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Journal articles on the topic 'Atomic Force Microscope (AFM)'

Author: Grafiati

Published: 4 June 2021

Last updated: 4 February 2022

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1

Carmichael, Stephen W. "Atomic Resolution with the Atomic Force Microscope." Microscopy Today 3, no. 4 (1995): 6–7. http://dx.doi.org/10.1017/s1551929500063513.

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For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

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2

Johnson, W. Travis. "Advantages of Simultaneous Imaging Using an Atomic Force Microscope Integrated with an Inverted Light Microscope." Microscopy Today 19, no. 6 (2011): 22–29. http://dx.doi.org/10.1017/s1551929511001222.

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Atomic Force Microscopy (AFM) permits measurements on biological samples below the limits of light microscopy resolution under physiological environments and other controlled conditions. Consequently, AFM has become an increasingly valuable technique in cell biology. One of the most exciting advances in AFM instrumentation has been its integration with the light microscope. This permits investigators to take advantage of the power and utility of light microscopy and scanning probe microscopy simultaneously. In combining a light microscope with an AFM, scanner components must be specifically de

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Fisher, K. A., M. G. L. Gustafsson, M. B. Shattuck, and J. Clarke. "Cryogenic atomic force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 54–55. http://dx.doi.org/10.1017/s0424820100084570.

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The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical di

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4

Anderson, Mark S. "Infrared Spectroscopy with an Atomic Force Microscope." Applied Spectroscopy 54, no. 3 (2000): 349–52. http://dx.doi.org/10.1366/0003702001949618.

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An atomic force microscope (AFM) has been used to measure the modulated photothermal displacement of a surface, thus acting as a local detector. This was demonstrated with Fourier transform infrared (FT-IR) and filter spectrometers focused on various samples. Similarly, surface layers were removed by an AFM and analyzed by the photothermal deformation of the coated cantilever. This work shows that the AFM can function as both an infrared detector and a precise surface separation device for spectroscopic analysis. The AFM combined with an FT-IR has the potential to enhance the sensitivity, sele

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Liu, Zeng Lei, Nian Dong Jiao, Zhi Dong Wang, Zai Li Dong, and Lian Qing Liu. "Atomic Force Microscope Deposition Assisted by Electric Field." Advanced Materials Research 677 (March 2013): 69–73. http://dx.doi.org/10.4028/www.scientific.net/amr.677.69.

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This paper introduces atomic force microscope (AFM) deposition method to fabricate nanostructures and nanodevices. Field emission theory is introduced in this paper, which provides theoretical explanation for AFM deposition. Dot matrixes are fabricated by AFM deposition on three different substrates, Si, Au and GaAs. Differences of deposition on the three substrates are discussed. AFM deposition has many practical applications. For example, AFM deposition can be used to solder nano components together to improve electrical properties of nanodevices. Besides nanosoldering, AFM deposition can al

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Henderson, Eric, Daniel Jondle, Thomas Marsh, et al. "Imaging biological samples with the atomic-force microscope." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 512–13. http://dx.doi.org/10.1017/s0424820100148393.

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The application of atomic force microscopy (AFM) to biological investigation is attractive for a number of reasons. Foremost among these is the ability of the AFM to image samples, even living cells, under near native conditions and at resolution equal to, or exceeding, that possible by the best light microscopes. Moreover, the ability of the AFM to manipulate samples it images provides a novel and far reaching application of this technology.We have been studying a number of biological samples by AFM. These include conventional and non-conventional nucleic acid structures, ribosomes, neural ce

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Lal, R., and S. A. John. "Biological applications of atomic force microscopy." American Journal of Physiology-Cell Physiology 266, no. 1 (1994): C1—C21. http://dx.doi.org/10.1152/ajpcell.1994.266.1.c1.

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The newly developed atomic force microscope (AFM) provides a unique window to the microworld of cells, subcellular structures, and biomolecules. The AFM can image the three-dimensional structure of biological specimens in a physiological environment. This enables real-time biochemical and physiological processes to be monitored at a resolution similar to that obtained for the electron microscope. The process of image acquisition is such that the AFM can also measure forces at the molecular level. In addition, the AFM can interact with the sample, thereby manipulating the molecules in a defined

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8

Zauscher, Stefan. "Putting a Sphere on an Atomic Force Microscope Cantilever Tip." Microscopy Today 5, no. 10 (1997): 6. http://dx.doi.org/10.1017/s155192950006065x.

