Relevant bibliographies by topics / Atom probe tomograpghy

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Atom probe tomograpghy'

Author: Grafiati
Published: 4 June 2021
Last updated: 20 February 2023

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Journal articles on the topic "Atom probe tomograpghy"

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Miller, M. K. "Atom Probe Tomography: A Tutorial." Microscopy and Microanalysis 6, S2 (August 2000): 1188–89. http://dx.doi.org/10.1017/s1431927600038435.

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Atom probe tomography (APT) is an ultrahigh resolution microanalytical technique that enables the spatial coordinates and elemental identities of the atoms in a small volume of material to be determined. The specimen volume that may be analyzed is typically ∼ 10 to 20 nm square by ∼ 100 to 250 nm deep, and contains up to ∼ 1 million atoms. The distribution of the solute atoms within this volume may then be reconstructed from these data. The compositions of small volumes are determined by simply counting the number of atoms of each type within that volume, and thus the technique provides a fund
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Chiaramonti, Ann N., Luis Miaja-Avila, Paul T. Blanchard, David R. Diercks, Brian P. Gorman, and Norman A. Sanford. "A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source." MRS Advances 4, no. 44-45 (2019): 2367–75. http://dx.doi.org/10.1557/adv.2019.296.

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ABSTRACTPulsed coherent extreme ultraviolet (EUV) radiation is a potential alternative to pulsed near-ultraviolet (NUV) wavelengths for atom probe tomography. EUV radiation has the benefit of high absorption within the first few nm of the sample surface for elements across the entire periodic table. In addition, EUV radiation may also offer athermal field ion emission pathways through direct photoionization or core-hole Auger decay processes, which are not possible with the (much lower) photon energies used in conventional NUV laser-pulsed atom probe. We report preliminary results from what we
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Takahashi, Jun, Kazuto Kawakami та Yukiko Kobayashi. "Study on Quantitative Analysis of Carbon and Nitrogen in Stoichiometric θ-Fe3C and γ′-Fe4N by Atom Probe Tomography". Microscopy and Microanalysis 26, № 2 (5 березня 2020): 185–93. http://dx.doi.org/10.1017/s1431927620000045.

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AbstractThe quantitative analysis performance of carbon and nitrogen was investigated using stoichiometric θ-Fe3C (25 at% C) and γ′-Fe4N (~20 at% N) precipitates in pulsed voltage and pulsed laser atom probes. The dependencies of specimen temperature, pulse fraction, and laser pulse energy on the apparent concentrations of carbon and nitrogen were measured. Good coincidence with 25 at% carbon concentration in θ-Fe3C was obtained for the pulsed voltage atom probe by considering the mean number of carbon atoms per ion at 24 Da and the detection loss of iron, while better coincidence was obtained
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Miller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.

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The technique of atom probe tomography (APT) enables the x, y, and z coordinates and the elemental identities of the atoms in a small volume to be determined at the atomic level. Therefore, the APT technique may be used to characterize solute segregation to interfaces and precipitation in terms of concentration gradients and precipitate morphology. This type of information may be used to optimize the design of alloys.The material that was used to illustrate the capabilities of atom probe tomography is a complex polycrystalline nickel-based superalloy, Alloy 718. The composition of this commerc
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Felfer, P., L. T. Stephenson, and T. Li. "Atom Probe Tomography." Practical Metallography 55, no. 8 (August 16, 2018): 515–26. http://dx.doi.org/10.3139/147.110543.

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Kelly, Thomas F., and Michael K. Miller. "Atom probe tomography." Review of Scientific Instruments 78, no. 3 (March 2007): 031101. http://dx.doi.org/10.1063/1.2709758.

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Miller, M. K., and R. G. Forbes. "Atom probe tomography." Materials Characterization 60, no. 6 (June 2009): 461–69. http://dx.doi.org/10.1016/j.matchar.2009.02.007.

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Kim, Se-Ho, Ji Yeong Lee, Jae-Pyoung Ahn, and Pyuck-Pa Choi. "Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi–In–Sn Alloy as an Embedding Medium." Microscopy and Microanalysis 25, no. 2 (February 4, 2019): 438–46. http://dx.doi.org/10.1017/s1431927618015556.

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AbstractWe propose a new method for preparing atom probe tomography specimens from nanoparticles using a fusible bismuth–indium–tin alloy as an embedding medium. Iron nanoparticles synthesized by the sodium borohydride reduction method were chosen as a model system. The as-synthesized iron nanoparticles were embedded within the fusible alloy using focused ion beam milling and ion-milled to needle-shaped atom probe specimens under cryogenic conditions. An atom probe analysis revealed boron atoms in a detected iron nanoparticle, indicating that boron from the sodium borohydride reductant was inc
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Kelly, Thomas F., and David J. Larson. "Atom Probe Tomography 2012." Annual Review of Materials Research 42, no. 1 (August 4, 2012): 1–31. http://dx.doi.org/10.1146/annurev-matsci-070511-155007.

