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Journal articles on the topic 'Atomic Force Microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 July 2025

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1

Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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2

Razumić, Andrej, Biserka Runje, Dragutin Lisjak, et al. "Atomic Force Microscopy." Tehnički glasnik 18, no. 2 (2024): 209–14. http://dx.doi.org/10.31803/tg-20230829155921.

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The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices. Thus far, there are no guidelines or guides available in the field of atomic force microscopy that analyze the influence of input parameters on the quality of measurement results, nor has the measurement uncertainty of the results been estimated. Given the complex functional relationship between input and output variables, which cannot always be explicitly expressed, one of the prima

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3

NAKAJIMA, Ken, Kei SEKINE, Kaede MOGI, Makiko ITO, and Xiaobin LIANG. "Atomic Force Microscopy." Journal of the Japan Society of Colour Material 93, no. 10 (2020): 321–28. http://dx.doi.org/10.4011/shikizai.93.321.

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4

Binnig, G. K. "Atomic-Force Microscopy." Physica Scripta T19A (January 1, 1987): 53–54. http://dx.doi.org/10.1088/0031-8949/1987/t19a/008.

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5

Slater, S. D., and K. P. Parsons. "Atomic Force Microscopy." Imaging Science Journal 45, no. 3-4 (1997): 269. http://dx.doi.org/10.1080/13682199.1997.11736428.

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6

Prater, C. B., H. J. Butt, and P. K. Hansma. "Atomic force microscopy." Nature 345, no. 6278 (1990): 839–40. http://dx.doi.org/10.1038/345839a0.

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7

Chatterjee, Snehajyoti, Shrikanth S. Gadad, and Tapas K. Kundu. "Atomic force microscopy." Resonance 15, no. 7 (2010): 622–42. http://dx.doi.org/10.1007/s12045-010-0047-z.

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8

Schwarz, Udo D. "Atomic Force Microscopy." Physics Today 64, no. 4 (2011): 60–61. http://dx.doi.org/10.1063/1.3580496.

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9

Rugar, Daniel, and Paul Hansma. "Atomic Force Microscopy." Physics Today 43, no. 10 (1990): 23–30. http://dx.doi.org/10.1063/1.881238.

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10

Meyer, E. "Atomic force microscopy." Progress in Surface Science 41, no. 1 (1992): 3–49. http://dx.doi.org/10.1016/0079-6816(92)90009-7.

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11

BLANCHARD, CHERYL R. "Atomic Force Microscopy." CHEMICAL EDUCATOR 1, no. 5 (1996): 1–8. http://dx.doi.org/10.1007/s00897960059a.

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12

Hellemans, Louis. "Can atomic force microscopy tips be inspected by atomic force microscopy?" Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (1991): 1309. http://dx.doi.org/10.1116/1.585185.

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13

Ippolito, Stephen, Sean Zumwalt, and Andy Erickson. "Emerging Techniques in Atomic Force Microscopy: Diamond Milling and Electrostatic Force Microscopy." EDFA Technical Articles 17, no. 3 (2015): 4–10. http://dx.doi.org/10.31399/asm.edfa.2015-3.p004.

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Abstract Atomic force microscopy has been a consistent factor in the advancements of the past decade in IC nanoprobing and failure analysis. Over that time, many new atomic force measurement techniques have been adopted by the IC analysis community, including scanning conductance, scanning capacitance, pulsed current-voltage, and capacitance-voltage spectroscopy. More recently, two new techniques have emerged: diamond probe milling and electrostatic force microscopy (EFM). As the authors of the article explain, diamond probe milling using an atomic force microscope is a promising new method fo

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14

Kempe, A., J. W. Schopf, W. Altermann, A. B. Kudryavtsev, and W. M. Heckl. "Atomic force microscopy of Precambrian microscopic fossils." Proceedings of the National Academy of Sciences 99, no. 14 (2002): 9117–20. http://dx.doi.org/10.1073/pnas.142310299.