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Atomic Force Microscopes (AFM) can measure the force between a surface and the tip of a cantilever as a junction of separation with great precision. For example, van der Waals type forces and electrostatic repulsive forces can easily be measured in aqueous solutions using an AFM. The complex, pyramidal shape of the typical AFM cantilever is, however, not well suited for quantitative measurements. It is thus desirable to attach particles of known geometry (usually spheres) to the tip of a cantilever.

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9

Heaton, Monteith G., and Jason P. Cleveland. "Pushing the Envelope in Atomic Force Microscopy." Microscopy Today 17, no. 2 (2009): 26–29. http://dx.doi.org/10.1017/s1551929500054456.

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Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades

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Sumetpipat, Kanes, Duangkamon Baowan, Barry J. Cox, and James M. Hill. "Mathematical methods on atomic force microscope cantilever systems." RSC Advances 6, no. 52 (2016): 46658–67. http://dx.doi.org/10.1039/c6ra02126c.

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Mathematical modelling, comprising Lennard–Jones potential and calculus of variations, is utilized to obtain the energy equations arising from AFM probe and substrate, leading to deflection equations of AFM cantilever.

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11

Howland, R. S., D. F. Oot, R. Nowroozi-Esfahani, G. J. Maclay, and P. J. Hesketh. "Non-contact atomic-force microscopy for soft surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 516–17. http://dx.doi.org/10.1017/s0424820100148411.

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The atomic force microscope (AFM) was invented in the mid-1980s, in response to strong interest in the high resolution, real-space surface imaging capabilities of the scanning tunneling microscope (STM). The AFM provides one real benefit that the STM cannot: it is able to image insulating surfaces. As a result, the AFM can operate on a wider variety of samples; it also can image samples in air, where many conductors oxidize rapidly, and in solution. Essentially no surface preparation is necessary. Historically, however, even the AFM has had limitations. Until recently, the contact forces exert

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Hues, Steven M., Richard J. Colton, Ernst Meyer, and Hans-Joachim Güntherodt. "Scanning Probe Microscopy of Thin Films." MRS Bulletin 18, no. 1 (1993): 41–49. http://dx.doi.org/10.1557/s088376940004344x.

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Atomic force microscopy (AFM) was invented in 1986 by Binnig, Quate, and Gerber as “a new type of microscope capable of investigating surfaces of insulators on an atomic scale.” Stemming from developments in scanning tunneling microscopy (STM), it became possible to image insulators, organic and biological molecules, salts, glasses, and metal oxides — some under a variety of conditions, e.g., ambient pressure, in aqueous or cryogenic liquids, etc. In 1987, Mate and co-workers introduced a new application for AFM where atomic-scale frictional forces could be measured. Likewise, in 1989, Burnham

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An, Sangmin, and Wonho Jhe. "Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope." Sensors 19, no. 8 (2019): 1794. http://dx.doi.org/10.3390/s19081794.

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We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching

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14

Hansma, Helen G., Christine Chen, Roxana Golan, et al. "Probing Biomaterials with the Atomic Force Microscope." Microscopy and Microanalysis 5, S2 (1999): 1012–13. http://dx.doi.org/10.1017/s1431927600018389.

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Recent AFM research in our laboratory has covered such diverse biomaterials as laminin and other macromolecules from basement membranes (Fig. 1) (1), DNA condensed for gene therapy (Fig. 2) (2), DNA-protein complexes in the yeast kinetochore (Fig. 3) (3), and biofilms of the bacterium Pseudomonas putida (Fig. 4) (4).Laminin is a major protein of basement membranes. When analyzed by AFM in air, it shows a variety of conformations of its cruciform structure (Fig. 1A). Time-lapse images of a single laminin molecule in aqueous solution show the flexibility of the laminin arms as they move and bend

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15

Morita, Seizo, Yasuhiro Sugawara, and Yoshinobu Fukano. "Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]." Japanese Journal of Applied Physics 32, Part 1, No. 6B (1993): 2983–88. http://dx.doi.org/10.1143/jjap.32.2983.