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Cerezo, Alfred, Peter H. Clifton, Mark J. Galtrey, Colin J. Humphreys, Thomas F. Kelly, David J. Larson, Sergio Lozano-Perez, et al. "Atom probe tomography today." Materials Today 10, no. 12 (December 2007): 36–42. http://dx.doi.org/10.1016/s1369-7021(07)70306-1.

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Dissertations / Theses on the topic "Atom probe tomograpghy"

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Marceau, Ross Kevin William. "Design in Light Alloys by Understanding the Solute Clustering Processes During the Early Stages of Age Hardening in Al-Cu-Mg Alloys." Thesis, The University of Sydney, 2008. http://hdl.handle.net/2123/4008.

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The evolution of atomistic-level nanostructure during the early stages of both standard, high-temperature T6 heat treatment, and low-temperature secondary ageing after interruption of the former (T6I4), has been investigated in rapid hardening Al-Cu-Mg alloys using a variety of microscopy and microanalytical techniques, including transmission electron microscopy (TEM), positron annihilation spectroscopy (PAS) and atom probe tomography (APT). In order to carry out this objective, quantitative data-analysis methods were developed with respect to new cluster-finding algorithms, specifically desig
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Marceau, Ross Kevin William. "Design in Light Alloys by Understanding the Solute Clustering Processes During the Early Stages of Age Hardening in Al-Cu-Mg Alloys." University of Sydney, 2008. http://hdl.handle.net/2123/4008.

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Doctor of Philosophy (PhD)<br>The evolution of atomistic-level nanostructure during the early stages of both standard, high-temperature T6 heat treatment, and low-temperature secondary ageing after interruption of the former (T6I4), has been investigated in rapid hardening Al-Cu-Mg alloys using a variety of microscopy and microanalytical techniques, including transmission electron microscopy (TEM), positron annihilation spectroscopy (PAS) and atom probe tomography (APT). In order to carry out this objective, quantitative data-analysis methods were developed with respect to new cluster-finding
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Withrow, Travis P. "Computational Modeling of Atom Probe Tomography." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1525763934302517.

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Engberg, David. "Atom Probe Tomography of TiSiN Thin Films." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-122724.

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This thesis concerns the wear resistant coating TiSiN and the development of the analysis technique atom probe tomography (APT) applied to this materials system. The technique delivers compositional information through time-of-flight mass spectrometry, with sub-nanometer precision in 3D for a small volume of the sample. It is thus a powerful technique for imaging the local distribution of elements in micro and nanostructures. To gain the full benefits of the technique for the materials system in question, I have developed a method that combines APT with isotopic substitution, here demonstrated
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Yang, Qifeng. "Atom probe tomography research on catalytic alloys and nanoparticles." Thesis, University of Oxford, 2018. http://ora.ox.ac.uk/objects/uuid:f3acdf37-3d23-4893-a4de-12e81712157a.

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Catalyst is a key component in the chemical industry, with more than 90% of total chemical products reliant on their use. However, the working mechanisms are in many cases still not fully understood. For heterogeneous catalysts, in which the reactions normally occur on solid phase materials, a better understanding of the catalytic surfaces, and how they evolve under reactive environments is recognised as the next step forward in the field. This work presents a study utilising atom probe tomography (APT), combined with an in-situ reaction cell, to understand the initial oxidation processes of c
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McCarroll, Ingrid. "Corrosion Processes: Through the lens of atom probe tomography." Thesis, The University of Sydney, 2017. http://hdl.handle.net/2123/18131.

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1 Abstract The motivation behind the current work is twofold. In the first instance it stems from a desire to understand and advance knowledge and instrumentation in the field of atom probe tomography (APT). In the second instance it is driven by the need for rapid advancements in engineered materials to keep up with the energy requirements of a continuously developing and demanding technological world. Advances in the capabilities of APT have only recently made analysis of semi- and non- conductive materials possible, opening up the APT field to the corrosion science community. The curre
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Araullo-Peters, Vicente James. "Advancements in atomic-scale analytical methods and their application to understanding materials." Thesis, The University of Sydney, 2014. http://hdl.handle.net/2123/12770.

