Relevant bibliographies by topics / Atomic Force Microscope (AFM)

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Atomic Force Microscope (AFM)'

Author: Grafiati
Published: 4 June 2021
Last updated: 4 February 2022

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Atomic Force Microscope (AFM).'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Atomic Force Microscope (AFM)"

1

Carmichael, Stephen W. "Atomic Resolution with the Atomic Force Microscope." Microscopy Today 3, no. 4 (1995): 6–7. http://dx.doi.org/10.1017/s1551929500063513.

Full text
Abstract:
For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.
APA, Harvard, Vancouver, ISO, and other styles
2

Johnson, W. Travis. "Advantages of Simultaneous Imaging Using an Atomic Force Microscope Integrated with an Inverted Light Microscope." Microscopy Today 19, no. 6 (2011): 22–29. http://dx.doi.org/10.1017/s1551929511001222.

Full text
Abstract:
Atomic Force Microscopy (AFM) permits measurements on biological samples below the limits of light microscopy resolution under physiological environments and other controlled conditions. Consequently, AFM has become an increasingly valuable technique in cell biology. One of the most exciting advances in AFM instrumentation has been its integration with the light microscope. This permits investigators to take advantage of the power and utility of light microscopy and scanning probe microscopy simultaneously. In combining a light microscope with an AFM, scanner components must be specifically de
APA, Harvard, Vancouver, ISO, and other styles
3

Fisher, K. A., M. G. L. Gustafsson, M. B. Shattuck, and J. Clarke. "Cryogenic atomic force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 54–55. http://dx.doi.org/10.1017/s0424820100084570.

Full text
Abstract:
The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical di
APA, Harvard, Vancouver, ISO, and other styles
4

Anderson, Mark S. "Infrared Spectroscopy with an Atomic Force Microscope." Applied Spectroscopy 54, no. 3 (2000): 349–52. http://dx.doi.org/10.1366/0003702001949618.

Full text
Abstract:
An atomic force microscope (AFM) has been used to measure the modulated photothermal displacement of a surface, thus acting as a local detector. This was demonstrated with Fourier transform infrared (FT-IR) and filter spectrometers focused on various samples. Similarly, surface layers were removed by an AFM and analyzed by the photothermal deformation of the coated cantilever. This work shows that the AFM can function as both an infrared detector and a precise surface separation device for spectroscopic analysis. The AFM combined with an FT-IR has the potential to enhance the sensitivity, sele
APA, Harvard, Vancouver, ISO, and other styles
5

Liu, Zeng Lei, Nian Dong Jiao, Zhi Dong Wang, Zai Li Dong, and Lian Qing Liu. "Atomic Force Microscope Deposition Assisted by Electric Field." Advanced Materials Research 677 (March 2013): 69–73. http://dx.doi.org/10.4028/www.scientific.net/amr.677.69.

Full text
Abstract:
This paper introduces atomic force microscope (AFM) deposition method to fabricate nanostructures and nanodevices. Field emission theory is introduced in this paper, which provides theoretical explanation for AFM deposition. Dot matrixes are fabricated by AFM deposition on three different substrates, Si, Au and GaAs. Differences of deposition on the three substrates are discussed. AFM deposition has many practical applications. For example, AFM deposition can be used to solder nano components together to improve electrical properties of nanodevices. Besides nanosoldering, AFM deposition can al
APA, Harvard, Vancouver, ISO, and other styles
6

Henderson, Eric, Daniel Jondle, Thomas Marsh, et al. "Imaging biological samples with the atomic-force microscope." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 512–13. http://dx.doi.org/10.1017/s0424820100148393.

Full text
Abstract:
The application of atomic force microscopy (AFM) to biological investigation is attractive for a number of reasons. Foremost among these is the ability of the AFM to image samples, even living cells, under near native conditions and at resolution equal to, or exceeding, that possible by the best light microscopes. Moreover, the ability of the AFM to manipulate samples it images provides a novel and far reaching application of this technology.We have been studying a number of biological samples by AFM. These include conventional and non-conventional nucleic acid structures, ribosomes, neural ce
APA, Harvard, Vancouver, ISO, and other styles
7

Lal, R., and S. A. John. "Biological applications of atomic force microscopy." American Journal of Physiology-Cell Physiology 266, no. 1 (1994): C1—C21. http://dx.doi.org/10.1152/ajpcell.1994.266.1.c1.

