Relevant bibliographies by topics / Atom-microscope

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Atom-microscope'

Author: Grafiati
Published: 4 June 2021
Last updated: 31 January 2023

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Journal articles on the topic "Atom-microscope"

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Degen, Christian L., and Jonathan P. Home. "Cold-atom microscope shapes up." Nature Nanotechnology 6, no. 7 (July 2011): 399–400. http://dx.doi.org/10.1038/nnano.2011.107.

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Clauser, John F., and Shifang Li. "‘‘Heisenberg microscope’’ decoherence atom interferometry." Physical Review A 50, no. 3 (September 1, 1994): 2430–33. http://dx.doi.org/10.1103/physreva.50.2430.

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Kellogg, G. L. "Atom-probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 438–39. http://dx.doi.org/10.1017/s042482010010425x.

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The atom-probe field ion microscope is a highly-sensitive, time-of-flight mass spectrometer which is used to identify individual atoms or groups of atoms that appear in a field ion microscope image. Under ideal conditions the atom-probe can yield the surface and bulk composition of a solid sample with true atomic spatial and depth resolution. Since its development in the late 1960's, the atom-probe has been used to study a variety of problems in the areas of metallurgy, surface science, and materials science. This review focuses on operational principles of the atom-probe and selected applications carried out in the author's laboratory.The most widely-used atom-probe follows the original design developed by Müller, Panitz and McLane. In this instrument a small probe-hole is placed in the viewing screen of a field ion microscope. The image is adjusted such that the atom or atoms of interest are in alignment with the probe hole.
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Murphy, Tom. "IBM Scientists Build New Atom Imaging Microscope." JOM 37, no. 12 (December 1985): 56. http://dx.doi.org/10.1007/bf03259974.

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Grigorescu, M., P. Budau, and N. Carjan. "Atom oscillations in the scanning tunneling microscope." Physical Review B 55, no. 11 (March 15, 1997): 7244–48. http://dx.doi.org/10.1103/physrevb.55.7244.

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NISHIKAWA, O., K. HATTORI, F. KATSUKI, and M. TOMITORI. "FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS." Le Journal de Physique Colloques 49, no. C6 (November 1988): C6–55—C6–59. http://dx.doi.org/10.1051/jphyscol:1988610.

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Yamamoto, M. "Atom-Scale Characterization of Ordered Alloys with Atom-Probe Field-Ion Microscope." Materials Science Forum 304-306 (February 1999): 139–46. http://dx.doi.org/10.4028/www.scientific.net/msf.304-306.139.

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Carmichael, Stephen W. "How Much Force Does it Take to Move an Atom on a Surface?" Microscopy Today 16, no. 4 (July 2008): 3–5. http://dx.doi.org/10.1017/s1551929500059708.

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It was demonstrated 18 years ago that atoms could be manipulated, one at a time, on a surface. Yet only recently has the force required to move an atom been determined. Markus Ternes, Christopher Lutz, Cyrus Hirjibehedin, Franz Giessibl, and Andreas Heinrich, in a technical tour de force, have engineered a microscope that incorporates features of the scanning tunneling microscope (STM) and atomic force microscope (AFM) to accurately quantitate the lateral and vertical forces needed to move a single atom on a surface.
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Sato, Yuta, Takeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, Takeshi Tomita, Toshikatsu Kaneyama, Yukihito Kondo, and Kazutomo Suenaga. "Innovative electron microscope for light-element atom visualization." Synthesiology 4, no. 3 (2011): 166–75. http://dx.doi.org/10.5571/synth.4.166.

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SATO, Yuta, Takeo SASAKI, Hidetaka SAWADA, Fumio HOSOKAWA, Takeshi TOMITA, Toshikatsu KANEYAMA, Yukihito KONDO, and Kazutomo SUENAGA. "Innovative electron microscope for light-element atom visualization." Synthesiology English edition 4, no. 3 (2012): 172–82. http://dx.doi.org/10.5571/syntheng.4.172.

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Dissertations / Theses on the topic "Atom-microscope"

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Babonis, Gregory S. "Low Temperature Scanning Tunneling Microscope for Single Atom Manipulation." Ohio University / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1058475483.

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Burtzlaff, Andreas [Verfasser]. "Shot noise measurements at single atom contacts in a low-temperature scanning tunnelling microscope / Andreas Burtzlaff." Kiel : Universitätsbibliothek Kiel, 2017. http://d-nb.info/1136903283/34.

