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Journal articles on the topic 'Atom-microscope'

Author: Grafiati
Published: 4 June 2021
Last updated: 31 January 2023

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1

Degen, Christian L., and Jonathan P. Home. "Cold-atom microscope shapes up." Nature Nanotechnology 6, no. 7 (July 2011): 399–400. http://dx.doi.org/10.1038/nnano.2011.107.

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2

Clauser, John F., and Shifang Li. "‘‘Heisenberg microscope’’ decoherence atom interferometry." Physical Review A 50, no. 3 (September 1, 1994): 2430–33. http://dx.doi.org/10.1103/physreva.50.2430.

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3

Kellogg, G. L. "Atom-probe microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 438–39. http://dx.doi.org/10.1017/s042482010010425x.

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The atom-probe field ion microscope is a highly-sensitive, time-of-flight mass spectrometer which is used to identify individual atoms or groups of atoms that appear in a field ion microscope image. Under ideal conditions the atom-probe can yield the surface and bulk composition of a solid sample with true atomic spatial and depth resolution. Since its development in the late 1960's, the atom-probe has been used to study a variety of problems in the areas of metallurgy, surface science, and materials science. This review focuses on operational principles of the atom-probe and selected applications carried out in the author's laboratory.The most widely-used atom-probe follows the original design developed by Müller, Panitz and McLane. In this instrument a small probe-hole is placed in the viewing screen of a field ion microscope. The image is adjusted such that the atom or atoms of interest are in alignment with the probe hole.
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4

Murphy, Tom. "IBM Scientists Build New Atom Imaging Microscope." JOM 37, no. 12 (December 1985): 56. http://dx.doi.org/10.1007/bf03259974.

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5

Grigorescu, M., P. Budau, and N. Carjan. "Atom oscillations in the scanning tunneling microscope." Physical Review B 55, no. 11 (March 15, 1997): 7244–48. http://dx.doi.org/10.1103/physrevb.55.7244.

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6

NISHIKAWA, O., K. HATTORI, F. KATSUKI, and M. TOMITORI. "FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS." Le Journal de Physique Colloques 49, no. C6 (November 1988): C6–55—C6–59. http://dx.doi.org/10.1051/jphyscol:1988610.

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7

Yamamoto, M. "Atom-Scale Characterization of Ordered Alloys with Atom-Probe Field-Ion Microscope." Materials Science Forum 304-306 (February 1999): 139–46. http://dx.doi.org/10.4028/www.scientific.net/msf.304-306.139.

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8

Carmichael, Stephen W. "How Much Force Does it Take to Move an Atom on a Surface?" Microscopy Today 16, no. 4 (July 2008): 3–5. http://dx.doi.org/10.1017/s1551929500059708.

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It was demonstrated 18 years ago that atoms could be manipulated, one at a time, on a surface. Yet only recently has the force required to move an atom been determined. Markus Ternes, Christopher Lutz, Cyrus Hirjibehedin, Franz Giessibl, and Andreas Heinrich, in a technical tour de force, have engineered a microscope that incorporates features of the scanning tunneling microscope (STM) and atomic force microscope (AFM) to accurately quantitate the lateral and vertical forces needed to move a single atom on a surface.
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9

Sato, Yuta, Takeo Sasaki, Hidetaka Sawada, Fumio Hosokawa, Takeshi Tomita, Toshikatsu Kaneyama, Yukihito Kondo, and Kazutomo Suenaga. "Innovative electron microscope for light-element atom visualization." Synthesiology 4, no. 3 (2011): 166–75. http://dx.doi.org/10.5571/synth.4.166.

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10

SATO, Yuta, Takeo SASAKI, Hidetaka SAWADA, Fumio HOSOKAWA, Takeshi TOMITA, Toshikatsu KANEYAMA, Yukihito KONDO, and Kazutomo SUENAGA. "Innovative electron microscope for light-element atom visualization." Synthesiology English edition 4, no. 3 (2012): 172–82. http://dx.doi.org/10.5571/syntheng.4.172.