Full text
Abstract:
The newly developed atomic force microscope (AFM) provides a unique window to the microworld of cells, subcellular structures, and biomolecules. The AFM can image the three-dimensional structure of biological specimens in a physiological environment. This enables real-time biochemical and physiological processes to be monitored at a resolution similar to that obtained for the electron microscope. The process of image acquisition is such that the AFM can also measure forces at the molecular level. In addition, the AFM can interact with the sample, thereby manipulating the molecules in a defined
APA, Harvard, Vancouver, ISO, and other styles
8

Zauscher, Stefan. "Putting a Sphere on an Atomic Force Microscope Cantilever Tip." Microscopy Today 5, no. 10 (1997): 6. http://dx.doi.org/10.1017/s155192950006065x.

Full text
Abstract:
Atomic Force Microscopes (AFM) can measure the force between a surface and the tip of a cantilever as a junction of separation with great precision. For example, van der Waals type forces and electrostatic repulsive forces can easily be measured in aqueous solutions using an AFM. The complex, pyramidal shape of the typical AFM cantilever is, however, not well suited for quantitative measurements. It is thus desirable to attach particles of known geometry (usually spheres) to the tip of a cantilever.
APA, Harvard, Vancouver, ISO, and other styles
9

Heaton, Monteith G., and Jason P. Cleveland. "Pushing the Envelope in Atomic Force Microscopy." Microscopy Today 17, no. 2 (2009): 26–29. http://dx.doi.org/10.1017/s1551929500054456.

Full text
Abstract:
Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades
APA, Harvard, Vancouver, ISO, and other styles
10

Sumetpipat, Kanes, Duangkamon Baowan, Barry J. Cox, and James M. Hill. "Mathematical methods on atomic force microscope cantilever systems." RSC Advances 6, no. 52 (2016): 46658–67. http://dx.doi.org/10.1039/c6ra02126c.

Full text
Abstract:
Mathematical modelling, comprising Lennard–Jones potential and calculus of variations, is utilized to obtain the energy equations arising from AFM probe and substrate, leading to deflection equations of AFM cantilever.
APA, Harvard, Vancouver, ISO, and other styles
More sources

Dissertations / Theses on the topic "Atomic Force Microscope (AFM)"

1

McKee, Clayton T. "Investigation of Non-DLVO Forces using an Evanescent Wave Atomic Force Microscope." Diss., Virginia Tech, 2006. http://hdl.handle.net/10919/28233.

Full text
Abstract:
This dissertation describes new methods for measuring surface forces using evanescent waves, and applications to non-DLVO forces. An evanescent wave, generated at a solid-liquid interface, is scattered by AFM tips or particles attached to AFM cantilevers. The scattering of this wave is used to determine absolute separation between surfaces and/or the refractive index as a function of separation in AFM measurements. This technique is known as evanescent wave atomic force microscopy (EW-AFM). The scattering of an evanescent wave by Si3N4 AFM tips is large and decays exponentially with separ
APA, Harvard, Vancouver, ISO, and other styles
2

McBride, Sean P. "Surface science experiments involving the atomic force microscope." Diss., Kansas State University, 2012. http://hdl.handle.net/2097/13459.

Full text
Abstract:
Doctor of Philosophy<br>Department of Physics<br>Bruce M. Law<br>Three diverse first author surfaces science experiments conducted by Sean P. McBride 1-3 will be discussed in detail and supplemented by secondary co-author projects by Sean P. McBride, 4-7 all of which rely heavily on the use of an atomic force microscope (AFM). First, the slip length parameter, b of liquids is investigated using colloidal probe AFM. The slip length describes how easily a fluid flows over an interface. The slip length, with its exact origin unknown and dependencies not overwhelming decided upon by the
APA, Harvard, Vancouver, ISO, and other styles
3

Xu, JiaPeng. "A Novel Nanoparticle Manipulation Method Using Atomic Force Microscope." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1243987021.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

González, Romo Mario Javier. "Manipulation of nanoparticles by pushing operations using an Atomic Force Microscope (AFM)." Thesis, Cardiff University, 2012. http://orca.cf.ac.uk/47113/.