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15

Rabe, U., and W. Arnold. "Acoustic microscopy by atomic force microscopy." Applied Physics Letters 64, no. 12 (1994): 1493–95. http://dx.doi.org/10.1063/1.111869.

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16

Schwarz, Udo D. "Noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 3 (February 29, 2012): 172–73. http://dx.doi.org/10.3762/bjnano.3.17.

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17

Heath, George R., Ekaterina Kots, Janice L. Robertson, et al. "Localization atomic force microscopy." Nature 594, no. 7863 (2021): 385–90. http://dx.doi.org/10.1038/s41586-021-03551-x.

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18

Barnard, H., B. Drake, C. Randall, and P. K. Hansma. "Deep atomic force microscopy." Review of Scientific Instruments 84, no. 12 (2013): 123701. http://dx.doi.org/10.1063/1.4821145.

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19

Söngen, Hagen, Ralf Bechstein, and Angelika Kühnle. "Quantitative atomic force microscopy." Journal of Physics: Condensed Matter 29, no. 27 (2017): 274001. http://dx.doi.org/10.1088/1361-648x/aa6f8b.

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20

Platz, Daniel, Erik A. Tholén, Devrim Pesen, and David B. Haviland. "Intermodulation atomic force microscopy." Applied Physics Letters 92, no. 15 (2008): 153106. http://dx.doi.org/10.1063/1.2909569.

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21

Fisher, K. A., M. G. L. Gustafsson, M. B. Shattuck, and J. Clarke. "Cryogenic atomic force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 54–55. http://dx.doi.org/10.1017/s0424820100084570.

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The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical di

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22

Eifert, Alexander, and Christine Kranz. "Hyphenating Atomic Force Microscopy." Analytical Chemistry 86, no. 11 (2014): 5190–200. http://dx.doi.org/10.1021/ac5008128.

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23

FUJII, Masatoshi. "Surface Forces Measurement by Atomic Force Microscopy." Journal of the Japan Society of Colour Material 72, no. 1 (1999): 34–42. http://dx.doi.org/10.4011/shikizai1937.72.34.

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24

O'Shea, Sean J. "Oscillatory Forces in Liquid Atomic Force Microscopy." Japanese Journal of Applied Physics 40, Part 1, No. 6B (2001): 4309–13. http://dx.doi.org/10.1143/jjap.40.4309.

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25

Jang, Joonkyung, George C. Schatz, and Mark A. Ratner. "Capillary force in atomic force microscopy." Journal of Chemical Physics 120, no. 3 (2004): 1157–60. http://dx.doi.org/10.1063/1.1640332.

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26

SASAHARA, Akira, Hiroshi UETSUKA, Taka-aki ISHIBASHI, and Hiroshi ONISHI. "Noncontact Atomic Force Microscopy. Noncontact Atomic Force Microscope Topography of Adsorbed Organic Molecules." Hyomen Kagaku 23, no. 3 (2002): 186–93. http://dx.doi.org/10.1380/jsssj.23.186.

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27

Hues, Steven M., Richard J. Colton, Ernst Meyer, and Hans-Joachim Güntherodt. "Scanning Probe Microscopy of Thin Films." MRS Bulletin 18, no. 1 (1993): 41–49. http://dx.doi.org/10.1557/s088376940004344x.

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Atomic force microscopy (AFM) was invented in 1986 by Binnig, Quate, and Gerber as “a new type of microscope capable of investigating surfaces of insulators on an atomic scale.” Stemming from developments in scanning tunneling microscopy (STM), it became possible to image insulators, organic and biological molecules, salts, glasses, and metal oxides — some under a variety of conditions, e.g., ambient pressure, in aqueous or cryogenic liquids, etc. In 1987, Mate and co-workers introduced a new application for AFM where atomic-scale frictional forces could be measured. Likewise, in 1989, Burnham

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28

Elisabetta, Canetta, and K. Adya Ashok. "Atomic force microscopy : applications to nanobiotechnology." Journal of Indian Chemical Society Vol. 82, Dec 2005 (2005): 1147–72. https://doi.org/10.5281/zenodo.5824399.

