the input’s peak rate of change, optimized for minimum real-time error; a secondary goal is to react quickly to input transient spikes. The implementation of the Tandem ADC is described, along with various issues which arise when designing such a converter and how they may be dealt with. These include Flash ADC inaccuracies, rounding issues, and system timing and synchronization. Most of the design is described down to the level of logic gates and related building blocks (e.g. latches and flip-flops), and various logic optimizations are used in the design to reduce calculation delays. The design also avoids active analog circuitry whenever possible – it can be almost entirely implemented with CMOS logic and passive analog components.
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14

Danesh, Seyed Amir Ali. "Time interleaved counter analog to digital converters." Thesis, University of Edinburgh, 2011. http://hdl.handle.net/1842/5790.

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The work explores extending time interleaving in A/D converters, by applying a high-level of parallelism to one of the slowest and simplest types of data-converters, the counter ADC. The motivation for the work is to realise high-performance re-configurable A/D converters for use in multi-standard and multi-PHY communication receivers with signal bandwidths in the 10s to 100s of MHz. The counter ADC requires only a comparator, a ramp signal, and a digital counter, where the comparator compares the sampled input against all possible quantisation levels sequentially. This work explores arranging counter ADCs in large time-interleaved arrays, building a Time Interleaved Counter (TIC) ADC. The key to realising a TIC ADC is distributed sampling and a global multi-phase ramp generator realised with a novel figure-of-8 rotating resistor ring. Furthermore Counter ADCs allow for re-configurability between effective sampling rate and resolution due to their sequential comparison of reference levels in conversion. A prototype TIC ADC of 128-channels was fabricated and measured in 0.13μm CMOS technology, where the same block can be configured to operate as a 7-bit 1GS/s, 8-bit 500MS/s, or 9-bit 250MS/s dataconverter. The ADC achieves a sub 400fJ/step FOM in all modes of configuration.
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15

Syed, Arsalan Jawed. "Analog-to-Digital Converter Design for Non-Uniform Quantization." Thesis, Linköping University, Department of Electrical Engineering, 2004. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-2654.

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The thesis demonstrates a low-cost, low-bandwidth and low-resolution Analog-to- Digital Converter(ADC) in 0.35 um CMOS Process. A second-order Sigma-Delta modulator is used as the basis of the A/D Converter. A Semi-Uniform quantizer is used with the modulator to take advantage of input distributions that are dominated by smaller-amplitude signals e.g. Audio, Voice and Image-sensor signals. A Single-bit feedback topology is used with a multi-bit quantizer in the modulator. This topology avoids the use of a multi-bit DAC in the feedback loop – hence the system does not need to use digital correction techniques to compensate for a multi-bit DAC nonlinearity.

High-Level Simulations of the second-order Sigma-Delta modulator single-bit feedback topology along with a Semi-Uniform quantizer are performed in Cadence. Results indicate that a 5-bit Semi-Uniform quantizer with a Over-Sampling Ratio of 32, can achieve a resolution of 10 bits, in addition, a semi-uniform quantizer exhibits a 5-6 dB gain in SNR over its uniform counterpart for input amplitudes smaller than –10 dB. Finally, this system is designed in 0.35um CMOS process.

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16

Cheng, Yongjie. "Design and Realization of a Single Stage Sigma-Delta ADC With Low Oversampling Ratio." Diss., CLICK HERE for online access, 2006. http://contentdm.lib.byu.edu/ETD/image/etd1561.pdf.

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17

Orchanian, Shant. "Split Non-Linear Cyclic Analog-to-Digital Converter." Digital WPI, 2010. https://digitalcommons.wpi.edu/etd-theses/324.

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Analog-to-Digital Converters (ADC's) are inherently optimized for linearity in order to produce an accurate digital representation of an analog voltage. The Cyclic ADC's linearity is limited by one of its components, the residue amplifier. The residue amplifier is used to amplify the error between the analog voltage and the digital decision by a gain of two in each cycle of a conversion. In previous designs, this was accomplished by using a compound op-amp with a large open loop gain for linearity, and negative feedback to achieve the gain of two. This thesis explores the use of a resistively loaded differential pair to achieve this gain. The design reduces die size, power usage, and analog complexity. To correct for this inherent non- linearity, a Split ADC concept is employed to enable digital background calibration and a correction algorithm to account for this non- linearity. The Integrated circuit is designed, laid out, and simulated using the Cadence Integrated Circuit Front to Back design suite (ICFB) in the 0.18um Jazz CMOS process.
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18

Björsell, Niclas. "Modeling Analog to Digital Converters at Radio Frequency." Doctoral thesis, KTH, Signalbehandling, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-4523.

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Det här arbetet handlar om att ta fram beteendemodeller av analog till digital omvandlare avsedda för tillämpningar i radiofrekvensområdet. Det gäller tillämpningar inom telekommunikation men även in test- och mätinstrument där omvandlingen från analoga till digitala signaler ofta är en prestandamässig flaskhals. Modellerna är avsedda att användas för att efterbehandla utdata från omvandlaren och på så sätt förbättra prestanda på den digitala signalen. Genom att skapa modeller av verkliga omvandlare och hur dessa avviker från ett idealt beteende kan ofullständigheter korrigeras genom så kallad postkorrigering. Beteendemodeller innebär att genererar en lämplig insignal, mäta utdata och beräkna en modell. För omvandlare i radiofrekvensområdet ställs höga krav på instrumentering. Den testutrustningen som används är baserad på moderna högprestanda instrument som har kompletterats med specialbyggd utrustning för signalkonditionering och datainsamling. I avhandlingen har även olika insignaler utvärderats med såväl teoretisk som experimentell analys. Det finns ett flertal olika varianter av modeller för att modulera ett olinjär, dynamisk system. För att få en parametereffektiv modell har utgångspunkten varit att utgå från en Volterramodell som på ett optimalt sätt beskriver svagt olinjära dynamiska system, så som analog till digital omvandlare, men som är alltför omfattande i antal parametrar. Volterramodellens har sedan reducerats till en mindre parameterintensiv, modellerstruktur på så sätt att Volterrakärnans symmetriegenskaper jämförts med symmetrierna hos andra modeller. En alternativ metod är att använda en Kautz-Volterramodell. Den har samma generella egenskaper som Volterramodellen, men är inte lika parameterkrävande. I den här avhandlingen redovisas experimentella resultat av Kautz-Volterramodellen som i framtiden kommer att vara intressanta att använda för postkorrigeringen. För att kunna beskriva beteenden som en dynamiska olinjära modellen inte klarar av har modellen kompletterats med en statisk styckvis linjär modellkomponent. I avhandlingen presenteras en sluten lösning för att identifiera samtliga paramervärden i modellen. Vidare har det i avhandlingen genomförs en analys av hur respektive komponent påverkar prestanda på utsignalen. Därigenom erhålls ett mått på den maximala prestandaförbättring som kan uppnås om felet kan elimineras.
This work considers behavior modeling of analog to digital converters with applications in the radio frequency range, including the field of telecommunication as well as test and measurement instrumentation, where the conversion from analog to digital signals often is a bottleneck in performance. The models are intended to post-process output data from the converter and thereby improve the performance of the digital signal. By building a model of practical converters and the way in which they deviate from ideal, imperfections can be corrected using post-correction methods. Behavior modeling implies generation of a suitable stimulus, capturing the output data, and characterizing a model. The demands on the test setup are high for converters in the radio frequency range. The test-bed used in this thesis is composed of commercial state-of-the-art instruments and components designed for signal conditioning and signal capture. Further, in this thesis, different stimuli are evaluated, theoretically as well as experimentally. There are a large number of available model structures for dynamic nonlinear systems. In order to achieve a parameter efficient model structure, a Volterra model was used as a starting-point, which can describe any weak nonlinear system with fading memory, such as analog to digital converters. However, it requires a large number of coefficients; for this reason the Volterra model was reduced to a model structure with fewer parameters, by comparing the symmetry properties of the Volterra kernels with the symmetries from other models. An alternative method is the Kautz-Volterra model, which has the same general properties as the Volterra model, but with fewer parameters. This thesis gives experimental results of the Kautz-Volterra model, which will be interesting to apply in a post-correction algorithm in the future. To cover behavior not explained by the dynamic nonlinear model, a complementary piecewise linear model component is added. In this thesis, a closed form solution to the estimation problem for both these model components is given. By gradually correcting for each component the performance will improve step by step. In this thesis, the relation between a given component and the performance of the converter is given, as well as potential for improvement of an optimal post-correction.
QC 20100629
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19