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Clark, Kendal. "Ultra High Vacuum Low Temperature Scanning Tunneling Microscope for Single Atom Manipulation on Molecular Beam Epitaxy Grown Samples." Ohio University / OhioLINK, 2005. http://www.ohiolink.edu/etd/view.cgi?ohiou1125611713.

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Deshpande, Aparna. "Atomistic interactions in STM atom manipulation." Ohio : Ohio University, 2007. http://www.ohiolink.edu/etd/view.cgi?ohiou169849272.

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Caulfield, John Christopher. "Transition-metal dichalcogenides and the scanning tunnelling microscope : the creation and imaging of vacancy defects." Thesis, University College London (University of London), 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.286294.

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Ma, Ruichao. "Engineered potentials and dynamics of ultracold quantum gases under the microscope." Thesis, Harvard University, 2014. http://dissertations.umi.com/gsas.harvard:11368.

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In this thesis, I present experiments on making and probing strongly correlated gases of ultracold atoms in an optical lattice with engineered potentials and dynamics. The quantum gas microscope first developed in our lab enables single-site resolution imaging and manipulation of atoms in a two-dimensional lattice, offering an ideal platform for quantum simulation of condensed matter systems. Here we demonstrate our abilities to generate optical potential with high precision and high resolution, and engineer coherent dynamics using photon assisted tunneling. We also create a system of bilayer quantum gases that brings new imaging capabilities and extends the possible range of our quantum simulation.
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Barr, Matthew Gordon. "Imaging with atoms: aspects of scanning helium microscopy." Thesis, 2016. http://hdl.handle.net/1959.13/1312654.

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Research Doctorate - Doctor of Philosophy (PhD)
Microscopy is an essential tool for the discovery, application and fabrication of new materials, structures and devices. However, there exists a range of systems that are traditionally challenging to image, such as transparent, weakly-bonded, insulating, very rough and magnetic samples. Furthermore, many of these systems (such as organic thin films, biological specimens and delicate adsorbate structures) suffer degradation under the energetic photons, electrons or ions of conventional microscopies. Neutral helium is the ideal probe of such surfaces, owing to its low mass, lack of net charge or spin, and short de Broglie wavelength. Moreover, the low kinetic energy of thermal helium atoms (of the order meV) means that these probe particles are unambiguously surface sensitive, scattering from the outermost electron corrugation of the sample. The advantages of helium atoms as a surface probe have already been demonstrated in the established technique of Helium Atom Scattering (HAS). Nevertheless, HAS is limited by its lack of spatial resolution, hence limiting its application to relatively simple, heterogeneous systems. The work presented in this thesis describes the realisation of a fundamentally new imaging technique based on HAS. This instrument, in which a fine beam of helium is rastered over a sample, operates in a similar configuration to a scanning electron microscope and hence is referred to as a Scanning Helium Microscope or SHeM. Chapter 1 examines the motivations for constructing a SHeM, and then provides an assessment of the technologies required to demonstrate proof of concept of the technique. In Chapter 2, an appropriate measure of image contrast is provided, alongside a detailed discussion of the potential mechanisms by which SHeM image contrast could be generated. Thereafter, a semi-empirical gas flow model of SHeM performance is outlined, providing an avenue towards the construction of a practicable instrument. Chapter 3 commences with a comprehensive description of the design, construction and characterisation of the first-generation SHeM. This prototype instrument was then used to image a range of systems, demonstrating contrast that arises predominantly from the surface topology of the sample. To address the primary weaknesses of the prototype instrument, a second-generation SHeM was then constructed, with an aim towards the observation of weaker, more exotic contrast mechanisms. The design, construction and characterisation of the second instrument is outlined in Chapter 4, whilst the subsequent contrast investigations are detailed in Chapter 5. Indeed, the work reported in Chapter 5 constitutes the first demonstration of contrast arising from the elemental composition of the sample under investigation by SHeM. Furthermore, this chemical contrast is shown to be inelastic in nature and apparent under the oxide or physisorbed layers present in ex situ prepared samples. Chapter 6 then comprises a discussion of the design pathways to the realisation of an improved, third-generation SHeM. These discussions are accompanied by a number of pilot studies and simulations, which show that a higher resolution, next-generation SHeM is readily achievable using current technology. Finally, Chapter 7 concludes with an outlook for the future development and application of scanning helium microscopy.
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Chang, Che-Cheng, and 張哲誠. "Low-Energy Electron Point Projection Microscope: Noble-Metal Covered W(111) Single-atom Emitters." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/70990269997963526649.