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Atom probe tomography is a high resolution microscopy technique capable of determining the 3D location and chemical identification of individual atoms within a specimen. Though it is becoming ever more popular, a number of issues with the technique are known. First, the large amount of data created by atom probe tomography experiments requires new techniques to be developed so as to conduct effective analysis. Also, atom probe tomography is not traditionally considered a tool for crystallographic analysis even though crystallographic information is known to be present in reconstructed datasets
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Bennett, Samantha. "Nitride semiconductors studied by atom probe tomography and correlative techniques." Thesis, University of Cambridge, 2011. https://www.repository.cam.ac.uk/handle/1810/236685.

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Optoelectronic devices fabricated from nitride semiconductors include blue and green light emitting diodes (LEDs) and laser diodes (LDs). To design efficient devices, the structure and composition of the constituent materials must be well-characterised. Traditional microscopy techniques used to examine nitride semiconductors include transmission electron microscopy (TEM), and atomic force microscopy (AFM). This thesis describes the study of nitride semiconductor materials using these traditional methods, as well as atom probe tomography (APT), a technique more usually applied to metals that pr
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Chen, Yi-Sheng. "Characterisation of hydrogen trapping in steel by atom probe tomography." Thesis, University of Oxford, 2017. http://ora.ox.ac.uk/objects/uuid:9d8ee66f-176d-4ac1-aad6-ccb33efc924d.

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Hydrogen embrittlement (HE), which results in an unpredictable failure of metals, has been a major limitation in the design of critical components for a wide range of engineering applications, given the near-ubiquitous presence of hydrogen in their service environments. However, the exact mechanisms that underpin HE failure remain poorly understood. It is known that hydrogen, when free to diffuse in these materials, can tend to concentrate at a crack tip front. In turn, this facilitates crack propagation. Hence one of the proposed strategies for mitigating HE is to limit the content of freely
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Oberdorfer, Christian [Verfasser], and Guido [Akademischer Betreuer] Schmitz. "Numeric simulation of atom probe tomography / Christian Oberdorfer ; Betreuer: Guido Schmitz." Münster : Universitäts- und Landesbibliothek Münster, 2014. http://d-nb.info/1138282715/34.

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Books on the topic "Atom probe tomograpghy"

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Miller, M. K. Atom Probe Tomography. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0.

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Miller, Michael K., and Richard G. Forbes. Atom-Probe Tomography. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3.

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Larson, David J., Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, and Thomas F. Kelly. Local Electrode Atom Probe Tomography. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-8721-0.

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Larson, David J. Local electrode atom probe tomography: A user's guide. New York: Springer, 2013.

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Miller, M. K. Atom probe tomography: Analysis at the atomic level. New York: Kluwer Academic / Plenum Publishers, 2000.

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Atom Probe Tomography: Analysis at the Atomic Level. Boston, MA: Springer US, 2000.

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Lefebvre, Williams, Francois Vurpillot, and Xavier Sauvage. Atom Probe Tomography. Elsevier Science & Technology Books, 2016.

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Atom Probe Tomography. Elsevier, 2016. http://dx.doi.org/10.1016/c2015-0-01720-8.

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Miller, Michael K., and Richard G. Forbes. Atom-Probe Tomography: The Local Electrode Atom Probe. Springer, 2014.

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Atom-Probe Tomography: The Local Electrode Atom Probe. Springer, 2014.

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Book chapters on the topic "Atom probe tomograpghy"

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Kelly, Thomas F. "Atom-Probe Tomography." In Springer Handbook of Microscopy, 715–63. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-00069-1_15.

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Miller, Michael K., and Richard G. Forbes. "Introduction to Atom-Probe Tomography." In Atom-Probe Tomography, 1–49. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_1.

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Miller, Michael K., and Richard G. Forbes. "Introduction to the Physics of Field Ion Emitters." In Atom-Probe Tomography, 51–109. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_2.

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Miller, Michael K., and Richard G. Forbes. "Field Evaporation and Related Topics." In Atom-Probe Tomography, 111–87. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_3.

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Miller, Michael K., and Richard G. Forbes. "The Art of Specimen Preparation." In Atom-Probe Tomography, 189–228. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_4.

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Miller, Michael K., and Richard G. Forbes. "The Local Electrode Atom Probe." In Atom-Probe Tomography, 229–58. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_5.

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Miller, Michael K., and Richard G. Forbes. "Data Reconstruction." In Atom-Probe Tomography, 259–302. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_6.

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Miller, Michael K., and Richard G. Forbes. "Data Analysis." In Atom-Probe Tomography, 303–45. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_7.

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Miller, M. K. "Overview and Historical Evolution." In Atom Probe Tomography, 1–23. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0_1.

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Miller, M. K. "The Art of Specimen Preparation." In Atom Probe Tomography, 25–44. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0_2.

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Conference papers on the topic "Atom probe tomograpghy"

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Bunton, J. H., D. Lenz, J. D. Olson, K. Thompson, R. M. Ulfig, D. J. Larson, E. Oltman, and T. F. Kelly. "Instrumentation Developments in Atom Probe Tomography." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335294.