Kook, Se Hun. "Low-cost testing of high-precision analog-to-digital converters." Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/41170.

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The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-signal system-on-chips (SoCs) and system-on-packages (SoPs). As a result, the cost of electrical products has sharply declined, and their performance has greatly improved. However, a testing throughput still remains one of the major contribution factors to final cost of the electrical products. In addition, highly precise and robust test methods and equipment are needed to promise non-defective products to customers. Hence, the testing is a critical part of the manufacturing process in the semiconductor industry. Testing such highly integrated systems and devices requires high-performance and high-cost equipment. Analog-to-digital converters (A/D converters) are the largest volume mixed-signal circuits, and they play a key role in communication between the analog and digital domains in many mixed-signal systems. Due to the increasing complexity of the mixed-signal systems and the availability of the new generations of highly integrated systems, reliable and robust data conversion schemes are necessary for many mixed-signal designs. Many applications such as telecommunications, instrumentation, sensing, and data acquisition have demanded data converters that support ultra high-speed, wide-bandwidths, and high-precision with excellent dynamic performance and low-noise. However, as resolutions and speeds in the A/D converters increase, testing becomes much harder and more expensive. In this research work, low-cost test strategies to reduce overall test cost for high-precision A/D converters are developed. The testing of data converters can be classified as dynamic (or alternating current (AC)) performance test and static (or direct current (DC)) performance test [1]. In the dynamic specification test, a low-cost test stimulus is generated using an optimization algorithm to stimulate high-precision sigma-delta A/D converters under test. Dynamic specifications are accurately predicted in two different ways using concepts of an alternate-based test and a signature-based test. For this test purpose, the output pulse stream of a sigma-delta modulator is made observable and useful. This technique does not require spectrally pure input signals, so the test cost can be reduced compared to a conventional test method. In addition, two low-cost test strategies for static specification testing of high-resolution A/D converters are developed using a polynomial-fitting method. The cost of testing can be significantly reduced as a result of the measurement of fewer samples than a conventional histogram test. While one test strategy needs no expensive high-precision stimulus generator, which can reduce the test cost, the other test strategy finds the optimal set of test-measurement points for the maximum fault coverage, which can use minimum-code measurement as a production test solution. The theoretical concepts of the proposed test strategies are developed in software simulation and validated by hardware experiments using a commercially available A/D converter and designed converters on printed circuit board (PCB). This thesis provides low-cost test solutions for the high-resolution A/D converters.
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20

Nilsson, Johan, and Mikael Rothin. "Live Demonstration of Mismatch Compensation for Time-Interleaved ADCs." Thesis, Linköpings universitet, Elektroniksystem, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-78709.

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The purpose of this thesis is to demonstrate the effects of mismatch errors that occur in time-interleaved analog-to-digital converters (TI-ADC) and how these are compensated for by proprietary methods from Signal Processing Devices Sweden AB. This will be demonstrated by two different implementations, both based on the combined digitizer/generator SDR14. These demonstrations shall be done in a way that is easy to grasp for people with limited knowledge in signal processing. The first implementation is an analog video demo where an analog video signal is sampled by such an TI-ADC in the SDR14, and then converted back to analog and displayed with the help of a TV tuner. The mismatch compensation can be turned on and off and the difference on the resulting video image is clearly visible. The second implementation is a digital communication demo based on W-CDMA, implemented on the FPGA of the SDR14. Four parallel W-CDMA signals of 5 MHz are sent and received by the SDR14. QPSK, 16-QAM, and 64-QAM modulated signals were successfully sent and the mismatch effects were clearly visible in the constellation diagrams. Techniques used are, for example: root-raised cosine pulse shaping, RF modulation, carrier recovery, and timing recovery.
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21

Petrie, Alexander Craig. "Ultra-Low-Supply-Voltage Analog-to-Digital Converters." BYU ScholarsArchive, 2019. https://scholarsarchive.byu.edu/etd/9122.

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This thesis presents techniques to implement analog-to-digital converters (ADCs) under an ultra-low-supply-voltage of 0.2 V to reduce the power consumption. The thesis proposes a dynamic bulk biasing circuit to adjust the PMOS bulk voltage to balance the NMOS and PMOS drain currents to guarantee functionality in the presence of process, voltage, and temperature variations. The dynamic bulk bias circuit is analyzed rigorously to show its functionality. This thesis also describes a new comparator suitable for a 0.2-V supply using ac-coupling, stacked input pairs, and voltage-boosted load capacitor. A 10-bit 5-kS/s successive-approximation-register (SAR) ADC in a 180-nm CMOS process with a supply voltage of 0.2 V demonstrates these ideas. The ADC exhibits a differential nonlinearity (DNL) and integral nonlinearity (INL) within +0.42/-0.45 and +0.62/-0.67 LSB, respectively. The measured SFDR and SNDR at 5 kS/s with a Nyquist-frequency input are 65.9 dB and 52.1 dB, respectively. The entire ADC and dynamic bulk biasing circuitry consume 22 nW including leakage power to yield a figure-of-meirt (FoM) of 8.8 fJ/conv.-step. Measurements of multiple chips show the proposed dynamic bulk biasing fully recovers the ADC performance when the supply voltage is varied. The nW power consumption makes the design well suited for wireless sensor node and energy harvester applications.
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22

Croughwell, Rosamaria. "A 16-b 10Msample/s Split-Interleaved Analog to Digital Converter." Digital WPI, 2007. https://digitalcommons.wpi.edu/etd-theses/974.