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Condensed Matter Group and BIONTH (Bio- and Nano-Technologies for Health) Centre, School of Contemporary Sciences, University of Abertay Dundee, Bell Street, Dundee, Scotland, United Kingdom DD1 1HG <em>E-mail</em> : a.k.adya@abertay.ac.uk                               Fax : 44-1382-308663 <em>Manuscript received 6 June 2005</em> Atomic Force Microscopy (AFM) is a microscopic technique belonging to the Scanning Probe Microscopy (SPM) family. Other SPM techniques are Near-Field Scanning Optical Microscopy (NSOM), El

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29

Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomi

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30

Humphris, A. D. L., M. J. Miles, and J. K. Hobbs. "A mechanical microscope: High-speed atomic force microscopy." Applied Physics Letters 86, no. 3 (2005): 034106. http://dx.doi.org/10.1063/1.1855407.

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31

Ţîrcă, Simona Maria, Ion Ţîrcă, Marius Sorin Ciontea, and Florin Dumitru Mihălţan. "Atomic Force Microscopy Applied to Atopic Dermatitis Study." Internal Medicine 18, no. 4 (2021): 21–28. http://dx.doi.org/10.2478/inmed-2021-0171.

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Abstract Atopic dermatitis (AD)-the commonest inflammatory skin disease affects up to 25% of children and 2% to 5% of adults. Methods of the diagnostic provide expanded recommendations founded on available evidence. Morphological evaluation remains a principal feature of clinical investigation and the main criteria of diagnosis. Methods. We collected normal and affected skin from a 6-month child patient who was diagnosed through dermatologic examination. Clinical characteristics and the diagnosis of atopic dermatitis were in accordance with Hanifin and Rajka criteria. Morphology and structural

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32

NAKAGAWA, YOSHITSUGU. "Scanning Tunneling Microscopy and Atomic Force Microscopy." Sen'i Gakkaishi 49, no. 4 (1993): P144—P148. http://dx.doi.org/10.2115/fiber.49.4_p144.

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33

Linnemann, R. "Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 2 (1996): 856. http://dx.doi.org/10.1116/1.589161.

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34

Dufrêne, Yves F. "Atomic force microscopy and chemical force microscopy of microbial cells." Nature Protocols 3, no. 7 (2008): 1132–38. http://dx.doi.org/10.1038/nprot.2008.101.

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35

LeGrange, Jane D. "Microscopic manipulation of materials by atomic force microscopy." Biophysical Journal 64, no. 3 (1993): 903–4. http://dx.doi.org/10.1016/s0006-3495(93)81451-6.

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36

Yamanaka, Kazushi. "Ultrasonic Force Microscopy." MRS Bulletin 21, no. 10 (1996): 36–41. http://dx.doi.org/10.1557/s0883769400031626.

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As an imaging method of elastic properties and subsurface features on the microscopic scale, the scanning acoustic microscope (SAM) provides spatial resolution comparable or superior to that of optical microscopes. Nondestructive evaluation methods of defects and elastic properties on the microscopic scale were developed by using the SAM, and they have been widely applied to various fields in science and technology. One major problem in acoustic microscopy is resolution. The best resolution of SAM with water as the coupling fluid has been 240 nm at a frequency of 4.4 GHz. At a more conventiona

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37

Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demons

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38

Xu, Rong-Guang, and Yongsheng Leng. "Solvation force simulations in atomic force microscopy." Journal of Chemical Physics 140, no. 21 (2014): 214702. http://dx.doi.org/10.1063/1.4879657.

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39

Cappella, B., and G. Dietler. "Force-distance curves by atomic force microscopy." Surface Science Reports 34, no. 1-3 (1999): 1–104. http://dx.doi.org/10.1016/s0167-5729(99)00003-5.

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40

Mitiurev, Nikolai, Michael Verrall, Svetlana Shilobreeva, Alireza Keshavarz, and Stefan Iglauer. "Shale adhesion force measurements via atomic force microscopy." Oil & Gas Science and Technology – Revue d’IFP Energies nouvelles 76 (2021): 73. http://dx.doi.org/10.2516/ogst/2021057.