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11

Slaughter, D. S., L. R. Hargreaves, M. A. Stevenson, A. Dorn, J. P. Sullivan, J. C. Lower, S. J. Buckman, and B. Lohmann. "A reaction microscope for positron – atom ionisation studies." Journal of Physics: Conference Series 194, no. 7 (November 1, 2009): 072002. http://dx.doi.org/10.1088/1742-6596/194/7/072002.

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12

Grigorescu, M. "Heating-assisted atom transfer inthe scanning tunneling microscope." Canadian Journal of Physics 76, no. 12 (1998): 911–20. http://dx.doi.org/10.1139/cjp-76-12-911.

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13

Kröger, J., N. Néel, A. Sperl, Y. F. Wang, and R. Berndt. "Single-atom contacts with a scanning tunnelling microscope." New Journal of Physics 11, no. 12 (December 11, 2009): 125006. http://dx.doi.org/10.1088/1367-2630/11/12/125006.

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14

Clancy, J. P. "HRTEM: White-atom images versus black-atom images." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 746–47. http://dx.doi.org/10.1017/s0424820100171468.

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The observed intensity under phase-contrast imaging conditions is a complicated function of the microscope and the thin solid. The important parameters of the microscope are the beam divergence, the energy spread of the fast electrons, and the objective lens excitation. From these parameters, a transfer function is defined that operates on the scattered wavefunction. The important parameters of the thin solid are the thickness, the atomic coordinates, and the scattering strength of the atoms. These parameters define the phase and amplitude of the Bloch waves excited in the crystal. As a result of these complexities, image interpretation is quite often problematic. Moreover, for those models that do accurately predict the experimental intensity, uniqueness is still in question. Since the indicated parameters limit the resolution capability of the microscope and this limit can not be overcome, the task at hand is to exploit the consequences of these parameters.There are two imaging conditions that produce interpretable data for periodic crystals: those where the intensity maxima correspond to atomic columns (white-atom images), and those where the intensity maxima correspond to atomic tunnels (black-atom images.)
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15

Miller, M. K. "Spatial Resolution in the Atom Probe Field Ion Microscope." Microscopy and Microanalysis 3, S2 (August 1997): 1189–90. http://dx.doi.org/10.1017/s1431927600012836.

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The atom probe field ion microscope can resolve and identify individual atoms. This ability is demonstrated in a pair of field ion micrographs of an Ni3Al specimen, Fig. 1, in which the individual atoms on the close packed (111) plane are clearly resolved. Comparison of these two micrographs reveals that an individual atom was field evaporated between the micrographs. Due to the hemispherical nature of the specimen, the ability to resolve this two dimensional atomic arrangement is only possible on low index plane facets. The spatial resolution in field ion images is determined by a number of factors including specimen temperature, material, microstructural features, specimen geometry, and crystallographic location.The spatial resolution of the data obtained in atom probe and 3 dimensional atom probe compositional analyses can be evaluated with the use of field evaporation or field desorption images. The field evaporation images are formed from the surface atoms with the use of a single atom sensitive detector whereas the field ion image is formed from the projection of a continuous supply of ionized image gas atoms.
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16

Kellogg, G. L. "The Atom-Probe Field Ion Microscope: Applications in Surface M Science." Microscopy and Microanalysis 4, S2 (July 1998): 110–11. http://dx.doi.org/10.1017/s1431927600020675.