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"This work describes the integrated circuit design of a 16-bit, 10Msample/sec, combination ‘split’ interleaved analog to digital converter. Time interleaving of analog to digital converters has been used successfully for many years as a technique to achieve faster speeds using multiple identical converters. However, efforts to achieve higher resolutions with this technique have been difficult due to the precise matching required of the converter channels. The most troublesome errors in these types of converters are gain, offset and timing differences between channels. The ‘split ADC’ is a new concept that allows the use of a deterministic, digital, self calibrating algorithm. In this approach, an ADC is split into two paths, producing two output codes from the same input sample. The difference of these two codes is used as the calibration signal for an LMS error estimation algorithm that drives the difference error to zero. The ADC is calibrated when the codes are equal and the output is taken as the average of the two codes. The ‘split’ ADC concept and interleaved architecture are combined in this IC design to form the core of a high speed, high resolution, and self-calibrating ADC system. The dual outputs are used to drive a digital calibration engine to correct for the channel mismatch errors. This system has the speed benefits of interleaving while maintaining high resolution. The hardware for the algorithm as well as the ADC can be implemented in a standard 0.25um CMOS process, resulting in a relatively inexpensive solution. This work is supported by grants from Analog Devices Incorporated (ADI) and the National Science Foundation (NSF). "
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23

Chan, Ka Yan. "Applying the "split-ADC" architecture to a 16 bit, 1 MS/s differential successive approximation analog-to-digital converter." Worcester, Mass. : Worcester Polytechnic Institute, 2008. http://www.wpi.edu/Pubs/ETD/Available/etd-043008-164352/.

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24

Liu, Shaolong. "SAR ADCs Design and Calibration in Nano-scaled Technologies." Research Showcase @ CMU, 2017. http://repository.cmu.edu/dissertations/1073.

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The rapid progress of scaling and integration of modern complimentary metal oxide semiconductor (CMOS) technology motivates the replacement of traditional analog signal processing by digital alternatives. Thus, analog-to-digital converters (ADCs), as the interfaces between the analog world and the digital one, are driven to enhance their performance in terms of speed, resolution and power efficiency. However, in the presence of imperfections of device mismatch, thermal noise and reduced voltage headroom, efficient ADC design demands new strategies for design, calibration and optimization. Among various ADC architectures, successive-approximation-register (SAR) ADCs have received renewed interest from the design community due to their low hardware complexity and scaling-friendly property. However, the conventional SAR architecture has many limitations for high-speed, high-resolution applications. Many modified SAR architectures and hybrid SAR architectures have been reported to break the inherent constraints in the conventional SAR architecture. Loop-unrolled (LU) SAR ADCs have been recognized as a promising architecture for high-speed applications. However, mismatched comparator offsets introduce input-level dependent errors to the conversion result, which deteriorates the linearity and limits the resolution and the resolution of most reported SAR ADCs of this kind are limited to 6 bits. Also, for high-resolution SAR ADCs, the comparator noise specification is very stringent, which imposes a limitation on ADC speed and power-efficiency. Lastly, capacitor mismatch is an important limiting factor for SAR ADC linearity, and generally requires dedicated calibration to achieve efficient designs in terms of power and area. In this work, we investigate the impacts of offset mismatch, comparator noise and capacitor mismatch on high-speed SAR ADCs. An analytical model is proposed to estimate the resolution and predict the yield of LU-SAR ADCs with presence of comparator offset mismatch. A background calibration technique is proposed for resolving the comparator mismatch issue. A 150-MS/s 8-bit LU-SAR ADC is fabricated in a 130-nm CMOS technology to validate the concept. The measured result shows that the calibration improves the SNDR from 33.7-dB to 42.9-dB. The ADC consumes 640 μW from a 1.2 V supply with a Figure-of-Merit (FoM) of 37.5-fJ/conv-step. Moreover, the bit-wise impact of comparator noise is studied for LU-SAR ADCs. Lastly, an extended statistical element selection (SES) calibration technique is proposed to calibrate the capacitor mismatch in SAR ADCs. Based on these techniques, a high-resolution, asynchronous SAR architecture employing multiple comparators with different speed and noise specifications to optimize speed and power efficiency. A 12-bit prototype ADC is fabricated in a 1P9M 65nm CMOS technology, and fits into an active area of 500 μm × 200 μm. At 125 MS/s, the ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 64.4 dB and a spurious-free-dynamic-range (SFDR) of 75.1 dB at the Nyquist input frequency while consuming 1.7 mW from a 1.2 V supply. The resultant figure-of-merit (FoM) is 10.3 fJ/conv-step.
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Sheikhaei, Samad. "A 43mW single-channel 4GS/s 4-bit flash ADC IN 0.18um CMOS." Thesis, University of British Columbia, 2008. http://hdl.handle.net/2429/2746.

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The continued speed improvement of serial links and appearance of new communication technologies, such as ultra wideband (UWB), have introduced increasing demands on the speed and power specifications of high speed low to medium resolution analog to digital converters (ADCs). While multi channel ADCs can achieve high speeds, they often require extensive and costly post fabrication calibration. A single channel 4 bit flash ADC, suitable for abovementioned or similar applications, implemented entirely using current mode logic (CML) blocks, is presented. CML implementation allows for high sampling rates, while typically providing low power consumption at high speeds. To improve the conversion rate, both the analog (comparator array) and the digital (encoder) parts of the ADC are fully pipelined. Furthermore, the logic functions in the encoder are reformulated to reduce wire crossings and delay and to equalize the wires lengths in the layout. To keep the design simple, inductors are avoided. As a result, a compact design with small wire parasitics is achieved. Moreover, some geometric layout techniques, including a common centroid layout for the resistor ladder, are introduced to reduce the effect of mismatches to eliminate the use of digital calibration. The ADC is designed and fabricated in 0.18um CMOS and operates at 4GS/s. It achieves an effective number of bits (ENOB) of 3.71 (3.14, 2.75) for a 10MHz (0.501GHz, 1.491GHz) signal sampled at 4GS/s (3GS/s, 3GS/s). Differential/integral nonlinearity (DNL/INL) errors are between +/-0.35LSB and +/-0.26LSB, respectively. The ADC consumes 43mW from a 1.8V supply and occupies 0.06mm2 active area. Due to the use of CML circuits, the ADC achieves the highest speed reported for a single channel 4 bit ADC in a 0.18um CMOS technology. It also reports the best power performance among the 4-bit ADCs with similar or higher speeds. The active area is also among the smallest reported. In addition, in this thesis, the signal to noise ratio (SNR) of an ADC is formulated in terms of its INL performance. The related formulas in the literature are not accurate for low resolution ADCs, and yet they do not take the input waveform into account. Two standard waveforms, ramp and sinusoid, are considered here. The SNR formulas are derived and confirmed by simulation results.
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Lundin, Henrik. "Characterization and Correction of Analog-to-Digital Converters." Doctoral thesis, KTH, School of Electrical Engineering (EES), 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-547.

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Denna avhandling behandlar analog-digitalomvandling. I synnerhet behandlas postkorrektion av analog-digitalomvandlare (A/D-omvandlare). A/D-omvandlare är i praktiken behäftade med vissa fel som i sin tur ger upphov till distorsion i omvandlarens utsignal. Om felen har ett systematiskt samband med utsignalen kan de avhjälpas genom att korrigera utsignalen i efterhand. Detta verk behandlar den form av postkorrektion som implementeras med hjälp av en tabell ur vilken korrektionsvärden hämtas.

Innan en A/D-omvandlare kan korrigeras måste felen i den mätas upp. Detta görs genom att estimera omvandlarens överföringsfunktion. I detta arbete behandlas speciellt problemet att skatta kvantiseringsintervallens mittpunkter. Det antas härvid att en referenssignal finns tillgänglig som grund för skattningen. En skattare som baseras på sorterade data visas vara bättre än den vanligtvis använda skattaren baserad på sampelmedelvärde.

