Academic literature on the topic 'Beam cleaning'

M, Kane D., ed. Laser cleaning II. World Scientific, 2006.

Minarik, Else Holmelund. Spring cleaning. HarperFestival, 2003.

Bredenberg, Jeff. The experts book of cleaning mircales: Over 50,000 ways to remove stains, beat grease, eliminate odors, and make anything sparkle and shine. Rodale Press, 1998.

Hong, M. H. Laser applications in nanotechnology. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.24.

Kane, D. M. Laser Cleaning II. World Scientific Publishing Co Pte Ltd, 2007.

Kane, D. M. Laser Cleaning II. World Scientific Publishing Co Pte Ltd, 2007.

5 Ton Per Day Bean Cleaning Line By Win Tone Manufacture. Win Tone, 2017.

Bender, Melanie. Cleaning Planner: Bear Cleaning Planner, Daily House Cleaning Notebook for Wives, Husbands, Men, Women. Kitchen and Home, 120 Pages, Size 8 X 10. Independently Published, 2021.

Schmitz, Franz-Josef. Cleaning Planner: Cute Bear Cleaning Planner, Daily House Cleaning Notebook for Wives, Husbands, Men, Women. Kitchen and Home, 120 Pages, Size 8 X 10. Independently Published, 2021.

Rauschenbach, Bernd. "Ion Beam Deposition and Cleaning." In Low-Energy Ion Irradiation of Materials. Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-97277-6_9.

Gabovich, M. D., N. V. Pleshivtsev, and N. N. Semashko. "Ion Cleaning and Milling of Solid Surfaces." In Ion and Atomic Beams for Controlled Fusion and Technology. Springer US, 1989. http://dx.doi.org/10.1007/978-1-4684-8407-6_5.

Hecht, Jeff. "Microwaves are the first step." In Beam. Oxford University PressNew York, NY, 2005. http://dx.doi.org/10.1093/oso/9780195142105.003.002.

Lee, Jin W. "Supersonic Nano-Particle Beam Technique for Removing Nano-Sized Contaminant Particles from Surfaces." In Developments in Surface Contamination and Cleaning. Elsevier, 2011. http://dx.doi.org/10.1016/b978-1-4377-7885-4.10001-6.

Srin, K. S., J. Ramkumar, and Ravi N. Bathe. "Nanomachining." In Nature-Inspired Self-Cleaning Surfaces in the Nanotechnology Era. IntechOpen, 2023. http://dx.doi.org/10.5772/intechopen.111369.

Hansch, W., Eisele, H. Kibbel, U. König, and J. Ramm. "Device quality of in situ plasma cleaning for silicon molecular beam epitaxy." In Selected Topics in Group IV and II–VI Semiconductors. Elsevier, 1996. http://dx.doi.org/10.1016/b978-0-444-82411-0.50028-0.

"Cleaning of paint with high repetition rate laser: Scanning the laser beam." In Lasers in the Conservation of Artworks. CRC Press, 2008. http://dx.doi.org/10.1201/9780203882085-12.

"of the spectral response, the integrated reflection-absorption intensity, of these samples are slightly greater than the intensity of the spectral response of the same samples measured via a 60 ° angle of incidence data (Figure 3). This behavior is expected due to the increase in reflection-absorption sensitivity with increasing angle o f incidence. Here, too, the average initial slope (and hence instrument sen-sitivity) is the same for both transverse and longitudinal orientations. The pronounced non-linearity in slope for the thickest films at 75° angle-of-incidence was unexpected. A n increasingly non-linear response may be observed for thicker absorbing films, and this effect will become more pronounced as the angle of incidence is also increased. The interpretation of the data implying that measurement of a thicker film, sampled at a steeper angle, generated the observed non-linearity in the data is not substantiated by th e calculated spectra for the pre-sent measurement conditions due to the small change from 60 to 75° in the angle of incidence. Furthermore, such a non-linear effect would be most pronounced for measurements on the smoothest substrat e (Figure 4, filled circles) where the ef-fective local orientation of the surface is most constant with respect to the illumi-nation beam. Instead of observing such non-linear behavior the measurements made on the smoothest surface are by far the most linear sample series for the 75° data . We attribute the pronounced non-linearity of the 75° data for the thickest draw-ing-agent films to the morphological characteristics of the material as deposited o n the aluminum test panel surface. As described above, the drawing-agent mate-rial is highly viscous and forms a visibly heterogeneous white film at l-|im thick-ness. Variations in the deposition process produce relatively thick local areas of drawing-agent film and result in accretion of solid residue along the polishing grooves and ridges of the aluminum substrate. Under these circumstances, illumi-natio n of the surface with the FTIR beam at an angle of 75° may result in shadow-ing by contaminant material on ridge structures for all except the smoothest (600 grit polish) surface. The 12-mm diameter focal area of the infrared beam is elon-gated by a factor o f four for this angle of incidence. In contrast, reflectance meas-urements at 60° result in only a factor of 2 elongation, and minimize the shadow-ing effect of thick films except for ridges on the roughest (80 grit polish) surfaces. This interpretation is substantiated by reflectance data for the second test set (lubricant material) as shown in Figure 5. FTIR reflectance measurements have been made at 75° angle-of-incidence for a test series similar to that of the draw-ing-agent set. An analysis of the C-H stretching frequencies shows a strikingly more linear dependence of instrument response with film thickness (with the ex-ception of a single point for one of the panels with a 220 grit surface finish). We believe that this is due to the more fluid characteristic of the lubricant material, which allows the deposited film to conform much more closely to the surface to-pography of the test coupons. This behavior may also account for the stronger de-pendence of the integrated intensity slope with surface roughness, when compared to the nearly constant results for the drawing-agent contaminant examined above." In Surface Contamination and Cleaning. CRC Press, 2003. http://dx.doi.org/10.1201/9789047403289-6.