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The ability to locate an individual atom on a surface, remove it in a controlled fashion, and determine its chemical identity makes the atom-probe field-ion microscope an extremely powerful tool for the analysis of solid surfaces. By itself, the field ion microscope has contributed significantly to our understanding of surface atomic structure, single-atom surface diffusion, and the detailed interactions that occur between atoms and defects on surfaces.1 When used in combination with the atom-probe mass spectrometer there have been several additional areas within the traditional definition of "surface science" where the chemical identification capability of the atom probe has led to new insights. In this paper these applications are reviewed focusing on two specific areas: surface segregation in intermetallic alloys and chemical reactions on metal surfaces.The equilibrium distribution of component species in the near surface region of solid solution alloy may be different from the distribution in the bulk.
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17

Cerezo, A., P. J. Warren, and G. D. W. Smith. "The Position-Sensitive Atom Probe - A New Dimension In Atom Probe Analysis." Microscopy and Microanalysis 4, S2 (July 1998): 76–77. http://dx.doi.org/10.1017/s143192760002050x.

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A possible description of the ideal microscope would be an instrument which was able to reconstruct, with atomic resolution and in 3 dimensions, both the position and the chemical identity of atoms in a material. The 3-dimensional atom probe (3DAP) is the technique which comes closest to this goal.The position-sensitive atom probe (PoSAP) was the first 3DAP. In the PoSAP, the high magnification of the field-ion microscope is combined with the time-of-flight mass spectroscopy of the atom probe, and position-sensitive detection based on a wedge-and-strip anode, Fig.1. This combination allows the chemical identity and the original surface position to be determined for single atoms removed from a field-ion specimen by pulsed field evaporation. Continued field evaporation and analysis builds up a 3D image of the distribution of all the atomic species originally present in the material, Fig. 2.
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18

Kelly, T. F., P. P. Camus, J. J. McCarthy, D. J. Larson, L. M. Holzman, and N. A. Zreiba. "Prospects for compositional imaging with the atom probe microscope." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1616–17. http://dx.doi.org/10.1017/s0424820100132716.

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For the purposes of analytical characterization on the atomic scale, the ultimate instrument would identify every atom in a sample and determine its position with atomic-scale resolution. The recently developed positionsensitive atom probe (POSAP) comes as close as yet possible to this goal. This is the only experimental technique which can analyze the three-dimensional (3D) composition of a sample on a sub-nanometer scale.By adding a position-sensitive detector (PSD) to a conventional atom probe/field ion microscope, a 3D data structure with position-correlated compositional analysis is acquired. The 3D data are stored on a computer and may be examined for structural and compositional information at an atomic level. Note that, because it uses time-of-flight mass spectroscopy, all elements and their isotopes are detected in this way with equal proficiency. Usually, the evaporation rate is mediated by pulsing the field on the specimen. This approach, however, severely limits the data acquisition rate (about 1 atom per second) and mass resolution (about 1 part in 30).
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19

Morita, Seizo, Noriaki Oyabu, Ryuji Nishi, Kenji Okamoto, Masayuki Abe, Óscar Custance, Insook Yi, Yoshihide Seino, and Yasuhiro Sugawara. "Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method." e-Journal of Surface Science and Nanotechnology 1 (2003): 158–70. http://dx.doi.org/10.1380/ejssnt.2003.158.

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20

Meyer, Gerhard, Ludwig Bartels, Sven Zöphel, Erdmuth Henze, and Karl-Heinz Rieder. "Controlled Atom by Atom Restructuring of a Metal Surface with the Scanning Tunneling Microscope." Physical Review Letters 78, no. 8 (February 24, 1997): 1512–15. http://dx.doi.org/10.1103/physrevlett.78.1512.

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21

Morita, S. "Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope." Journal of Electron Microscopy 53, no. 2 (April 1, 2004): 163–68. http://dx.doi.org/10.1093/jmicro/53.2.163.

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22

Shi, Zhen Xue, Jia Rong Li, Shi Zhong Liu, and Jin Qian Zhao. "Microstructures of Low Angle Boundaries of the Second Generation Single Crystal Superalloy DD6." Advanced Materials Research 284-286 (July 2011): 1584–87. http://dx.doi.org/10.4028/www.scientific.net/amr.284-286.1584.