Nästa huvudbidrag visar hur resultatet efter korrigering av en A/D-omvandlare kan predikteras. Omvandlaren antas här ha en viss differentiell olinjäritet och insignalen antas påverkad av ett slumpmässigt brus. Ett postkorrektionssystem, implementerat med begränsad precision, korrigerar utsignalen från A/D-omvandlaren. Ett utryck härleds som beskriver signal-brusförhållandet efter postkorrektion. Förhållandet visar sig bero på den differentiella olinjäritetens varians, det slumpmässiga brusets varians, omvandlarens upplösning samt precisionen med vilken korrektionstermerna beskrivs.

Till sist behandlas indexering av korrektionstabeller. Valet av metod för att indexera en korrektionstabell påverkar såväl tabellens storlek som förmågan att beskriva och korrigera dynamiska fel. I avhandlingen behandlas i synnerhet tillståndsmodellbaserade metoder, det vill säga metoder där tabellindex bildas som en funktion utav flera på varandra följande sampel. Allmänt gäller att ju fler sampel som används för att bilda ett tabellindex, desto större blir tabellen, samtidigt som förmågan att beskriva dynamiska fel ökar. En indexeringsmetod som endast använder en delmängd av bitarna i varje sampel föreslås här. Vidare så påvisas hur valet av indexeringsbitar kan göras optimalt, och experimentella utvärderingar åskådliggör att tabellstorleken kan reduceras avsevärt utan att fördenskull minska prestanda mer än marginellt.

De teorier och resultat som framförs här har utvärderats med experimentella A/D-omvandlardata eller genom datorsimuleringar.


Analog-to-digital conversion and quantization constitute the topic of this thesis. Post-correction of analog-to-digital converters (ADCs) is considered in particular. ADCs usually exhibit non-ideal behavior in practice. These non-idealities spawn distortions in the converters output. Whenever the errors are systematic, it is possible to mitigate them by mapping the output into a corrected value. The work herein is focused on problems associated with post-correction using look-up tables. All results presented are supported by experiments or simulations.

The first problem considered is characterization of the ADC. This is in fact an estimation problem, where the transfer function of the converter should be determined. This thesis deals with estimation of quantization region midpoints, aided by a reference signal. A novel estimator based on order statistics is proposed, and is shown to have superior performance compared with the sample mean traditionally used.

The second major area deals with predicting the performance of an ADC after post-correction. A converter with static differential nonlinearities and random input noise is considered. A post-correction is applied, but with limited (fixed-point) resolution in the corrected values. An expression for the signal-to-noise and distortion ratio after post-correction is provided. It is shown that the performance is dependent on the variance of the differential nonlinearity, the variance of the random noise, the resolution of the converter and the precision of the correction values.

Finally, the problem of addressing, or indexing, the correction look-up table is dealt with. The indexing method determines both the memory requirements of the table and the ability to describe and correct dynamically dependent error effects. The work here is devoted to state-space--type indexing schemes, which determine the index from a number of consecutive samples. There is a tradeoff between table size and dynamics: more samples used for indexing gives a higher dependence on dynamic, but also a larger table. An indexing scheme that uses only a subset of the bits in each sample is proposed. It is shown how the selection of bits can be optimized, and the exemplary results show that a substantial reduction in memory size is possible with only marginal reduction of performance.

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Levski, Dimitrov Deyan. "A Cyclic Analog to Digital Converter for CMOS image sensors." Thesis, Linköpings universitet, Elektroniksystem, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-103193.

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The constant strive for improvement of digital video capturing speeds together with power efficiency increase, has lead to tremendous research activities in the image sensor readout field during the past decade. The improvement of lithography and solid-state technologies provide the possibility of manufacturing higher resolution image sensors. A double resolution size-up, leads to a quadruple readout speed requirement, if the same capturing frame rate is to be maintained. The speed requirements of conventional serial readout techniques follow the same curve and are becoming more challenging to design, thus employing parallelism in the readout schemes appears to be inevitable for relaxing the analog readout circuits and keeping the same capturing speeds. This transfer however imposes additional demands to parallel ADC designs, mainly related to achievable accuracy, area and power. In this work a 12-bit Cyclic ADC (CADC) aimed for column-parallel readout implementation in CMOS image sensors is presented. The aim of the conducted study is to cover multiple CADC sub-component architectures and provide an analysis onto the latter to a mid-level of depth. A few various Multiplying DAC (MDAC) structures have been re-examined and a preliminary redundant signed-digit CADC design based on a 1.5-bit modified flip-over MDAC has been conducted. Three comparator architectures have been explored and a dynamic interpolative Sub-ADC is presented. Finally, some weak spots degrading the performance of the carried-out design have been analyzed. As an architectural improvement possibility two MDAC capacitor mismatch error reduction techniques have been presented.
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Zhang, Dai. "Design of Ultra-Low-Power Analog-to-Digital Converters." Licentiate thesis, Linköpings universitet, Elektroniska komponenter, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-79276.

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Power consumption is one of the main design constraints in today’s integrated circuits. For systems powered by small non-rechargeable batteries over their entire lifetime, such as medical implant devices, ultra-low power consumption is paramount. In these systems, analog-to-digital converters (ADCs) are key components as the interface between the analog world and the digital domain. This thesis addresses the design challenges, strategies, as well as circuit techniques of ultra-low-power ADCs for medical implant devices. Medical implant devices, such as pacemakers and cardiac defibrillators, typically requirelow-speed, medium-resolution ADCs. The successive approximation register (SAR) ADC exhibits significantly high energy efficiency compared to other prevalent ADC architectures due to its good tradeoffs among power consumption, conversion accuracy, and design complexity. To design an energy-efficient SAR ADC, an understanding of its error sources as well as its power consumption bounds is essential. This thesis analyzes the power consumption bounds of SAR ADC: 1) at low resolution, the power consumption is bounded by digital switching power; 2) at medium-to-high resolution, the power consumption is bounded by thermal noise if digital assisted techniques are used to alleviate mismatch issues; otherwise it is bounded by capacitor mismatch.  Conversion of the low frequency bioelectric signals does not require high speed, but ultra-low-power operation. This combined with the required conversion accuracy makes the design of such ADCs a major challenge. It is not straightforward to effectively reduce the unnecessary speed for lower power consumption using inherently fast components in advanced CMOS technologies. Moreover, the leakage current degrades the sampling accuracy during the long conversion time, and the leakage power consumption contributes to a significant portion of the total power consumption. Two SAR ADCs have been implemented in this thesis. The first ADC, implemented in a 0.13-µm CMOS process, achieves 9.1 ENOB with 53-nW power consumption at 1 kS/s. The second ADC, implemented in a 65-nm CMOS process, achieves the same resolution at 1 kS/s with a substantial (94%) improvement in power consumption, resulting in 3-nW total power consumption. Our work demonstrates that the ultra-low-power operation necessitates maximum simplicity in the ADC architecture.
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Spetla, Hattie. "Split Cyclic Analog to Digital Converter Using A Nonlinear Gain Stage." Digital WPI, 2009. https://digitalcommons.wpi.edu/etd-theses/1014.