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博士
國立清華大學
材料科學工程學系
97
本論文是利用自製低能量電子點投影顯微儀研究金字塔型單原子針的電子場發射同調特性，以及以同調電子束對單管奈米碳管進行成像。首先，利用傳統場發射鎢針以及單原子針，在298 K與90 K進行儀器的測試。研究結果顯示，儀器在不同的溫度下都可穩定操作。另外，在實驗過程中亦發現單原子針的同調性，在不同的溫度下都比傳統場發射鎢針的同調性來的高。由單原子針所發射的電子束具有張角小，能量分佈小，高亮度以及全同調性等性質。由可見度及K factor嘗試量化單原子針的同調長度，以及發射源的有效尺度。 在單管奈米碳管成像的研究中發現，單原子針與樣品在不同的距離下，干涉條紋會顯現出不同的明暗與寬度。經由理論計算結果得知，單原子針與樣品在10微米的距離外，干涉條紋會受到樣品本身的相位影響；反之在5微米的距離內，干涉條紋則會受到電場在樣品上產生的感應電荷影響。因此，在詮釋干涉條紋影像時必須要考慮到樣品本身的相位與電場在樣品上產生的感應電荷影響。
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O'Donnell, Kane. "Field ionization detection for atom microscopy." Thesis, 2010. http://hdl.handle.net/1959.13/802939.

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Research Doctorate - Doctor of Philosophy (PhD)
Helium has the highest ionization energy of any species and is as a consequence difficult to detect by conventional means. On the other hand, it is the ideal surface probe, having no net charge or spin, a low mass and a short de Broglie wavelength. Therefore, there exists a strong incentive to develop a microscopy technique based on helium atom scattering. The purpose of this thesis is to investigate in detail how an efficient helium detector might be developed using the phenomenon of field ionization, an ionization method that relies on quantum mechanical tunneling rather than the more conventional electron impact ionization techniques. In particular, the work focusses on the potential use of a novel nanomaterial, carbon nanotubes, as the source of the high electric fields required for field ionization detection. In Chapter 1 we review the history of field ionization research and the properties and synthesis methods for carbon nanotubes. Chapter 2 describes the experimental apparatus and procedures used for the present research, and Chapter 3 introduces the theoretical framework and background for field ionization. In Chapter 4, the prototypical field ionization system is considered from a detector viewpoint. The work demonstrates that existing theory is not sufficiently quantitative for describing a field ionization detector and therefore a semi-empirical theory is advanced for that purpose. Chapter 5 considers the problem of nanotube field enhancement in detail using computational methods, leading to a complete description of the maximum field enhancement of a nanotube array based on the four fundamental array parameters. Efforts to synthesize carbon nanotubes in the Newcastle plasma-enhanced chemical vapor deposition system are described in Chapter 6. Several procedures are developed for reproducible growth of nanotube films and the chemical vapor deposition system is characterized with single parameter studies. Chapter 7 presents the results of electron field emission and helium field ionization experiments carried out using the grown nanotube films. We demonstrate for the first time the field ionization of helium using a planar film of carbon nanotubes. Finally, we conclude the investigation of field ionization detection in Chapter 8 with a discussion on how such a detection method integrates into a helium microscope and in particular we detail the design and initial calculations for the planned Newcastle helium microscope.
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O'Donnell, Kane. "Field ionization detection for neutral atom microscopy." 2010. http://hdl.handle.net/1959.13/802939.

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Research Doctorate - Doctor of Philosophy (PhD)
Helium has the highest ionization energy of any species and is as a consequence difficult to detect by conventional means. On the other hand, it is the ideal surface probe, having no net charge or spin, a low mass and a short de Broglie wavelength. Therefore, there exists a strong incentive to develop a microscopy technique based on helium atom scattering. The purpose of this thesis is to investigate in detail how an efficient helium detector might be developed using the phenomenon of field ionization, an ionization method that relies on quantum mechanical tunneling rather than the more conventional electron impact ionization techniques. In particular, the work focusses on the potential use of a novel nanomaterial, carbon nanotubes, as the source of the high electric fields required for field ionization detection. In Chapter 1 we review the history of field ionization research and the properties and synthesis methods for carbon nanotubes. Chapter 2 describes the experimental apparatus and procedures used for the present research, and Chapter 3 introduces the theoretical framework and background for field ionization. In Chapter 4, the prototypical field ionization system is considered from a detector viewpoint. The work demonstrates that existing theory is not sufficiently quantitative for describing a field ionization detector and therefore a semi-empirical theory is advanced for that purpose. Chapter 5 considers the problem of nanotube field enhancement in detail using computational methods, leading to a complete description of the maximum field enhancement of a nanotube array based on the four fundamental array parameters. Efforts to synthesize carbon nanotubes in the Newcastle plasma-enhanced chemical vapor deposition system are described in Chapter 6. Several procedures are developed for reproducible growth of nanotube films and the chemical vapor deposition system is characterized with single parameter studies. Chapter 7 presents the results of electron field emission and helium field ionization experiments carried out using the grown nanotube films. We demonstrate for the first time the field ionization of helium using a planar film of carbon nanotubes. Finally, we conclude the investigation of field ionization detection in Chapter 8 with a discussion on how such a detection method integrates into a helium microscope and in particular we detail the design and initial calculations for the planned Newcastle helium microscope.
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Books on the topic "Atom-microscope"