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Ralston, John, Ian Larson, Mark W. Rutland, Adam A. Feiler, and Mieke Kleijn. "Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)." Pure and Applied Chemistry 77, no. 12 (2005): 2149–70. http://dx.doi.org/10.1351/pac200577122149.

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The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection of the spring, which is monitored optically. Usually, a feedback loop is employed, which holds the spring deflection constant, and the corresponding movement of the piezoelectric positioner thus generates

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17

Fried, G., K. Balss, and P. W. Bohn. "Imaging Electrochemical Controlled Chemical Gradients Using Pulsed Force Mode Atomic Force Microscopy." Microscopy and Microanalysis 6, S2 (2000): 726–27. http://dx.doi.org/10.1017/s1431927600036126.

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The electrochemical formation of gradients in self assembled monolayers has been demonstrated recently [1]. The capacity to image these gradients provides useful information on the physical chemistry of electrochemical striping.Imaging chemical gradients requires the ability to sense the chemical moiety on the top of the self-assembled monolayer. This has been accomplished by derivatizing an atomic force microscope (AFM) tip with molecules selected to have specific interactions with the sample in a technique known as chemical force microscopy [2]. Typical tapping mode AFM is then used to image

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18

Prater, C. B., A. L. Weisenhorn, B. Dixon Northern, C. M. Peterson, S. A. C. Gould, and P. K. Hansma. "Imaging Molecules and Cells with the Atomic Force Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 254–55. http://dx.doi.org/10.1017/s0424820100180021.

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The atomic force microscope (AFM) gives topographic images by scanning a sharp stylus over a surface. The stylus is attached to a spring lever which is deflected when the stylus interacts with the surface. The AFM images a surface by measuring deflection as a function of position over the surface. The AFM has given atomic resolution images of both conductors and nonconductors. The AFM has also given images of amino acid polymers with subnanometer resolution. The AFM has imaged samples covered with a liquid and biological processes like blood clotting have been imaged. In this report we present

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Jin, Tao, Ryosuke Takahashi, Hui Zhang, You Yin, and Sumio Hosaka. "Prototype of Atomic Force Microscope with High Resolution Optical Microscope for Observing Magnetic Nanodot Arrays." Key Engineering Materials 643 (May 2015): 185–89. http://dx.doi.org/10.4028/www.scientific.net/kem.643.185.

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This paper is dedicated to develop an atomic force microscope (AFM) system cou-pled with a high resolution optical microscope (OM), which serves to observe AFM image from a desired micro-area. The system employs through-the-lens optical path for detecting atomic force based on optical lever. By switching the objective lenses from low to high magni cation, a micro-area for obtaining AFM image can be easily found. AFM images of magnetic nanodotarrays with 300 nm and 150 nm pitches are obtained from two local micro-areas using the system. The results demonstrate the proposed prototype has the su

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Bhalla, Amar S., Gargi Raina, and Shiv K. Sharma. "Ferroelastic domain study by atomic force microscope (AFM)." Materials Letters 35, no. 1-2 (1998): 28–32. http://dx.doi.org/10.1016/s0167-577x(97)00220-6.

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21

Prater, C. B. "New tools for Atomic Force Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 716–17. http://dx.doi.org/10.1017/s0424820100139950.

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The Atomic Force Microscope (AFM) has been widely used in the physics, chemistry, and materials science communities, and is becoming more common in life sciences research. To better serve the biological community, new instruments have been developed recently that combine AFM and various forms of optical microscopy including EPI-fluorescence, DIC, and confocal microscopy. In addition, new techniques like fluid Tapping Mode™ have been developed to allow gentle, non-destructive imaging of biological samples, including live specimens in physiological conditions. Other new techniques can provide in

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22

Wang, Fei, and Xue Zeng Zhao. "Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements." Key Engineering Materials 353-358 (September 2007): 742–45. http://dx.doi.org/10.4028/www.scientific.net/kem.353-358.742.