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"Previous implementations of digital background calibration for cyclic ADCs have required linear amplifier behavior in the gain stage for accurate correction. Correction is digital decoding of ADC outputs to determine the original ADC input. Permitting nonlinearity in the gain stage of the ADC allows for less demanding amplifier design requirements, reducing power and size. However this requires a method of determining the value of this variable gain during digital correction. Look up tables (LUTs,) are an effective and efficient method of compensating for analog circuit imperfections. The LUT correction and calibration method discussed in this work has been simulated using Cadence integrated circuit simulation ADC specifications and MATLAB."
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Li, Xiangtao. "High-speed analog-to-digital conversion in SiGe HBT technology." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/24652.

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Thesis (Ph.D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2008.
Committee Chair: Cressler, John D.; Committee Member: Laskar, Joy; Committee Member: Lee, Chin-Hui; Committee Member: Morley, Thomas; Committee Member: Papapolymerou, John
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Majidi, Rabeeh. "DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS." Digital WPI, 2015. https://digitalcommons.wpi.edu/etd-dissertations/275.

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With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI.
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Li, Sulin. "A Highly Digital VCO-Based ADC With Lookup-Table-Based Background Calibration." Digital WPI, 2019. https://digitalcommons.wpi.edu/etd-dissertations/556.

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CMOS technology scaling has enabled dramatic improvement for digital circuits both in terms of speed and power efficiency. However, most traditional analog-to-digital converter (ADC) architectures are challenged by ever-decreasing supply voltage. The improvement in time resolution enabled by increased digital speeds drives design towards time-domain architectures such as voltage-controlled-oscillator (VCO) based ADCs. The main challenge in VCO-based ADC design is mitigating the nonlinearity of VCO Voltage-to-frequency (V-to-f) characteristics. Achieving signal-to-noise ratio (SNR) performance better than 40dB requires some form of calibration, which can be realized by analog or digital techniques, or some combination. This dissertation proposes a highly digital, reconfigurable VCO-based ADC with lookup-table (LUT) based background calibration based on "split ADC" architecture. Each of the two split channels, ADC "A" and "B", contains two VCOs in a differential configuration. This helps alleviate even-order distortions as well as increase the dynamic range. A digital controller on chip can reconfigure the ADCs' sampling rates and resolutions to adapt to various application scenarios. Different types of input signals can be used to train the ADC’s LUT parameters through the simple, anti-aliasing continuous-time input to achieve target resolution. The chip is fabricated in a 180 nm CMOS process, and the active area of analog and digital circuits is 0.09 and 0.16mm^2, respectively. Power consumption of the core ADC function is 25 mW. Measured results for this prototype design with 12-b resolution show ENOB improves from uncorrected 5-b to 11.5-b with calibration time within 200 ms (780K conversions at 5 MSps sample rate).
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Aust, Carrie Ellen. "A Low-Power, Variable-Resolution Analog-to-Digital Converter." Thesis, Virginia Tech, 2000. http://hdl.handle.net/10919/33737.

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Analog-to-digital converters (ADCs) are used to convert analog signals to the digital domain in digital communications systems. An ADC used in wireless communications should meet the necessary requirements for the worst-case channel condition. However, the worst-case scenario rarely occurs. As a consequence, a high-resolution and subsequently high power ADC designed for the worst case is not required for most operating conditions. A solution to reduce the power dissipation of ADCs in wireless digital communications systems is to detect the current channel condition and to dynamically vary the resolution of the ADC according to the given channel condition. In this thesis, we investigated an ADC that can change its resolution dynamically and, consequently, its power dissipation. Our ADC is a switched-current, redundant signed-digit (RSD) cyclic implementation that easily incorporates variable resolution. Furthermore, the RSD cyclic algorithm is insensitive to offsets, allowing simple, low-power comparators. Our ADC is implemented in a 0.35 um CMOS technology with a single-ended 3.3 V power supply. Our ADC has a maximum power dissipation of 6.35 mW for a 12-bit resolution and dissipates an average of 10 percent less power when the resolution is decreased by two bits. Simulation results indicate our ADC achieves a bit rate of 1.7 MHz and has a SNR of 84 dB for the maximum input frequency of 8.3 kHz.
Master of Science
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Figueiredo, Michael. "Reference-free high-speed cmos pipeline analog-to-digital converters." Doctoral thesis, Faculdade de Ciências e Tecnologia, 2012. http://hdl.handle.net/10362/8776.

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Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering of the Faculdade de Ciências e Tecnologia of Universidade Nova de Lisboa
More and more signal processing is being transferred to the digital domain to profit from the technological enhancement of digital circuits. Where technology scaling enhances the capabilities of digital circuits, it degrades the performance of analog circuits. However, it is important to note that the impact that technology scaling has on digital circuits is becoming smaller and smaller, which means that, in nanotechnologies, to enhance energy and area efficiency, we can not simply depend on the benefits of this scaling. Although, a share of the efficiency can be obtained from the technology, new circuit architectures and techniques have to be developed to really push the limits of efficiency. In data converters, more specifically analog-to-digital converters (ADCs), a decision can be made: research energy and area efficient analog circuit techniques and architectures that cope with technological scaling issues, or design algorithms that use digital circuitry to assist the poor analog technological performance. The former option is the premise for the work developed in this thesis. The work reported in this thesis explores various design techniques with the purpose of enhancing the power and area efficiency of building blocks mainly to be used in multiplying digital-to-analog converter based ADCs. Therefore, novel analog techniques are developed for the three main blocks of an MDAC-based stage, namely, the flash quantizer, the amplifier, and the switched capacitor network of the MDAC. These techniques include self-biasing and inverter-based design for the flash quantizer and amplifier. Regarding the MDAC, it combines three techniques: unity feedback factor, insensitivity to capacitor mismatch, and current-mode reference shifting. In the second part of this work, the designed amplifier is implemented and experimentally characterized demonstrating its practical feasibility and performance. The final part of this work explores the design and implementation of a medium-low resolution high speed pipeline ADC incorporating all the developed circuits. Experimental results validate the feasibility of the techniques and demonstrate the attractiveness in terms of power dissipation and reduced area.
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Tao, Sha. "Power-Efficient Continuous-Time Incremental Sigma-Delta Analog-to-Digital Converters." Doctoral thesis, KTH, Integrerade komponenter och kretsar, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-164282.