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Walck, Scott Douglas. Depth profiling of low energy ions implanted into metals using the field ion microscope/imaging atom probe. 1986.

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Binh, Vu Thien. Electron cold sources: Nanotechnology contribution to field emitters. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.21.

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This article reviews recent advances in field emission cathodes and their applications, focusing on a number of possibilities emerging from the field of nanotechnology. It begins with an overview of the driving forces for the evolution of cold cathodes, laying emphasis on their fundamental characteristics and industrial applications as well as the bottlenecks of metallic field emitters. It then considers single-atom emitters, followed by different examples where the advent of nanotechnology has contributed towards improving new cold cathodes. It also discusses the Fresnel projection microscope and the microgun, a route to the microcolumn approach which is associated with the nanotip; a host of material issues for field emitters, taking into account carbon nanocompounds; carbon-nanotube field emitters; and carbon-nanopearl field emitters. The article concludes with an evaluation of the applications and uses of carbon nanocompounds, carbon nanotubes and carbon nanopearls as cold cathodes.
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Book chapters on the topic "Atom-microscope"

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Tomitori, Masahiko. "Atom Probe Field Ion Microscope." In Compendium of Surface and Interface Analysis, 27–32. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_5.

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Eigler, D. M. "Atom Manipulation with the Scanning Tunneling Microscope." In Atomic and Nanometer-Scale Modification of Materials: Fundamentals and Applications, 1–10. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-2024-1_1.

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Avouris, Phaedon, and In-Whan Lyo. "Studying Surface Chemistry Atom-by-Atom Using the Scanning Tunneling Microscope." In Chemistry and Physics of Solid Surfaces VIII, 371–93. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-75762-4_16.

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Lang, N. D. "Theory of Single-Atom Imaging in the Scanning Tunnelling Microscope." In Solvay Conference on Surface Science, 216–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/978-3-642-74218-7_18.

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Lang, N. D. "Theory of Single-Atom lmaging in the Scanning Tunneling Microscope." In Scanning Tunneling Microscopy, 75–78. Dordrecht: Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_7.

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Huang, D., H. Uchida, and M. Aono. "Atomcraft Technology: Single-Atom Deposition and Re-Removal by the Scanning Tunneling Microscope." In Nanostructures and Quantum Effects, 315–17. Berlin, Heidelberg: Springer Berlin Heidelberg, 1994. http://dx.doi.org/10.1007/978-3-642-79232-8_44.

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Tsong, T. T., and M. Ahmad. "Atom-Probe and Field Ion Microscope Studies of the Atomic Structure and Composition of Overlayers on Metal Surfaces." In The Structure of Surfaces, 389–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-642-82493-7_62.

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Zikovsky, Janik, Mark H. Salomons, Stanislav A. Dogel, and Robert A. Wolkow. "Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope." In Advances in Atom and Single Molecule Machines, 167–79. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-28172-3_13.

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Cherepanov, Vasily, Evgeny Zubkov, Hubertus Junker, Stefan Korte, Marcus Blab, Peter Coenen, and Bert Voigtländer. "Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm." In Advances in Atom and Single Molecule Machines, 9–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-28172-3_2.

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Mee, Nicholas. "Animated Atom Boy." In The Cosmic Mystery Tour, 39–45. Oxford University Press, 2019. http://dx.doi.org/10.1093/oso/9780198831860.003.0006.