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The cantilevers of atomic force microscope (AFM) are mounted under a certain tilt angle, which is commonly assumed to have negligible effect on friction measurements in AFM. We present a theoretical study of the effect of the tilt angle on AFM based friction measurements. A method for correcting the friction coefficient between sample surfaces and AFM tips is also presented to minimize the effects of the tilt. The frictional forces between a silicon tip and a silicon surface at tilt angles ranging from 5 degrees to 25 degrees were measured. The results show that the measured friction coefficie

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Bučinskas, Vytautas, Andrius Dzedzickis, Ernestas Šutinys, and Tadas Lenkutis. "Implementation of Different Gas Influence for Operation of Modified Atomic Force Microscope Sensor." Solid State Phenomena 260 (July 2017): 99–104. http://dx.doi.org/10.4028/www.scientific.net/ssp.260.99.

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This paper presents modelling of various gas application to modified atomic force microscope sensor in order to change its existing dynamic characteristics. This paper represents part of continuous research, which is focused on improvement of scanning speed of atomic force microscope (AFM) sensor. Subject of our research is enhancement of dynamic characteristics of Atomic force microscope sensor. Natural frequency of AFM sensor is the main factor influencing max scanning speed of atomic force microscope. In case of working range of frequencies approaches to the resonant frequency of cantilever

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Anderson, Mark. "The Detection of Long-Chain Bio-Markers Using Atomic Force Microscopy." Applied Sciences 9, no. 7 (2019): 1280. http://dx.doi.org/10.3390/app9071280.

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The detection of long-chain biomolecules on mineral surfaces is presented using an atomic force microscope (AFM). This is achieved by using the AFM’s ability to manipulate molecules and measure forces at the pico-newton scale. We show that a highly characteristic force-distance signal is produced when the AFM tip is used to detach long-chain molecules from a surface. This AFM force spectroscopy method is demonstrated on bio-films, spores, fossils and mineral surfaces. The method works with AFM imaging and correlated tip enhanced infrared spectroscopy. The use of AFM force spectroscopy to detec

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Tortonese, M., and F. J. Giessibl. "Atomic-Force Microscopy with piezoresistive cantilevers." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1064–65. http://dx.doi.org/10.1017/s0424820100173054.

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The atomic force microscope (AFM) works by measuring the deflection of a cantilever as it is scanned over a sample. A sharp tip at the end of the cantilever is responsible for the high lateral resolution achieved with the AFM. There are several ways to measure the deflection of the cantilever. The technique used to measure the deflection of the cantilever most often dictates the mechanical complexity and stability of the instrument. Electron tunneling, interferometry and capacitive sensors have been used successfully. The most common way to measure the cantilever deflection is by means of an o

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Liu, Zenglei, Ailian Gao, Shuangxi Xie, Niandong Jiao, and Lianqing Liu. "Characteristics Analysis for Nanosoldering with Atomic Force Microscope." Nano 13, no. 04 (2018): 1850040. http://dx.doi.org/10.1142/s1793292018500406.

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Field-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads w

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Carvalho, Filomena A., Teresa Freitas, and Nuno C. Santos. "Taking nanomedicine teaching into practice with atomic force microscopy and force spectroscopy." Advances in Physiology Education 39, no. 4 (2015): 360–66. http://dx.doi.org/10.1152/advan.00119.2014.

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Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic force microscope by performing AFM scanning images of human blood cells and force spectroscopy measurements of the fibrinogen-platelet interaction. Since the beginning of this course, in 2008, the overall rating by the students was 4.7 (out of 5), mean

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Parvini, Cameron H., M. A. S. R. Saadi, and Santiago D. Solares. "Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy." Beilstein Journal of Nanotechnology 11 (June 16, 2020): 922–37. http://dx.doi.org/10.3762/bjnano.11.77.

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Atomic force microscopy (AFM) techniques have provided and continue to provide increasingly important insights into surface morphology, mechanics, and other critical material characteristics at the nanoscale. One attractive implementation involves extracting meaningful material properties, which demands physically accurate models specifically designed for AFM experimentation and simulation. The AFM community has pursued the precise quantification and extraction of rate-dependent material properties, in particular, for a significant period of time, attempting to describe the standard viscoelast

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Dobiński, Grzegorz, Sławomir Pawłowski, and Marek Smolny. "Amplitude Estimation Technique for Intermittent Contact Atomic Force Microscopy." International Journal of Measurement Technologies and Instrumentation Engineering 6, no. 2 (2017): 29–42. http://dx.doi.org/10.4018/ijmtie.2017070103.