Full text
Abstract:
This thesis presents new paradigms for a particular class of non-prehensile manipulators of nanoscale objects that are limited to modelling accurately the relative motion of objects using continuous mechanics where the contact area is not presented. This restrictions results in models which have low accuracy and a lack of understanding about the real motion of the nanoscale object. The newly developed paradigms are focused on three topics: characterisation and analysis of forces present during motion at nanoscale in two dimensional space; characterisation and analysis of the quasi-static motio
APA, Harvard, Vancouver, ISO, and other styles
5

Abdel, Salam Khalifa Moataz Bellah Mohammed. "Lithography Using an Atomic Force Microscope and Ionic Self-assembled Multilayers." Diss., Virginia Tech, 2015. http://hdl.handle.net/10919/72856.

Full text
Abstract:
This thesis presents work done investigating methods for constructing patterns on the nanometer scale. Various methods of nanolithography using atomic force microscopes (AFMs) are investigated. The use of AFMs beyond their imaging capabilities is demonstrated in various experiments involving nanografting and surface electrochemical modification. The use of an AFM to manipulate a monolayer of thiols deposited on a gold substrate via nanografting is shown in our work to enable chemical modification of the surface of the substrate by varying the composition of the monolayer deposited on it. This
APA, Harvard, Vancouver, ISO, and other styles
6

Zhang, Zaicheng. "Nano-rheology at soft interfaces probed by atomic force microscope." Thesis, Bordeaux, 2020. http://www.theses.fr/2020BORD0157.

Full text
Abstract:
Des progrès récents dans les études expérimentales et théoriques ont montré que l'écoulement d’un liquide à l'échelle micro/nano se comporte différemment de celui à l'échelle macroscopique. À l'échelle microscopique, les propriétés des surfaces sont prédominantes pour le comportement d'écoulement proche des parois. Pour un confinement élevé, non seulement les propriétés physico-chimie des parois sont importantes, mais leur comportement élastique doit également être pris en compte. Dans cette thèse, nous avons utilisé l'AFM dynamique à sonde colloïdal pour étudier l’écoulement confiné sur des s
APA, Harvard, Vancouver, ISO, and other styles
7

Bippes, Christian Alexander. "Investigation of biological macromolecules using atomic force microscope-based techniques." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2009. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-23734.

Full text
Abstract:
The atomic force microscope (AFM) provides a powerful instrument for investigating and manipulating biological samples down to the subnanometer scale. In contrast to other microscopy methods, AFM does not require labeling, staining, nor fixation of samples and allows the specimen to be fully hydrated in buffer solution during the experiments. Moreover, AFM clearly compares in resolution to other techniques. In general, the AFM can be operated in an imaging or a force spectroscopy mode. In the present work, advantage was taken of this versatility to investigate single biomolecules and biomole
APA, Harvard, Vancouver, ISO, and other styles
8

Sarangapani, Krishna Kumar. "Characterizing selectin-ligand bonds using atomic force microscopy (AFM)." Diss., Georgia Institute of Technology, 2005. http://hdl.handle.net/1853/11650.

Full text
Abstract:
The human body is an intricate network of many highly regulated biochemical processes and cell adhesion is one of them. Cell adhesion is mediated by specific interactions between molecules on apposing cell surfaces and is critical to many physiological and pathological processes like inflammation and cancer metastasis. During inflammation, blood-borne circulating leukocytes regularly stick to and roll on the vessel walls, which consist in part, adhesive contacts mediated by the selectin family of adhesion receptors (P-, E- and L-selectin). This is the beginning of a multi-step cascade that ult
APA, Harvard, Vancouver, ISO, and other styles
9

Thoreson, Erik J. "Apparatus to deliver light to the tip-sample interface of an atomic force microscope (AFM)." Link to electronic thesis, 2002. http://www.wpi.edu/Pubs/ETD/Available/etd-1003102-092130.