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Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous sample, such as shale, for instance, have prompted scientists to look for the methods of wettability assessment at nanoscale. At the same time, bulk techniques, which are commonly applied, such as USBM (United States Bureau of Mines) or Amott tests, are not sensitive enough in cases with mixed wettability of rocks as they provide average wettability

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41

Choi, D. H., and W. Hwang. "Measurement of Frictional Forces in Atomic Force Microscopy." Solid State Phenomena 121-123 (March 2007): 851–54. http://dx.doi.org/10.4028/www.scientific.net/ssp.121-123.851.

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A new calibration method of frictional forces in atomic force microscopy (AFM) is suggested. An angle conversion factor is defined using the relationship between torsional angle and frictional signal. When the factor is measured, the slopes of the torsional angle and the frictional signal as a function of the normal force are used to eliminate the effect of the adhesive force. Moment balance equations on the flat surface and the top edge of a commercial step grating are used to obtain the angle conversion factor. After the factor is obtained from an AFM system, it can be applied to all cantile

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42

Müller, F., A.-D. Müller, M. Hietschold, and S. Kämmer. "Detecting electrical forces in noncontact atomic force microscopy." Measurement Science and Technology 9, no. 5 (1998): 734–38. http://dx.doi.org/10.1088/0957-0233/9/5/002.

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43

Malotky, David L., and Manoj K. Chaudhury. "Investigation of Capillary Forces Using Atomic Force Microscopy." Langmuir 17, no. 25 (2001): 7823–29. http://dx.doi.org/10.1021/la0107796.

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44

Lim, Roderick, Sam F. Y. Li, and Sean J. O'Shea. "Solvation Forces Using Sample-Modulation Atomic Force Microscopy." Langmuir 18, no. 16 (2002): 6116–24. http://dx.doi.org/10.1021/la011789+.

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45

Tivanski, Alexei V., Jason E. Bemis, Boris B. Akhremitchev, Haiying Liu, and Gilbert C. Walker. "Adhesion Forces in Conducting Probe Atomic Force Microscopy." Langmuir 19, no. 6 (2003): 1929–34. http://dx.doi.org/10.1021/la026555k.

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46

Ogletree, D. F., R. W. Carpick, and M. Salmeron. "Calibration of frictional forces in atomic force microscopy." Review of Scientific Instruments 67, no. 9 (1996): 3298–306. http://dx.doi.org/10.1063/1.1147411.

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47

Lin, F., and D. J. Meier. "Atomic-Scale Resolution in Atomic Force Microscopy." Langmuir 10, no. 6 (1994): 1660–62. http://dx.doi.org/10.1021/la00018a008.

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48

Hsu, Hsiang Chen, and Li Ming Chu. "Nanotribology Properties and Microscopic Interfacial Frictional Behavior Studied by Atomic Force Microscopy." Advanced Materials Research 230-232 (May 2011): 639–43. http://dx.doi.org/10.4028/www.scientific.net/amr.230-232.639.

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This paper deals with the description of a method for the measurement of the nanotribology properties and microscopic interfacial frictional behavior with Atomic Force Microscopy (AFM). AFM force-displacement curve is utilized to determine the nanotribology properties. The interfacial coefficient of frictional force can be derived from a serial of calculations. A well-defined contact area is measured to study the frictional force and friction stress. The roughness of contact surface influences the contact between friction and surface forces. The study of roughness parameters corresponds to eva

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49

Glatzel, Thilo, Hendrik Hölscher, Thomas Schimmel, Mehmet Z. Baykara, Udo D. Schwarz, and Ricardo Garcia. "Advanced atomic force microscopy techniques." Beilstein Journal of Nanotechnology 3 (December 21, 2012): 893–94. http://dx.doi.org/10.3762/bjnano.3.99.

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50

Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy II." Beilstein Journal of Nanotechnology 5 (March 12, 2014): 289–90. http://dx.doi.org/10.3762/bjnano.5.31.

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