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The specimens of low angle boundaries were machined from the second generation single crystal superalloy DD6 blades. The microstructures of low angle boundaries (LAB) were investigated from three scales of dendrite, γ′ phase and atom with optical microscopy (OM), scanning electron microscope (SEM), transition electron microscope (TEM) and high resolution transmission electrion microscopy (HREM). The results showed that on the dendrite scale LAB is interdendrite district formed by three dimensional curved face between the adjacent dendrites. On the γ′ phase scale LAB is composed by a thin layer γ phase and its bilateral imperfect cube γ′ phase. On the atom scale LAB is made up of dislocations within several atom thickness.
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23

Kellogg, G. L., and P. R. Schwoebel. "Field ion microscope investigations of atomic processes at surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 228–29. http://dx.doi.org/10.1017/s0424820100153117.

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Although no longer unique in its ability to resolve individual single atoms on surfaces, the field ion microscope remains a powerful tool for the quantitative characterization of atomic processes on single-crystal surfaces. Investigations of single-atom surface diffusion, adatom-adatom interactions, surface reconstructions, cluster nucleation and growth, and a variety of surface chemical reactions have provided new insights to the atomic nature of surfaces. Moreover, the ability to determine the chemical identity of selected atoms seen in the field ion microscope image by atom-probe mass spectroscopy has increased or even changed our understanding of solid-state-reaction processes such as ordering, clustering, precipitation and segregation in alloys. This presentation focuses on the operational principles of the field-ion microscope and atom-probe mass spectrometer and some very recent applications of the field ion microscope to the nucleation and growth of metal clusters on metal surfaces.The structure assumed by clusters of atoms on a single-crystal surface yields fundamental information on the adatom-adatom interactions important in crystal growth. It was discovered in previous investigations with the field ion microscope that, contrary to intuition, the initial structure of clusters of Pt, Pd, Ir and Ni atoms on W(110) is a linear chain oriented in the <111> direction of the substrate.
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24

Gadgil, V. J., and B. H. Kolster. "Microanalysis of Welds Using Field Ion Microscope/Atom Probe." Polymer-Plastics Technology and Engineering 33, no. 6 (November 1994): 691–712. http://dx.doi.org/10.1080/03602559408013103.

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25

Bhatti, A. R., B. Cantor, D. S. Joag, and G. D. W. Smith. "Field-ion microscope atom probe studies of metallic glasses." Philosophical Magazine B 52, no. 4 (October 1985): L63—L69. http://dx.doi.org/10.1080/13642818508238926.

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26

Avouris, Phaedon. "Atom-resolved surface chemistry using the scanning tunneling microscope." Journal of Physical Chemistry 94, no. 6 (March 1990): 2246–56. http://dx.doi.org/10.1021/j100369a011.

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27

Gao, Shiwu, M. Persson, and B. I. Lundqvist. "Theory of atom transfer with a scanning tunneling microscope." Physical Review B 55, no. 7 (February 15, 1997): 4825–36. http://dx.doi.org/10.1103/physrevb.55.4825.

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28

Panitz, John A. "My Life With Erwin: The Beginning of an Atom-Probe Legacy." Microscopy and Microanalysis 25, no. 2 (April 2019): 274–79. http://dx.doi.org/10.1017/s1431927618015313.

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AbstractThe atom-probe field ion microscope was introduced in 1967 at the 14th Field Emission Symposium held at the National Bureau of Standards (now, NIST) in Gaithersburg, Maryland. The atom-probe field ion microscope was, and remains, the only instrument capable of determining “the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. The development of the atom-probe is a story of an instrument that one National Science Foundation (NSF) reviewer called “impossible because single atoms could not be detected”. It is also a story of my life with Erwin Wilhelm Müller as his graduate student in the Field Emission Laboratory at the Pennsylvania State University in the late 1960s and his strong and volatile personality, perhaps fostered by his pedigree as Gustav Hertz’s student in the Berlin of the 1930s. It is the story that has defined by scientific career.
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29

Tsong, Tien T., Chong-lin Chen, and Jiang Liu. "Atom-probe field ion microscope analysis of surfaces of materials." Journal of Materials Research 4, no. 6 (December 1989): 1549–59. http://dx.doi.org/10.1557/jmr.1989.1549.