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Over the past decade, there has been a growing interest in the devel- opment of integrated circuits (ICs) for wearable or implantable biosensors, aiming at providing personalized healthcare services and reducing the health-care expenses. In biosensor ICs, the analog-to-digital converter (ADC) is a key building block that acts as a bridge between analog signals and digital processors. Since most of the biosensors are attached to or implanted in hu- man bodies and powered by either portable batteries or harvested energy, ultra-low-power operation is often required. The stringent power budget im- poses challenges in designing power-efficient ADCs, especially when targeting high-resolution. Among different ADC architectures, the Sigma-Delta (Σ∆) ADC has emerged as the most suitable for low-power, high-resolution appli- cations. This thesis aims to enhance the power efficiency of continuous-time (CT) incremental Σ∆ (IΣ∆) ADCs by exploring design techniques at both architectural and circuit levels. The impact of feedback DACs in CT IΣ∆ ADCs is investigated, so as to provide power-efficient feedback DAC solutions, suitable for biosensor ap- plications. Different DAC schemes are examined analytically considering the trade-off between timing error sensitivity and power consumption. The an- alytical results are verified through behavioral simulations covering both the conventional and incremental Σ∆ modes. Additionally, by considering a typi- cal biosensor application, different feedback DACs are further compared, aim- ing to offer a reference for selecting a power-efficient DAC scheme. A two-step CT IΣ∆ ADC is proposed, analyzed, implemented and tested, with the objective of offering flexible and power-efficient A/D conversion in neural recording systems. By pipelining two CT IΣ∆ ADCs, the pro- posed ADC can achieve high-resolution without sacrificing the conversion rate. Power-efficient circuits are proposed to implement the active blocks of the proposed ADC. The feasibility and power efficiency of the two-step CT IΣ∆ ADC are validated by measurement results. Furthermore, enhancement techniques from both the architecture and circuit perspectives are discussed and implemented, which are validated by post-layout simulations. A comparative study of several CT IΣ∆ ADC architectures is presented, aiming to boost the power efficiency by reducing the number of cycles per con- version while benefiting from the advantage of CT implementation. Five CT IΣ∆ ADC architectures are analyzed and simulated to evaluate their effective- ness under ideal conditions. Based on the theoretical results, a second-order CT IΣ∆ ADC and an extended-range CT IΣ∆ ADC are selected as implemen- tation case studies together with the proposed two-step CT IΣ∆ ADC. The impact of critical circuit non-idealities is investigated. The three ADCs are then implemented and fabricated on a single chip. Experimental results reveal that the three prototype ADCs improve considerably the power efficiency of existing CT IΣ∆ ADCs while being very competitive when compared to all types of the state-of-the-art IΣ∆ ADCs.

QC 20150422

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Jalali, Mazlouman Shahrzad. "A frequency-translating hybrid architecture for wideband analog-to-digital converters." Thesis, University of British Columbia, 2008. http://hdl.handle.net/2429/2745.

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Many emerging applications call for wideband analog-to-digital converters and some require medium-to-high resolution. Incorporating such ADCs allows for shifting as much of the signal processing tasks as possible to the digital domain, where more flexible and programmable circuits are available. However, realizing such ADCs with the existing single stage architectures is very challenging. Therefore, parallel ADC architectures such as time-interleaved structures are used. Unfortunately, such architectures require high-speed high-precision sample-and-hold (S/H) stages that are challenging to implement. In this thesis, a parallel ADC architecture, namely, the frequency-translating hybrid ADC (FTH-ADC) is proposed to increase the conversion speed of the ADCs, which is also suitable for applications requiring medium-to-high resolution ADCs. This architecture addresses the sampling problem by sampling on narrowband baseband subchannels, i.e., sampling is accomplished after splitting the wideband input signals into narrower subbands and frequency-translating them into baseband where identical narrowband baseband S/Hs can be used. Therefore, lower-speed, lower-precision S/Hs are required and single-chip CMOS implementation of the entire ADC is possible. A proof of concept board-level implementation of the FTH-ADC is used to analyze the effects of major analog non-idealities and errors. Error measurement and compensation methods are presented. Using four 8-bit, 100 MHz subband ADCs, four 25 MHz Butterworth filters, two 64-tap FIR reconstruction filters, and four 10-tap FIR compensation filters, a total system with an effective sample rate of 200 MHz is implemented with an effective number of bits of at least 7 bits over the entire 100 MHz input bandwidth. In addition, one path of an 8-GHz, 4-bit, FTH-ADC system, including a highly-linear mixer and a 5th-order, 1 GHz, Butterworth Gm-C filter, is implemented in a 90 nm CMOS technology. Followed by a 4-bit, 4-GHz subband ADC, the blocks consume a total power of 52 mW from a 1.2 V supply, and occupy an area of 0.05 mm2. The mixer-filter has a THD ≤ 5% (26 dB) over its full 1 GHz bandwidth and provides a signal with a voltage swing of 350 mVpp for the subsequent ADC stage.
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Radhakrishnan, Venkataraman. "Design of a low power analog to digital converter in a 130nmCMOS technology." Thesis, Linköpings universitet, Elektroniksystem, 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-72700.

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Communication technology has become indispensable in a modernsociety. Its importance is growing day by day. One of the main reasonsbehind this growth is the advancement in the analog and mixed signalcircuit design.Analog to digital converter (ADC) is an essential part in a modernreceiver system. Its development is driven by the progress of CMOStechnologies with an aim to reduce area and power consumption. In thearea of RF integrated circuits for wireless application low operationalvoltage, and less current consumption are the central aspects of thedesign. The aim of this master thesis is the development and design ofa low-power analog to digital converter for RF applications.The basic specifications are:· High Speed, Low Current (1.5 V supply voltage)· Maximum input frequency 3.5 MHz· 8-bit resolution· Sampling rate < 100 MHzThus, this work comprises a theoretical concept phase in whichdifferent ADC topologies will be investigated. Based on which anappropriate ADC architecture will be fixed. Later, the chosen design willbe implemented in an industrial 130 nm CMOS process.
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Lu, Dongtian. "High speed CMOS ADC for UWB receiver /." View abstract or full-text, 2007. http://library.ust.hk/cgi/db/thesis.pl?ECED%202007%20LUD.

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Hassan, Raza Naqvi Syed. "1 GS/s, Low Power Flash, Analog to Digital Converter in 90nm CMOS Technology." Thesis, Linköping University, Department of Electrical Engineering, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8382.

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The analog to digital converters is the key components in modern electronic systems. As the digital signal processing industry grows the ADC design becomes more and more challenging for researchers. In these days an ADC becomes a part of the system on chip instead of standalone circuit for data converters. This increases the requirements on ADC design concerning for example speed, power, area, resolution, noise etc. New techniques and methods are going to develop day by day to achieve high performance ADCs.

Of all types of ADCs the flash ADC is not only famous for its data conversion rate but also it becomes the part of other types of ADC for example pipeline and multi bit Sigma Delta ADCs. The main problem with a flash ADC is its power consumption, which increases in number of bits. This thesis presents the comparison of power consumption of different blocks in 1Gbps flash ADCs for 2, 4 and 6 bits in a 90nm CMOS technology. We also investigate the impact on power consumption by changing the design of decoder block.

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McGinnis, Ryan Edward. "Flexible Sigma Delta Time-Interleaved Bandpass Analog-to-Digital Converter." Wright State University / OhioLINK, 2006. http://rave.ohiolink.edu/etdc/view?acc_num=wright1152542196.

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Dinc, Huseyin. "A high-speed two-step analog-to-digital converter with an open-loop residue amplifier." Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/39572.