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The concept of the atom dates back to the speculations of Democritus and other Ancient Greek philosophers, but it was only in modern times that atoms were shown to exist and physicists began to investigate their structure. Rutherford’s team in Manchester discovered the atomic nucleus and Rutherford proposed that atoms consist of a tiny positively charged nucleus surrounded by negatively charged orbiting electrons. Rutherford and his colleagues went on to discover the nucleus is composed of protons and neutrons. It is now possible to produce pictures of atoms using the scanning tunnelling microscope (STM) invented by Binnig and Rohrer.
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Conference papers on the topic "Atom-microscope"

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Nishikawa, Osamu. "Atom-Probe and Scanning Tunneling Microscope Studies of Surfaces and Interfaces." In 1987 Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 1987. http://dx.doi.org/10.7567/ssdm.1987.s-iii-1.

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Lawrence, D. F., R. M. Ulfig, D. J. Larson, D. P. Olson, D. A. Reinhard, I. Y. Martin, S. Strennen, and P. H. Clifton. "Routine Device-Level Atom Probe Analysis." In ISTFA 2014. ASM International, 2014. http://dx.doi.org/10.31399/asm.cp.istfa2014p0019.

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Abstract Continuing advances in Atom Probe Tomography and Focused Ion Beam Scanning Electron Microscope technologies along with the development of new specimen preparation approaches have resulted in reliable methods for acquiring 3D subnanometer compositional data from device structures. The routine procedure is demonstrated here by the analysis of the silicon-germanium source-drain region of a field effect transistor from a de-packaged off-the-shelf 28 nm design rule graphics chip. The center of the silicon-germanium sourcedrain region was found to have approximately 180 ppm of boron and the silicide contact was found to contain both titanium and platinum.
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Ju, Yang, Hiroyuki Sato, and Hitoshi Soyama. "Fabrication of the Tip of GaAs Microwave Probe by Wet Etching." In ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73140.

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In order to develop a new structure microwave probe, the fabrication of micro tip on the GaAs wafer surface was studied. The effects of the shape, direction, and size of etching mask to the fabricated tip were discussed in details. By finding the most suitable etching conditions, a tip having 7 μm high, 1.4 aspect ratio, and 50 nm curvature radius was formed. The experimental result indicates that the tip having the similar capability to sense the surface topography of materials as that of commercial atom force microscope (AFM) probe.
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Nakanishi, Takahiro, Ken Suzuki, and Hideo Miura. "Variation of the Strength of Grains and Grain Boundaries Caused by the Fluctuation of Their Crystallinity." In ASME 2016 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/imece2016-67557.

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The variation of the strength of a grain and a grain boundary was measured by a micro tensile test system fabricated in an electron microscope. A micro-scale beam structure was fabricated from a single-crystalline silicon wafer and a fine nano-scale sample cut from a thin film using a focused ion beam was attached to the center of the beam by deposition of tungsten in the microscope. The other end was attached to a micro probe similarly. Finally, the micro probe was activated to pull the sample and the deformation of the sample was observed by a scanning electron microscope. The fracture strength of a bicrystal sample was measured by detecting the deflection of the beam at the breakage of the sample. The crystallinity of both a grain and a grain boundary was quantitatively evaluated by using electron back-scatter diffraction analysis from the viewpoint of the change of the order of atom arrangement in them. It was found that the strength of a grain and a grain boundary varied clearly depending on their crystallinity. In addition, there was a critical value of the crystallinity at which the fracture mode of a polycrystalline material changed from intergranular fracture to transgranular fracture.
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Jaculbia, Rafael B., Hiroshi Imada, Kuniyuki Miwa, Takeshi Iwasa, Masato Takenaka, Bo Yang, Emiko Kazuma, Norihiko Hayazawa, Tetsuya Taketsugu, and Yousoo Kim. "Vibrational symmetry of a single molecule revealed by tip-enhanced Raman spectroscopy." In JSAP-OSA Joint Symposia. Washington, D.C.: Optica Publishing Group, 2019. http://dx.doi.org/10.1364/jsap.2019.18p_e208_9.

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The scanning tunneling microscope (STM) is a powerful tool for studying various nanoscale materials with atomic scale spatial resolution. Despite the atom scale spatial sensitivity however, the STM lacks the chemical sensitivity crucial to the investigation of nanomaterials. Raman spectroscopy on the other hand has a very strong chemical sensitivity but its spatial resolution is highly restricted by the diffraction limit of light allowing only about several hundreds of nanometer resolution. Combining these two powerful experiments into a technique called STM-tip enhanced Raman spectroscopy (STM-TERS) alleviates the limitation of STM and Raman allowing for simultaneous subnanometer spatial resolution and high chemical sensitivity.
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Conley, W. G., A. Raman, and C. M. Krousgrill. "Nonlinear Dynamics in Tomlinson’s Model of Atomic Scale Friction." In ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-42638.