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Our recent applications of the atom-probe field ion microscope to the study of physics and chemistry of materials at the atomic level are summarized. The materials applicability of field ion microscopy has recently been extended to silicon, silicide, graphite, high Tc superconductors, and other materials. Atom-probe field ion microscopy has been used for atomic layer by atomic layer chemical analysis of surfaces in alloy and impurity segregations, for analyzing the compositional changes across metal-semiconductor interfaces, and for studying formation of cluster ions in laser stimulated field desorption. The energetics of atoms in solids and on surfaces can be studied by a direct kinetic energy analysis of field desorbed ions using a high resolution pulsed-laser time-of-flight atom-probe and by other field ion microscope measurements. The site specific binding energy of surface atoms can be measured at low temperature, where the atomic structure of the surface is still perfectly defined, to an accuracy of about 0.1 to 0.3 eV.
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30

ADACHI, Toshiyuki. "Analysis of Cu Silicides by Atom-probe Field Ion Microscope." SHINKU 47, no. 7 (2004): 568–73. http://dx.doi.org/10.3131/jvsj.47.568.

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31

Uemori, Ryuji, and Mitsuru Tanino. "Applications of atom probe-field ion microscope to ferrous materials." Bulletin of the Japan Institute of Metals 25, no. 3 (1986): 222–32. http://dx.doi.org/10.2320/materia1962.25.222.

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32

NISHIKAWA, OSAMU. "Compositional analysis surface and interface. Atom-probe field ion microscope." Nihon Kessho Gakkaishi 29, no. 2 (1987): 102–3. http://dx.doi.org/10.5940/jcrsj.29.102.

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33

Meyer, Gerhard, Ludwig Bartels, and Karl-Heinz Rieder. "Atom Manipulation with the Scanning Tunneling Microscope: Nanostructuring and Femtochemistry." Japanese Journal of Applied Physics 37, Part 1, No. 12B (December 30, 1998): 7143–47. http://dx.doi.org/10.1143/jjap.37.7143.

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34

Hage, F. S., G. Radtke, D. M. Kepaptsoglou, M. Lazzeri, and Q. M. Ramasse. "Single-atom vibrational spectroscopy in the scanning transmission electron microscope." Science 367, no. 6482 (March 5, 2020): 1124–27. http://dx.doi.org/10.1126/science.aba1136.

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Single-atom impurities and other atomic-scale defects can notably alter the local vibrational responses of solids and, ultimately, their macroscopic properties. Using high-resolution electron energy-loss spectroscopy in the electron microscope, we show that a single substitutional silicon impurity in graphene induces a characteristic, localized modification of the vibrational response. Extensive ab initio calculations reveal that the measured spectroscopic signature arises from defect-induced pseudo-localized phonon modes—that is, resonant states resulting from the hybridization of the defect modes and the bulk continuum—with energies that can be directly matched to the experiments. This finding realizes the promise of vibrational spectroscopy in the electron microscope with single-atom sensitivity and has broad implications across the fields of physics, chemistry, and materials science.
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35

Haller, Elmar, James Hudson, Andrew Kelly, Dylan A. Cotta, Bruno Peaudecerf, Graham D. Bruce, and Stefan Kuhr. "Single-atom imaging of fermions in a quantum-gas microscope." Nature Physics 11, no. 9 (July 13, 2015): 738–42. http://dx.doi.org/10.1038/nphys3403.

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36

Lang, N. D. "Theory of Single-Atom Imaging in the Scanning Tunneling Microscope." Physical Review Letters 56, no. 11 (March 17, 1986): 1164–67. http://dx.doi.org/10.1103/physrevlett.56.1164.