Full text
Abstract:
Thesis (M.S.)--Worcester Polytechnic Institute.<br>Keywords: purple membrane; photomechanics; photoinduced conformation change; photocycle; photoactive; photoinduced; bimetallic bending; bacteriorhodopsin; atomic force microscope; tip-sample interface; molecular conformation; PLDS; photoreactive; AFM. Includes bibliographical references (p. E-1-E-4).
APA, Harvard, Vancouver, ISO, and other styles
10

Parlak, Zehra. "Quantitative imaging of subsurface structures and mechanical properties at nanoscale using atomic force microscope." Diss., Georgia Institute of Technology, 2010. http://hdl.handle.net/1853/37181.

Full text
Abstract:
This dissertation focuses on quantitative subsurface and mechanical properties imaging potential of AFM probes. Extensive modeling of AFM probes are presented for thorough understanding of capabilities and limitations of current techniques, these models are verified by various experiments, and different methods are developed by utilizing force-sensing integrated read-out active tip (FIRAT), which is an active AFM probe with broad bandwidth. For quantitative subsurface imaging, a 3-D FEA model of AFM tip-sample contact is developed and this model can simulate AFM tip scan on nanoscale-sized bur
APA, Harvard, Vancouver, ISO, and other styles
More sources

Books on the topic "Atomic Force Microscope (AFM)"

1

Yang, Guocheng. An in situ atomic force microscopy (AFM) investigation of tropoelastin-like peptide assembly at ordered interfaces. National Library of Canada, 2002.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
2

Chui, Benjamin W. Microcantilevers for Atomic Force Microscope Data Storage. Springer US, 1999.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
3

Microcantilevers for atomic force microscope data storage. Kluwer Academic Publishers, 1998.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Chui, Benjamin W. Microcantilevers for Atomic Force Microscope Data Storage. Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4983-3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Yang, Hongshun Ph D. Atomic Force Microscopy Afm: Principles, Modes of Operation and Limitations. Nova Science Pub Inc, 2014.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
6

Atomic Force Microscopy In Process Engineering Introduction To Afm For Improved Processes And Products. Butterworth-Heinemann, 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

Atomic force microscopy in process Engineering : introduction to AFM for improved processes and products. 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

Chen, C. Julian. Introduction to Scanning Tunneling Microscopy. 3rd ed. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198856559.001.0001.

Full text
Abstract:
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to
APA, Harvard, Vancouver, ISO, and other styles
9

Stm And Afm Studies On Biomolecular Systems Unravelling The Nanoworld. Springer, 2008.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

(Editor), Bhanu P. Jena, J.K. Heinrich Horber (Editor), Leslie Wilson (Series Editor), and Paul T. Matsudaira (Series Editor), eds. Atomic Force Microscopy in Cell Biology (Methods in Cell Biology, Volume 68) (Methods in Cell Biology, Volume 68). Academic Press, 2002.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Book chapters on the topic "Atomic Force Microscope (AFM)"

1

Gooch, Jan W. "Atomic Force Microscope (AFM)." In Encyclopedic Dictionary of Polymers. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13188.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Sakai, Kenichi. "Atomic Force Microscope (AFM)." In Measurement Techniques and Practices of Colloid and Interface Phenomena. Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-13-5931-6_8.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Voigtländer, Bert. "Artifacts in AFM." In Atomic Force Microscopy. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3_8.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Hilal, Nidal, and Daniel Johnson. "Atomic Force Microscopy (AFM)." In Encyclopedia of Membranes. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-44324-8_34.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Hilal, Nidal, and Daniel Johnson. "Atomic Force Microscopy (AFM)." In Encyclopedia of Membranes. Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-40872-4_34-1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Shahbazian-Yassar, Reza. "Atomic Force Microscopy (AFM)." In Encyclopedia of Tribology. Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_1213.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Mehlhorn, Heinz. "Atomic Force Microscopy (AFM)." In Encyclopedia of Parasitology. Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-43978-4_4501.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Mehlhorn, Heinz. "Atomic Force Microscopy (AFM)." In Encyclopedia of Parasitology. Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-642-27769-6_4501-1.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Friedbacher, Gernot. "Atomic Force Microscopy (AFM)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch29.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Giessibl, Franz J. "Principle of NC-AFM." In Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4_2.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Atomic Force Microscope (AFM)"