"niques were prepared using pentane as the solvent. Similar methods were used in preparing calibration samples with the mold release, solder flux, and hydraulic oil samples. All contaminated coupons were gentl y heated in an oven at 50°C for several days to remove both semi-volatile and volatile components. This served to stabi-lize the contaminants, allowing for quantification by weighing. Once the weights became stable, the coupons were cooled and weighed to determine the amount of contaminant present on the surface. When not being weighed or examined, the coupons were kept in a desiccator. 3. RESULTS AND DISCUSSION Grazing-angle incidence reflectance spectroscopy acts to enhance the detection sensitivity for thin layers of residue predominantly through improved coupling of th e electric field intensity of the incident beam with the vibrating dipoles of the surface contaminant layer perpendicular to the metallic surface. Some additional enhancement of the infrared absorption spectrum will also occur due to a length-ening of the effective path length through the absorbing thin film layer [4-6]. If the optical properties of both thin film and substrate are known (or can be de-termined), the reflection-absorption spectrum can be calculated as a function of film thickness and angle of incidence. This capability is particularly useful for in-terpreting experimental data and designing optical instrumentation. Computer codes written at Sandia [7] performed these calculations for a variety of materials. 3.1. FTIR measurements FTIR reflectance data for the full drawing-agent sample set were obtained at NFESC and Sandia using angles of incidence of 75 and 60° for average film thickness ranging from 0.1 to 1 |im, and aluminum substrates with surface finish ranging from 600 to 80 grit. Since the surface finishing operation produced a highly directional roughness, measurements were made both longitudinally and transversely with respect to the polishing grooves. R values were determined at." In Surface Contamination and Cleaning. CRC Press, 2003. http://dx.doi.org/10.1201/9789047403289-5.

"about chemical bonding and molecular structure. This information can be used to detect th e types of organic materials present on the surface. 4.3.2.2. Raman spectroscopy (RS) [7, 8] It is used to examine the energy levels of molecules that cannot be well character-ized via infrared spectroscopy. Th e two techniques, however, are complimentary. In the RS, a sample is irradiated with a strong monochromatic light source (usu-ally a laser). Most of the radiation will scatter or "reflect off' the sample at the same energy as the incoming laser radiation. However, a small amount will scat-ter from the sample at a wavelength slightly shifted from the original wavelength. It is possible to study the molecular structure or determine the chemical identity of the sample. It is quite straightforward to identify compounds by spectral library search. Due to extensive library spectral information, the unique spectral finger-print of every compound, and the ease with which such analyses can be per-formed, the RS is a very useful technique for various applications. An important application of the RS is the rapid, nondestructive characterization of diamond, diamond-like, and amorphous-carbon films. 4.3.2.3. Scanning electron microscopy (SEM) / energy dispersive X-ra y analysis (EDX) [7, 8] The SEM produce s detailed photographs that provide important information about the surface structure and morphology of almost any kind of sample. Image analy-sis is often the first and most important step in problem solving and failure analy-sis. With SEM, a focused beam of high-energy electrons is scanned over the sur-face of a material, causing a variety of signals, secondary electrons, X-rays, photons, etc. - each of which may be used to characterize the material with re-spect to specific properties . The signals are used to modulate the brightness on a CRT display, thereb y providing a high-resolution map of the selected material property. It is a surface imaging technique, but with Energy Dispersive X-ray (EDX) it can identify elements in the near-surface region. This technique is most useful for imaging particles. 4.3.2.4. X-ray fluorescence (XRF) [7, 8] Incident X-rays are used to excite surface atoms. The atoms relax through the emission of an X-ray with energy characteristic of the parent atoms and the inten-sity proportional to the amount of the element present. It is a bulk or "total mate-rials" characterization technique for rapid, simultaneous, and nondestructive analysis of elements having an atomic number higher than that of boron. Tradi-tional bulk analysis applications include identifying metals and alloys, detecting trace elements in liquids, and identifying residues and deposits. 4.3.2.5. Total-reflection X-ray fluorescence (TXRF) [7, 8] It is a special XRF technique that provides extremely sensitive measures of the elements present in a material's outer surface. Applications include searching for metal contamination in thin films on silicon wafers and detecting picogram-levels o f arsenic, lead, mercury and cadmium on hazardous, chemical fume hoods." In Surface Contamination and Cleaning. CRC Press, 2003. http://dx.doi.org/10.1201/9789047403289-9.