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This article describes how one of the biggest challenges in designing of high-speed intermittent contact atomic force microscope (AFM) is the construction of a fast amplitude detector. The measurement techniques commonly used in commercial microscopes, such as RMS to DC converters or lock-in amplifiers often do not provide sufficient bandwidth to perform high speed imaging. On the other hand, many techniques developed especially for high-speed AFM are characterized by poor signal-to-noise ratio. In this paper, a novel amplitude estimation method based on the generalized Goertzel algorithm is p

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Tourek, Christopher J., and Sriram Sundararajan. "Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip." Microscopy and Microanalysis 16, no. 5 (2010): 636–42. http://dx.doi.org/10.1017/s1431927610000437.

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AbstractThree-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

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Giessibl, Franz. "Probing the Nature of Chemical Bonds by Atomic Force Microscopy." Molecules 26, no. 13 (2021): 4068. http://dx.doi.org/10.3390/molecules26134068.

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The nature of the chemical bond is important in all natural sciences, ranging from biology to chemistry, physics and materials science. The atomic force microscope (AFM) allows to put a single chemical bond on the test bench, probing its strength and angular dependence. We review experimental AFM data, covering precise studies of van-der-Waals-, covalent-, ionic-, metallic- and hydrogen bonds as well as bonds between artificial and natural atoms. Further, we discuss some of the density functional theory calculations that are related to the experimental studies of the chemical bonds. A descript

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Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomi

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Variola, Fabio. "Atomic force microscopy in biomaterials surface science." Physical Chemistry Chemical Physics 17, no. 5 (2015): 2950–59. http://dx.doi.org/10.1039/c4cp04427d.

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Niedermeier, W., J. Stierstorfer, S. Kreitmeier, O. Metz, and D. Göritz. "Morphological Investigations on Carbon-Black Particles by Atomic Force Microscopy." Rubber Chemistry and Technology 67, no. 1 (1994): 148–58. http://dx.doi.org/10.5254/1.3538661.

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Abstract The atomic force microscope (AFM) can profile surfaces similar to the scanning tunneling microscope (STM) at resolutions down to the atomic level. To investigate carbon-black particles and subsequently styrene-butadiene-rubber, filled with carbon black, a STM was modified to run as an AFM. An optical detection system is used to measure the deflection of the cantilever. Atomic resolution was achieved by forces in the order of 5·10−8 N on mica with the AFM. Structural investigations of carbon-black particles of different dimensions with the AFM agree with the data of the manufacturer. T

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Lee, Gil U., Linda Chrisey, and Richard J. Colton. "Measuring forces between biological macromolecules with the Atomic Force Microscope: characterization and applications." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 718–19. http://dx.doi.org/10.1017/s0424820100139962.

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Structure and function in biological macromolecular systems such as proteins and polynucleotides are based on intermolecular interactions that are short ranged and chemically specific. Our knowledge of these molecular interactions results from indirect physical and thermodynamic measurements such as x-ray crystallography, light scattering and nuclear magnetic resonance spectroscopy. Direct measurement of molecular interaction forces requires that the state of a system be monitored with near atomic resolution while an independent force is applied to the system of 10−12 to 10−9 Newton magnitude.

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Kodera, N., Y. Naito, A. Miyagi, and T. Ando. "Improvements on a high-speed atomic force microscope." Seibutsu Butsuri 43, supplement (2003): S117. http://dx.doi.org/10.2142/biophys.43.s117_2.

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Hoh, J. H., P. E. Hillner, and P. K. Hansma. "Measuring intermolecular binding forces with the Atomic-Force Microscope: The magnetic jump method." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1054–55. http://dx.doi.org/10.1017/s0424820100173005.