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This work presents a detailed computational and analytical investigation of Tomlinson’s model for atomic scale dry friction. The model describes a prototypical mechanism of energy dissipation from an atom dragged across a periodic atomic lattice and is often used to model the dynamics of friction force microscope tips. While a number of articles in the literature utilize this model, there is little work in the literature that utilizes the computational and theoretical tools of modern nonlinear dynamics in analyzing this model. This research demonstrates that the use of computational nonlinear dynamics techniques provides a deep insight into the mechanisms of chaotic stick-slip phenomena and the speed dependence of frictional forces of atomic scale friction.
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Bai, Bing, Hanxiao Wang, Changyi Zhang, Zhenfeng Tong, and Wen Yang. "Effect of Element Segregation on Thermal Aging Behavior of 17-4PH Martensitic Stainless Steel for Nuclear Power Plant." In 2017 25th International Conference on Nuclear Engineering. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/icone25-66977.

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The valve stem used in the main steam system of nuclear power plant is usually 17-4PH martensitic stainless steel. When it served in 300 C° for a long time, the thermal aging embrittlement of valve stem will be significant, with the performance of the ductile brittle transition temperature (DBTT) and the hardness increased, the upper stage energy (USE) decreased. It will seriously affect the safety and economic operation of nuclear power plant (NPP). It is important to study the thermal aging effect of the 17-4PH steel for safe operation of nuclear power plant. In this work, Three-Dimensional Atom Probe (3DAP), Energy Dispersive X-Ray Spectroscopy (EDX), Scanning Electron Microscope (SEM) and Optical Microscope (OM) are used to analyze the element distribution in 17-4PH steel. The results show that lath martensite will grow significantly under high temperature for a long time. More δ-ferrite will be found between lath martensite, and some carbide aggregates at its interface. In addition, the number density of Cu clusters in the17-4PH steel is increased. It is found that Ni and Mn have obvious segregation with the Cu cluster.
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Zhang, Y. J., Y. Z. Hu, H. Wang, P. Li, and L. Huang. "Manufacturing Structures in Nanometer Scale by Nanomanipulation." In ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-41262.

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Abstract:
Nanomanipulation based on atomic force microscope is one of the key technologies for nanomanufacturing. It plays important role in practical fabrication of nanodevices. In this paper, nanomanipulation method is used to build a structure in nanometer scale. A basic pattern made up of single-wall carbon nanotube on silicon substrate was successfully obtained by sophisticated manipulations, and thus provides an effective way to make more complicated nanostructures. In the meantime, experiments results also show a promising prospect to build future nanodevices step by step using this technique. Carbon nanotubes are selected as the raw materials for nanofabrication due to their excellent mechanical and electrical properties, which are the most suitable for the application in building nano-electromechanical systems (NEMS). In addition, the major failure modes of nanomanipulation experiments were also analyzed by FED-SEM observation. The main factors affecting the final manipulation results, wear and pollution of tips, and their corresponding relations between tips and experiment results were analyzed. Furthermore, the preventive measurements were proposed in order to get better results. A new method for measuring manipulating forces was explored in the experiments based on a commercial AFM (Atom Force Microscope). Lateral forces while manipulating and cutting a single-walled carbon nanotube was successfully measured that providing valuable information for quantitative research on nanomechanics.
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9

Landefeld, Andreas. "An upgrade on the site-specific FIB preparation of atom probe tips using a combination of STEM and TKD inside a dual beam microscope." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.728.

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10

Wanderka, N., A. Bakai, C. Abromeit, D. Isheim, and D. Seidman. "A Transmission Electron Microscope and Atom-probe Tomographic Study of the Microstructure of a Ni-Mo Based "Hastelloy" Alloy after 10 MeV Electron Irradiation." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335340.

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Reports on the topic "Atom-microscope"

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Brenner, S. S. Microchemical analysis of intermetallic alloys using the field-ion microscope atom probe. Office of Scientific and Technical Information (OSTI), September 1991. http://dx.doi.org/10.2172/6112606.

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2

Brenner, S. S. Microchemical analysis of intermetallic alloys using the field-ion microscope atom probe. Final report. Office of Scientific and Technical Information (OSTI), September 1991. http://dx.doi.org/10.2172/10106463.

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Journal articles
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