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Academic literature on the topic 'Backside illuminated CMOS image sensors'
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Journal articles on the topic "Backside illuminated CMOS image sensors"
Kim, Bioh, Thorsten Matthias, Gerald Kreindl, Viorel Dragoi, Markus Wimplinger, and Paul Lindner. "Advances in Wafer Level Processing and Integration for CIS Module Manufacturing." International Symposium on Microelectronics 2010, no. 1 (2010): 000378–84. http://dx.doi.org/10.4071/isom-2010-wa1-paper5.
Full textMinoglou, K., Padmakumar R. Rao, M. Rahman, K. De Munck, C. Van Hoof, and P. De Moor. "Backside illuminated CMOS image sensors optimized by modeling and simulation." Optical and Quantum Electronics 42, no. 11-13 (2011): 691–98. http://dx.doi.org/10.1007/s11082-011-9456-9.
Full textZhang, Xiang, Yudong Li, Lin Wen, et al. "Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors." Journal of Nuclear Science and Technology 57, no. 9 (2020): 1015–21. http://dx.doi.org/10.1080/00223131.2020.1751323.
Full textDe Vos, Joeri, Anne Jourdain, Wenqi Zhang, Koen De Munck, Piet De Moor, and Antonio La Manna. "The Road towards Fully Hybrid CMOS Imager Sensors." International Symposium on Microelectronics 2011, no. 1 (2011): 000173–80. http://dx.doi.org/10.4071/isom-2011-ta5-paper5.
Full textLiu, Bingkai, Yudong Li, Lin Wen, et al. "Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors." Results in Physics 19 (December 2020): 103443. http://dx.doi.org/10.1016/j.rinp.2020.103443.
Full textXu, C., C. Shen, W. Wu, and M. Chan. "Backside-Illuminated Lateral PIN Photodiode for CMOS Image Sensor on SOS Substrate." IEEE Transactions on Electron Devices 52, no. 6 (2005): 1110–15. http://dx.doi.org/10.1109/ted.2005.848106.
Full textSeok, Godeun, and Yunkyung Kim. "Front-Inner Lens for High Sensitivity of CMOS Image Sensors." Sensors 19, no. 7 (2019): 1536. http://dx.doi.org/10.3390/s19071536.
Full textVereecke, Bart, Celso Cavaco, Koen De Munck, et al. "Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor." Japanese Journal of Applied Physics 54, no. 4S (2015): 04DE09. http://dx.doi.org/10.7567/jjap.54.04de09.
Full textBingkai, Liu, Li Yudong, Wen Lin, et al. "Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors." Chinese Journal of Electronics 30, no. 1 (2021): 180–84. http://dx.doi.org/10.1049/cje.2020.12.002.
Full textHorie, Yu, Seunghoon Han, Jeong-Yub Lee, et al. "Visible Wavelength Color Filters Using Dielectric Subwavelength Gratings for Backside-Illuminated CMOS Image Sensor Technologies." Nano Letters 17, no. 5 (2017): 3159–64. http://dx.doi.org/10.1021/acs.nanolett.7b00636.
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