1

Castagne, Michel, Christel Prioleau, Jean-Pierre Fillard, and E. Baudry. "Evanescent photon capture by atomic force microscope (AFM) tips." In Photonics West '95, edited by Mehdi Vaez-Iravani. SPIE, 1995. http://dx.doi.org/10.1117/12.205928.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Muckenhirn, Sylvain, and A. Meyyappan. "Critical-dimension atomic force microscope (CD-AFM) measurement of masks." In 23rd Annual International Symposium on Microlithography, edited by Bhanwar Singh. SPIE, 1998. http://dx.doi.org/10.1117/12.308778.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Chung, Koo-Hyun, and Dae-Eun Kim. "Wear Characteristics of Atomic Force Microscope Probe Tips." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63783.

Full text
Abstract:
In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (
APA, Harvard, Vancouver, ISO, and other styles
4

Rubio-Sierra, F. J., R. Vazquez, and R. W. Stark. "Transfer Function Analysis of Atomic Force Microscope Cantilevers." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81156.

Full text
Abstract:
Current methods to study atomic force microscope (AFM) cantilever dynamics use model simplification or are based on the non-trivial solution of the equation of motion. As an alternative method, transfer function analysis gives a more complete description of system dynamics. In this work a transfer function study of two different AFM configurations, the point force and base driven cantilever, is presented. Exact analytical expressions of the infinite dimensional transfer function are derived for cantilever deflection and slope along the cantilever. Frequency response and transfer function infin
APA, Harvard, Vancouver, ISO, and other styles
5

Druffner, Carl J., Edward J. Schumaker, Paul T. Murray, and Shamachary Sathish. "Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)." In NDE for Health Monitoring and Diagnostics, edited by Norbert Meyendorf, George Y. Baaklini, and Bernd Michel. SPIE, 2003. http://dx.doi.org/10.1117/12.483824.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Johannes, Matthew S., Daniel G. Cole, and Robert L. Clark. "Enabling Soft Lithography Using an Atomic Force Microscope." In ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/detc2008-49877.

Full text
Abstract:
Atomic force microscope (AFM) based anodization nanolithography generates nanoscale oxide patterns on a silicon substrate in a serial fashion. The design of a custom AFM system allows for the controlled deposition of oxide patterns in the 100 nm regime. Anisotropic etching of the substrates results in raised micro- and nanostructures. The resulting master patterns are shown to be useful for the molding of stamps for soft lithographic patterning at the nanoscale. The simplicity of this method enables prototypical investigation of new materials and processes for soft lithographic research.
APA, Harvard, Vancouver, ISO, and other styles
7

Gupta, Surendra Kumar, and Patricia Iglesias Victoria. "Atomic Force Microscopy of Annealed Plain Carbon Steels." In ASME 2015 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2015. http://dx.doi.org/10.1115/imece2015-50972.

Full text
Abstract:
Microstructure of annealed plain carbon steels is examined using optical microscopy. When the inter-lamellar spacing in pearlite is small, optical microscope at 1000X is unable to resolve the ferrite and cementite lamellae. In hyper-eutectoid steels, cementite in pearlite appears as darker phase whereas the pro-eutectoid cementite appears as a lighter phase. Atomic force microscopy (AFM) of etched steels is able to resolve ferrite and cementite lamellae in pearlite at similar magnifications. Both cementite in pearlite as well as pro-eutectoid cementite appear as raised areas (hills) in AFM ima
APA, Harvard, Vancouver, ISO, and other styles
8

Strus, Mark C., Arvind Raman, Luis Zalamea, R. Byron Pipes, and Cattien V. Nguyen. "Nanomechanics of Peeling Studied Using the Atomic Force Microscope." In ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/detc2007-34570.