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The atomic-force microscope (AFM) can measure forces between atoms and molecules with a sensitivity of <10−12 N. By coating the AFM tip with specific molecules the types of interactions that can be examined will be greatly extended. Recently tips with biotin attached have been used to probe surfaces coated with avidin or streptavidin, to measure the respective bond strength.We have developed a novel approach to measuring intermolecular forces with the AFM that employs paramagnetic beads coated with one of the molecules to be studied. Beads are incubated with a surface coated with the second

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Florea, Cristina, Karla Berdich, and Mircea Dreucean. "Topography Imaging of Material Surfaces Using Atomic Force Microscope." Solid State Phenomena 188 (May 2012): 199–204. http://dx.doi.org/10.4028/www.scientific.net/ssp.188.199.

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The atomic force microscope (AFM) is a mechanical imaging instrument that measures the three dimensional topography at nanoscale as well as physical properties of a surface with a sharpened tip. This paper proposes an AFM imaging process for obtaining quality images in order to describe surface topography of different materials. Good topography information is a premise in nanoindentetion and in determining mechanical properties of materials. Samples used were: copper, nickel, titanium, polyamide and trabecular bone.

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Moreno-Madrid, Francisco, Natalia Martín-González, Aida Llauró, et al. "Atomic force microscopy of virus shells." Biochemical Society Transactions 45, no. 2 (2017): 499–511. http://dx.doi.org/10.1042/bst20160316.

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Microscopes are used to characterize small objects with the help of probes that interact with the specimen, such as photons and electrons in optical and electron microscopies, respectively. In atomic force microscopy (AFM), the probe is a nanometric tip located at the end of a microcantilever which palpates the specimen under study just as a blind person manages a walking stick. In this way, AFM allows obtaining nanometric resolution images of individual protein shells, such as viruses, in a liquid milieu. Beyond imaging, AFM also enables not only the manipulation of single protein cages, but

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Keighobadi, J., J. Faraji, and S. Rafatnia. "Chaos Control of Atomic Force Microscope System Using Nonlinear Model Predictive Control." Journal of Mechanics 33, no. 3 (2016): 405–15. http://dx.doi.org/10.1017/jmech.2016.89.

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AbstractOwing to robust and optimal specification, model predictive control method has received wide attentions over recent years. Since in certain operational conditions, an Atomic/scanning Force Microscope (AFM) shows chaos behavior, the chaos feedback control of the AFM system is considered. According to the nonlinear model of forces interacting between the tip of micro cantilever and the substrate of AFM; the nonlinear control methods are proposed. In the paper, the chaos control of a micro cantilever AFM based on the nonlinear model predictive control (NMPC) technique is presented. Throug

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Fung, Rong-Fong, and Shih-Chien Huang. "Dynamic Modeling and Vibration Analysis of the Atomic Force Microscope." Journal of Vibration and Acoustics 123, no. 4 (2001): 502–9. http://dx.doi.org/10.1115/1.1389084.

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The objective of this paper is to formulate the equations of motion and to investigate the vibrations of the atomic force microscope (AFM), which is divided into the contact and noncontact types. First, the governing equations of the AFM including both base oscillator and piezoelectric actuator are obtained using Hamilton’s principle. In the dynamic analysis, the piezoelectric layer is treated as a sensor to measure the deflection and as an actuator to excite the AFM via an external voltage. The repulsive force and van der Waals (vdW) force are considered in the contact and noncontact types of

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Kosgodagan Acharige, Sébastien, Justine Laurent, and Audrey Steinberger. "Capillary force on a tilted cylinder: Atomic Force Microscope (AFM) measurements." Journal of Colloid and Interface Science 505 (November 2017): 1118–24. http://dx.doi.org/10.1016/j.jcis.2017.06.095.

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Bączkowski, Bohdan, Anna Ziębowicz, Bogusław Ziębowicz, Elżbieta Wojtyńska, and Elżbieta Mierzwińska-Nastalska. "The assesment of surface topograhy of zirconium oxide ceramic using Atomic Force Microscope (AFM)." Prosthodontics 70, no. 3 (2020): 265–73. http://dx.doi.org/10.5114/ps/127265.