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It is well known that feedback is a very valuable tool for analog designers to improve linearity, and desensitize various parameters affected by process, temperature and supply variations. However, using strong global feedback limits the operation speed of analog circuits due to stability requirements. The circuits and techniques explored in this research avoid the usage of strong-global-feedback circuits to achieve high conversion rates in a two-stage analog-to-digital converter (ADC). A two-step, 9-bit, complementary-metal-oxide-semiconductor (CMOS) ADC utilizing an open-loop residue-amplifier is demonstrated. A background-calibration technique was proposed to generate the reference voltage to be used in the second stage of the ADC. This technique alleviates the gain variation in the residue amplifier, and allows an open-loop residue amplifier topology. Even though the proposed calibration idea can be extended to multistage topologies, this design was limited to two stages. Further, the ADC exploits a high-performance double-switching frontend sample-and-hold amplifier (SHA). The proposed double-switching SHA architecture results in exceptional hold-mode isolation. Therefore, the SHA maintains the desired linearity performance over the entire Nyquist bandwidth.
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42

Thandri, Bharath Kumar. "Design of RF/IF analog to digital converters for software radio communication receivers." Texas A&M University, 2003. http://hdl.handle.net/1969.1/5774.

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Software radio architecture can support multiple standards by performing analogto- digital (A/D) conversion of the radio frequency (RF) signals and running reconfigurable software programs on the backend digital signal processor (DSP). A slight variation of this architecture is the software defined radio architecture in which the A/D conversion is performed on intermediate frequency (IF) signals after a single down conversion. The first part of this research deals with the design and implementation of a fourth order continuous time bandpass sigma-delta (CT BP) C based on LC filters for direct RF digitization at 950 MHz with a clock frequency of 3.8 GHz. A new ADC architecture is proposed which uses only non-return to zero feedback digital to analog converter pulses to mitigate problems associated with clock jitter. The architecture also has full control over tuning of the coefficients of the noise transfer function for obtaining the best signal to noise ratio (SNR) performance. The operation of the architecture is examined in detail and extra design parameters are introduced to ensure robust operation of the ADC. Measurement results of the ADC, implemented in IBM 0.25 µm SiGe BiCMOS technology, show SNR of 63 dB and 59 dB in signal bandwidths of 200 kHz and 1 MHz, respectively, around 950 MHz while consuming 75 mW of power from ± 1.25 V supply. The second part of this research deals with the design of a fourth order CT BP ADC based on gm-C integrators with an automatic digital tuning scheme for IF digitization at 125 MHz and a clock frequency of 500 MHz. A linearized CMOS OTA architecture combines both cross coupling and source degeneration in order to obtain good IM3 performance. A system level digital tuning scheme is proposed to tune the ADC performance over process, voltage and temperature variations. The output bit stream of the ADC is captured using an external DSP, where a software tuning algorithm tunes the ADC parameters for best SNR performance. The IF ADC was designed in TSMC 0.35 µm CMOS technology and it consumes 152 mW of power from ± 1.65 V supply.
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Ren, Saiyu Dr. "BROAD BANDWIDTH HIGH RESOLUTION ANALOG TO DIGITAL CONVERTERS: THEORY, ARCHITECTURE AND IMPLEMENTATION." Wright State University / OhioLINK, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=wright1205948819.

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Carr, Richard D. "Analog preprocessing in a SNS 2 [mu] low-noise CMOS folding ADC." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1994. http://handle.dtic.mil/100.2/ADA293356.

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Thesis (M.S. in Electrical Engineering) Naval Postgraduate School, December 1994.
"December 1994." Thesis advisor(s): Phillip E. Pace, Douglas J. Fouts. Bibliography: p. 103. Also available online.
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45

Säll, Erik. "Implementation of Flash Analog-to-Digital Converters in Silicon-on-Insulator Technology." Licentiate thesis, Linköping University, Linköping University, Electronics System, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-5260.

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High speed analog-to-digital converters (ADCs) used in, e.g., read channel and ultra wideband (UWB) applications are often based on a flash topology. The read channel applications is the intended application of this work, where a part of the work covers the design of two different types of 6-bit flash ADCs. Another field of application is UWB receivers.

To optimize the performance of the whole system and derive the specifications for the sub-blocks of the system it is often desired to use a topdown design methodology. To facilitate the top-down design methodology the ADCs are modeled on behavioral level. The models are simulated in MATLAB®. The results are used to verify the functionality of the proposed circuit topologies and serve as a base to the circuit design phase.

The first flash ADC has a conventional topology. It has a resistor net connected to a number of latched comparators, but its thermometer-tobinary encoder is based on 2-to-1 multiplexers buffered with inverters. This gives a compact encoder with a regular structure and short critical path. The main disadvantage is the code dependent timing difference between the encoder outputs introduced by this topology. The ADC was simulated on schematic level in Cadence® using the foundry provided transistor models. The design obtained a maximum sampling frequency of 1 GHz, an effective resolution bandwidth of 390 MHz, and a power consumption of 170 mW.

The purpose of the second ADC is to demonstrate the concept of introducing dynamic element matching (DEM) into the reference net of a flash ADC. This design yields information about the performance improvements the DEM gives, and what the trade-offs are when introducing DEM. Behavioral level simulations indicate that the SFDR is improved by 11 dB when introducing DEM, but the settling time of the reference net with DEM will now limit the conversion speed of the converter. Further, the maximum input frequency is limited by the total resistance in the reference net, which gets increased in this topology. The total resistance is the total switch on-resistance plus the total resistance of the resistors. To increase the conversion speed and the maximum input frequency a new DEM topology is proposed in this work, which reduces the number of switches introduced into the reference net compared with earlier proposed DEM topologies. The transistor level simulations in Cadence® of the flash ADC with DEM indicates that the SFDR improves by 6 dB compared with when not using DEM, and is expected to improve more if more samples are used in the simulation. This was not possible in the current simulations due to the long simulation time. The improved SFDR is however traded for an increased chip area and a reduction of the maximum sampling frequency to 550 MHzfor this converter. The average power consumption is 92 mW.

A goal of this work is to evaluate a 130 nm partially depleted silicon-oninsulator (SOI) complementary metal oxide semiconductor (CMOS) technology with respect to analog circuit implementation. The converters are therefore implemented in this technology. When writing this the ADCs are still being manufactured. Since the technology evaluation will be based on the measurement results the final results of the evaluation are not included in this thesis. The conclusions regarding the SOI CMOS technology are therefore based on a literature study of published scientific papers in the SOI area, information extracted during the design phase of the ADCs, and from the transistor level circuit simulations. These inputs indicate that to fully utilize the potential performance advantages of the SOI CMOS technology the partially depleted SOI CMOS technology should be exchanged for a fully depleted SOI CMOS technology. The manufacturing difficulties regarding the control of the thin-film thickness must however first be solved before the exchange can be done.


Report code: LiU-Tek-Lic-2005:68.
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46

Sekar, Ramgopal. "LOW-POWER TECHNIQUES FOR SUCCESSIVE APPROXIMATION REGISTER (SAR) ANALOG-TO-DIGITAL CONVERTERS." OpenSIUC, 2010. https://opensiuc.lib.siu.edu/theses/350.

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In this work, we investigate circuit techniques to reduce the power consumption of Successive Approximation Register Analog-to-Digital Converter (SAR-ADC). We developed four low-power SAR-ADC design techniques, which are: 1) Low-power SAR-ADC design with split voltage reference, 2) Charge recycling techniques for low-power SAR-ADC design, 3) Low-power SAR-ADC design using two-capacitor arrays, 4) Power reduction techniques by dynamically minimizing SAR-ADC conversion cycles. Matlab simulations are performed to investigate the power saving by the proposed techniques. Simulation results show that significant power reduction can be achieved by using the developed techniques. In addition, design issues such as area overhead, design complexity associated with the proposed low-power techniques are also discussed in the thesis.
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47

Kim, Tae Hong. "Electromagnetic Band Gap (EBG) synthesis and its application in analog-to-digital converter load boards." Diss., Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/22712.