Full text
Abstract:
Through adaptation of an atomic force microscope, we have developed a peel test at the micro- and nanoscale level that has the capability of investigating how long flexible nanotubes, nanowires, nanofibers, proteins, and DNA adhere to various substrates. This novel atomic force microscopy (AFM) peeling mode extends existing AFM “pushing” and “pulling” force spectroscopies by offering practical knowledge about the complex interplay of nonlinear flexure, friction, and adhesion when one peels a long flexible molecule or nanostructure off a substrate. The static force peeling spectroscopies of str
APA, Harvard, Vancouver, ISO, and other styles
9

Johannes, Matthew S., Daniel G. Cole, and Robert L. Clark. "The Atomic Force Microscope as a Nanoscale Stereo Lithography Machine." In ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/detc2007-35348.

Full text
Abstract:
Atomic force microscope (AFM) based anodization nanolithography on semiconducting layers is a useful tool for nanoscale fabrication. A custom AFM patterning technique has been created that couples CAD with the lithographic capabilities of the AFM. Designed nanostructures to be deposited on a silicon substrate are rendered as a three-dimensional model using CAD. AFM based anodization nanolithography is then used to replicate the features at the nanoscale using automated voltage bias and humidity modulation as prescribed by the model and dictated by the system. The work presented outlines the ad
APA, Harvard, Vancouver, ISO, and other styles
10

Heying, Matthew J., James H. Oliver, Sriram Sundararajan, Pranav Shrotriya, and Qingze Zou. "Virtual Training Simulator for Atomic Force Microscopy." In ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/detc2005-85477.

Full text
Abstract:
Training novice users how to operate an Atomic Force Microscope (AFM) is expensive due to the cost of equipment and the time required to train users in a hands-on learning environment. Training large groups of users simultaneously presents a problem because usually only one AFM is available for use. To alleviate this problem, a virtual training simulator for AFM training has been developed. The training simulator is a Windows-based software program designed to allow users to simulate basic AFM operation on a PC. Instructors can use this tool to demonstrate the exact same instruction that a use
APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Atomic Force Microscope (AFM)"

1

Soufli, R., S. Baker, and J. Robinson. Atomic Force Microscope (AFM) measurements and analysis on Sagem 05R0025 secondary substrate. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/928199.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Burgens, LaTashia. The Atomic Force Microscopic (AFM) Characterization of Nanomaterials. Defense Technical Information Center, 2009. http://dx.doi.org/10.21236/ada550815.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Soufli, R., S. Baker, and J. Robinson. Atomic Force Microscope (AFM) measurements and analysis on Tinsley AIA-1000-003 primary substrate. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/928196.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Day, R. D., and P. E. Russell. Atomic Force Microscope. Office of Scientific and Technical Information (OSTI), 1988. http://dx.doi.org/10.2172/476627.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Davis, D. T. Atomic force microscope: Enhanced sensitivity. Office of Scientific and Technical Information (OSTI), 1995. http://dx.doi.org/10.2172/93754.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Quate, Calvin F. Sub-Micron Lithography with the Atomic Force Microscope. Defense Technical Information Center, 2000. http://dx.doi.org/10.21236/ada379939.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Smith, Ralph C., Andrew G. Hatch, Tathagata De, Murti V. Salapaka, Julie K. Raye, and Ricardo C. del Rosario. Model Development for Atomic Force Microscope Stage Mechanisms. Defense Technical Information Center, 2005. http://dx.doi.org/10.21236/ada440129.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Quate, Calvin F., Leland T. Edwards, and Steve Minne. Sub-Micron Lithography with the Atomic Force Microscope. Defense Technical Information Center, 1998. http://dx.doi.org/10.21236/ada342660.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Smith, Ralph C., Murti Salapaka, and Luke Cherveny. A Preisach Model for Quantifying Hysteresis in an Atomic Force Microscope. Defense Technical Information Center, 2002. http://dx.doi.org/10.21236/ada451962.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Kozell, Monte. Investigation of the Acoustic Response of a Confined Mesoscopic Water Film Utilizing a Combined Atomic Force Microscope and Shear Force Microscope Technique. Portland State University Library, 2000. http://dx.doi.org/10.15760/etd.6335.

Full text
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the extended bibliographies on the topic 'Atomic Force Microscope (AFM)' for particular source types:
Journal articles Dissertations / Theses Books
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography