Relevant bibliographies by topics / Bright-field/dark-field imaging

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  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers

Academic literature on the topic 'Bright-field/dark-field imaging'

Author: Grafiati
Published: 4 June 2021
Last updated: 14 February 2022

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Journal articles on the topic "Bright-field/dark-field imaging"

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Herring, R. A., and M. E. Twigg. "High-Resolution Bright-Field and Dark-Field Hollow Cone Illumination." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 36–37. http://dx.doi.org/10.1017/s0424820100178938.

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Hollow cone illumination using a large C2 blocked-aperture (bl apt) in the conventional TEM (CTEM) can remove the beams within the zero-order Laue zone (ZOLZ) thereby making lattice images more simply interpretable. Dark-field (DF) hollow cone illumination has the added advantage of enhancing the Z-contrast within the lattice image, since the electrons contributing to the image must be scattered over a large angle (approximately 10 mrad). Both of these imaging methods have been explored, using a 600 um C2 bl apt and objective aperture sizes of 70, 20 and 10 um, and are reported in this paper.Much interest has been generated by the report of Pennycook [1] on STEM Z-contrast imaging using annular dark-field. In earlier work ,it was noted that CTEM hollow cone imaging and STEM annular dark-field imaging are related via reciprocity [2] (Fig. 1). In addition, Zernike has shown the advantages of hollow cone illumination in optical phase-contrast microscopy [3]. The electron-optical analogues to these optical techniques are now possible because of the low Cs values achieved in modern TEMs.
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Patel, Binay, Raymond Pearson, and Masashi Watanabe. "Bright field and dark field STEM-IN-SEM imaging of polymer systems." Journal of Applied Polymer Science 131, no. 19 (2014): n/a. http://dx.doi.org/10.1002/app.40851.

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Helvoort, A. T. J. van, B. S. Tanem, and R. Holmestad. "Annular bright and dark field imaging of soft materials." Journal of Physics: Conference Series 26 (February 22, 2006): 42–45. http://dx.doi.org/10.1088/1742-6596/26/1/010.

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Patel, B. S., and M. Watanabe. "Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Nanocomposites." Microscopy and Microanalysis 19, S2 (2013): 362–63. http://dx.doi.org/10.1017/s1431927613003802.

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Mitsuishi, K., A. Hashimoto, M. Takeguchi, M. Shimojo, and K. Ishizuka. "Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy." Ultramicroscopy 111, no. 1 (2010): 20–26. http://dx.doi.org/10.1016/j.ultramic.2010.08.004.

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Vanfleet, R. R. "Toward Quantitative Annular Dark Field Imaging." Microscopy and Microanalysis 7, S2 (2001): 188–89. http://dx.doi.org/10.1017/s143192760002701x.

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Annular Dark Field imaging has the potential to be directly quantifiable. By this I mean that with careful measurement, the absolute image intensity has physical meaning. Unlike Bright Field TEM, the ADF image has no contrast reversals with focus and with the exception of thick specimens there are no contrast reversals with changes in thickness. Thus, image intensity is related to thickness, composition, orientation, and structure of local regions whose size is determined by the electron probe. The ability to extract quantitative information about the specimen from the intensity requires careful collection of the intensity data and a solid understanding of how that intensity will change with thickness, composition, orientation, and structure. The qualitative effect of thickness and composition has been well shown in the literature but more quantitative approaches have been lacking.The simplest models of ADF imaging treat each atom interacting
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Sugimoto, Ryo, Ryoji Maruyama, and Wataru Watanabe. "Acquisition of Multi-Modal Images of Structural Modifications in Glass with Programmable LED-Array-Based Illumination." Applied Sciences 9, no. 6 (2019): 1136. http://dx.doi.org/10.3390/app9061136.

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Ultrashort laser pulses can induce structural modifications in bulk glass, leading to refractive index change and scattering damage. As bright-field, dark-field, and phase imaging each provide complementary information about laser-induced structures, it is often desired to use multiple observations simultaneously. As described herein, we present the acquisition of bright-field, dark-field, and differential phase-contrast images of structural modifications induced in glass by femtosecond laser pulses with an LED array microscope. The contrast of refractive index change can be enhanced by differential phase-contrast images. We also report on the simultaneous acquisition of bright-field and dark-field images of structural modifications in a glass with LED-array-based Rheinberg illumination. A single-shot color image is separated to obtain bright field and dark field images simultaneously. We provide an experimental demonstration on multi-modal imaging of structural modifications in a glass with an LED array microscope using temporally-coded illumination and color-coded illumination.
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Xu, Jun, Yoshio Matsui, Tsuyoshi Kimura, and Yoshinori Tokura. "Dark‐field and bright‐field imaging of charge order domains in Nd0.5Ca0.5(Mn0.98Cr0.02)O3." Journal of Electron Microscopy 51, suppl 1 (2002): S155—S158. http://dx.doi.org/10.1093/jmicro/51.supplement.s155.

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Zhang, J. P. "Structures and defects identified by dark-field HREM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 124–25. http://dx.doi.org/10.1017/s0424820100121028.

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The tilted illumination dark field high resolution imaging technique was applied to structures and defects of semiconductors and superconductors. We used a Hitachi-H9000 top entry microscope with a high resolution pole-piece of Cs=0.9 mm, operated at 300 Kv. Proper apertures, tilting angle and imaging conditions were chosen to minimize the phase shift due to aberrations. Since the transmitted beam was moved outside the aperture, the noise ratio was greatly reduced, which resulted in a significant enhancement of image contrast and apparent resolution. Images are not difficult to interpret if they have a clear correspondence to structure - information from image simulations in bright field mode can be used to assist in dark field image interpretation.An example in a semiconductor, GaAs/Ga0.49In0.51P2 superlattice imaged along [110] direction is shown in Figure 1. In this dark field image the GaAs and GaInP layers can be easily distinguished by their different contrast, and the difference in quality between both sides of interfaces is clear. An enlarged image in Figure 1 shows the defective area on the rough side of interface. Since this image shows the same pattern as the [110] projection of an fee structure, the major structural information about {111}, {200}, {220} planes can be obtained from this zone. Note that in bright field mode, [110] is not a good zone for imaging such multilayers.
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Kheireddine, Sara, Ayyappasamy Sudalaiyadum Perumal, Zachary J. Smith, Dan V. Nicolau, and Sebastian Wachsmann-Hogiu. "Dual-phone illumination-imaging system for high resolution and large field of view multi-modal microscopy." Lab on a Chip 19, no. 5 (2019): 825–36. http://dx.doi.org/10.1039/c8lc00995c.

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Dissertations / Theses on the topic "Bright-field/dark-field imaging"

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Miller, Kelsey, Olivier Guyon, and Jared Males. "Spatial linear dark field control: stabilizing deep contrast for exoplanet imaging using bright speckles." SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 2017. http://hdl.handle.net/10150/626442.

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Direct imaging of exoplanets requires establishing and maintaining a high-contrast dark field (DF) within the science image to a high degree of precision (10(-10)). Current approaches aimed at establishing the DF, such as electric field conjugation (EFC), have been demonstrated in the lab and have proven capable of high-contrast DF generation. The same approaches have been considered for the maintenance of the DF as well. However, these methods rely on phase diversity measurements, which require field modulation; this interrupts the DF and consequently competes with the science acquisition. We introduce and demonstrate spatial linear dark field control (LDFC) as an alternative technique by which the high-contrast DF can be maintained without modulation. Once the DF has been established by conventional EFC, spatial LDFC locks the high-contrast state of the DF by operating a closed loop around the linear response of the bright field (BF) to wavefront variations that modify both the BF and the DF. We describe the fundamental operating principles of spatial LDFC and provide numerical simulations of its operation as a DF stabilization technique that is capable of wavefront correction within the DF without interrupting science acquisition. (c) The Authors.
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Akhtar, Sultan. "Transmission Electron Microscopy of Graphene and Hydrated Biomaterial Nanostructures : Novel Techniques and Analysis." Doctoral thesis, Uppsala universitet, Tillämpad materialvetenskap, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-171991.

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Transmission Electron Microscopy (TEM) on light element materials and soft matters is problematic due to electron irradiation damage and low contrast. In this doctoral thesis techniques were developed to address some of those issues and successfully characterize these materials at high resolution. These techniques were demonstrated on graphene flakes, DNA/magnetic beads and a number of water containing biomaterials. The details of these studies are given below. A TEM based method was presented for thickness characterization of graphene flakes. For the thickness characterization, the dynamical theory of electron diffraction is used to obtain an analytical expression for the intensity of the transmitted electron beam as a function of thickness. From JEMS simulations (experiments) the absorption constant λ in a low symmetry orientation was found to be ~ 208 nm (225 ± 9 nm). When compared to standard techniques for thickness determination of graphene/graphite, the method has the advantage of being relatively simple, fast and requiring only the acquisition of bright-field (BF) images. Using the proposed method, it is possible to measure the thickness change due to one monolayer of graphene if the flake has uniform thickness over a larger area. A real-space TEM study on magnetic bead-DNA coil interaction was conducted and a statistical analysis of the number of beads attached to the DNA-coils was performed. The average number of beads per DNA coil was calculated around 6 and slightly above 2 for samples with 40 nm and 130 nm beads, respectively. These results are in good agreement with magnetic measurements. In addition, the TEM analysis supported an earlier hypothesis that 40 nm beads are preferably attached interior of the DNA-coils while 130 nm beads closer to the exterior of the coils. A focused ion-beam in-situ lift-out technique for hydrated biological specimens was developed for cryo-TEM. The technique was demonstrated on frozen Aspergillus niger spores which were frozen with liquid nitrogen to preserve their cellular structures. A thin lamella was prepared, lifted out and welded to a TEM grid. Once the lamella was thinned to electron transparency, the grid was cryogenically transferred to the TEM using a cryo-transfer bath. The structure of the cells was revealed by BF imaging. Also, a series of energy filtered images was acquired and C, N and Mn elemental maps were produced. Furthermore, 3 Å lattice fringes of the underlying Al support were successfully resolved by high resolution imaging, confirming that the technique has the potential to extract structural information down to the atomic scale. The experimental protocol is ready now to be employed on a large variety of samples e.g. soft/hard matter interfaces.
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Book chapters on the topic "Bright-field/dark-field imaging"

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Krishnan, Kannan M. "Optics, Optical Methods, and Microscopy." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0006.

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Propagation of light is described as the simple harmonic motion of transverse waves. Combining waves that propagate on orthogonal planes give rise to linear, elliptical, or spherical polarization, depending on their amplitudes and phase differences. Classical experiments of Huygens and Young demonstrated the principle of optical interference and diffraction. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals forms the basis of diffraction methods. Fresnel diffraction finds application in the design of zone plates for X-ray microscopy. Optical microscopy, with resolution given by the Rayleigh criterion to be approximately half the wavelength, works best when tailored to the optimal characteristics of the human eye (λ = 550 nm). Lenses suffer from spherical and chromatic aberrations, and astigmatism. Optical microscopes operate in bright-field, oblique, and dark-field imaging conditions, produce interference contrast, and can image with polarized light. Variants include confocal scanning optical microscopy (CSOM). Metallography, widely used to characterize microstructures, requires polished or chemically etched surfaces to provide optimal contrast. Finally, the polarization state of light reflected from the surface of a specimen is utilized in ellipsometry to obtain details of the optical properties and thickness of thin film materials.
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Conference papers on the topic "Bright-field/dark-field imaging"

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Davydova, Natalia V., Jo Finders, John McNamara, et al. "Fundamental understanding and experimental verification of bright versus dark field imaging." In International Conference on Extreme Ultraviolet Lithography 2020, edited by Kurt G. Ronse, Paolo A. Gargini, Patrick P. Naulleau, and Toshiro Itani. SPIE, 2020. http://dx.doi.org/10.1117/12.2573161.

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Arora, P., and A. Krishnan. "Dark field imaging in a bright field microscope using tailored polarization of Spoof Surface Plasmons." In International Conference on Fibre Optics and Photonics. OSA, 2014. http://dx.doi.org/10.1364/photonics.2014.s4d.6.

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Eugui, Pablo, Antonia Lichtenegger, Marco Augustin, et al. "Simultaneous Bright and Dark Field Optical Coherence Tomography Using Few-Mode Fiber Detection for Neuropathology Imaging." In Optical Tomography and Spectroscopy. OSA, 2018. http://dx.doi.org/10.1364/ots.2018.oth2d.3.

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Schamp, C. T., Y. Suzuki, J. Fuse, et al. "EBIC and EBAC Analysis of Site Specific STEM Samples." In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0366.

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Abstract In transmission electron microscopy (TEM), one typically considers bright-field or dark-field imaging signals, which utilize the transmitted and scattered electrons, respectively. Analytical signals such as characteristic X-Rays or primary electron beam energy losses from inelastic scattering events give rise to the energy dispersive X-Ray spectroscopy and electron energy loss spectroscopy techniques, respectively. In this paper, the detection of the electron beam absorbed current (EBAC) and electron beam induced current (EBIC) signals is reported using a specially designed scanning TEM holder and associated amplification electronics. By utilizing thin TEM samples where the beam-sample interaction volume is controlled more through the incident electron probe size, the EBAC and EBIC signal resolution is improved to the point where implant regions and Schottky junction depletion zones can be visualized.
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Journal articles
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