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Blavette, D., E. Cadel, D. Mangelinck, K. Hoummada, R. Larde, F. Vurpillot, B. Gault, et al. "Laser Atom Probe Tomography: some applications." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335352.

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Nelson, William, Austin Akey, Julia Hammer, and Steve Parman. "Atom by Atom: Investigating phosphorus in olivine using atom probe tomography." In Goldschmidt2022. France: European Association of Geochemistry, 2022. http://dx.doi.org/10.46427/gold2022.12543.

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Lawrence, D. F., R. M. Ulfig, D. J. Larson, D. P. Olson, D. A. Reinhard, I. Y. Martin, S. Strennen, and P. H. Clifton. "Routine Device-Level Atom Probe Analysis." In ISTFA 2014. ASM International, 2014. http://dx.doi.org/10.31399/asm.cp.istfa2014p0019.

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Abstract Continuing advances in Atom Probe Tomography and Focused Ion Beam Scanning Electron Microscope technologies along with the development of new specimen preparation approaches have resulted in reliable methods for acquiring 3D subnanometer compositional data from device structures. The routine procedure is demonstrated here by the analysis of the silicon-germanium source-drain region of a field effect transistor from a de-packaged off-the-shelf 28 nm design rule graphics chip. The center of the silicon-germanium sourcedrain region was found to have approximately 180 ppm of boron and the
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Miaja-Avila, Luis, Ann N. Chiaramonti, Paul T. Blanchard, Norman A. Sanford, David R. Diercks, and Brian P. Gorman. "Atom Probe Tomography with Extreme-Ultraviolet Light." In CLEO: Science and Innovations. Washington, D.C.: OSA, 2019. http://dx.doi.org/10.1364/cleo_si.2019.sf2g.6.

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Miaja Avila, Luis, Ann Chiaramonti, Benjamin Caplins, David Diercks, Brian Gorman, and Norman Sanford. "Atom probe tomography using Extreme-Ultraviolet Light." In Metrology, Inspection, and Process Control for Microlithography XXXIV, edited by Ofer Adan and John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551898.

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Geiser, B. P., J. Schneir, J. Roberts, S. Wiener, D. J. Larson, and T. F. Kelly. "Spatial Distribution Maps for Atom Probe Tomography." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335314.

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Prosa, T. J., S. L. P. Kostrna, and T. F. Kelly. "Laser Atom Probe Tomography: Application to Polymers." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335331.

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Foley, Michelle, Elias Bloch, Stephan Gerstl, Benita Putlitz, and Lukas P. Baumgartner. "ATOM PROBE TOMOGRAPHY OF MAGMATIC ZIRCON XENOCRYSTS." In GSA Connects 2022 meeting in Denver, Colorado. Geological Society of America, 2022. http://dx.doi.org/10.1130/abs/2022am-380016.

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Prosa, Ty J., Brian P. Geiser, Dan Lawrence, David Olson, and David J. Larson. "Developing detection efficiency standards for atom probe tomography." In SPIE NanoScience + Engineering, edited by Michael T. Postek. SPIE, 2014. http://dx.doi.org/10.1117/12.2062211.

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Reports on the topic "Atom probe tomograpghy"

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Edmondson, Philip D. An On-Axis Tomography Holder for Correlative Electron and Atom Probe Microscopy. Office of Scientific and Technical Information (OSTI), October 2018. http://dx.doi.org/10.2172/1479802.

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Sanford, Norman A. Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures. National Institute of Standards and Technology, April 2022. http://dx.doi.org/10.6028/nist.tn.2201.

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Wells, Peter, and G. Robert Odette. Status Summary of FY16 Atom Probe Tomography Studies on UCSB ATR-2 Irradiated RPV Steels. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1364468.

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Knipling, Keith, Fred Meisenkothen, and Eric B. Steel. Proceedings of the International Conference on Atom-Probe Tomography and Microscopy (APT&M 2018). National Institute of Standards and Technology, December 2019. http://dx.doi.org/10.6028/nist.sp.2100-03.

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Tiley, J., O. Senkov, G. Viswanathan, S. Nag, R. Banerjee, and J. Hwang. Determination of Gamma-Prime Site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-Ray Diffraction (Preprint). Fort Belvoir, VA: Defense Technical Information Center, August 2012. http://dx.doi.org/10.21236/ada563340.

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Miller, M. K. Atom Probe Tomography Characterization of the Solute Distributions in a Neutron-Irradiated and Annealed Pressure Vessel Steel Weld. Office of Scientific and Technical Information (OSTI), January 2001. http://dx.doi.org/10.2172/777685.

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