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Frederix, P. L. T. M., B. W. Hoogenboom, D. Fotiadis, D. J. Müller, and A. Engel. "Atomic Force Microscopy of Biological Samples." MRS Bulletin 29, no. 7 (2004): 449–55. http://dx.doi.org/10.1557/mrs2004.138.

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AbstractThe atomic force microscope (AFM) allows biomolecules to be observed and manipulated under native conditions. It produces images with an outstanding signal-to-noise ratio and addresses single molecules while the sample is in a buffer solution. Progress in sample preparation and instrumentation has led to topographs that reveal subnanometer details and the surface dynamics of biomolecules. Tethering single molecules between a support and a retracting AFM tip produces force–extension curves, giving information about the mechanical stability of secondary structural elements. For both imag

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Carmichael, Stephen W. "Atomic Force Microscopy for Biologists." Microscopy Today 5, no. 3 (1997): 3–4. http://dx.doi.org/10.1017/s1551929500060193.

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Atomic force microscopy (AFM) has proven to be very useful to material scientists and physicists. Biologists are only beginning to utilize the potential of this methodology. In a recent article, Tatsuo Ushiki, Jiro Hitomi, Shigeaki Ogura, Takeshi Umemoto, and Masatsugu Shigeno reviewed the applications of AFM to biologic studies.They began by reviewing the basic principles of AFM, emphasizing the value of the non-contact mode for visualizing the relatively “soft” surface of biologic specimens. They presented some examples of biologic images: DNA, chromosomes, and collagen fibrils. The specimen

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Forbes, Jeffrey G., and John P. Santos. "Solvent Isotope Effects in Atomic Force Spectroscopy." Microscopy and Microanalysis 7, S2 (2001): 856–57. http://dx.doi.org/10.1017/s143192760003035x.

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The utility of the atomic force microscope (AFM) for measuring forces is now well established. The AFM is capable of measuring forces from tens of piconewtons to tens of nanonewtons. Systems ranging from the adhesion of clean or functionalized tips interacting with different surface, to singlemolecule measurements of the force required to rupture protein-ligand interactions, to the forced unfolding of single protein molecules have been studied. The adhesion of a clean silicon nitride tip to a clean glass surface is one of the simplest systems to study and was the first system to demonstrate qu

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Korayem, M. H., A. K. Hoshiar, and N. Ebrahimi. "Maximum allowable load of atomic force microscope (AFM) nanorobot." International Journal of Advanced Manufacturing Technology 43, no. 7-8 (2008): 690–700. http://dx.doi.org/10.1007/s00170-008-1755-3.

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Pun, Purna B., and Shobha K. Lamichhane. "Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM." Himalayan Physics 2 (July 31, 2011): 76–79. http://dx.doi.org/10.3126/hj.v2i2.5220.

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The surface contamination affects Atomic Force Microscope (AFM) performance. Thermal agitation during mapping doping, thermal oxidation, annealing impurities and crystal defects promotes the roughness; various kinds of forces on the surface can be detected by the interaction between tip of cantilever and sample. This interaction not only help us to understand the characteristics and morphology of the sample but also useful to measure the surface force of the aluminum sample too.Key words: Atomic Force Microscope (AFM) performance; Thermal oxidation; Annealing impurities; Crystal defectsThe Him

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Obermair, Christian, Andreas Wagner, and Thomas Schimmel. "The atomic force microscope as a mechano–electrochemical pen." Beilstein Journal of Nanotechnology 2 (October 4, 2011): 659–64. http://dx.doi.org/10.3762/bjnano.2.70.

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We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Na

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Woodward, John T. "Choosing a Cantilever for In Situ Atomic Force Microscopy." Microscopy Today 11, no. 2 (2003): 42–43. http://dx.doi.org/10.1017/s1551929500052500.

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What is the best cantilever for intermittent contact mode (often called Tapping Mode™) atomic force microscope (AFM) imaging under water? This is a question I hear often and one that recently generated some interesting discussion on an AFM newsgroup (more on the newsgroup below). The ability of the AFM to image samples En physiologically relevant environments has made it a popular technique in the biological sciences. However, because scanning the AFM tip in contact mode easily perturbs many biological samples, it was the advent of intermittent contact modes that lead to AFM's widespread use i

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