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37

Elswijk, H. B., P. M. Bronsveld, and J. Th M. De Hosson. "FIELD ION MICROSCOPE, IMAGING ATOM PROBE STUDY OF METALLIC GLASSES." Le Journal de Physique Colloques 48, no. C6 (November 1987): C6–305—C6–310. http://dx.doi.org/10.1051/jphyscol:1987650.

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38

Meyer, G., L. Bartels, and K. H. Rieder. "Atom manipulation with the scanning tunneling microscope: nanostructuring and femtochemistry." Superlattices and Microstructures 25, no. 1-2 (January 1999): 463–71. http://dx.doi.org/10.1006/spmi.1998.0676.

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39

Smith, G. D. W., A. Cerezo, C. R. M. Grovenor, T. J. Godfrey, and R. P. Setna. "Three-dimensional reconstruction of atomic-scale composition with the position-sensitive atom probe." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1478–79. http://dx.doi.org/10.1017/s0424820100132029.

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The combination of a field ion microscope with a time-of-flight mass spectrometer provides the capability for chemical microanalysis at the single atom level. Such an instrument is termed an Atom Probe. Conventionally, the connection between the microscope and the mass spectrometer is made via a small aperture hole in the imaging screen. This defines a region on the specimen, typically about 2nm across, from which the analysis is obtained. The disadvantage of this arrangement is that other regions of the specimen cannot be examined, as ions from all but the selected area strike the image screen and therefore do not pass into the mass spectrometer. In order to overcome this problem, we have developed a version of the Atom Probe which incorporates a wide-angle position sensitive detector system. This instrument, which we have termed the POSAP, is shown schematically in figure 1. Typically, the field of view in this instrument is about 20nm across. The number of ions collected per atom layer removed from the specimen surface is therefore approximately 5,000.
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40

Kelly, Thomas F., Michael K. Miller, Krishna Rajan, and Simon P. Ringer. "Visions of Atomic-Scale Tomography." Microscopy Today 20, no. 3 (May 2012): 12–16. http://dx.doi.org/10.1017/s1551929512000211.

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A microscope, by definition, provides structural and analytical information about objects that are too small to see with the unaided eye. From the very first microscope, efforts to improve its capabilities and push them to ever-finer length scales have been pursued. In this context, it would seem that the concept of an ultimate microscope would have received much attention by now; but has it really ever been defined? Human knowledge extends to structures on a scale much finer than atoms, so it might seem that a proton-scale microscope or a quark-scale microscope would be the ultimate. However, we argue that an atomic-scale microscope is the ultimate for the following reason: the smallest building block for either synthetic structures or natural structures is the atom. Indeed, humans and nature both engineer structures with atoms, not quarks. So far as we know, all building blocks (atoms) of a given type are identical; it is the assembly of the building blocks that makes a useful structure (see Figure 1). Thus, would a microscope that determines the position and identity of every atom in a structure with high precision and for large volumes be the ultimate microscope? We argue, yes. In this article, we consider how it could be built, and we ponder the answer to the equally important follow-on questions: who would care if it is built, and what could be achieved with it?
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41

Miller, M. K., and G. D. W. Smith. "Applications of Atom Probe Microanalysis in Materials Science." MRS Bulletin 19, no. 7 (July 1994): 27–34. http://dx.doi.org/10.1557/s0883769400047515.