Labaz, Moshe, and Pavel Sidorenko. "Spatial-Spectral Complexity in Kerr Beam Self-Cleaning." In 2024 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR). IEEE, 2024. http://dx.doi.org/10.1109/cleo-pr60912.2024.10676686.

Mangini, Fabio, Mario Ferraro, Wasyhun Gemechu, et al. "Spatial beam self-cleaning: from non-equilibrium to thermalization of nonlinear multimode fiber modes." In Laser Resonators, Microresonators, and Beam Control XXVII, edited by Andrea M. Armani, Alexis V. Kudryashov, Vladimir S. Ilchenko, Andrey B. Matsko, and Julia V. Sheldakova. SPIE, 2025. https://doi.org/10.1117/12.3048505.

Mangini, F., M. Ferraro, W. A. Gemechu, et al. "Beam self-cleaning and wave thermalization in multimode fibers." In 2024 International Conference Laser Optics (ICLO). IEEE, 2024. http://dx.doi.org/10.1109/iclo59702.2024.10624550.

Xu, Bohao, Hu Zhang, Jiaqi Wang, Xiaosheng Xiao, Lixia Xi, and Xiaoguang Zhang. "Beam cleaning in a graded-index ring-core multimode fiber." In CLEO: Applications and Technology. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/cleo_at.2024.jw2a.56.

Geng, Chaoyang, and Xiaosheng Xiao. "Effects of Random Birefringence in Multimode Fibers on Nonlinear Beam Self-cleaning." In 2024 22nd International Conference on Optical Communications and Networks (ICOCN). IEEE, 2024. http://dx.doi.org/10.1109/icocn63276.2024.10648309.

Pushkarev, D. V., G. E. Rizaev, M. V. Levus, and L. V. Seleznev. "Beam Self-cleaning and Transition from Nonlinear to Geometric Focusing during Filamentation." In 2024 International Conference Laser Optics (ICLO). IEEE, 2024. http://dx.doi.org/10.1109/iclo59702.2024.10624119.

Mangini, Fabio, Mario Ferraro, Wasyhun A. Gemechu, Yifan Sun, Vincent Couderc, and Stefan Wabnitz. "Optical Entropy Maximization Leads to Spatial Beam Self-Cleaning in Multimode GRIN Fibers." In 2024 24th International Conference on Transparent Optical Networks (ICTON). IEEE, 2024. http://dx.doi.org/10.1109/icton62926.2024.10647848.

Poisson, Arnaud, Alessandro Tonello, Vincent Couderc, and Christine Restoin. "Exploiting time reversal symmetry for beam shaping in multimode nonlinear fiber optics." In Nonlinear Photonics. Optica Publishing Group, 2024. http://dx.doi.org/10.1364/np.2024.npm3b.3.

Yancey, Peter, Glenn Astolfi, Randy Nixon, Glenn D. Hauser, Cory Brown, and Gregory Pope. "Atmospheric Plasma Coating Removal: the Future without Spent Abrasive." In SSPC 2018. SSPC, 2018. https://doi.org/10.5006/s2018-00014.

van Agthoven, R. "Ultrasonic Inspection of Risers a New and Simple Approach." In CORROSION 1998. NACE International, 1998. https://doi.org/10.5006/c1998-98092.

Chao, A. Halo Generation and Beam Cleaning by Resonance Trapping. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/829712.

Dowell, D. H., F. K. King, R. E. Kirby, and J. F. Schmerge. In-Situ Cleaning of Metal Cathodes using a Hydrogen Ion Beam. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/878343.

Trbojevic, D., and N. Pastore. Argon and argon-oxygen glow discharge cleaning of the Main Ring beam pipe. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/6080884.

Schechter, D. E., C. C. Tsai, and C. Boitnott. Energetic neutral beam cleaning. Final CRADA report for CRADA number Y-1296-0427. Office of Scientific and Technical Information (OSTI), 1996. http://dx.doi.org/10.2172/515581.

Fu, Gongkang, and Gabriel Bryk. BrM Quantity-Based Bridge Element Deterioration/Improvement Modeling and Software Tools. Illinois Center for Transportation, 2024. http://dx.doi.org/10.36501/0197-9191/24-005.