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With increase in frequency and convergence toward mixed signal systems, supplying stable voltages to integrated circuits and blocking noise coupling in the systems are major problems. Electromagnetic band gap (EBG) structures have been in the limelight for power/ground noise isolation in mixed signal applications due to their capability to suppress unwanted electromagnetic mode transmission in certain frequency bands. The EBG structures have proven effective in isolating the power/ground noise in systems that use a common power supply. However, while the EBG structures have the potential to present many advantages in noise suppression applications, there is no method in the prior art that enables reliable and efficient synthesis of these EBG structures. Therefore, in this research, a novel EBG synthesis method for mixed signal applications is presented. For one-dimensional periodic structures, three new approaches such as current path approximation method, border to border radius, power loss method have been introduced and combined for synthesis. For two-dimensional EBG structures, a novel EBG synthesis method using genetic algorithm (GA) has been presented. In this method, genetic algorithm (GA) is utilized as a solution-searching technique. Synthesis procedure has been automated by combining GA with multilayer finite-difference method and dispersion diagram analysis method. As a real application for EBG structures, EBG structures have been applied to a GHz ADC load board design for power/ground noise suppression.
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48

David, Christopher Leonidas. "All Digital, Background Calibration for Time-Interleaved and Successive Approximation Register Analog-to-Digital Converters." Digital WPI, 2010. https://digitalcommons.wpi.edu/etd-dissertations/194.

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The growth of digital systems underscores the need to convert analog information to the digital domain at high speeds and with great accuracy. Analog-to-Digital Converter (ADC) calibration is often a limiting factor, requiring longer calibration times to achieve higher accuracy. The goal of this dissertation is to perform a fully digital background calibration using an arbitrary input signal for A/D converters. The work presented here adapts the cyclic "Split-ADC" calibration method to the time interleaved (TI) and successive approximation register (SAR) architectures. The TI architecture has three types of linear mismatch errors: offset, gain and aperture time delay. By correcting all three mismatch errors in the digital domain, each converter is capable of operating at the fastest speed allowed by the process technology. The total number of correction parameters required for calibration is dependent on the interleaving ratio, M. To adapt the "Split-ADC" method to a TI system, 2M+1 half-sized converters are required to estimate 3(2M+1) correction parameters. This thesis presents a 4:1 "Split-TI" converter that achieves full convergence in less than 400,000 samples. The SAR architecture employs a binary weight capacitor array to convert analog inputs into digital output codes. Mismatch in the capacitor weights results in non-linear distortion error. By adding redundant bits and dividing the array into individual unit capacitors, the "Split-SAR" method can estimate the mismatch and correct the digital output code. The results from this work show a reduction in the non-linear distortion with the ability to converge in less than 750,000 samples.
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49

El, Hamoui Mohamad A. "A Pipeline Analog-To-Digital Converter for a Plasma Impedance Probe." DigitalCommons@USU, 2009. https://digitalcommons.usu.edu/etd/287.

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Space instrumentation technology is an essential tool for rocket and satellite research, and is expected to become popular in commercial and military operations in fields such as radar, imaging, and communications. These instruments are traditionally implemented on printed circuit boards using discrete general-purpose Analog-to-Digital Converter (ADC) devices and other components. A large circuit board is not convenient for use in micro-satellite deployments, where the total payload volume is limited to roughly one cubic foot. Because micro-satellites represent a fast growing trend in satellite research and development, there is motivation to explore miniaturized custom application-specific integrated circuit (ASIC) designs to reduce the volume and power consumption occupied by instrument electronics. In this thesis, a model of a new Plasma Impedance Probe (PIP) architecture, which utilizes a custom-built ADC along with other analog and digital components, is proposed. The model can be fully integrated to produce a low-power, miniaturized impedance probe.
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50

Säll, Erik. "Implementation of Flash Analog-to-Digital Converters in Silicon-on-Insulator CMOS Technology." Doctoral thesis, Linköpings universitet, Elektroniksystem, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8712.

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A 130 nm partially depleted silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) technology is evaluated with respect to analog circuit implementation. We perform the evaluation through implementation of three flash analog-to-digital converters (ADCs). Our study indicate that to fully utilize the potential performance advantages of the SOI CMOS technology the partially depleted SOI CMOS technology should be replaced by a fully depleted technology. The manufacturing difficulties regarding the control of the thin-film thickness must however first be solved. A strong motivator for using the SOI CMOS technology instead of bulk CMOS seems to be the smaller gate leakage power consumption. The targeted applications in mind for the ADCs are read channel and ultra wideband radio applications. These applications requires a resolution of at least four to six bits and a sampling frequency of above 1 GHz. Hence the flash ADC topology is chosen for the implementations. In this work we do also propose enhancements to the flash ADC converter. Further, this work also investigates introduction of dynamic element matching (DEM) into a flash ADC. A method to introduce DEM into the reference net of a flash ADC is proposed and evaluated. To optimize the performance of the whole system and derive the specifications for the sub-blocks of the system it is often desired to use a top-down design methodology. To facilitate the top-down design methodology the ADCs are modeled on behavioral level using MATLAB and SpectreHDL. The modeling results are used to verify the functionality of the proposed circuit topologies and serve as a base to the circuit design phase. The first flash ADC implementation has a conventional topology. It has a resistor net connected to a number of latched comparators and employs a ones-counter thermometer-to-binary decoder. This ADC serves as a reference for evaluating the other topologies. The measurements indicate a maximum sampling frequency of 470 MHz, an SNDR of 26.3 dB, and an SFDR of about 29 to 35 dB. The second ADC has a similar topology as the reference ADC, but its thermometer-to-binary decoder is based on 2-to-1 multiplexers buffered with inverters. This gives a compact decoder with a regular structure and a short critical path. The measurements show that it is more efficient in terms of power consumption than the ones-counter decoder and it has 40 % smaller chip area. Further, the SNDR and SFDR are similar as for the reference ADC, but its maximum sampling frequency is about 660 MHz. The third ADC demonstrates the introduction of DEM into the reference net of a flash ADC. Our proposed technique requires fewer switches in the reference net than other proposals. Our technique should thereby be able to operate at higher sampling and input frequencies than compared with the other proposals. This design yields information about the performance improvements the DEM gives, and what the trade-offs are when introducing DEM. Behavioral level simulations indicate that the SFDR is improved by 11 dB in average when introducing DEM. The transistor level simulations in Cadence and measurements of the ADC with DEM indicates that the SFDR improves by 6 dB and 1.5 dB, respectively, when applying DEM. The smaller improvement indicated by the measurements is believed to be due to a design flaw discovered during the measurements. A mask layer for the resistors of the reference net is missing, which affects their accuracy and degrades the ADC performance. The same reference net is used in the other ADCs, and therefore degrades their performance as well. Hence the measured performance is significantly lower than indicated by the transistor level simulations. Further, it is observed that the improved SFDR is traded for an increased chip area and a reduction of the maximum sampling frequency. The DEM circuitry impose a 30 % larger chip area.
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