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The atom probe field ion microscope is the most powerful and direct method for the analysis of materials at the atomic level. Since analyses are performed by collecting atoms one at a time from a small volume, it is possible to conduct fundamental characterization of materials at this level. The atom probe technique is applicable to a wide range of materials since its only restriction is that the material under analysis must possess at least some limited electrical conductance. Therefore, since its introduction in 1968, the atom probe field ion microscope has been used in many diverse applications in most branches of materials science. Many of the applications have exploited its high spatial resolution capabilities to perform microstructural characterizations of features such as grain boundaries and other interfaces and ultrafine scale precipitation that are not possible with other microanaly tical techniques. This article briefly outlines some of the capabilities and applications of the atom probe. The details of the atom probe technique are described elsewhere.The power of the atom probe may be demonstrated by its ability to see and identify a single atom, which is particularly useful in characterizing solute segregation to grain boundaries or other interfaces. An example of a brightly-imaging solute atom at a grain boundary in a nickel aluminide is shown in Figure 1. In order to conclusively determine its identity, its image is aligned with the probe aperture in the center of the imaging screen and then the selected atom is carefully removed by field evaporation and analyzed in the time-of-flight mass spectrometer. This and many other bright spots in this material were shown to be boron atoms. This example also illustrates the light element analytical capability of the atom probe. In fact, the atom probe may to used to analyze all elements in the periodic table and has had applications ranging from characterizing the distribution of implanted hydrogen to phase transformations in uranium alloys.
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42

Ikeda, Kazuto, Kenshi Takamuku, Koji Yamaguchi, Rittaporn Itti, and Naoki Koshizuka. "Ultrahigh vacuum STM studies of the Bi–O surface of Bi2212." Journal of Materials Research 7, no. 5 (May 1992): 1060–62. http://dx.doi.org/10.1557/jmr.1992.1060.

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Observations of the Bi–O surface of superconductive Bi2212 single crystals were carried out using an ultrahigh-vacuum scanning tunneling microscope (UHV-STM). In the atomic resolution images, surface corrugations, which correspond to the superstructure of the Bi–O surface in addition to Bi atom deficiencies, were observed. There were hollow lines along the ridges of the corrugations, which may be due to missing atom rows.
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43

ONODA, Jo, and Yoshiaki SUGIMOTO. "Chemical Identification of the Foremost Tip Atom of Atomic Force Microscope." Vacuum and Surface Science 64, no. 7 (July 10, 2021): 324–28. http://dx.doi.org/10.1380/vss.64.324.

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44

Hirano, Ken-Ichi. "Atom-Probe Field-Ion Microscope Studies on Age-Hardenable Aluminium Alloys." Materials Science Forum 13-14 (January 1987): 215–40. http://dx.doi.org/10.4028/www.scientific.net/msf.13-14.215.

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45

Shi, Qiang, Dehuan Huang, and Qingshi Zhu. "Vibrational-Energy Redistribution in Single-Atom Manipulation by Scanning Tunneling Microscope." Japanese Journal of Applied Physics 38, Part 1, No. 6B (June 30, 1999): 3856–59. http://dx.doi.org/10.1143/jjap.38.3856.

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46

Miller, M. K. "Analysis at the atomic level - The atom probe field-ion microscope." Journal of Research of the National Bureau of Standards 93, no. 3 (May 1988): 374. http://dx.doi.org/10.6028/jres.093.083.

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47

Lang, N. D. "Resistance of a one-atom contact in the scanning tunneling microscope." Physical Review B 36, no. 15 (November 15, 1987): 8173–76. http://dx.doi.org/10.1103/physrevb.36.8173.

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48

Snow, E. S., D. Park, and P. M. Campbell. "Single‐atom point contact devices fabricated with an atomic force microscope." Applied Physics Letters 69, no. 2 (July 8, 1996): 269–71. http://dx.doi.org/10.1063/1.117946.

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49

Peale, D. R., and B. H. Cooper. "A scanning tunneling microscope for ultrahigh vacuum atom–surface interaction studies." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (January 1990): 345–49. http://dx.doi.org/10.1116/1.577104.

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50

Burtzlaff, Andreas, Natalia L. Schneider, Alexander Weismann, and Richard Berndt. "Shot noise from single atom contacts in a scanning tunneling microscope." Surface Science 643 (January 2016): 10–12. http://dx.doi.org/10.1016/j.susc.2015.07.006.

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